A sensor access testing device and method
By constructing a sensor access test device and combining it with display delay, occlusion, and fault injection systems, the problem of lacking display delay testing in sensor access testing was solved, enabling efficient, reliable, and comprehensive testing and evaluation of sensors.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- CHONGQING QIANLI ZHIJIA TECHNOLOGY CO LTD
- Filing Date
- 2026-04-13
- Publication Date
- 2026-06-05
AI Technical Summary
Existing technologies lack methods for testing sensor access latency, making it impossible to comprehensively evaluate the sensor's response delay and sensing capabilities.
A sensor access test device is constructed, including a test dark box, a domain controller, a detection system, and a test host computer. Through a display delay test device, an occlusion test device, and a fault injection system, the display delay, occlusion, and fault injection tests of the sensor are realized. Dynamic simulation is carried out in combination with a lift, a rotary motor, and a robotic arm, and abnormal states are simulated using a programmable power supply and a fault injection board.
It enables display delay testing of sensors in a controlled environment, improves the automation and repeatability of testing, enhances the comprehensiveness and reliability of testing, and can accurately evaluate the sensor's sensing performance and abnormal response capability.
Smart Images
Figure CN122160500A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of computer technology, and in particular to a sensor access testing device and method. Background Technology
[0002] Currently, in the field of embodied smart hardware (such as smart cars and robots), various types of sensors, including cameras, LiDAR, and millimeter-wave radar, are commonly used. These sensors are usually connected to intelligent domain controllers for joint testing. Therefore, sensor connection testing around the underlying drivers of the domain controller has become a key testing content. Currently, the industry mainly verifies the positive functionality of various sensors under different ambient temperatures in sensor connection testing, and lacks methods for displaying latency testing. Summary of the Invention
[0003] This application provides a sensor access testing apparatus and method to at least solve the problem of lack of display delay testing in sensor access testing in related technologies.
[0004] This application provides a sensor access testing device, which includes a test dark box, a domain controller, a detection system, and a test host computer. The test chamber includes a chamber body, at least one sensor mounting position, and a display delay test device. The sensor mounting position is located on the side wall of the dark box body, and the display delay testing device is located inside the dark box body. The sensor mounting position and the display delay testing device are respectively located at both ends of the dark box body. The target sensor to be tested is mounted on the sensor mounting position. The target sensor is electrically connected to the domain controller. The detection system is electrically connected to the domain controller to acquire the sensing image transmitted by the target sensor. The detection system is electrically connected to the test host computer. The test host computer is electrically connected to the display delay testing device. The detection system acquires the real-time position image of the display delay testing device through the test host computer. The detection system performs a display delay test on the target sensor by comparing the sensing image and the real-time position image.
[0005] Furthermore, the display delay testing device includes a lift, a fixed standard target, a rotating standard target, and a rotating motor. The lift is connected to the inner bottom surface of the dark box body, the rotating motor is located on the top of the lift, the fixed standard target is placed on the lift and stationary relative to the rotating motor, the rotating standard target is connected to the rotating shaft of the rotating motor, and the rotating standard target rotates relative to the fixed standard target. The testing host computer controls the rotating motor and the lift to move the fixed standard target and the rotating standard target to a preset height and angle.
[0006] Furthermore, the test dark box also includes an occlusion test device, which is located between the sensor mounting position and the display delay test device. The test host is electrically connected to the occlusion test device, and the target sensor is subjected to occlusion test by controlling the occlusion intensity and occlusion area.
[0007] Furthermore, the occlusion testing device includes a robotic arm, a occlusion plate, and an occlusion plate placement area. The robotic arm is installed on the inner bottom surface of the dark box body. The occlusion plate placement area is used to place multiple occlusion plates of different occlusion strength levels. The robotic arm is used to clamp the occlusion plates and adjust the occlusion position of the occlusion plates.
