Flaw detection test method, device and computer equipment based on four probe wheel structure

Abstract

This application relates to a flaw detection test method, apparatus, and computer equipment based on a four-wheeled ultrasonic probe structure. The method includes: when an ultrasonic probe is installed on a four-wheeled mobile platform, adjusting the installation position of the ultrasonic probe using an automatic gain control (AGaS) strategy to position it in a flaw detection location; performing a damage scan on the ultrasonic probe while the four-wheeled mobile platform moves automatically to obtain the probe test results; and based on the probe test results, performing a state assessment on the probe test results using a state assessment strategy to obtain the corresponding flaw detection test results. This method improves the inspection efficiency for batches of ultrasonic probes.

Description

Technical Field

[0001] This application relates to the field of nondestructive testing technology, and in particular to a flaw detection test method, apparatus and computer equipment based on a four-probe structure. Background Technology

[0002] Currently, with the vigorous development of railway transportation, the mileage of railway construction in my country is increasing daily; at the same time, the number of rail flaw detection vehicles deployed by various railway bureaus is also increasing year by year. Rail flaw detection vehicles play a crucial role in ensuring railway transportation safety. As the most important sensing device at the front end of the flaw detection vehicle, the performance and condition of the probe wheel directly affect the flaw detection effect of the entire vehicle. Therefore, the inspection and testing of the overall condition of the probe wheel is extremely important. A normal flaw detection operation on a flaw detection vehicle requires 6 probe wheels, plus 1-2 sets of spare probe wheels, so a flaw detection vehicle generally has 12-18 probe wheels. According to the requirements of railway bureau flaw detection operations, during the work intervals, a centralized probe wheel condition test is required on average once a month to prepare for the flaw detection task of the following month. Some railway bureaus have 3-4 flaw detection vehicles, so the number of probe wheels that need to be tested each month is very large. Therefore, it is essential to seek an efficient and rapid testing method.

[0003] Existing technologies often require manual repetitive movement of the rail test block, precise position adjustment to find the highest reflected echo of the target damage, and then reading and recording the data. Moreover, only one chip channel's A-display data result test can be completed at a time. This detection method is inefficient and cannot meet the needs of efficient detection of batch test wheels. It also increases the cost of a large number of manual laborers and detection equipment, resulting in excessively low detection efficiency for batch test wheels. Summary of the Invention

[0004] Therefore, it is necessary to provide a flaw detection test method, apparatus, computer equipment, computer-readable storage medium, and computer program product based on a four-probe structure to address the above-mentioned technical problems.

[0005] Firstly, this application provides a flaw detection test method based on a four-probe wheel structure, including:

[0006] When the ultrasonic probe is installed on the four-wheel mobile platform, the installation position of the ultrasonic probe is adjusted by the automatic gain strategy of wave height so that the ultrasonic probe is in the position to be inspected.

[0007] When the four-wheeled mobile platform moves automatically, damage scanning is performed on the ultrasonic probe wheel to obtain the probe wheel test results;

[0008] Based on the test results of the ultrasonic probe, a condition assessment strategy is used to perform condition assessment processing on the test results to obtain the flaw detection test results corresponding to the test results.

[0009] Optionally, adjusting the installation position of the ultrasonic probe wheel using an automatic gain control strategy to position the ultrasonic probe wheel in the flaw detection position includes:

[0010] In response to the user's automatic gain confirmation operation for wave height, the interface wave is adjusted to the preset wave height, and the current gain parameter value of the current bottom wave is calculated through the bottom wave gain parameter algorithm;

[0011] When the current gain parameter value is within the preset detection warning range, it is determined that the ultrasonic probe is in the position to be inspected;

[0012] When the current gain parameter value is not within the preset detection warning range, adjust the displacement adjustment knob of the ultrasonic probe wheel and return to the step of calculating the current gain parameter value of the current bottom wave through the bottom wave gain parameter algorithm, until the current gain parameter value is within the preset detection warning range, and then stop the iteration process.

[0013] Optionally, the step of performing damage scanning processing on the ultrasonic probe to obtain the probe test results includes:

[0014] The comprehensive amplitude of each visible damage point of the rail test block is collected by an ultrasonic probe, and the visible waveform of each visible damage point is selected from the preset visible waveform of the rail test block.

[0015] Based on the comprehensive amplitude of each visible damage point and the visible waveform of each visible damage point, the signal-to-noise ratio and the flaw detection sensitivity of each visible damage point are calculated using a flaw detection data calculation strategy.

[0016] The signal-to-noise ratio and the flaw detection sensitivity of each of the aforementioned visible defects are used as the test results of the ultrasonic probe.

[0017] Optionally, based on the ultrasonic probe test results, a condition assessment strategy is used to perform condition assessment processing on the probe test results to obtain the flaw detection test results corresponding to the probe test results, including:

[0018] Based on the test results of the probe, an evaluation value for each evaluation index is generated through a state evaluation strategy.

[0019] Based on the evaluation values ​​of each evaluation indicator and the standard evaluation values ​​of each evaluation indicator, the current evaluation status of each evaluation indicator is identified.

[0020] When the current evaluation state is abnormal, based on the evaluation value of the evaluation index corresponding to the abnormal state, the current abnormal information of the ultrasonic probe is identified, and the current abnormal information of the ultrasonic probe is used as the flaw detection test result corresponding to the probe test result.

