Spectrometer device for obtaining spectroscopic information about at least one object, imaging plane of the imaging system positioned at a distance from the illumination plane

Abstract

A spectrometer device (130) and a method for obtaining spectral information about at least one object (110) are disclosed. The spectrometer device (130) comprises: - at least one light emitting element (132) configured for emitting illumination light (134) to illuminate the at least one object (110) in at least one illumination plane (136); - at least one imaging system (140) comprising at least one detector (142) configured for detecting detection light (144) from the object (110) and for generating at least one detector signal upon detection of the detection light (144), wherein the imaging system (140) further comprises at least one optical element (148) for guiding the detection light (144) onto the detector (142), wherein the imaging system (140) is configured for receiving the detection light (144) from at least one imaging plane; - at least one sample interface (160) configured for allowing the illumination light (134) to illuminate the object (110) and configured for allowing the detection light (144) from the object (110) to propagate to the imaging system (140), wherein the sample interface (160) is configured for defining a measurement pose of the spectrometer device (130) with respect to the object (110); wherein the imaging plane of the imaging system (140) is positioned at a distance from the illumination plane (136).

Description

Technical Field

[0001] This invention relates to a spectrometer apparatus for obtaining spectral information about at least one object, a mobile device including said spectrometer, and a method for obtaining spectral information about at least one object. The method and apparatus according to the invention can generally be used for survey or monitoring purposes, particularly in the infrared (IR) spectral region, especially in the near-infrared (NIR) spectral region, in various fields such as daily life, security technology, gaming, transportation technology, production technology, photography (e.g., digital or video photography for artistic, documentation, or technical purposes), safety technology, information technology, agriculture, crop protection, maintenance, cosmetics, medical technology, or science. However, other applications are also possible. Background Technology

[0002] Spectrometers are known to be efficient tools for obtaining information about the spectral properties of an object when it emits, irradiates, reflects, and / or absorbs light. Therefore, spectrometers can aid in the analysis of samples or other tasks where information about the spectral properties of an object is of interest.

[0003] EP 2 821 777 A1 describes a spectral characteristic measurement apparatus that allows measurement light emitted from an object to be measured to enter a fixed mirror unit and a movable mirror unit, forming an interference pattern of the measurement light reflected by the fixed mirror unit and the measurement light reflected by the movable mirror unit. The movable mirror unit is moved to obtain a change in the intensity of the interference light, and an interferogram of the measurement light is acquired based on this change. Simultaneously, a reference light with a narrow wavelength band included in the wavelength band of the measurement light is introduced into the fixed mirror unit and the movable mirror unit, forming an interference pattern of the reference light reflected by the fixed mirror unit and the reference light reflected by the movable mirror unit. The movable mirror unit is moved to correct the interferogram of the measurement light based on the amplitude of the change in the interference light of the reference light and based on the phase difference between the measurement light and the reference light, the wavelength of which is the same as that of the reference light in the measurement light, and the spectrum of the measurement light is acquired based on the corrected interferogram.

[0004] WO 2023 / 009840 A1 discloses a spectrometer that can be used for the detection of biological samples. The spectrometer includes an optical window configured to receive a sample and a spectral sensor. The spectrometer includes a chassis on which various components are assembled. Examples of components may include a light source, a light modulator, illumination and collection optics, a detector, and a processor. The spectrometer is configured to use, for example, an artificial intelligence (AI) engine to acquire spectral data representing the spectrum of the sample. The spectrometer further includes a thermal separator positioned between the light modulator and the light source.

[0005] WO 2023 / 161403 A1 describes the calibration methods for use in spectrometer equipment. The method includes: a) providing at least one spectrometer device, the at least one spectrometer device including at least one optical measuring element and at least one optical calibration element having different optical properties; b) providing at least one sample; c) performing at least two measurements using the spectrometer device, specifically at least two consecutive measurements, wherein one of these measurements is performed with the sample and the other of these measurements is performed without the sample, i. wherein performing the measurement with the sample includes illuminating a detector of the spectrometer device via an optical measuring path using the optical measuring element, the optical measuring path including at least one reflection at the at least one sample, and ii. wherein performing the measurement without the sample includes illuminating the detector via an optical calibration path independent of the optical measuring path using the optical calibration element, the optical calibration path including at least one interaction with the optical calibration element without interaction with the sample, and wherein the optical calibration path is arranged within the spectrometer device, specifically within a housing of the spectrometer device; d) generating at least one first detector signal S by the at least one detector based on the measurement without the sample. d1 And based on the measurement in the presence of the sample, at least one second detector signal S is generated. d2 e) From the first detector signal S d1 and the second detector signal S d2 At least one calibrated optical property of the at least one sample is obtained. Furthermore, a spectrometer apparatus configured to perform an in-use calibration method and its various applications are disclosed.

[0006] DE 10 2019 126038 A1 discloses a spectrometer apparatus and a method for manufacturing the spectrometer apparatus. The optical path from the light source to the sample and from the sample via an interferometer to a photodetector can be specifically constructed using basic components.

[0007] Typically, to obtain information about the spectral properties of an object, the object is illuminated with light, causing it to generate detection light. The received detection light can then be analyzed to obtain the object's spectral characteristics. Generally, most objects or samples (such as tissues, food, or plastic samples) exhibit volume effects. Specifically, the illuminating light may not be completely reflected on the object's surface and can penetrate into the object's volume. Light reflection within the object's volume is called "Kubekah-Munk reflection." Furthermore, depending on the object's material properties, different objects can exhibit different depths of light penetration. Typically, in spectroscopy, reflected light can be at a certain angle... Lowering the collection angle typically only yields optimal results for a single reflective plane. Volumetric reflection at the object can approximate reflection at different sample reflective planes, specifically leading to reduced light collection. For example, in the case of ideal surface reflection, the light-collecting optics of a spectrometer device can be optimized to operate at a single angle. The detection light is collected at an angle relative to the surface normal of the sample or sample interface. However, in the case of volumetric reflection at the object, i.e., when the irradiating light is reflected simultaneously at both the surface and volume of the object, the signal flux may be reduced, and therefore, the light collected by the light-collecting optics of the spectrometer equipment may be less than that collected by an ideal surface. Furthermore, these effects may become even greater if different illumination paths with different collection angles are considered. For example, spectral fluctuations can be observed due to different sample reflection planes. Additionally, fluctuations and / or signal loss may increase with the reflection angle. It increases as it increases.

[0008] The problem to be solved

[0009] Therefore, it is desirable to provide methods and apparatus that at least partially address the aforementioned technical challenges and at least substantially avoid the drawbacks of known methods and apparatuses. Specifically, a spectrometer apparatus and method for obtaining spectroscopic information about at least one object should be proposed, which allows for taking into account variations in the depth of light penetration into the object. Summary of the Invention

[0010] This problem is solved by a spectrometer device for obtaining spectral information about at least one object, a mobile device including said spectrometer, and a method for obtaining spectral information about at least one object, having the features of the independent claims. Advantageous embodiments that can be implemented independently or in any arbitrary combination are set forth in the dependent claims and throughout the specification.

[0011] In a first aspect of the invention, a spectrometer apparatus for obtaining spectral information about at least one object is disclosed.

[0012] As used herein, the term "spectrometer device" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, an optical device configured to acquire at least one spectral information item about at least one object. Specifically, at least one spectral information item may refer to, for example, at least one optical characteristic or optically measurable characteristic determined as a function of wavelength for one or more different wavelengths. More specifically, the optical characteristic or optically measurable characteristic and at least one spectral information item may relate to at least one characteristic characterizing at least one of transmission, absorption, reflection, and emission of at least one object itself or after exposure to external light. At least one optical characteristic may be determined for one or more wavelengths. The spectrometer device may specifically be configured to record signal strengths about corresponding wavelengths or partitions (e.g., wavelength intervals) of the spectrum, wherein the signal strength may specifically be provided as an electrical signal that can be used for further evaluation.

[0013] As an example, a spectrometer device may be, or may include, a device that allows the measurement of at least one spectrum (e.g., for measuring spectral flux, specifically as a function of wavelength or detection wavelength). As an example, the spectrum may be acquired in absolute or relative units (e.g., relative to at least one reference measurement). Thus, as an example, the acquisition of at least one spectrum may specifically be performed for the measurement of spectral flux (in W / nm) or spectrum (in 1) relative to at least one reference material, which may describe the material's properties (e.g., reflectance as a function of wavelength). Additionally or alternatively, the reference measurement may be based on a reference light source, an optical reference path, a calculated reference signal (e.g., a calculated reference signal from a document), and / or a reference device.

[0014] Specifically, at least one spectrometer device may be a diffuse reflectance spectrometer device configured to acquire spectral information from light diffusely reflected by at least one object (e.g., at least one sample). Additionally or alternatively, at least one spectrometer device may be or may include an absorption spectrometer and / or a transmission spectrometer. In particular, measuring the spectrum with the spectrometer device may include measuring absorption in a transmission configuration. Specifically, the spectrometer device may be configured to measure absorption in a transmission configuration. However, as outlined above, other types of spectrometer devices are also feasible.

[0015] Specifically, and as will be further detailed below, at least one spectrometer device may include at least one light source, which, as an example, may be at least one of a tunable light source, a light source having at least one fixed emission wavelength, and a broadband light source. As will be further detailed below, the spectrometer device further includes at least one detector configured to detect light, such as at least one of light transmitted, reflected, or emitted from at least one object. As will be further detailed below, the spectrometer device may further include at least one wavelength selection element, such as at least one of a grating, a prism, and a filter (e.g., a length-variable filter having varying transmission characteristics on its lateral extension). The wavelength selection element can be used to separate the incident light into spectra comprising wavelength signals, the corresponding intensities of which are determined by employing a detector (e.g., a detector having a detector array described in more detail below).

