Communication test system, method, storage medium and electronic device

Abstract

This application discloses a communication testing system, method, storage medium, and electronic device. The communication testing system includes: a coupling device configured to couple an interference signal output from a pin device to a radio frequency antenna; wherein the pin device includes at least two pin groups, and each pin group includes at least one pin; a switching device including at least one primary switching unit and at least two secondary switching unit groups, wherein one primary switching unit is correspondingly connected between the at least two secondary switching unit groups and the coupling device, and one secondary switching unit group is correspondingly connected between a pin group and the primary switching unit; a control device configured to control the switching device to switch the on / off state between at least one pin and the coupling device; and to determine the degree of interference of the pin to the radio frequency antenna based on the interference signal output by the pin. The communication testing system of this application can improve the efficiency of pin testing.

Description

Technical Field

[0001] This application relates to the field of mobile communication technology, and more particularly to the field of mobile device technology, specifically to a communication testing system, method, storage medium, and electronic device. Background Technology

[0002] Communication modules typically have multiple pins on the bottom. Due to the small size of the module and the close spacing between the pins, electromagnetic interference can easily occur between adjacent pins during high-frequency operation, leading to a decrease in the sensitivity of the RF antenna. Therefore, it is necessary to test the interference level of each pin on the RF antenna.

[0003] The current pin testing methods suffer from problems such as long testing time, low accuracy, and low efficiency. Summary of the Invention

[0004] This application provides a communication testing system, method, storage medium, and electronic device that can improve the accuracy and efficiency of testing the interference level of pins to radio frequency antennas.

[0005] On one hand, embodiments of this application provide a communication testing system, including: a coupling device configured to couple an interference signal output by a pin device to a radio frequency antenna; wherein the pin device includes at least two pin groups, and one pin group includes at least one pin; a switching device including at least one primary switching unit and at least two secondary switching unit groups, one primary switching unit being correspondingly connected between the at least two secondary switching unit groups and the coupling device, and one secondary switching unit group being correspondingly connected between one pin group and the primary switching unit;

[0006] A control device is connected to the switching device; the control device is configured to control the switching device to switch the on / off state between at least one of the pins and the coupling device; and, when at least one of the pins is connected to the coupling device, to determine the degree of interference of the pin to the radio frequency antenna based on the interference signal output by the pin.

[0007] In some embodiments, the system further includes: The test unit is configured to test the reference sensitivity and current sensitivity of the radio frequency antenna; The control device is also configured to determine the degree of interference of the pin to the radio frequency antenna based on the reference sensitivity and the current sensitivity of the radio frequency antenna. The reference sensitivity is the sensitivity of the radio frequency antenna when all the pins are disconnected from the coupling device; the current sensitivity is the sensitivity of the radio frequency antenna when at least one of the pins is connected to the coupling device.

[0008] In some embodiments, one of the primary switching units includes a primary switch, the primary switch including an output terminal and at least two input terminals; A secondary switching unit group includes a common terminal, and the input terminals of the primary switching units are connected one-to-one to the common terminal of the secondary switching unit group.

[0009] In some embodiments, each of the secondary switching unit groups includes at least one secondary switch, and one of the secondary switches is connected to one of the pins.

[0010] In some embodiments, the controller is further configured to: Control at least two target pins corresponding to at least two target secondary switches to be simultaneously connected to the coupling device; The degree of interference of the target pin to the radio frequency antenna is determined based on the interference signal output by the target pin; Among them, at least two of the target secondary switches belong to different secondary switching unit groups.

[0011] On the other hand, embodiments of this application also provide a communication testing method, including: The control switching device switches the on / off state between at least one pin and the coupling device; When at least one of the pins is connected to the coupling device, the degree of interference of the pin to the radio frequency antenna is determined based on the interference signal output by the pin. The coupling device is configured to couple the interference signal output by the pin device to the radio frequency antenna; the pin device includes at least two pin groups, and each pin group includes at least one pin; the switching device includes at least one primary switching unit and at least two secondary switching unit groups, one primary switching unit is correspondingly connected between the at least two secondary switching unit groups and the coupling device, and one secondary switching unit group is correspondingly connected between one pin group and the primary switching unit.

[0012] In some embodiments, the method further includes: Based on the reference sensitivity and current sensitivity of the radio frequency antenna, determine the degree of interference of the pin to the radio frequency antenna; The reference sensitivity is the sensitivity of the radio frequency antenna when all the pins are disconnected from the coupling device; the current sensitivity is the sensitivity of the radio frequency antenna when at least one of the pins is connected to the coupling device.