[0021] If there is no abnormal state in the current evaluation, the flaw detection test will be deemed qualified and taken as the flaw detection test result corresponding to the test result of the probe wheel.

[0022] Secondly, this application also provides a flaw detection test system based on a four-wheel structure, the system comprising an ultrasonic probe wheel, a four-wheel moving platform, an ultrasonic signal processing component, a terminal control computer, and a rail test block, wherein:

[0023] The ultrasonic probe wheel includes a conventional wheel and a middle wheel. The conventional wheel is fixedly installed on the left side of the four-wheel mobile platform, and the middle wheel is installed on the right side of the four-wheel mobile platform.

[0024] The four-wheeled mobile platform includes a moving star wheel, a probe wheel mounting mechanism, a battery, an encoder, and a coupling water tank;

[0025] The probe installation mechanism is installed on the four-wheel mobile platform and is used to install the ultrasonic probe on the four-wheel mobile platform;

[0026] The battery is connected to the ultrasonic signal processing component and is used to power the ultrasonic signal processing component.

[0027] The coupling water tank is used to provide coupling water for the ultrasonic probe.

[0028] The rail test block is positioned on both sides of the four-wheel mobile platform.

[0029] The terminal control computer is connected to the four-wheel mobile platform, the ultrasonic signal processing component, and the rail test block, respectively.

[0030] The terminal control computer is used to adjust the installation position of the ultrasonic probe wheel when it is installed on the four-wheel mobile platform, so that the ultrasonic probe wheel is in the position to be inspected; when the four-wheel mobile platform moves automatically, it performs damage scanning processing on the ultrasonic probe wheel to obtain the probe wheel test results; based on the probe wheel test results, it performs state evaluation processing on the probe wheel test results through a state evaluation strategy to obtain the flaw detection test results corresponding to the probe wheel test results.

[0031] Optionally, the probe wheel installation mechanism further includes a mechanical centering guide wheel and a probe wheel position stop block, wherein:

[0032] The mechanical centering guide wheel is used to press the ultrasonic probe wheel tightly against the inner side of the rail.

[0033] The ultrasonic probe position stop block is used to physically limit the ultrasonic probe and control the ultrasonic probe to be installed at the target center position.

[0034] Thirdly, this application also provides a flaw detection test device based on a four-probe wheel structure, comprising:

[0035] The adjustment module is used to adjust the installation position of the ultrasonic probe wheel by means of an automatic gain strategy based on wave height when the ultrasonic probe wheel is installed on the four-wheel mobile platform, so that the ultrasonic probe wheel is in the position to be inspected.

[0036] The scanning module is used to perform damage scanning on the ultrasonic probe wheel when the four-wheel mobile platform moves automatically, and to obtain the probe wheel test results of the ultrasonic probe wheel;

[0037] The evaluation module is used to perform state evaluation processing on the ultrasonic probe test results based on the probe test results through a state evaluation strategy, so as to obtain the flaw detection test results corresponding to the probe test results.

[0038] Optionally, the adjustment module is specifically used for:

[0039] In response to the user's automatic gain confirmation operation for wave height, the interface wave is adjusted to the preset wave height, and the current gain parameter value of the current bottom wave is calculated through the bottom wave gain parameter algorithm;

[0040] When the current gain parameter value is within the preset detection warning range, it is determined that the ultrasonic probe is in the position to be inspected;

[0041] When the current gain parameter value is not within the preset detection warning range, adjust the displacement adjustment knob of the ultrasonic probe wheel and return to the step of calculating the current gain parameter value of the current bottom wave through the bottom wave gain parameter algorithm, until the current gain parameter value is within the preset detection warning range, and then stop the iteration process.

[0042] Optionally, the scanning module is specifically used for:

[0043] The comprehensive amplitude of each visible damage point of the rail test block is collected by an ultrasonic probe, and the visible waveform of each visible damage point is selected from the preset visible waveform of the rail test block.

[0044] Based on the comprehensive amplitude of each visible damage point and the visible waveform of each visible damage point, the signal-to-noise ratio and the flaw detection sensitivity of each visible damage point are calculated using a flaw detection data calculation strategy.

[0045] The signal-to-noise ratio and the flaw detection sensitivity of each of the aforementioned visible defects are used as the test results of the ultrasonic probe.

[0046] Optionally, the evaluation module is specifically used for:

[0047] Based on the test results of the probe, an evaluation value for each evaluation index is generated through a state evaluation strategy.

[0048] Based on the evaluation values ​​of each evaluation indicator and the standard evaluation values ​​of each evaluation indicator, the current evaluation status of each evaluation indicator is identified.

[0049] When the current evaluation state is abnormal, based on the evaluation value of the evaluation index corresponding to the abnormal state, the current abnormal information of the ultrasonic probe is identified, and the current abnormal information of the ultrasonic probe is used as the flaw detection test result corresponding to the probe test result.

[0050] If there is no abnormal state in the current evaluation, the flaw detection test will be deemed qualified and taken as the flaw detection test result corresponding to the test result of the probe wheel.

[0051] Fourthly, this application provides a computer device. The computer device includes a memory and a processor, the memory storing a computer program, and the processor executing the computer program to implement the steps of the method described in any one of the first aspects.

[0052] Fifthly, this application provides a computer-readable storage medium having a computer program stored thereon that, when executed by a processor, implements the steps of the method described in any one of the first aspects.