[0016] The spectrometer device can specifically be a portable spectrometer device. As used herein, the term "portable" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. The term can specifically refer to, but is not limited to, the characteristic that at least one object can be moved manually (e.g., by a single user). Specifically, the weight of an object characterized by the term "portable" may not exceed 10 kg, specifically 5 kg, more specifically 1 kg, or even 500 g. Additionally or alternatively, the dimensions of an object characterized by the term "portable" may allow the object to extend no more than 0.3 m in any dimension, specifically no more than 0.2 m in any dimension. Specifically, the volume of the object may not exceed 0.03 m³. 3 Specifically, not exceeding 0.01 m 3 More specifically, not exceeding 0.001 m 3 Or even no more than 500 mm 3 Specifically, as an example, a portable spectrometer device may have dimensions of, for example, 10 mm × 10 mm × 5 mm. Specifically, the portable spectrometer device may be part of or attachable to a mobile device, such as a laptop computer, tablet computer, mobile phone (e.g., smartphone), smartwatch, and / or wearable computer (also referred to as a "wearable device," such as a human-worn computer (e.g., a wristband or watch)). Specifically, the weight of the spectrometer device, specifically the portable spectrometer device, may be in the range of 1 g to 100 g, more specifically in the range of 1 g to 10 g.

[0017] As used herein, the term "spectral information" (also referred to as "spectral information" or "spectral information item") is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, information items relating to, at least one object and / or radiation emitted by, at least one object, characterizing at least one optical property of that object, and more specifically, characterizing, for example, at least one information item qualitatively and / or quantitatively representing, at least one of the transmission, absorption, reflection, and emission of that at least one object. As an example, at least one spectral information item may include at least one intensity information, such as information regarding the intensity of at least one type of light transmitted, absorbed, reflected, or emitted by the object, the intensity being, for example, a function of wavelength or a subrange of wavelength within one or more wavelengths (e.g., within a wavelength range). Specifically, the intensity information may correspond to, or be derived from, a signal intensity (specifically an electrical signal) recorded by a spectrometer device in relation to the wavelength or wavelength range of the spectrum.

[0018] Specifically, a spectrometer device can be configured to acquire at least one spectrum or at least a portion of a spectrum of the detection light propagating from an object to the spectrometer. The spectrum can be given in radiometric units describing the spectral flux, for example, in watts per nanometer (W / nm), or in other units, such as as a function of the wavelength of the detection light. Thus, the spectrum can describe the optical power of light, for example, within a specific wavelength band in the NIR spectral range. The spectrum can include one or more optical variables that vary with wavelength, such as power spectral density, electrical signals obtained through optical measurements, etc. As an example, the spectrum can indicate the power spectral density and / or spectral flux of an object (e.g., a sample), for example, relative to a reference sample, such as the transmittance and / or reflectance of the object (specifically, the sample).

[0019] As an example, the spectrum may include at least one measurable optical variable or characteristic of the detection light and / or object, which specifically varies with the irradiating light and / or the detection light. As an example, at least one measurable optical variable or characteristic may include at least one radiometric quantity, such as spectral density, power spectral density, spectral flux, radiant flux, radiant intensity, spectral radiant intensity, irradiance, and spectral irradiance. Specifically, as an example, the spectrometer device (specifically the detector) may measure in watts per square meter (W / m²). 2 Irradiance is measured in units of watts per square meter per nanometer (W / m²). 2 Spectral irradiance is measured in watts per nanometer (W / nm). Based on the measured quantities, the spectral flux in watts per nanometer (W / nm) and / or the radiative flux in watts (W) can be determined (e.g., calculated) by taking into account the area of ​​the detector.

[0020] As used herein, the term "object" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a particular or customary meaning. The term may specifically refer to, but is not limited to, any body selected from living and inanimate objects. Thus, by way of example, at least one object may include one or more articles and / or one or more parts of articles, wherein at least one article or at least one part thereof may include at least one component that can provide a spectrum suitable for study. Additionally or alternatively, an object may be or may include one or more organisms and / or one or more parts thereof, such as one or more body parts of a human (e.g., a user) and / or an animal.

[0021] The spectrometer equipment includes:

[0022] - At least one light-emitting element, the at least one light-emitting element being configured to emit illumination light to illuminate the at least one object in at least one illumination plane;

[0023] - At least one imaging system, the imaging system including at least one detector configured to detect detection light from the object and to generate at least one detector signal when the detection light is detected, wherein the imaging system further includes at least one optical element for guiding the detection light onto the detector, wherein the imaging system is configured to receive detection light from at least one imaging plane;

[0024] - At least one sample interface configured to allow the illumination light to illuminate the object and to allow the detection light from the object to propagate to the imaging system, wherein the sample interface is configured to define the measurement orientation of the spectrometer relative to the object, specifically during the spectral measurement of the object.

[0025] The imaging plane of the imaging system is positioned at a certain distance from the illumination plane.

[0026] As used herein, the term "light" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a particular or customary meaning. Specifically, the term may refer to, but is not limited to, electromagnetic radiation in one or more of the infrared, visible, and ultraviolet spectral ranges. In this document, the term "ultraviolet spectral range" generally refers to electromagnetic radiation with wavelengths from 1 nm to 380 nm, preferably from 100 nm to 380 nm. Further, in part according to the standard ISO-21348, the effective version of this document as of the date of this document, the term "visible spectral range" generally refers to the spectral range from 380 nm to 760 nm. The term "infrared spectral range" (IR) generally refers to electromagnetic radiation from 760 nm to 1000 µm, wherein the range from 760 nm to 1.5 µm is generally referred to as the "near-infrared spectral range" (NIR), the range from 1.5 µm to 15 µm is referred to as the "mid-infrared spectral range" (MidIR), and the range from 15 µm to 1000 µm is referred to as the "far-infrared spectral range" (FIR). Preferably, the light used for the typical purposes of this invention is light in the infrared (IR) spectral range, more preferably light in the near-infrared (NIR) and / or mid-infrared (MidIR) spectral range, especially light with wavelengths of 1 µm to 5 µm, preferably 1 µm to 3 µm. This is because the material properties or characteristics relating to the chemical composition of many objects can be obtained from the near-infrared spectral range. However, it should be noted that spectral analysis in other spectral ranges is also applicable and within the scope of this invention.

[0027] As used herein, the term "light-emitting element" is a broad term and is given its common and customary meaning to those skilled in the art, but is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, any device configured to generate or provide light as defined above. A light-emitting element may include at least one illumination source configured to generate light in the sense defined above. Specifically, a light-emitting element may be or may include at least one electric light source.

[0028] The light-emitting element may include at least one element selected from the group consisting of: a thermal radiator, such as an incandescent lamp and / or a thermal infrared emitter; a laser, specifically a vertical-cavity surface-emitting laser (VCSEL), more specifically a laser emitting at least one wavelength in the infrared region; a light-emitting diode (LED), specifically an LED emitting light at least partially in the infrared spectral range and / or an LED illuminating a light-emitting material for light conversion of light generated by the LED, wherein the light-emitting material generates converted light at least partially in the near-infrared spectral range; and a thermal emitter based on a microelectromechanical system (MEMS).

[0029] In spectroscopy, it is important to distinguish between various light sources and optical paths. In the context of this invention, the nomenclature used first refers to the light propagating from the light-emitting element to the object as "illuminating light" (or "illumination light"). Secondly, the light propagating from the object to the detector is referred to as "detection light." Detection light can include at least one of the following: illuminating light reflected by the object, illuminating light scattered by the object, illuminating light transmitted by the object, and light emitted by the object (e.g., phosphorescence or fluorescence generated by the object after optical, electrical, or acoustic excitation by illuminating light). Therefore, detection light can be generated directly or indirectly by illuminating the object with illuminating light.

[0030] Therefore, as used herein, the term "irradiation" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, the process of exposing at least one element to light.

[0031] As used herein, the term "illumination plane" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom meaning. Specifically, the term may refer to, but is not limited to, any two-dimensional region including illuminating light. The illumination plane may specifically be or may include an illumination spot defined by the illuminating light. Specifically, the illumination plane may be or may include an illumination spot defined by a beam of illuminating light illuminating an object. The illuminating light may be focused in the illumination plane. For example, the illumination plane may include the focal plane of a light-emitting element emitting the illuminating light. The illumination plane may specifically coincide with at least one surface of the object.

[0032] For example, the light-emitting element may include a light-emitting diode (LED), specifically an LED that emits light at least partially within the infrared spectral range. Alternatively or additionally, the light-emitting element may include an LED that emits light that illuminates a light-emitting material, specifically a phosphor, for converting the light generated by the LED, wherein the light-emitting material generates converted light at least partially within the near-infrared spectral range.

[0033] As used herein, the term "light-emitting diode" or simply "LED" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom meaning. Specifically, the term may refer to, but is not limited to, optoelectronic semiconductor devices capable of emitting light when an electric current flows through them. Optoelectronic semiconductor devices can be configured to generate light due to one or more of various physical processes, including spontaneous emission, induced emission, decay of metastable excited states, etc. Thus, by way of example, a light-emitting diode may include one or more of the following: a light-emitting diode based on spontaneous emission (particularly an organic light-emitting diode), a superluminescent light-emitting diode (sLED), or a laser diode (LD). In the following, without reducing possible embodiments of a light-emitting diode to any of the foregoing physical principles or configurations, the abbreviation "LED" will be used for any type of light-emitting diode.

[0034] Specifically, an LED may comprise at least two semiconductor material layers, wherein light can be generated at at least one interface between the at least two semiconductor material layers, specifically due to the recombination of positive and negative charges (e.g., electron-hole recombination). The at least two semiconductor material layers may have different electrical properties; for example, at least one of these layers may be an n-doped semiconductor material, and at least one of these layers may be a p-doped semiconductor material. Therefore, as an example, an LED may comprise at least one pn junction and / or at least one pin structure. However, it should be noted that other device structures are also feasible. At least one semiconductor material may specifically be or may comprise at least one inorganic semiconductor material. However, it should be noted that organic semiconductor materials may be used additionally or alternatively.

[0035] Typically, an LED converts electrical current into light, specifically light that is at least partially located in the infrared spectrum. Alternatively or additionally, an LED can convert electrical current into light, into primary light, and more specifically, into blue primary light. Therefore, an LED can specifically be a blue LED. An LED can be configured to generate primary light, particularly for light conversion in a phosphor, also known as "pump light." Therefore, an LED can also be called a "pumped LED." An LED can specifically include at least one LED chip and / or at least one LED die. Therefore, the semiconductor element of an LED can include a bare LED chip.