[0013] In some embodiments, each of the secondary switching unit groups includes at least one secondary switch, with one of the secondary switches connected to one of the pins, and the method further includes: Control at least two target pins corresponding to at least two target secondary switches to be simultaneously connected to the coupling device; The degree of interference of the target pin to the radio frequency antenna is determined based on the interference signal output by the target pin; Among them, at least two of the target secondary switches belong to different secondary switching unit groups.

[0014] On the other hand, embodiments of this application also provide a computer-readable storage medium storing a computer program or instructions thereon, which, when executed by a processor, implement the steps in any of the communication testing methods provided in embodiments of this application.

[0015] On the other hand, embodiments of this application also provide an electronic device, including a memory and a processor, wherein the memory stores a computer program or instructions, and when the computer program or instructions are executed by the processor, the processor performs the steps in any of the communication testing methods provided in embodiments of this application.

[0016] The above technical solution enables pin selection within a single pin group through a two-level switching unit group, allowing switching between different interference sources within the same pin group. A single-level switching unit enables path selection across pin groups, allowing switching between interference sources between different pin groups. In multi-pin testing scenarios, not only can single-pin testing be achieved, but parallel testing of multiple pins can also be realized. When testing requirements change, the number of single-level and two-level switching units can be increased or decreased according to actual testing needs without reconstructing the entire testing system, thereby reducing testing time and improving testing efficiency. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of the structure of a communication testing system provided in an embodiment of this application; Figure 2 This is a schematic diagram of the structure of another communication testing system provided in the embodiments of this application; Figure 3 This is a flowchart illustrating a communication testing method provided in an embodiment of this application; Figure 4 This is a flowchart illustrating yet another communication testing method provided in the embodiments of this application; Figure 5 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application.

[0019] Explanation of reference numerals in the attached figures: 100. Communication test system; 110. Coupling device; 120. Pin device; 121. Pin; 130. Switching device; 131. Primary switching unit; 132. Secondary switching unit group; 140. Control device; 150. Test device; 160. Test base plate. Detailed Implementation

[0020] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0021] In the following description, specific embodiments of the invention will be illustrated with reference to steps and symbols performed by one or more computers, unless otherwise stated. Therefore, these steps and operations will be referred to several times as being performed by a computer, and computer execution as referred to herein includes operations by a computer processing unit representing electronic signals of data in a structured format. This operation transforms the data or maintains it at a location in the computer's memory system, which can be reconfigured or otherwise alter the operation of the computer in a manner well known to those skilled in the art. The data structure maintained by the data is the physical location of the memory, which has specific characteristics defined by the data format. However, the principles of the invention described above are not intended to be limiting, and those skilled in the art will understand that many of the steps and operations described below can also be implemented in hardware.

[0022] The terms "module" or "unit" as used herein can be considered as software objects executing on the computing system. The various components, modules, engines, and services described herein can be considered as implementations on the computing system. While the apparatus and methods described herein are preferably implemented in software, they can also be implemented in hardware, both of which are within the scope of this invention.

[0023] Those skilled in the art will understand that, unless specifically stated otherwise, the singular forms “a,” “an,” “the,” and “the” used herein may also include the plural forms. It should be further understood that the term “comprising” as used in this specification means the presence of the stated features, integers, steps, operations, elements, and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof. It should be understood that when an element is “connected” or “coupled” to another element, it may be directly connected or coupled to the other element, or there may be intermediate elements. Furthermore, “connected” or “coupled” as used herein may include wireless connections or wireless coupling. The term “and / or” as used herein includes all or any units and all combinations of one or more associated listed items.

[0024] Communication modules have numerous pins 121 on their bottom, especially highly integrated 4G and 5G communication modules, which often have dozens of pins densely packed together. Due to the small size of the modules and the close proximity of the pins 121 (typically less than 1mm), adjacent pins 121 are prone to electromagnetic interference during high-frequency operation, leading to a decrease in the sensitivity of the RF antenna. Therefore, it is necessary to test the interference of the pins 121 on the RF antenna. Related technologies use multiplexers to switch the pins 121 or select corresponding test channels for selective testing. However, the signal transmission paths of these methods are usually complex, increasing signal loss and resulting in long testing times, leading to low measurement accuracy and efficiency.

