A testing device for power chip production

Abstract

The application relates to the technical field of chip testing, and discloses a testing device for power chip production, which comprises a testing fixture platform, a testing seat arranged on the testing fixture platform and provided with a contact area below, a continuous carrier formed by a closed-loop conveying belt matched with equidistant arrangement holes, linkage structure for converting the vertical lifting movement of a sealing gland into intermittent equidistant pushing of the conveying belt, automatic material replacement when the sealing gland is opened, elimination of idle time of the instrument, construction of a flow line type continuous testing rhythm, and substantial improvement of the production test efficiency of the power chip; meanwhile, the gas in the lifting compression guide rod of the sealing gland is utilized to realize pre-blowing and dust removal before chip testing, a surrounding air curtain barrier is formed in the testing area, poor contact of the probe caused by dust is effectively avoided, the cleaning frequency of the production line is reduced, and the stable and reliable testing yield is ensured.

Description

Technical Field

[0001] This invention relates to the field of chip testing technology, specifically to a testing device for power chip production. Background Technology

[0002] In the packaging and testing back-end process of power management chips, the screening of electrical performance parameters is the key to distinguishing good products from defective products; existing production lines are generally equipped with a manual flip-type test fixture for small-batch or sampling tests.

[0003] The typical workflow for this type of fixture is as follows: the operator uses tweezers or a suction pen to pick up a single chip and places it into the positioning groove on the base, ensuring that the bottom pads of the chip are aligned with the probe contacts in the groove; then the sealing cover is manually flipped over, and the chip is pressed down by the rigid pressure block inside the sealing cover; finally, the switch is manually turned on to start the test; after the test is completed, the above actions must be reversed to remove the chip.

[0004] Although the above structure is simple, it adopts a single-station, single-clamping structure. After a chip is tested, it is necessary to wait for the manual completion of a complete cycle of opening the cover, picking up the material, purging, putting in new material, and closing the cover before the testing instrument can be restarted. For power chips that only require a few hundred milliseconds for testing, the effective utilization rate of the instrument is low, and it is impossible to build a pipeline-style continuous testing cycle, which seriously restricts the mass production throughput. Summary of the Invention

[0005] The purpose of this invention is to provide a testing device for power chip manufacturing, so as to solve the problems mentioned in the background art.

[0006] To achieve the above objectives, the present invention provides the following technical solution: a testing device for power chip production, comprising: a testing fixture platform; a testing seat disposed on the testing fixture platform, wherein a contact area is provided in the lower part of the testing seat; a sealing cover disposed vertically on the upper part of the testing seat, wherein the lower end of the sealing cover is protruding and fits into the inner cavity of the testing seat to press the chip; and auxiliary components disposed on the testing fixture platform, including a conveying component embedded in the testing fixture platform for continuous testing, a linkage component disposed on one side of the sealing cover to follow its vertical movement and control the conveying component to equidistantly convey the chip into the testing seat, and a cleaning component located between the testing seat and the sealing cover to achieve dust removal of the chip testing surface and testing area through a closing operation.

[0007] Preferably, the auxiliary component further includes a hydraulic push rod, which is positioned directly above the sealing cover via a bracket fixed to the test fixture platform, with its telescopic end fixed to the sealing cover to control the lifting and lowering of the sealing cover.

[0008] Preferably, the conveying component includes: a recessed seat, embedded and vertically sliding in the test fixture platform; a conveyor belt, embedded and sliding in the recessed seat, having a closed-loop design, with its upper center located in the test fixture; a number of mounting holes, equidistantly spaced on the surface of the conveyor belt, to support chip movement; and two support plates, respectively located on both sides of the upper part of the recessed seat, inside the conveyor belt, to support the conveyor belt.

[0009] Preferably, the conveyor further includes: four spring seats, which are respectively fixed at the four corners of the lower part of the sinking seat, and the other end of the spring seats is fixed to the inner wall of the test fixture platform to realize vertical compensation of the conveyor belt on the sinking seat within the test seat.

