A method and device for evaluating steel purity, equipment and medium

Abstract

The present application relates to a kind of steel purity evaluation method and device, equipment, medium, it is related to detection analysis technical field, including: at least 3 molten steel samples are obtained from the LF furnace of target steel and solidification, at least 3 molten steel samples are obtained from VD furnace and solidification, obtain sample;Ultrasonic defect analysis is carried out to sample, the number of first defect, the number of second defect and the number of third defect in each sample are obtained, then according to purity evaluation index calculation formula, the purity evaluation index of sample is obtained;The purity of target steel is evaluated using purity evaluation index.The evaluation method provided in the present application uses multiple process samples in the smelting process as test material, proposes a new defect grade division and weight coefficient setting method to calculate purity evaluation index, and three-dimensional space imaging is carried out on the defects in the material, realizes the ultrasonic detection and evaluation method of metal material purity based on statistical method, so that the evaluation result is more comprehensive and accurate.

Description

Technical Field

[0001] This invention relates to the field of detection and analysis technology, specifically to a method, apparatus, equipment, and medium for evaluating the purity of steel. Background Technology

[0002] Steel purity is a comprehensive indicator for inspecting and evaluating steel quality. It is mainly related to the quantity, composition, type, morphology, size, and distribution of inclusions in the steel. Simply put, the fewer the inclusions and the smaller their size, the higher the purity of the steel.

[0003] Currently, ultrasonic evaluation methods are commonly used to assess purity. For example, CN110018234A discloses a method for detecting inclusions in bearing steel using dual-frequency ultrasonic waves. A cylindrical bearing steel sample that has undergone quenching, tempering, and metalworking is mounted on a water-immersion high-frequency ultrasonic flaw detector. A 10MHz flat probe and a 25MHz focused probe are used to jointly detect the sample. The A and C scan images generated simultaneously by the scanning are analyzed to determine the size, quantity, and distribution of inclusions in the medium-carbon bearing steel. Based on meeting the international high-standard bearing steel testing requirements, a unique standard for judging the purity level of steel has been formed.

[0004] CN115950949A discloses a rapid quantitative ultrasonic defect inspection method for forged and rolled steel materials. The method involves establishing a rapid lookup table for ultrasonic defects, preparing a digital ultrasonic flaw detector and its probe, and calibrating the digital ultrasonic flaw detector and probe. The method verifies the inspection requirements for the forged and rolled steel material to be inspected, and then performs digital ultrasonic flaw detection on the material. When a defect is found, the method uses the obtained rapid lookup table for ultrasonic defects. The horizontal axis represents the defect display position, the lookup cell value represents the decibel difference between the defect and the reference wave height in the inspected forged and rolled steel material, and the corresponding vertical axis yields the defect equivalent of the inspected forged and rolled steel material.

[0005] However, existing ultrasonic evaluation methods still have shortcomings such as insufficient basis for defect level classification and a single method for setting weight coefficients for different levels of defects, resulting in poor evaluation accuracy. Summary of the Invention

[0006] In view of the problems existing in the prior art, the purpose of the present invention is to provide a method, device, equipment and medium for evaluating the purity of steel, so as to solve the shortcomings of the current ultrasonic evaluation method, such as insufficient basis for defect level classification and single method for setting weight coefficients of different defect levels, which leads to poor evaluation accuracy.

[0007] To achieve this objective, the present invention adopts the following technical solution:

[0008] In a first aspect, the present invention provides a method for evaluating the purity of steel, the evaluation method comprising:

[0009] At least three first molten steel samples were obtained from the LF furnace of the target steel and solidified to obtain the first sample group;

[0010] At least three second molten steel samples were obtained from the VD furnace of the target steel and solidified to obtain a second sample group;

[0011] Ultrasonic defect analysis was performed on the samples in the first and second sample groups to obtain the number of first defects, second defects, and third defects in each sample; the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the first defect is greater than the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the second defect, which is greater than the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the third defect.

[0012] The purity evaluation index of each sample is obtained based on the number of first defects, second defects, and third defects of each sample according to the purity evaluation index calculation formula.

[0013] The purity of a sample is evaluated using a purity evaluation index, where a higher purity evaluation index indicates a lower purity of the sample.

