LabVIEW technology-based embedded device performance test system and method, and storage medium
The embedded device performance testing system based on LabVIEW technology enables automated testing of multiple key performance indicators of embedded devices, solving the problems of low efficiency and poor accuracy of traditional testing methods, and providing reliable performance evaluation and testing basis.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- WUHAN SHIP COMM RES INST (NO 722 RES INST OF CHINA STATE SHIPBUILDING CORP)
- Filing Date
- 2026-03-10
- Publication Date
- 2026-06-12
AI Technical Summary
Traditional embedded device performance testing methods are inefficient, inaccurate, and lack versatility. In particular, they are insufficient for testing system restart performance, resulting in inaccurate test results and increased testing costs and time.
An embedded device performance testing system based on LabVIEW technology includes a power module, an interface adapter module, and an industrial computer. It has built-in host computer software to achieve automated testing. Through restart performance testing submodule, memory performance testing submodule, and communication performance testing submodule, combined with database storage module and test report module, it performs automated testing of multiple key performance indicators.
It improves the efficiency and accuracy of embedded device performance testing, enhances the versatility of the testing system, provides reliable performance evaluation basis, and ensures the stability of restart performance and the traceability of test results.
Smart Images
Figure CN122193750A_ABST
Abstract
Description
Technical Field
[0001] This invention belongs to the field of embedded device testing technology, specifically relating to an embedded device performance testing system, method, and storage medium based on LabVIEW technology. Background Technology
[0002] Embedded devices, with their small size, high efficiency, and strong specialization, have been used more widely than ever before in various fields of modern society. From smart refrigerators and smart TVs in homes, to industrial robot controllers and automated production lines in factories, to medical monitors in hospitals and in-vehicle navigation systems in cars, embedded devices are ubiquitous, and their performance directly affects the quality of the entire product and the user experience.
[0003] With the rapid development of embedded technology, the functions of devices are becoming increasingly complex, and performance requirements are constantly rising. The drawbacks of traditional embedded device performance testing methods are becoming apparent: on the one hand, the testing process relies heavily on manual operation, which is not only inefficient but also prone to inaccurate results due to human factors; on the other hand, testing tools are often highly specific and lack versatility. If the type of test object changes, the testing environment may need to be rebuilt, increasing testing costs and time. Furthermore, traditional testing systems have significant shortcomings in terms of real-time data acquisition, depth of test data analysis, and traceability of the testing process, especially lacking system testing of device restart performance. Restart performance is a crucial indicator of embedded device stability, and anomalies during restart can lead to serious problems such as system crashes and data loss.
[0004] LabVIEW, as a powerful graphical programming environment, boasts rich data acquisition and analysis capabilities, excellent hardware compatibility, and flexible modular design, demonstrating immense potential in the field of automated testing. However, current systems that comprehensively apply LabVIEW technology to embedded device performance monitoring are not yet fully mature, lacking a complete solution that can cover the main performance indicators of embedded devices, automate testing processes, and perform in-depth analysis and evaluation of test results. Summary of the Invention
[0005] In response to one or more of the above-mentioned defects or improvement needs of the prior art, the present invention provides an embedded device performance testing system, method and storage medium based on LabVIEW technology, which can realize automated monitoring of multiple key performance indicators of embedded devices, improve testing efficiency and accuracy, enhance the versatility of the testing system, and provide reliable performance data for the research, development, production and maintenance of embedded devices.
[0006] To achieve the above objectives, one aspect of the present invention provides an embedded device performance testing system based on LabVIEW technology, comprising: The power module is used to provide operating power to the embedded device under test, and its output is controlled by the host computer software. The interface adapter module is used to convert the communication peripheral interface of the embedded device under test into a high-speed serial bus that matches the industrial control computer, so as to realize data communication. The industrial control computer has built-in host computer software developed based on LabVIEW technology; and the host computer software includes: The test parameter configuration module provides a human-computer interaction interface for configuring test parameters; The test execution module executes specific performance test tasks according to the test parameters and collects test data; and the test execution module includes a restart performance test submodule, which realizes automated testing of the restart performance of the embedded device under test by controlling the power supply module to power on / off. The database storage module is used to store the collected test data into the database; The test report module is used to automatically generate a test report based on the test data.