[0036] As used herein, the term "luminescence" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, the process by which a substance spontaneously emits light not caused by heat. Specifically, luminescence may refer to cold body radiation. More specifically, luminescence can be initiated or excited by irradiation with light, in which case it is also referred to as "photoluminescence." In the context of this invention, the property of a material capable of luminescence is referred to by the adjective "luminescent." At least one luminescent material may specifically be a photoluminescent material, i.e., a material capable of emitting light after absorbing photons or excitation light. Specifically, the luminescent material may have a positive Stokes shift, which generally refers to the fact that the secondary light is redshifted relative to the primary light.

[0037] Therefore, at least one luminescent material can form at least one transducer (also called a light transducer) that converts primary light into secondary light with different spectral characteristics compared to the primary light. Specifically, the spectral width of the secondary light can be greater than that of the primary light, and / or the emission center of the secondary light can be shifted (specifically, redshifted). Specifically, at least one luminescent material can be absorbent in the ultraviolet and / or blue spectral range and emissive in the near-infrared and / or infrared spectral range. Therefore, typically, the luminescent material or transducer can form at least one component of a phosphor LED that focuses primary light or pump light, particularly in the blue spectral range, into light with a longer wavelength, for example, in the near-infrared or infrared spectral range.

[0038] Therefore, the luminescent material can specifically form at least one transducer or light converter. The luminescent material can form at least one of a conversion sheet, a luminescent coating (specifically a phosphor coating) on ​​an LED, and a phosphor coating on an LED. As an example, the luminescent material may include one or more of the following materials: cerium-doped YAG (YAG:Ce3+ or Y3Al5O12:Ce3+); rare-earth-doped Sialon; copper-aluminum co-doped zinc sulfide (ZnS:Cu,Al).

[0039] LEDs and luminescent materials together can form what is known as “phosphorescent LEDs.” Therefore, as used herein, the term “phosphorescent light-emitting diode” or simply “phosphorescent LED” is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to any particular or custom meaning. Specifically, the term can refer to, but is not limited to, a combination of at least one light-emitting diode configured to generate primary light or pump light and at least one luminescent material (also referred to as a “phosphor”) configured to convert the primary light generated by the light-emitting diode. Phosphorescent LEDs can form packaged LED light sources comprising an LED die (e.g., a blue LED emitting blue pump light) and a phosphor, for example, which is wholly or partially coated on the LED and, by way of example, configured to convert primary light or blue light into light with different spectral characteristics (specifically, into near-infrared light). Typically, phosphorescent LEDs can be packaged in a housing or can be unpackaged. Therefore, the LED and the at least one luminescent material for converting the primary light generated by the light-emitting diode can be specifically housed in a common housing. However, alternatively, LEDs can also be unencapsulated or bare LEDs, which can be completely or partially covered with light-emitting material, for example, by setting one or more layers of light-emitting material on the LED die. Phosphor LEDs can typically form the emitter or light source themselves.

[0040] The irradiation light may specifically have a spectral range that is at least partially located in the near-infrared spectral range, specifically in the spectral range of 1 µm to 3 µm, preferably 1.3 µm to 2.5 µm, more preferably 1.5 µm to 2.2 µm.

[0041] As outlined above, a spectrometer device includes at least one imaging system. As used herein, the term "system" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, any set of interacting or interdependent components forming a whole. Specifically, the components of the system may be configured to interact with each other to jointly achieve at least one common function. The components of the system may be processed independently, or may be coupled or connectable. As used herein, the term "imaging system" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, a system comprising one or more optical components configured for imaging, specifically for interacting with light, transmitting, reflecting, absorbing, and diffracting light (specifically detecting light).

[0042] An imaging system includes at least one detector. As used herein, the verb “detect” is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, the process of qualitatively and / or quantitatively determining, measuring, and monitoring at least one parameter (e.g., at least one of physical, chemical, and biological parameters). Specifically, physical parameters may be or may include electrical parameters. Therefore, as used herein, the term “detector” is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, any device configured for detecting, i.e., qualitatively and / or quantitatively determining, measuring, and monitoring at least one parameter (e.g., at least one of physical, chemical, and biological parameters). At least one detector may be configured to generate at least one detector signal, more specifically at least one electrical detector signal, such as an analog and / or digital detector signal, which provides information about at least one parameter measured by the detector. The detector signal can be provided directly or indirectly to the evaluation unit of the spectrometer device by at least one detector, such that at least one detector and the evaluation unit can be directly or indirectly connected. The detector signal can be used as a "raw" detector signal and / or can be processed or preprocessed (e.g., by filtering) before further use. Therefore, at least one detector may include at least one processing device and / or at least one preprocessing device, such as at least one of an amplifier, an analog-to-digital converter, an electrical filter, and a Fourier transform.

[0043] At least one detector can be configured to detect light propagating from an object to a spectrometer device, or more specifically, to at least one detector within the spectrometer device. At least one detector can be configured to determine at least one optical parameter, such as the intensity and / or power of light irradiating at least one sensitive region of the detector. More specifically, at least one detector may include at least one photosensitive element and / or at least one optical sensor, such as at least one of a photodiode, photocell, photoresistor, phototransistor, thermopile sensor, photoacoustic sensor, pyroelectric sensor, photomultiplier, and calorimeter. Therefore, at least one detector can be configured to generate at least one detector signal, more specifically, at least one electrical detector signal in the foregoing sense, which provides information about at least one optical parameter (such as the power and / or intensity of light irradiating the detector or a sensitive region of the detector). At least one detector may be a lead sulfide (PbS) detector.

[0044] The detector may include multiple photosensitive elements, each of which may be configured to generate at least one detector signal upon detection of a detection light, wherein, for example, multiple detector signals may be used to obtain spectral information. The multiple photosensitive elements may be arranged in at least one of a one-dimensional array (specifically a linear array) and a two-dimensional array. As used herein, the term "array" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a particular or custom meaning. The term may specifically refer to, but is not limited to, a spatial arrangement of two or more photosensitive elements. The array may include, for example, a series of optical sensors, which may preferably be arranged as a one-dimensional matrix along the length of a variable-length filter in a single line, or arranged in more than one line, particularly two, three, or four parallel lines, especially in the form of a two-dimensional matrix, in order to receive as much of the intensity of the incident light as possible. Therefore, the number of photosensitive elements N in one direction can be higher than the number of photosensitive elements M in the other direction, making it possible to obtain a one-dimensional 1 × N matrix or a rectangular two-dimensional M × N matrix, where M < 10 and N ≥ 10, preferably N ≥ 20, and more preferably N ≥ 50. Alternatively, the matrix can be arranged in an alternating pattern.

[0045] These multiple photosensitive elements can be sensitive to different, specific, non-overlapping wavelength ranges. For example, a first photosensitive element can detect light within a first wavelength range, and a second photosensitive element can detect light within a second wavelength range, wherein the first and second wavelength ranges can differ from each other, particularly in that their wavelength ranges do not overlap. Additionally, other photosensitive elements can detect light within other wavelength ranges, wherein these other wavelength ranges can differ from each other and are distinct from both the first and second wavelength ranges, particularly in that they do not overlap.

[0046] As outlined above, the imaging system further includes at least one optical element. As used herein, the term "optical element" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, any device configured to interact with light in a predefined manner, such as causing the light to change one or more of its propagation direction, spectral composition, or other optical properties. The optical element may be configured to alter the path of the detection light, specifically to guide the detection light onto the detector. Alternatively or additionally, the optical element may interact with the incident light through reflection, scattering, refraction, diffraction, birefringence, dispersion, and / or absorption to guide the detection light onto the detector. Alternatively or additionally, the optical element may modify the intensity, spectral composition, orientation, phase, polarization, direction of the detection light, and / or beam shape.

[0047] The optical element may specifically be selected from the group consisting of: mirrors, specifically curved mirrors and / or freeform mirrors; lenses, specifically focusing lenses; apertures; optical waveguides; optical fibers; gratings; waveplates; prisms; active optical elements, such as micromirror arrays, liquid crystal arrays and / or another type of spatial light modulator (SLM); and combinations of at least one of the aforementioned optical elements.

[0048] As outlined above, the imaging system is configured to receive detection light from at least one imaging plane. As used herein, the term "imaging plane" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to any particular or custom meaning. The term may specifically refer to, but is not limited to, any two-dimensional light-collecting region. Specifically, the imaging plane may be defined by the field of view of the imaging system. The imaging system may be specifically configured to receive detection light emitted from the imaging plane. The imaging plane may be or may include the light-collecting plane of the imaging system. For example, the imaging plane may include, specifically, at least one focusing plane. The imaging system may be configured to receive detection light emitted from the focusing plane. The imaging system may focus toward the focusing plane. Specifically, the focusing plane may define the light-collecting plane of the imaging system to which the received light intensity is higher than that of any other light-collecting plane. Alternatively or additionally, the imaging plane of the imaging system may be different from the illumination plane. Alternatively or additionally, the imaging plane of the imaging system may be positioned at a distance from the illumination plane corresponding to the penetration depth of the illumination light in the object.

[0049] For example, the imaging plane may be at least partially located within the object applied to the sample interface. The imaging plane may be positioned at a distance from the irradiation plane ranging from 0.01 mm to 10 mm, specifically from 0.1 mm to 1.0 mm, more specifically from 0.2 mm to 0.5 mm, and more specifically 0.25 mm, particularly in the direction from the irradiation plane to the object. For example, the object applied to the sample interface may be or may include human or animal skin. In this case, the imaging plane may be located at a distance of 0.25 mm within the object, which specifically corresponds to the penetration depth of light in the infrared spectral range into the skin. The distance of the imaging plane from the irradiation plane may be specifically optimized for each object with different material properties. Alternatively or additionally, the object applied to the sample interface may be or may include inorganic materials, such as textiles or plastics. In this case, the imaging plane may be located at a distance ranging from 0.1 mm to 1.0 mm within the object, specifically 0.25 mm, which specifically corresponds to the penetration depth of light in the infrared spectral range into the inorganic material.