[0014] The evaluation method provided by this invention uses multiple process samples from the smelting process as test materials, proposes a new method for classifying defect levels and setting weight coefficients to calculate the purity evaluation index, and performs three-dimensional spatial imaging of internal defects of the material, thereby obtaining an ultrasonic detection and evaluation method for the purity of metallic materials based on statistical methods. This makes the evaluation results more comprehensive and accurate, and realizes the analysis and evaluation of the purity change trend of the entire furnace during the steel smelting process.

[0015] As a preferred technical solution of the present invention, the ultrasonic defect analysis method includes: water immersion ultrasonic detection and analysis.

[0016] As a preferred technical solution of the present invention, the first defect includes: the defect that the absolute value of the echo signal amplitude is ≥44.5dB in ultrasonic defect analysis.

[0017] As a preferred technical solution of the present invention, the second defect includes: a defect in which the absolute value of the echo signal amplitude in ultrasonic defect analysis is between 40-44.5dB, excluding 44.5dB.

[0018] As a preferred technical solution of the present invention, the third defect includes: a defect in which the absolute value of the echo signal amplitude in ultrasonic defect analysis is between 35-40dB, excluding 40dB.

[0019] As a preferred technical solution of the present invention, the formula for calculating the purity evaluation index is as follows:

[0020] S=(a×NL +b×N M +c×N H ) / V;

[0021] In the formula, S is the purity evaluation index; N L denoted as , where is the number of echoes from the first defect in the sample; 'a' is the weighting coefficient for the first defect; N M denoted as , where is the number of echoes from the second defect in the sample; b is the weighting coefficient for the second defect; N H denoted as , where is the number of echoes from the third defect in the sample; c is the weighting coefficient of the third defect; and V is the volume of the sample analyzed for ultrasonic defects.

[0022] As a preferred technical solution of the present invention, the control frequency in the ultrasonic defect analysis is 25-35MHz.

[0023] Preferably, the focal length is controlled to be 12-13 mm in the ultrasonic defect analysis.

[0024] Preferably, the diameter of the control wafer in the ultrasonic defect analysis is 5-7 mm.

[0025] Preferably, the sampling rate is controlled at 1-2 GHz in the ultrasonic defect analysis.

[0026] Preferably, the stepping accuracy in the ultrasonic defect analysis is controlled to be 35-45 μm.

[0027] Preferably, the control gain in the ultrasonic defect analysis is 20-25 dB.

[0028] Secondly, the present invention provides a device for evaluating the purity of steel, the device comprising:

[0029] The sample acquisition module is used to acquire at least three first molten steel samples from the LF furnace of the target steel and solidify them to obtain a first sample group; and to acquire at least three second molten steel samples from the VD furnace of the target steel and solidify them to obtain a second sample group.

[0030] The defect analysis module is used to perform ultrasonic defect analysis on samples in the first sample group and the second sample group to obtain the number of first defects, the number of second defects, and the number of third defects in each sample; the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the first defect is greater than the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the second defect, which is greater than the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the third defect.

[0031] The evaluation module is used to obtain the purity evaluation index of each sample based on the number of first defects, second defects, and third defects according to the purity evaluation index calculation formula. The purity of the sample is evaluated using the purity evaluation index, where the larger the purity evaluation index, the worse the purity of the sample.

[0032] Thirdly, the present invention provides an electronic device comprising: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores a computer program executable by the at least one processor, the computer program being executed by the at least one processor to enable the at least one processor to perform the steel purity evaluation method described in the first aspect.

[0033] Fourthly, the present invention provides a computer storage medium storing computer-executable instructions, which, when executed by a processor, implement the steel purity evaluation method described in the first aspect.

[0034] Compared with existing technical solutions, the present invention has the following beneficial effects:

[0035] The evaluation method provided by this invention, by characterizing the spatial distribution of inclusions, enables the analysis and evaluation of the purity change trend of the entire furnace during steel smelting, making the evaluation results more objective and accurate, which is conducive to ensuring the quality of steel leaving the factory. At the same time, the method of setting weight coefficients for different grades of inclusions is more comprehensive, and can provide a theoretical basis for the classification of inclusions inside metal materials. Attached Figure Description

[0036] Figure 1 This is a flowchart of a method for evaluating the purity of steel provided in an embodiment of the present invention;

[0037] Figure 2 This is a schematic diagram of the steel purity evaluation device provided in an embodiment of the present invention;

[0038] Figure 3 This is a schematic diagram of an electronic device provided in an embodiment of the present invention;

[0039] In the picture:

[0040] 100 - Sample acquisition module, 200 - Defect analysis module, 300 - Evaluation module;

[0041] 10-Electronic device, 11-Processor, 12-ROM, 13-RAM, 14-Bus, 15-I / O interface, 16-Input unit, 17-Output unit, 18-Storage unit, 19-Communication unit.