[0025] refer to Figure 1 On one hand, this application provides a communication testing system 100, including: a coupling device 110, a switching device 130, and a control device 140 connected to the switching device 130. The coupling device 110 is configured to couple interference signals output from a pin device 120 to a radio frequency antenna; the pin device 120 includes at least two pin groups, and each pin group includes at least one pin 121. The switching device 130 includes at least one primary switching unit 131 and at least two secondary switching unit groups 132. One primary switching unit 131 is correspondingly connected between the at least two secondary switching unit groups 132 and the coupling device 110, and one secondary switching unit group 132 is correspondingly connected between a pin group and the primary switching unit 131.

[0026] The control device 140 is configured to control the switching device 130 to switch the on / off state between at least one pin 121 and the coupling device 110; and, when at least one pin 121 is connected to the coupling device 110, to determine the degree of interference of the pin 121 to the radio frequency antenna based on the interference signal output by the pin 121.

[0027] The coupling device 110 is used to couple the interference signal output by the pin device 120 to the radio frequency antenna. The pin device 120 includes a pin group composed of the pins of the communication module under test, and is used to output the interference signal generated by the pin 121. The interference signal can reflect the degree of interference of the pin 121 to the radio frequency antenna.

[0028] Through the above technical solution, the secondary switching unit group 132 enables the selection of pin 121 within a single pin group, allowing switching between different interference sources within the same pin group. The primary switching unit 131 enables path selection across pin groups, allowing switching between interference sources between different pin groups. In multi-pin 121 testing scenarios, not only can single-pin 121 testing be achieved, but also parallel testing of multiple pins 121 can be realized. When testing requirements change, the number of primary switching units 131 and secondary switching unit groups 132 can be increased or decreased according to actual testing needs without reconstructing the entire testing system, thereby reducing testing time and improving testing efficiency.

[0029] For example, the coupling device 110 may include components such as a directional coupler, such as a microstrip line directional coupler or a coaxial directional coupler. By connecting the output terminal of the pin device 120 to one of the through terminals of the directional coupler and connecting the other through terminal of the directional coupler to the antenna interface of the communication module under test, the interference signal output from the pin 121 can be coupled to the radio frequency antenna. By connecting the output terminal of the directional coupler to the test device 150, the radio frequency signal under the condition that the radio frequency antenna is interfered with can be obtained.

[0030] The pin device 120 may include two or more pin groups. The number of pin groups can be determined according to the number of pins 121 of the communication module under test, for example, it can be divided into 2 groups, 3 groups, 4 groups, 5 groups, or 6 groups. The number of pins 121 in each pin group can be the same or different. The switching device 130 is a component used to switch the connection relationship between pins 121 and coupling device 110. The primary switching unit 131 connects at least two secondary switching unit groups 132 to coupling device 110, and can control the on / off connection between different pin groups and coupling device 110. Each secondary switching unit group 132 corresponds one-to-one with a pin group. The secondary switching unit group 132 may have multiple input ports, and the input ports correspond one-to-one with the pins 121 in the pin group. By controlling the secondary switching unit group 132, the on / off connection between each pin group and the primary switching unit 131 can be controlled, or the on / off connection between the pins 121 in each pin group and coupling device 110 can be controlled. The primary switching unit 131 may include multiple input ports or channels, each of which corresponds to a secondary switching unit group 132. By controlling the primary switching unit 131, the connection and disconnection between the primary switching unit 131 and the coupling device 110 can be controlled, thereby controlling the connection and disconnection between the pin 121 corresponding to the secondary switching unit group 132 and the coupling device 110.

[0031] refer to Figure 2 For example, the communication module under test can be soldered onto the test base plate 160 (demo board), and all pins 121 of the module can be brought out through traces. All pins 121 except for the RF antenna pin 121 are grouped, and the pins 121 in each group are connected to the secondary switching unit group 132. The pin groups can be divided equally by number; for example, when the number of pins 121 under test is M×N, N pin groups can be directly formed, with each pin group containing M pins 121. Alternatively, the pins 121 can be grouped according to their characteristics, such as interference frequency, power level, or interference type, allowing for targeted testing of the impact of specific types of interference on the RF antenna. For example, low-frequency interference pins 121 can be grouped into one group, and high-frequency interference pins 121 into another group. By switching the primary unit group, the differences between the two types of interference can be quickly compared without reconnecting the hardware.

