A method for evaluating EMC based on IC-level EMC data assets

Abstract

The application discloses a kind of based on IC level EMC data assets Localized IC replacement EMC evaluation method, comprising: obtaining the model identification of target IC and replacement IC;Query whether there is matching intrinsic characteristic data in IC level data assets, if missing, then generate demand order and receive the data generated on demand;Calculate replacement equivalence coefficient;Get peripheral circuit feature and calculate replacement matching degree;Call scene coupling sensitivity data in system level data assets to calculate replacement risk index;According to the above index, generate replacement feasibility conclusion containing replacement measure set and replacement credibility;The conclusion is stored in local knowledge base, and replacement evaluation rule data assets are generated based on historical data.The application quantitatively evaluates the EMC risk and adaptability of domestic IC replacement, clearly determines the feasibility, provides adjustment scheme and gives performance compliance judgment, and realizes data-driven replacement decision by sedimenting the evaluation process into reusable data assets and rule assets.

Description

Technical Field

[0001] This invention belongs to the field of electromagnetic compatibility (EMC) design technology, specifically involving a method for evaluating the EMC of domestically produced IC replacements based on integrated circuit (IC) level EMC data assets. Background Technology

[0002] With the rapid development of the integrated circuit industry, domestically produced ICs are gradually approaching the functionality and performance of their foreign counterparts. Domestic substitution has become a crucial path for the electronics manufacturing industry to reduce supply chain risks and enhance its self-reliance and controllability. However, in the actual substitution process, the core issue faced by engineers is not whether the functions match, but whether electromagnetic compatibility (EMC) is reliable. Whether the original peripheral circuits (filter networks, PCB layout, grounding methods, shielding structures) are still applicable, which parameters need adjustment, and whether the performance after adjustment can reach the original design level—these critical questions cannot be answered simply by comparing datasheets.

[0003] Several existing technologies attempt to evaluate or optimize the EMC characteristics of integrated circuits (ICs). For example, patent application CN119827878A discloses a method and system for predicting the electromagnetic radiation intensity of an integrated isolation chip. This method predicts the chip's radiation intensity by establishing an electromagnetic field model of a transformer and converting it into an equivalent circuit model, using common-mode current as the excitation input to the electromagnetic field model of the PCB evaluation board. This method focuses on the simulation prediction of single-chip radiation intensity, reducing the number of prototyping and testing iterations. However, its core lies in predicting the radiation of the chip itself, without involving EMC characteristic comparisons between two ICs, and without considering the matching issues with the original peripheral circuitry after replacement.

[0004] Utility model patent CN222015408U discloses a low-loss wireless radio frequency chip packaging structure. It utilizes a shielding layer within the chip's protective layer to create an electromagnetic interference shielding mechanism, reducing the impact of external interference on the chip and minimizing the chip's own interference to the outside world. This patent pertains to electromagnetic shielding design at the packaging structure level, which can improve the chip's EMC performance. However, it does not provide a quantitative evaluation method needed for IC replacement decisions, and therefore cannot provide a quantitative basis and specific direction for adjusting the adaptability of the peripheral circuitry after replacement.

[0005] Furthermore, existing technologies typically rely on a trial-and-error model of "testing after replacement - rectification - retesting" for IC replacement evaluation, which is costly and time-consuming. Even with the assistance of simulation tools, there is a lack of accurate data coupled with the actual system (PCB, structure, cables), and the model support for domestic ICs is limited, making it impossible to quickly and accurately predict the system-level EMC risks and the necessary compensation measures after replacement.

[0006] In summary, existing technologies lack a method for quantitatively assessing the EMC of domestic IC substitution during the design phase, failing to address engineers' concerns about EMC risks when making substitution decisions, and further failing to transform the assessment process into reusable data assets. Summary of the Invention

[0007] The purpose of this invention is to provide a domestic IC substitution EMC assessment method based on IC-level EMC data assets, in order to solve the problems of difficulty in quantitatively predicting EMC risks, unclear peripheral circuit adjustment schemes, and inability to convert the assessment process into reusable data assets when substituting domestic ICs in existing technologies.