[0042] The present invention will now be described in further detail. However, the examples described below are merely simplified examples of the present invention and do not represent or limit the scope of protection of the present invention. The scope of protection of the present invention is determined by the claims. Detailed Implementation

[0043] To better illustrate the present invention and facilitate understanding of its technical solutions, typical but non-limiting embodiments of the present invention are as follows:

[0044] Currently, ultrasonic evaluation methods are commonly used to assess purity. However, existing ultrasonic evaluation methods still have drawbacks such as insufficient criteria for defect level classification and a single method for setting weight coefficients for different defect levels, resulting in poor evaluation accuracy. Therefore, this invention optimizes the evaluation process, using multiple process samples from the smelting process as experimental materials. It studies an ultrasonic detection and evaluation method for metallic material purity based on statistical methods, proposes a new method for defect level classification and weight coefficient setting to calculate the purity evaluation index, and performs three-dimensional spatial imaging of internal defects in the material, thereby making the evaluation results more comprehensive and accurate. The details are as follows:

[0045] I. This embodiment provides a method for evaluating the purity of steel, the process of which is as follows: Figure 1 As shown, the evaluation method includes:

[0046] At least three first molten steel samples were obtained from the LF furnace of the target steel and solidified to obtain the first sample group;

[0047] At least three second molten steel samples were obtained from the VD furnace of the target steel and solidified to obtain a second sample group;

[0048] Ultrasonic defect analysis was performed on the samples in the first and second sample groups to obtain the number of first defects, second defects, and third defects in each sample; the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the first defect is greater than the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the second defect, which is greater than the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the third defect.

[0049] The purity evaluation index of each sample is obtained based on the number of first defects, second defects, and third defects of each sample according to the purity evaluation index calculation formula.

[0050] The purity of a sample is evaluated using a purity evaluation index, where a higher purity evaluation index indicates a lower purity of the sample.

[0051] In this invention, due to the limited penetration capability of the ultrasonic probe in the ultrasonic defect analysis, it is necessary to perform focused detection on the upper and lower surfaces of the process sample separately. It should be noted that, to avoid the influence of the interface wave blind zone on the detection results, imaging can be performed starting 0.5 mm after the main peak of the interface wave, covering a thickness range of 1.5 mm. Therefore, for each process sample, after two scans on both sides, statistical analysis can be performed on defects within a 3 mm thickness range inside the process sample.

[0052] The ultrasonic defect analysis method includes: water immersion ultrasonic testing and analysis.

[0053] In this invention, when performing ultrasonic defect analysis, specific relevant parameters can be reasonably selected and designed based on existing technologies. Exemplary control parameters are as follows:

[0054] The control frequency in the ultrasonic defect analysis is 25-35MHz, for example, it can be 25MHz, 26MHz, 27MHz, 28MHz, 29MHz, 30MHz, 31MHz, 32MHz, 33MHz, 34MHz or 35MHz, but is not limited to the listed values. Other unlisted values ​​within this range are also acceptable.

[0055] In the ultrasonic defect analysis, the focal length is controlled to be 12-13mm, for example, it can be 12mm, 12.1mm, 12.2mm, 12.3mm, 12.4mm, 12.5mm, 12.6mm, 12.7mm, 12.8mm, 12.9mm or 13mm, but is not limited to the listed values. Other unlisted values ​​within this range are also acceptable.

[0056] The diameter of the control chip in the ultrasonic defect analysis is 5-7mm, for example, it can be 5mm, 5.2mm, 5.4mm, 5.6mm, 5.8mm, 6mm, 6.2mm, 6.4mm, 6.6mm, 6.8mm or 7mm, but is not limited to the listed values. Other unlisted values ​​within this range are also acceptable.