[0053] Sixthly, this application provides a computer program product. The computer program product includes a computer program that, when executed by a processor, implements the steps of the method described in any one of the first aspects.

[0054] The aforementioned flaw detection method, apparatus, and computer equipment based on a four-wheeled probe structure adjust the installation position of the ultrasonic probes using an automatic gain control strategy when they are installed on the four-wheeled mobile platform, ensuring the probes are in the position to be inspected. During the automatic movement of the four-wheeled platform, damage scanning is performed on the ultrasonic probes to obtain their test results. Based on these test results, a state assessment strategy is used to evaluate the state of the test results, yielding the corresponding flaw detection test results. This solution enables automatic calibration of the ultrasonic probe installation. Through damage scanning, probe testing, and state assessment, it allows for cyclical, continuous, and automated data testing of all wafers within the probes, significantly improving testing efficiency and effectively avoiding the inefficiency of testing only a single wafer at a time. While ensuring detection accuracy, it effectively improves the detection efficiency for batches of probes. Attached Figure Description

[0055] To more clearly illustrate the technical solutions in the embodiments or related technologies of this application, the accompanying drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0056] Figure 1 This is a flowchart illustrating a flaw detection test system based on a four-probe structure in one embodiment;

[0057] Figure 2 This is a flowchart illustrating a flaw detection test method based on a four-probe structure in one embodiment;

[0058] Figure 3 This is a schematic diagram of the monitoring process for monitoring the bottom wave amplitude in one embodiment;

[0059] Figure 4 This is a schematic diagram of the component architecture of an ultrasonic signal processing component in one embodiment;

[0060] Figure 5 This is a schematic diagram of the damage layout of a rail test block in one embodiment;

[0061] Figure 6 This is a schematic diagram of the structure applicable to the probe wheel pressure adjustment function in one embodiment.

[0062] Figure 7 This is a schematic diagram of the mechanical device for mounting the probe wheel in one embodiment;

[0063] Figure 8This is a flowchart illustrating a flaw detection test example based on a four-probe structure in one embodiment;

[0064] Figure 9 This is a structural block diagram of a flaw detection test device based on a four-probe structure in one embodiment;

[0065] Figure 10 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0066] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0067] The flaw detection test method based on a four-probe structure provided in this application embodiment, such as Figure 1 As shown, this can be applied to a flaw detection testing system based on a four-wheeled probe structure. The system includes ultrasonic probes, a four-wheeled mobile platform, ultrasonic signal processing components, a terminal control computer, and rail test blocks. The terminal control computer can be used as a terminal, which can be, but is not limited to, various onboard computers or computing units. The terminal can automatically calibrate the installation of the ultrasonic probes, and then, through damage scanning, probe testing, and condition assessment, can cyclically, continuously, and automatically test the data of all wafers inside the probes. This significantly improves testing efficiency and effectively avoids the inefficiency of testing only a single wafer at a time. While ensuring detection accuracy, it effectively improves the detection efficiency of batch probes.

[0068] In one exemplary embodiment, such as Figure 2 As shown, a flaw detection test method based on a four-probe wheel structure is provided. Taking the application of this method to a terminal as an example, the method includes the following steps S201 to S203. Wherein:

[0069] Step S201: When the ultrasonic probe is installed on the four-wheel mobile platform, the installation position of the ultrasonic probe is adjusted by the automatic gain control strategy to make the ultrasonic probe be in the position to be inspected.

[0070] In this embodiment, after the ultrasonic probe is installed on the four-wheeled mobile platform, the terminal responds to the operator's automatic gain control operation by detecting the interface wave height gain parameter of the ultrasonic probe's bottom wave. This determines whether the installation position of the ultrasonic probe needs adjustment. If the interface wave height gain parameter does not meet the preset detection warning range, the installation position is iteratively adjusted to find the optimal bottom wave position, thereby ensuring the ultrasonic probe is in the optimal alignment position, i.e., the position to be inspected. The specific adjustment process will be explained in detail later.

[0071] Step S202: When the four-wheel mobile platform moves automatically, the ultrasonic probe wheel is subjected to damage scanning to obtain the test results of the ultrasonic probe wheel.

[0072] In this embodiment, the terminal moves and scans the rail test block on the four-wheeled mobile platform according to a preset movement program, thereby obtaining the crystal sensitivity, crystal signal-to-noise ratio, and number of B-wave points of the ultrasonic probe. The specific damage scanning process is based on the simultaneous display and storage function of A / B displays for scanning and identification. The specific identification process will be described in detail later.

[0073] Step S203: Based on the test results of the ultrasonic probe wheel, the test results are processed by a condition assessment strategy to obtain the flaw detection test results corresponding to the test results of the probe wheel.

[0074] In this embodiment, the terminal presets multiple standard values ​​for different indicators and reasonable ranges defined by these standard values. Then, based on the acquired ultrasonic probe test results, it automatically analyzes and compares the results from different indicator perspectives to determine whether the evaluation status of the ultrasonic probe meets the reasonable ranges defined by the standard values ​​for each indicator. If it meets the requirements, the ultrasonic probe is deemed qualified. If any indicators do not meet the requirements, the abnormal information of the ultrasonic probe is determined based on the non-compliant indicators, and this information is used as the flaw detection test result. The specific testing and evaluation methods will be explained in detail later.

