Thickness measurement method, system, and electronic device

Abstract

This application relates to the field of nuclear power technology and provides a thickness measurement method, system, and electronic equipment, including: acquiring a background radiation signal transmitted by a detector and determining the background radiation intensity based on the background radiation signal; acquiring a first ray signal transmitted by the detector and determining a first ray intensity based on the first ray signal; acquiring a second ray signal transmitted by the detector and determining a second ray intensity based on the second ray signal; acquiring the linear attenuation coefficient of the object being measured; and determining the thickness of the object being measured based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient of the object being measured. This method helps to improve the accuracy of the determined thickness of the object being measured.

Description

Technical Field

[0001] This application belongs to the field of nuclear power technology, and in particular relates to thickness measurement methods, systems, electronic devices, computer-readable storage media, and computer program products. Background Technology

[0002] A nuclear power plant is a facility that converts nuclear energy into electrical energy. It includes the nuclear island, the conventional island, and auxiliary facilities. The nuclear island and the conventional island, as well as the nuclear island and the auxiliary facilities, are connected by pipelines. Any abnormalities in these pipelines (or the welds on them) have a significant impact on the safety of the nuclear power plant.

[0003] To improve the safety of nuclear power plants, it is necessary to develop in-service inspection plans for the objects to be inspected (such as pipelines) in accordance with relevant standards and specifications.

[0004] Currently, in-service inspections of objects under test typically rely on manual measurements. For objects located in radiation-free or low-dose radiation areas, while inspections can be conducted by notifying maintenance personnel when necessary, real-time measurements are difficult to achieve due to limitations such as personnel response time, work shifts, and on-site preparation. For objects in high-dose radiation areas, such as nuclear islands (completely enclosed during power operation, prohibiting personnel entry) and radioactive waste treatment facilities (where personnel entry requires special work permits and is subject to dose limits), measurements cannot be performed at any time. These accessibility limitations all lead to delays in obtaining thickness information for the objects under test, thus delaying condition assessments and defect identification. Summary of the Invention

[0005] This application provides a thickness measurement method, system, and electronic device, which can solve the problem that existing measurement methods are unable to obtain the thickness information of the measured object in a timely manner.

[0006] In a first aspect, embodiments of this application provide a thickness measurement method, including: Acquire the background radiation signal sent by the detector, and determine the background radiation intensity based on the background radiation signal; The detector receives a first ray signal and determines a first ray intensity based on the first ray signal. The first ray signal is a signal obtained by the detector receiving rays emitted by the radiation source module that do not pass through any object. The rays include X-rays and gamma rays. The detector sends a second ray signal, and the second ray intensity is determined based on the second ray signal, wherein the second ray signal is the signal obtained by the detector receiving the ray emitted by the radiation source module that passes through the object under test; Obtain the linear attenuation coefficient of the object under test; The thickness of the object under test is determined based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient of the object under test.

[0007] The beneficial effects of the embodiments in this application compared with the prior art are: In this embodiment, the linear attenuation coefficient of the object under test is obtained. Simultaneously, a background radiation signal, a first ray signal, and a second ray signal are acquired by a detector, and the corresponding background radiation intensity, first ray intensity, and second ray intensity are determined respectively. The first ray signal is the signal obtained by the detector receiving rays emitted by the radiation source module that have not passed through any object, and the second ray signal is the signal obtained by the detector receiving rays that have passed through the object under test. Since these rays are X-rays or gamma rays, both of which are photon radiation, the collective behavior of a large number of photons follows statistical laws—that is, the probability of photons being attenuated per unit distance is constant and proportional to the number of remaining photons. Therefore, the thickness of the object under test can be calculated based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient. Furthermore, since the background radiation in the area of ​​a nuclear power plant (such as the area with high-dose radiation in a nuclear power plant) is usually greater than that in non-nuclear power plant areas, if the background radiation intensity is not considered when calculating the thickness of the object under test, a systematic error will be introduced. This application explicitly incorporates background radiation intensity correction in the thickness calculation, thereby effectively improving the accuracy of the determined thickness of the object under test.

[0008] Secondly, embodiments of this application provide a thickness measurement system, including: a radiation source module, a detector, and a calculation module; The radiation source module is used to emit radiation, including X-rays and gamma rays; The detector is used to receive the rays emitted by the radiation source module and send the received rays to the computing module; The calculation module is used for: Acquire the background radiation signal sent by the detector, and determine the background radiation intensity based on the background radiation signal; The detector receives a first ray signal and determines a first ray intensity based on the first ray signal. The first ray signal is a signal obtained by the detector receiving rays emitted by the radiation source module that do not pass through any object. The rays include X-rays and gamma rays. The detector sends a second ray signal, and the second ray intensity is determined based on the second ray signal, wherein the second ray signal is the signal obtained by the detector receiving the ray emitted by the radiation source module that passes through the object under test; Obtain the linear attenuation coefficient of the object under test; The thickness of the object under test is determined based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient of the object under test.