[0032] The control device 140 is used to output a switching control signal and collect and analyze data after the interference signal has acted upon it to determine the degree of interference of pin 121 to the RF antenna. After the interference signal acts upon it, the RF antenna may experience a decrease in signal sensitivity, a decrease in transmission rate, or an increase in bit error rate. For example, the control device 140 can determine the degree of interference of pin 121 to the RF antenna based on quantitative indicators such as the change in sensitivity, the change in signal-to-noise ratio, the percentage decrease in signal transmission rate, or the bit error rate. For example, the control device 140 may include a microprocessor or an industrial control computer, which can generate switching commands according to test requirements to control the on / off combination of the first-level switching unit 131 and the second-level switching unit.

[0033] By adopting the above scheme, the selection of pin 121 within a single pin group is achieved through the secondary switching unit group 132, which can switch different interference sources within the same pin group. The path selection across pin groups is achieved through the primary switching unit 131, which can switch interference sources between different pin groups. In the testing scenario of multiple pins 121, not only can the testing of a single pin 121 be realized, but also the parallel testing of multiple pins 121 can be realized. When the testing requirements change, the number of primary switching units 131 and secondary switching units can be increased or decreased according to the actual testing requirements without reconstructing the entire testing system, thereby reducing testing time and improving testing efficiency.

[0034] In some embodiments, the system further includes a test unit configured to test a reference sensitivity and a current sensitivity of the radio frequency antenna. The control device 140 is also configured to determine the degree of interference of pin 121 to the radio frequency antenna based on the reference sensitivity and the current sensitivity of the radio frequency antenna; wherein the reference sensitivity is the sensitivity of the radio frequency antenna when all pins 121 are disconnected from the coupling device 110; and the current sensitivity is the sensitivity of the radio frequency antenna when at least one pin 121 is connected to the coupling device 110.

[0035] The test unit refers to a functional module used to measure the sensitivity of the radio frequency (RF) antenna. It can transmit standard test signals, receive feedback data from the RF antenna, calculate and output sensitivity indicators. For example, the test unit may include test equipment such as a spectrum analyzer, a comprehensive tester, or a vector network analyzer. The reference sensitivity refers to the sensitivity of the RF antenna in an interference-free environment, i.e., the sensitivity when all pins 121 are disconnected from the coupling device 110 and there is no interference signal input. The current sensitivity is the sensitivity of the RF antenna in an interference environment, i.e., the sensitivity value of the RF antenna when at least one pin 121 injects an interference signal into the antenna through the coupling device 110. It reflects the impact of the interference signal on the antenna's receiving capability. By comparing the reference sensitivity and the current sensitivity, the degree of interference from pin 121 to the RF antenna can be obtained.

[0036] For example, during the reference sensitivity measurement phase, the control device 140 can disconnect all pins 121 from the coupling device 110 via the switching device 130 to ensure no interference signal input and send a command to the test unit to trigger the reference sensitivity test. The test unit can transmit a series of standard signals with gradually decreasing power to the RF antenna, which receives and demodulates the signals, feeding back the demodulation results to the test unit. The test unit determines the minimum input power at which the bit error rate reaches a preset threshold as the reference sensitivity and sends it to the control device 140. During the current sensitivity measurement phase, the control device 140 connects one or more target pins to the coupling device 110 via the switching device 130, allowing the interference signal output from pin 121 to be injected into the RF antenna via the coupling device 110. The control device 140 sends a command to the test unit to trigger the current sensitivity test. Due to the influence of the interference signal, the demodulation performance of the RF antenna decreases, requiring a higher power signal to reach the same bit error rate threshold as under interference-free conditions. The test unit determines the minimum input power at this time as the current sensitivity and sends it to the control device 140. The control device 140 can calculate the level of interference based on the difference between the reference sensitivity and the current sensitivity. The absolute value of the difference between the reference sensitivity and the current sensitivity is used as the sensitivity offset. The larger the sensitivity offset, the more significant the decrease in antenna sensitivity caused by the interference signal, and the stronger the interference.

[0037] For example, at least one pin 121 can have different connection states with the coupling device 110. For instance, by connecting all pins 121 of each pin group to the coupling device 110, the interference level to the RF antenna when all pins 121 are working together can be measured. By connecting all or some pins 121 of one pin group to the coupling device 110, the interference level of a single pin 121 to the RF antenna, or the interference level of multiple pins 121 in each pin group working together, can be measured. By connecting one pin 121 in each pin group to the coupling device 110, the interference level of different pins 121 in multiple pin groups to the RF antenna can be tested in parallel. By switching the conduction state between the pin 121 and the coupling device 110 and measuring the change in sensitivity, the interference level of each pin 121 to the RF antenna can be evaluated individually, thereby locating strong interference sources. The superposition effect of multi-pin 121 cooperative interference can also be evaluated, providing a more comprehensive representation of the interference environment of the communication module in actual application scenarios and offering effective reference for optimizing the anti-interference capabilities of the communication module.

