A light leakage point data correction method and device, electronic equipment and storage medium

Abstract

This application discloses a method, apparatus, electronic device, and storage medium for correcting light leakage data, relating to the field of spectral imaging technology. It corrects a first slit image and a second slit image based on dark level correction coefficients and relative radiometric correction coefficients, respectively. A one-dimensional resampling function is used to resample the corrected second slit image and perform relative consistency correction between slits, resulting in a consistent second slit corrected resampled image. The radiometric response value corresponding to the first slit corrected image with light leakage is determined based on the determined target frame number, target band index, and target spatial column index. This radiometric response value is corrected based on a light leakage intensity calibration coefficient. The corrected radiometric response value is subtracted from the radiometric response value of the first slit corrected image with light leakage to obtain the target radiometric response value. This improves the situation where the superposition of spectral information of targets outside the slit affects the spectral data of targets normally imaged within the slit.

Description

Technical Field

[0001] This application relates to the field of spectral imaging technology, and in particular to a method, apparatus, electronic device, and storage medium for correcting light leakage point data. Background Technology

[0002] The dual-slit hyperspectral imager is an advanced optical remote sensing device that achieves high-resolution spectral imaging of targets through a unique dual-slit design combined with spectral dispersion technology. The instrument uses two parallel slits to split incident light into two paths. After being dispersed by a dispersive element, the light is projected onto a detector to form a two-dimensional image that fuses spatial and spectral information. This allows for the simultaneous acquisition of multi-band continuous spectral data of the target in a single exposure. The black film slit and photolithography process are the core technologies for manufacturing high-precision slits.

[0003] In related technologies, the black film process first involves depositing a highly light-absorbing black film (such as chromium or carbon nanomaterials) onto a substrate (such as glass or metal). Then, photolithography is used to transfer the designed slit pattern onto the black film, followed by etching to form a micron-scale high-contrast slit structure. The photolithography process typically includes steps such as resist coating, exposure, development, and ion etching, achieving sub-micron-level processing precision and ensuring steep slit edges with low roughness. This combined process not only effectively suppresses stray light but also meets the stringent requirements of dual-slit imaging systems for slit parallelism and width consistency, making it widely used in optical systems such as spectrometers and high-resolution imaging devices.

[0004] However, due to factors such as photolithography resist removal and film stress, pinhole structures can occur on the film surface, inevitably leading to light leakage points in non-slit areas. For hyperspectral imagers, these light leakage points can cause the spectral information of ground objects outside the slit to be superimposed on the spectral data of ground objects normally imaged by the slit during pushbroom imaging, affecting the spectral data of ground objects normally imaged by the slit. Summary of the Invention

[0005] In view of this, this application provides a method for correcting light leakage data, which solves the problem in the prior art that for hyperspectral imagers, light leakage causes the superposition of spectral information of ground objects outside the slit during pushbroom imaging to affect the spectral data of ground objects in normal slit imaging.

[0006] The objective of this application can be achieved through the following technical solutions: The first aspect of this application is to provide a method for correcting light leakage point data, including: Multiple frames of the first slit image and multiple frames of the second slit image were obtained by push-broom imaging with a dual-slit hyperspectral imager. The first slit image has light leakage points. The first slit image and the second slit image are corrected based on the dark level correction coefficient and the relative radiation correction coefficient, respectively, to obtain the first slit corrected image and the second slit corrected image; Obtain the center wavelength position sequence of each spectral band corresponding to the first slit correction image and the center wavelength position sequence of each spectral band corresponding to the second slit correction image to obtain the first center wavelength position sequence and the second center wavelength position sequence. Using the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, a one-dimensional resampling function is used to resample the second slit correction image to obtain the second slit correction resampled image. Based on the relative consistency correction coefficient corresponding to the second slit, the second slit corrected resampled image is subjected to inter-slit relative consistency correction to obtain a consistent second slit corrected resampled image. The target frame number, target band index, and target spatial column index are determined based on the complementary position coefficient of the light leakage point and the frame number, band index, and spatial column index of the first slit-corrected image with light leakage point. The target frame number, target band index, and target spatial column index are the frame number, band index, and spatial column index of the consistent second slit-corrected resampled image corresponding to the first slit-corrected image with light leakage point. Based on the target frame number, target band index and target spatial column index, determine the radiation response value corresponding to the first slit corrected image with light leakage point, and obtain the first radiation response value; The first radiation response value is corrected based on the leakage intensity calibration coefficient to obtain the second radiation response value; The target radiation response value of the first slit-corrected image with the light leakage point is obtained by subtracting the second radiation response value from the radiation response value of the first slit-corrected image with the light leakage point.

[0007] In an optional embodiment, before correcting the first slit image and the second slit image based on the dark level correction coefficient and the relative radiation correction coefficient, respectively, to obtain the first slit corrected image and the second slit corrected image, the method further includes: Acquire the original light leak point calibration data, dark level correction coefficient, and relative radiation correction coefficient. The original light leak point calibration data includes at least one frame of original light leak point polychromatic light two-dimensional image and multiple frames of original light leak point monochromatic light two-dimensional image. Based on the dark level correction coefficient and the relative radiation correction coefficient, at least one frame of original leak point polychromatic light two-dimensional image and multiple frames of original leak point monochromatic light two-dimensional image are corrected respectively to obtain at least one frame of first leak point polychromatic light two-dimensional image and multiple frames of first leak point monochromatic light two-dimensional image. The calibration coefficients of the light leak point region are determined based on the two-dimensional image of the polychromatic light of the first light leak point and the adaptive conditional threshold. Based on the calibration coefficient of the leakage point region, the column where the leakage point is located in the monochromatic light two-dimensional image of the first leakage point in each frame is determined, and all the radiation response values ​​in the column where the leakage point is located are extracted to obtain the first response distribution vector. By fitting the first response distribution vector with a one-dimensional Gaussian function, the center position of the light leakage point and the complementary position of the light leakage point are obtained. Based on the center position and complementary position of the light leakage point, the complementary position coefficient of the light leakage point is calculated; The light leakage intensity calibration coefficients for pixel positions in the light leakage point region are calculated based on the calibration coefficients of the light leakage point region and the complementary position coefficients of the light leakage point.

[0008] In one optional embodiment, determining the calibration coefficients of the light leak point region based on the two-dimensional image of the polychromatic light of the first light leak point and an adaptive conditional threshold includes: For the polychromatic light two-dimensional image of the first leak point in each row, calculate the mean radiative response of the polychromatic light two-dimensional image of the first leak point in each row; Calculate the product of the mean radiative response and the preset threshold coefficient, and use the product as the adaptive conditional threshold. The pixel positions in the two-dimensional image of the polychromatic light of the first light leak point with a radiation response value greater than the adaptive condition threshold are assigned a first preset value, and the pixel positions in the two-dimensional image of the polychromatic light of the first light leak point with a radiation response value not greater than the adaptive condition threshold are assigned a second preset value, thus obtaining the calibration coefficient of the light leak point region. The preset threshold coefficient is a constant greater than 1.

[0009] In one optional embodiment, the complementary position coefficient of the light leakage point is calculated using the following formula, based on the center position and complementary position of the light leakage point: ; ; Where a and b are the complementary position coefficients of the leakage points. The center position of the light leak point in the monochromatic light two-dimensional image of the first light leak point in the i-th group is given. Let the complementary positions of the light leak points in the monochromatic two-dimensional image of the first light leak point in the i-th group be the positions of the light leak points. s is the number of groups in the monochromatic two-dimensional image of the first leak point, and i represents the group index.