[0009] Thirdly, embodiments of this application provide an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the method described in the first aspect.

[0010] Fourthly, embodiments of this application provide a computer-readable storage medium storing a computer program that, when executed by a processor, implements the method described in the first aspect.

[0011] Fifthly, embodiments of this application provide a computer program product that, when run on an electronic device, causes the electronic device to perform the method described in the first aspect.

[0012] It is understood that the beneficial effects of the second to fifth aspects mentioned above can be found in the relevant descriptions in the first aspect mentioned above, and will not be repeated here. Attached Figure Description

[0013] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments or the prior art will be briefly introduced below.

[0014] Figure 1 This is a schematic flowchart of a thickness measurement method provided in an embodiment of this application; Figure 2 This is a schematic diagram illustrating an application of a collimator-constrained ray according to an embodiment of this application; Figure 3 This is a schematic diagram of the structure of a thickness measurement system provided in one embodiment of this application; Figure 4 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Detailed Implementation

[0015] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of this application. However, those skilled in the art will understand that this application may also be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods have been omitted so as not to obscure the description of this application with unnecessary detail.

[0016] It should be understood that, when used in this application specification and the appended claims, the term "comprising" indicates the presence of the described features, integrals, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or a collection thereof.

[0017] It should also be understood that the term “and / or” as used in this application specification and the appended claims means any combination of one or more of the associated listed items and all possible combinations, and includes such combinations.

[0018] Furthermore, in the description of this application and the appended claims, the terms "first," "second," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0019] References to "one embodiment" or "some embodiments" in this specification mean that one or more embodiments of this application include a specific feature, structure, or characteristic described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized.

[0020] Nuclear power plants contain numerous pipelines, such as steam pipelines, feedwater pipelines, and process pipelines, which are the core channels for energy conversion. As service life extends, pipelines (or their welds) may exhibit various abnormal conditions due to factors such as corrosion, erosion, fatigue, and stress concentration. These abnormalities include thinning of the base material wall, wear of the weld reinforcement, propagation of non-fusion defects, initiation of cracks in the heat-affected zone, material deterioration, and even rupture failure. To reduce the probability of major safety incidents caused by abnormal pipelines, timely in-service inspections must be conducted in accordance with relevant standards and specifications.

[0021] Currently, the main method involves maintenance personnel entering the area and manually measuring the thickness of the objects being tested (such as pipes or welds on pipes).

[0022] However, for the objects being tested in high-dose radiation areas (using pipeline welds as an example below), maintenance personnel need special work permits to enter these areas and are subject to dose limits. Therefore, it is difficult for maintenance personnel to access these areas at any time and continuously monitor the pipeline welds. Furthermore, since both the pipe's base wall thickness and the weld thickness are key indicators for assessing its structural integrity, limited access directly leads to insufficient frequency of weld inspections and delayed data acquisition. This prevents maintenance personnel from promptly grasping the true weld thickness in the area, making it difficult to identify potential defects early and take preventative measures, potentially escalating into serious safety hazards.

[0023] In order to measure the thickness of the object under test in a high-dose radiation area in a timely manner, this application provides a thickness measurement method.

[0024] In this thickness measurement method, the thickness of the object being measured can be determined by utilizing the difference in radiation intensity between the radiation emitted by the radiation source module and the object being measured, the background radiation intensity of the environment surrounding the detector, and the linear attenuation coefficient of the object being measured.

[0025] Since maintenance personnel do not need to be on-site during the thickness measurement process, the thickness of the object being measured can be measured in a timely manner even if the object is in a high-dose radiation area, using the above method.

[0026] The thickness measurement method provided in the embodiments of this application is described below with reference to the accompanying drawings.

[0027] Figure 1 A schematic flowchart of a thickness measurement method provided in an embodiment of this application is shown. This thickness measurement method can be applied to electronic devices, and is described in detail below: S11, acquire the background radiation signal sent by the detector, and determine the background radiation intensity based on the background radiation signal.

[0028] The aforementioned detector is for detecting X-ray signals. In this embodiment, considering that the detector may be used in high-dose radiation areas, a radiation-resistant detector can be selected to delay the radiation damage effect on the detector and improve the reliability of the detector's measurement results.

[0029] The aforementioned background radiation intensity refers to the intensity of ionizing radiation that is always present in the environment in which the detector is located, such as the intensity of ionizing radiation present in the high-dose radiation area of ​​a nuclear power plant.

[0030] In this embodiment, when measuring background radiation signals, it is necessary to avoid the influence of radiation emitted by the radiation source module on the detector. For example, if the radiation source module emits X-rays, since the module requires power to emit X-rays, the power to the module must be turned off during background radiation signal measurement to prevent the X-rays emitted by the module from affecting the measurement results and thus the background radiation intensity. As another example, if the radiation source module includes a stable Co60 radiation source that emits gamma rays, since the stable Co60 source can emit gamma rays without power, the radiation source module including the stable Co60 source can be shielded or removed during background radiation signal measurement to prevent gamma rays from affecting the measurement results.