[0010] Preferably, the conveying component further includes: two compensation rings, which are respectively disposed in the perforations on both sides of the test seat for the conveyor belt to pass through, and are fitted onto the surface of the conveyor belt; and four folding plates, which are respectively fixed to the upper and lower parts of the two compensation rings, with the side of the plate closest to the test seat fixed to the inner wall of the test seat to achieve dynamic closure when the conveyor belt moves vertically.

[0011] Preferably, the auxiliary component further includes: two linkage brackets, which are respectively disposed on both sides of the sealing cover. The cross-sectional shape of the linkage brackets is an inverted L-shaped design to follow the vertical displacement of the sealing cover; wherein, when the inner side of the sealing cover contacts the upper end of the conveyor belt, the lower end of the linkage bracket contacts the sink seat.

[0012] Preferably, the linkage includes: a linkage rod, rotatably connected to one side of the sealing cap via a rotating shaft, with its lower end corresponding to the upper part of the conveyor belt; a sliding seat, rotatably connected to the lower end of the linkage rod, which slides horizontally on the upper part of the conveyor belt; a one-way buckle, rotatably connected to the sliding seat via a rotating shaft; and several overlapping holes, equidistantly located on the side of the conveyor belt surface, with the inner wall of the overlapping hole corresponding to the one-way buckle contacting the one-way buckle, so as to pull the conveyor belt into the test seat when the sealing cap rises.

[0013] Preferably, the linkage further includes: two grooves, which are respectively opened in front of and behind the support plate on one side of the linkage rod; and a sliding block that slides horizontally in the groove, with its outer side fixed to the inner wall of the sliding seat.

[0014] Preferably, the cleaning component includes: four guide rods, which are respectively embedded in the four corners inside the test seat, and their other ends are fixed to the sealing cap; wherein the guide rods are telescopic sleeves.

[0015] Preferably, the cleaning component further includes: a guide cover, embedded on one side of the test base relative to the loading area, whose air inlet is connected to the air outlet of the four guide rods through an air pipe, and whose overall design is inclined, with the air outlet direction corresponding to the lower part of the test placement hole of the conveyor belt; and a dust removal sleeve, fixed to the surface of the test base, whose air inlet is connected to the air outlet of the four guide rods through an air pipe, and whose surface has several air outlets evenly distributed, used to cooperate with the guide cover to blow air to prevent dust on the chip test surface and test area of ​​the lower station when the sealing cover and the test base are closed.

[0016] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0017] This invention utilizes a closed-loop conveyor belt with equidistant mounting holes in the conveyor to form a continuous carrier. Through the linkage mechanism, including a connecting rod, sliding seat, one-way buckle, and overlapping holes on the conveyor belt side, the vertical lifting motion of the sealing cap is transformed into an intermittent, equidistant pushing motion of the conveyor belt. This allows the linkage mechanism to simultaneously pull the conveyor belt forward one station when the previous chip is tested and the sealing cap rises to open the mold, automatically feeding the next chip into the test chamber. This effectively eliminates instrument downtime, establishes a continuous testing cycle, and improves the throughput of mass production testing of power chips.

[0018] During the sealing cap descent and test socket closure process, the guide rod, acting as a telescopic sleeve, is compressed. The gas inside is guided by the air tube to the guide cover, which can pre-purge and remove dust from the chip test surface before the chip enters the test socket. Another part of the gas is discharged through the air holes of the dust removal cover, which can form a surrounding air blowing barrier for the test area. This can effectively prevent intermittent poor contact caused by dust and debris embedded in the probe contacts, greatly reduce the frequency of production line shutdowns due to probe cleaning, and ensure the authenticity and stability of test yield data. Attached Figure Description

[0019] Figure 1 A schematic diagram of the main structure of the testing device for power chip production provided by the present invention;

[0020] Figure 2 A schematic diagram of the structure of the auxiliary component provided by the present invention;

[0021] Figure 3 A schematic diagram of a half-section of the sunken seat in the conveyor provided by the present invention;

[0022] Figure 4 A partial structural schematic diagram of the sealing gland and test seat provided by the present invention;

[0023] Figure 5 A partial structural schematic diagram of the conveying component provided by the present invention;