[0075] Based on the above scheme, automatic calibration of the ultrasonic probe installation can be achieved. Then, through damage scanning, probe testing, and status assessment, data testing of all the wafers inside the probe can be carried out cyclically, continuously, and automatically, greatly improving testing efficiency and effectively avoiding the inefficiency of testing only a single wafer each time. While ensuring detection accuracy, it effectively improves the detection efficiency of batch probes.

[0076] Optionally, the installation position of the ultrasonic probe is adjusted using an automatic gain control strategy to ensure it is in the position to be inspected. This includes: responding to the user's automatic gain control confirmation operation, adjusting the interface wave to a preset wave height, and calculating the current gain parameter value of the current bottom wave using a bottom wave gain parameter algorithm; confirming the ultrasonic probe is in the position to be inspected when the current gain parameter value is within a preset detection warning range; and adjusting the displacement adjustment knob of the ultrasonic probe when the current gain parameter value is not within the preset detection warning range, and returning to the step of calculating the current gain parameter value of the current bottom wave using the bottom wave gain parameter algorithm, until the current gain parameter value falls within the preset detection warning range, at which point the iteration process stops.

[0077] In this embodiment, in response to the user's automatic gain confirmation operation for wave height, the terminal adjusts the interface wave to a preset wave height and calculates the current gain parameter value of the current bottom wave using a bottom wave gain parameter algorithm. Specifically, the terminal first automatically adjusts the interface wave gain parameter G of the interface wave to make the interface wave reach exactly 80% of its wave height. When the probe is in the optimal alignment position, the bottom wave also reaches 80% of its wave height with the following gain parameter (i.e., the bottom wave gain parameter algorithm):

[0078] G_bottom wave = G_interface wave + K;

[0079] Where K is a fixed value, caused by the attenuation of the sound beam inside the rail.

[0080] When the current gain parameter value falls within the preset detection warning range, it is determined that the ultrasonic probe is in the position to be inspected. Specifically, such as... Figure 3 As shown, if the bottom wave amplitude deviates significantly from the 80% wave height position under the action of the gain G bottom wave, it indicates that the current probe wheel installation is not in the optimal position. The bottom wave amplitude status monitoring and warning range is 80% ± 5%. When the bottom wave amplitude status indicator button is green, it indicates that the centering bottom wave signal is good; when it is red, it indicates that the bottom wave status is abnormal. At this time, it is necessary to fine-tune the probe wheel lateral displacement adjustment knob to find the optimal bottom wave position again. When the current gain parameter value is not within the preset detection and warning range, adjust the displacement adjustment knob of the ultrasonic probe wheel and return to the step of calculating the current gain parameter value of the current bottom wave through the bottom wave gain parameter algorithm until the current gain parameter value is within the preset detection and warning range, then stop the iteration process.

[0081] Based on the above scheme, the physical limit is provided by the probe wheel position stop block, which improves the speed and repeatability of the probe wheel lateral position installation; on the other hand, the bottom wave amplitude status monitoring function provides secondary confirmation at the signal level, thereby improving the efficiency and accuracy of the probe wheel installation position.

[0082] Optionally, damage scanning processing is performed on the ultrasonic probe to obtain the probe test results, including: acquiring the comprehensive amplitude of each visible damage point of the rail test block through the ultrasonic probe, and selecting the visible waveform of each visible damage point from the preset visible waveform of the rail test block; based on the comprehensive amplitude and visible waveform of each visible damage point, calculating the signal-to-noise ratio and the flaw detection sensitivity of each visible damage point through a flaw detection data calculation strategy; and using the signal-to-noise ratio and the flaw detection sensitivity of each visible damage point as the probe test results of the ultrasonic probe.

[0083] In this embodiment, the terminal uses an ultrasonic probe to collect the comprehensive amplitude of each visible damage point on the rail test block, and filters the visible waveforms of each damage point from a preset rail test block waveform. Then, based on the comprehensive amplitude and visible waveform of each damage point, the terminal calculates the signal-to-noise ratio and the flaw detection sensitivity of each damage point using a flaw detection data calculation strategy. The comprehensive amplitude includes the statistics of the highest noise wave amplitude (H noise) inside the gate and the damage wave amplitude (H damage). Specifically, the flaw detection data calculation strategy includes a signal-to-noise ratio calculation algorithm and a flaw detection sensitivity calculation algorithm. The signal-to-noise ratio calculation algorithm is as follows:

[0084] SNR = 20 x lg(H_damage / H_noise);

[0085] Wherein, SNR is the signal-to-noise ratio, H noise is the highest noise amplitude value inside the gate, and H damage is the damage amplitude value.

[0086] During the probe test, the gain of each target damage gate uses the initial reference gain value (G reference), which ensures that the target damage reflection is approximately around 80% of the wave height. The G reference is an empirically specified value (which needs to be set appropriately) and is related to the type of wafer. This value remains unchanged for each probe test (unless the wafer from another manufacturer is used). Since the amplitude of the target damage reflection echo is around 80% of the wave height under the initial reference gain (G reference), but not precisely 80%, the flaw detection sensitivity (S-detection) of the target damage can be calculated. The calculation formula (i.e., the flaw detection sensitivity calculation algorithm) is as follows:

[0087] S-inspection = G-baseline + 20 x lg(80% / H damage);

[0088] Finally, the terminal uses the signal-to-noise ratio of each visible damage point and the flaw detection sensitivity of each visible damage point as the test results of the ultrasonic testing wheel.