[0050] For example, an optical element for guiding detection light onto a detector may include at least one lens having at least one focal length, specifically at least one focusing lens, wherein the lens may be arranged to focus the detection light onto the detector. As used herein, the term "lens" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a particular or custom meaning. The term may specifically refer to, but is not limited to, an optically transparent element having at least one curved surface, particularly a surface curved in a spherical manner. Incident light, specifically an incident ray, or a beam may be bent at at least one surface of the lens, particularly depending on at least one of the following: the refractive index of the lens, and the wavelength of the incident radiation. The incident light (e.g., a ray) may be bent toward the center of the beam comprising the ray. Alternatively, the incident light (e.g., a ray) may be away from the center of the beam comprising the ray. The lens may have a convex surface for collecting the incident light and / or a concave surface for dispersing the incident light. The lens may specifically be a focusing lens for focusing detection light onto a detector. The lens may be arranged such that the imaging plane of the imaging system is positioned at a distance from the illumination plane.

[0051] Alternatively or additionally, the optical element used to guide the detection light onto the detector may include at least one freeform mirror, wherein the freeform mirror may be arranged to reflect the detection light onto the detector. As used herein, the term "freeform mirror" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term may specifically refer to, but is not limited to, an optical mirror having an asymmetric reflective surface. The freeform mirror may have at least one focal length such that the imaging plane of the imaging system is positioned at a distance from the object illumination plane. The focal length may be in the range of 5 mm to 15 mm, specifically in the range of 10 mm to 15 mm, and more specifically 12 mm. However, in principle, other forms of mirrors are also feasible, such as plane mirrors or curved mirrors. The surface of the curved mirror may be curved such that the imaging plane of the imaging system is positioned at a distance from the object illumination plane.

[0052] Alternatively or additionally, the optical element for guiding detection light onto the detector may include at least one aperture with an aperture stop, wherein the aperture may be arranged in the beam path of the detection light. As used herein, the term "aperture" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a particular or customary meaning. The term may specifically refer to, but is not limited to, an aperture or opening in the aperture for transmitting light, specifically detection light, onto the detector. The aperture may specifically have a circular shape. The size of the aperture or opening (e.g., the diameter of the aperture) may define the aperture stop of the aperture. The aperture with the aperture stop may be arranged such that the imaging plane of the imaging system is positioned at a distance from the illumination plane.

[0053] The imaging system can be configured to receive images with angular distributions on the sample interface. The detection light has a centroid angle in the range of 0° to 90°, specifically in the range of 15° to 75°, more specifically in the range of 30° to 70°, and more specifically in the range of 45° to 65°. This angle... Specifically, it can be the angle between the detection light ray on the sample interface and the surface normal of the sample interface. As the angle... By reducing the range of 15° to 75°, more specifically 30° to 70°, and even more specifically 45° to 65°, the fluctuation of the spectrum can be reduced.

[0054] Imaging systems can have a resolution of 1 mm. 2 Up to 100 mm 2 Within the range, specifically within 5 mm 2 Up to 55 mm 2 Within the range, more specifically within 5 mm 2 Up to 20 mm 2 Within the range, more specifically within 10 mm 2 Up to 15 mm 2 At least one light detection region within the range. The light detection region can be the area of ​​one or more of the optical elements and detectors in the imaging system. By increasing the size by 1 mm 2 Up to 100 mm 2 Within the range, specifically within 5 mm 2 Up to 55 mm 2 Within the range, more specifically within 5 mm 2 Up to 20 mm 2 Within the range, more specifically within 10 mm 2 Up to 15 mm 2 Within the range of the light detection area, the signal intensity of the detection light at the detector can be increased.

[0055] An imaging system can be configured to receive detection light from at least one elliptical light-collecting profile in an imaging plane. As used herein, the term "elliptical light-collecting profile" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, a light-collecting region having an elliptical boundary. Thus, the boundary of the light-collecting region can be described by a curve around two foci, such that for all points on the curve, the sum of the two distances to the foci is constant. In the case of an elliptical light-collecting profile, the imaging system can be configured to receive equal or nearly constant light intensities from reflective planes at different heights. An elliptical light-collecting profile allows for the collection of detection light from different reflective planes at certain angles.

[0056] As outlined above, the spectrometer device includes at least one sample interface. As used herein, the term "sample interface" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, any surface on which an object is intended to interact with the spectrometer device, such as a measurement surface. The sample interface may be or may include a real measurement surface or a hypothetical measurement surface. To interact with the object, the spectrometer device may emit illumination light, particularly causing the object to generate detection light. Additionally, the spectrometer device may receive detection light. The sample interface may specifically define the measurement posture of the object relative to the spectrometer device to allow optical interaction with the object as intended. Positioning the object in a measurement posture, particularly as defined by the sample interface, allows at least one of receiving illumination light and generating detection light by the object to be performed in a contemplated manner, specifically minimizing the signal-to-noise ratio of the spectrometer device.

[0057] As used herein, the term "measurement posture" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a particular or custom meaning. Specifically, the term may refer to, but is not limited to, the relative position and / or orientation of an object relative to the spectrometer apparatus, and specifically relative to the sample interface, which is intended to assume, and in particular allow, during spectroscopic measurements, an interaction between the spectrometer apparatus and the object as expected (e.g., as anticipated based on the setup and / or arrangement of the components of the spectrometer apparatus).

[0058] The sample interface can be an abstract element and may not require structural features, such as when the sample interface is an area in the environment of the spectrometer device. Alternatively, the device window of the device, particularly the outer surface of the device window, can be used as the sample interface. Further, the sample interface may include at least one spectrometer window. At least one contact surface of the spectrometer window can define the measurement posture of the spectrometer device relative to the object, and particularly, the contact surface can be configured to contact the object during spectral measurements. The spectrometer window can be configured to transmit detection light and illumination light. As used herein, the term "specttrometer window" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term can specifically refer to, but is not limited to, any optically transparent window of the spectrometer device. The spectrometer window can be positioned in the beam path of the illumination light and / or detection light. Typically, the spectrometer window can have a transparency coefficient (also called a transmittance coefficient) greater than 90%, preferably greater than 95%, specifically for light within the relevant spectral range. Additionally, for light outside the relevant spectral range, the spectrometer window can have a transmittance coefficient less than 10%, preferably less than 5%. As an example, the relevant spectral range may include the infrared spectral range. Additionally or alternatively, the spectrometer window may have a transmission coefficient that depends on the angle of incidence. For example, within the infrared spectral range, the transmission coefficient may be higher than 99% for an angle of incidence in the range of 0° to 20°, wherein the transmission coefficient may be higher than 98% for an angle of incidence in the range of 21° to 50°, wherein the transmission coefficient may be higher than 92% for an angle of incidence in the range of 51° to 60°, wherein the transmission coefficient may be higher than 80% for an angle of incidence in the range of 61° to 70°, and wherein the transmission coefficient may be higher than 50% for an angle of incidence in the range of 71° to 80°.

[0059] A spectrometer window may be arranged within the housing of the spectrometer device. Alternatively or additionally, the spectrometer window may form a closure of the spectrometer device. In particular, the spectrometer window may include an outer surface, specifically facing directly to the exterior of the spectrometer device. The outer surface of the spectrometer window may be in contact with the surrounding environment, particularly where the surrounding environment is not contained and / or enclosed by the spectrometer device, for example, by being enclosed by the housing of the spectrometer device. The spectrometer window may include an inner surface facing the interior of the spectrometer device. The outer surface may be opposite to the inner surface. The inner surface of the spectrometer window may be in contact with a closed environment within the spectrometer device, particularly where the closed environment within the spectrometer device is enclosed by the housing of the spectrometer device. The closed environment within the spectrometer device may include components of the spectrometer device and / or gases contained within the spectrometer device, such as ambient air, specifically dried ambient air dried via a drying chamber, or gel, and / or nitrogen, and / or rare gases. The outer surface may be configured to contact an object during spectroscopic measurements and thereby serve as a sample interface.

[0060] The spectrometer device may further include at least one wavelength selection element for selectively transmitting light within at least one wavelength range. As used herein, the term "wavelength selection element" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, any optical element that interacts with different spectral portions of incident light in various ways, for example, by having at least one wavelength-dependent optical characteristic (such as at least one wavelength-dependent optical characteristic selected from a list consisting of reflectivity, direction of reflection, refractive index, direction of refraction, absorption, transmission, and refractive index). The wavelength selection element may be disposed in at least one of the beam path of the illuminating light and the beam path of the detection light.

[0061] The wavelength selection element may include at least one of a tunable wavelength selection element and a wavelength selection element with a fixed transmission spectrum. The wavelength selection element may be configured such that each of the photodetectors can be exposed to the same spectral range of the detection light or different, specifically non-overlapping, spectral ranges of the detection light. As an example, by using a tunable wavelength selection element, different wavelength ranges can be selected sequentially, while by using a wavelength selection element with a fixed transmission spectrum, the selection of the wavelength range may be fixed but may depend on, for example, the detection position, thereby allowing, for example, different detectors and / or different photodetectors of the detectors to be exposed to light of different spectral ranges simultaneously in the beam path of the detection light.

[0062] Wavelength selection elements may include at least one element selected from the group consisting of: optical filters; bandpass filters; variable-length filters; static filters; tunable filters; specifically MEMS Fabry-Perot resonators; optical lenses; diffraction elements; gratings; prisms; plasmonic filters; and metamaterials. Wavelength selection elements may include one or more of the following: dispersive elements (e.g., prisms) or diffraction elements (gratings), or detectors having inherently finite spectral response bandwidths. More specifically, the spectrometer device may include at least one filter element disposed in the beam path of light from the object (i.e., in the beam path of the detection light), wherein the filter element may be specifically configured such that each photosensitive element is exposed to a separate spectral range of light from the object. As an example, a variable filter element may be used, the transmission of which depends on the position on the filter element, such that when the variable filter element is placed on top of an array of photosensitive elements, each photosensitive element is exposed to a different spectral range of incident light (specifically, the detection light from the object). Additionally or alternatively, at least one wavelength selection element may include at least one of the following: an array of individual bandpass filters, a patterned filter array, a MEMS interferometer, or a MEMS Fabry-Perot interferometer. Other elements are also possible.

