Entropy source quality determination method and analysis method

Abstract

The embodiment of the present disclosure discloses an entropy source quality determination method and an analysis method. The entropy source quality determination method comprises: under current working parameters, a first clock of the true random number generator is in the case of not being frequency-divided, being frequency-divided by a first frequency divider and being frequency-divided by a second frequency divider, and the actual probability absolute deviation of the true random number generator is respectively obtained according to output data of the true random number generator as a first deviation, a second deviation and a third deviation; the working parameters comprise a power supply voltage and / or a working temperature; an entropy source quality parameter of the true random number generator is determined according to the first deviation, the second deviation, the third deviation and a system deviation calculation model; and the entropy source quality is determined according to the entropy source quality parameter. The entropy source quality determination method and the analysis method can quantitatively analyze the entropy source quality, and lay a foundation for optimizing the probability absolute deviation of the metastable state or even eliminating the probability absolute deviation of the metastable state.

Description

Technical Field

[0001] This disclosure relates to, but is not limited to, the field of integrated circuit technology, and more specifically, to a method for determining and analyzing entropy source quality. Background Technology

[0002] The basic working principle of a traditional dual-clock source phase jitter sampling true random number generator is as follows: the edge of a low-frequency clock is used to sample the level of a high-frequency clock, and the values ​​obtained by continuous or intermittent sampling can form a true random data stream. The high-frequency clock has a 50% duty cycle, while the low-frequency clock exhibits significant periodic jitter. The high-frequency clock frequency is much higher than the low-frequency clock frequency. Because the circuit operates in asynchronous clock mode, metastable sampling is inevitable. Therefore, the random number stream will inevitably contain randomness introduced by phase jitter and metastable sampling. The randomness introduced by phase jitter can be optimized by adjusting the low-frequency phase jitter performance and the high-frequency clock period and duty cycle. However, the randomness introduced by metastable sampling naturally introduces uncontrollable absolute probability deviation. Since the absolute probability deviation of metastable sampling is affected by device process variations, operating voltage, and operating temperature, optimizing this performance is extremely complex and challenging. In the academic community of true random number generators, it is still impossible to accurately measure metastable states, optimize the absolute probability deviation of metastable states, or eliminate the absolute probability deviation of metastable states. Summary of the Invention

[0003] The following is an overview of the subject matter described in detail herein. This overview is not intended to limit the scope of the claims.

[0004] This disclosure provides a method for determining entropy source quality and an entropy source quality analysis method, which can determine the entropy source quality parameters, thereby laying the foundation for optimizing the absolute deviation of metastable probability or even eliminating the absolute deviation of metastable probability.

[0005] This disclosure provides a method for determining the quality of an entropy source, applied to a true random number generator. The true random number generator includes a first clock and a second clock, and true random numbers are obtained by sampling the first clock using the second clock. The frequency of the first clock is greater than the frequency of the second clock. The method includes: With the operating parameters of the true random number generator set to default values, the actual absolute probability deviation of the true random number generator is statistically obtained from the output data of the true random number generator under the conditions of no frequency division, after first frequency division, and after second frequency division, respectively, and is used as the first deviation, second deviation, and third deviation; the operating parameters include power supply voltage and / or operating temperature. The entropy source quality parameter of the true random number generator is determined based on the calculation model of the first deviation, the second deviation, the third deviation, and the system deviation; the entropy source quality parameter includes at least one of the following: the proportion of the metastable state of the first clock of the true random number generator in the totalization period without frequency division, the absolute deviation of the metastable state probability, and the absolute deviation of the reference state probability; The current entropy source quality is determined based on the value of the entropy source quality parameter.

[0006] In one exemplary embodiment, the system deviation calculation model is as follows: in, Indicates the absolute deviation from the actual probability; This indicates the proportion of metastable states within the totalization period; This represents the absolute deviation of the metastable probability; This represents the absolute deviation of the base state probability.

