A multi-station detection device for deep processing detection based on machine vision

Abstract

This invention discloses a multi-station inspection device for deep processing inspection based on machine vision. It includes a frame, a linkage control unit, and a modular reconfigurable conveying unit, an adaptive flexible positioning unit, and multiple inspection stations mounted on the frame. The modular reconfigurable conveying unit includes a linear guide rail with positioning holes and data interface slots, and a movable station module. The module is quickly fixed and plug-and-play via electromagnetic positioning pins. The adaptive flexible positioning unit is integrated into the workpiece bearing platform of the station module, combining vacuum flexible adsorption, servo-driven elastic limiting columns, and a vision-assisted positioning camera to achieve non-destructive adaptive positioning and micron-level pose compensation of the workpiece. The inspection stations are equipped with multi-degree-of-freedom adjustable multi-dimensional vision inspection units. Thus, through the modular, flexible, and intelligent collaborative design of the mechanical structure, the problems of slow changeover and debugging, easy workpiece damage during positioning, and low multi-station collaborative efficiency of traditional equipment are solved, improving the flexibility, accuracy, and efficiency of the equipment.

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