[0024] Figure 6 A cross-sectional schematic diagram of the sliding seat structure of the linkage component provided by the present invention;

[0025] Figure 7 This is a structural disassembly diagram of the cleaning component provided by the present invention;

[0026] Figure 8 A cross-sectional view of the test fixture provided by the present invention;

[0027] Figure 9 Provided by the present invention Figure 8 Enlarged structural diagram at point A;

[0028] Figure 10 A schematic diagram of the initial state structure of the linkage bracket provided by the present invention;

[0029] Figure 11 This is a schematic diagram of the linkage bracket provided by the present invention, which moves downward with the sealing cover.

[0030] In the diagram: 100, Test fixture platform; 110, Sealing cap; 120, Test seat; 200, Auxiliary components; 210, Hydraulic push rod; 220, Linkage bracket; 230, Conveying component; 231, Sinking seat; 232, Support plate; 233, Spring seat; 234, Conveyor belt; 235, Mounting hole; 236, Folding plate; 237, Compensating ring; 240, Linkage component; 241, Linking rod; 242, Sliding seat; 243, One-way buckle; 244, Groove; 245, Sliding block; 246, Overlap hole; 250, Cleaning component; 251, Guide rod; 252, Guide cover; 253, Dust collector sleeve. Detailed Implementation

[0031] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0032] Please see Figure 1 - Figure 11As shown, a testing device for power chip production includes: a test fixture platform 100; a test socket 120 disposed on the test fixture platform 100, with a contact area disposed in the lower part of the test socket 120; a cavity that extends vertically through the test socket 120 to accommodate the chip under test; a contact area composed of high-precision elastic probes disposed in the lower part of the cavity; the electrical leads of the contact area are electrically connected to external testing instruments to provide excitation signals to the chip and collect feedback parameters; it should be noted that a probe fixing plate is embedded in the base of the test socket 120, and high-precision elastic probes are arranged in an array on the probe fixing plate; the tips of the probes are slightly higher than the upper surface of the base so as to preferentially contact the bottom pads of the chip when the chip is lowered.

[0033] The sealing cap 110 is vertically set on the upper part of the test socket 120. Its lower end is designed to protrude and fit into the inner cavity of the test socket 120. During the descent, it can be inserted into the test socket 120 in a gap fit manner, thereby applying a uniform and accurately positioned vertical clamping force to the chip placed inside the test socket 120, ensuring a stable and reliable electrical connection between the chip bottom pad and the contact area.

[0034] The auxiliary component 200 is disposed on the test fixture platform 100 and includes a conveyor 230 embedded in the test fixture platform 100 for continuous testing, a linkage component 240 disposed on one side of the sealing cover 110 to follow its vertical movement and control the conveyor 230 to convey the chip equidistantly into the test holder 120, and a cleaning component 250 located between the test holder 120 and the sealing cover 110 to achieve dust removal operation on the chip test surface and test area through the closing operation.

[0035] The auxiliary component 200 also includes a hydraulic push rod 210, which is mounted directly above the sealing cover 110 via a bracket fixed on the test fixture platform 100. Its telescopic end is fixed to the sealing cover 110 to control the lifting and lowering of the sealing cover 110. The piston telescopic end of the hydraulic push rod 210 is vertically downward and rigidly connected to the center of the top of the sealing cover 110. Under the control command of the test program, the hydraulic push rod 210 provides continuous and stable downward pressure or upward lifting force, so that the sealing cover 110 can be smoothly lifted and lowered along the vertical axis, completely eliminating the contact resistance dispersion problem caused by uneven human operation force, and providing power for the subsequent linkage action of various mechanisms.