[0038] By adopting the above scheme, by measuring the sensitivity of at least one pin 121 when it is connected to the coupling device 110, the interference level of each pin 121 to the RF antenna can be tested individually, as well as the superposition and cancellation of the interference of multiple pins 121 to the RF antenna. This allows for a comprehensive evaluation of the interference of pin 121 to the RF antenna.

[0039] refer to Figure 2 In some embodiments, a primary switching unit 131 includes a primary switch, which includes an output terminal and at least two input terminals; a secondary switching unit group 132 includes a common terminal, and the input terminals of the primary switching unit 131 are connected one-to-one to the common terminal of the secondary switching unit group 132.

[0040] The primary switch, used for path selection across pin groups, has one output and at least two inputs. The output is the signal outlet of the primary switch, used to transmit the selected interference signal to the coupling device 110. The inputs are the signal inlets of the primary switch, and their number can be the same as or greater than the number of secondary switching unit groups 132, to receive interference signals output from the common terminal of the secondary switching unit groups 132. The common terminal of each secondary switching unit group 132 is its signal outlet, used to output the signal of the target pin within the secondary switching unit group 132 to the switch input, thus connecting the signal within the pin group to the primary switch.

[0041] For example, during signal switching, the secondary switching unit group 132 selects a connected pin 121 through an internal switch, causing the interference signal of that pin 121 to be output to the input of the primary switch via the common terminal of the group. The control device 140 can send a command to the primary switch to connect the input and output terminals. By controlling the primary switch and the corresponding channel of the secondary switching unit group 132 to be connected, interference superposition caused by multiple pin 121 signals entering the coupling device 110 through the same channel can be avoided, thereby ensuring the signal purity of a single or specified pin group test.

[0042] With the above scheme, pin 121 in each pin group is controlled by the corresponding secondary switching unit group 132. The connection and disconnection between the secondary switching unit group 132 and the coupling device 110 is controlled by the primary switch. The control device 140 does not need to directly drive all pin 121 switches. It can reduce the complexity of control by controlling the internal switches of the secondary unit group and the path of the primary switch to achieve the combination of intra-group selection and inter-group selection.

[0043] refer to Figure 2In some embodiments, each secondary switching unit group 132 includes at least one secondary switch, and a secondary switch is connected to a pin 121.

[0044] The secondary switch is a switching component in the secondary switching unit group 132, corresponding one-to-one with each pin 121. It controls whether the interference signal of the connected pin 121 is connected to the common terminal of the secondary switching unit group 132 through its own on / off state. When testing the interference of a single pin 121 on the RF antenna, the control device 140 sends a command to the secondary switching unit group 132 and the primary switch to only turn on the secondary switch connected to the pin 121 under test and the primary switch corresponding to the input terminal of the secondary switching unit group 132 containing the secondary switch. Other secondary switches and primary switches remain off, ensuring that only the interference signal output from the pin 121 under test is output to the coupling device 110 via the secondary switching unit group 132 and the primary switching unit 131, thus avoiding mutual interference between signals caused by multiple pins 121 sharing a switch.

[0045] In some embodiments, the controller is further configured to: control at least two target pins corresponding to at least two target secondary switches to be simultaneously connected to the coupling device 110; determine the degree of interference of the target pins to the radio frequency antenna based on the interference signals output by the target pins; wherein the at least two target secondary switches belong to different secondary switching unit groups 132.

[0046] For example, at least two groups can be selected from multiple groups of secondary switching units 132, and a target secondary switch can be selected in each group of secondary switching units 132. By turning on multiple target secondary switches at the same time, the overall interference generated when multiple pins 121 work at the same time can be measured. When all pins 121 are working simultaneously, if the frequency and / or phase of the interference signals between pins 121 are the same, a synergistic enhancement effect may occur. Therefore, there may be a situation where the interference level of a single pin 121 to the RF antenna is small, but the interference level of multiple pins 121 combined is large. If the frequency and / or phase of the interference signals between pins 121 are opposite, a cancellation effect may occur. Therefore, there may be a situation where the interference level of a single pin 121 to the RF antenna is large, but the interference level of multiple pins 121 combined is small. Therefore, by selectively activating the target secondary switches in different secondary switching unit groups 132 simultaneously according to the actual function, characteristics and test requirements of pins 121, it is possible to verify whether there is synergistic interference or interference cancellation when multiple pins 121 are working simultaneously. This allows the test results to more comprehensively reflect the interference situation of the RF antenna of the communication module under test under different working states of pins 121, which is beneficial for targeted optimization of the pin 121 structure of the communication module.