[0008] To achieve the above objectives, the present invention provides the following technical solution:

[0009] A method for evaluating the EMC performance of domestically produced ICs based on IC-level EMC data assets includes the following steps:

[0010] S1. Obtain the model identification information of the target IC and the alternative IC to be evaluated;

[0011] S2. Query whether there is intrinsic characteristic data of IC that matches the target IC and the alternative IC to be evaluated in the IC-level EMC data assets. The intrinsic characteristic data of IC includes at least emission parameters for characterizing the electromagnetic emission characteristics of IC and sensitivity parameters for characterizing the electromagnetic sensitivity characteristics of IC.

[0012] S3. When there is no intrinsic IC characteristic data in the IC-level EMC data asset that matches the target IC or the alternative IC to be evaluated, a standardized demand form containing the missing IC model identifier is generated and sent to the data asset producer. The intrinsic IC characteristic data generated by the producer based on the demand is received and updated to the IC-level EMC data asset.

[0013] S4. Retrieve the intrinsic IC characteristics data of the target IC and the alternative IC to be evaluated from the updated IC-level EMC data assets;

[0014] S5. Based on the intrinsic characteristic data of the IC, calculate the emission equivalence coefficient of the replacement IC to be evaluated relative to the target IC in terms of emission parameters and the sensitivity equivalence coefficient in terms of sensitivity parameters, and obtain the replacement equivalence coefficient in combination. The replacement equivalence coefficient is used to quantitatively characterize the overall equivalence of the two ICs in terms of key EMC intrinsic characteristics.

[0015] S6. Obtain the characteristic data of the peripheral circuit of the target system. The peripheral circuit characteristic data includes at least one of filter network parameters, PCB layout characteristics, grounding method and shielding structure characteristics. Based on the peripheral circuit characteristic data and the intrinsic characteristic data of the replacement IC to be evaluated, calculate the replacement matching degree between the replacement IC to be evaluated and the original peripheral circuit of the target system.

[0016] S7. Retrieve scenario coupling sensitivity data corresponding to the target product application scenario from system-level EMC data assets. The scenario coupling sensitivity data includes at least one of IC coupling coefficient, combination effect coefficient and trade-off characteristics. Calculate the substitution risk index based on the substitution equivalence coefficient, substitution matching degree and scenario coupling sensitivity data.

[0017] S8. Based on the substitution equivalence coefficient, substitution matching degree, and substitution risk index, generate a substitution feasibility conclusion; the substitution feasibility conclusion is a structured data asset, including at least a set of substitution measures and a substitution credibility; wherein, the set of substitution measures includes specific design adjustment measures required to achieve successful substitution, the design adjustment measures include at least one of the following: filter parameter modification, shielding measure optimization, layout adjustment, grounding method optimization, and drive parameter adjustment, and is accompanied by a conclusive judgment that the electromagnetic compatibility performance of the substitute IC to be evaluated is not lower than that of the target IC after adopting the set of substitution measures; the substitution credibility is used to characterize the degree of acceptability of the substitution feasibility conclusion;

[0018] S9. Store the aforementioned alternative feasibility assertions in the form of structured data assets in the user's local design knowledge base, as callable data assets for subsequent product design;

[0019] S10. Store the evaluation results and subsequent test feedback accumulated from multiple rounds of replacement projects into the user's local design knowledge base to optimize the calibration parameters of replacement credibility in subsequent replacement evaluations, thereby achieving continuous self-growth of the user's local design knowledge base.

[0020] S11. Based on the historical alternative assessment results and test feedback accumulated in the user's local design knowledge base, continuously optimize the calculation model of the alternative risk index, generate and update the alternative assessment rule data asset. The alternative assessment rule data asset stores typical alternative scenarios, dominant risk types, recommended alternative measure sets, alternative credibility reference values ​​and historical success rates in a structured form, serving as an operational guide for engineers to conduct EMC assessments of domestic IC substitution.

