An automated test device for power module testing
By designing automated testing equipment to simulate the actual working state of power modules and collect current and voltage signals, the problem of existing equipment being unable to test under continuous variable power and active heating conditions was solved, enabling accurate screening of power modules and improving the quality of shipments.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- JIGUANG SEMICON (SHAOXING) CO LTD
- Filing Date
- 2026-03-12
- Publication Date
- 2026-06-02
AI Technical Summary
Existing power module testing equipment cannot accurately test the operation of the power module under test under continuous variable power and active heating conditions, resulting in the inability to accurately detect potential defects.
An automatic testing device was designed, including a control module, a pin management module, a power testing module, a sampling module, and a data acquisition module. By configuring the operating basis of the power module under test, its real working state is simulated, and current and voltage signals are collected to realize dynamic testing of the power module.
It can perform tests under simulated real working conditions of the power module under test, accurately determine whether there are defects, and thus improve the quality of shipments.
Smart Images
Figure CN122131047A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of power module testing technology, and more specifically to an automated testing device for power module testing. Background Technology
[0002] Currently, in the manufacturing process of power modules, automated testing equipment is commonly used to screen and test the completed power modules to ensure the quality of shipments. Generally, automated testing equipment is used to perform static and dynamic tests at room temperature and high temperature. Among them, dynamic testing includes dual-pulse or multi-pulse testing, as well as short-circuit testing.
[0003] It should be understood that existing dynamic testing involves multiple pulse switching tests under passive temperature conditions. The waveform sequences in dual-pulse or multi-pulse tests typically last from microseconds to milliseconds. Short-circuit tests typically last around 10 microseconds. Therefore, existing room-temperature and high-temperature dynamic tests cannot test the operation of the power module under test (DUT) under continuous power variation or active heating conditions; in other words, they cannot perform power testing of the DUT and thus cannot accurately detect potential defects. Summary of the Invention
[0004] The summary section introduces a series of simplified concepts, which will be further explained in detail in the detailed description section. This summary section is not intended to limit the key and essential technical features of the claimed technical solution, nor is it intended to determine the scope of protection of the claimed technical solution.
[0005] To address the existing problems, this application provides an automated test device for power module testing, the automated test device comprising: The control module is used to execute the test sequence and generate corresponding control commands; The pin management module, connected to the control module, is used to switch the interfaces of each test resource module so that the interface is connected to the corresponding pin of the power module under test. It is also used to switch and connect the corresponding test resource module to the pin of the power module under test according to the control command, so as to realize various tests on the power module. The power test module, connected to the pin management module, is used to configure and provide the operating basis for the power module under test to simulate the actual working state of the power module under test. The sampling module, connected to the power test module, is used to sample the current and voltage of the power module under test during operation, and outputs current sampling signals and voltage sampling signals. The data acquisition module is connected to the sampling module through the pin management module to receive current sampling signals and voltage sampling signals, and is used to acquire the current waveform in the current sampling signal and the voltage waveform in the voltage sampling signal.
[0006] In one embodiment, the power testing module includes: A three-phase inductive load network, with its three ports used to connect to the three-phase output terminals of the power under test module; The PWM signal generation unit, connected to the pin management module, is used to generate configurable PWM signals to simulate the driving conditions of the power module under test under various operating conditions. The drive unit, connected to the PWM signal generation unit, is used to amplify the PWM signal to generate and output drive signals for driving each power switching device in the power module under test.
[0007] In one embodiment, the PWM signal is generated with the assistance of simulation tools.
[0008] In one embodiment, the three-phase inductive load network consists of three load inductors.
[0009] In one embodiment, the first ends of the three load inductors are connected to each other, and the second ends of the three load inductors are respectively connected to the three-phase output terminals of the power module under test.
[0010] In one embodiment, the sampling module includes multiple current sampling units, which are connected to the three-phase output terminals of the power module under test to sample the three-phase current output by the power module under test and output a current sampling signal.