[0036] The conveyor 230 includes: a recessed seat 231, embedded and vertically sliding in the test fixture platform 100; a conveyor belt 234, embedded and sliding in the recessed seat 231, forming a closed-loop design, with its upper center located in the test seat 120, and made entirely of a flexible, wear-resistant material; and several mounting holes 235, equidistantly spaced on the surface of the conveyor belt 234, to support chip movement. The size of each mounting hole 235 is adapted to the chip package shape to accommodate a single power chip and restrict its horizontal movement. The movement of the chip is controlled by the chip. Two support plates 232 are respectively set on both sides of the upper part of the sink 231, located inside the conveyor belt 234, to support the conveyor belt 234. In order to support the upper part of the conveyor belt 234 and keep it flat to prevent the chip from tilting or falling off during the transmission, two flat support plates 232 are also fixed on the upper inner part of the sink 231 and corresponding to the inner position of the conveyor belt 234. The upper surface of the support plate 232 slides and fits against the inner surface of the conveyor belt 234, providing solid bottom support.

[0037] The conveyor 230 also includes: four spring seats 233, which are fixed to the four corners of the lower part of the sink seat 231, and the other end of the spring seats 233 is fixed to the inner wall of the test fixture platform 100, so as to realize the vertical compensation of the conveyor belt 234 on the sink seat 231 within the test seat 120; when the downward pressure applied by the sealing cover 110 is transmitted to the conveyor belt 234 through the chip, the conveyor belt 234 and the sink seat 231 can overcome the elasticity of the spring seats 233 and move downward a small distance as a whole. This distance just compensates for the chip thickness tolerance and the compression stroke of the contact probe.

[0038] The conveyor component 230 further includes: two compensation rings 237, each disposed in a perforation on both sides of the test base 120 through which the conveyor belt 234 passes, and the entire rings are fitted onto the surface of the conveyor belt 234; four folding plates 236, each fixed to the upper and lower parts of the two compensation rings 237, with the side closest to the test base 120 fixed to the inner wall of the test base 120 to achieve dynamic closure when the conveyor belt 234 moves vertically; simultaneously, to prevent the conveyor belt 234 from rubbing and getting stuck against the perforation walls on both sides of the test base 120 during vertical movement, and to prevent dust from the external environment from entering the test chamber through the perforations, this device has a dynamic closure structure at the perforations on both sides of the test base 120 through which the conveyor belt 234 passes; this structure includes compensation rings 237 fitted onto the surface of the conveyor belt 234, and folding plates 236 connected to the upper and lower parts of the compensation rings 237 respectively. A folded plate 236 is placed between the edge and the inner wall of the perforation in the test seat 120. The folded plate 236 is made of a thin-walled, pleated material with good elasticity. When the conveyor belt 234 moves up and down with the sinker 231, the folded plate 236 can freely extend or compress, always maintaining a tight seal over the perforation gap, ensuring both the flexibility of movement and a reliable dust barrier. It should be noted that the folded plate 236 can be made of polyurethane or silicone rubber, with a thickness of approximately 0.3 to 0.5 millimeters. The folded shape of the folded plate 236 is a continuous V-shape, which tends to stretch to both sides in its natural state. The extension stroke of the folded plate 236 is designed to be no less than the maximum vertical sinking of the sinker 231. For example, when the maximum sinking is 2 millimeters, the allowable extension stroke of the folded plate 236 should be no less than 3 millimeters to ensure that tearing does not occur under extreme working conditions.

[0039] The auxiliary component 200 also includes two linkage brackets 220, which are respectively located on both sides of the sealing cover 110. The linkage brackets have an inverted L-shaped cross-section to follow the vertical displacement of the sealing cover 110. When the inner side of the sealing cover 110 contacts the upper end of the conveyor belt 234, the lower end of the linkage bracket 220 contacts the sinker 231. During the descent of the sealing cover 110 driven by the hydraulic push rod 210, the linkage bracket 220 descends along with it. The relative distance between the lower end face of the linkage bracket 220 and the upper surface of the sinker 231 is precisely set in the design, so that when the sealing cover 110 moves down to the moment its lower protrusion just contacts the upper surface of the conveyor belt 234 without generating substantial downward pressure, the lower end face of the linkage bracket 220 contacts the upper surface of the sinker 231. This provides a precise mechanical reference for subsequent pressing and sinking linkage.