[0007] In one exemplary embodiment, the proportion of the metastable state within the totalization period includes a first proportion, a second proportion, and a third proportion; the first proportion, the second proportion, and the third proportion respectively correspond to the proportion of the metastable state of the first clock of the true random number generator within the totalization period under the conditions of no frequency division, after first frequency division, and after second frequency division. The absolute metastable probability deviation includes a first absolute metastable probability deviation, a second absolute metastable probability deviation, and a third absolute metastable probability deviation; the first absolute metastable probability deviation, the second absolute metastable probability deviation, and the third absolute metastable probability deviation correspond to the absolute metastable probability deviations of the first clock of the true random number generator under the conditions of no frequency division, after the first frequency division, and after the second frequency division, respectively. The absolute deviation of the reference state probability includes a first absolute deviation of the reference state probability, a second absolute deviation of the reference state probability, and a third absolute deviation of the reference state probability; the first absolute deviation of the reference state probability, the second absolute deviation of the reference state probability, and the third absolute deviation of the reference state probability correspond to the absolute deviation of the first clock of the true random number generator under the conditions of no frequency division, after the first frequency division, and after the second frequency division, respectively; The step of determining the entropy source quality parameter value of the true random number generator based on the calculation model of the first deviation, the second deviation, the third deviation, and the system deviation includes: Determine the conversion relationship between the first proportion, the second proportion, and the third proportion, as well as the values ​​of the absolute deviation of the second reference state probability and the absolute deviation of the third reference state probability; set the absolute deviations of the first metastable state probability, the second metastable state probability, and the third metastable state probability to be equal; Substitute the conversion relationship between the first proportion, the second proportion, and the third proportion, as well as the values ​​of the absolute probability deviation of the second baseline state and the absolute probability deviation of the third baseline state, into the system deviation calculation model to obtain at least one of the values ​​of the first proportion, the absolute probability deviation of the first metastable state, and the absolute probability deviation of the first baseline state. The value of at least one of the first proportion, the absolute deviation of the first metastable probability, and the absolute deviation of the first reference state probability is used as the value of the entropy source quality parameter.

[0008] In one exemplary embodiment, the first frequency division is a 2-way frequency division; the second frequency division is a 3-way frequency division.

[0009] In one exemplary embodiment, the conversion relationship between the first proportion, the second proportion, and the third proportion includes: ; in, Indicates the first percentage, Indicates the second percentage; This indicates the third percentage.

[0010] In one exemplary embodiment, the value of the absolute deviation of the second reference state probability is 0; The value of the absolute deviation of the third reference state probability is .

[0011] In one exemplary embodiment, the true random number generator includes a dual-clock-source phase jitter sampling true random number generator.

[0012] An entropy source quality analysis method according to an embodiment of this disclosure, applied to a true random number generator, includes: The operating parameters of the true random number generator are adjusted multiple times according to a preset method. After each adjustment, the value of the entropy source quality parameter of the true random number generator is determined according to the method described in any of the above embodiments. The operating parameters include power supply voltage and / or operating temperature. Based on the value of the entropy source quality parameter of the true random number generator after each adjustment, determine how the value of the entropy source quality parameter changes with the value of each operating parameter.

[0013] In one exemplary embodiment, determining the variation of the entropy source quality parameter with respect to the value of each operating parameter based on the value of the entropy source quality parameter of the true random number generator after each adjustment includes: Plot a curve based on the values ​​of the entropy source quality parameters and the corresponding operating parameters of the true random number generator after each adjustment. The curves plotted determine how the values ​​of the entropy source quality parameters change with the values ​​of each operating parameter.

[0014] In one exemplary embodiment, the preset method includes adjusting the power supply voltage within a preset voltage range according to a first preset step size and / or adjusting the operating temperature within a preset temperature range according to a second preset step size.

[0015] Other features and advantages of this disclosure will be set forth in the following description and will be apparent in part from the description or may be learned by practicing the disclosure. The objects and other advantages of this disclosure may be realized and obtained by means of the structures particularly pointed out in the description and the drawings. Attached Figure Description

[0016] The accompanying drawings are provided to further understand the technical solutions of this disclosure and constitute a part of the specification. They are used together with the embodiments of this disclosure to explain the technical solutions of this disclosure and do not constitute a limitation on the technical solutions of this disclosure.