[0011] In one embodiment, the sampling module includes multiple voltage sampling units, which are used to sample the voltage difference between the three-phase output terminal of the power module under test and the positive terminal and negative terminal of the power supply DC bus, and output voltage sampling signals.
[0012] In one embodiment, the voltage sampling unit is a differential probe.
[0013] In one embodiment, each power switching device in the power module under test is configured with a drive circuit, and the automatic testing equipment further includes: A first power supply module is used to connect to the drive circuit located on the lower bridge arm of the power module under test to provide a first test power supply. A second power supply module is used to connect to the drive circuit located on the upper bridge arm of the power module under test to provide a second test power supply.
[0014] In one embodiment, the pin management module is a matrix multiplexer, and the power module includes an inverter; The inverter includes three sets of power switching devices, each set of power switching devices includes two power switching devices. The output terminal of the first power switching device in each set of power switching devices is connected to the input terminal of the second power switching device. The control terminal and input terminal of the first power switching device and the control terminal and output terminal of the second power switching device are used to connect to the interface. A freewheeling diode is connected in reverse parallel between the input terminal and the output terminal of each power switching device.
[0015] The automated testing equipment for power module testing in this application embodiment, by setting up a power testing module, can configure the basic operation of the power module under test, allowing the power module under test to operate as a whole to simulate its actual working state and thereby obtain its operating parameters during operation. This enables accurate determination of whether the power module under test has defects, thus improving the quality of shipments. Attached Figure Description
[0016] The following drawings, which are incorporated herein by reference and are used to understand this application, illustrate embodiments of the invention and their descriptions to explain the principles of the invention.
[0017] In the attached image: Figure 1 A system schematic diagram of an automated testing device based on related technologies is shown; Figure 2 A schematic diagram of a dual-pulse test waveform of an automated testing device in the related technology is shown. Figure 3 A system schematic diagram of an automated test apparatus for power module testing according to a specific embodiment of this application is shown; Figure 4 A schematic diagram of the PWM test waveform of an automatic test device for power module testing according to a specific embodiment of this application is shown. Detailed Implementation
[0018] The present application will now be described more fully with reference to the accompanying drawings, in which embodiments of the present application are illustrated. However, the present application can be implemented in various forms and should not be construed as limited to the embodiments set forth herein. Rather, providing these embodiments will make the disclosure thorough and complete, and will fully convey the scope of the present application to those skilled in the art. In the drawings, for clarity, the dimensions and relative dimensions of layers and regions may be exaggerated. The same reference numerals denote the same elements throughout.
[0019] It should be understood that when an element or layer is referred to as "on," "adjacent to," "connected to," or "coupled to" other elements or layers, it may be directly on, adjacent to, connected to, or coupled to other elements or layers, or there may be intervening elements or layers. Conversely, when an element is referred to as "directly on," "directly adjacent to," "directly connected to," or "directly coupled to" other elements or layers, there are no intervening elements or layers. It should be understood that although the terms first, second, third, etc., may be used to describe various elements, components, areas, layers, and / or portions, these elements, components, areas, layers, and / or portions should not be limited by these terms. These terms are only used to distinguish one element, component, area, layer, or portion from another element, component, area, layer, or portion. Therefore, without departing from the teachings of this application, the first element, component, area, layer, or portion discussed below may be referred to as the second element, component, area, layer, or portion.
[0020] Spatial relation terms such as “below,” “under,” “below,” “under,” “above,” “above,” etc., are used herein for convenience of description to describe the relationship between one element or feature shown in the figure and other elements or features. It should be understood that, in addition to the orientation shown in the figure, spatial relation terms are intended to also include different orientations of the device in use and operation. For example, if the device in the figure is flipped, then the element or feature described as “below” or “under” the other element or feature will be oriented “above” the other element or feature. Therefore, the exemplary terms “below” and “under” can include both upper and lower orientations. The device may be otherwise oriented (rotated 90 degrees or otherwise) and the spatial descriptive terms used herein will be interpreted accordingly.