[0007] As a further improvement of the present invention, the restart performance test submodule is configured as follows: Receive user-inputted restart test parameters; The power module is controlled to perform cyclic power-on and power-off operations. Real-time monitoring of device performance metrics of the embedded device under test during the restart process; the device performance metrics include at least one of the following: peak CPU utilization, memory release and reallocation, critical process startup time, system log error information, and configuration parameter consistency metrics. Record the data from each restart and store it in the database storage module.
[0008] As a further improvement of the present invention, the test parameter configuration module is configured to support setting at least one of the following parameters for the restart performance test submodule: Number of restarts, including a single restart or multiple consecutive restarts; Restart interval; Restart trigger conditions include timed trigger, manual trigger, or fault trigger.
[0009] As a further improvement of the present invention, the power supply module includes: AC output unit, used to provide 220V AC power; DC output unit for providing a programmable DC power supply of 0~48V; The host computer software controls the output of the AC output unit using the Modbus protocol and the output of the DC output unit using the SCPI protocol via the RS232 interface.
[0010] As a further improvement of the present invention, the test execution module further includes a memory performance test submodule, the execution flow of which is configured as follows: Receive memory test metrics input by the user; the memory test metrics include one or more of the following: sequential read / write capability, random read / write capability, read / write speed, read / write latency, memory bandwidth, and memory error rate; Send memory test metrics to the controller of the embedded device under test and control the embedded device under test to perform memory performance testing; The results of the memory performance test are recorded and stored in the database storage module.
[0011] As a further improvement of the present invention, the test execution module further includes a communication performance test submodule, the execution flow of which is configured as follows: The corresponding communication test program is called in the host computer software according to the communication interface of the embedded device under test. The device interacts with the embedded device under test by sending data packets of different sizes and types to test the device's communication performance indicators at different communication rates; the communication performance indicators include at least one of throughput, data transmission latency, and packet loss rate. The results of the communication performance test are recorded and stored in the database storage module.
[0012] As a further improvement of the present invention, the database storage module is based on the LabVIEW database connection toolkit and stores the test data in a MySQL database; and the table structure of the database includes at least the test number, device model, test time, test parameters, and various performance index data.
[0013] As a further improvement of the present invention, the test report module supports multiple file format outputs and automatically generates test reports for the embedded device under test based on LabVIEW's report generation tool; and The test report includes at least one of the following: test configuration information, test process overview, test data and analysis charts for various performance indicators, and performance evaluation results.
[0014] Another aspect of the present invention provides a performance testing method for embedded devices based on LabVIEW technology, which is implemented using the aforementioned LabVIEW-based embedded device performance testing system, and includes the following process: (1) Connect the power module and interface adapter module of the embedded device under test to the test system; (2) Determine the test type and power parameters of the embedded device under test; (3) Configure the test parameters and the power parameters of the equipment using the test parameter configuration module; (4) Use the test execution module to control the embedded device under test to perform performance test tasks, collect test data and store it in the database, and generate a test report.
[0015] In another aspect, the present invention provides a storage medium having a computer program executable by a processor, the computer program being used to execute the aforementioned embedded device performance testing method based on LabVIEW technology.
[0016] The aforementioned improved technical features can be combined with each other as long as they do not conflict with each other.
[0017] In summary, the beneficial effects of the above-described technical solutions conceived by this invention compared with the prior art include: (1) The embedded device performance testing system based on LabVIEW technology in this invention includes a power supply module, an interface adapter module and an industrial computer. The industrial computer has built-in host computer software developed based on LabVIEW technology. The host computer software includes a test parameter configuration module, a test execution module with a restart performance test sub-module, a database storage module and a test report module. By using the combination settings of each module, the performance testing of embedded devices can be accurately realized, especially the restart performance testing of embedded devices, which provides a basis for the performance evaluation and research of embedded devices.
[0018] (2) The embedded device performance testing method based on LabVIEW technology in this invention has simple steps and convenient testing. It can accurately complete the performance testing of embedded devices based on the settings of the test system, ensuring the efficiency and accuracy of embedded device performance testing.