[0008] Furthermore, the detection system includes a data acquisition device, a screen of the device under test, and a screen of a host computer. The screen of the device under test is electrically connected to the domain controller for displaying the sensed image, and the screen of the host computer is electrically connected to the test host computer for displaying the real-time position image. The data acquisition device simultaneously acquires the sensed image and the real-time position image.
[0009] Furthermore, the test dark chamber also includes an exposure lamp and a projection screen. The exposure lamp is located on the inner top surface of the dark chamber body, and the sensor mounting position and the projection screen are respectively located at both ends of the dark chamber body. The host computer is electrically connected to the exposure lamp and the projection screen. The host computer performs exposure tests on the target sensor by controlling the light intensity and light change rate of the exposure lamp and controlling the image and light intensity played on the projection screen.
[0010] Furthermore, the sensor access testing device also includes a fault injection system, which is electrically connected between the detection system and the target sensor. The fault injection system is used to inject test faults during the occlusion test, display delay test, or exposure test of the target sensor.
[0011] Furthermore, the fault injection system includes a programmable power supply, which is electrically connected to the detection system, the domain controller, the target sensor, and the test host computer. The test host computer displays power supply abnormalities, controller power supply abnormalities, and sensor power supply abnormalities by controlling the opening and closing of the programmable power supply switch.
[0012] Furthermore, the fault injection system also includes an active push rod, a connector fixture, and a sensor connector; the sensor connector is located inside the connector fixture, and the sensor connector is correspondingly plugged into the power supply pin of the target sensor; the active push rod is connected to the connector fixture to control the connector fixture to stretch the sensor connector and the power supply pin of the target sensor to achieve abnormal connector connection.
[0013] Furthermore, the fault injection system also includes a fault injection board, which is connected between the sensor connector and the domain controller. The fault injection board is used to short-circuit the power supply pin of the target sensor to ground, short-circuit the power supply, disconnect one or more power supply pins, short-circuit between power supply pins, or cause voltage fluctuations and current fluctuations.
[0014] This application also provides a sensor access testing method for the sensor access testing device described above, the method comprising: Select the test type for the target sensor, wherein the test type includes at least one of the following: occlusion test, display delay test, exposure test, and fault injection test; Initialize the sensor access test device and install the target sensor into the sensor mounting position; Adjust the positions of the occlusion test device and the display delay test device and / or the initial parameters of the test variable factors in the test dark box according to the test type; Obtain the test program corresponding to the test type, start the test program to perform occlusion test, display delay test or exposure test, and the test data is collected in real time by the test host computer and transmitted to the detection system; The detection system generates test results based on the test data.
[0015] This application utilizes a structure comprising a test chamber, domain controller, detection system, and host computer to achieve controlled display delay testing of target sensors. Simultaneously, through the cooperation of the detection system and host computer, synchronous acquisition and comparative analysis of sensor-sensed images and actual real-time images are achieved. This approach significantly improves the automation and repeatability of the test, while overcoming the limitation of traditional methods that cannot perform display delay testing, thus enhancing the comprehensiveness and reliability of the test. Attached Figure Description
[0016] To more clearly illustrate the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0017] Figure 1 This is a structural block diagram of a sensor access testing device in one embodiment of this application; Figure 2 This is a front view of the screen of the device under test at a first moment, according to one embodiment of this application. Figure 3 This is a front view of the second time displayed on the host computer screen in one embodiment of this application.
[0018] The markings in the diagram are as follows: Test dark box 1, dark box body 11, sensor mounting position 12, occlusion test device 13, robotic arm 131, occlusion plate 132, occlusion plate placement area 133, display delay test device 14, lifter 141, fixed standard target object 142, rotating standard target object 143, rotating motor 144, exposure lamp 15, projection screen 16, domain controller 2, detection system 3, acquisition device 31, screen of device under test 32, upper computer screen 33, test upper computer 4, target sensor 5, fault injection system 6, programmable power supply 61, active push rod 62, plug-in tooling 63, sensor connector 64, fault injection board 65. Detailed Implementation
[0019] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of this application.