[0021] Unless otherwise defined, all terms used herein (including technical and scientific terms) shall have the same meaning as commonly understood by one of ordinary skill in the art. It will also be understood that terms as defined in commonly used dictionaries shall be interpreted as having a meaning consistent with their meaning in the relevant field and / or the context of this specification, and not as in an ideal or overly formal sense, unless expressly defined herein.
[0022] To fully understand this application, a detailed structure will be presented in the following description to illustrate the technical solutions proposed in this application. Preferred embodiments of this application are described in detail below; however, in addition to these detailed descriptions, this application may have other implementation methods.
[0023] Currently, in the manufacturing process of power modules, automated test equipment (ATE) is commonly used to screen and test the completed power modules. ATE is a key piece of equipment at the production line testing station, responsible for batch screening of products before shipment, with the goal of intercepting defective products to ensure shipment quality. Generally, ATE is used to perform static and dynamic tests at both room temperature and high temperature. Specifically, ATE is divided into AC / DC stations, namely ATE for static testing at room temperature and high temperature and ATE for dynamic testing at room temperature and high temperature. This application mainly focuses on the ATE for dynamic testing at room temperature and high temperature. (The ATE mentioned below refers to the ATE for dynamic testing at room temperature and high temperature.) Dynamic testing includes dual-pulse or multi-pulse testing, as well as short-circuit testing.
[0024] like Figure 1 As shown, for a common three-phase six-unit power module, the automatic testing equipment mainly uses relays to switch each power switching device (unit) of each power module to the inductive load and waveform measurement channel, sequentially testing the dynamic parameters of each power switching device (unit) of each power module. Specifically, dynamic testing is achieved by performing 2 to 8 pulse switching tests under a passive temperature environment. When the passive temperature environment is 25℃, it achieves room temperature testing; when the passive temperature environment is 150℃, it achieves high temperature testing.
[0025] like Figure 2 As shown, however, in existing dynamic tests, the waveform sequences of dual-pulse or multi-pulse tests typically last from microseconds to milliseconds, which are non-power tests. Short-circuit tests typically use pulses lasting around 10 microseconds, which are instantaneous limit tests. Therefore, existing room-temperature and high-temperature dynamic tests do not actively screen the power module as a whole. Consequently, they cannot test the operation of the power module under test under continuous variable power conditions or under active heating conditions, nor can they accurately detect potential defects in the power module under test.
[0026] Therefore, in view of the aforementioned technical problems, this application proposes an automatic test device for power module testing, the automatic test device comprising: The control module is used to execute the test sequence and generate corresponding control commands; A pin management module, connected to the control module, is used to switch the interfaces of each test resource module so that the interface is connected to the corresponding pin of the power module under test, and is used to switch and connect the corresponding test resource module to the pin of the power module under test according to the control command, so as to realize various tests on the power module. A power test module, connected to the pin management module, is used to configure and provide the operating basis of the power module under test to simulate the actual working state of the power module under test. The sampling module, connected to the power test module, is used to sample the current and voltage of the power module under test during operation, and output current sampling signals and voltage sampling signals. The data acquisition module is connected to the sampling module through the pin management module to receive the current sampling signal and the voltage sampling signal, and is used to acquire the current waveform in the current sampling signal and the voltage waveform in the voltage sampling signal.
[0027] The automated testing equipment for power module testing in this application embodiment, by setting up a power testing module, can configure the basic operation of the power module under test, allowing the power module under test to operate as a whole to simulate its actual working state and thereby obtain its operating parameters during operation. This enables accurate determination of whether the power module under test has defects, thus improving the quality of shipments.
[0028] Below, for reference Figure 3 This application provides a detailed description of the automated test equipment for power module testing, wherein... Figure 3 A system schematic diagram of an automated test apparatus for power module testing according to a specific embodiment of this application is shown; Figure 4 A schematic diagram of the PWM test waveform of an automatic test device for power module testing according to a specific embodiment of this application is shown.
[0029] like Figure 3 As shown, the automatic testing equipment for power module testing in this application is used to test power modules, making the testing process closer to the application conditions of power modules. During this process, potential defects in the product are stimulated by applying active electrothermal stress to the power module, achieving effective dynamic testing and screening.