[0089] Based on the above scheme, by adopting a high-precision ultrasonic scanning + A / B simultaneous display and storage mechanism in the direction of the probe wheel travel, the automatic extraction and automatic calculation of the highest reflected echo of the target damage are realized. The data test of all the crystals inside the two probe wheels can be completed at one time, which greatly improves the testing efficiency. It also supports file storage operation of the result data, which can provide historical data basis for long-term testing of the probe wheels.

[0090] Optionally, based on the ultrasonic probe test results, a state assessment strategy is used to process the probe test results to obtain the corresponding flaw detection test results. This includes: generating evaluation values ​​for each evaluation index based on the probe test results using the state assessment strategy; identifying the current evaluation state of each evaluation index based on its evaluation value and its standard value; identifying the current abnormal information of the ultrasonic probe based on the evaluation value of the evaluation index corresponding to the abnormal state, and using this abnormal information as the flaw detection test result corresponding to the probe test results; and determining that the flaw detection test is qualified if no abnormal state exists.

[0091] In this embodiment, the terminal generates evaluation values ​​for each evaluation index based on the test results of the probe wheel using a state evaluation strategy. This state evaluation strategy involves identifying the evaluation value corresponding to each test result based on the pre-defined evaluation values ​​for each evaluation index, its corresponding signal-to-noise ratio range, flaw detection sensitivity range, or range of the number of damage points, according to the signal-to-noise ratio, flaw detection sensitivity, and number of damage points in the probe wheel test results. This evaluation index value is then used as the evaluation value for that evaluation index.

[0092] Then, based on the evaluation values ​​of each evaluation indicator and the standard indicator values ​​of each evaluation indicator, the terminal identifies the current evaluation status of each evaluation indicator. Specifically, the terminal determines whether the evaluation value of each evaluation indicator is within a preset range corresponding to the standard indicator value. If it is, it is not an abnormal state; otherwise, it is an abnormal state.

[0093] When the terminal determines that the current evaluation state is abnormal, it identifies the current abnormal information of the ultrasonic probe wheel based on the evaluation value of the evaluation index corresponding to the abnormal state, and uses the current abnormal information of the ultrasonic probe wheel as the flaw detection test result corresponding to the probe wheel test result. This abnormal information corresponds to an abnormal index, for example: 1) severe degradation of wafer performance (sensitivity index will drop significantly); 2) high noise from prolonged use of the wafer (signal-to-noise ratio index will fail to meet requirements); 3) broken or damaged wafer cables inside the probe wheel (abnormal number of B-display points on the wafer); 4) severe wear of the outer membrane of the probe wheel affecting ultrasonic incident radiation (multiple wafers inside the probe wheel experience simultaneous sensitivity degradation).

[0094] If there is no abnormal status in the current assessment, the terminal will accept the flaw detection test as the flaw detection test result corresponding to the test result of the probe wheel; when all indicators of the overall status test of the probe wheel are qualified, the probe wheel is basically in a good normal state and can be directly installed on the flaw detection vehicle for normal operation next time; otherwise, it is necessary to replace the probe wheel wafer, wheel film or spool as appropriate according to the abnormal channel indication.

[0095] Based on the above scheme, by evaluating different state indicators, it is possible to accurately analyze one or more problems that may exist in the probe, thereby improving the accuracy of detecting probe anomalies.

[0096] This application also provides a flaw detection test system based on a four-probe wheel structure, such as Figure 1 As shown, the system includes an ultrasonic probe wheel, a four-wheeled mobile platform, an ultrasonic signal processing component, a terminal control computer, and a rail test block, wherein:

[0097] The ultrasonic probe wheel includes a conventional wheel and a middle wheel. The conventional wheel is fixedly installed on the left side of the four-wheel mobile platform, and the middle wheel is installed on the right side. The four-wheel mobile platform includes a moving star wheel, a probe wheel mounting mechanism, a battery, an encoder, and a coupling water tank. The probe wheel mounting mechanism is located on the four-wheel mobile platform and is used to install the ultrasonic probe wheel onto the platform. The battery is connected to the ultrasonic signal processing component and is used to power the ultrasonic signal processing component. The coupling water tank is used to provide coupling water for the ultrasonic probe wheel. Rail test blocks are set on both sides of the four-wheel mobile platform. A terminal control computer is also included. It is connected to a four-wheel mobile platform, an ultrasonic signal processing component, and a rail test block, respectively. The terminal control computer is used to adjust the installation position of the ultrasonic probe wheel when it is installed on the four-wheel mobile platform, so that the ultrasonic probe wheel is in the position to be inspected. When the four-wheel mobile platform moves automatically, it performs damage scanning processing on the ultrasonic probe wheel to obtain the probe wheel test results. Based on the probe wheel test results, it performs state evaluation processing on the probe wheel test results through a state evaluation strategy to obtain the corresponding flaw detection test results.

[0098] The four-wheeled mobile platform, serving as the main load-bearing structure of the system, has a total length of no more than 1.5m. Its main structure includes two pairs of mobile running wheels, two sets of probe wheel mounting mechanisms, a battery, an encoder, and a coupling water tank. The probe wheel mounting mechanism interface is adapted to the probe wheel installation, allowing adjustment of the probe wheel's downward pressure and lateral displacement. It also features mechanical rail alignment. The battery provides continuous power to the ultrasonic signal processing components, and the coupling water tank continuously provides coupling water to the probe wheels.