[0020] It should be noted that, in the description of this application, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. The terms "first," "second," etc., in this application are used to distinguish similar objects and are not used to describe a specific order or sequence.
[0021] To enable those skilled in the art to better understand the present application, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments.
[0022] like Figure 1 As shown, an embodiment of this application provides a sensor access testing device, which includes a test dark box 1, a domain controller 2, a detection system 3, and a test host computer 4; The test dark box 1 includes a dark box body 11, at least one sensor mounting position 12, and a display delay test device 14; The sensor mounting position 12 is located on the side wall of the dark box body 11, and the display delay testing device 14 is located inside the dark box body 11. The sensor mounting position 12 and the display delay testing device 14 are respectively located at both ends of the dark box body 11. The target sensor 5 to be tested is mounted on the sensor mounting position 12. The target sensor 5 is electrically connected to the domain controller 2. The detection system 3 is electrically connected to the domain controller 2 to acquire the sensing image transmitted by the target sensor 5. The detection system 3 is electrically connected to the test host computer 4. The test host computer 4 is electrically connected to the display delay testing device 14. The detection system 3 acquires the real-time position image of the display delay testing device 14 through the test host computer 4. The detection system 3 performs a display delay test on the target sensor 5 by comparing the sensing image and the real-time position image.
[0023] This method utilizes a controlled environment to test the display delay of a target sensor 5 by constructing an overall structure comprising a test dark box 1, a domain controller 2, a detection system 3, and a test host computer 4. Simultaneously, the detection system 3 and the host computer work together to achieve synchronous acquisition and comparative analysis of the sensor's sensed images and actual real-time images. This approach significantly improves the automation and repeatability of the test, while overcoming the limitation of traditional methods that cannot perform display delay testing, thus enhancing the comprehensiveness and reliability of the test.
[0024] like Figure 1 , Figure 2 , Figure 3As shown, the display delay testing device 14 includes a lift 141, a fixed standard target 142, a rotating standard target 143, and a rotating motor 144. The lift 141 is connected to the inner bottom surface of the dark box body 11. The rotating motor 144 is located on the top of the lift 141. The fixed standard target 142 is mounted on the lift 141 and is stationary relative to the rotating motor 144. The rotating standard target 143 is connected to the rotating shaft of the rotating motor 144 and rotates relative to the fixed standard target 142. The testing host computer 4 controls the rotating motor 144 and the lift 141 to move the fixed standard target 142 and the rotating standard target 143 to a preset height and angle.
[0025] The fixed standard target 142 and the rotating standard target 143, controlled by a combination of a lifter 141 and a rotary motor 144, can accurately simulate the movement and position changes of the target objects, enabling the testing system to acquire the sensor's display delay characteristics with high precision. This solution automates and controls dynamic testing, solving the problem of accurately quantifying sensor response delay in traditional methods, thereby comprehensively evaluating the sensor's real-time sensing capabilities.
[0026] The detection system 3 performs a display delay test on the target sensor 5 by comparing the sensed image and the real-time position image, which includes: the detection system 3 determines the end-to-end delay of the target sensor 5 by comparing the offset angle of the rotating target in the sensed image and the real-time position image.
[0027] like Figure 1 As shown, the test dark box 1 also includes an occlusion test device 13, which is located between the sensor mounting position 12 and the display delay test device 14. The test host computer 4 is electrically connected to the occlusion test device 13 and performs occlusion tests on the target sensor 5 by controlling the occlusion intensity and occlusion area.
[0028] Specifically, the occlusion testing device 13 includes a robotic arm 131, a occlusion plate 132, and an occlusion plate placement area 133. The robotic arm 131 is installed on the inner bottom surface of the dark box body 11. The occlusion plate placement area 133 is used to place multiple occlusion plates 132 with different occlusion strength levels. The robotic arm 131 is used to clamp the occlusion plates 132 and adjust the occlusion position of the occlusion plates 132.