[0040] The linkage 240 includes: a linkage rod 241, rotatably connected to one side of the sealing cover 110 via a rotating shaft, with its lower end corresponding to the upper part of the conveyor belt 234; a sliding seat 242, rotatably connected to the lower end of the linkage rod 241, and sliding horizontally on the upper part of the conveyor belt 234; a one-way latch 243, rotatably connected to the sliding seat 242 via a rotating shaft; and several overlapping holes 246, equidistantly located on the sides of the surface of the conveyor belt 234, corresponding to... The inner wall of the overlapping hole 246 corresponding to the one-way latch 243 contacts the one-way latch 243 to achieve the following when the sealing cap 110 rises: it pulls the conveyor belt 234 into the test seat 120. When the sealing cap 110 is in the rising stroke, the linkage rod 241 pushes the sliding seat 242 to slide towards the conveyor belt 234. At this time, the lower end of the one-way latch 243 just fits into the inner edge of the overlapping hole 246. The continued forward movement of the sliding seat 242 is achieved through the one-way latch 243. The meshing force of the interlocking hole 246 forcibly pulls the conveyor belt 234 forward by a fixed station interval, so that the next chip under test, carried in the placement hole 235, is precisely pulled into the test socket 120 for standby. When the sealing cover 110 rotates to the lower stroke, the linkage rod 241 pulls the sliding seat 242 to reset in the opposite direction. At this time, the one-way buckle 243, due to its sloping back design, will slide out along the edge of the interlocking hole 246 and pass over the hole. This will not cause reverse dragging interference to the conveyor belt 234, ensuring the reliability of the unidirectional stepping of the conveyor belt 234. It should be noted that a miniature torsion spring is set at the hinge shaft of the unidirectional latch 243. One end of the torsion spring abuts against the inner wall of the sliding seat 242, and the other end abuts against the side of the unidirectional latch 243, providing a small pre-pressure to ensure that the unidirectional latch 243 can quickly fall into the overlap hole 246 under the combined action of gravity and elasticity, improving the reliability of the action response.

[0041] The linkage 240 also includes: two grooves 244, which are respectively opened in front of and behind the support plate 232 on one side of the linkage 241; and a sliding block 245, which slides horizontally in the grooves 244 and whose outer side is fixed to the inner wall of the sliding seat 242. Through the cooperation between the grooves 244 and the sliding block 245 fixed to the inner side of the sliding seat 242, the limitation that the sliding seat 242 can only move horizontally back and forth along the conveying direction of the conveyor belt 234 is realized.

[0042] The cleaning component 250 includes: four guide rods 251, each embedded in one of the four corners of the test base 120, with its other end fixed to the sealing cap 110; each guide rod 251 is a telescopic sleeve, forming a sealed gas compression chamber inside; a guide cover 252, embedded on one side of the test base 120 opposite to the loading area, its air inlet end connected to the air outlet end of the four guide rods 251 via an air pipe, its overall design being inclined, with the air outlet direction corresponding to the area below the test placement hole 235 of the conveyor belt 234; and a dust collector sleeve 253, fixed to the surface of the test base 120, its air inlet end connected to the air outlet end of the four guide rods 251 via an air pipe, and its surface evenly distributed with several air outlet holes. The guide rods 251 are used to blow air to prevent dust from the chip test surface and test area at the lowering station when the sealing cover 110 and test base 120 are closed, in conjunction with the guide cover 252. When the sealing cover 110 descends, the guide rods 251 are axially compressed, the internal volume of the chamber decreases, and the internal air is forced out. The air outlets of the four guide rods 251 are diverted through the air pipes, and a portion of the gas is guided to the guide cover 252 fixed to the loading side wall of the test base 120. The outlet of the guide cover 252 is flat and duckbill-shaped, and is tilted upwards to align with the bottom surface of the chip that is about to enter the test station in the conveyor belt 234. Before the sealing cover 110 is pressed down and the conveyor belt 234 has fully descended, the guide rods 251... The high-speed airflow squeezed out from inside 251 first exits from guide cover 252, forming an oblique air curtain that blows away the tiny lint or dust adhering to the chip bottom pads during the transfer process, completing the pre-cleaning of the test surface; another part of the gas is transported through pipeline to an annular dust removal sleeve 253 surrounding and fixed to the edge of the opening on the upper surface of the test holder 120; the inner ring wall of the dust removal sleeve 253 is evenly and densely covered with micro air outlets; at the extremely short instant when the sealing cover 110 finally closes with the upper surface of the test holder 120, guide rod 251 is compressed to its limit, and compressed gas is simultaneously and violently ejected from each air outlet of the dust removal sleeve 253, at the sealing cover 110 and the test holder 120 A ring-shaped air curtain is formed at the closed gap, effectively preventing ambient dust raised by air pressure disturbances when the sealing cap 110 closes from falling into the test chamber, thus achieving dynamic clean protection of the contact area. It should be noted that an air inlet is provided on the side wall of the outer sleeve of the guide rod 251 near the top, and a one-way air inlet valve is installed at the air inlet. When the sealing cap 110 rises and the guide rod 251 is stretched, the volume of the chamber increases, generating negative pressure. The one-way air inlet valve opens, and outside air is drawn into the chamber. When the sealing cap 110 descends and the guide rod 251 is compressed, the one-way air inlet valve closes, and the gas in the chamber can only be discharged from the outlet, ensuring the directional output of the purging airflow.