[0019] (3) The embedded device performance testing system, method and storage medium based on LabVIEW technology in this invention can overcome the shortcomings of existing embedded device performance testing methods, such as low efficiency, poor accuracy, weak universality and lack of effective testing of restart performance. It can realize automated testing of multiple key performance indicators (including restart performance) of embedded devices, improve testing efficiency and accuracy, enhance the universality and scalability of the testing system, and actively save the test environment when the embedded device fails according to the user configuration requirements during the testing process, so that R&D personnel can troubleshoot problems and provide reliable test basis for the R&D, production and maintenance of embedded devices. It has good application prospects. Attached Figure Description
[0020] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0021] Figure 1 This is a block diagram of the embedded device performance testing system based on LabVIEW technology in an embodiment of the present invention; Figure 2 This is a block diagram of the 220V AC source output in an embodiment of the present invention; Figure 3 This is a block diagram of the DC source output in an embodiment of the present invention; Figure 4 This is a schematic diagram of the execution flow of the restart performance testing submodule in an embodiment of the present invention; Figure 5 This is a schematic diagram of the execution flow of the memory performance testing submodule in an embodiment of the present invention; Figure 6 This is a schematic diagram of the execution flow of the communication performance testing submodule in an embodiment of the present invention. Detailed Implementation
[0022] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention. Furthermore, the technical features involved in the various embodiments of this invention described below can be combined with each other as long as they do not conflict with each other.
[0023] In the description of this invention, it should be understood that, unless otherwise expressly specified and limited, the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," etc., indicating the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, are only for the convenience of describing this invention and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this invention.
[0024] Furthermore, unless otherwise expressly defined, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise expressly and specifically defined.
[0025] In this invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.
[0026] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "over," and "on top" of the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.
[0027] Terminology Explanation: LabVIEW (Laboratory Virtual Instrument Engineering Workbench) is a graphical programming environment developed by National Instruments (NI) and is known for its powerful data acquisition, instrument control, and automated testing capabilities.
[0028] Below, for reference Figures 1-6 This invention describes an embedded device performance testing system based on LabVIEW technology according to a preferred embodiment of the present invention.
[0029] like Figure 1 As shown, the embedded device performance testing system based on LabVIEW technology in a preferred embodiment of this invention includes: The power module is used to provide operating power to the embedded device under test, and its output is controlled by the host computer software. The interface adapter module is used to convert the communication peripheral interface of the embedded device under test into a high-speed serial bus that matches the industrial control computer, so as to realize data communication. The industrial computer has built-in host computer software developed based on LabVIEW technology; and the host computer software includes: The test parameter configuration module provides a human-computer interaction interface for configuring test parameters; The test execution module executes specific performance test tasks according to test parameters and collects test data; the test execution module also includes a restart performance test submodule, which realizes automated testing of the restart performance of the embedded device under test by controlling the power supply module to power on / off. The database storage module is used to store the collected test data into the database; The test report module is used to automatically generate test reports based on test data.
[0030] In actual setup, the relevant device parameters of the embedded device under test (DUT) are also configured using the test parameter configuration module, such as the power supply parameter type and value of the DUT. By setting the power supply parameter type and value of the DUT, the test execution module can subsequently control the power module to provide the corresponding power to the DUT.
[0031] Specifically, in the preferred embodiment, the power module preferably includes an AC output unit and a DC output unit. The AC output unit provides 220V AC power, and its output block diagram is shown below. Figure 2 As shown, a 220V AC power supply is connected to an external relay, and then connected to an industrial control computer through an AC power output control module. This allows the test execution module to generate corresponding enable and disable output commands based on the configured test parameters, thereby providing 220V AC power to the embedded device under test or cutting off the power.
[0032] Accordingly, the DC output unit is used to provide a programmable DC power supply from 0 to 48V, and its output block diagram is as follows. Figure 3 As shown, by setting a programmable power supply connected to the industrial control computer, a DC power supply of 0-48V can be provided. At this time, the test execution module can generate corresponding enable and disable output commands according to the configured test parameters, and then provide the corresponding DC power or power off to the embedded device under test.
[0033] More specifically, the host computer software preferably uses the RS232 interface to control the output of the AC output unit using the Modbus protocol and the output of the DC output unit using the SCPI protocol.
[0034] Furthermore, as a core module in the host computer software, the test execution module is also based on LabVIEW's modular design concept, consisting of multiple functional sub-modules. It is responsible for executing specific performance test tasks according to the test parameters set by the test parameter configuration module. Among these, a restart performance test sub-module is specifically designed for testing the restart performance of embedded devices.