[0031] In this embodiment of the application, the detector sends the received background radiation signal to an electronic device, which amplifies, filters, and performs analog-to-digital (A / D) conversion on the received background radiation signal, and then calculates the background radiation intensity based on the processed background radiation signal.

[0032] S12, acquire the first ray signal sent by the detector, and determine the first ray intensity based on the first ray signal, wherein the first ray signal is the signal obtained by the detector receiving rays emitted by the radiation source module that do not pass through any object, and the rays include X-rays and gamma rays.

[0033] In this embodiment, before the detector receives the first ray signal, it must be ensured that there are no objects between the radiation source module and the detector. The detector then receives the ray signal emitted by the radiation source module. Specifically, when the radiation source module emits X-rays, the module is powered on, causing it to emit X-rays. The detector receives the corresponding first ray signal and sends it to an electronic device, which then calculates the corresponding first ray intensity based on the signal. When the radiation source module emits gamma rays, it is not necessary to power on the module. The detector receives the corresponding first ray signal and sends it to an electronic device, which then calculates the corresponding first ray intensity.

[0034] S13, acquire the second ray signal sent by the detector, and determine the second ray intensity based on the second ray signal, wherein the second ray signal is the signal obtained by the detector receiving the ray emitted by the radiation source module that passes through the object under test.

[0035] In this embodiment, before the detector receives the second ray signal, it must be ensured that the object under test is between the radiation source module and the detector. That is, the second ray signal received by the detector is the signal obtained after the ray emitted by the radiation source module passes through the object under test. It should be noted that since the ray will attenuate after passing through an object, it is usually ensured that there are no other objects between the radiation source module and the detector besides the object under test, in order to ensure the accuracy of the second ray signal.

[0036] In this embodiment, the process by which the electronic device acquires the second ray signal is similar to the process by which the electronic device acquires the first ray signal, and will not be described again here. Similarly, the process by which the electronic device determines the intensity of the second ray based on the second ray signal is similar to the process by which the electronic device determines the intensity of the first ray based on the first ray signal, and will not be described again here.

[0037] S14, obtain the linear attenuation coefficient of the object under test.

[0038] The linear attenuation coefficient mentioned above refers to the probability that rays (such as gamma rays) are attenuated when traveling a unit distance in matter, and is used to describe the ability of matter to attenuate rays.

[0039] In this embodiment, the linear attenuation coefficients of different materials can be pre-calibrated based on the materials of the test objects commonly used in nuclear power plants. Subsequently, the linear attenuation coefficient of the test object can be determined based on its material. That is, obtaining the linear attenuation coefficient of the test object includes: Determine the material of the object under test; obtain the linear attenuation coefficient of the object under test based on its material.

[0040] For example, assuming the linear attenuation coefficient of carbon steel is The linear attenuation coefficient of stainless steel is If the material of the object being tested is carbon steel, then the linear attenuation coefficient of the object being tested is... .

[0041] S15, determine the thickness of the object under test based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient of the object under test.

[0042] In this embodiment, the actual incident ray intensity is calculated based on the background radiation intensity and the first ray intensity, and the actual transmitted ray intensity is calculated based on the background radiation intensity and the second ray intensity. For example, assuming the background radiation intensity is... It is indicated that the intensity of the first ray is adopted. It is indicated that the intensity of the second ray is adopted. This indicates that the actual incident ray intensity is expressed as follows: This indicates that the actual transmitted ray intensity is expressed as follows: If it means: , .

[0043] Then according to ,Right now ,in, This is the linear attenuation coefficient, which is used when the presence of a medium inside the object being measured is not considered. The linear attenuation coefficient of the object under test. The thickness of the object being measured.

[0044] When the object being measured is a pipe, if the radiation penetrates along the diameter (i.e., passes through both sides of the pipe simultaneously), the thickness of the object being measured is the sum of the thicknesses of both sides of the pipe (i.e., twice the thickness of a single wall). To calculate the actual thickness of a single wall, the sum of the thicknesses of both sides of the pipe needs to be divided by 2. That is, determining the thickness of the object being measured based on the background radiation intensity, the intensity of the first radiation, the intensity of the second radiation, and the linear attenuation coefficient includes: The double wall thickness of the pipe is determined based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient of the pipe.

[0045] In this embodiment, the linear attenuation coefficient of the object under test is obtained. Simultaneously, a background radiation signal, a first ray signal, and a second ray signal are acquired by a detector, and the corresponding background radiation intensity, first ray intensity, and second ray intensity are determined respectively. The first ray signal is the signal obtained by the detector receiving rays emitted by the radiation source module that have not passed through any object, and the second ray signal is the signal obtained by the detector receiving rays that have passed through the object under test. Since these rays are X-rays or gamma rays, both of which are photon radiation, the collective behavior of a large number of photons follows statistical laws—that is, the probability of photons being attenuated per unit distance is constant and proportional to the number of remaining photons. Therefore, the thickness of the object under test can be calculated based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient. Furthermore, since the background radiation in the area of ​​a nuclear power plant (such as the area with high-dose radiation in a nuclear power plant) is usually greater than that in non-nuclear power plant areas, if the background radiation intensity is not considered when calculating the thickness of the object under test, a systematic error will be introduced. This application explicitly incorporates background radiation intensity correction in the thickness calculation, thereby effectively improving the accuracy of the determined thickness of the object under test.