[0030] To facilitate understanding, before providing a detailed description of the automated test equipment for power module testing in this application, a brief introduction to the power module will be given first.
[0031] The power module mentioned in this article refers to a three-phase six-unit power module. It integrates and packages all the core power semiconductor devices required to form a complete three-phase voltage source inverter bridge into a single module.
[0032] Specifically, the power module includes an inverter. The inverter comprises three sets of power switching devices. Each set includes two power switching devices: a first power switching device and a second power switching device. The output terminal of the first power switching device in each set is connected to the input terminal of the second power switching device. Furthermore, the control terminals and input terminals of the first power switching device, as well as the control terminals and output terminals of the second power switching device, are all packaged as pins for connection to the power stage circuitry, forming a complete three-phase inverter system. Similarly, the common node of the first and second power switching devices in each set is the output terminal, which is also a packaged pin for connection to loads such as motors or the power grid. In addition, a freewheeling diode is connected in reverse parallel between the input and output terminals of each power switching device.
[0033] In some embodiments, the power switching device may be an IGBT or a MOSFET.
[0034] The following section provides a detailed introduction to power modules, using IGBT transistors as an example of power switching devices.
[0035] In a specific example, the inverter in the power module includes three sets of IGBTs, all of which are NPN transistors. Each set of IGBTs includes two IGBTs: a first IGBT and a second IGBT. Each set of first and second IGBTs forms a single-phase bridge arm. Specifically, the emitter of the first IGBT in each set is connected to the collector of the second IGBT. The bases of both the first and second IGBTs serve as package pins for receiving drive signals. The collectors and emitters of both IGBTs serve as package pins for connecting to the positive and negative bus voltages, respectively. The common node of the first and second IGBTs is the output terminal of this single-phase bridge arm, which also serves as a package pin for connecting to the load.
[0036] Each IGBT transistor and its freewheeling diode connected in reverse parallel between its emitter and collector can serve as a power unit 201. In some embodiments, each power unit 201 may also be configured with a current and voltage measurement channel to acquire the operating parameters of the power unit 201.
[0037] This concludes the description of the power module. A complete power module may also include other components, which will not be elaborated here.
[0038] The following is a description of the automated test equipment for power module testing described in this application.
[0039] The automatic test equipment for power module testing in this application includes a control module 21, a pin management module 22, a power test module 23, a sampling module, and a data acquisition module 26.
[0040] Specifically, the control module 21 is used to execute the test sequence and generate corresponding control commands.
[0041] The pin management module 22 is connected to the control module 21 and is used to switch the interfaces of each test resource module so that the interface is connected to the corresponding pin of the power module under test 20. It is also used to switch and connect the corresponding test resource module to the pin of the power module under test 20 according to the control command, so as to realize various tests of the power module.
[0042] The test resource module is a resource module required to perform dynamic testing on the power module 20 under test.
[0043] Dynamic testing refers to testing the characteristics of power devices during high-speed switching transients. This may include switching time (turn-on delay time, rise time, turn-off delay time, fall time), switching energy (turn-on energy, turn-off energy, total switching energy), reverse recovery characteristics, double-pulse testing, and short-circuit testing.
[0044] Accordingly, the test resource module may be, for example, an auxiliary power supply, a module for simulating the actual working state of the power module under test 20, a short-circuit protection circuit module for short-circuit testing, a current sampling module, a voltage sampling module, etc.
[0045] Understandably, during actual testing, under the control of the pin management module 22, the interfaces of each test resource module can be connected to the corresponding pins of the power module under test 20, and can be connected to the corresponding pins of the power module under test 20 according to the test sequence.
[0046] In a specific example, when testing the power module under test (A), the pin management module 22 controls the interfaces of test resource modules B1 and B2 to connect to pins A1 and A2 of A. When performing the first test on A, the pin management module 22 connects the interface of test resource module B1 to pin A1. After the first test, when performing the second test, the pin management module 22 switches test resource module B1 to test resource module B2 and connects the interface of test resource module B2 to pin A2 of A. After completing the test on A, the pin management module 22 also switches the interfaces of each test resource module to connect to the pins of the power module under test (C) to facilitate testing of C.