[0047] For example, pins 121 can be grouped according to their electrical characteristics and functions. All target secondary switches in each secondary switching unit group 132 are turned on. The total offset of the RF antenna when pins 121 in each pin group are working simultaneously is compared. The pin group with the largest total offset is identified as the pin group with a higher risk of interference. More test resources are allocated to this group of pins 121 during the single pin 121 test. For example, the interference level of pins 121 under different operating conditions can be tested to accurately locate the pins 121 with a higher degree of interference. For pin groups with a total offset far below the preset threshold, the allocation of test resources can be reduced. Through the above scheme, more comprehensive test results can be obtained and test efficiency can be improved.

[0048] In some embodiments, the switching device 130 includes a relay switch.

[0049] For example, the primary and / or secondary switches in the switching device 130 can be types such as relay switches, solid-state RF switches, and optocoupler switches. Among them, relay switches have low insertion loss and high isolation. Therefore, in some embodiments, using relay switches to form the primary switching unit 131 and the secondary switching unit group 132 can improve the accuracy of sensitivity measurement.

[0050] refer to Figures 3 to 4 On the other hand, embodiments of this application also provide a communication testing method 300, including: Step S310: Control the switching device 130 to switch the on / off state between at least one pin 121 and the coupling device 110; Step S320: When at least one pin 121 is connected to the coupling device 110, determine the degree of interference of pin 121 to the radio frequency antenna based on the interference signal output by pin 121. The coupling device 110 is configured to couple the interference signal output by the pin device 120 to the radio frequency antenna; the pin device 120 includes at least two pin groups, and each pin group includes at least one pin 121; the switching device 130 includes at least one primary switching unit 131 and at least two secondary switching unit groups 132, with one primary switching unit 131 correspondingly connected between the at least two secondary switching unit groups 132 and the coupling device 110, and one secondary switching unit group 132 correspondingly connected between a pin group and the primary switching unit 131.

[0051] The communication testing method 300 provided in this application embodiment is applicable to the communication testing system 100 described above. The pin under test 121 can be connected to the input terminal of the switching device 130, and the output terminal of the switching device 130 can be connected to the through terminal of the coupling device 110. The other through terminal of the coupling device 110 is connected to the radio frequency antenna to couple the interference signal to the radio frequency antenna. The other end is connected to the testing device 150, which collects the radio frequency signal data after the radio frequency antenna is affected by interference, thereby determining the interference situation of the current pin 121 on the radio frequency antenna.

[0052] For example, when testing the interference of a single pin 121 to the RF antenna, the secondary switch corresponding to the pin under test 121 can be closed, while the other secondary switches in the secondary switching unit group 132 containing the pin 121 remain open; simultaneously, the primary switching unit 131 is controlled to connect to the input terminal corresponding to the secondary switching unit group 132, thus connecting the primary switching unit 131 to the coupling device 110. Through this scheme, only the interference signal from the pin under test 121 can be transmitted to the coupling device 110 via the secondary switching unit group 132 and the primary switching unit 131, avoiding crosstalk from other pins 121 and improving the accuracy of testing the interference of a single pin 121.

[0053] For example, when testing the interference of multiple pins 121 within the same secondary switching unit group 132, multiple target secondary switches within the same secondary switching unit group 132 can be controlled to close simultaneously, while all secondary switches in other secondary switching unit groups 132 are opened; then, the primary switching unit 131 is controlled to connect the corresponding input terminal of the secondary switching unit group 132. Through this scheme, the interference effect when multiple pins 121 within the same pin group work together can be tested.

[0054] For example, when testing the interference of all pins 121 within the same secondary switching unit group 132, all secondary switches of a certain secondary switching unit group 132 are closed, other secondary switching unit groups 132 are disconnected, and the corresponding primary switching unit 131 path is then connected. Through the above scheme, the overall interference level of the entire pin group to the RF antenna can be quickly screened.

[0055] In some embodiments, the method further includes: determining the degree of interference of pin 121 to the radio frequency antenna based on a reference sensitivity and a current sensitivity of the radio frequency antenna; wherein the reference sensitivity is the sensitivity of the radio frequency antenna when all pins 121 are disconnected from the coupling device 110; and the current sensitivity is the sensitivity of the radio frequency antenna when at least one pin 121 is connected to the coupling device 110.