[0010] In an optional embodiment, calculating the light leakage intensity calibration coefficient at the pixel position of the light leakage point region based on the light leakage point region calibration coefficient and the light leakage point complementary position coefficient includes: Based on the calibration coefficient of the light leak point region and the complementary position coefficient of the light leak point, the light leak intensity calibration coefficient of the pixel position in the light leak point region is calculated using the following formula:

[0011]

[0012] ; in, Let be the scaling factor for the light leakage intensity at the pixel position k-th row and j-th column in the two-dimensional image of the polychromatic light of the first light leakage point. Let be the radiative response value of the pixel at the k-th row and j-th column in the two-dimensional image of the polychromatic light at the first light leak point. Let be the radiative response value of the complementary position of the pixel at row k and column j in the two-dimensional image of the polychromatic light of the first leak point. Let a and b be the complementary positions of the kRow, and a and b be the complementary position coefficients of the leakage points. Let j be the dimension of the k-th spectral row. Let j be the dimension of the spatial column. Here, k represents the calibration coefficient for the light leak area, and j represents the column index.

[0013] In an optional embodiment, determining the radiative response value corresponding to the first slit-corrected image with light leakage points based on the target frame number, target band index, and target spatial column index to obtain the first radiative response value further includes: When the target band index determined based on the complementary position coefficient of the light leak point and the band index of the first slit corrected image with the light leak point is a sub-pixel position, the radiation response value corresponding to the first slit corrected image with the light leak point is determined according to the neighboring band index, target frame number and target spatial column index corresponding to the target band index, and the first radiation response value is obtained.

[0014] In one optional embodiment, using the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, a one-dimensional resampling function is used to resample the second slit correction image to obtain a second slit correction resampled image, including: Extract the radiation response value located in the j-th column of the m-th frame of the second slit-corrected image to obtain the second response distribution vector; Using the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, a one-dimensional resampling function is used to resample the second response distribution vector to obtain the third response distribution vector; the above operation is repeated until the third response distribution vectors corresponding to all frames of the second slit correction image are obtained. The third response distribution vector corresponding to all frames of the second slit-corrected image is used as the response distribution vector of the second slit-corrected resampled image to obtain the second slit-corrected resampled image.

[0015] A second aspect of this application is to provide a light leakage point data correction device, comprising: The imaging module is used to obtain multiple frames of first slit images and multiple frames of second slit images by push-broom imaging with a dual-slit hyperspectral imager. The first slit image has light leakage points. The first correction module is used to correct the first slit image and the second slit image based on the dark level correction coefficient and the relative radiation correction coefficient, respectively, to obtain the first slit corrected image and the second slit corrected image; The acquisition module is used to acquire the center wavelength position sequence of each spectral band corresponding to the first slit correction image and the center wavelength position sequence of each spectral band corresponding to the second slit correction image, so as to obtain the first center wavelength position sequence and the second center wavelength position sequence. The sampling module is used to resample the second slit correction image using the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, and to obtain the second slit correction resampled image by using a one-dimensional resampling function. The second correction module is used to perform inter-slit relative consistency correction on the second slit corrected resampled image based on the relative consistency correction coefficient corresponding to the second slit, so as to obtain a consistent second slit corrected resampled image. The first determining module is used to determine the target frame number, target band index, and target spatial column index based on the complementary position coefficient of the light leakage point and the frame number, band index, and spatial column index of the first slit-corrected image with light leakage point. The target frame number, target band index, and target spatial column index are the frame number, band index, and spatial column index of the consistent second slit-corrected resampled image corresponding to the first slit-corrected image with light leakage point. The second determining module is used to determine the radiation response value corresponding to the first slit corrected image with light leakage points based on the target frame number, target band index and target spatial column index, and obtain the first radiation response value. The correction module is used to correct the first radiation response value based on the leakage light intensity calibration coefficient to obtain the second radiation response value; The third determining module is used to subtract the second radiation response value from the radiation response value of the first slit-corrected image with the light leakage point to obtain the target radiation response value of the first slit-corrected image with the light leakage point.

[0016] A third aspect of this application is to provide an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to perform the method as described in the first aspect.

[0017] A fourth aspect of this application is to provide a computer-readable storage medium storing a computer program, which, when executed by a processor, performs the method as described in the first aspect.

[0018] Compared with existing technologies, the leakage point data correction method provided in this application relates to the field of spectral imaging technology. It corrects the first and second slit images based on dark level correction coefficients and relative radiometric correction coefficients, respectively. A one-dimensional resampling function is used to resample the corrected second slit image and perform relative consistency correction between slits, resulting in a consistent second slit corrected resampled image. The radiometric response value corresponding to the first slit corrected image with leakage points is determined based on the determined target frame number, target band index, and target spatial column index. This radiometric response value is corrected based on the leakage intensity calibration coefficient. The corrected radiometric response value is subtracted from the radiometric response value of the first slit corrected image with leakage points to obtain the target radiometric response value. This improves the situation where the superposition of spectral information of targets outside the slit affects the spectral data of targets normally imaged within the slit. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 A flowchart illustrating a method for correcting light leakage point data provided in an embodiment of this application; Figure 2 A schematic diagram of a first slit image provided in an embodiment of this application; Figure 3 A schematic diagram of a second slit image provided in an embodiment of this application; Figure 4 A schematic diagram of a two-dimensional image of the original light leak point polychromatic light (light leak point polychromatic light calibration data) provided in an embodiment of this application; Figure 5 A schematic diagram of a two-dimensional image of the original light leak point monochromatic light (light leak point monochromatic light calibration data) provided in an embodiment of this application; Figure 6 A schematic diagram of the dark level correction coefficient provided in an embodiment of this application; Figure 7 A schematic diagram of the relative radiation correction coefficient provided in an embodiment of this application; Figure 8 A schematic diagram of a light leakage point region provided in an embodiment of this application; Figure 9 A schematic diagram of the calibration coefficients for the light leakage region provided in an embodiment of this application; Figure 10A schematic diagram showing that the spectral information provided in the embodiments of this application is superimposed on the normal spectral information of a certain slit; Figure 11 A schematic diagram of multiple sets of light leakage point center positions PXiSpe and corresponding complementary slit positions PYiSpe provided in an embodiment of this application; Figure 12 A schematic diagram of the calibration coefficients for the complementary positions of light leakage points provided in an embodiment of this application; Figure 13 A schematic diagram of the light leakage point intensity calibration coefficient provided in an embodiment of this application; Figure 14 A comparative schematic diagram illustrating correction based on dark level correction coefficient and relative radiation correction coefficient provided in an embodiment of this application; Figure 15 A schematic diagram illustrating the relative consistency correction effect between slits provided in an embodiment of this application; Figure 16 A schematic diagram of the radiation response values ​​of a first slit-corrected image with light leakage points provided in an embodiment of this application; Figure 17 A schematic diagram of the target radiometric response value of a first slit-corrected image with a light leakage point provided in an embodiment of this application; Figure 18 A structural block diagram of a light leakage point data correction device provided in an embodiment of this application; Figure 19 This is a structural block diagram of an electronic device for implementing a light leakage point data correction method, provided in an embodiment of this application. Detailed Implementation

[0021] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort should fall within the scope of protection of the present application.

[0022] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0023] It should be understood that in the embodiments of this application, "at least one" means one or more, and "more than one" means two or more. "And / or" is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. The character " / " generally indicates that the related objects before and after it are in an "or" relationship. "Contains A, B and / or C" means containing any one, two, or three of A, B, and C.