[0046] In this embodiment, the object under test includes a pipe (or a weld seam of a pipe). When the object under test is a pipe, if the nuclear island is not currently operating at power, the pipe connected to the nuclear island may not contain a medium; conversely, if the nuclear island is currently operating at power, the pipe connected to the nuclear island must contain a medium. Considering that the medium also has a corresponding linear attenuation coefficient, when measuring the thickness of a pipe containing a medium, the influence of the linear attenuation coefficient of the medium on the measurement result also needs to be considered. That is, if a medium exists within the pipe, the thickness measurement method further includes: Obtain the linear attenuation coefficient of the medium; Correspondingly, determining the double wall thickness of the pipe based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient of the pipe includes: The double wall thickness of the pipe is determined based on the background radiation intensity, the first ray intensity, the second ray intensity, the linear attenuation coefficient of the pipe, and the linear attenuation coefficient of the medium.

[0047] As can be seen from the above introduction, Furthermore, when the internal medium of the object being tested is not considered, this The linear attenuation coefficient of the measured object is the sum of the linear attenuation coefficient of the measured object and the linear attenuation coefficient of the medium when the presence of a medium inside the measured object is considered.

[0048] For example, suppose the pre-determined linear attenuation coefficients of the medium and the object under test are shown in Table 1 below:

[0049] When the object being measured is a pipe, and the pipe is made of carbon steel, and the medium inside the pipe is water, the pipe's double thickness... for: In for( + ) When calculated and Then, substitute the values ​​into the above formula to obtain the result. This is twice the wall thickness of the carbon steel pipe. Among them, and The calculation process is detailed in the description above and will not be repeated here.

[0050] In this embodiment, when calculating the double wall thickness of the pipeline, not only the linear attenuation coefficient of the pipeline itself is considered, but also the linear attenuation coefficient of the medium inside the pipeline. Since the linear attenuation coefficient of the medium also affects the measurement result of the double thickness of the pipeline, the double thickness of the pipeline calculated in the above manner is more accurate.

[0051] In this embodiment, considering the high safety requirements of nuclear power plants, and the potential for safety accidents due to thinning of the measured object, a warning system is needed for measured objects with significant thickness changes. That is, after determining the thickness of the measured object in S15, the system further includes: If the thickness of the object being measured is not less than a preset thickness threshold, the thickness of the object being measured is stored; if the thickness of the object being measured is less than the preset thickness threshold, an alarm signal is triggered.

[0052] In this embodiment, the preset thickness threshold can be determined based on the minimum standard thickness of the object being measured. For example, if, based on experience, damage will occur within a preset time period after the thickness of the object being measured falls below the minimum standard thickness, then the minimum standard thickness of the object being measured can be used as the preset thickness threshold. Of course, a preset percentage can be added to the minimum standard thickness, and the increased thickness can then be used as the preset thickness threshold; this is not limited here.

[0053] When the calculated thickness of the object under test is not lower than the preset thickness threshold, it indicates that the current structure of the object is still stable and safe. At this time, the thickness of the object under test can be stored for subsequent review and analysis. However, when the calculated thickness of the object under test is lower than the preset thickness threshold, it indicates that the current structure of the object under test is likely unstable. In this case, an alarm signal is triggered. For example, the alarm information corresponding to the alarm signal is sent to the backend server, and / or the alarm information corresponding to the alarm signal is sent to a designated communication address, so that relevant personnel can be informed of the alarm information in a timely manner, thereby reducing the risk of nuclear power plant safety accidents caused by the structural instability of the object under test.

[0054] In this embodiment of the application, when storing the thickness of the object being measured, the storage time of the thickness (i.e., the time when the thickness was obtained) can also be recorded so that the thickness and storage time can be used for subsequent analysis. That is, the thickness measurement method provided in this embodiment of the application further includes: The storage time for recording the thickness of the object being measured; If the time difference between the storage time and the current time is not greater than the preset retention period, the thickness of the measured object will continue to be stored. The preset retention period is determined according to the refueling and overhaul cycle of the nuclear power plant.

[0055] Optionally, the preset retention period is equal to the maximum cycle of the nuclear power plant's refueling overhaul. For example, if the cycle of the nuclear power plant's refueling overhaul is 12 to 18 months, then the preset retention period can be 18 months. Of course, the preset retention period can also be greater than (but not less than) the maximum cycle of the nuclear power plant's refueling overhaul; this is not limited here.