[0043] Working principle: Before starting the test operation, the operator only needs to use a vacuum pen or tweezers to place the power chip to be tested one by one into the empty placement hole 235 in the loading area of ​​the conveyor belt 234 at the loading station of the device.

[0044] After the test program is started, the hydraulic push rod 210 fixed to the top of the bracket receives the control command, and its telescopic end begins to extend downward, pushing the sealing cover 110 fixed to it to move smoothly down along the vertical guide column; in the initial stage of the downward movement of the sealing cover 110, the upper end of the linkage rod 241 fixed to one side of the sealing cover 110 also descends, and the lower end drives the sliding seat 242 and its internal one-way buckle 243 to slide along the groove 244 on the side of the support plate 232 in the reset direction; during this reset stroke, the one-way buckle 243, due to its one-way sliding characteristic on the back, will lightly touch the upper edge of the overlapping hole 246 on the side of the conveyor belt 234 and slide out in the same direction. At this time, the conveyor belt 234 body remains stationary and is in the test waiting state;

[0045] As the hydraulic push rod 210 continues to advance, the bottom surface of the protruding part at the lower end of the sealing cover 110 begins to contact the upper surface of the conveyor belt 234. At this time, the chip located in the placement hole 235 of the conveyor belt 234 is initially confined inside the cavity of the test holder 120. At the same time, the telescopic guide rods 251 fixed at the four corners of the sealing cover 110 begin to be compressed, reducing their internal volume. The air inside the cavity is guided to the guide cover 252 and the dust removal sleeve 253 through the internal air passage. At this time, a portion of the gas enters the guide cover 252 and is directed to the bottom surface of the chip that is about to move down to the test depth through its inclined duckbill-shaped outlet, and the airflow is sprayed. The airflow sweeps over the metal pad area on the bottom surface of the chip, blowing away the tiny dust particles that may be electrostatically adsorbed during the flow process downstream, ensuring that the test surface is clean before the chip comes into contact with the contacts.

[0046] At the same moment that the sealing cover 110 contacts the upper surface of the conveyor belt 234, the lower end face of the linkage bracket 220 on both sides of the sealing cover 110 also just touches the upper surface edge of the sinker 231; at this time, there is still a noticeable gap between the sealing cover 110 and the upper end face of the test seat 120. The vertical height of the gap is precisely designed to be exactly equal to the sinking stroke allowed by the sinker 231, and also equal to the contact distance between the chip test surface and the bottom contact area.

[0047] The hydraulic push rod 210 continues to apply downward thrust. Since the test seat 120 is rigidly fixed on the test fixture platform 100, its position will not change. Therefore, the subsequent force is transmitted to the sinking seat 231 through the linkage bracket 220. The linkage bracket 220 begins to forcefully compress the sinking seat 231 to overcome the elastic support force of the four spring seats 233 at the bottom, driving the entire conveyor belt 234 and the chip it supports to sink vertically into the inner cavity of the test seat 120. During this sinking process, the folding plates 236 on the compensation rings 237 on both sides of the conveyor belt 234 are compressed accordingly, always maintaining a dynamic seal on the perforation of the test seat 120.