[0024] It should be understood that in the embodiments of this application, "B corresponding to A", "B corresponding to A", "A corresponds to B", or "B corresponds to A" means that B is associated with A, and B can be determined based on A. Determining B based on A does not mean that B is determined solely based on A; B can also be determined based on A and / or other information.

[0025] Traditional methods for correcting bad pixels in hyperspectral imagers assume that the data at the bad pixel location is completely unusable and use data from adjacent pixels to fit the data at the bad pixel location. However, since the area affected by light leakage points is relatively large, and the data in this affected area still contains valid spectral information, traditional bad pixel correction methods are not suitable.

[0026] To address the technical problems existing in related technologies, embodiments of this application provide a method, apparatus, electronic device, and storage medium for correcting light leakage point data.

[0027] The light leak data correction method provided in this application can be executed by an electronic device, such as a terminal or a server. The terminal can be a smartphone, tablet, laptop, or other similar device. The server can be a standalone physical server, a server cluster or distributed system composed of multiple physical servers, or a cloud server providing basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud storage, network services, cloud communication, middleware services, domain name services, security services, CDN (Content Delivery Network), and big data and artificial intelligence platforms. It is understood that this application does not specifically limit the executing entity of the light leak data correction method.

[0028] The technical solution of this application will be described in detail below through specific embodiments. It should be noted that the following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments. The embodiments described below are used to explain the technical solution of this application and are not intended to limit actual use.

[0029] To address the technical problems existing in related technologies, embodiments of this application provide a method for correcting light leakage point data, such as... Figure 1 As shown, Figure 1 This is a flowchart illustrating a method for correcting light leakage point data provided in an embodiment of this application. It should be noted that the steps shown may be executed in a different logical order than those shown in the flowchart. The method may include the following steps S101 to S109.

[0030] Step S101: Obtain multiple frames of the first slit image and multiple frames of the second slit image by push-broom imaging with a dual-slit hyperspectral imager.

[0031] It should be noted that a dual-slit hyperspectral imager typically contains two parallel slits, each corresponding to a different optical path or spectral channel. During the pushbroom imaging process of a dual-slit hyperspectral imager, a single frame of raw image usually contains the regions imaged by each slit on the detector, with each slit corresponding to one spatial dimension and one spectral dimension.

[0032] In one optional embodiment, the spectral-spatial sub-regions corresponding to each of the two slits are extracted from the original image frame to obtain a first slit image DataS1Raw and a second slit image DataS2Raw. Both DataS1Raw and DataS2Raw have dimensions of Bands×Cols×Frames, where Bands is the number of imaging bands of the dual-slit hyperspectral imager, Cols is the number of detector spatial dimensions, and Frames is the number of pushbroom imaging frames. Figure 2 As shown, Figure 2 This is a schematic diagram of the first slit image. Figure 3 This is a schematic diagram of the second slit image. It should be noted that... Figure 2 and Figure 3 Imaging of different ground features at the same time.

[0033] In one optional embodiment, the number of frames captured can be 2580 frames, 3000 frames, or 5000 frames, etc.

[0034] Step S102: Correct the first slit image and the second slit image based on the dark level correction coefficient and the relative radiation correction coefficient respectively to obtain the first slit corrected image and the second slit corrected image.

[0035] In an optional embodiment, before correcting the first slit image and the second slit image based on the dark level correction coefficient and the relative radiation correction coefficient, respectively, to obtain the first slit corrected image and the second slit corrected image, the method further includes: The process involves acquiring original light leak point calibration data, dark level correction coefficients, and relative radiometric correction coefficients. The original light leak point calibration data includes at least one frame of original light leak point polychromatic light 2D image and multiple frames of original light leak point monochromatic light 2D images. Based on the dark level correction coefficients and relative radiometric correction coefficients, the at least one frame of original light leak point polychromatic light 2D image and the multiple frames of original light leak point monochromatic light 2D images are corrected to obtain at least one frame of first light leak point polychromatic light 2D image and multiple frames of first light leak point monochromatic light 2D images. Based on the first light leak point polychromatic light 2D image and an adaptive conditional threshold, the light leak point is determined. The light spot region calibration coefficient is used to determine the column of the first light leak point in the monochromatic two-dimensional image of each frame based on the light leak point region calibration coefficient. All radiation response values ​​in the column of the light leak point are extracted to obtain the first response distribution vector. The first response distribution vector is fitted with a one-dimensional Gaussian function to obtain the center position and complementary position of the light leak point. The complementary position coefficient of the light leak point is calculated based on the center position and complementary position of the light leak point. The light leak intensity calibration coefficient of the pixel position of the light leak point region is calculated according to the light leak point region calibration coefficient and the complementary position coefficient of the light leak point.

[0036] It should be noted that the original light leak points in the monochromatic two-dimensional images correspond to different wavelengths in different frames.

[0037] In one optional embodiment, an integrating sphere solar simulator is used as a polychromatic light source to illuminate the dual-slit hyperspectral imager to obtain a two-dimensional image of the polychromatic light leak point, and a monochromator is used as an adjustable monochromatic light source to illuminate the dual-slit hyperspectral imager to obtain a two-dimensional image of the monochromatic light leak point.

[0038] In one specific embodiment, the original size of the detector in the dual-slit hyperspectral imager is Rows × Cols, where Rows represents the number of pixels in the vertical direction (broom direction or height) and Cols represents the number of pixels in the horizontal direction. For example, the detector has 183 rows in the spectral dimension and 1000 columns in the spatial dimension.

[0039] In a more specific embodiment, the first slit imaging region is rows 1-84 of the detector's spectral dimension, and the second slit imaging region is rows 100-183 of the detector's spectral dimension.

[0040] In a more specific embodiment, Figure 4 This is a schematic diagram of a two-dimensional image of the original light leak point polychromatic light (light leak point polychromatic light calibration data) provided in an embodiment of this application. The number of bands in the spectral data acquired by the dual-slit hyperspectral imager can be 84.

[0041] Figure 4 It includes a two-dimensional image of polychromatic light with light leak points (located in...) Figure 4 Top), spectral response of a single pixel column (located in Figure 4 (right side) and three-dimensional spectral map (located in) Figure 4 (Left side), and mark the light leak point with arrows and rectangles to indicate that an unexpected strong light signal appeared at a certain location.

[0042] The spectral response of a single pixel column is a spectral intensity distribution map extracted from a column (i.e., a vertical line) in the top image. Grayscale represents the digital number (DN) at different wavelengths. The vertical direction represents the spectral band (e.g., from short to long wavelength), and the horizontal direction represents the spatial location. A bright vertical stripe appears in the middle, corresponding to the location of the "leak point." This stripe exists across the entire spectral range (i.e., there is a response in all bands), indicating that this is not a signal of a specific wavelength, but rather a type of broadband interference.

[0043] The 3D spectral plot shows the variation of DN values ​​for a row (or column) of pixels across different wavelengths. The X-axis represents the spectral dimension (band number, 0-200), the Y-axis the spatial dimension (pixel row number, or temporal / spatial scan position), and the Z-axis a numerical value reflecting the radiative response. The range is 0-4000. The 3D surface plot has two symmetrical "peak" structures, corresponding to two highly reflective regions (like two metal strips); between them is a valley representing a low-reflection region; in the middle of the valley is an anomalously enhanced region, which is precisely the spectral manifestation of light leakage points.