[0021] Beneficial effects

[0022] First, this invention deeply binds data asset production with user needs by querying IC-level EMC data assets and generating missing data on demand. When the IC data that the user needs to evaluate does not exist, a standardized demand process is automatically triggered, realizing on-demand production and continuous enrichment of data assets.

[0023] Secondly, by separating the emission parameters and the sensitivity parameters, and dynamically adjusting the weights in the substitution equivalence coefficients, this invention enables the method to cover the substitution evaluation needs of both interference source type and sensitivity source type ICs, thus having broad applicability.

[0024] Third, by calculating the degree of matching between the replacement IC and the peripheral circuits (filtering, layout, grounding, shielding) of the target system, this invention quantifies the degree of matching between the replacement IC and the target system's peripheral circuits (filtering, layout, grounding, shielding), enabling engineers to clearly understand the specific direction and quantification range of adjustments needed to the original design.

[0025] Fourth, by calculating the substitution risk index, this invention comprehensively considers the substitution equivalence coefficient, substitution matching degree, and scenario coupling sensitivity, classifying substitution risks into three levels: low, medium, and high, providing engineers with an intuitive basis for risk judgment.

[0026] Fifth, the alternative feasibility assertion generated by this invention includes a set of alternative measures and the credibility of the alternative. It not only provides specific design adjustment actions, but also includes a conclusive judgment that the performance after adopting the set of measures is no less than that of the target IC, and clarifies the degree of admissibility of the assertion. It directly answers the four core questions that engineers care about: whether it can be replaced, how to replace it, the performance after replacement, and the reliability of the assertion.

[0027] Sixth, this invention stores the feasibility of alternatives in the user's local design knowledge base, making the results of each alternative evaluation traceable and reusable, forming the user's exclusive design experience assets.

[0028] Seventh, through the accumulation of multiple rounds of substitution projects and test feedback, this invention continuously optimizes the calibration parameters of substitution credibility, realizes the self-growth of the user's local design knowledge base, and makes the subsequent evaluation results gradually approach the actual verification results.

[0029] Eighth, the alternative assessment rule data asset generated and updated by this invention precipitates typical alternative scenarios, dominant risk types, recommended alternative measure sets, alternative credibility reference values, and historical success rates in a structured form. It systematizes the design experience of senior engineers into callable rule assets, enabling designers to complete alternative assessments based on standardized rules and reducing reliance on personal experience.

[0030] Ninth, this invention can be integrated into EMC intelligent design instruments as an alternative evaluation module, or it can be implemented as a standalone computer software product or a plug-in for electronic design automation software, providing flexible application options for enterprises of different sizes and broadening the industrial application scenarios of the technical solution. Attached Figure Description

[0031] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0032] Figure 1 This is a flowchart of the method of the present invention.

[0033] Figure 2 This is a diagram showing the module interaction relationship of the present invention in the EMC intelligent design instrument.

[0034] Figure 3 This is a schematic diagram illustrating the application of the present invention as a standalone software tool.

[0035] Figure 4 This is a schematic diagram illustrating the calculation of the substitution equivalence coefficient of the present invention.

[0036] Figure 5 This is a schematic diagram of the alternative evaluation rule data asset structure of the present invention. Detailed Implementation

[0037] The overall process of this invention includes: S1 obtaining the model identifiers of the target IC and the alternative IC to be evaluated; S2 querying whether there is matching IC intrinsic characteristic data in the IC-level EMC data asset; S3 generating a standardized requirement form when data is missing and receiving the data generated on demand; S4 calling the updated IC intrinsic characteristic data; S5 calculating the substitution equivalence coefficient; S6 calculating the substitution matching degree; S7 calculating the substitution risk index; S8 generating a substitution feasibility conclusion; S9 storing the conclusion in the user's local design knowledge base; S10 accumulating multiple rounds of evaluation results to achieve self-growth; S11 generating and updating the substitution evaluation rule data asset.

[0038] The following three embodiments illustrate the specific applications of the present invention in three carriers: EMC intelligent design instruments, standalone software tools, and PCB design software plug-ins.