[0099] The ultrasonic signal processing component needs to handle the excitation control of all ultrasonic signal channels and the processing of ultrasonic echo signals. To improve the efficiency of ultrasonic data processing, the acquisition and processing of ultrasonic signals adopt a parallel architecture design (e.g., Figure 4As shown in the figure, its functional structure mainly includes three parts: 1) ultrasonic analog circuit; 2) FPGA digital circuit; 3) core CPU circuit. The analog circuit part mainly includes: 1) multi-channel analog excitation circuit; 2) multi-channel signal conditioning circuit; 3) gain control circuit; 4) analog-to-digital conversion circuit, etc. The entire ultrasonic signal processing component is built around FPGA+CPU, featuring low latency, highly parallel signal processing, and supporting simultaneous A / B display and storage. This ultrasonic signal processing component possesses high-precision ultrasonic scanning capabilities, primarily ensuring that the probe wheel wafer always obtains the highest amplitude A-display reflected echo during dynamic scanning of defects, providing a data basis for subsequent automatic software calculation of sensitivity and signal-to-noise ratio. The ultrasonic excitation is enabled and triggered by the encoder signal. This system adopts a combination of fixed-frequency excitation and fixed-distance excitation modes. Fixed-frequency excitation mode is used when the system is stationary at 0 km / h, and fixed-distance excitation mode is used when the system is running dynamically. To ensure sufficiently high scanning accuracy of the probe wheel in the traveling direction, the system scanning accuracy n is designed to be 0.1 mm / pulse, calculated using the following formula:

[0100] n = D *π / N;

[0101] Where D is the diameter of the mobile platform's running wheels, and N is the encoder resolution.

[0102] The simultaneous display and storage function of the A / B display is to simultaneously store the full waveform of the A display echo of the injury exceeding the threshold setting during the ultrasonic signal processing. Subsequently, when the terminal control computer outputs the B display, the A display waveform can be exported synchronously for each B display injury point.

[0103] The rail test block is designed specifically for conventional probe wheels and center wheels, and its damage layout is as follows: Figure 5 As shown in Table 1, the detailed types and sizes of damage are as follows; in the actual test process, the probe only needs to quickly detect the corresponding rail test block and form the corresponding B-view image to complete the test.

[0104] Table 1: Types of Injuries

[0105]

[0106] Optionally, the ultrasonic probe mounting mechanism further includes a mechanical centering guide wheel and a probe position stop block, wherein: the mechanical centering guide wheel is used to press the ultrasonic probe against the inner side of the rail; the probe position stop block is used to physically limit the ultrasonic probe and control the ultrasonic probe to be installed at the target centering position.

[0107] Among them, in the mechanical device for installing the probe wheel, such as Figure 6As shown, the pressure adjustment knob for the probe wheel can be rotated to adjust the pressure. A limit nut is specially designed on the knob screw, and this limit nut is adjustable. Upon first use, the position of the phase nut can be adjusted so that the probe wheel is pressed down to the target position when the limit nut and the support plane are flush. Simultaneously, the 0°A waveform display in the probe wheel testing software features a dedicated interface wave monitoring boundary line and status indicator button. The reasonable range for the probe wheel pressure is typically 90µs - 92µs. When the 0° wafer interface wave falls within this range, the interface wave status indicator ring is green; otherwise, it is red, indicating that the user needs to readjust the probe wheel pressure.

[0108] In actual operation, the limit nut allows users to quickly and repeatedly adjust the pressure; meanwhile, the 0°A interface wave monitoring and status indication function provides signal-level indication and protection.

[0109] like Figure 7 As shown, the mechanical device for installing the probe wheel is designed with two mechanical centering rail wheels. When the user pushes the mechanical centering enable handle, the entire mechanical device of the probe wheel will automatically press against the inner side of the rail under the pulling force of the double springs, thereby realizing the mechanical centering function of the probe wheel.

[0110] To ensure that the probe is always in the optimal alignment position (i.e., the highest position of the bottom wave at 0°A) during each installation, both physical and signal-level design and considerations are taken into account.

[0111] First, the bottom of the V-groove for the probe wheel installation is designed with a probe wheel position stop block. When installing the probe wheel for the first time, the position of the stop block can be adjusted so that the bottom wave is at its highest when the probe wheel is pushed to the bottom. Then, the nut of the stop block is tightened, so that the probe wheel is basically in the optimal center position when it is installed again. There is no need to adjust the probe wheel lateral displacement adjustment knob or make minor adjustments.

[0112] This application also provides an example of a flaw detection test based on a four-probe structure, such as... Figure 8 As shown, the specific processing procedure includes the following steps:

[0113] Step S801: In response to the user's automatic gain confirmation operation for wave height, the interface wave is adjusted to the preset wave height, and the current gain parameter value of the current bottom wave is calculated through the bottom wave gain parameter algorithm.

[0114] Step S802: When the current gain parameter value is within the preset detection warning range, determine that the ultrasonic probe is in the position to be inspected.

[0115] Step S803: When the current gain parameter value is not within the preset detection warning range, adjust the displacement adjustment knob of the ultrasonic probe wheel and return to the step of calculating the current gain parameter value of the current bottom wave through the bottom wave gain parameter algorithm until the current gain parameter value is within the preset detection warning range, then stop the iteration process.

[0116] Step S804: Using an ultrasonic probe, collect the comprehensive amplitude of each visible damage point on the rail test block, and select the visible waveform of each visible damage point from the preset visible waveform of the rail test block.