[0044] In another, more specific embodiment... Figure 5A schematic diagram of the original two-dimensional monochromatic light image of the light leak point (monochromatic light calibration data of the light leak point) provided in the embodiments of this application, as shown below. Figure 5 As shown, Figure 5 This includes monochromatic light calibration data at different wavelengths such as 450nm, 550nm, and 650nm, with light leakage points marked by arrows and rectangles. Spes represents multiple sets of data collected at different wavelengths; for example, Spes is 3.

[0045] In one optional embodiment, obtaining the dark level correction coefficient specifically includes the following steps: acquiring multiple frames of images using a dual-slit hyperspectral imager in a dark environment; for each pixel location, calculating the average response value of the pixel location in all images, and using the average response value as the dark level correction coefficient.

[0046] In a more specific embodiment, such as Figure 6 As shown, Figure 6 This is a schematic diagram of the dark level correction coefficient provided in an embodiment of this application.

[0047] In another alternative embodiment, obtaining the relative radiation correction coefficient specifically includes the following steps: Under uniform illumination, a standard white board is imaged using a dual-slit hyperspectral imager to obtain the original image of the white board. The standard white board refers to a white board whose reflectivity and spectral response meet the preset conditions. The original image of the white board is corrected using a dark level correction coefficient to obtain a dark level corrected image of the white board. The average response of each row of the image in the spatial dimension is calculated to obtain the average response of each row of the image in the spatial dimension. The average response of each row of the image in the spatial dimension is divided by the response value of each pixel position in the corresponding row to obtain the relative radiometric correction coefficient. The relative radiometric correction coefficient is a correction coefficient matrix that matches the detector size.

[0048] In a more specific embodiment, such as Figure 7 As shown, Figure 7 This is a schematic diagram of a relative radiation correction coefficient provided in an embodiment of this application.

[0049] In one specific embodiment, based on the dark level correction coefficient and the relative radiation correction coefficient, at least one frame of the original leak point polychromatic light two-dimensional image is corrected using the following formula to obtain at least one frame of the first leak point polychromatic light two-dimensional image, including: (1); in, This is a two-dimensional image of the polychromatic light at the first light leak point. This is a two-dimensional image of the original leak point polychromatic light. This is the dark level correction factor. This is the relative radiation correction factor. This is a dot product operation.

[0050] In one specific embodiment, based on the dark level correction coefficient and the relative radiation correction coefficient, the following formula is used to correct multiple frames of original leak point monochromatic light two-dimensional images to obtain multiple frames of first leak point monochromatic light two-dimensional images, including: (2); in, This is a two-dimensional image of the original light leak point monochromatic light. The first leak point monochromatic light two-dimensional image, This is the dark level correction factor. This is the relative radiation correction factor. This is a dot product operation.

[0051] In one specific embodiment, determining the calibration coefficients of the light leak point region based on the two-dimensional image of the polychromatic light of the first light leak point and an adaptive conditional threshold includes: For each row of the first leak point polychromatic light two-dimensional image, calculate the mean radiative response of the first leak point polychromatic light two-dimensional image of each row; calculate the product of the mean radiative response and the preset threshold coefficient, and use the product as the adaptive condition threshold; assign the pixel positions in the first leak point polychromatic light two-dimensional image where the radiative response value is greater than the adaptive condition threshold to the first preset value, and assign the pixel positions in the first leak point polychromatic light two-dimensional image where the radiative response value is not greater than the adaptive condition threshold to the second preset value, to obtain the calibration coefficient of the leak point region, where the preset threshold coefficient is a constant greater than 1.

[0052] In a more specific embodiment, the first preset value can be 1, and the second preset value can be 0.

[0053] In a more specific embodiment, Figure 8 This is a schematic diagram of a light leakage point region provided in an embodiment of this application. Figure 9 This is a schematic diagram of the calibration coefficients for the light leakage point region provided in an embodiment of this application.

[0054] In one specific embodiment, based on the principle of double-slit imaging, the spectral information of the light leakage point will be superimposed on the normal spectral information of one of the slits. Figure 10 This is a schematic diagram illustrating how the spectral information of a light leakage point provided in an embodiment of this application is superimposed on the normal spectral information of a slit. Figure 10The image includes the hyperspectral imager's dual-slit plane, the ground feature area projected by slit 1, the ground feature area projected by the light leak point, and the ground feature area projected by slit 2. The ground feature area projected by the light leak point marks the projection position of the light leak point on the ground. The ground feature area projected by slit 1 represents the range of ground features imaged through the first slit, and the ground feature area projected by slit 2 represents the range of ground features imaged through the second slit. The push-broom imaging direction (from left to right) reflects the time series characteristics of push-broom imaging. Figure 10 The data also includes a spectral dimension of one frame of data, consisting of a spectral curve, including the spectrum of slit 1 and the spectrum of slit 2. The spectrum of slit 1 represents the spectral information of ground objects received from slit 1, and the spectrum of slit 2 represents the spectral information of ground objects received from slit 2. The spectra of the ground objects at the light leakage point are superimposed on the spectrum of the ground objects in slit 1.

[0055] In one specific embodiment, monochromatic light calibration data of the Spes group were collected. For the iSpe group of monochromatic light calibration data, the column jCol where the light leakage point is located was determined according to CoeffArea, and a column of spectral data CalibMono was extracted. jCol，iSpe Using a one-dimensional Gaussian fitting method, the center position of the light leak point in the current iSpe band data, PXiSpe, and the corresponding complementary position of another slit, PYiSpe, are determined, as follows: Figure 11 As shown, Figure 11 This diagram illustrates multiple sets of leak point center positions PXiSpe (leak point position PX) and corresponding complementary slit positions PYiSpe (complementary correction position PY) provided in embodiments of this application. It includes the leak point center position and corresponding complementary slit position for 450nm monochromatic light, the leak point center position and corresponding complementary slit position for 550nm monochromatic light, and the leak point center position and corresponding complementary slit position for 650nm monochromatic light. The horizontal axis represents the number of spectral rows, ranging from 1 to 200; the vertical axis represents numerical values, ranging from 0 to 4500.

[0056] In one specific embodiment, the complementary position coefficient of the light leakage point is calculated using the following formula, based on the center position and complementary position of the light leakage point: (3); ; Where a and b are the complementary position coefficients of the leakage points. The center position of the light leak point in the monochromatic light two-dimensional image of the first light leak point in the i-th group is given. Let the complementary positions of the light leak points in the monochromatic two-dimensional image of the first light leak point in the i-th group be the positions of the light leak points. s is the number of groups in the monochromatic two-dimensional image of the first leak point, and i represents the group index.

[0057] In a more specific embodiment, PX iSpeFor [134.0, 111.0, 94.5, 81.5, 71.0], PY iSpe Given [170.0, 147.0, 130.5, 117.5, 107.0], the calculated complementary position coefficients of the leakage points are a = 1.0 and b = 36.0. For example... Figure 12 As shown, Figure 12 This is a schematic diagram of the calibration coefficients for the complementary positions of light leaks provided in an embodiment of this application. The horizontal axis represents the position of the light leaks, ranging from 60 to 140, and the vertical axis represents the corresponding complementary correction position, ranging from 80 to 180. Circles distributed on a straight line represent the pairing relationship between different light leaks and their complementary correction positions.