[0047] The power test module 23 is connected to the pin management module 22 and is used to configure and provide the operating basis of the power module under test 20 to simulate the real working state of the power module under test 20.
[0048] In some embodiments, since the typical application of a power module is to implement PWM control, the power test module 23 can be a module used to perform PWM operating condition testing on the power module 20 under test. That is, the power test module 23 can be configured and provide the necessary test conditions for the power module 20 under test in PWM operating mode to simulate the actual operating state of the power module 20 under test in this operating mode.
[0049] In some embodiments, the power test module 23 may include a three-phase inductive load network 231, a PWM signal generation unit 232, and a drive unit 233.
[0050] Specifically, the three ports of the three-phase inductive load network 231 are used to connect to the three-phase output terminals of the power under test module 20.
[0051] The PWM signal generation unit 232 is connected to the pin management module 22 and is used to generate configurable PWM signals to simulate the drive adjustment of the power module under test 20 under various operating conditions.
[0052] The drive unit 233 is connected to the PWM signal generation unit 232 and is used to amplify the PWM signal to generate and output drive signals for each power switching device in the power module.
[0053] By setting up a three-phase inductive load network 231, it can be made not to consume active power, so that the power consumption is on the switching and conduction losses of the power module under test in PWM working mode, thereby realizing the active heating of the power module under test.
[0054] For the three-phase inductive load network 231, when the pins of the power under test module 20 are connected to the interfaces of each test resource module, the three ports of the three-phase inductive load network 231 are connected to the output terminals of the three single-phase bridge arms in the power under test module 20 under the control of the pin management module 22. At this time, the three-phase inductive load network 231 is the output load of the power under test module 20.
[0055] In some embodiments, the three-phase inductive load network 231 may consist of three load inductors. Specifically, the three load inductors may be connected in a star configuration or in a delta configuration to form the three-phase inductive load network 231. The three-phase inductive load network 231 formed by the three load inductors allows for a more realistic test of the power module 20 under test.
[0056] In a specific example, taking a star connection, the three load inductors are connected as follows: the first terminals of the three load inductors are connected to each other, and the second terminals of the three load inductors are connected one-to-one to the three-phase output terminals of the power under test module 20. That is, the output terminal of each single-phase bridge arm of the power under test module 20 is connected to the second terminal of a load inductor, and the first terminals of the three load inductors are connected to each other.
[0057] In some embodiments, the PWM signal generation unit 232 can be flexibly configured to generate PWM waveform sequences. For example, it can simulate waveform sequences under conditions such as constant speed, overload, acceleration / deceleration, and stall to closely approximate the application conditions. In other embodiments, the PWM waveform sequence can be designed and used in conjunction with the drive unit 233 to achieve accelerated stress testing of the power switching devices in the power module. Accelerated stress testing can include, for example, continuous high dv / dt, di / dt, dynamic reverse bias, and dynamic gate bias.
[0058] In some embodiments, the PWM signal generation unit 232 may include a control module 21 and a PWM signal generator. The control module 21 is used to issue control commands related to the generation of PWM signals. The PWM signal generator is connected to the control module 21 to receive control commands and, based on the received control commands, generates and outputs corresponding PWM signals. When the control module 21 issues different control commands, the PWM signal generator can generate different PWM signals, thereby enabling the configuration of the PWM signals.
[0059] In some embodiments, since the three-phase inductive load network 231 does not output mechanical power, PWM control is relatively simple, and therefore the PWM signal can be generated with the assistance of simulation tools. Specifically, the PWM waveform sequence can be generated by the auxiliary tool, and then the generated PWM waveform sequence is loaded onto the control circuit board where the control module 21 is located, and then sent by the control module 21 to the PWM signal generator. As an example, the auxiliary tool can be Simulink. That is, typical operating condition waveforms can be generated directly for output via Simulink.