[0039]

Example 1

[0040] This embodiment uses the integration of the method of the present invention into an EMC intelligent design instrument as an example to illustrate its application in the localization of analog input modules for industrial programmable logic controllers (PLCs).

[0041] An industrial automation company plans to replace a precision operational amplifier (model: A-OPA-01, hereinafter referred to as IC1-1) from foreign company A with a precision operational amplifier (model: B-OPA-02, hereinafter referred to as IC1-2) from domestic company B in the analog input module of its PLC. The engineer inputs the model identifiers of the two ICs into the "EMC Replacement Evaluation Module" of the EMC intelligent design instrument.

[0042] Step S1: The instrument receives the model identification information of IC1-1 and IC1-2.

[0043] Step S2: The instrument queries the internally integrated IC-level EMC data assets to confirm that the data of IC1-1 is complete and exists, while the data of IC1-2 is missing.

[0044] Step S3: The instrument automatically generates a standardized requirement form containing the IC1-2 model identifier and sends it to the data asset producer (Beijing Gaobo EMC) via a standardized interface. The producer completes the intrinsic characteristic data acquisition of IC1-2 based on the requirement (according to the method described in Invention 1) and returns the data to the instrument. The instrument updates the received data into the integrated IC-level EMC data asset.

[0045] Step S4: The instrument retrieves the intrinsic IC characteristic data of IC1-1 and IC1-2 from the updated IC-level EMC data assets. The data shows that IC1-1 has a common-mode rejection ratio of 95dB at 1MHz, an input bias current of 1nA, a differential-mode input capacitance of 3pF, and a common-mode input capacitance of 5pF; IC1-2 has a common-mode rejection ratio of 92dB at 1MHz, an input bias current of 2nA, a differential-mode input capacitance of 4pF, and a common-mode input capacitance of 6pF.

[0046] Step S5: The instrument compares the emission parameters (since the operational amplifier is mainly used as a sensitive device, its port impedance and internal noise may affect the system) and the sensitivity parameters (common-mode rejection ratio, input capacitance, etc.) item by item. Since IC1-2 is the main sensitive device in the target system, the sensitivity dimension weight is set to 0.7, and the emission dimension weight is set to 0.3. The weighted calculation yields a substitution equivalence coefficient of 0.88.

[0047] Step S6: The instrument acquires the characteristic data of the target system's peripheral circuit: the input filter is a differential RC filter (1kΩ resistor, 10nF capacitor). In the PCB layout, IC1-1 is located at the front end of the analog input, uses multi-point grounding, and has no additional shielding. The instrument performs matching analysis on the input capacitor of IC1-2 and the filter network, and performs matching analysis on the package layout of IC1-2 and the PCB layout features, obtaining a comprehensive substitution matching degree of 0.92.

[0048] Step S7: The instrument retrieves scenario coupling sensitivity data corresponding to the industrial PLC application scenario from the system-level EMC data assets, including the coupling coefficient between the operational amplifier and the subsequent ADC, power supply noise suppression characteristics, etc. Based on the comprehensive substitution equivalence coefficient of 0.88, substitution matching degree of 0.92, and scenario coupling sensitivity data, the substitution risk index is determined to be low risk through preset mapping rules.

[0049] Step S8: The instrument generates an alternative feasibility assertion based on the above assessment results. This assertion includes:

[0050] Alternative measures: Due to the high degree of matching and low risk index of the alternatives, it is recommended that only minor adjustments be made to the filter network to compensate for the input capacitance difference. The differential filter capacitor should be adjusted from 10nF to 8.2nF to maintain matching with the input capacitor of IC1-2. This is expected to keep the common-mode rejection ratio (CMRR) drop within 2dB. Additional conclusion: After adopting this set of measures, the EMC performance of IC1-2 is no lower than that of IC1-1.

[0051] Replacement credibility: Based on the completeness of data from IC1-1 and IC1-2 (both are measured data, with high completeness), the matching degree between application scenarios and historical scenarios (industrial PLCs have historical cases, with moderate matching degree), and the statistical results of historical verification cases (success rate of replacement of similar operational amplifiers is 90%), the overall credibility is rated as high.