[0035] More specifically, in the preferred embodiment, the restart performance testing submodule is configured as follows: The system receives user-inputted restart test parameters, which serve as a prerequisite for restart testing of the embedded device. These restart test parameters preferably include the number of restarts and the interval time. The power module is controlled to perform cyclic power-on and power-off operations. Real-time monitoring of device performance metrics of the embedded device under test during the restart process; device performance metrics include at least one of the following: peak CPU utilization, memory release and reallocation, critical process startup time, system log error information, and configuration parameter consistency metrics. Record the data from each restart and store it in the database storage module to analyze the stability of restart performance.
[0036] In actual operation, the execution flow of restarting the performance testing submodule is as follows: Figure 4 As shown, by utilizing the control of the test execution module, the power-on / power-off control of the power module can be accurately completed, and the peak CPU utilization, memory release and reallocation, critical process startup time, error messages in the system log, and consistency of device configuration parameters before and after restart can be monitored in real time. Based on this, multiple restart performance tests of the embedded device under test are completed, and a restart performance test report of the embedded device under test is output.
[0037] More specifically, the test parameter configuration module in the preferred embodiment is configured to support setting at least one of the following parameters for the restart performance test submodule: Number of restarts, including a single restart or multiple consecutive restarts; Restart interval; Restart trigger conditions include timed trigger, manual trigger, or fault trigger.
[0038] By utilizing the configuration of the restart performance test submodule in the test execution module, it is possible to automate the testing of key performance indicators (restart performance) of embedded devices and reliably save the restart performance test data, providing reliable performance data for the research, development, production and maintenance of embedded devices.
[0039] Furthermore, in the preferred embodiment, the test execution module further includes a memory performance testing submodule, used to test the memory performance of the embedded device under test, and its execution flow is as follows: Figure 5 As shown, and specifically configured as follows: Receive memory test metrics input by the user; wherein, the memory test metrics preferably include one or more of the following: sequential read / write capability, random read / write capability, read / write speed, read / write latency, memory bandwidth, and memory error rate; Send memory test metrics to the controller of the embedded device under test and control the embedded device under test to perform memory performance testing; Record the results of memory performance tests and store them in the database storage module.
[0040] More specifically, when configuring memory test parameters, it is preferable to use the factory-set memory parameters of the embedded device under test as the basis for judging its memory performance test, and obtain comparative data after cross-comparison. Simultaneously, after completing the memory test of the embedded device under test, it is preferable to report the memory test performance data to the industrial control computer, display the test results in the human-machine interface of the test parameter configuration module, and store the test results in a database for subsequent retrieval.
[0041] Furthermore, the test execution module also includes a communication performance testing submodule, used to test the communication interface on the embedded device under test. Its execution flow is preferably as follows: Figure 6 As shown, and specifically configured as follows: The corresponding communication test program is called in the host computer software according to the communication interface of the embedded device under test. The device interacts with the embedded device under test by sending data packets of different sizes and types to test the device's communication performance at different communication rates. The communication performance indicators include at least one of throughput, data transmission latency, and packet loss rate. Record the results of the communication performance test and store them in the database storage module.
[0042] In actual setup, the interface adapter module in the preferred embodiment preferably supports converting general peripherals such as UART, SPI, I2C, Ethernet, etc. into a high-speed serial bus that matches the industrial control computer, ensuring that each general communication interface can be converted into a high-speed serial bus during the test, thereby providing the universality and compatibility of the test system.
[0043] Obviously, it is understandable that the host computer software needs to pre-build communication test programs for various commonly used communication interfaces. During actual testing, the device parameters of the embedded device under test (such as power type parameters, communication interface parameters, etc.) can be input into the test system through the test parameter configuration module. Then, the host computer software controls the communication performance test submodule to call the corresponding communication test program and finally complete the communication performance test of the device.
[0044] In addition, during actual testing, after the test is completed, the test results are displayed on the human-computer interaction interface and stored in the database for later retrieval.
[0045] Furthermore, for the database storage module in the host computer software, it is preferable to use the LabVIEW-based database connection toolkit to store the test data in a MySQL database.
[0046] Meanwhile, when actually storing the data, the database table structure should preferably include at least the following fields: test number, device model, test time, test parameters, and various performance index data (such as restart performance data) to ensure the integrity and traceability of the test data.
[0047] More specifically, the database storage module in the preferred embodiment further preferably supports real-time data backup to prevent data loss.
[0048] Furthermore, for the test report module in the preferred embodiment, it preferably uses LabVIEW's report generation tool to automatically generate a test report for the embedded device under test, automatically generating a detailed test report. The test report preferably includes at least one of the following: test configuration information, a test process overview, test data and analysis charts for various performance indicators, and performance evaluation results.