[0029] The occlusion area includes one of the following: full occlusion, upper half occlusion, lower half occlusion, left half occlusion, and right half occlusion. Occlusion plates 132, designed for different wavelengths and occlusion effects such as natural light, laser, and millimeter waves, are placed in the occlusion plate placement area 133. The robotic arm 131, under the control of the testing host computer 4, picks up different occlusion plates 132 for testing. Relevant images are recorded by the acquisition device 31 in the detection system 3, and the testing host computer 4 automatically evaluates the presence or absence of occlusion and the test indicators for different degrees of occlusion.
[0030] The combination of robotic arm 131 and replaceable occlusion plate 132 enables adjustable occlusion position and intensity for the target sensor 5. This design eliminates the need for manual operation in occlusion testing, improving test accuracy and consistency, and allowing for rapid switching between different occlusion conditions, thus significantly increasing testing efficiency. Furthermore, it enables a systematic evaluation of the sensor's sensing performance under various occlusion scenarios.
[0031] Furthermore, the detection system 3 includes a data acquisition device 31, a device under test screen 32, and a host computer screen 33. The device under test screen 32 is electrically connected to the domain controller 2 to display the sensed image, and the host computer screen 33 is electrically connected to the test host computer 4 to display the real-time position image. The data acquisition device 31 is configured to synchronously acquire the sensed image and the real-time position image corresponding to the device under test screen 32 and the host computer screen 33.
[0032] Through the collaborative design of the acquisition device 31, the screen of the device under test 32, and the host computer screen 33, the synchronous acquisition and display of the sensed image and the real-time position image are achieved. This structure ensures the synchronicity and comparability of data acquisition, making the test results more accurate and reliable. At the same time, this scheme improves the visualization and monitoring capabilities of the test, which helps to quickly analyze the performance of the sensor under different conditions, thereby enhancing the overall test efficiency and data quality.
[0033] like Figure 2 , Figure 3 As shown, there is a time difference between the acquisition of sensing data by each target sensor 5 and the final output of the image on the screen. Therefore, dynamic sensing targets are required for display latency testing. Two time points are used when calculating the latency. The front view of the second time point (τ(b)) is the image initially acquired by the target sensor 5. The angle of rotation of the standard target object 143 relative to the fixed standard target object 142 at the second time point is Θ(b). The front view of the first time point (τ(a)) is the image of the dynamic sensing target after adding the end-to-end latency Δτ to the target sensor 5 at the first time point. The angle of rotation of the standard target object 143 relative to the fixed standard target object 142 at the first time point is Θ(a).
[0034] The host computer 4 connects to the screen 32 of the device under test and the host computer screen 33. The host computer 4 employs a time synchronization mechanism to ensure that the image changes on these two screens are synchronized, meaning both are front views at the second time (τ(b)). At the same moment, such as... Figure 3 As shown, the host computer screen 33 displays a front view of the second time (τ(b)), as follows. Figure 2 As shown, the screen 32 of the device under test displays a front view of the first time (τ(a)).
[0035] Among them, target sensor 5 includes multiple types of sensors such as camera, LiDAR, and millimeter-wave radar.
[0036] Latency testing for cameras includes direct measurement, indirect measurement, and combined measurement methods.
[0037] Direct measurement method: such as Figure 2 , Figure 3 As shown, in the detection system 3, the program in the test host computer 4 will automatically process the real-time time captured by the acquisition device 31 and calculate the time difference between the two to obtain the delay: Δτ=τ(b) -τ(a).