[0057] The ultrasonic defect analysis uses a sampling rate of 1-2 GHz, which can be, for example, 1 GHz, 1.1 GHz, 1.2 GHz, 1.3 GHz, 1.4 GHz, 1.5 GHz, 1.6 GHz, 1.7 GHz, 1.8 GHz, 1.9 GHz, or 2 GHz, but is not limited to the listed values. Other unlisted values ​​within this range are also acceptable.

[0058] The stepping accuracy in the ultrasonic defect analysis is controlled to be 35-45μm, for example, it can be 35μm, 36μm, 37μm, 38μm, 39μm, 40μm, 41μm, 42μm, 43μm, 44μm or 45μm, but is not limited to the listed values. Other unlisted values ​​within this range also meet the requirements.

[0059] In the ultrasonic defect analysis, the control gain is 20-25dB, for example, it can be 20dB, 20.5dB, 21dB, 21.5dB, 22dB, 22.5dB, 23dB, 23.5dB, 24dB, 24.5dB or 25dB, but is not limited to the listed values. Other unlisted values ​​within this range are also acceptable.

[0060] In this invention, the ultrasonic defect analysis can selectively remove background noise of a large amplitude caused by a large gain setting and uneven internal structure of the material, which can be done in accordance with conventional requirements in the field.

[0061] The first defect includes: a defect in which the absolute value of the echo signal amplitude is ≥44.5dB in ultrasonic defect analysis.

[0062] The second defect includes: defects in ultrasonic defect analysis where the absolute value of the echo signal amplitude is between 40 and 44.5 dB, excluding 44.5 dB.

[0063] The third defect includes: defects in ultrasonic defect analysis where the absolute value of the echo signal amplitude is between 35-40dB, excluding 40dB.

[0064] The formula for calculating the purity evaluation index is as follows:

[0065] S=(a×N L +b×N M +c×N H ) / V;

[0066] In the formula, S is the purity evaluation index; N L denoted as , where is the number of echoes from the first defect in the sample; 'a' is the weighting coefficient for the first defect; N M denoted as , where is the number of echoes from the second defect in the sample; b is the weighting coefficient for the second defect; N H denoted as , where is the number of echoes from the third defect in the sample; c is the weighting coefficient of the third defect; and V is the volume of the sample analyzed for ultrasonic defects.

[0067] In this invention, the volume of ultrasonic defect analysis is calculated as the scanning area multiplied by the gate width.

[0068] In this invention, the selection of weighting coefficients a, b, and c can be reasonably designed according to the evaluation requirements. For example, they can be designed according to the degree of harm of the corresponding defects in the steel grade. For example, the larger the defect, the greater the harm. The weighting coefficients a, b, and c are controlled to be 0.3-0.4, 0.2-0.3, and 0.01-0.1, respectively.

[0069] II. This embodiment provides a device for evaluating the purity of steel, such as... Figure 2 As shown, the evaluation device includes:

[0070] The sample acquisition module 100 is used to acquire at least three first molten steel samples from the LF furnace of the target steel and solidify them to obtain a first sample group; and to acquire at least three second molten steel samples from the VD furnace of the target steel and solidify them to obtain a second sample group.

[0071] The defect analysis module 200 is used to perform ultrasonic defect analysis on samples in the first sample group and the second sample group to obtain the number of first defects, the number of second defects and the number of third defects in each sample; the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the first defect is greater than the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the second defect is greater than the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the third defect.

[0072] The evaluation module 300 is used to obtain the purity evaluation index of each sample based on the number of first defects, second defects, and third defects of each sample according to the purity evaluation index calculation formula; the purity of the sample is evaluated using the purity evaluation index, wherein the larger the purity evaluation index, the worse the purity of the sample.

[0073] Regarding the apparatus in the above embodiments, the specific manner in which each module performs its operation has been described in detail in the embodiments related to the method, and will not be elaborated upon here.

[0074] III. This embodiment provides an electronic device intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device may also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices (e.g., helmets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the invention described and / or claimed herein.

[0075] like Figure 3As shown, the electronic device 10 includes at least one processor 11 and a memory, such as a read-only memory (ROM) 12 or a random access memory (RAM) 13, communicatively connected to the at least one processor 11. The memory stores computer programs executable by the at least one processor. The processor 11 can perform various appropriate actions and processes based on the computer program stored in the ROM 12 or loaded into the RAM 13 from storage unit 18. The RAM 13 can also store various programs and data required for the operation of the electronic device 10. The processor 11, ROM 12, and RAM 13 are interconnected via a bus 14. An I / O interface 15 is also connected to the bus 14.