[0056] The reference sensitivity can be measured when the connection between all secondary switching unit groups 132 and primary switching unit 131 and the coupling unit is disconnected.

[0057] For example, let the reference sensitivity be denoted as S0 and the current sensitivity as S1. The sensitivity offset ΔS can be obtained by calculating the absolute value of the difference between the two, i.e., ΔS = |S0 - S1|. When ΔS is greater than or equal to a preset sensitivity threshold, it is determined that the current operation of pin 121 or the pin group interferes with the RF antenna. The value of ΔS can be 3dB. If a certain pin 121 under test causes a sensitivity offset of 3dB, it means that the interference of pin 121 reduces the receiving sensitivity of the RF antenna by 3dB. This means that with the input signal power remaining unchanged, the useful power received by the RF antenna decreases by 50%, and the signal receiving capability of the RF antenna is significantly affected. Therefore, it is determined that pin 121 significantly interferes with the RF antenna.

[0058] In some embodiments, each secondary switching unit group 132 includes at least one secondary switch, and one secondary switch is connected to one pin 121. The method further includes: controlling at least two target pins corresponding to at least two target secondary switches to be simultaneously connected to the coupling device 110; determining the degree of interference of the target pin to the radio frequency antenna based on the interference signal output by the target pin; wherein the at least two target secondary switches belong to different secondary switching unit groups 132.

[0059] For example, at least one target secondary switch can be selected from at least two different secondary switching unit groups 132 and closed to control the input and output terminals of the corresponding primary switching unit 131 to be connected. Through the above scheme, the synergistic enhancement or interference cancellation phenomenon when pins 121 in different pin groups work at the same time can be verified.

[0060] On the other hand, embodiments of this application provide a computer-readable storage medium storing a computer program thereon, the computer program being loaded by a processor to execute the steps described in the above-described method embodiments of this application. For example, the computer program, when loaded by a processor, can execute the following steps: The control switching device 130 switches the on / off state between at least one pin 121 and the coupling device 110; When at least one pin 121 is connected to the coupling device 110, the degree of interference of pin 121 to the radio frequency antenna is determined based on the interference signal output by pin 121. The coupling device 110 is configured to couple the interference signal output by the pin device 120 to the radio frequency antenna.

[0061] For details on the implementation of each of the above operations / steps, please refer to the previous examples, which will not be repeated here.

[0062] The computer-readable storage medium may include: read-only memory (ROM), random access memory (RAM), disk or optical disk, etc.

[0063] Since the computer program stored in the computer-readable storage medium can execute the steps in any of the above method embodiments provided in the embodiments of this application, the beneficial effects that the methods described in any of the above method embodiments can achieve can be realized, as detailed in the preceding embodiments, and will not be repeated here.

[0064] refer to Figure 5 On the other hand, this application embodiment also provides an electronic device 500, including a memory 520 and a processor 510. The memory 520 stores a computer program or instructions. When the computer program or instructions are executed by the processor 510, the processor 510 performs the steps in any of the communication testing methods 300 provided in this application embodiment.

[0065] Figure 5 This is a schematic diagram of the structure of an electronic device provided in some embodiments of this application. Figure 5 The dashed line in the text indicates that the unit or module is optional. Figure 5 The electronic device 500 can be used to implement the methods described in the above method embodiments. The electronic device 500 can be a chip, a terminal device, or a server.

[0066] Electronic device 500 may include one or more processors 510. The processor 510 can support the electronic device 500 in implementing the methods described in the preceding method embodiments. The processor 510 can be a general-purpose processor or a special-purpose processor. For example, the processor can be a Central Processing Unit (CPU). Alternatively, the processor can also be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or any conventional processor.

[0067] The electronic device 500 may also include one or more memories 520. Computer programs are stored on the memories 520. The memories 520 may be independent of the processor 510 or integrated into the processor 510.

[0068] Electronic device 500 may also include transceiver 530. Processor 510 can communicate with other devices or chips via transceiver 530. For example, processor 510 can send and receive data with other devices or chips via transceiver 530.

[0069] The computer program in memory 520 can be executed by processor 510, causing processor 510 to perform the following steps: The control switching device switches the on / off state between at least one pin 121 and the coupling device; When at least one pin 121 is connected to the coupling device, the degree of interference of pin 121 to the radio frequency antenna is determined based on the interference signal output by pin 121; wherein the coupling device is configured to couple the interference signal output by the pin device to the radio frequency antenna.