[0038] Indirect measurement methods: such as Figure 2 , Figure 3 As shown, in the detection system 3, the program in the test host computer 4 will automatically obtain the difference between the angle Θ(b) of the rotating standard target object 143 compared with the fixed standard target object 142 at the second time moment and the angle Θ(a) of the rotating standard target object 143 compared with the fixed standard target object 142 at the first time moment, and then divide it by the known rotational angular velocity ω of the rotating standard target object 143, Δτ=|Θ(b)-Θ(a)| / ω.
[0039] Comprehensive measurement method: The average value of direct and indirect measurement methods is used.
[0040] For LiDAR and Radar, which cannot directly acquire images, their latency is measured indirectly using the following method: Δτ=|Θ(b)-Θ(a)| / ω.
[0041] Furthermore, the test dark box 1 also includes an exposure lamp 15 and a projection screen 16. The exposure lamp 15 is located on the inner top surface of the dark box body 11, and the sensor mounting position 12 and the projection screen 16 are respectively located at both ends of the dark box body 11. The test host computer 4 is electrically connected to the exposure lamp 15 and the projection screen 16. The test host computer 4 performs exposure tests on the target sensor 5 by controlling the light intensity and light change rate of the exposure lamp 15 and controlling the image and light intensity played on the projection screen 16.
[0042] In the exposure test, the host computer 4 controls the brightness change parameters of the exposure lamp 15 (including but not limited to brightness value, brightness change slope, etc.) to achieve the exposure of the target sensor 5. At the same time, the host computer 4 controls the brightness change parameters of the projection screen 16 (including but not limited to each image, brightness value, contrast, brightness change slope, etc.) to achieve the parameter change of the background image.
[0043] In this design, an exposure lamp 15 and a projection screen 16 were added to the test dark chamber 1. By controlling the light intensity and rate of change, and utilizing the projection screen 16 to display different images, the sensor's exposure was tested. This solution automates the testing of the sensor under different lighting conditions, enabling a systematic and accurate evaluation of its photosensitivity and exposure response characteristics. It solves the problems of low efficiency and poor repeatability associated with traditional manual lighting adjustments, while also enriching the observation dimensions of the test.
[0044] Furthermore, the sensor access testing device also includes a fault injection system 6, which is electrically connected between the detection system 3 and the target sensor 5. The fault injection system 6 is used to inject test faults during the occlusion test, display delay test, or exposure test of the target sensor 5.
[0045] The types of test faults include one or more of the following: connector connection abnormalities, power supply abnormalities, and board injection abnormalities. A fault injection system 6 is introduced and placed between the detection system 3 and the target sensor 5, enabling the simulation of different types of faults during occlusion testing, display delay testing, or exposure testing. This design expands the testing coverage, allowing the responsiveness of the sensor and domain controller 2 under abnormal conditions to be verified, thereby improving the completeness of the test and system reliability, and overcoming the shortcomings of traditional testing that only verifies positive functionality.
[0046] Furthermore, the fault injection system 6 includes a programmable power supply 61, which is electrically connected to the detection system 3, the domain controller 2, the target sensor 5, and the test host computer 4. The test host computer 4 controls the programmable power supply 61 to cut off the power supply to the screen 32 of the device under test, the domain controller 2, or the target sensor 5 to display power supply abnormalities, controller power supply abnormalities, and sensor power supply abnormalities.
[0047] Specifically, the fault injection system 6 is implemented as a programmable power supply 61, which simulates and displays power supply anomalies, controller power supply anomalies, and sensor power supply anomalies through a controllable power switch. This solution achieves automated control of the testing process, making the injection of abnormal states accurate and repeatable, significantly improving the efficiency and accuracy of fault testing, while also enabling a comprehensive evaluation of the system's stability and fault tolerance under different power supply conditions.
[0048] Furthermore, the fault injection system 6 also includes an active push rod 62, a connector fixture 63, and a sensor connector 64; the sensor connector 64 is disposed within the connector fixture 63, and the sensor connector 64 is correspondingly plugged into the power supply pin of the target sensor 5; the active push rod 62 is connected to the connector fixture 63 to control the connector fixture 63 to stretch the sensor connector 64 and the power supply pin of the target sensor 5 to achieve abnormal connector connection.