[0058] In one specific embodiment, the light leakage intensity calibration coefficient at the pixel position of the light leakage point region is calculated based on the light leakage point region calibration coefficient and the light leakage point complementary position coefficient, including: (4); (5); ; in, Let be the scaling factor for the light leakage intensity at the pixel position k-th row and j-th column in the two-dimensional image of the polychromatic light of the first light leakage point. Let be the radiative response value of the pixel at the k-th row and j-th column in the two-dimensional image of the polychromatic light at the first light leak point. Let be the radiative response value of the complementary position of the pixel at row k and column j in the two-dimensional image of the polychromatic light of the first leak point. Let a and b be the complementary positions of the kRow, and a and b be the complementary position coefficients of the leakage points. Let j be the dimension of the k-th spectral row. Let j be the dimension of the spatial column. Here, k represents the calibration coefficient for the light leak area, and j represents the column index.

[0059] In a more specific embodiment, such as Figure 13 As shown, Figure 13This diagram illustrates a light leak intensity calibration coefficient provided in an embodiment of this application. It includes an elongated structure representing the entrance slit region of a dual-slit hyperspectral imager. An arrow points to this region, indicating that it is the entry point for light into the dual-slit hyperspectral imager. Each slit allows ground light from a specific direction to enter, forming a one-dimensional spatial sampling. It also includes a vertical cross-section representing the detector chip, presented as a slender cylinder with multiple pixel units stacked inside. After beam splitting, the light is projected onto different rows (spectral dimensions) of the detector, each row corresponding to a wavelength channel. The diagram shows a three-dimensional hyperspectral data cube: X-axis: spatial horizontal coordinate (along the slit direction), Y-axis: spatial vertical coordinate (broom direction), and Z-axis: spectral dimension (different wavelengths). For example, the coordinates of a light leak point in the diagram are (19, 32, 0.00917916). The rectangular plane in the lower left figure represents the data layer acquired in a certain frame of pushbroom imaging. The multiple vertical lines extending downward from this plane represent the spectral information acquired at different spatial locations. The rectangular marked areas refer to the abnormal bright spots formed on the detector due to stray light. The arrows connecting the detector and the data cube indicate that the signal on the detector is mapped to the corresponding position in the three-dimensional data cube.

[0060] In another optional embodiment, the first slit image and the second slit image are corrected based on the dark level correction coefficient and the relative radiation correction coefficient, respectively, to obtain the first slit corrected image and the second slit corrected image, including: Based on the dark level correction coefficient and the relative radiation correction coefficient, the first slit image and the second slit image are corrected using the following formulas to calculate the corrected first slit image and the corrected second slit image: (6) in, Corrected image for the first slit. Image of the first slit. This is the dark level correction factor. This is the relative radiation correction factor; (7) in, For the second slit correction image, Image of the second slit. This is the dark level correction factor. This is the relative radiation correction factor.

[0061] In a more specific embodiment, such as Figure 14 As shown, Figure 14 This is a comparative diagram showing the correction based on dark level correction coefficient and relative radiation correction coefficient provided in the embodiments of this application.

[0062] Step S103: Obtain the center wavelength position sequence of each spectral band corresponding to the first slit correction image and the center wavelength position sequence of each spectral band corresponding to the second slit correction image, to obtain the first center wavelength position sequence and the second center wavelength position sequence.

[0063] In one optional embodiment, obtaining the center wavelength position sequence of each spectral band corresponding to the first slit-corrected image and the center wavelength position sequence of each spectral band corresponding to the second slit-corrected image to obtain the first center wavelength position sequence and the second center wavelength position sequence includes: Wavelength calibration was performed on the dual-slit hyperspectral imager to establish a calibration curve between pixel position and wavelength. The center wavelength position sequence of each spectral band was extracted from the first slit calibrated image and the second slit calibrated image using the calibration curve to obtain the first center wavelength position sequence and the second center wavelength position sequence.

[0064] Step S104: Using the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, a one-dimensional resampling function is used to resample the second slit correction image to obtain the second slit correction resampled image.

[0065] In one optional embodiment, using the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, a one-dimensional resampling function is used to resample the second slit correction image to obtain a second slit correction resampled image, including: Extract the radiation response value located in the j-th column of the m-th frame of the second slit-corrected image to obtain the second response distribution vector; use the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, and resample the second response distribution vector using a one-dimensional resampling function to obtain the third response distribution vector; repeat the above operation until the third response distribution vectors corresponding to all frames of the second slit-corrected image are obtained; use the third response distribution vectors corresponding to all frames of the second slit-corrected image as the response distribution vector of the second slit-corrected resampled image to obtain the second slit-corrected resampled image.

[0066] In one specific embodiment, using the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, a one-dimensional resampling function is used to resample the second response distribution vector to obtain the third response distribution vector: (8); j m ; in, Let be the radiative response value of the j-th column in the m-th frame of the second slit-corrected image after resampling. For a one-dimensional resampling function, This is the second center wavelength position sequence. Let be the radiative response value of the j-th column in the second slit corrected image of the m-th frame. The first center wavelength position sequence, For the column set of the second slit correction image, The set of frames for the second slit correction image.

[0067] In a more specific embodiment, the one-dimensional resampling function includes, but is not limited to, the following methods: linear interpolation, nearest neighbor interpolation, and spline interpolation.

[0068] In this step, the center wavelength position Cen2 of each spectral band of the second slit imaging data DataS2 is resampled pixel by pixel to the center wavelength position Cen1 of each spectral band of the first slit imaging data to obtain the resampled second slit data DataS21, so as to ensure that the center wavelength of each spectral band of the two slit pushbroom imaging data is consistent, thereby achieving spectral alignment.

[0069] Step S105: Perform inter-slit relative consistency correction on the second slit corrected resampled image based on the relative consistency correction coefficient corresponding to the second slit, to obtain a consistent second slit corrected resampled image.

[0070] To ensure the relative consistency of the two slit data, it is necessary to perform inter-slit relative consistency correction on the second slit data segment by segment towards the first slit, based on the second slit spectral resampling.

[0071] It should be noted that in a laboratory environment, a series of calibration processes are typically performed to ensure the accuracy of measuring instruments. Calibration refers to the operation of compensating for instrument system errors by measuring the deviation of a standard, thereby improving the accuracy (precision) of the instrument or system. For obtaining the relative consistency correction coefficient for the second slit, this process involves precise adjustment and calibration of the instrument to ensure the consistency and reliability of its measurement results under different conditions.

[0072] In one alternative embodiment, the relative consistency correction coefficient is obtained using laboratory calibration, the specific acquisition process of which is existing technology and will not be described in detail here.

[0073] In one optional embodiment, based on the relative consistency correction coefficient corresponding to the second slit, the relative consistency between slits is corrected on the second slit corrected resampled image using the following formula to obtain a consistent second slit corrected resampled image: (9); j

[0074] m

[0075] in, Let be the radiative response value of the j-th column in the m-th frame coherent second slit correction resampled image. Let j be the radiative response value in the j-th column of the second slit corrected resampled image of the m-th frame. This is the relative consistency correction coefficient corresponding to the second slit. For the column set of the second slit correction image, The set of frames for the second slit correction image.

[0076] In a more specific embodiment, such as Figure 15 As shown, Figure 15 This is a schematic diagram of the relative consistency correction effect between slits provided in the embodiments of this application. The horizontal axis represents the wavelength, ranging from 400nm to 900nm (nanometers), and the vertical axis represents the numerical value, ranging from 0 to 2500, which represents the signal strength (radiative response value) received by the detector. Figure 15 It also includes the spectral response acquired by the first slit (slit 1), the spectral response acquired by the second slit (slit 2), and the result of resampling and correcting the data of slit 2 and aligning it with the data of slit 1 on the same wavelength grid (relative correction between slits).