[0056] In this embodiment, considering that nuclear power plants regularly undergo refueling overhauls, and since complete historical data is needed before each overhaul to assess equipment degradation trends and formulate maintenance strategies, to ensure that equipment status data is complete and traceable from one overhaul to the next, the thickness of the measured object must be stored for at least one nuclear power plant overhaul cycle. That is, after storing the thickness of the measured object, if it is determined that the time difference between the stored thickness and the current time is not greater than a preset retention period, then the thickness is retained, which helps improve the integrity of the stored data.

[0057] Optionally, when the time difference between the storage time of the measured object's thickness and the current time exceeds a preset retention period, it can be selected whether to continue storing the measured object's thickness based on the actual situation. For example, if there is still a large amount of storage space, it can be selected to continue storing the measured object's thickness, or, depending on the importance of the measured object, it can be selected whether to continue storing the measured object's thickness, and so on.

[0058] In this embodiment of the application, after storing multiple thicknesses of the object under test, trend analysis can be performed on these thicknesses to provide an earlier warning for the object under test. That is, after storing the thicknesses of the object under test, the method further includes: A trend analysis is performed on the thickness of the object being measured, and the corresponding processing method is selected based on the trend analysis results.

[0059] In this embodiment, when the number of thicknesses of the same object under test exceeds a preset threshold, a trend analysis of the thickness of the object under test is performed, and a corresponding processing method is selected based on the trend analysis results. For example, if the thinning rate of the object under test is stable and slow, no processing is required; if the thinning rate of the object under test shows an accelerating trend, the monitoring cycle is shortened or the monitoring frequency is increased, and online monitoring methods are used for continuous tracking if necessary; if there is a risk of local thinning of the object under test, other thickness detection methods (such as ultrasonic guided waves, X-rays, eddy currents, etc.) can be used for supplementary detection or re-inspection to confirm the defect size and eliminate false defects. Since the trend analysis results can reflect the thickness changes of the object under test in advance, selecting the corresponding processing method based on the trend analysis results of the object under test can achieve predictive maintenance, avoid sudden failures, and ensure the safe and stable operation of the nuclear power unit during the refueling and overhaul cycle.

[0060] In this embodiment of the application, when the object being measured is a pipe, the thickness of the object being measured is twice the wall thickness of the pipe. In this case, storing the thickness of the object being measured if its thickness is not less than a preset thickness threshold includes: If the double wall thickness of the pipe is not less than a preset thickness threshold, then the double wall thickness of the pipe is stored, wherein the preset thickness threshold is greater than half of the standard double wall thickness of the pipe.

[0061] In this embodiment of the application, the standard double wall thickness of the pipeline refers to twice the nominal wall thickness of the pipeline before it is manufactured and put into operation. This value represents the design reference thickness of the pipeline in its initial state.

[0062] Since the pipe's thickness is twice the standard wall thickness, it's difficult to pinpoint the exact location of thinning based solely on the calculated double wall thickness. Therefore, a thickness threshold can be set to be greater than half the standard double wall thickness of the pipe, for example, 87.5% of the pipe's double wall thickness. Because the preset thickness threshold is greater than half the standard double wall thickness, when the double wall thickness meets this threshold, it indicates that the pipe has not yet ruptured and still has the capacity to withstand a certain design load. In this case, only the pipe's double wall thickness data is stored without triggering an alarm signal, effectively reducing the probability of false alarms caused by normal wall thickness fluctuations.

[0063] In some embodiments, the target signal includes the first ray signal and / or the second ray signal, and before acquiring the target signal sent by the detector, the method further includes: The radiation emitted by the radiation source module is constrained into a monochromatic narrow beam.

[0064] In this embodiment, the radiation can be constrained by absorbing edge rays using a collimator. Specifically, one or more collimators are placed around the object being measured. These collimators are configured corresponding to the radiation source module and have narrow slits to organize the radiation emitted by the radiation source into a monochromatic narrow beam of a preset diameter.

[0065] like Figure 2 As shown, the radiation source module 21 emits rays, of which ray 22 passes through the narrow slit of the collimator 23 and through the object under test 24. The rays passing through the object under test 24 contain two components: scattered rays 25 that deviate from their original direction after undergoing the Compton effect with the object under test 24, and transmitted primary rays 26 whose direction remains essentially unchanged, with intensity following an exponential decay law. The detector 27 selectively receives the transmitted primary rays 26 through the collimator for thickness measurement of the object under test 24. It should be noted that... Figure 2 The number of collimators 23 in the text is only one example. In practice, there may be other numbers, which are not limited here.

[0066] In some embodiments, to further improve the accuracy of the measurement results, the thickness measurement method provided in this application may further include: The radiation source module is used to shield the scattered rays generated during the propagation of its emitted rays, and / or to shield the background radiation signal.

[0067] In this embodiment, a shielding cover can be used to enclose the outside of the radioactive source module to shield it from background radiation signals, scattered rays, and radiation leaked from the radioactive source. By reducing the interference of stray radiation on the measurement results, measurement accuracy is ensured, while also preventing the impact of radiation leakage on the nuclear island environment.