[0052] Step S9: The instrument stores the alternative feasibility statement in the form of structured data assets in the user's local design knowledge base, as a callable data asset for the subsequent design of the PLC module.

[0053] Step S10: The engineer adopts the set of alternative measures to complete the design, and the prototype passes the test. The instrument stores the evaluation results, the adopted set of measures, and the test verification data in the user's local design knowledge base.

[0054] Step S11: Based on this substitution case and other historical cases accumulated in the user's local design knowledge base, the instrument continuously optimizes the calculation model of the substitution risk index, generating and updating the substitution assessment rule data asset. This asset adds a new record, including the substitution scenario identifier "Industrial PLC Analog Input Operational Amplifier Substitution," the dominant risk type "Input Capacitor Difference," the recommended substitution measure set "Adjust Differential Filter Capacitor," the substitution credibility reference value "High Credibility," and a historical success rate of 90%.

[0055] This embodiment demonstrates the complete application of the method of the present invention in EMC intelligent design instruments. Through data asset support, quantitative evaluation, measure recommendation, result storage, and rule accumulation, it enables engineers to quickly complete the evaluation of domestic substitution.

[0056]

Example 2

[0057] This embodiment uses the method of the present invention as an example to illustrate its application in the localization and substitution of smart home gateway controllers.

[0058] A smart home device company plans to replace a CAN transceiver (model: C-CAN-01, hereinafter referred to as IC2-1) from a foreign company (Company C) with a domestic company (Company D) in its gateway controller (model: D-CAN-02, hereinafter referred to as IC2-2). Engineers used a standalone software tool (hereinafter referred to as the "alternative evaluation software") implemented in this invention to conduct the evaluation.

[0059] Step S1: The engineer enters the model identifiers of IC2-1 and IC2-2 in the software interface.

[0060] Steps S2-S3: The software connects to the data asset server via the internet, confirms the existence of IC2-1 data, and confirms that IC2-2 data is missing. The software automatically generates a standardized requirement form and submits it to the data asset producer, simultaneously displaying "IC2-2 data is being produced and is expected to be completed within 24 hours." 24 hours later, the software receives a data update notification and synchronizes the intrinsic characteristic data of IC2-2 from the data asset server.

[0061] Step S4: The software retrieves data for IC2-1 and IC2-2 from the locally cached IC-level EMC data assets. The emitter parameters of IC2-2 show that its common-mode output voltage swing is slightly higher than that of IC2-1, but the differential-mode output voltage swing is similar; the sensitivity parameters show that its common-mode immunity is better than that of IC2-1.

[0062] Steps S5-S7: The software sequentially calculates the substitution equivalence coefficient (0.84), substitution matching degree (0.78), and substitution risk index (medium risk). Since IC2-2 acts as both an interference source and a sensitive device in the system, the weights for both the emission and sensitivity dimensions are 0.5.

[0063] Steps S8-S9: The software generates an alternative feasibility statement, including a set of alternative measures (it is recommended to add a common-mode choke to the CAN bus interface, with an inductance value of 51μH to suppress common-mode radiation, and to add 0.1μF and 10nF parallel capacitors to the transceiver power pins) and an alternative confidence level (medium confidence). The software automatically stores the statement in the user's local design knowledge base.

[0064] Steps S10-S11: Engineers complete the design according to the recommendations, and the prototype passes the test. The software imports the test data, updates the historical cases in the local knowledge base, and optimizes the calculation model for the alternative risk index.

[0065] This embodiment demonstrates that the method of the present invention, as an independent software tool, can also effectively support the evaluation of domestic IC substitution and work in conjunction with cloud data asset services to achieve on-demand data production and self-growth of local knowledge base.

[0066]

Example 3

[0067] This embodiment uses the method of the present invention as a PCB design software plug-in as an example to illustrate its application in the localization of logic level conversion chips in medical monitoring equipment.