[0077] In this step, it is considered that even after spectral resampling is completed, there may still be inconsistencies in the radiation response between the two slits. Therefore, by introducing a relative consistency correction between the slits, the resampled second slit image is corrected using a relative consistency correction coefficient to obtain a consistent second slit corrected resampled image. This can further eliminate radiation deviations between the slits, achieve radiation consistency, and thus enhance the reliability of light leakage point repair.

[0078] Step S106: Determine the target frame number, target band index, and target spatial column index based on the complementary position coefficients of the light leak points and the frame number, band index, and spatial column index of the first slit corrected image with light leak points.

[0079] It should be noted that the target frame number, target band index, and target spatial column index are the frame number, band index, and spatial column index of the consistent second slit-corrected resampled image corresponding to the first slit-corrected image with light leakage points.

[0080] In an optional embodiment, the target frame number is determined using the following formula, based on the complementary position coefficients of the light leaks and the frame number of the first slit-corrected image where the light leaks exist: (10); in, The target frame number, 'b' represents the frame number of the first slit corrected image where light leaks, and 'b' represents the complementary position coefficient of the light leak.

[0081] In an optional embodiment, the target band index is determined using the following formula, based on the complementary position coefficients of the light leaks and the band index of the first slit-corrected image where the light leaks exist: (11); in, Index the target band. b are the complementary position coefficients of the light leakage points. The band index for the corrected image of the first slit where light leakage occurs.

[0082] Step S107: Determine the radiation response value corresponding to the first slit corrected image with light leakage points based on the target frame number, target band index and target spatial column index, and obtain the first radiation response value.

[0083] In an optional embodiment, based on the target frame number, target band index, and target spatial column index, the radiometric response value corresponding to the first slit-corrected image with the light leakage point is determined using the following formula, thus obtaining the first radiometric response value: (12); in, This is the radiative response value corresponding to the pixel position in the j-th column of the p-th band in the first slit corrected image of the current frame where a light leak exists. For consistency, the radiometric response values ​​of the frame number, band index, and spatial column index corresponding to the pixel position of the p-th band and j-th column in the first slit-corrected image of the current frame with the light leakage point in the second slit-corrected resampled image are used.

[0084] It should be noted that the calibration coefficient for pBand,jCol∈Leakage Point Region is 1.

[0085] In another optional embodiment, the first radiation response value is obtained by determining the radiation response value corresponding to the first slit-corrected image with the light leakage point based on the target frame number, target band index, and target spatial column index, and further includes: When the target band index determined based on the complementary position coefficient of the light leak point and the band index of the first slit corrected image with the light leak point is a sub-pixel position, the radiation response value corresponding to the first slit corrected image with the light leak point is determined according to the neighboring band index, target frame number and target spatial column index corresponding to the target band index, and the first radiation response value is obtained.

[0086] Step S108: Correct the first radiation response value based on the leakage light intensity calibration coefficient to obtain the second radiation response value.

[0087] In one alternative embodiment, based on the leakage intensity calibration coefficient, the first radiative response value is corrected using the following formula to obtain the second radiative response value: (13); in, The second radiative response value of the p-th band in the j-th column of the corrected image of the first slit where a light leakage point exists. The first radiative response value of the p-th band in the j-th column of the corrected image of the first slit where a light leakage point exists. is the scaling factor for the light leakage intensity at the k-th row and i-th column of the pixel position in the two-dimensional polychromatic light image of the first light leakage point.

[0088] It should be noted that the calibration coefficient for the iBand,iCol ∈ leak point region is 1.

[0089] Step S109: Subtract the second radiation response value from the radiation response value of the first slit-corrected image with the light leakage point to obtain the target radiation response value of the first slit-corrected image with the light leakage point.

[0090] In this embodiment, a light leak point calibration coefficient is generated based on the laboratory calibration results of the light leak point, the hyperspectral imager push-broom imaging double slit data is preprocessed, and the light leak point region is corrected based on the light leak point calibration coefficient.

[0091] In one specific embodiment, this application provides a schematic diagram of the radiometric response values ​​of a first slit-corrected image with light leakage points, as shown below. Figure 16 As shown in the figure. This application embodiment provides a schematic diagram of the target radiometric response value of a first slit-corrected image with light leakage points, as shown in the figure. Figure 17 As shown.

[0092] Corresponding to the light leakage point data correction method provided in the embodiments of this application, the embodiments of this application also provide a light leakage point data correction device, such as... Figure 18 As shown, the light leakage point data correction device includes: The imaging module 1801 is used to obtain multiple frames of first slit images and multiple frames of second slit images by push-broom imaging with a dual-slit hyperspectral imager. The first slit image has light leakage points. The first correction module 1802 is used to correct the first slit image and the second slit image based on the dark level correction coefficient and the relative radiation correction coefficient, respectively, to obtain the first slit corrected image and the second slit corrected image. The acquisition module 1803 is used to acquire the center wavelength position sequence of each spectral band corresponding to the first slit correction image and the center wavelength position sequence of each spectral band corresponding to the second slit correction image, so as to obtain the first center wavelength position sequence and the second center wavelength position sequence. The sampling module 1804 is used to resample the second slit correction image using a one-dimensional resampling function with the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, to obtain the second slit correction resampled image. The second correction module 1805 is used to perform inter-slit relative consistency correction on the second slit correction resampled image based on the relative consistency correction coefficient corresponding to the second slit, so as to obtain a consistent second slit correction resampled image. The first determining module 1806 is used to determine the target frame number, target band index, and target spatial column index based on the complementary position coefficient of the light leakage point and the frame number, band index, and spatial column index of the first slit-corrected image with the light leakage point. The target frame number, target band index, and target spatial column index are the frame number, band index, and spatial column index of the consistent second slit-corrected resampled image corresponding to the first slit-corrected image with the light leakage point. The second determining module 1807 is used to determine the radiation response value corresponding to the first slit corrected image with a light leakage point based on the target frame number, the target band index and the target spatial column index, and to obtain the first radiation response value. The correction module 1808 is used to correct the first radiation response value based on the leakage light intensity calibration coefficient to obtain the second radiation response value; The third determining module 1809 is used to subtract the second radiation response value from the radiation response value of the first slit-corrected image with the light leakage point to obtain the target radiation response value of the first slit-corrected image with the light leakage point.

[0093] Corresponding to the light leakage point data correction method provided in the embodiments of this application, the embodiments of this application also provide an electronic device for performing the light leakage point data correction method, such as... Figure 19 As shown, the electronic device includes: a processor 1901; and a memory 1902 for storing a program for correcting light leakage data. After the device is powered on and the program for correcting light leakage data is run by the processor, the following steps are performed: Multiple frames of the first slit image and multiple frames of the second slit image were obtained by push-broom imaging with a dual-slit hyperspectral imager. The first slit image has light leakage points. The first slit image and the second slit image are corrected based on the dark level correction coefficient and the relative radiation correction coefficient, respectively, to obtain the first slit corrected image and the second slit corrected image; Obtain the center wavelength position sequence of each spectral band corresponding to the first slit correction image and the center wavelength position sequence of each spectral band corresponding to the second slit correction image to obtain the first center wavelength position sequence and the second center wavelength position sequence. Using the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, a one-dimensional resampling function is used to resample the second slit correction image to obtain the second slit correction resampled image. Based on the relative consistency correction coefficient corresponding to the second slit, the second slit corrected resampled image is subjected to inter-slit relative consistency correction to obtain a consistent second slit corrected resampled image. The target frame number, target band index, and target spatial column index are determined based on the complementary position coefficient of the light leakage point and the frame number, band index, and spatial column index of the first slit-corrected image with light leakage point. The target frame number, target band index, and target spatial column index are the frame number, band index, and spatial column index of the consistent second slit-corrected resampled image corresponding to the first slit-corrected image with light leakage point. Based on the target frame number, target band index and target spatial column index, determine the radiation response value corresponding to the first slit corrected image with light leakage point, and obtain the first radiation response value; The first radiation response value is corrected based on the leakage intensity calibration coefficient to obtain the second radiation response value; The target radiation response value of the first slit-corrected image with the light leakage point is obtained by subtracting the second radiation response value from the radiation response value of the first slit-corrected image with the light leakage point.