[0017] Figure 1 This is a schematic diagram of the entropy source quality determination method according to an embodiment of the present disclosure; Figure 2 This is a schematic diagram of the entropy source quality analysis method according to an embodiment of the present disclosure. Detailed Implementation

[0018] To make the objectives, technical solutions, and advantages of this disclosure clearer, the embodiments of this disclosure will be described in detail below with reference to the accompanying drawings. Note that the implementation methods can be carried out in many different forms. Those skilled in the art will readily understand that the methods and content can be transformed into various forms without departing from the spirit and scope of this disclosure. Therefore, this disclosure should not be construed as limited to the content described in the following embodiments. Without conflict, the embodiments and features in the embodiments of this disclosure can be arbitrarily combined with each other. To keep the following description of the embodiments of this disclosure clear and concise, detailed descriptions of some known functions and components have been omitted. The accompanying drawings of the embodiments of this disclosure only relate to the structures involved in the embodiments of this disclosure; other structures can be referred to in general design.

[0019] The ordinal numbers “first,” “second,” and “third” used in this specification are used to avoid confusion among the constituent elements, not to limit their quantity.

[0020] The applicant of this application found that the duration of a metastable event is In a quantitative cycle Within this period, there are two opportunities for metastable sampling; therefore, the proportion of metastable states within the total quantization period is... The proportion of state M (metastable state) is s, and its absolute probability deviation is... . This represents the 0 / 1 probability under metastable conditions. The proportion of state B (the baseline state, primarily determined by the duty cycle) is 1 - s, and its absolute probability deviation is... . The 0 / 1 probability is the baseline random source.

[0021] The absolute probability deviation D observed by the system as a whole can be expressed as a weighted sum of the contributions of the two: (1) .

[0022] In order to separate from equation (1) , and This disclosure proposes a method for determining the quality of an entropy source.

[0023] Figure 1 This is one of the schematic diagrams of an entropy source quality determination method according to an embodiment of this disclosure. The entropy source quality determination method is applied to a true random number generator, which includes a first clock and a second clock. True random numbers are obtained by sampling the first clock using the second clock; the frequency of the first clock is greater than the frequency of the second clock. Figure 1 As shown, the method for determining the entropy source quality includes the following steps 11 to 13: Step 11: With the operating parameters of the true random number generator at the current value, the first clock, under the conditions of no frequency division, after first frequency division, and after second frequency division, respectively, statistically obtains the actual absolute probability deviation of the true random number generator based on the output data of the true random number generator, and uses it as the first deviation, the second deviation, and the third deviation. Step 12: Determine the value of the entropy source quality parameter of the true random number generator based on the calculation model of the first deviation, the second deviation, the third deviation, and the system deviation; Step 13: Determine the entropy source quality under the current operating parameters based on the value of the entropy source quality parameter.

[0024] The entropy source quality parameters include at least one of the following: the proportion of the metastable state of the first clock of the true random number generator in the totalization period without frequency division, the absolute deviation of the metastable state probability, and the absolute deviation of the reference state probability; the operating parameters include the power supply voltage and / or the operating temperature.

[0025] This embodiment of the disclosure obtains the actual absolute probability deviation of the first clock of the true random number generator under the current operating parameters, under the conditions of no frequency division, after the first frequency division, and after the second frequency division. Based on the actual absolute probability deviation and the system deviation calculation model, the value of the entropy source quality parameter of the true random number generator is determined. This can quantitatively determine the current entropy source quality, laying the foundation for optimizing the metastable probability absolute deviation or even eliminating the metastable probability absolute deviation.

[0026] In one exemplary embodiment, the system deviation calculation model is as follows: in, Indicates the absolute deviation from the actual probability; This indicates the proportion of metastable states within the totalization period; This represents the absolute deviation of the metastable probability; This represents the absolute deviation of the base state probability.