[0049] More specifically, the test report module in the preferred embodiment supports multiple file format outputs, such as PDF, Word, Excel and other common formats, which users can select as needed.
[0050] Furthermore, based on the aforementioned design of the embedded device performance testing system, as another aspect of the present invention, an embedded device performance testing method based on LabVIEW technology is also provided, which preferably includes the following process: (1) Connect the power module and interface adapter module of the embedded device under test to the test system; (2) Determine the test type and power parameters of the embedded device under test; (3) Configure the test parameters and the power parameters of the equipment using the test parameter configuration module; (4) Use the test execution module to control the embedded device under test to perform performance test tasks, collect test data and store it in the database, and generate a test report.
[0051] The following is a specific embodiment to further illustrate the aforementioned embedded device performance testing method.
[0052] In this embodiment, the embedded device under test is a data link embedded device, powered by a 12V DC source. Its external communication interfaces include two Ethernet Gigabit Ethernet interfaces, one RS232 serial port, one RS485 serial port, and one 16-bit Locabus local bus. The specific testing process is as follows: (1) Connect the power module and interface adapter module of the embedded device under test to the test system; In this embodiment, the first Ethernet gigabit Ethernet interface of the embedded device is preferably used as the interface for communication between the device under test and the monitoring system, and it is connected to the interface adapter module. At the same time, the power supply interface of the embedded device under test is connected to the power supply module.
[0053] (2) Determine the test type and power parameters of the embedded device under test; (3) Configure the test parameters and the power parameters of the equipment using the test parameter configuration module; After the system starts, the power supply type and parameters are configured on the human-machine interface of the test parameter configuration module. The power supply type is DC power supply, and the input DC source voltage value is 12V and the current limit value is 5A.
[0054] At the same time, configure the test parameters for the embedded device under test.
[0055] Specifically, the preferred test types include memory performance testing, communication performance testing, and restart performance testing. The communication performance test selects one Ethernet Gigabit Ethernet port, one RS232 serial port, one RS485 serial port, and one 16-bit Locabus local bus for testing. The restart performance test is set to perform 5 consecutive restarts with a 3-minute interval. The test report output type is configured as PDF format. After setting the monitoring parameters, save the settings to the configuration file and start monitoring.
[0056] (4) Use the test execution module to control the embedded device under test to perform performance test tasks, collect test data and store it in the database, and generate a test report.
[0057] Specifically, the test execution module calls the parameters in the configuration file to start the test. Among them, the memory and communication performance test submodules execute the test according to the set process; the restart performance test submodule controls the DC source to power off and on every 3 minutes, sending a total of 5 times, and recording data such as restart trigger time, completion time, peak CPU usage during restart, and startup time of each application each time.
[0058] During the performance testing process, all test data is stored in a MySQL database, recording monitoring time, device model, monitoring results, and anomaly information.
[0059] After completing the testing task, the industrial control computer exports a test report in PDF format. The exported test report consists of three parts: Test information includes information on the test operators, test time, and the model of the device under test; Test results include memory test results, communication performance test results, and reboot performance test results; Test anomaly information includes various anomalies that occur during the startup of the device under test, memory monitoring, communication performance monitoring, restart performance monitoring, etc.
[0060] By using the aforementioned testing process, memory performance testing, communication performance testing, and restart performance testing of this type of data link embedded device can be performed, and the test results can be stored in the database and a test report in PDF format can be generated.
[0061] Furthermore, as another aspect of the present invention, a storage medium is also provided, on which a computer program executable by a processor is disposed, the computer program being used to execute the aforementioned embedded device performance testing method based on LabVIEW technology.
[0062] The embedded device performance testing system, method, and medium based on LabVIEW technology in this invention can overcome the shortcomings of existing embedded device performance testing methods, such as low efficiency, poor accuracy, weak versatility, and lack of effective testing for restart performance. It realizes automated testing of multiple key performance indicators (including restart performance) of embedded devices, improves testing efficiency and accuracy, enhances the versatility and scalability of the testing system, and actively saves the test environment when the embedded device fails according to user configuration requirements during the testing process, so as to help R&D personnel troubleshoot problems and provide reliable test basis for the R&D, production and maintenance of embedded devices. It has good application prospects.
[0063] Those skilled in the art will readily understand that the above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.