[0068] Optionally, when a collimator is used to confine the radiation emitted by the radiation source module, the aforementioned shielding cover can cover not only the outside of the radiation source module but also the outside of the collimator. Since the through-holes in the collimator, designed to form a narrow beam of radiation, are potential channels for radiation leakage—that is, after the radiation is scattered on the inner wall of the collimator, it may escape from the side, leading to an increase in the local dose rate—covering the collimator area with a shielding cover can effectively absorb these scattered rays, blocking their propagation path into the surrounding environment. This significantly reduces the dose received by operators and minimizes interference from background radiation signals on subsequent measurements.

[0069] Alternatively, the shielding cover can be made of lead plate with a thickness of 10 mm. This thickness is suitable for use in nuclear power plants. 7 A Cs radiation source is approximately equivalent to two half-value layers, which can attenuate the intensity of scattered rays to less than 25% of the original intensity, achieving an optimal balance between shielding effect, structural weight, and material cost, while meeting the occupational exposure dose limit requirements specified in GB 18871-2002.

[0070] It should be understood that the sequence number of each step in the above embodiments does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.

[0071] Corresponding to the thickness measurement method described in the above embodiments, Figure 3 A structural block diagram of a thickness measurement system provided in an embodiment of this application is shown. For ease of explanation, only the parts related to the embodiment of this application are shown.

[0072] Reference Figure 3 The thickness measurement system 3 includes: a radiation source module 31, a detector 32, and a calculation module 33; The radiation source module 31 is used to emit radiation, including X-rays and gamma rays. Optionally, the radiation source module 31 can be powered by a power source built into the nuclear island.

[0073] The detector 32 is used to receive the rays emitted by the radiation source module and send the received rays to the computing module.

[0074] The calculation module 33 is used for: Acquire the background radiation signal sent by detector 32, and determine the background radiation intensity based on the background radiation signal; The detector 32 acquires a first ray signal and determines a first ray intensity based on the first ray signal. The first ray signal is a signal obtained by the detector receiving rays emitted by the radiation source module that do not pass through any object. The rays include X-rays and gamma rays. The detector 32 sends a second ray signal, and the second ray intensity is determined based on the second ray signal, wherein the second ray signal is the signal obtained by the detector receiving the ray emitted by the radiation source module that passes through the object under test; Obtain the linear attenuation coefficient of the object under test; The thickness of the object under test is determined based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient of the object under test.

[0075] In this embodiment, the linear attenuation coefficient of the object under test is obtained. Simultaneously, a background radiation signal, a first ray signal, and a second ray signal are acquired by a detector, and the corresponding background radiation intensity, first ray intensity, and second ray intensity are determined respectively. The first ray signal is the signal obtained by the detector receiving rays emitted by the radiation source module that have not passed through any object, and the second ray signal is the signal obtained by the detector receiving rays that have passed through the object under test. Since these rays are X-rays or gamma rays, both of which are photon radiation, the collective behavior of a large number of photons follows statistical laws—that is, the probability of photons being attenuated per unit distance is constant and proportional to the number of remaining photons. Therefore, the thickness of the object under test can be calculated based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient. Furthermore, since the background radiation in the area of ​​a nuclear power plant (such as the area with high-dose radiation in a nuclear power plant) is usually greater than that in non-nuclear power plant areas, if the background radiation intensity is not considered when calculating the thickness of the object under test, a systematic error will be introduced. This application explicitly incorporates background radiation intensity correction in the thickness calculation, thereby effectively improving the accuracy of the determined thickness of the object under test.

[0076] Optionally, obtaining the linear attenuation coefficient of the object under test includes: Determine the material of the object being tested; The linear attenuation coefficient of the object under test is obtained based on the material of the object under test.

[0077] Optionally, determining the thickness of the object under test based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient of the object under test includes: If the object under test is a pipe, then the double wall thickness of the pipe is determined based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient of the pipe.

[0078] Optionally, a medium exists within the pipeline, and the calculation module 33 is further configured to: Obtain the linear attenuation coefficient of the medium; The step of determining the double wall thickness of the pipe based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient of the pipe includes: The double wall thickness of the pipe is determined based on the background radiation intensity, the first ray intensity, the second ray intensity, the linear attenuation coefficient of the pipe, and the linear attenuation coefficient of the medium.

[0079] Optionally, the computing module 33 is further configured to: After determining the thickness of the object being measured, if the thickness of the object being measured is not less than a preset thickness threshold, the thickness of the object being measured is stored; if the thickness of the object being measured is less than the preset thickness threshold, an alarm signal is triggered.

[0080] Optionally, the computing module 33 is further configured to: The storage time for recording the thickness of the object being measured; If the time difference between the storage time and the current time is not greater than the preset retention period, the thickness of the measured object will continue to be stored. The preset retention period is determined according to the refueling and overhaul cycle of the nuclear power plant.