[0048] When the sinker 231 moves downward to its limit position, that is, when its bottom surface contacts the limiting surface of the inner cavity of the test fixture platform 100, the sinking movement stops. At this time, the chip bottom pad in the mounting hole 235 on the conveyor belt 234 is pressed against the probe contact area inside the lower part of the test holder 120 with a preset standard pressure, realizing a stable and reliable electrical connection. At the same time, the lower end face of the sealing cover 110 also moves synchronously to a position where it is completely closed with the upper end face of the test holder 120. At the moment of closure, the guide rod 251 is compressed to its shortest limit state, and the last burst of compressed gas inside is forced into the dust removal sleeve 253 surrounding the edge of the opening of the test holder 120, and violently ejected through the densely distributed micropores in its inner ring, forming an outwardly diverging annular air curtain at the closed gap; effectively preventing suspended dust in the environment from drifting into the test area.

[0049] With the sealing cap 110 closed, the chip pressed tightly, and the dust removal operation completed, external testing instruments apply electrical signals to the chip through the contact area and read the feedback data, completing the millisecond-level rapid determination of the chip's electrical performance parameters.

[0050] When the testing system sends a signal indicating test completion, the telescopic end of the hydraulic push rod 210 begins to retract upwards, causing the sealing cover 110 to rise vertically. In the initial stage of the sealing cover 110's ascent, the pressure on the sinker 231 is released. Under the elastic restoring force of the four spring seats 233 at the bottom, the sinker 231 causes the conveyor belt 234 and the tested chip to float upwards, separating the bottom surface of the chip from the contact area. As the sealing cover 110 continues to rise, the guide rod 251 gradually stretches and resets, drawing in outside air in preparation for the next compression. Simultaneously, the rising of the sealing cover 110 drives the linkage rod 241 and... The sliding seat 242 moves in the conveying direction; at this time, the one-way buckle 243 inside the sliding seat 242 falls into the corresponding overlapping hole 246 on the side of the conveyor belt 234. As the sealing cover 110 continues to rise, the one-way buckle 243 hooks onto the edge of the overlapping hole 246, forcibly dragging the conveyor belt 234 forward precisely by one station distance; so that the chip that has just completed the test is moved out of the test seat 120 and enters the unloading area, while the placement hole 235 that carries the next chip to be tested is precisely pulled into the test station in the test seat 120, completing the automatic switching between the old and new stations;

[0051] As the hydraulic push rod 210 reciprocates, the above actions will be executed automatically in a cyclical manner. Operators only need to continuously replenish materials at the feeding end to achieve continuous, dust-free, and highly reliable production line testing of power chips.

[0052] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0053] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A testing device for power chip manufacturing, characterized in that, include: Test fixture platform (100); The test socket (120) is set on the test fixture platform (100), and a contact area is provided in its lower part; A sealing cap (110) is vertically positioned on the upper part of the test socket (120), with its lower end protruding and fitting into the inner cavity of the test socket (120) to press the chip firmly. The auxiliary component (200) is disposed on the test fixture platform (100) and includes a conveyor (230) embedded in the test fixture platform (100) for continuous testing, a linkage (240) disposed on one side of the sealing cover (110) to follow its vertical movement and control the conveyor (230) to equidistantly convey the chip into the test holder (120), and a cleaning component (250) located between the test holder (120) and the sealing cover (110) to achieve dust removal operation on the chip test surface and test area through the closing operation.

2. The testing device for power chip production according to claim 1, characterized in that: The auxiliary component (200) also includes: The hydraulic push rod (210) is positioned directly above the sealing cover (110) via a bracket fixed on the test fixture platform (100), and its telescopic end is fixed to the sealing cover (110) to control the lifting and lowering of the sealing cover (110).