[0049] The host computer 4 controls the active push rod 62 to reciprocate, thereby driving the sensor connector 64 to insert and remove the power supply pin of the target sensor 5.
[0050] The sensor connector 64 is controllably plugged in and out using the active push rod 62 and the connector fixture 63, thereby simulating connection anomalies. This design eliminates the need for manual operation in fault injection, enabling a systematic and accurate simulation of connector connection problems. It provides an effective means to evaluate abnormal responses of the sensor and domain controller 2, thus enhancing the automation and controllability of the test.
[0051] Furthermore, the fault injection system 6 also includes a fault injection board 65, which is connected between the sensor connector 64 and the domain controller 2. The fault injection board 65 is used to short-circuit the power supply pin of the target sensor 5 to ground, short-circuit the power supply, open-circuit one or more power supply pins, short-circuit between power supply pins, and cause voltage fluctuations and current fluctuations.
[0052] Specifically, a fault injection board 65 is added to the fault injection system 6 to simulate various anomalies such as short circuits, open circuits, and voltage and current fluctuations on the power supply pins. This solution can comprehensively cover the types of electrical faults that the sensor may encounter, making the testing more detailed and comprehensive, effectively improving the system's robustness verification capability under abnormal conditions, and filling the gap in traditional methods for electrical fault testing.
[0053] Understandably, the domain controller 2 includes a first domain controller and a second domain controller. The fault injection board 65 is connected to the screen of the device under test 32 through the first domain controller and the second domain controller, which are connected in series. The programmable power supply 61 is connected to the first domain controller and the screen of the device under test 32.
[0054] This application enables simultaneous testing of one or more different scenarios using different sensors: For camera testing, as shown in Table 1, at least 1×2×1×1×5×1×3×2=60 different combinations of variable factors can be tested.
[0055] Table 1
[0056] For LiDAR or Radar sensors, which do not involve exposure testing, as shown in Table 2, at least 1×1×5×1×3×2=30 different combinations of test variable factors can be tested.
[0057] Table 2
[0058] This application also provides a sensor access testing method for the sensor access testing device described above, the method comprising: Step S1: Select the test type for the target sensor 5, wherein the test type includes at least one of the following: occlusion test, display delay test, exposure test, and fault injection test; Step S2: Initialize the sensor access test device and install the target sensor 5 into the sensor mounting position 12; Step S3: Adjust the position of the occlusion test device 13 and the display delay test device 14 and / or the initial parameters of the test variable factor in the test dark box 1 according to the test type. Step S4: Obtain the test program corresponding to the test type, start the test program to perform occlusion test, display delay test, exposure test and / or fault injection test, and the test data is collected in real time by the test host computer 4 and transmitted to the detection system 3; Step S5: The detection system 3 generates test results based on the test data.
[0059] The described sensor access testing method systematically collects test data and generates test results by selecting the test type, initializing the device, adjusting test parameters, and starting the corresponding test program, thus automating the entire sensor access testing process. This method significantly improves testing efficiency and repeatability. Furthermore, by conducting multiple types of tests (occlusion, display delay, exposure), it achieves a comprehensive evaluation of sensor performance, solving the problems of low automation and incomplete observation dimensions in traditional testing, and enhancing the scientific rigor and reliability of sensor access testing.
[0060] In step S1, the test type is determined according to the test requirements of the target sensor 5. If there are multiple test types, the order of the multiple test types is set, the test variable type is determined according to the test type, the test variable factor of the test variable type is obtained, and the combination of different test variable factors is determined.
[0061] In step S4, during the occlusion test, the position and occlusion intensity of the occlusion plate 132 are controlled by the robotic arm 131; during the display delay test, the height and angle of the rotating standard target object 143 are adjusted by the rotary motor 144 and the lifter 141; during the exposure test, the light intensity and light change rate of the exposure lamp 15 are adjusted, and the image and light intensity of the projection screen 16 are adjusted.