[0081] Optionally, the computing module 33 is further configured to: After storing the thickness of the object under test, a trend analysis is performed on the thickness of the object under test, and the corresponding processing method is selected based on the trend analysis results.

[0082] Optionally, the thickness of the object being measured is twice the wall thickness of the pipe, and storing the thickness of the object being measured if its thickness is not less than a preset thickness threshold includes: If the double wall thickness of the pipe is not less than a preset thickness threshold, then the double wall thickness of the pipe is stored, wherein the preset thickness threshold is greater than half of the standard double wall thickness of the pipe.

[0083] Optionally, the target signal includes the first ray signal and / or the second ray signal, and the thickness measurement system 3 further includes a collimator: The collimator is used to confine the rays emitted by the radiation source module 31 into a monochromatic narrow beam.

[0084] The thickness measurement system 3 also includes a shielding cover: The shielding cover is used to shield the scattered rays generated by the radiation emitted by the radiation source module 31 during propagation, and / or to shield the background radiation.

[0085] Optionally, the radiation source module 31, detector 32, collimator and / or shield in this embodiment of the application can be installed on the object being measured as a thickness measuring device.

[0086] For example, an adjustable clamp structure is used to install the thickness measuring device on the object being measured. Specifically, a dedicated remote robotic arm for the nuclear island fixes the clamp of the thickness measuring device to the weld of the inspected pipeline. The tightness of the clamp is adjusted to ensure that the thickness measuring device is securely fixed. The angle of the thickness measuring device is adjusted so that the radiation source module 31, collimator and / or shield, and detector 32 are coaxially aligned, and the X-ray beam penetrates perpendicularly to the center of the weld. Optionally, the inner diameter of the clamp is adjustable, and the adjustment range is related to the size of the object being measured. For example, assuming the object being measured is a pipeline with a diameter in the range of 50mm to 500mm, the inner diameter of the clamp can be adjusted within the range of 50mm to 500mm to adapt the same thickness measuring device to pipelines of different diameters. Optionally, the clamp is equipped with adjusting bolts to adjust the installation angle of the thickness measuring device.

[0087] It should be noted that the information interaction and execution process between the above-mentioned devices / units are based on the same concept as the method embodiments of this application. For details on their specific functions and technical effects, please refer to the method embodiments section, and they will not be repeated here.

[0088] Figure 4 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Figure 4 As shown, the electronic device 4 of this embodiment includes: at least one processor 40 ( Figure 4 The diagram shows only one processor, a memory 41, and a computer program 42 stored in the memory 41 and executable on the at least one processor 40, which, when executing the computer program 42, performs the steps in any of the above method embodiments.

[0089] The electronic device 4 can be a desktop computer, laptop, handheld computer, cloud server, or other computing device. This electronic device may include, but is not limited to, a processor 40 and a memory 41. Those skilled in the art will understand that... Figure 4 This is merely an example of electronic device 4 and does not constitute a limitation on electronic device 4. It may include more or fewer components than shown, or combine certain components, or different components. For example, it may also include input / output devices, network access devices, etc.

[0090] The processor 40 may be a Central Processing Unit (CPU), or it may be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor.

[0091] In some embodiments, the memory 41 may be an internal storage unit of the electronic device 4, such as a hard disk or memory of the electronic device 4. In other embodiments, the memory 41 may be an external storage device of the electronic device 4, such as a plug-in hard disk, smart media card (SMC), secure digital (SD) card, flash card, etc., equipped on the electronic device 4. Furthermore, the memory 41 may include both internal and external storage units of the electronic device 4. The memory 41 is used to store the operating system, applications, bootloader, data, and other programs, such as the program code of the computer program. The memory 41 can also be used to temporarily store data that has been output or will be output.

[0092] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the above-described division of functional units and modules is merely an example. In practical applications, the above functions can be assigned to different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit. Furthermore, the specific names of the functional units and modules are only for easy differentiation and are not intended to limit the scope of protection of this application. The specific working process of the units and modules in the above system can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0093] This application also provides a network device, which includes: at least one processor, a memory, and a computer program stored in the memory and executable on the at least one processor, wherein the processor executes the computer program to implement the steps in any of the above method embodiments.

[0094] This application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, can implement the steps in the above-described method embodiments.

[0095] This application provides a computer program product that, when run on an electronic device, enables the electronic device to implement the steps described in the various method embodiments above.

[0096] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, all or part of the processes in the methods of the above embodiments of this application can be implemented by a computer program instructing related hardware. The computer program can be stored in a computer-readable storage medium, and when executed by a processor, it can implement the steps of the various method embodiments described above. The computer program includes computer program code, which can be in the form of source code, object code, executable files, or certain intermediate forms. The computer-readable medium can include at least: any entity or device capable of carrying computer program code to a photographic device / electronic device, a recording medium, a computer memory, a read-only memory (ROM), a random access memory (RAM), an electrical carrier signal, a telecommunication signal, and a software distribution medium. Examples include USB flash drives, portable hard drives, magnetic disks, or optical disks. In some jurisdictions, according to legislation and patent practice, computer-readable media cannot be electrical carrier signals or telecommunication signals.