[0060] In some embodiments, since the power module typically operates with a PWM power switching waveform of around 10kHz in practical applications, the PWM signal generator can also generate a PWM signal of around 10kHz for power testing of the power module 20 under test.
[0061] In some embodiments, the drive unit 233 may include logic circuitry and multiple drive circuits 202. The logic circuitry is connected to a PWM signal generation unit to receive PWM signals and transmit them according to the control logic of the PWM signals. The multiple drive circuits 202 correspond to multiple power units 201 in the power under test module 20. Each drive circuit 202 is connected to the logic circuitry and, upon receiving a PWM signal, amplifies the PWM signal to generate and output drive signals for driving the corresponding power switching devices in the power under test module 20.
[0062] In some embodiments, the plurality of drive circuits 202 may be disposed in an automated test device or in a power module.
[0063] Taking the latter as an example, in a specific example, the driver circuit 202 is configured with six outputs, and correspondingly, the logic circuit is configured with six output ports. These six output ports are the interfaces of the logic circuit.
[0064] Furthermore, in the power module, each power unit 201 corresponds to a drive circuit 202. Specifically, the input terminal of each drive circuit 202 serves as a package pin to receive the PWM signal. The output terminal of each drive circuit 202 is connected to the control terminal of the corresponding power switching device.
[0065] In some embodiments, the drive circuit 202 may be an inverter drive circuit 202, specifically an inverter drive circuit 202 board. The drive board is connected to the PWM signal generation unit via a cable. In other embodiments, the drive circuit 202 may also be implemented using a push-pull circuit.
[0066] It is understood that the drive circuit 202 requires a power supply. Therefore, in some embodiments, the automatic test equipment further includes a first power module 27 and a second power module 28. The first power module 27 is connected to the drive circuit 202 located on the lower bridge arm of the power module under test 20 to provide a first test power. The second power module 28 is connected to the drive circuit 202 located on the upper bridge arm of the power module under test 20 to provide a second test power. The aforementioned first and second test power supplies not only provide the required voltage to the drive circuit 202 but can also be used to provide corresponding test voltages for testing each power unit 201 in the power module under test 20.
[0067] For the first power module 27, its two output terminals are the positive and negative terminals, respectively. These two output terminals serve as the interface for the first power module 27, used to output the first test power. Correspondingly, the positive terminals of the three drive circuits 202 corresponding to the power switching device located on the lower bridge arm in the power under test module 20 are connected to each other to form a first common node. The negative terminals of these three drive circuits 202 are also connected to each other to form a second common node. The first and second common nodes serve as package pins for connection to the first power module 27 to access the first test power.
[0068] Multiple second power supply modules 28 are provided, each corresponding to a power switching device located on the upper bridge arm of the power module under test 20. Taking one second power supply module 28 as an example, its two output terminals are the positive and negative power supply terminals, respectively. These two output terminals are the interfaces of the second power supply module 28, used to output the second test power. Correspondingly, the positive and negative power supply terminals of the drive circuit 202 corresponding to the power switching device located on the upper bridge arm of the power module under test 20 are used as package pins to connect to one of the second power supply modules 28 to access the second test power.
[0069] Thus, by configuring the PWM signal through the control module 21, the power switching device in the power module under test 20 is driven by the drive unit 233 to work, thereby simulating the real working state of the power device under test and realizing the power test of the power module under test 20.
[0070] In some embodiments, considering that the power module under test 20 needs to operate under a continuous PWM waveform sequence, water cooling can also be configured to ensure that the chip junction temperature rises and falls within a specified range. When the power module under test 20 is running in PWM mode during the test, the power module under test 20 will actively generate heat, and its chip temperature rise can reach the maximum limit of 150°C, which makes its power test not requiring an additional constant high temperature environment.
[0071] When the power module under test 20 is operating in PWM mode, its current and voltage are also operating parameters used in the test. These current and voltage readings can be acquired using a sampling module.
[0072] The sampling module is connected to the power test module 23 and is used to sample the current and voltage of the power module under test 20 in operation, and output current sampling signal and voltage sampling signal.