[0070] Those skilled in the art will understand that all or part of the steps in the various methods of the above embodiments can be performed by instructions, or by instructions controlling related hardware. These instructions can be stored in a computer-readable storage medium and loaded and executed by a processor.

[0071] The communication testing method, apparatus, server, and storage medium provided in the embodiments of this application have been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of the present invention. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of the present invention. Therefore, the content of this specification should not be construed as a limitation of the present invention.

Claims

1. A communication testing system, characterized in that, include: A coupling device is configured to couple an interference signal output from a pin device to a radio frequency antenna; wherein the pin device includes at least two pin groups, and one of the pin groups includes at least one pin; A switching device, comprising at least one primary switching unit and at least two secondary switching unit groups, wherein one primary switching unit is correspondingly connected between the at least two secondary switching unit groups and the coupling device, and one secondary switching unit group is correspondingly connected between a pin group and the primary switching unit; A control device is connected to the switching device; the control device is configured to: control the switching device to switch the on / off state between at least one of the pins and the coupling device, and, when at least one of the pins is connected to the coupling device, determine the degree of interference of the pin to the radio frequency antenna based on the interference signal output by the pin.

2. The system according to claim 1, characterized in that, The system also includes: The test unit is configured to test the reference sensitivity and current sensitivity of the radio frequency antenna; The control device is further configured to: determine the degree of interference of the pin to the radio frequency antenna based on the reference sensitivity and current sensitivity of the radio frequency antenna; The reference sensitivity is the sensitivity of the radio frequency antenna when all the pins are disconnected from the coupling device; the current sensitivity is the sensitivity of the radio frequency antenna when at least one of the pins is connected to the coupling device.

3. The system according to claim 1, characterized in that, One of the primary switching units includes a primary switch, the primary switch including an output terminal and at least two input terminals; A secondary switching unit group includes a common terminal, and the input terminals of the primary switching units are connected one-to-one to the common terminal of the secondary switching unit group.

4. The system according to claim 3, characterized in that, Each of the secondary switching unit groups includes at least one secondary switch, and each secondary switch is connected to one of the pins.

5. The system according to claim 1, characterized in that, The control device is also configured to: Control at least two target pins corresponding to at least two target secondary switches to be simultaneously connected to the coupling device; The degree of interference of the target pin to the radio frequency antenna is determined based on the interference signal output by the target pin; Among them, at least two of the target secondary switches belong to different secondary switching unit groups.

6. A communication testing method, characterized in that, include: The control switching device switches the on / off state between at least one pin and the coupling device; When at least one of the pins is connected to the coupling device, the degree of interference of the pin to the radio frequency antenna is determined based on the interference signal output by the pin. The coupling device is configured to couple the interference signal output by the pin device to the radio frequency antenna; the pin device includes at least two pin groups, and each pin group includes at least one pin; the switching device includes at least one primary switching unit and at least two secondary switching unit groups, one primary switching unit is correspondingly connected between the at least two secondary switching unit groups and the coupling device, and one secondary switching unit group is correspondingly connected between one pin group and the primary switching unit.

7. The method according to claim 6, characterized in that, The method further includes: Based on the reference sensitivity and current sensitivity of the radio frequency antenna, determine the degree of interference of the pin to the radio frequency antenna; The reference sensitivity is the sensitivity of the radio frequency antenna when all the pins are disconnected from the coupling device; the current sensitivity is the sensitivity of the radio frequency antenna when at least one of the pins is connected to the coupling device.

8. The method according to claim 6, characterized in that, Each of the secondary switching unit groups includes at least one secondary switch, with one of the secondary switches connected to one of the pins, and the method further includes: Control at least two target pins corresponding to at least two target secondary switches to be simultaneously connected to the coupling device; The degree of interference of the target pin to the radio frequency antenna is determined based on the interference signal output by the target pin; Among them, at least two of the target secondary switches belong to different secondary switching unit groups.

9. A computer-readable storage medium, characterized in that, It stores a computer program or instructions thereon, which, when executed by a processor, implement the steps in the communication testing method as described in any one of claims 6 to 8.

10. An electronic device, characterized in that, It includes a memory and a processor, wherein the memory stores a computer program or instructions, which, when executed by the processor, cause the processor to perform the steps in the communication module testing method as described in any one of claims 6 to 8.

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