[0097] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail or recorded in a certain embodiment, please refer to the relevant descriptions of other embodiments.

[0098] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0099] In the embodiments provided in this application, it should be understood that the disclosed apparatus / network devices and methods can be implemented in other ways. For example, the apparatus / network device embodiments described above are merely illustrative. For instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.

[0100] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

Claims

1. A thickness measurement method, characterized in that, include: Acquire the background radiation signal sent by the detector, and determine the background radiation intensity based on the background radiation signal; The detector receives a first ray signal and determines a first ray intensity based on the first ray signal. The first ray signal is a signal obtained by the detector receiving rays emitted by the radiation source module that do not pass through any object. The rays include X-rays and gamma rays. The detector sends a second ray signal, and the second ray intensity is determined based on the second ray signal, wherein the second ray signal is the signal obtained by the detector receiving the ray emitted by the radiation source module that passes through the object under test; Obtain the linear attenuation coefficient of the object under test; The thickness of the object under test is determined based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient of the object under test.

2. The thickness measurement method as described in claim 1, characterized in that, The step of obtaining the linear attenuation coefficient of the object under test includes: Determine the material of the object being tested; The linear attenuation coefficient of the object under test is obtained based on the material of the object under test.

3. The thickness measurement method as described in claim 1, characterized in that, The step of determining the thickness of the object under test based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient of the object under test includes: If the object under test is a pipe, then the double wall thickness of the pipe is determined based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient of the pipe.

4. The thickness measurement method as described in claim 3, characterized in that, The pipeline contains a medium, and the thickness measurement method further includes: Obtain the linear attenuation coefficient of the medium; The step of determining the double wall thickness of the pipe based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient of the pipe includes: The double wall thickness of the pipe is determined based on the background radiation intensity, the first ray intensity, the second ray intensity, the linear attenuation coefficient of the pipe, and the linear attenuation coefficient of the medium.

5. The thickness measurement method as described in claim 1, characterized in that, After determining the thickness of the object being measured, the method further includes: If the thickness of the object being measured is not less than a preset thickness threshold, the thickness of the object being measured is stored; if the thickness of the object being measured is less than the preset thickness threshold, an alarm signal is triggered.

6. The thickness measurement method as described in claim 5, characterized in that, Also includes: The storage time for recording the thickness of the object being measured; If the time difference between the storage time and the current time is not greater than the preset retention period, the thickness of the measured object will continue to be stored. The preset retention period is determined according to the refueling and overhaul cycle of the nuclear power plant.

7. The thickness measurement method as described in claim 5, characterized in that, After storing the thickness of the object being measured, the method further includes: A trend analysis is performed on the thickness of the object being measured, and the corresponding processing method is selected based on the trend analysis results.

8. The thickness measurement method as described in claim 5, characterized in that, The thickness of the object being measured is twice the wall thickness of the pipe. If the thickness of the object being measured is not less than a preset thickness threshold, then the thickness of the object being measured is stored, including: If the double wall thickness of the pipe is not less than a preset thickness threshold, then the double wall thickness of the pipe is stored, wherein the preset thickness threshold is greater than half of the standard double wall thickness of the pipe.

9. The thickness measurement method according to any one of claims 1 to 8, characterized in that, The target signal includes the first ray signal and / or the second ray signal, and before acquiring the target signal sent by the detector, it further includes: The radiation emitted by the radiation source module is constrained into a monochromatic narrow beam.

10. The thickness measurement method according to any one of claims 1 to 8, characterized in that, Also includes: The radiation source module is used to shield the scattered rays generated during the propagation of its emitted rays, and / or to shield the background radiation signal.

11. A thickness measurement system, characterized in that, include: Radioactive source module, detector, and computing module; The radiation source module is used to emit radiation, including X-rays and gamma rays; The detector is used to receive the rays emitted by the radiation source module and send the received rays to the computing module; The calculation module is used for: Acquire the background radiation signal sent by the detector, and determine the background radiation intensity based on the background radiation signal; The detector receives a first ray signal and determines a first ray intensity based on the first ray signal. The first ray signal is a signal obtained by the detector receiving rays emitted by the radiation source module that do not pass through any object. The rays include X-rays and gamma rays. The detector sends a second ray signal, and the second ray intensity is determined based on the second ray signal, wherein the second ray signal is the signal obtained by the detector receiving the ray emitted by the radiation source module that passes through the object under test; Obtain the linear attenuation coefficient of the object under test; The thickness of the object under test is determined based on the background radiation intensity, the first ray intensity, the second ray intensity, and the linear attenuation coefficient of the object under test.

12. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the method as described in any one of claims 1 to 10.

13. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, it implements the method as described in any one of claims 1 to 10.

14. A computer program product, characterized in that, Includes a computer program, which, when executed, causes the electronic device to perform the method according to any one of claims 1 to 10.

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