[0068] A medical electronics company is designing a portable electrocardiogram (ECG) monitor and plans to replace a logic level converter (model: E-LVC-01, hereinafter referred to as IC3-1) from a foreign company E with a logic level converter (model: F-LVC-02, hereinafter referred to as IC3-2) from a domestic company F. Engineers are using the plugin of this invention in their PCB design software to evaluate the replacement.

[0069] Step S1: The plug-in automatically extracts the model identifiers of IC3-1 and IC3-2 from the schematic diagram.

[0070] Steps S2-S4: The plugin calls the local IC-level EMC data asset to confirm that data for both ICs exists, and directly calls the intrinsic characteristic data. The data shows that IC3-2 has a slightly higher propagation delay, but its output drive capability is comparable, and the port impedance is slightly different.

[0071] Step S5: The plug-in calculation substitution equivalence coefficient is 0.91. Since the logic level converter is mainly used as a signal transmission device in the system, its electromagnetic sensitivity characteristics have a more significant impact on the system performance. Therefore, the weight of the transmitting class is set to 0.4, and the weight of the sensitive class is set to 0.6.

[0072] Step S6: The plugin analyzes the current PCB layout in real time and obtains the characteristics of the peripheral circuit: signal line width 0.15mm, spacing 0.2mm, no matching resistors, and a complete ground plane. The calculated substitution matching degree is 0.88.

[0073] Step S7: Retrieve scenario coupling sensitivity data corresponding to the medical device application scenario from the system-level EMC data assets. Considering that the ECG monitor is sensitive to low-frequency interference, the replacement risk index is low risk.

[0074] Step S8: The plugin generates an alternative feasibility statement, including a set of alternative measures (it is recommended to adjust the series damping resistor at the output end from 22Ω to 33Ω to match the output impedance of IC3-2 and reduce overshoot) and the credibility of the alternative (high credibility).

[0075] Step S9: The plugin stores the conclusions in the user's local design knowledge base and highlights the position and adjustment suggestions of IC3-2 in the PCB design interface.

[0076] After the engineers adopted the suggestions, they completed the design, and the first version passed testing. This embodiment demonstrates that the method of the present invention can be effectively integrated into the PCB design process in the form of a plug-in.

[0077] Application Examples

[0078] 1. Application of EMC intelligent design instruments: Evaluation of industrial controller logic IC replacements

[0079] In an industrial controller project, engineers used an EMC intelligent design instrument to evaluate the substitution of domestically produced logic ICs. The instrument retrieved intrinsic characteristic data of the target IC and the replacement IC from the IC-level EMC data asset, calculating a substitution equivalence coefficient of 0.89, a substitution matching degree of 0.85, and a substitution risk index of low risk. The generated substitution feasibility assessment recommended adding decoupling capacitors to the power supply pins and fine-tuning the output series resistance. After the engineers adopted the recommendations, the controller passed the EMC test on the first attempt. The evaluation results were stored in the user's local design knowledge base as structured data assets, and the substitution evaluation rule data asset was updated synchronously.

[0080] 2. Application in standalone software tools: Batch substitution assessment for medical device companies

[0081] A medical device company plans to replace several products with domestically produced ICs in batches. The purchasing department uses a standalone software tool to import lists of target ICs and alternative ICs. The software then batch-accesses IC-level EMC data assets, generating a batch assessment report that includes the reliability level of the replacements. The report shows that 8 groups of replacements have a low or medium risk index, allowing for direct design progress; 2 groups have a high risk index, requiring the selection of new replacement models. This batch assessment provides data support for the company's domestic substitution strategy.

[0082] 3. Application in PCB design software plugins: Real-time rule invocation during communication module design.

[0083] During the communication module design process, engineers used a PCB design software plugin to evaluate alternatives to domestically produced clock ICs in real time. The plugin accesses alternative evaluation rule data assets stored in the user's local design knowledge base, reviews historical successful cases in the "communication module clock IC replacement" scenario, and refers to their recommended alternative measures (adding series resistors, optimizing layout) and alternative reliability reference values ​​to quickly complete the peripheral circuit design and shorten the R&D cycle.