[0027] In one exemplary embodiment, the proportion of the metastable state within the totalization period includes a first proportion, a second proportion, and a third proportion; the first proportion, the second proportion, and the third proportion respectively correspond to the proportion of the metastable state of the first clock of the true random number generator within the totalization period under the conditions of no frequency division, after first frequency division, and after second frequency division. The absolute metastable probability deviation includes a first absolute metastable probability deviation, a second absolute metastable probability deviation, and a third absolute metastable probability deviation; the first absolute metastable probability deviation, the second absolute metastable probability deviation, and the third absolute metastable probability deviation correspond to the absolute metastable probability deviations of the first clock of the true random number generator under the conditions of no frequency division, after the first frequency division, and after the second frequency division, respectively. The absolute deviation of the reference state probability includes a first absolute deviation of the reference state probability, a second absolute deviation of the reference state probability, and a third absolute deviation of the reference state probability; the first absolute deviation of the reference state probability, the second absolute deviation of the reference state probability, and the third absolute deviation of the reference state probability correspond to the absolute deviation of the first clock of the true random number generator under the conditions of no frequency division, after the first frequency division, and after the second frequency division, respectively; The step of determining the entropy source quality parameter value of the true random number generator based on the calculation model of the first deviation, the second deviation, the third deviation, and the system deviation includes: Determine the conversion relationship between the first proportion, the second proportion, and the third proportion, as well as the values ​​of the absolute deviation of the second reference state probability and the absolute deviation of the third reference state probability; set the absolute deviations of the first metastable state probability, the second metastable state probability, and the third metastable state probability to be equal; Substitute the conversion relationship between the first proportion, the second proportion, and the third proportion, as well as the values ​​of the absolute probability deviation of the second baseline state and the absolute probability deviation of the third baseline state, into the system deviation calculation model to obtain at least one of the values ​​of the first proportion, the absolute probability deviation of the first metastable state, and the absolute probability deviation of the first baseline state. The value of at least one of the first proportion, the absolute deviation of the first metastable probability, and the absolute deviation of the first reference state probability is used as the value of the entropy source quality parameter.

[0028] In one exemplary embodiment, the first frequency division is a 2-way division; the second frequency division is a 3-way division. Exemplarily, the duty cycle of the 3-way division is... .

[0029] In one exemplary embodiment, the conversion relationship between the first proportion, the second proportion, and the third proportion includes: ; in, Indicates the first percentage, Indicates the second percentage; This indicates the third percentage.

[0030] In one exemplary embodiment, the value of the absolute deviation of the second reference state probability is 0; The value of the absolute deviation of the third reference state probability is .

[0031] Assume the first deviation is The second deviation is The third deviation is The absolute deviation of the first metastable probability is The absolute deviation of the second metastable probability is The absolute deviation of the third metastable probability is Absolute deviation of the first baseline probability Absolute deviation of the second baseline probability Absolute deviation from the probability of the third baseline state .

[0032] According to the system deviation calculation model, we have: ; make ;Will ; ; Substituting into the above system of equations, we get: ; Because the first deviation is The second deviation is The third deviation is The entropy source quality parameters can be obtained by statistically analyzing the output data of true random numbers: the first proportion, the absolute deviation of the first metastable probability, and the absolute deviation of the first reference state probability. Thus, the entropy source quality can be determined based on the values ​​of the first proportion, the absolute deviation of the first metastable probability, and the absolute deviation of the first reference state probability.

[0033] In some other embodiments, the second frequency division can be a five-way frequency division, etc. The duty cycle of this five-way frequency division is... When the periodic jitter is sufficiently large, the relationship between the first proportion, the second proportion, and the third proportion includes: The absolute deviation of the second reference state probability is 0; the absolute deviation of the third reference state probability is .

[0034] In one exemplary embodiment, the true random number generator includes a dual-clock-source phase jitter sampling true random number generator.

[0035] Figure 2 This is one of the schematic diagrams of the entropy source quality analysis method according to an embodiment of this disclosure, such as... Figure 2 As shown, the entropy source quality analysis method of this disclosure includes the following steps 21 to 22: Step 21: Adjust the values ​​of the operating parameters of the true random number generator multiple times according to a preset method. After each adjustment, determine the value of the entropy source quality parameter of the true random number generator according to the entropy source quality determination method described in any of the above embodiments. Step 22: Based on the value of the entropy source quality parameter of the true random number generator after each adjustment, determine how the value of the entropy source quality parameter changes with the value of each working parameter.

[0036] The operating parameters include the power supply voltage and / or operating temperature.

[0037] The entropy source quality analysis method of this disclosure changes the value of the operating parameters of the true random number generator and determines the value of the entropy source quality parameter after each change of the operating parameters using the entropy source quality determination method described in any of the above embodiments. This can determine how the value of the entropy source quality parameter changes with the value of each operating parameter, thereby laying the foundation for optimizing the absolute deviation of metastable probability or even eliminating the absolute deviation of metastable probability.