[0076] Multiple components in electronic device 10 are connected to I / O interface 15, including: input unit 16, such as keyboard, mouse, etc.; output unit 17, such as various types of displays, speakers, etc.; storage unit 18, such as disk, optical disk, etc.; and communication unit 19, such as network card, modem, wireless transceiver, etc. Communication unit 19 allows electronic device 10 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks.

[0077] Processor 11 can be a variety of general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. Processor 11 performs the various methods and processes described above, such as methods for evaluating the purity of steel.

[0078] In some embodiments, the method for evaluating steel purity may be implemented as a computer program tangibly contained in a computer-readable storage medium, such as storage unit 18. In some embodiments, part or all of the computer program may be loaded and / or installed on electronic device 10 via ROM 12 and / or communication unit 19. When the computer program is loaded into RAM 13 and executed by processor 11, one or more steps of the steel purity evaluation method described above may be performed. Alternatively, in other embodiments, processor 11 may be configured to perform the steel purity evaluation method by any other suitable means (e.g., by means of firmware).

[0079] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), systems-on-a-chip (SoCs), payload-programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0080] Computer programs used to implement the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, such that when executed by the processor, the computer programs cause the functions / operations specified in the flowcharts and / or block diagrams to be performed. The computer programs may be executed entirely on a machine, partially on a machine, or as a standalone software package, partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0081] In the context of this invention, a computer-readable storage medium can be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, apparatus, or device. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination thereof. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0082] To provide interaction with a user, the systems and techniques described herein can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the electronic device. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0083] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as data servers), or middleware components (e.g., application servers), or frontend components (e.g., user computers with graphical user interfaces or web browsers through which users can interact with implementations of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., communication networks). Examples of communication networks include local area networks (LANs), wide area networks (WANs), blockchain networks, and the Internet.

[0084] A computing system can include clients and servers. Clients and servers are generally located far apart and typically interact through communication networks. The client-server relationship is created by computer programs running on the respective computers and having a client-server relationship with each other. The server can be a cloud server, also known as a cloud computing server or cloud host, which is a hosting product within the cloud computing service system to address the shortcomings of traditional physical hosts and VPS services, such as high management difficulty and weak business scalability.

[0085] The server provided in this embodiment includes: a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the program, it implements a method for evaluating the purity of steel.

[0086] Unless otherwise specifically stated, terms such as processing, calculation, operation, determination, display, etc., may refer to the actions and / or processes of one or more processing or computing systems or similar devices that represent the manipulation and conversion of data representing physical (e.g., electronic) quantities within the registers or memory of the processing system into other data similarly representing physical quantities within the memory, registers, or other such information storage, transmission, or display devices of the processing system. Information and signals can be represented using any of a variety of different techniques and methods. For example, data, instructions, commands, information, signals, bits, symbols, and chips mentioned throughout the above description can be represented by voltage, current, electromagnetic waves, magnetic fields or particles, light fields or particles, or any combination thereof.

[0087] Those skilled in the art will also understand that the various illustrative logic blocks, modules, circuits, and algorithm steps described in conjunction with embodiments of the present invention can all be implemented as electronic hardware, computer software, or a combination thereof. To clearly illustrate the interchangeability between hardware and software, the various illustrative components, blocks, modules, circuits, and steps described above are generally described in terms of their functionality. Whether this functionality is implemented as hardware or software depends on the specific application and the design constraints imposed on the overall system. Those skilled in the art can implement the described functionality in alternative ways for each specific application; however, such implementation decisions should not be construed as departing from the scope of protection of the present invention.

[0088] The steps of the methods or algorithms described in conjunction with the embodiments herein can be directly embodied in hardware, software modules executed by a processor, or a combination thereof. The software modules can reside in RAM memory, flash memory, ROM memory, EPROM memory, EEPROM memory, registers, hard disks, removable disks, CD-ROMs, or any other form of storage medium well known in the art. An exemplary storage medium is connected to the processor, enabling the processor to read information from and write information to the storage medium. Of course, the storage medium can also be a component of the processor. The processor and storage medium can reside in an ASIC. The ASIC can reside in a user terminal. Alternatively, the processor and storage medium can exist as discrete components in the user terminal.