[0084] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in the present invention should be included within the scope of protection of the present invention.

Claims

1. A method for evaluating the EMC performance of domestically produced IC substitutes based on IC-level EMC data assets, characterized in that, Includes the following steps: S1. Obtain the model identification information of the target IC and the alternative IC to be evaluated; S2. Query whether there is intrinsic characteristic data of IC that matches the target IC and the alternative IC to be evaluated in the IC-level EMC data assets. The intrinsic characteristic data of IC includes at least emission parameters for characterizing the electromagnetic emission characteristics of IC and sensitivity parameters for characterizing the electromagnetic sensitivity characteristics of IC. S3. When there is no intrinsic IC characteristic data in the IC-level EMC data asset that matches the target IC or the alternative IC to be evaluated, a standardized demand form containing the missing IC model identifier is generated and sent to the data asset producer. The intrinsic IC characteristic data generated by the producer based on the demand is received and updated to the IC-level EMC data asset. S4. Retrieve the intrinsic IC characteristics data of the target IC and the alternative IC to be evaluated from the updated IC-level EMC data assets; S5. Based on the intrinsic characteristic data of the IC, calculate the emission equivalence coefficient of the replacement IC to be evaluated relative to the target IC in terms of emission parameters and the sensitivity equivalence coefficient in terms of sensitivity parameters, and obtain the replacement equivalence coefficient in combination. The replacement equivalence coefficient is used to quantitatively characterize the overall equivalence of the two ICs in terms of key EMC intrinsic characteristics. S6. Obtain the characteristic data of the peripheral circuit of the target system. The peripheral circuit characteristic data includes at least one of filter network parameters, PCB layout characteristics, grounding method and shielding structure characteristics. Based on the peripheral circuit characteristic data and the intrinsic characteristic data of the replacement IC to be evaluated, calculate the replacement matching degree between the replacement IC to be evaluated and the original peripheral circuit of the target system. S7. Retrieve scenario coupling sensitivity data corresponding to the target product application scenario from system-level EMC data assets. The scenario coupling sensitivity data includes at least one of IC coupling coefficient, combination effect coefficient and trade-off characteristics. Calculate the substitution risk index based on the substitution equivalence coefficient, substitution matching degree and scenario coupling sensitivity data. S8. Based on the substitution equivalence coefficient, substitution matching degree, and substitution risk index, generate a conclusion on the feasibility of substitution; The alternative feasibility assertion is a structured data asset, comprising at least a set of alternative measures and an alternative credibility. The set of alternative measures includes specific design adjustments required for successful substitution, including at least one of the following: filter parameter modification, shielding optimization, layout adjustment, grounding method optimization, and drive parameter adjustment. It also includes a conclusive judgment that the electromagnetic compatibility performance of the alternative IC to be evaluated is not lower than that of the target IC after adopting the set of alternative measures. The alternative credibility is used to characterize the degree of acceptability of the alternative feasibility assertion. S9. Store the aforementioned alternative feasibility assertions in the form of structured data assets in the user's local design knowledge base, as callable data assets for subsequent product design; S10. Store the evaluation results and subsequent test feedback accumulated from multiple rounds of replacement projects into the user's local design knowledge base to optimize the calibration parameters of replacement credibility in subsequent replacement evaluations, thereby achieving continuous self-growth of the user's local design knowledge base. S11. Based on the historical alternative assessment results and test feedback accumulated in the user's local design knowledge base, continuously optimize the calculation model of the alternative risk index, generate and update the alternative assessment rule data asset. The alternative assessment rule data asset stores typical alternative scenarios, dominant risk types, recommended alternative measure sets, alternative credibility reference values ​​and historical success rates in a structured form, serving as an operational guide for engineers to conduct EMC assessments of domestic IC substitution.

2. The method according to claim 1, characterized in that, The emission parameters include at least one of transient emission characteristic parameters, frequency domain disturbance spectrum envelope, and port impedance characteristics; the sensitivity parameters include at least one of immunity threshold, sensitive frequency band, and port impedance characteristics; the transient emission characteristic parameters include at least one of switching time, voltage change rate dv / dt, and current change rate di / dt; the frequency domain disturbance spectrum envelope includes the main harmonic distribution and amplitude; the port impedance characteristics include at least common-mode impedance and differential-mode impedance.