[0062] The principle of performing display latency testing is as follows: Figure 2 , Figure 3 As shown, there is a time difference between the acquisition of sensing data by each target sensor 5 and the final output of the image on the screen. Therefore, dynamic sensing targets are required for display latency testing. Two time points are used when calculating the latency. The front view of the second time point (τ(b)) is the image initially acquired by the target sensor 5. The angle of rotation of the standard target object 143 relative to the fixed standard target object 142 at the second time point is Θ(b). The front view of the first time point (τ(a)) is the image of the dynamic sensing target after adding the end-to-end latency Δτ to the target sensor 5 at the first time point. The angle of rotation of the standard target object 143 relative to the fixed standard target object 142 at the first time point is Θ(a).
[0063] The host computer 4 connects to the screen 32 of the device under test and the host computer screen 33. The host computer 4 employs a time synchronization mechanism to ensure that the image changes on these two screens are synchronized, meaning both are front views at the second time (τ(b)). At the same moment, such as... Figure 3 As shown, the host computer screen 33 displays a front view of the second time (τ(b)), as follows. Figure 2 As shown, the screen 32 of the device under test displays a front view of the first time (τ(a)).
[0064] Among them, target sensor 5 includes multiple types of sensors such as camera, LiDAR, and millimeter-wave radar.
[0065] Latency testing for cameras includes direct measurement, indirect measurement, and combined measurement methods.
[0066] Direct measurement method: such as Figure 2 , Figure 3 As shown, in the detection system 3, the program in the test host computer 4 will automatically process the real-time time captured by the acquisition device 31 and calculate the time difference between the two to obtain the delay: Δτ=τ(b) -τ(a).
[0067] Indirect measurement methods: such as Figure 2 , Figure 3As shown, in the detection system 3, the program in the test host computer 4 will automatically obtain the difference between the angle Θ(b) of the rotating standard target object 143 compared with the fixed standard target object 142 at the second time moment and the angle Θ(a) of the rotating standard target object 143 compared with the fixed standard target object 142 at the first time moment, and then divide it by the known rotational angular velocity ω of the rotating standard target object 143, Δτ=|Θ(b)-Θ(a)| / ω.
[0068] Comprehensive measurement method: The average value of direct and indirect measurement methods is used.
[0069] For LiDAR and Radar, which cannot directly acquire images, their latency is measured indirectly using the following method: Δτ=|Θ(b)-Θ(a)| / ω.
[0070] Among them, the sensor access test method realizes multi-dimensional testing of the target sensor 5, which significantly improves the automation and repeatability of the test. At the same time, it makes up for the shortcomings of traditional methods that cannot perform display delay testing. Moreover, it can perform combined tests of multiple different scenarios, which enhances the comprehensiveness and reliability of the test.
[0071] The sensor access testing device and method provided in this application have been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The descriptions of the above embodiments are only intended to help understand the method and core ideas of this application. It should be noted that those skilled in the art can make various improvements and modifications to this application without departing from its principles, and these improvements and modifications also fall within the protection scope of the claims of this application.
Claims
1. A sensor access testing device, characterized in that, The sensor access testing device includes a test dark box, a domain controller, a detection system, and a test host computer; The test chamber includes a chamber body, at least one sensor mounting position, and a display delay test device. The sensor mounting position is located on the side wall of the dark box body, and the display delay testing device is located inside the dark box body. The sensor mounting position and the display delay testing device are respectively located at both ends of the dark box body. The target sensor to be tested is mounted on the sensor mounting position. The target sensor is electrically connected to the domain controller. The detection system is electrically connected to the domain controller to acquire the sensing image transmitted by the target sensor. The detection system is electrically connected to the test host computer. The test host computer is electrically connected to the display delay testing device. The detection system acquires the real-time position image of the display delay testing device through the test host computer. The detection system performs a display delay test on the target sensor by comparing the sensing image and the real-time position image.