[0089] For software implementation, the techniques described in this invention can be implemented using modules (e.g., procedures, functions, etc.) that perform the functions described in this application. This software code can be stored in memory units and executed by a processor. The memory units can be implemented within the processor or externally; in the latter case, they are communicatively coupled to the processor via various means, as is well known in the art.

[0090] IV. To illustrate the evaluation effect achievable by the steel purity evaluation method provided by this invention, the following example is used for explanation:

[0091] Example 1

[0092] This embodiment provides a method for evaluating the purity of high-carbon chromium bearing steel GCr15, as detailed below:

[0093] ① Sampling: Molten steel was directly extracted and solidified from the LF furnace of high carbon chromium bearing steel GCr15 and numbered LF1, LF2, and LF3. Molten steel was directly extracted and solidified from the VD furnace and numbered VD1, VD2, and VD3.

[0094] ② The above six process samples were tested using a water immersion ultrasonic testing system. The relevant test parameters were: probe frequency 30MHz, focal length 12.7mm, crystal diameter 6mm, scanning range 10mm×10mm, sampling rate 1GHz, step accuracy 40μm, and gain 23dB.

[0095] Using the same experimental parameters, ultrasonic analysis was performed on six process samples. Based on the absolute value of the echo signal amplitude of the internal defects in the material, the defect signals were divided into three levels: large, medium, and small, corresponding to the first, second, and third defects, respectively. Specifically, the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the first defect was greater than that of the second defect, which was greater than that of the third defect. The number N of defect echoes falling into each level was then determined. H N M and N L The statistics are shown in Table 1 below.

[0096] Table 1

[0097]

[0098] ③ For the first defect, the second defect, and the third defect, the weighting coefficients are set to 0.3, 0.2, and 0.1, respectively;

[0099] After obtaining the weight coefficients corresponding to the three defect levels, the number of defects at different levels statistically shown in Table 1 is substituted into the purity evaluation index formula for calculation. The purity evaluation indices corresponding to the six process samples in the steel smelting process are 6.58, 3.98, 3.45, 3.16, 2.83, and 3.81, respectively. It can be seen that the index shows a decreasing trend. The index of the last sample increases because the secondary oxidation of molten steel near the casting period causes an increase in non-metallic inclusions.

[0100] Furthermore, to highlight the advantages of the evaluation method of the present invention, the following comparative examples are used for illustration:

[0101] Comparative Example 1

[0102] The only difference from Example 1 is that the first defect is not counted in the defect analysis; in this case, the purity evaluation index S = (b × N) M +c×N H Since the first defect is not included in the calculation, the purity evaluation index is too small, which will make the purity evaluation result inflated. Even if the result that is not up to standard is recorded as up to standard, the final product quality will not meet the expectations, which is not conducive to product quality control.

[0103] Comparative Example 2

[0104] The only difference from Example 1 is that the second and third defects are not counted in the defect analysis. In this case, the purity evaluation index S = (a × N) L Since the first and second defects are not counted, the calculated purity evaluation index is significantly smaller, meaning there are fewer defects per unit measurement volume. This leads to an artificially high purity evaluation result, which may result in a non-compliant result being recorded as compliant. Consequently, the final product quality cannot meet expectations, which is detrimental to product quality control.

[0105] In summary, the evaluation method provided by this invention, by characterizing the spatial distribution of inclusions, makes the evaluation results more objective and accurate, which is conducive to ensuring the quality of steel leaving the factory; at the same time, the method of setting weight coefficients for different grades of inclusions is more comprehensive; and it can provide a theoretical basis for classifying the grades of inclusions inside metallic materials.

[0106] The present invention is described in detail through the above embodiments, but the present invention is not limited to the above detailed structural features, that is, it does not mean that the present invention must rely on the above detailed structural features to be implemented. Those skilled in the art should understand that any improvements to the present invention, equivalent substitutions for the components used in the present invention, additions of auxiliary components, and selection of specific methods, etc., all fall within the protection scope and disclosure scope of the present invention.

[0107] The preferred embodiments of the present invention have been described in detail above. However, the present invention is not limited to the specific details in the above embodiments. Within the scope of the technical concept of the present invention, various simple modifications can be made to the technical solution of the present invention, and these simple modifications all fall within the protection scope of the present invention.