[0073] In some embodiments, the sampling module may include a plurality of current sampling units 25. The plurality of current sampling units 25 are used to connect to the three-phase output terminals of the power module under test 20 to sample the three-phase current output by the power module under test 20 and output a current sampling signal.
[0074] Specifically, the current sampling unit 25 can be installed on the line connecting the output terminal of each single-phase bridge arm of the power module under test 20 to the load inductor, in order to sample the three-phase current output by the power module under test 20. The current sampling unit 25 can be, for example, a current sensor, a current transformer, or other device capable of detecting current.
[0075] In some embodiments, the sampling module may include a plurality of voltage sampling units 24. The plurality of voltage sampling units 24 are respectively used to sample the voltage difference between the three-phase output terminal of the power module under test and the positive terminal and negative terminal of the power supply DC bus, and output voltage sampling signals.
[0076] In some embodiments, the voltage sampling unit 24 can be a differential probe. Specifically, when sampling the voltage difference between the three-phase output terminals of the power module under test 20 and the positive and negative terminals of the power supply DC bus using a differential probe, the positive terminal of the differential probe can be connected to the output terminal of a single-phase bridge arm in the power module under test 20, and the negative terminal can be connected to the negative terminal of the power supply DC bus; alternatively, the positive terminal of the differential probe can be connected to the positive terminal of the power supply DC bus, and the negative terminal can be connected to the output terminal of a single-phase bridge arm in the power module under test 20. By setting six voltage sampling units 24 in the aforementioned manner, the voltage difference between the three-phase output terminals of the power module under test 20 and the positive and negative terminals of the power supply DC bus can be obtained.
[0077] Of course, in some other embodiments, the voltage sampling unit 24 may also employ other devices capable of detecting voltage.
[0078] The data acquisition module 26 is connected to the sampling module through the pin management module 22 to receive current sampling signals and voltage sampling signals, and to acquire the current waveform in the current sampling signal and the voltage waveform in the voltage sampling signal.
[0079] In some embodiments, in addition to the aforementioned sampling module, each power unit 201 can also transmit its operating waveform data to the pin management module 22 via the voltage and current measurement channels of each power unit 201 on the power module under test 20, so as to the data acquisition unit. That is, the data acquisition unit can acquire operating waveform data through these voltage and current measurement channels in a time-division or real-time manner.
[0080] It should be understood that in some embodiments, the dynamic parameters of the power module 20 under test can be sampled during the selected PWM switching period to complete the test. Specific test waveforms can be found in the appendix. Figure 4 .
[0081] In some embodiments, the pin management module 22 can be a matrix multiplexer.
[0082] The aforementioned hardware resources related to PWM power testing can be applied to FT dynamic testing to achieve PWM power testing.
[0083] In addition, the automatic test equipment for power module testing in this application is also equipped with a high-power DC power supply for powering the test of the power module 20 under test.
[0084] This concludes the description of the automated test equipment for power module testing in this application. A complete automated test equipment may also include other components, which will not be elaborated here.
[0085] In summary, the automatic testing equipment for power module testing described in this application embodiment, by setting up a power testing module, can configure the operating foundation of the power module under test, allowing the power module under test to operate as a whole to simulate its actual working state and thereby obtain its operating parameters during operation. Furthermore, this automatic testing equipment can perform active electrothermal stress testing at the minute level. This allows for accurate determination of whether the power module under test has defects, thus improving shipment quality.
[0086] The automatic testing equipment of this application differs from existing automatic testing equipment in that: This application applies the PWM operating mode of power modules in practical applications to ATE equipment, replacing the current dynamic testing at FT sites. Specifically, the load inductor used in this application is replaced with a three-phase, three-coil star connection instead of a single-phase, single-coil connection, eliminating the high-power mechanical switch relay used for unit test switching; the power module acts as the active switch. Using the automated testing equipment of this application, real-time data acquisition can be achieved during PWM dynamic testing, completely capturing the failure process data of defective modules and providing direct assistance in finding the cause of failure. Specifically, the Von voltage can be collected during the turn-on duration of each power unit's PWM, and the Ioff current can be collected during the turn-off duration. These data can be used to track the temperature rise of the power unit in real time under pre-calibration. The composite electrothermal stress testing provided by the PWM dynamic testing method involved in this application can simplify the FT site process, reduce site equipment, shorten material flow, and improve UPH (Uptime Per Hour).