Claims
1. An embedded device performance testing system based on LabVIEW technology, characterized in that, include: The power module is used to provide operating power to the embedded device under test, and its output is controlled by the host computer software. The interface adapter module is used to convert the communication peripheral interface of the embedded device under test into a high-speed serial bus that matches the industrial control computer, so as to realize data communication. The industrial control computer has built-in host computer software developed based on LabVIEW technology; and the host computer software includes: The test parameter configuration module provides a human-computer interaction interface for configuring test parameters; The test execution module executes specific performance test tasks according to the test parameters and collects test data; and the test execution module includes a restart performance test submodule, which realizes automated testing of the restart performance of the embedded device under test by controlling the power supply module to power on / off. The database storage module is used to store the collected test data into the database; The test report module is used to automatically generate a test report based on the test data.
2. The embedded device performance testing system based on LabVIEW technology according to claim 1, characterized in that, The restart performance test submodule is configured as follows: Receive user-inputted restart test parameters; The power module is controlled to perform cyclic power-on and power-off operations. Real-time monitoring of device performance metrics of the embedded device under test during the restart process; the device performance metrics include at least one of the following: peak CPU utilization, memory release and reallocation, critical process startup time, system log error information, and configuration parameter consistency metrics. Record the data from each restart and store it in the database storage module.
3. The embedded device performance testing system based on LabVIEW technology according to claim 2, characterized in that, The test parameter configuration module is configured to support setting at least one of the following parameters for the restart performance test submodule: Number of restarts, including a single restart or multiple consecutive restarts; Restart interval; Restart trigger conditions include timed trigger, manual trigger, or fault trigger.
4. The embedded device performance testing system based on LabVIEW technology according to any one of claims 1 to 3, characterized in that, The power module includes: AC output unit, used to provide 220V AC power; DC output unit for providing a programmable DC power supply of 0~48V; The host computer software controls the output of the AC output unit using the Modbus protocol and the output of the DC output unit using the SCPI protocol via the RS232 interface.
5. The embedded device performance testing system based on LabVIEW technology according to any one of claims 1 to 3, characterized in that, The test execution module also includes a memory performance test submodule, whose execution flow is configured as follows: Receive memory test metrics input by the user; the memory test metrics include one or more of the following: sequential read / write capability, random read / write capability, read / write speed, read / write latency, memory bandwidth, and memory error rate; Send memory test metrics to the controller of the embedded device under test and control the embedded device under test to perform memory performance testing; The results of the memory performance test are recorded and stored in the database storage module.
6. The embedded device performance testing system based on LabVIEW technology according to any one of claims 1 to 3, characterized in that, The test execution module also includes a communication performance test submodule, whose execution flow is configured as follows: The corresponding communication test program is called in the host computer software according to the communication interface of the embedded device under test. The device interacts with the embedded device under test by sending data packets of different sizes and types to test the device's communication performance indicators at different communication rates; the communication performance indicators include at least one of throughput, data transmission latency, and packet loss rate. The results of the communication performance test are recorded and stored in the database storage module.
7. The embedded device performance testing system based on LabVIEW technology according to any one of claims 1 to 3, characterized in that, The database storage module is based on LabVIEW's database connection toolkit and stores the test data in a MySQL database; and the database table structure includes at least the test number, device model, test time, test parameters, and various performance index data.
8. The embedded device performance testing system based on LabVIEW technology according to any one of claims 1 to 3, characterized in that, The test report module supports multiple file format outputs and automatically generates test reports for the embedded device under test using LabVIEW's report generation tool; and The test report includes at least one of the following: test configuration information, test process overview, test data and analysis charts for various performance indicators, and performance evaluation results.
9. A method for testing the performance of embedded devices based on LabVIEW technology, implemented using the embedded device performance testing system based on LabVIEW technology as described in any one of claims 1 to 8, characterized in that, The process includes the following: (1) Connect the power module and interface adapter module of the embedded device under test to the test system; (2) Determine the test type and power parameters of the embedded device under test; (3) Configure the test parameters and the power parameters of the equipment using the test parameter configuration module; (4) Use the test execution module to control the embedded device under test to perform performance test tasks, collect test data and store it in the database, and generate a test report.
10. A storage medium, characterized in that, The storage medium is configured with a computer program that can be executed by a processor, the computer program being used to perform the embedded device performance testing method based on LabVIEW technology as described in claim 9.