[0063] As outlined above, the detector may include multiple photosensitive elements, such as multiple photosensitive elements arranged in an array. A wavelength selection element may be configured to selectively transmit light such that at least two of the multiple photosensitive elements are exposed to separate, specifically offset wavelength ranges of detection light from the object. For example, the wavelength selection element may include multiple bandpass filters, wherein each bandpass filter may be arranged within the field of view of a particular photosensitive element. Each bandpass filter may be configured to selectively transmit incident light, specifically at least one wavelength range of the detection light. The wavelength ranges of the bandpass filters may be specifically different from each other, and more specifically, may be non-overlapping wavelength ranges.

[0064] The spectrometer device further includes at least one evaluation unit for evaluating at least one detector signal generated by the detector and for obtaining spectral information about the object from the detector signal. As used herein, the term "evaluation" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term may specifically refer to, but is not limited to, the process of processing at least one first information item to generate at least one second information item. Therefore, as used herein, the term "evaluation unit" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term may specifically refer to, but is not limited to, any device or combination of devices configured to evaluate or process at least one first information item to generate at least one second information item thereof. Therefore, specifically, the evaluation unit may be configured to process at least one input signal and generate at least one output signal thereof. As an example, at least one input signal may include at least one detector signal provided directly or indirectly by the detector, specifically from multiple detector signals from multiple photosensitive elements.

[0065] As an example, the evaluation unit may be or may include one or more integrated circuits (such as one or more application-specific integrated circuits (ASICs)) and / or one or more data processing devices (such as one or more of a computer, digital signal processor (DSP), or field-programmable gate array (FPGA), preferably one or more microcomputers and / or microcontrollers. Additional components may be included, such as one or more preprocessing devices and / or data acquisition devices, such as one or more devices for receiving and / or preprocessing detector signals, such as one or more AD converters and / or one or more filters. Further, the evaluation unit may include one or more data storage devices. Further, the evaluation unit may include one or more interfaces, such as one or more wireless interfaces and / or one or more wired interfaces.

[0066] The evaluation unit may be adapted to execute at least one computer program, such as at least one computer program that performs or supports the information item generation step. As an example, one or more algorithms may be implemented that, by using at least one detector signal, perform a predetermined transformation to obtain spectral information about the object, such as to obtain a corrected spectrum and / or to obtain at least one spectral piece of information describing at least one characteristic of the object. For this purpose, the evaluation unit may specifically include at least one data processing device (also called a processor, particularly an electronic data processing device) designed to generate desired information by evaluating the detector signal. The evaluation unit may use any process to generate the desired information, such as by calculating and / or using at least one stored and / or known relation. Specifically, the evaluation unit may be configured to perform at least one digital signal processing (DSP) technique on the primary detector signal or any secondary detector signal derived therefrom, particularly at least one Fourier transform. Additionally or alternatively, the evaluation unit may be configured to perform one or more other digital signal processing techniques on the primary detector signal or any secondary detector signal derived therefrom, such as windowing, filtering, the Goertzel algorithm, cross-correlation, and autocorrelation. In addition to the detector signal, one or more additional parameters and / or information items may also affect the relationship. This relationship can be determined or determined by empirical, analytical, or semi-empirical methods. As an example, the relationship may include at least one of a model or calibration curve, at least one set of calibration curves, at least one function, or a combination of the mentioned possibilities. One or more calibration curves may be stored, for example, in a data storage device and / or a table as a set of values ​​and their associated function values. However, alternatively or additionally, at least one calibration curve may also be stored, for example, in a parametric form and / or as a functional equation. A separate relationship can be used to process the detector signal into information items. Alternatively, at least one combined relationship for processing the detector signal is feasible. Various possibilities are conceivable, and these possibilities can also be combined.

[0067] In another aspect of the invention, a mobile device, specifically a mobile communication device, is disclosed, the mobile device including at least one spectrometer device according to the invention (e.g., according to any of the embodiments disclosed above and / or according to any of the embodiments further detailed below).

[0068] As used herein, the term "mobile device" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom meaning. The term may specifically refer to, but is not limited to, mobile electronic devices, and more specifically, mobile communication devices, such as cellular phones, smartphones, or wearable devices. Additionally or alternatively, a mobile device may also refer to a tablet computer or other type of portable computer. A mobile device may be configured to provide access to at least one telecommunications network (such as a mobile phone, smartphone, or wearable device). In the sense defined above, a mobile device can be a portable device.

[0069] In another aspect of the invention, a method for obtaining spectral information about at least one object is disclosed. The method includes the following steps, which can be performed in a given order. However, different orders are also possible. In particular, one, more than one, or even all method steps may be performed once or repeatedly. Further, these method steps may be performed sequentially, or alternatively, one or more method steps may be performed in a timely overlapping manner or even in a parallel and / or combined manner. The method may further include additional method steps not listed.

[0070] The method includes:

[0071] a) Provide at least one spectrometer device according to the present invention (e.g., according to any of the embodiments disclosed above and / or according to any of the embodiments further detailed below);

[0072] b) Illuminate at least one object with light by using a light-emitting element;

[0073] c) Detect detection light from the object using a detector of an imaging system and generate at least one detector signal.

[0074] As outlined above, the spectrometer device may further include at least one evaluation unit. The method may further include evaluating at least one detector signal generated by the detector using the evaluation unit and obtaining spectral information about the object from the detector signal.

[0075] The method, specifically at least step c, may be computer-implemented or at least computer-controlled. As used herein, the term "computer-implemented" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom-defined meaning. Specifically, the term may refer to, but is not limited to, a process implemented wholly or partially using a data processing apparatus (e.g., a data processing apparatus including at least one processing unit). The method, specifically step c, may be implemented by a computer, or at least computer-controlled or computer-assisted, using an evaluation unit of a spectrometer device.

[0076] This document further discloses and proposes a computer program comprising computer-executable instructions for performing and / or controlling the methods according to the invention in one or more embodiments included herein, when executed on a computer or computer network, specifically on an evaluation unit of a spectrometer device. Specifically, the computer program may be stored on a computer-readable data carrier and / or a computer-readable storage medium.

[0077] As used herein, the terms "computer-readable data carrier" and "computer-readable storage medium" specifically refer to non-transitory data storage devices, such as hardware storage media on which computer-executable instructions are stored. Computer-readable data carriers or storage media can specifically be or may include storage media such as random access memory (RAM) and / or read-only memory (ROM).

[0078] Therefore, specifically, one, more, or even all of the method steps a) to c) as described above can be performed and / or controlled by using a computer or computer network, preferably by using a computer program, more preferably by using a computer program executed by the evaluation unit of the spectrometer device.

[0079] This document further discloses and proposes a computer program product with program code means for executing and / or controlling the methods according to the invention in one or more embodiments included herein when the program is executed on a computer or computer network, specifically on an evaluation unit of a spectrometer device. Specifically, the program code means may be stored on a computer-readable data carrier and / or a computer-readable storage medium.

[0080] This document further discloses and proposes a data carrier having a data structure stored thereon, which, after being loaded into a computer or computer network (e.g., into the working memory or main memory of the computer or computer network, such as the working memory or main memory of the evaluation unit of a spectrometer device), can execute and / or control the spectrometer to execute methods according to one or more embodiments disclosed herein.

[0081] This document further discloses and proposes a computer program product having program code means stored on a machine-readable medium to execute and / or control methods according to one or more embodiments disclosed herein when the program is executed on a computer or computer network, specifically on an evaluation unit of a spectrometer device. As used herein, a computer program product refers to a program that is a tradable product. The product can generally exist in any format, such as in paper format, or on a computer-readable data carrier and / or computer-readable storage medium. Specifically, the computer program product can be distributed via a data network.

[0082] Finally, this document discloses and proposes a modulated data signal containing instructions readable by a computer system or computer network, specifically by an evaluation unit of a spectrometer device, for performing and / or controlling methods according to one or more embodiments disclosed herein.

[0083] Referring to the computer implementation aspects of the present invention, one or more, or even all, of the method steps in the methods according to one or more embodiments disclosed herein can be performed and / or controlled using a computer or computer network, specifically using an evaluation unit of a spectrometer device. Therefore, typically, any of the method steps involving the provision and / or manipulation of data can be performed using a computer or computer network. Generally, these method steps can include any method steps, except for those that typically require manual work, such as providing samples and / or performing certain aspects of actual measurements.

[0084] In one or more of the above embodiments and / or in one or more of the embodiments described in further detail below, the spectrometer device and method according to the invention provide numerous advantages over known devices and methods of similar types. Specifically, the spectrometer device according to the invention allows for a reduction in system sensitivity by shifting the imaging plane into the object to account for variations in the penetration depth of light entering the object. Therefore, it can be assumed that the light-collecting plane of the spectrometer device is located within the sample, which can specifically be referred to as the effective sample plane. The position of the effective sample plane can be shifted into the object, for example, approximately 0.25 mm into the object for an object comprising human or animal skin. Additionally or alternatively, the spectrometer device can have a reduced light-collecting angle for detecting light. A reduced light-collecting angle can reduce fluctuations in the spectrum obtained by the spectrometer device. Additionally or alternatively, the spectrometer device can have an elliptical light-collecting profile. An elliptical light-collecting profile allows for the collection of detection light from different reflective planes at a given angle. Additionally or alternatively, the spectrometer device can have an increased light detection area. Specifically, optical elements (such as mirrors) can collect light at steeper angles and optimize the optical path of the imaging system.

[0085] As used herein, the terms “have,” “include,” or “contain,” or any of their grammatical variations, are used in a non-exclusive manner. Thus, these terms can refer either to a situation where no other features exist in the entity described in the context besides those introduced by these terms, or to a situation where one or more other features exist. For example, the statements “A has B,” “A includes B,” and “A contains B” can refer either to a situation where no other elements exist in A besides B (i.e., A consists solely of B), or to a situation where entity A contains one or more other elements besides B (such as element C, elements C and D, or even other elements).