[0117] Step S805: Based on the comprehensive amplitude of each visible damage point and the visible waveform of each visible damage point, the signal-to-noise ratio and the flaw detection sensitivity of each visible damage point are calculated using the flaw detection data calculation strategy.

[0118] Step S806: The signal-to-noise ratio and the flaw detection sensitivity of each visible damage point are used as the test results of the ultrasonic probe.

[0119] Step S807: Based on the test results of the probe wheel, generate the evaluation values ​​of each evaluation index through the state evaluation strategy.

[0120] Step S808: Based on the evaluation values ​​of each evaluation indicator and the standard values ​​of each evaluation indicator, identify the current evaluation status of each evaluation indicator.

[0121] Step S809: When the current evaluation state is an abnormal state, based on the evaluation value of the evaluation index corresponding to the abnormal state, identify the current abnormal information of the ultrasonic probe wheel, and use the current abnormal information of the ultrasonic probe wheel as the flaw detection test result corresponding to the probe wheel test result.

[0122] Step S810: If there is no abnormal state in the current evaluation state, the flaw detection test is qualified and is taken as the flaw detection test result corresponding to the test result of the probe wheel.

[0123] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0124] Based on the same inventive concept, this application also provides a flaw detection testing device based on a four-probe structure for implementing the flaw detection testing method based on the four-probe structure described above. The solution provided by this device is similar to the solution described in the above method. Therefore, the specific limitations of one or more flaw detection testing device embodiments based on a four-probe structure provided below can be found in the limitations of the flaw detection testing method based on a four-probe structure above, and will not be repeated here.

[0125] In one exemplary embodiment, such as Figure 9 As shown, a flaw detection test device based on a four-probe structure is provided, including: an adjustment module 910, a scanning module 920, and an evaluation module 930, wherein:

[0126] The adjustment module 910 is used to adjust the installation position of the ultrasonic probe wheel by means of an automatic gain strategy for wave height when the ultrasonic probe wheel is installed on the four-wheel mobile platform, so that the ultrasonic probe wheel is in the position to be inspected.

[0127] The scanning module 920 is used to perform damage scanning on the ultrasonic probe wheel when the four-wheel mobile platform moves automatically, and obtain the probe wheel test results of the ultrasonic probe wheel;

[0128] The evaluation module 930 is used to perform state evaluation processing on the test results of the ultrasonic test wheel based on the test wheel test results, through a state evaluation strategy, to obtain the flaw detection test results corresponding to the test wheel test results.

[0129] Optionally, the adjustment module 910 is specifically used for:

[0130] In response to the user's automatic gain confirmation operation for wave height, the interface wave is adjusted to the preset wave height, and the current gain parameter value of the current bottom wave is calculated through the bottom wave gain parameter algorithm;

[0131] When the current gain parameter value is within the preset detection warning range, it is determined that the ultrasonic probe is in the position to be inspected;

[0132] When the current gain parameter value is not within the preset detection warning range, adjust the displacement adjustment knob of the ultrasonic probe wheel and return to the step of calculating the current gain parameter value of the current bottom wave through the bottom wave gain parameter algorithm, until the current gain parameter value is within the preset detection warning range, and then stop the iteration process.

[0133] Optionally, the scanning module 920 is specifically used for:

[0134] The comprehensive amplitude of each visible damage point of the rail test block is collected by an ultrasonic probe, and the visible waveform of each visible damage point is selected from the preset visible waveform of the rail test block.

[0135] Based on the comprehensive amplitude of each visible damage point and the visible waveform of each visible damage point, the signal-to-noise ratio and the flaw detection sensitivity of each visible damage point are calculated using a flaw detection data calculation strategy.

[0136] The signal-to-noise ratio and the flaw detection sensitivity of each of the aforementioned visible defects are used as the test results of the ultrasonic probe.

[0137] Optionally, the evaluation module 930 is specifically used for:

[0138] Based on the test results of the probe, an evaluation value for each evaluation index is generated through a state evaluation strategy.

[0139] Based on the evaluation values ​​of each evaluation indicator and the standard evaluation values ​​of each evaluation indicator, the current evaluation status of each evaluation indicator is identified.

[0140] When the current evaluation state is abnormal, based on the evaluation value of the evaluation index corresponding to the abnormal state, the current abnormal information of the ultrasonic probe is identified, and the current abnormal information of the ultrasonic probe is used as the flaw detection test result corresponding to the probe test result.

[0141] If there is no abnormal state in the current evaluation, the flaw detection test will be deemed qualified and taken as the flaw detection test result corresponding to the test result of the probe wheel.

[0142] Each module in the aforementioned flaw detection test device based on the four-probe structure can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in the processor of a computer device in hardware form or independent of it, or stored in the memory of a computer device in software form, so that the processor can call and execute the corresponding operations of each module.

[0143] In one exemplary embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as follows: Figure 10As shown, the computer device includes a processor, memory, input / output interface, communication interface, display unit, and input device. The processor, memory, and input / output interface are connected via a system bus, and the communication interface, display unit, and input device are also connected to the system bus via the input / output interface. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The input / output interface is used for exchanging information between the processor and external devices. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, mobile cellular networks, NFC (Near Field Communication), or other technologies. When the computer program is executed by the processor, it implements a flaw detection test method based on a four-wheel structure. The display unit is used to form a visually visible image and can be a display screen, projection device, or virtual reality imaging device. The display screen can be an LCD screen or an e-ink screen. The input device of the computer device can be a touch layer covering the display screen, or buttons, trackballs, or touchpads set on the casing of the computer device, or external keyboards, touchpads, or mice, etc.