[0108] It should also be noted that the various specific technical features described in the above specific embodiments can be combined in any suitable manner without contradiction. In order to avoid unnecessary repetition, the present invention will not describe the various possible combinations separately.

[0109] Furthermore, various different embodiments of the present invention can be combined in any way, as long as they do not violate the spirit of the present invention, they should also be regarded as the content disclosed by the present invention.

Claims

1. A method for evaluating the purity of steel, characterized in that, The evaluation methods include: At least three first molten steel samples were obtained from the LF furnace of the target steel and solidified to obtain the first sample group; At least three second molten steel samples were obtained from the VD furnace of the target steel and solidified to obtain a second sample group; Ultrasonic defect analysis was performed on the samples in the first and second sample groups to obtain the number of first defects, second defects, and third defects in each sample; the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the first defect is greater than the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the second defect, which is greater than the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the third defect. The purity evaluation index of each sample is obtained based on the number of first defects, second defects, and third defects of each sample according to the purity evaluation index calculation formula. The purity of a sample is evaluated using a purity evaluation index, where a higher purity evaluation index indicates a lower purity of the sample.

2. The evaluation method as described in claim 1, characterized in that, The ultrasonic defect analysis methods include: water immersion ultrasonic testing and analysis.

3. The evaluation method as described in claim 1, characterized in that, The first defect includes: the absolute value of the echo signal amplitude in ultrasonic defect analysis is ≥44.5dB.

4. The evaluation method as described in claim 1, characterized in that, The second defect includes: defects in ultrasonic defect analysis where the absolute value of the echo signal amplitude is between 40 and 44.5 dB, excluding 44.5 dB.

5. The evaluation method as described in claim 1, characterized in that, The third defect includes: defects in ultrasonic defect analysis where the absolute value of the echo signal amplitude is between 35-40dB, excluding 40dB.

6. The evaluation method as described in claim 1, characterized in that, The formula for calculating the purity evaluation index is as follows: S=(a×N L +b×N M +c×N H ) / V; In the formula, S is the purity evaluation index; N L denoted as , where is the number of echoes from the first defect in the sample; 'a' is the weighting coefficient for the first defect; N M denoted as , where is the number of echoes from the second defect in the sample; b is the weighting coefficient for the second defect; N H denoted as , where is the number of echoes from the third defect in the sample; c is the weighting coefficient of the third defect; and V is the volume of the sample analyzed for ultrasonic defects.

7. The evaluation method as described in claim 1, characterized in that, The controlled frequency in the ultrasonic defect analysis is 25-35MHz; Preferably, the focal length is controlled to be 12-13 mm in the ultrasonic defect analysis; Preferably, the diameter of the control wafer in the ultrasonic defect analysis is 5-7 mm; Preferably, the sampling rate in the ultrasonic defect analysis is controlled at 1-2 GHz; Preferably, the stepping accuracy in the ultrasonic defect analysis is controlled to be 35-45 μm; Preferably, the control gain in the ultrasonic defect analysis is 20-25 dB.

8. A device for evaluating the purity of steel, characterized in that, The evaluation device includes: The sample acquisition module is used to acquire at least three first molten steel samples from the LF furnace of the target steel and solidify them to obtain a first sample group; and to acquire at least three second molten steel samples from the VD furnace of the target steel and solidify them to obtain a second sample group. The defect analysis module is used to perform ultrasonic defect analysis on samples in the first sample group and the second sample group to obtain the number of first defects, the number of second defects, and the number of third defects in each sample; the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the first defect is greater than the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the second defect, which is greater than the absolute value of the echo signal amplitude in the ultrasonic defect analysis of the third defect. The evaluation module is used to obtain the purity evaluation index of each sample based on the number of first defects, second defects, and third defects according to the purity evaluation index calculation formula. The purity of the sample is evaluated using the purity evaluation index, where the larger the purity evaluation index, the worse the purity of the sample.

9. An electronic device, characterized in that, The electronic device includes: At least one processor; and a memory communicatively connected to said at least one processor; The memory stores a computer program that can be executed by the at least one processor, which enables the at least one processor to perform the method for evaluating the purity of steel according to any one of claims 1-7.

10. A computer storage medium, characterized in that, The computer storage medium stores computer-executable instructions, which, when executed by a processor, implement the steel purity evaluation method according to any one of claims 1-7.

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