[0086] Furthermore, it should be noted that the terms "at least one," "one or more," or similar expressions indicating a feature or element may appear once or more, but are typically used only once when describing the corresponding feature or element. In most cases, the expressions "at least one" or "one or more" are not repeated when referring to the corresponding feature or element, but in fact, the corresponding feature or element may appear once or more.

[0087] Furthermore, as used herein, the terms “preferredly,” “more preferably,” “particularly,” “more particularly,” “specifically,” “more specifically,” or similar terms are used in combination with optional features without limiting the possibility of alternatives. Therefore, the features introduced by these terms are optional features and are not intended to limit the scope of the claims in any way. As those skilled in the art will recognize, the invention can be practiced by using alternative features. Similarly, features introduced by phrases such as “in embodiments of the invention” are intended to be optional features and do not limit any alternative embodiments of the invention, the scope of the invention, or the possibility of combining features introduced in this way with other optional or non-optional features of the invention.

[0088] In summary, and without excluding other possible embodiments, the following embodiments are conceivable:

[0089] Example 1: A spectrometer device for obtaining spectral information about at least one object, the spectrometer device comprising:

[0090] - At least one light-emitting element, the at least one light-emitting element being configured to emit illumination light to illuminate the at least one object in at least one illumination plane;

[0091] - At least one imaging system, the imaging system including at least one detector configured to detect detection light from the object and to generate at least one detector signal when the detection light is detected, wherein the imaging system further includes at least one optical element for guiding the detection light onto the detector, wherein the imaging system is configured to receive detection light from at least one imaging plane;

[0092] - At least one sample interface configured to allow the illumination light to illuminate the object and to allow the detection light from the object to propagate to the imaging system, wherein the sample interface is configured to define the measurement orientation of the spectrometer relative to the object, specifically during the spectral measurement of the object.

[0093] The imaging plane of the imaging system is positioned at a certain distance from the illumination plane.

[0094] Example 2: The spectrometer device according to the previous example, wherein the imaging plane of the imaging system is different from the illumination plane.

[0095] Example 3: According to any of the spectrometer devices described in the foregoing embodiments, the imaging plane of the imaging system is positioned at a certain distance from the irradiation plane, the distance corresponding to the penetration depth of the irradiation light in the object.

[0096] Example 4: According to any of the spectrometer devices described in the foregoing embodiments, the optical element is selected from the group consisting of: mirrors, specifically curved mirrors and / or freeform mirrors; lenses, specifically focusing lenses; apertures; optical waveguides; optical fibers; gratings; waveplates; prisms; active optical elements, such as micromirror arrays, liquid crystal arrays and / or another type of spatial light modulator (SLM); combinations of at least one of the foregoing optical elements.

[0097] Example 5: According to any of the spectrometer devices described in the foregoing embodiments, the optical element for guiding the detection light onto the detector includes at least one lens having at least one focal length, specifically at least one focusing lens, wherein the lens is arranged to focus the detection light onto the detector.

[0098] Example 6: The spectrometer device according to the previous example, wherein the lens is arranged such that the imaging plane of the imaging system is positioned at a certain distance from the illumination plane.

[0099] Example 7: According to any of the spectrometer devices described in the foregoing embodiments, the optical element for guiding the detection light onto the detector includes at least one freeform mirror, wherein the freeform mirror is arranged to reflect the detection light onto the detector.

[0100] Example 8: The spectrometer device according to the previous example, wherein the freeform mirror has at least one focal length, such that the imaging plane of the imaging system is positioned at a certain distance from the illumination plane.

[0101] Example 9: The spectrometer device according to any one of the two preceding examples, wherein the focal length is in the range of 5 mm to 15 mm, specifically in the range of 10 mm to 15 mm, more specifically 12 mm.

[0102] Example 10: According to any of the spectrometer devices described in the foregoing embodiments, the optical element for guiding the detection light onto the detector includes at least one aperture with at least one aperture stop, wherein the aperture is arranged in the beam path of the detection light.

[0103] Example 11: According to the spectrometer device of the previous embodiment, the aperture with the aperture stop is arranged such that the imaging plane of the imaging system is positioned at a certain distance from the illumination plane.

[0104] Example 12: According to any of the spectrometer devices described in the foregoing embodiments, the imaging plane includes, specifically, at least one focusing plane, wherein the imaging system is configured to receive detection light emitted from the focusing plane.

[0105] Example 13: According to any of the spectrometer devices described in the foregoing embodiments, the imaging plane is at least partially located in the object applied to the sample interface.

[0106] Example 14: According to any of the spectrometer devices described in the foregoing embodiments, the imaging plane is positioned at a distance from the irradiation plane within the range of 0.01 mm to 10 mm, specifically within the range of 0.1 mm to 1.0 mm, more specifically within the range of 0.2 mm to 0.5 mm, and more specifically at a distance of 0.25 mm.

[0107] Example 15: According to any of the spectrometer devices described in the foregoing embodiments, wherein the imaging system is configured to receive images having an angular distribution on the sample interface. The detection light has a centroid angle in the range of 0° to 90°, specifically in the range of 15° to 75°, more specifically in the range of 30° to 70°, and more specifically in the range of 45° to 65°.

[0108] Example 16: According to any of the spectrometer devices described in the foregoing embodiments, wherein the imaging system has an imaging capability of 1 mm. 2 Up to 100 mm 2 Within the range, specifically within 5 mm 2 Up to 55 mm 2 Within the range, more specifically within 5 mm 2 Up to 20 mm 2 Within the range, more specifically within 10 mm 2 Up to 15 mm 2 At least one light detection area within the range.

[0109] Example 17: According to any of the spectrometer devices described in the foregoing embodiments, wherein the imaging system is configured to receive detection light from at least one elliptical light collection profile in the imaging plane.

[0110] Example 18: A spectrometer device according to any of the foregoing embodiments, wherein the light-emitting element includes at least one element selected from the group consisting of: a thermal radiator; a laser, specifically a vertical-cavity surface-emitting laser (VCSEL), more specifically a laser emitting at least one wavelength in the infrared region; a light-emitting diode (LED), specifically an LED emitting light at least partially in the infrared spectral range and / or an LED illuminating a light-emitting material for light conversion of light generated by the LED, wherein the light-emitting material generates converted light at least partially in the near-infrared spectral range; a thermal emitter based on a microelectromechanical system (MEMS).

[0111] Example 19: According to any of the spectrometer devices described in the foregoing embodiments, the irradiation light has a spectral range that is at least partially located in the near-infrared spectral range, specifically in the spectral range of 1 µm to 3 µm, preferably 1.3 µm to 2.5 µm, more preferably 1.5 µm to 2.2 µm.

[0112] Example 20: According to any of the spectrometer devices described in the foregoing embodiments, the detector includes a plurality of photosensitive elements, wherein each of these photosensitive elements is configured to generate at least one detector signal when the detection light is detected.

[0113] Example 21: The spectrometer device according to the previous example, wherein the plurality of photosensitive elements are arranged in at least one of a one-dimensional array (specifically a linear array) and a two-dimensional array.

[0114] Example 22: According to any of the foregoing embodiments, the spectrometer device further includes at least one wavelength selection element for selectively transmitting light within at least one wavelength range, wherein the wavelength selection element is disposed in at least one of the beam path of the irradiating light and the beam path of the detection light.

[0115] Example 23: The spectrometer device according to the previous embodiment, wherein the wavelength selection element includes at least one of a tunable wavelength selection element and a wavelength selection element having a fixed transmission spectrum.

[0116] Example 24: According to any one of the two preceding embodiments, the spectrometer device comprises at least one element selected from the group consisting of: an optical filter; a bandpass filter; a variable length filter; a static filter; a tunable filter; specifically a MEMS Fabry-Perot resonator; an optical lens; a diffraction element; a grating; and a prism.

[0117] Example 25: A spectrometer device according to any one of the three preceding embodiments, wherein the detector includes a plurality of photosensitive elements, wherein the wavelength selection element is configured to selectively transmit light such that at least two of the plurality of photosensitive elements are exposed to individual, specifically deviated wavelength ranges of detection light from the object.

[0118] Example 26: The spectrometer device according to the previous embodiment, wherein the wavelength selection element includes a plurality of bandpass filters, wherein each bandpass filter is arranged in the field of view of a particular photosensitive element, wherein each bandpass filter is configured to selectively transmit the incident light and specifically detect at least one wavelength range of the light.

[0119] Example 27: According to any of the foregoing embodiments, the spectrometer device includes at least one spectrometer window, wherein at least one contact surface of the spectrometer window defines the measurement posture of the spectrometer device relative to the object, and in particular, wherein the contact surface is configured to contact the object during spectral measurement.

[0120] Example 28: The spectrometer device according to any of the foregoing embodiments further includes at least one evaluation unit, which is used to evaluate at least one detector signal generated by the detector and to obtain spectral information about the object from the detector signal.

[0121] Example 29: A mobile device, specifically a mobile communication device, the mobile device including at least one spectrometer device according to any of the foregoing embodiments.

[0122] Example 30: A method for obtaining spectral information about at least one object, the method comprising:

[0123] a) Provide at least one spectrometer device according to any of the foregoing embodiments relating to spectrometer devices;

[0124] b) Illuminate at least one object with light by using a light-emitting element;

[0125] c) Detect detection light from the object using a detector of an imaging system and generate at least one detector signal.

[0126] Example 31: According to the method of the previous embodiment, the spectrometer device further includes at least one evaluation unit, wherein the method further includes evaluating at least one detector signal generated by the detector and obtaining spectral information about the object from the detector signal by using the evaluation unit. Attached Figure Description

[0127] Further optional features and embodiments will be disclosed in more detail, preferably in conjunction with the dependent claims, in the following embodiments. As those skilled in the art will recognize, the corresponding optional features can be implemented independently and in any feasible combination. The scope of the invention is not limited to the preferred embodiments. Embodiments are schematically depicted in the accompanying drawings. The same reference numerals in these drawings denote the same or functionally equivalent elements.