[0094] Corresponding to the light leakage point data correction method provided in the embodiments of this application, the embodiments of this application also provide a computer-readable storage medium storing a program for the light leakage point data correction method, which is executed by a processor to perform the following steps: Multiple frames of the first slit image and multiple frames of the second slit image were obtained by push-broom imaging with a dual-slit hyperspectral imager. The first slit image has light leakage points. The first slit image and the second slit image are corrected based on the dark level correction coefficient and the relative radiation correction coefficient, respectively, to obtain the first slit corrected image and the second slit corrected image; Obtain the center wavelength position sequence of each spectral band corresponding to the first slit correction image and the center wavelength position sequence of each spectral band corresponding to the second slit correction image to obtain the first center wavelength position sequence and the second center wavelength position sequence. Using the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, a one-dimensional resampling function is used to resample the second slit correction image to obtain the second slit correction resampled image. Based on the relative consistency correction coefficient corresponding to the second slit, the second slit corrected resampled image is subjected to inter-slit relative consistency correction to obtain a consistent second slit corrected resampled image. The target frame number, target band index, and target spatial column index are determined based on the complementary position coefficient of the light leakage point and the frame number, band index, and spatial column index of the first slit-corrected image with light leakage point. The target frame number, target band index, and target spatial column index are the frame number, band index, and spatial column index of the consistent second slit-corrected resampled image corresponding to the first slit-corrected image with light leakage point. Based on the target frame number, target band index and target spatial column index, determine the radiation response value corresponding to the first slit corrected image with light leakage point, and obtain the first radiation response value; The first radiation response value is corrected based on the leakage intensity calibration coefficient to obtain the second radiation response value; The target radiation response value of the first slit-corrected image with the light leakage point is obtained by subtracting the second radiation response value from the radiation response value of the first slit-corrected image with the light leakage point.

[0095] Corresponding to the light leakage point data correction method provided in the embodiments of this application, the embodiments of this application also provide a computer program containing instructions, which, when executed by a computer, cause the computer to perform the following steps: Multiple frames of the first slit image and multiple frames of the second slit image were obtained by push-broom imaging with a dual-slit hyperspectral imager. The first slit image has light leakage points. The first slit image and the second slit image are corrected based on the dark level correction coefficient and the relative radiation correction coefficient, respectively, to obtain the first slit corrected image and the second slit corrected image; Obtain the center wavelength position sequence of each spectral band corresponding to the first slit correction image and the center wavelength position sequence of each spectral band corresponding to the second slit correction image to obtain the first center wavelength position sequence and the second center wavelength position sequence. Using the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, a one-dimensional resampling function is used to resample the second slit correction image to obtain the second slit correction resampled image. Based on the relative consistency correction coefficient corresponding to the second slit, the second slit corrected resampled image is subjected to inter-slit relative consistency correction to obtain a consistent second slit corrected resampled image. The target frame number, target band index, and target spatial column index are determined based on the complementary position coefficient of the light leakage point and the frame number, band index, and spatial column index of the first slit-corrected image with light leakage point. The target frame number, target band index, and target spatial column index are the frame number, band index, and spatial column index of the consistent second slit-corrected resampled image corresponding to the first slit-corrected image with light leakage point. Based on the target frame number, target band index and target spatial column index, determine the radiation response value corresponding to the first slit corrected image with light leakage point, and obtain the first radiation response value; The first radiation response value is corrected based on the leakage intensity calibration coefficient to obtain the second radiation response value; The target radiation response value of the first slit-corrected image with the light leakage point is obtained by subtracting the second radiation response value from the radiation response value of the first slit-corrected image with the light leakage point.

[0096] It should be noted that for a detailed description of the light leakage point data correction device, electronic device, computer-readable storage medium and computer program provided in the embodiments of this application, please refer to the relevant description of the embodiments of the light leakage point data correction method provided in the embodiments of this application, which will not be repeated here.

[0097] Although this application discloses preferred embodiments as described above, it is not intended to limit this application. Any person skilled in the art can make possible changes and modifications without departing from the spirit and scope of this application. Therefore, the scope of protection of this application should be determined by the scope defined in the claims of this application.

[0098] In a typical configuration, an electronic device includes one or more processors (Central Processing Units), input / output interfaces, network interfaces, and memory.

[0099] Memory may include non-persistent storage in computer-readable media, such as random access memory and / or non-volatile memory, like read-only memory or flash memory. Memory is an example of computer-readable media.

[0100] Computer-readable media, including both permanent and non-permanent, removable and non-removable media, can store information using any method or technology. Information can be computer-readable operations, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase-change memory, static random access memory, dynamic random access memory, other types of random access memory, read-only memory, electrically erasable programmable read-only memory, flash memory or other memory technologies, compact disc read-only memory, digital video disc or other optical storage, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include non-transitory computer-readable media, such as modulated data signals and carrier waves.

[0101] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product implemented on one or more computer-usable storage media (including, but not limited to, disk storage, compact disc read-only memory, optical storage, etc.) containing computer-usable program code.

[0102] Although this application discloses preferred embodiments as described above, it is not intended to limit this application. Any person skilled in the art can make possible changes and modifications without departing from the spirit and scope of this application. Therefore, the scope of protection of this application should be determined by the scope defined in the claims of this application.

Claims

1. A method for correcting light leakage point data, characterized in that, include: Multiple frames of first slit images and multiple frames of second slit images were obtained by push-broom imaging with a dual-slit hyperspectral imager. The first slit image has light leakage points. The first slit image and the second slit image are corrected based on the dark level correction coefficient and the relative radiation correction coefficient, respectively, to obtain the first slit corrected image and the second slit corrected image; Obtain the center wavelength position sequence of each spectral band corresponding to the first slit correction image and the center wavelength position sequence of each spectral band corresponding to the second slit correction image to obtain the first center wavelength position sequence and the second center wavelength position sequence. Using the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, a one-dimensional resampling function is used to resample the second slit correction image to obtain the second slit correction resampled image. Based on the relative consistency correction coefficient corresponding to the second slit, the second slit corrected resampled image is subjected to inter-slit relative consistency correction to obtain a consistent second slit corrected resampled image; The target frame number, target band index, and target spatial column index are determined based on the complementary position coefficient of the light leak point and the frame number, band index, and spatial column index of the first slit-corrected image containing the light leak point. The target frame number, target band index, and target spatial column index are the frame number, band index, and spatial column index of the consistent second slit-corrected resampled image corresponding to the first slit-corrected image containing the light leak point. Based on the target frame number, target band index and target spatial column index, determine the radiation response value corresponding to the first slit corrected image with the light leakage point, and obtain the first radiation response value; The first radiation response value is corrected based on the leakage intensity calibration coefficient to obtain the second radiation response value; The target radiation response value of the first slit-corrected image containing the light leakage point is obtained by subtracting the second radiation response value from the radiation response value of the first slit-corrected image containing the light leakage point.