3. The method according to claim 1, characterized in that, Calculating the substitution equivalence coefficient further includes: comparing the emission parameters and sensitivity parameters of the target IC and the substitution IC to be evaluated item by item to obtain the emission dimension similarity score and sensitivity dimension similarity score, and then obtaining the substitution equivalence coefficient by weighted summation; the weight coefficient of the weighted summation is dynamically adjusted according to the role of the substitution IC to be evaluated in the target system. When the substitution IC to be evaluated is the main interference source, the emission dimension weight is higher than the sensitivity dimension; when the substitution IC to be evaluated is the main sensitive device, the sensitivity dimension weight is higher than the emission dimension.

4. The method according to claim 1, characterized in that, Calculating the substitution matching degree further includes: performing a matching analysis between the port impedance characteristics of the substitution IC to be evaluated and the filter network of the target system; performing a matching analysis between the package layout characteristics of the substitution IC to be evaluated and the PCB layout characteristics; and performing a matching analysis between the dependence of the substitution IC to be evaluated on the shielding structure and the shielding characteristics of the target system, and comprehensively obtaining the substitution matching degree.

5. The method according to claim 1, characterized in that, The calculation of the substitution risk index further includes: combining the substitution equivalence coefficient, substitution matching degree and scenario coupling sensitivity data, and obtaining three risk levels of low, medium and high through preset mapping rules; the mapping rules are dynamically optimized based on historical substitution case data, and the optimized mapping rule parameters are stored in the substitution evaluation rule data asset.

6. The method according to claim 1, characterized in that, The reliability of the substitution is determined based on the following factors: the data completeness of the target IC and the substitute IC to be evaluated in the IC-level EMC data asset, the matching degree between the application scenario and the historical scenarios in the data asset, and the statistical results of historical verification cases; the reliability of the substitution is divided into three levels: high, medium and low.

7. The method according to claim 1, characterized in that, The method is applied to an EMC intelligent design instrument as an "EMC alternative evaluation module" of the instrument. The instrument integrates the IC-level EMC data assets and system-level EMC data assets, and communicates with the data asset producer through a standardized interface to send standardized demand forms, receive IC intrinsic characteristic data generated on demand, and update the received data to the IC-level EMC data assets integrated in the instrument. The instrument's user interface displays the alternative feasibility assertion and stores the alternative feasibility assertion in the form of structured data assets in the user's local design knowledge base; The instrument also provides an interface for accessing the alternative evaluation rule data assets, allowing engineers to consult operation guidelines based on historical alternative case studies.

8. The method according to claim 1, characterized in that, The method is implemented as a standalone computer software product or a plug-in to electronic design automation software; the software product can receive IC model identifiers input by the user, work in conjunction with IC-level EMC data assets and the user's local design knowledge base, and generate storable alternative feasibility arguments; the software product provides a batch import function, supports simultaneous substitution evaluation of multiple groups of target ICs and alternative ICs to be evaluated, and outputs a batch evaluation report containing the substitution credibility level.

9. The method according to claim 1, characterized in that, The alternative assessment rule data asset includes alternative scenario classification identifiers, dominant risk type identifiers, recommended alternative measure set parameters, alternative credibility reference values, historical success rate statistics and sample size, and is continuously iterated and updated as the user's local design knowledge base becomes richer.

10. The method according to claim 1, characterized in that, The IC-level EMC data asset is a pre-built structured database containing multiple intrinsic IC characteristics and their quantified contribution values. The quantified contribution values ​​include the impact coefficients of different design variable changes on the intrinsic EMC performance of the IC. The system-level EMC data asset is a pre-built structured database containing inter-IC coupling coefficients and combination effect coefficients. The user's local design knowledge base stores the user's historical alternative evaluation results, adopted alternative measures sets, and corresponding test verification data.

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