[0128] In the attached diagram:

[0129] Figure 1 It shows the contribution of reflected light from the object;

[0130] Figure 2 The example attenuation factor k of water is shown as a dependence on wavelength;

[0131] Figure 3 The dependence of the reflected spectrum of an exemplary record on the angle at which the detection light is received from the object is shown;

[0132] Figure 4 A schematic diagram of an exemplary embodiment of a spectrometer apparatus for obtaining spectral information about at least one object is shown;

[0133] Figure 5 A schematic diagram of another exemplary embodiment of a spectrometer apparatus for obtaining spectral information about at least one object is shown; and

[0134] Figure 6 A flowchart is shown for a method for obtaining spectroscopic information about at least one object. Detailed Implementation

[0135] Figure 1Three contributions to the light reflected from object 110 are illustrated exemplarily, particularly for objects that are and / or include biological tissue. Typically, reflected light can include diffuse Fresnel reflection (indicated by reference numeral 112). Diffuse Fresnel reflection is generated on the surface of object 110, particularly on rough surfaces of object 110, during scattering. Additionally, reflected light can include specular Fresnel reflection (indicated by reference numeral 114). Specular Fresnel reflection is produced by the specular-like behavior of the surface of object 110. It does not contain absorption information of object 110. Furthermore, reflected light can include volumetric reflection (indicated by reference numeral 116). Volumetric reflection can be Kubekah-Monk reflection, also known as subsurface reflection. Volumetric reflection can combine refractive effects (indicated by reference numeral 118) and diffraction effects (indicated by reference numeral 120). Volumetric reflection can be influenced by at least one of the following: grain size; structure; shape; and extinction coefficient of object 110. Typically, the ratio between specular Fresnel reflection and diffuse Fresnel reflection can be given by the surface roughness of object 110 relative to the wavelength of the reflected light.

[0136] Typically, the propagation of light in a medium can be described by the complex refractive index. To describe, among which, It is the refractive index of object 110, and This is the extinction coefficient of object 110, also known as the attenuation coefficient. Especially in absorption spectroscopy, a target is often used to determine and / or distinguish at least one component of object 110, such as the material of object 110, via light absorption. Light absorption can be determined by the extinction coefficient. Sure.

[0137] Fresnel reflection can occur in two media At the interface between them, each medium has a different complex refractive index. For light incident perpendicular to the surface, Fresnel reflection can be determined using the following equation.

[0138] .

[0139] Refractive index and attenuation coefficient Coupled via the so-called Kramer-Kleinich relation. Typically, in the near-infrared region, the refractive index... Possibly more than the attenuation coefficient Much larger. This is in Figure 2 As exemplarily shown, this figure illustrates the attenuation coefficient of water. (Indicated by reference numeral 122 in the attached figure). The wavelength, in µm, is plotted on the horizontal axis 124. The attenuation coefficient is plotted on the vertical axis 126. Attenuation coefficient At a wavelength of 1450 nm, it is approximately 0.0003. For comparison, the refractive index of water... At a wavelength of 1450 nm, it is approximately 1.37. Therefore, Fresnel reflection may not be affected by the extinction coefficient. The extinction coefficient has an effect on the near-infrared region, and Fresnel reflection may not carry information about the light absorption of the medium in the near-infrared. In contrast, in the mid-infrared region, the extinction coefficient... With refractive index They are on the same order of magnitude. Therefore, Fresnel reflection can be significantly affected by the extinction coefficient. This effect can be used in mid-infrared attenuated total reflectance spectra.

[0140] The reflectivity of light propagating through object 110 (e.g., in the case of volumetric reflection of light 116) can be obtained by considering the following...

[0141] -by extinction coefficient The absorption can be described by the Lambert-Beer Law and / or the following

[0142] - The scattering of light at the optical interface within object 110, also known as Kubekah-Munk reflection or subsurface reflection, combines the effects of refraction and diffraction at the optical interface between components with different optical properties (e.g., the surfaces of pores, cells, and / or blood vessels in biological tissues).

[0143] Absorption and scattering can determine the amount of reflected light generated by object 110. When absorption can imprint spectral information into the reflected light, such as as exemplified by the Lambert-Beer law, the reflectance spectrum of the volumetric reflected light can carry information about the composition of object 110, such as the concentration of biomarkers in the tissue.

[0144] Figure 3 The dependence of the exemplary recorded reflectance spectrum on the angle of the detection light received from object 110 is illustrated. (As shown in...) Figure 3 As can be seen, due to the interaction of volumetric reflection, specular Fresnel reflection, and diffuse Fresnel reflection, the recorded reflectance spectrum (denoted by reference numeral 123) can exhibit dependence on the angle at which the detection light is received from the object 110. Alternatively or additionally, the recorded reflectance spectrum can exhibit dependence on the angle at which the illuminating light strikes the object 110. Figure 3 (Not depicted in the text). In Figure 3 The horizontal axis 125 depicts the wavelength in nm. The vertical axis 127 depicts the absorbance. The recorded reflectance spectrum (indicated by reference numeral 123) does not show any contribution from specular Fresnel reflection.

[0145] Figure 3The exemplary record depicted in the image shows a reflectance spectrum of polycaprolactam (PA6), also known as Perlon. Figure 3 The numbers in Figure 128 refer to the angle of the detection light received from object 110 relative to the surface normal of object 110. The term "reference" in Figure 128 indicates the measurement recorded using an integrating sphere.

[0146] Figure 4 An exemplary spectrometer device 130 for obtaining at least one spectral information item about at least one object 110 is illustrated schematically. An exemplary mobile device 131 (e.g., a mobile communication device, such as a mobile phone, smartphone, or wearable device) includes the exemplary spectrometer device 130.

[0147] The spectrometer device 130 includes at least one light-emitting element 132 configured to emit illumination light 134 to illuminate at least one object 110 in at least one illumination plane 136. As an example, the light-emitting element 132 may include an LED emitting light that illuminates a light-emitting material, specifically a phosphor, for converting the light generated by the LED, wherein the light-emitting material generates converted light that is at least partially located in the near-infrared spectral range. The light-emitting element 132 may specifically include a phosphor LED. The phosphor LED may form an encapsulated LED light source, including an LED die (e.g., a blue LED emitting blue pump light) and a phosphor, for example, which is wholly or partially coated on the LED, and is configured, as an example, to convert primary light or blue light into light with different spectral characteristics (specifically, into near-infrared light). However, other light-emitting elements 132 are also feasible, such as at least one element selected from the group consisting of: thermal radiators, such as incandescent lamps and / or thermal infrared emitters; lasers, specifically vertical cavity surface-emitting lasers (VCSELs), and more specifically lasers emitting at least one wavelength in the infrared region; thermal emitters based on microelectromechanical systems (MEMS).

[0148] The irradiation light 134 may have a spectral range that is at least partially located in the near-infrared spectral range, specifically in the range of 1 µm to 3 µm, preferably 1.3 µm to 2.5 µm, more preferably 1.5 µm to 2.2 µm.

[0149] like Figure 4As shown, the light-emitting element 132 can be configured to illuminate a defined illumination area on the object 110, specifically defining an illumination plane 136. As an example, the spectrometer device 130 may include another optical element 138 configured to direct the illumination light 134 from the light-emitting element 132 toward the object 110. Specifically, this other optical element 138 can thus control the illumination area on the object 110.

[0150] The spectrometer device 130 further includes at least one imaging system 140. The imaging system 140 includes at least one detector 142 configured to detect detection light 144 from the object 110 and to generate at least one detector signal upon detection of the detection light 144. Figure 4 In an exemplary embodiment, detector 142 may include a plurality of photosensitive elements 146, each of which may be configured to generate at least one detector signal upon detection of detection light 144, wherein, for example, the plurality of detector signals may be used to obtain spectral information. The plurality of photosensitive elements 146 may be arranged in at least one of a one-dimensional array (specifically a linear array) and a two-dimensional array. The plurality of photosensitive elements 146 may be sensitive to different, specifically non-overlapping, wavelength ranges. For example, a first photosensitive element 146 may detect light within a first wavelength range, and a second photosensitive element 146 may detect light within a second wavelength range, wherein the first and second wavelength ranges may be different from each other, particularly in a manner where the wavelength ranges do not overlap. Additionally, further photosensitive elements 146 may detect light within other wavelength ranges, wherein these other wavelength ranges may be different from each other and different from the first and second wavelength ranges, particularly non-overlapping.

[0151] The imaging system 140 further includes at least one optical element 148 for guiding detection light 144 onto detector 142. The optical element 148 may specifically be selected from the group consisting of: mirrors, specifically curved mirrors and / or freeform mirrors; lenses, specifically focusing lenses; apertures; optical waveguides; optical fibers; gratings; waveplates; prisms; active optical elements, such as micromirror arrays, liquid crystal arrays, and / or another type of spatial light modulator (SLM); combinations of at least one of the aforementioned optical elements. The imaging system 140 is configured to receive light from at least one imaging plane ( Figure 4 The detection light 144 (not shown in the image) is used. The imaging plane of the imaging system 140 is positioned at a certain distance from the illumination plane 136.

[0152] For example, the imaging plane may be at least partially located within the object 110 applied to the sample interface. The imaging plane may be positioned at a distance from the illumination plane 136 ranging from 0.01 mm to 10 mm, specifically from 0.1 mm to 1.0 mm, more specifically from 0.2 mm to 0.5 mm, and more specifically 0.25 mm, particularly in the direction from the illumination plane 136 to the object 110. For example, the object 110 applied to the sample interface may be or may include human or animal skin. In this case, the imaging plane may be located at a distance of 0.25 mm within the object 110, which specifically corresponds to the penetration depth of light into the skin in the infrared spectral range. The distance of the imaging plane from the illumination plane 136 may be specifically optimized for each object 110 with different material properties.

[0153] As an example, the optical element 148 for guiding the detection light 144 onto the detector 142 may include at least one lens 150 having at least one focal length, specifically at least one focusing lens, wherein the lens 150 may be arranged to focus the detection light 144 onto the detector 142. The lens 150 may be arranged such that the imaging plane of the imaging system 140 is positioned at a distance from the illumination plane 136.