[0087] Although several embodiments have been described herein, it should be understood that many other modifications and embodiments will arise in the mind of those skilled in the art, all of which will fall within the spirit and scope of the concept disclosed herein. More specifically, various modifications and changes may be made in terms of the arrangement and / or components of the subject matter within the scope of this disclosure, the drawings, and the appended claims. In addition to modifications and changes in the components and / or arrangement, the use of alternative methods will also be obvious to those skilled in the art.
Claims
1. An automated testing device for power module testing, characterized in that, The automated testing equipment includes: The control module is used to execute the test sequence and generate corresponding control commands; A pin management module, connected to the control module, is used to switch the interfaces of each test resource module so that the interface is connected to the corresponding pin of the power module under test, and is used to switch and connect the corresponding test resource module to the pin of the power module under test according to the control command, so as to realize various tests on the power module. A power test module, connected to the pin management module, is used to configure and provide the operating basis of the power module under test to simulate the actual working state of the power module under test. The sampling module, connected to the power test module, is used to sample the current and voltage of the power module under test during operation, and output current sampling signals and voltage sampling signals. The data acquisition module is connected to the sampling module through the pin management module to receive the current sampling signal and the voltage sampling signal, and is used to acquire the current waveform in the current sampling signal and the voltage waveform in the voltage sampling signal.
2. The automated test equipment for power module testing as described in claim 1, characterized in that, The power testing module includes: A three-phase inductive load network, with its three ports used to connect to the three-phase output terminals of the power under test module; A PWM signal generation unit, connected to the pin management module, is used to generate a configurable PWM signal to simulate the driving conditions of the power module under test under various operating conditions. The driving unit, connected to the PWM signal generation unit, is used to amplify the PWM signal to generate and output driving signals for driving each power switching device in the power module under test.
3. The automated test equipment for power module testing as described in claim 2, characterized in that, The PWM signal is generated with the assistance of simulation tools.
4. The automated test equipment for power module testing as described in claim 2, characterized in that, The three-phase inductive load network consists of three load inductors.
5. The automated test equipment for power module testing as described in claim 4, characterized in that, The first terminals of the three load inductors are connected to each other, and the second terminals of the three load inductors are respectively connected to the three-phase output terminals of the power module under test.
6. The automated test equipment for power module testing as described in claim 1, characterized in that, The sampling module includes multiple current sampling units, which are connected to the three-phase output terminals of the power module under test to sample the three-phase current output by the power module under test and output the current sampling signal.
7. The automated test equipment for power module testing as described in claim 1, characterized in that, The sampling module includes multiple voltage sampling units, which are used to sample the voltage difference between the three-phase output terminal of the power module under test and the positive and negative terminals of the DC power bus, and output the voltage sampling signal.
8. The automated test equipment for power module testing as described in claim 7, characterized in that, The voltage sampling unit is a differential probe.
9. The automatic test equipment for power module testing as described in claim 1, characterized in that, Each power switching device in the power module under test is equipped with a drive circuit, and the automatic testing equipment further includes: A first power supply module is used to connect to the drive circuit located on the lower bridge arm of the power module under test to provide a first test power supply. A second power supply module is used to connect to the drive circuit located on the upper bridge arm of the power module under test to provide a second test power supply.
10. The automated test equipment for power module testing as described in claim 1, characterized in that, The pin management module is a matrix multiplexer, and the power module includes an inverter; The inverter includes three sets of power switching devices, each set of power switching devices includes two power switching devices. The output terminal of the first power switching device in each set of power switching devices is connected to the input terminal of the second power switching device. The control terminal and input terminal of the first power switching device and the control terminal and output terminal of the second power switching device are used to connect to the interface. A freewheeling diode is connected in reverse parallel between the input terminal and the output terminal of each power switching device.