[0038] In one exemplary embodiment, determining the variation of the entropy source quality parameter with respect to the value of each operating parameter based on the value of the entropy source quality parameter of the true random number generator after each adjustment includes: Plot a curve based on the values ​​of the entropy source quality parameters and the corresponding operating parameters of the true random number generator after each adjustment. The curves plotted determine how the values ​​of the entropy source quality parameters change with the values ​​of each operating parameter.

[0039] In one exemplary embodiment, the preset method includes adjusting the power supply voltage within a preset voltage range according to a first preset step size and / or adjusting the operating temperature within a preset temperature range according to a second preset step size.

[0040] For example, the preset voltage range of the supply voltage can be (1±10%)VDD, and the first preset step size can be 1%×VDD volts. VDD is the supply voltage.

[0041] For example, the preset temperature range of the operating temperature can be -40℃ to 85℃, and the second preset step size can be 15℃.

[0042] This disclosure describes several embodiments, but these descriptions are exemplary and not limiting, and it will be apparent to those skilled in the art that many more embodiments and implementations are possible within the scope of the embodiments described herein. Although many possible combinations of features are shown in the drawings and discussed in the detailed description, many other combinations of the disclosed features are also possible. Unless specifically limited, any feature or element of any embodiment may be used in combination with, or may replace, any feature or element of any other embodiment.

[0043] This disclosure includes and contemplates combinations of features and elements known to those skilled in the art. The embodiments, features, and elements disclosed in this disclosure may also be combined with any conventional features or elements to form unique inventive solutions. Any feature or element of any embodiment may also be combined with features or elements from other inventive solutions to form another unique inventive solution. Therefore, it should be understood that any feature shown and / or discussed in this disclosure may be implemented individually or in any suitable combination. Therefore, the embodiments are not limited except by the limitations imposed by the appended claims and their equivalents. Furthermore, various modifications and changes may be made within the scope of the appended claims.

[0044] Furthermore, in describing representative embodiments, the specification may have presented methods and / or processes as a specific sequence of steps. However, the method or process should not be limited to the specific order of steps described herein, to the extent that the method or process does not depend on the specific order of steps described herein. As will be understood by those skilled in the art, other sequences of steps are also possible. Therefore, the specific order of steps set forth in the specification should not be construed as a limitation of the claims. Moreover, the claims relating to the method and / or process should not be limited to the steps performed in the order written, and those skilled in the art will readily understand that these orders can be varied and still remain within the spirit and scope of the embodiments disclosed herein.

[0045] Furthermore, the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first," "second," etc., may explicitly or implicitly include at least one of those features.

[0046] In the description of this disclosure, "multiple" means at least two, such as two, three, etc., unless otherwise expressly and specifically limited.

[0047] In this disclosure, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," "fixing," etc., should be interpreted broadly. For example, "connection" can be a fixed connection, a detachable connection, or an integral part; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this disclosure according to the specific circumstances.

[0048] In this disclosure, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0049] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this disclosure. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0050] Although embodiments of the present disclosure have been shown and described above, it is to be understood that the above embodiments are exemplary and should not be construed as limiting the present disclosure. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of the present disclosure.

Claims

1. A method for determining the quality of an entropy source, applied to a true random number generator, wherein the true random number generator includes a first clock and a second clock, and true random numbers are obtained by sampling the first clock using the second clock; the frequency of the first clock is greater than the frequency of the second clock; characterized in that, When the operating parameters of the true random number generator are at their default values, the first clock, under the conditions of no frequency division, after first frequency division, and after second frequency division, respectively, statistically obtains the actual absolute probability deviation of the true random number generator based on the output data of the true random number generator, which are then used as the first deviation, the second deviation, and the third deviation; the operating parameters include the power supply voltage and / or the operating temperature. The entropy source quality parameter of the true random number generator is determined based on the calculation model of the first deviation, the second deviation, the third deviation, and the system deviation; the entropy source quality parameter includes at least one of the following: the proportion of the metastable state of the first clock of the true random number generator in the totalization period without frequency division, the absolute deviation of the metastable state probability, and the absolute deviation of the reference state probability; The current entropy source quality is determined based on the value of the entropy source quality parameter.