[0154] Alternatively or additionally, as an example, the optical element 148 for guiding the detection light 144 onto the detector 142 may include at least one freeform mirror 152, wherein the freeform mirror 152 may be arranged to reflect the detection light 144 onto the detector 142. The freeform mirror may have at least one focal length such that the imaging plane of the imaging system 140 is positioned at a distance from the illumination plane 136. The focal length may be in the range of 5 mm to 15 mm, specifically in the range of 10 mm to 15 mm, and more specifically 12 mm.

[0155] Alternatively or additionally, as an example, the optical element 148 for guiding the detection light 144 onto the detector 142 may include at least one aperture 154 having at least one aperture stop, wherein the aperture 154 may be arranged in the beam path of the detection light 144. The aperture 154 with the aperture stop may be arranged such that the imaging plane of the imaging system 140 is positioned at a distance from the illumination plane 136.

[0156] The spectrometer device 130 may further include at least one wavelength selection element 156 for selectively transmitting light within at least one wavelength range. The wavelength selection element 156 may be disposed in at least one of the beam path of the irradiating light 134 and the beam path of the detection light 144. In this exemplary embodiment, as... Figure 4As shown, the wavelength selection element 156 can be configured to selectively transmit light such that at least two of the plurality of photosensitive elements 146 are exposed to separate, specifically offset wavelength ranges of the detection light 144 from the object 110. For example, the wavelength selection element 156 may include a plurality of bandpass filters 158, wherein each bandpass filter 158 may be arranged in the field of view of a particular photosensitive element 146. Each bandpass filter 158 may be configured to selectively transmit incident light, specifically incident on at least one wavelength range of the detection light 144. The wavelength ranges of the bandpass filters 158 may be specifically different from each other, and more specifically, may be non-overlapping wavelength ranges.

[0157] The spectrometer device 130 further includes at least one sample interface 160 configured to allow illumination light 134 to illuminate the object 110 and to allow detection light 144 from the object 110 to propagate to the imaging system 140. The sample interface 160 is configured to define the measurement posture of the spectrometer device 130 relative to the object 110, specifically during spectral measurements of the object 110. The sample interface 160 may include at least one spectrometer window 162. At least one contact surface of the spectrometer window 162 may define the measurement posture of the spectrometer device 130 relative to the object 110, and in particular, the contact surface may be configured to contact the object 110 during spectral measurements. The spectrometer window 162 may be configured to transmit the detection light 144 and the illumination light 134.

[0158] Furthermore, such as Figure 4 As shown, the spectrometer device 130 may include at least one evaluation unit 164, which is used to evaluate at least one detector signal generated by the detector 142 and to obtain spectral information about the object 110 from the detector signal.

[0159] Figure 5 A schematic diagram of another exemplary embodiment of a spectrometer device 130 for obtaining spectral information about at least one object 110 is shown. Figure 5 Exemplary embodiments of the spectrometer device 130 broadly correspond to Figure 4 An exemplary embodiment of the spectrometer device 130 is shown. Therefore, for a detailed description of the spectrometer device 130, refer to... Figure 4 The description.

[0160] As in Figure 5 As can be seen, the central ray 166 of a beam of illumination 134 incident on the sample interface 160 can be parallel to the surface normal 168 of the sample interface 160 on which the object 110 is applied. The imaging system 140 can be at an angle relative to the surface normal 168 (indicated by reference numeral 170) of the sample interface 160. The detection light 144 is received. The imaging system 140 can be configured to receive light with an angular distribution on the sample interface 160. The detection light 144 has a centroid angle in the range of 0° to 90°, specifically in the range of 15° to 75°, more specifically in the range of 30° to 70°, and more specifically in the range of 45° to 65°. With the angle... By reducing the range of 15° to 75°, more specifically 30° to 70°, and even more specifically 45° to 65°, the fluctuation of the spectrum can be reduced.

[0161] Figure 6 A flowchart of an exemplary method for obtaining spectral information about at least one object 110 is shown. The method includes using methods according to the present invention (e.g., according to...). Figure 4 and Figure 5 The spectrometer device 130 is any of the embodiments shown and / or any other embodiment disclosed herein. Therefore, for a detailed description of the spectrometer device 130, refer to... Figure 4 and Figure 5 The description.

[0162] The method includes the following steps, which can be performed in a given order. However, different orders are also possible. In particular, one, more than one, or even all method steps may be performed once or repeatedly. Further, these method steps may be performed sequentially, or alternatively, one or more method steps may be performed in a timely overlapping manner or even in a parallel and / or combined manner. The method may further include additional method steps not listed.

[0163] The method includes:

[0164] a) (indicated by reference numeral 172) provides at least one spectrometer device 130 according to the invention;

[0165] b) (indicated by reference numeral 174) at least one object 110 is illuminated with illumination light 134 by using light-emitting element 132;

[0166] c) (represented by reference numeral 176) Detection light 144 from object 110 is detected by using detector 142 of imaging system 140 and at least one detector signal is generated.

[0167] As outlined above, the spectrometer device 130 may further include at least one evaluation unit 164. The method may further include evaluating at least one detector signal generated by the detector 142 using the evaluation unit 164 and obtaining spectral information about the object 110 from the detector signal (indicated by reference numeral 178).

[0168] List of reference numerals

[0169]

[0170] 。

Claims

1. A spectrometer device (130) for obtaining spectral information about at least one object (110), the spectrometer device (130) comprising: - At least one light-emitting element (132) is configured to emit illumination light (134) to illuminate the at least one object (110) in at least one illumination plane (136). - At least one imaging system (140) including at least one detector (142) configured to detect detection light (144) from the object (110) and to generate at least one detector signal when the detection light (144) is detected, wherein the imaging system (140) further includes at least one optical element (148) for guiding the detection light (144) onto the detector (142), wherein the imaging system (140) is configured to receive detection light (144) from at least one imaging plane. - At least one sample interface (160) configured to allow illumination light (134) to illuminate the object (110) and to allow detection light (144) from the object (110) to propagate to the imaging system (140), wherein the sample interface (160) is configured to define the measurement orientation of the spectrometer device (130) relative to the object (110); The imaging plane of the imaging system (140) is positioned at a certain distance from the irradiation plane (136), and the distance corresponds to the penetration depth of the irradiation light (134) in the object (110).

2. The spectrometer device (130) according to the preceding claim, wherein the optical element (148) for guiding the detection light (144) onto the detector (142) comprises at least one lens (150) having at least one focal length, wherein, The lens (150) is arranged to focus the detection light (144) onto the detector (142), wherein the lens (150) is arranged such that the imaging plane of the imaging system (140) is positioned at a certain distance from the illumination plane (136).

3. The spectrometer device (130) according to claim 1, wherein the optical element (148) for guiding the detection light (144) onto the detector (142) comprises at least one freeform mirror (152), wherein, The freeform mirror (152) is arranged to reflect the detection light (144) onto the detector (142), wherein the surface of the freeform mirror (152) has at least one focal length, such that the imaging plane of the imaging system (140) is positioned at a certain distance from the illumination plane (136).

4. The spectrometer device (130) according to claim 1, wherein the optical element (148) for guiding the detection light (144) onto the detector (142) comprises at least one aperture (154) having at least one aperture stop, wherein, The aperture (154) is arranged in the beam path of the detection light (144), wherein the aperture (154) with the aperture stop is arranged such that the imaging plane of the imaging system (140) is positioned at a certain distance from the illumination plane (136).

5. The spectrometer apparatus (130) according to any one of the preceding claims, wherein, The imaging plane includes at least one focusing plane, wherein the imaging system (140) is configured to receive detection light (144) emitted from the focusing plane, wherein the imaging system (140) focuses onto the focusing plane, wherein the focusing plane defines a light collection plane of the imaging system (140), for which the intensity of the received light is higher than that of any other light collection plane.

6. The spectrometer apparatus (130) according to any one of the preceding claims, wherein, The imaging plane is located at least partially within the object (110) applied to the sample interface (160).

7. The spectrometer apparatus (130) according to any one of the preceding claims, wherein, The imaging plane is positioned at a distance from the irradiation plane (136) in the range of 0.01 mm to 10 mm.

8. The spectrometer apparatus (130) according to any one of the preceding claims, wherein, The imaging system (140) is configured to receive images with angular distribution on the sample interface (160). The detection light (144) has a centroid angle in the range of 0° to 90°.

9. The spectrometer apparatus (130) according to any one of the preceding claims, wherein, The imaging system (140) is configured to receive detection light (144) from at least one elliptical light collection profile in the imaging plane.

10. The spectrometer apparatus (130) according to any one of the preceding claims, wherein, The detector (142) includes a plurality of photosensitive elements (146), each of which is configured to generate at least one detector signal when the detection light (144) is detected.

11. The spectrometer apparatus (130) according to any one of the preceding claims, wherein, The spectrometer device (130) further includes at least one wavelength selection element (156) for selectively transmitting light within at least one wavelength range, wherein the wavelength selection element (156) is disposed in at least one of the beam path of the irradiation light (134) and the beam path of the detection light (144).

12. The spectrometer device (130) according to any one of the preceding claims further includes at least one evaluation unit (164) for evaluating the at least one detector signal generated by the detector (142) and for obtaining spectral information about the object (110) from the detector signal.

13. A mobile device (131) comprising at least one spectrometer device (130) according to any one of the preceding claims.

14. A method for obtaining spectroscopic information about at least one object (110), the method comprising: a) Provide at least one spectrometer device (130) according to any of the preceding claims relating to the spectrometer device (130); b) Illuminate the at least one object (110) with illumination light (134) by using the light-emitting element (132); c) Detection light (144) from the object (110) is detected by using the detector (142) of the imaging system (140) and at least one detector signal is generated.

15. The method according to the preceding claim, wherein, The spectrometer device (130) further includes at least one evaluation unit (164), wherein the method further includes evaluating the at least one detector signal generated by the detector (142) by using the evaluation unit (164) and obtaining spectral information about the object (110) from the detector signal.

Images