2. The sensor access testing device according to claim 1, characterized in that, The display delay testing device includes a lift, a fixed standard target, a rotating standard target, and a rotary motor. The lift is connected to the inner bottom surface of the dark box body, the rotary motor is located on the top of the lift, the fixed standard target is placed on the lift and is stationary relative to the rotary motor, the rotating standard target is connected to the rotating shaft of the rotary motor, and the rotating standard target rotates relative to the fixed standard target. The host computer controls the rotary motor and the lift to move the fixed standard target and the rotating standard target to a preset height and angle.
3. The sensor access testing device according to claim 1, characterized in that, The test dark box also includes an occlusion test device, which is located between the sensor mounting position and the display delay test device. The test host is electrically connected to the occlusion test device, and the target sensor is subjected to occlusion test by controlling the occlusion intensity and occlusion area.
4. The sensor access testing device according to claim 3, characterized in that, The occlusion testing device includes a robotic arm, a occlusion plate, and an occlusion plate placement area. The robotic arm is installed on the inner bottom surface of the dark box body. The occlusion plate placement area is used to place multiple occlusion plates with different occlusion strength levels. The robotic arm is used to clamp the occlusion plates and adjust the occlusion position of the occlusion plates.
5. The sensor access testing device according to claim 1, characterized in that, The detection system includes a data acquisition device, a screen of the device under test, and a screen of a host computer. The screen of the device under test is electrically connected to the domain controller for displaying the sensed image, and the screen of the host computer is electrically connected to the test host computer for displaying the real-time position image. The data acquisition device simultaneously acquires the sensed image and the real-time position image.
6. The sensor access testing device according to claim 1, characterized in that, The test dark chamber also includes an exposure lamp and a projection screen. The exposure lamp is located on the inner top surface of the dark chamber body, and the sensor mounting position and the projection screen are respectively located at both ends of the dark chamber body. The host computer is electrically connected to the exposure lamp and the projection screen. The host computer performs exposure tests on the target sensor by controlling the light intensity and light change rate of the exposure lamp and controlling the image and light intensity played on the projection screen.
7. The sensor access testing device according to claim 1, characterized in that, The sensor access testing device also includes a fault injection system, which is electrically connected between the detection system and the target sensor. The fault injection system is used to inject test faults during the occlusion test, display delay test, or exposure test of the target sensor.
8. The sensor access testing device according to claim 7, characterized in that, The fault injection system also includes an active push rod, a connector fixture, and a sensor connector; the sensor connector is located inside the connector fixture, and the sensor connector is plugged into the power supply pin of the target sensor. The active push rod is connected to the connector fixture to control the connector fixture to stretch the sensor connector and the power supply pin of the target sensor to achieve abnormal connector connection.
9. The sensor access testing device according to claim 8, characterized in that, The fault injection system further includes a fault injection board, which is connected between the sensor connector and the domain controller. The fault injection board is used to short-circuit the power supply pin of the target sensor to ground, short-circuit the power supply, disconnect one or more power supply pins, short-circuit between power supply pins, or cause voltage fluctuations and current fluctuations.
10. A sensor access testing method, used in the sensor access testing apparatus according to any one of claims 1 to 9, characterized in that, The method includes: Select the test type for the target sensor, which includes at least one of the following: occlusion test, display delay test, exposure test, and fault injection test; Initialize the sensor access test device and install the target sensor into the sensor mounting position; Adjust the position of the occlusion test device and the display delay test device and / or the initial parameters of the test variable factors in the test dark box according to the test type; Obtain the test program corresponding to the test type, start the test program to perform occlusion test, display delay test, exposure test and / or fault injection test, and the test data is collected in real time by the test host computer and transmitted to the detection system; The detection system generates test results based on the test data.