2. The method for determining the entropy source quality as described in claim 1, characterized in that, The system deviation calculation model is as follows: in, This indicates the absolute deviation from the actual probability; This indicates the proportion of metastable states within the totalization period; Indicates the absolute deviation of the metastable probability; This represents the absolute deviation of the base state probability.

3. The method for determining the entropy source quality as described in claim 2, characterized in that, The proportion of the metastable state within the totalization period includes a first proportion, a second proportion, and a third proportion; the first proportion, the second proportion, and the third proportion correspond to the proportion of the metastable state of the first clock of the true random number generator within the totalization period under the conditions of no frequency division, after the first frequency division, and after the second frequency division, respectively. The absolute metastable probability deviation includes a first absolute metastable probability deviation, a second absolute metastable probability deviation, and a third absolute metastable probability deviation; the first absolute metastable probability deviation, the second absolute metastable probability deviation, and the third absolute metastable probability deviation correspond to the absolute metastable probability deviations of the first clock of the true random number generator under the conditions of no frequency division, after the first frequency division, and after the second frequency division, respectively. The absolute deviation of the reference state probability includes a first absolute deviation of the reference state probability, a second absolute deviation of the reference state probability, and a third absolute deviation of the reference state probability; the first absolute deviation of the reference state probability, the second absolute deviation of the reference state probability, and the third absolute deviation of the reference state probability correspond to the absolute deviation of the first clock of the true random number generator under the conditions of no frequency division, after the first frequency division, and after the second frequency division, respectively; The step of determining the entropy source quality parameter value of the true random number generator based on the calculation model of the first deviation, the second deviation, the third deviation, and the system deviation includes: Determine the conversion relationship between the first proportion, the second proportion, and the third proportion, as well as the values ​​of the absolute deviation of the second reference state probability and the absolute deviation of the third reference state probability; set the absolute deviations of the first metastable state probability, the second metastable state probability, and the third metastable state probability to be equal; Substitute the conversion relationship between the first proportion, the second proportion, and the third proportion, as well as the values ​​of the absolute probability deviation of the second baseline state and the absolute probability deviation of the third baseline state, into the system deviation calculation model to obtain at least one of the values ​​of the first proportion, the absolute probability deviation of the first metastable state, and the absolute probability deviation of the first baseline state. The value of at least one of the first proportion, the absolute deviation of the first metastable probability, and the absolute deviation of the first reference state probability is used as the value of the entropy source quality parameter.

4. The method for determining the quality of an entropy source as described in claim 3, characterized in that, The first frequency division is a 2-way division; the second frequency division is a 3-way division.

5. The method for determining the entropy source quality as described in claim 4, characterized in that, The conversion relationships between the first percentage, the second percentage, and the third percentage include: ； in, Indicates the first percentage, Indicates the second percentage; This indicates the third percentage.

6. The method for determining the quality of an entropy source as described in claim 5, characterized in that, The absolute deviation of the second reference state probability is 0; The value of the absolute deviation of the third reference state probability is .

7. The method for determining the quality of an entropy source as described in claim 1, characterized in that, The true random number generator includes a dual-clock-source phase jitter sampling type true random number generator.

8. An entropy source quality analysis method, applied to a true random number generator, characterized in that, The operating parameters of the true random number generator are adjusted multiple times according to a preset method. After each adjustment, the value of the entropy source quality parameter of the true random number generator is determined according to the method of any one of claims 1-7. The operating parameters include power supply voltage and / or operating temperature. Based on the value of the entropy source quality parameter of the true random number generator after each adjustment, determine how the value of the entropy source quality parameter changes with the value of each operating parameter.

9. The entropy source quality analysis method as described in claim 8, characterized in that, The step of determining how the entropy source quality parameter changes with the value of each operating parameter based on the value of the entropy source quality parameter of the true random number generator after each adjustment includes: Plot a curve based on the values ​​of the entropy source quality parameters and the corresponding operating parameters of the true random number generator after each adjustment. The curves plotted determine how the values ​​of the entropy source quality parameters change with the values ​​of each operating parameter.

10. The entropy source quality analysis method as described in claim 8, characterized in that, The preset method includes adjusting the power supply voltage within a preset voltage range according to a first preset step size, and / or adjusting the operating temperature within a preset temperature range according to a second preset step size.

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