3. The testing device for power chip production according to claim 1, characterized in that: The conveying component (230) includes: The recessed seat (231) is embedded in and slides vertically in the test fixture platform (100); The conveyor belt (234) is embedded and slides within the recessed seat (231), and its overall design is a closed loop, with the upper middle part located in the test seat (120); The mounting holes (235) are provided in several quantities and are equally spaced on the surface of the conveyor belt (234) to support the movement of the chip; There are two support plates (232), which are respectively set on both sides of the upper part of the sinker (231) and located inside the conveyor belt (234) to support the conveyor belt (234).

4. The testing apparatus for power chip manufacturing according to claim 3, characterized in that: The conveying component (230) also includes: Four spring seats (233) are provided and are fixed to the four corners of the lower part of the sink seat (231). The other end of the spring seats is fixed to the inner wall of the test fixture platform (100) so as to realize the vertical compensation of the conveyor belt (234) on the sink seat (231) in the test seat (120).

5. The testing apparatus for power chip manufacturing according to claim 3, characterized in that: The conveying component (230) also includes: Two compensation rings (237) are provided, and are respectively provided in the perforations on both sides of the test seat (120) for the conveyor belt (234) to pass through. The whole ring is sleeved on the surface of the conveyor belt (234). Four folding plates (236) are provided and are fixed to the upper and lower parts of the two compensation rings (237) respectively. The side of the plate closest to the test seat (120) is fixed to the inner wall of the test seat (120) to achieve dynamic closure when the conveyor belt (234) moves vertically.

6. The testing apparatus for power chip manufacturing according to claim 1, characterized in that: The auxiliary component (200) also includes: There are two linkage brackets (220), which are respectively set on both sides of the sealing cover (110). Their cross-sectional shape is an inverted L-shaped design to follow the vertical displacement of the sealing cover (110). When the inner side of the sealing cap (110) contacts the upper end of the conveyor belt (234), the lower end of the linkage bracket (220) contacts the sinker (231).

7. The testing apparatus for power chip manufacturing according to claim 1, characterized in that: The linkage (240) includes: The linkage rod (241) is rotatably connected to one side of the sealing cover (110) via a rotating shaft, and its lower end corresponds to the upper part of the conveyor belt (234); The sliding seat (242) is rotatably connected to the lower end of the connecting rod (241) and slides horizontally on the upper part of the conveyor belt (234); A one-way buckle (243) is rotatably connected to the sliding seat (242) via a pivot. The number of overlapping holes (246) is set in several and is equally spaced on the side of the surface of the conveyor belt (234). The inner wall of the overlapping hole (246) corresponding to the one-way buckle (243) contacts the one-way buckle (243) so that when the sealing cover (110) rises, it pulls the conveyor belt (234) into the test seat (120) to advance to the work station.

8. The testing apparatus for power chip manufacturing according to claim 7, characterized in that: The linkage (240) also includes: There are two grooves (244), which are respectively opened in front of and behind the support plate (232) on one side of the linkage (241); The sliding block (245) slides horizontally within the groove (244), and its outer side is fixed to the inner wall of the sliding seat (242).

9. The testing apparatus for power chip manufacturing according to claim 1, characterized in that: The cleaning component (250) includes: There are four guide rods (251), which are respectively embedded in the four corners of the test seat (120), and their other ends are fixed to the sealing cap (110); Among them, the guide rod (251) is a telescopic sleeve.

10. A testing apparatus for power chip manufacturing according to claim 9, characterized in that: The cleaning component (250) also includes: The guide cover (252) is embedded on one side of the test seat (120) relative to the feeding area. Its air inlet is connected to the air outlet of the four guide rods (251) through an air pipe. Its overall design is inclined, and the air outlet direction corresponds to the area below the test placement hole (235) of the conveyor belt (234). The dust removal sleeve (253) is fixed on the surface of the test base (120). Its air inlet end is connected to the air outlet end of the four guide rods (251) through the air pipe. Its surface has several air outlet holes evenly distributed, which are used to cooperate with the guide cover (252) to blow air to prevent dust on the chip test surface and test area of ​​the lower station when the sealing cover (110) and the test base (120) are closed.

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