2. The method for correcting light leakage point data according to claim 1, characterized in that, Before correcting the first slit image and the second slit image based on the dark level correction coefficient and the relative radiation correction coefficient respectively to obtain the first slit corrected image and the second slit corrected image, the method further includes: Acquire the original light leak point calibration data, dark level correction coefficient, and relative radiation correction coefficient. The original light leak point calibration data includes at least one frame of original light leak point polychromatic light two-dimensional image and multiple frames of original light leak point monochromatic light two-dimensional image. Based on the dark level correction coefficient and the relative radiation correction coefficient, at least one frame of the original leak point polychromatic light two-dimensional image and multiple frames of the original leak point monochromatic light two-dimensional image are corrected respectively to obtain at least one frame of the first leak point polychromatic light two-dimensional image and multiple frames of the first leak point monochromatic light two-dimensional image. The calibration coefficients of the light leak point region are determined based on the two-dimensional image of the polychromatic light of the first light leak point and the adaptive conditional threshold. Based on the calibration coefficient of the light leakage point region, determine the column where the light leakage point is located in the monochromatic light two-dimensional image of the first light leakage point in each frame, extract all the radiation response values ​​in the column where the light leakage point is located, and obtain the first response distribution vector. The first response distribution vector is fitted with a one-dimensional Gaussian function to obtain the center position of the light leakage point and the complementary position of the light leakage point. Based on the center position of the light leakage point and the complementary position of the light leakage point, the complementary position coefficient of the light leakage point is calculated. The light leakage intensity calibration coefficient of the pixel position in the light leakage point region is calculated based on the calibration coefficient of the light leakage point region and the complementary position coefficient of the light leakage point.

3. The method for correcting light leakage point data according to claim 2, characterized in that, The step of determining the calibration coefficients for the light leak point region based on the two-dimensional image of the polychromatic light of the first light leak point and the adaptive conditional threshold includes: For each row of the polychromatic light two-dimensional image of the first light leak point, calculate the mean radiative response of the polychromatic light two-dimensional image of the first light leak point in each row; Calculate the product of the mean radiation response and a preset threshold coefficient, and use the product as an adaptive conditional threshold. The pixel positions in the first leak point polychromatic light two-dimensional image where the radiation response value is greater than the adaptive condition threshold are assigned a first preset value, and the pixel positions in the first leak point polychromatic light two-dimensional image where the radiation response value is not greater than the adaptive condition threshold are assigned a second preset value, thereby obtaining the leak point region calibration coefficient, wherein the preset threshold coefficient is a constant greater than 1.

4. The method for correcting light leakage point data according to claim 2, characterized in that, Based on the center position and complementary position of the light leakage point, the complementary position coefficient of the light leakage point is calculated using the following formula: ； ； Where a and b are the complementary position coefficients of the leakage points. The center position of the light leak point in the monochromatic light two-dimensional image of the first light leak point in the i-th group is given. Let the complementary positions of the light leak points in the monochromatic two-dimensional image of the first light leak point in the i-th group be the positions of the light leak points. is the number of groups in the monochromatic two-dimensional image of the first light leak point, where i represents the group index.

5. The method for correcting light leakage point data according to claim 2, characterized in that, The step of calculating the light leakage intensity calibration coefficient at the pixel position of the light leakage point region based on the calibration coefficient of the light leakage point region and the complementary position coefficient of the light leakage point includes: Based on the calibration coefficient of the light leak point region and the complementary position coefficient of the light leak point, the light leak intensity calibration coefficient of the pixel position in the light leak point region is calculated using the following formula: ； in, Let be the scaling factor for the light leakage intensity at the pixel position k-th row and j-th column in the two-dimensional image of the polychromatic light of the first light leakage point. Let be the radiative response value of the pixel at the k-th row and j-th column in the two-dimensional image of the polychromatic light at the first light leak point. Let be the radiative response value of the complementary position of the pixel at row k and column j in the two-dimensional image of the polychromatic light of the first leak point. Let a and b be the complementary positions of the kRow, and a and b be the complementary position coefficients of the leakage points. Let j be the dimension of the k-th spectral row. Let j be the dimension of the spatial column. Here, k represents the calibration coefficient for the light leak area, and j represents the column index.

6. The method for correcting light leakage point data according to claim 1, characterized in that, The step of determining the radiometric response value corresponding to the first slit-corrected image containing the light leakage point based on the target frame number, target band index, and target spatial column index, and obtaining the first radiometric response value, further includes: When the target band index determined based on the complementary position coefficient of the light leak point and the band index of the first slit-corrected image containing the light leak point is a sub-pixel position, the radiation response value corresponding to the first slit-corrected image containing the light leak point is determined according to the neighboring band index corresponding to the target band index, the target frame number, and the target spatial column index, and the first radiation response value is obtained.

7. The method for correcting light leakage point data according to claim 1, characterized in that, The process of resampling the second slit correction image using the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, and then using a one-dimensional resampling function to obtain the second slit correction resampled image, includes: Extract the radiation response value located in the j-th column of the second slit-corrected image in the m-th frame of the second slit-corrected image to obtain the second response distribution vector; Using the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, a one-dimensional resampling function is used to resample the second response distribution vector to obtain the third response distribution vector; the above operation is repeated until the third response distribution vectors corresponding to all frames of the second slit correction image are obtained. The third response distribution vector corresponding to all frames of the second slit-corrected image is used as the response distribution vector of the second slit-corrected resampled image to obtain the second slit-corrected resampled image.

8. A device for correcting light leakage point data, characterized in that, include: The imaging module is used to obtain multiple frames of first slit images and multiple frames of second slit images by push-broom imaging with a dual-slit hyperspectral imager. The first slit image has light leakage points. The correction module is used to correct the first slit image and the second slit image based on the dark level correction coefficient and the relative radiation correction coefficient, respectively, to obtain the first slit corrected image and the second slit corrected image; The acquisition module is used to acquire the center wavelength position sequence of each spectral band corresponding to the first slit correction image and the center wavelength position sequence of each spectral band corresponding to the second slit correction image, so as to obtain the first center wavelength position sequence and the second center wavelength position sequence. The sampling module is used to resample the second slit correction image using the second center wavelength position sequence as the original wavelength coordinates and the first center wavelength position sequence as the target wavelength coordinates, and to obtain the second slit correction resampled image by using a one-dimensional resampling function. The second correction module is used to perform inter-slit relative consistency correction on the second slit corrected resampled image based on the relative consistency correction coefficient corresponding to the second slit, so as to obtain a consistent second slit corrected resampled image. The first determining module is used to determine the target frame number, target band index, and target spatial column index based on the complementary position coefficient of the light leak point and the frame number, band index, and spatial column index of the first slit-corrected image containing the light leak point. The target frame number, target band index, and target spatial column index are the frame number, band index, and spatial column index of the consistent second slit-corrected resampled image corresponding to the first slit-corrected image containing the light leak point. The second determining module is used to determine the radiation response value corresponding to the first slit corrected image with the light leakage point based on the target frame number, target band index and target spatial column index, and obtain the first radiation response value; The correction module is used to correct the first radiation response value based on the leakage light intensity calibration coefficient to obtain the second radiation response value; The third determining module is used to subtract the second radiation response value from the radiation response value of the first slit-corrected image containing the light leakage point to obtain the target radiation response value of the first slit-corrected image containing the light leakage point.

9. An electronic device, characterized in that, The method includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor, when executing the computer program, implements the light leakage point data correction method according to any one of claims 1-7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the light leakage point data correction method according to any one of claims 1-7.

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