[0144] Those skilled in the art will understand that Figure 10 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0145] In one exemplary embodiment, a computer device is provided, including a memory and a processor, the memory storing a computer program, the processor executing the computer program to implement the steps of a flaw detection test method based on a four-probe structure.

[0146] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the steps of a flaw detection test method based on a four-probe structure.

[0147] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps of a flaw detection test method based on a four-probe structure.

[0148] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of the relevant data must comply with relevant regulations.

[0149] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments described above. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0150] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0151] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A flaw detection test method based on a four-probe wheel structure, characterized in that, The method includes: When the ultrasonic probe is installed on the four-wheel mobile platform, the installation position of the ultrasonic probe is adjusted by the automatic gain strategy of wave height so that the ultrasonic probe is in the position to be inspected. When the four-wheeled mobile platform moves automatically, damage scanning is performed on the ultrasonic probe wheel to obtain the probe wheel test results; Based on the test results of the ultrasonic probe, a condition assessment strategy is used to perform condition assessment processing on the test results to obtain the flaw detection test results corresponding to the test results.

2. The method according to claim 1, characterized in that, The step of adjusting the installation position of the ultrasonic probe wheel using an automatic gain control strategy to position the ultrasonic probe wheel in the flaw detection position includes: In response to the user's automatic gain confirmation operation for wave height, the interface wave is adjusted to the preset wave height, and the current gain parameter value of the current bottom wave is calculated through the bottom wave gain parameter algorithm; When the current gain parameter value is within the preset detection warning range, it is determined that the ultrasonic probe is in the position to be inspected; When the current gain parameter value is not within the preset detection warning range, adjust the displacement adjustment knob of the ultrasonic probe wheel and return to the step of calculating the current gain parameter value of the current bottom wave through the bottom wave gain parameter algorithm, until the current gain parameter value is within the preset detection warning range, and then stop the iteration process.

3. The method according to claim 2, characterized in that, The damage scanning process performed on the ultrasonic probe wheel to obtain the probe wheel test results includes: The comprehensive amplitude of each visible damage point of the rail test block is collected by an ultrasonic probe, and the visible waveform of each visible damage point is selected from the preset visible waveform of the rail test block. Based on the comprehensive amplitude of each visible damage point and the visible waveform of each visible damage point, the signal-to-noise ratio and the flaw detection sensitivity of each visible damage point are calculated using a flaw detection data calculation strategy. The signal-to-noise ratio and the flaw detection sensitivity of each of the aforementioned visible defects are used as the test results of the ultrasonic probe.

4. The method according to claim 3, characterized in that, The test results based on the ultrasonic probe wheel are processed using a condition assessment strategy to obtain the corresponding flaw detection test results, including: Based on the test results of the probe, an evaluation value for each evaluation index is generated through a state evaluation strategy. Based on the evaluation values ​​of each evaluation indicator and the standard evaluation values ​​of each evaluation indicator, the current evaluation status of each evaluation indicator is identified. When the current evaluation state is abnormal, based on the evaluation value of the evaluation index corresponding to the abnormal state, the current abnormal information of the ultrasonic probe is identified, and the current abnormal information of the ultrasonic probe is used as the flaw detection test result corresponding to the probe test result. If there is no abnormal state in the current evaluation, the flaw detection test will be deemed qualified and taken as the flaw detection test result corresponding to the test result of the probe wheel.

5. A flaw detection test system based on a four-probe wheel structure, characterized in that, The system includes an ultrasonic probe wheel, a four-wheeled mobile platform, an ultrasonic signal processing component, a terminal control computer, and a rail test block, wherein: The ultrasonic probe wheel includes a conventional wheel and a middle wheel. The conventional wheel is fixedly installed on the left side of the four-wheel mobile platform, and the middle wheel is installed on the right side of the four-wheel mobile platform. The four-wheeled mobile platform includes a moving star wheel, a probe wheel mounting mechanism, a battery, an encoder, and a coupling water tank; The probe installation mechanism is installed on the four-wheel mobile platform and is used to install the ultrasonic probe on the four-wheel mobile platform; The battery is connected to the ultrasonic signal processing component and is used to power the ultrasonic signal processing component. The coupling water tank is used to provide coupling water for the ultrasonic probe. The rail test block is positioned on both sides of the four-wheel mobile platform. The terminal control computer is connected to the four-wheel mobile platform, the ultrasonic signal processing component, and the rail test block, respectively. The terminal control computer is used to adjust the installation position of the ultrasonic probe wheel when it is installed on the four-wheel mobile platform, so that the ultrasonic probe wheel is in the position to be inspected; when the four-wheel mobile platform moves automatically, it performs damage scanning processing on the ultrasonic probe wheel to obtain the probe wheel test results; based on the probe wheel test results, it performs state evaluation processing on the probe wheel test results through a state evaluation strategy to obtain the flaw detection test results corresponding to the probe wheel test results.

6. The system according to claim 5, characterized in that, The probe wheel installation mechanism further includes a mechanical centering guide wheel and a probe wheel position stop block, wherein: The mechanical centering guide wheel is used to press the ultrasonic probe wheel tightly against the inner side of the rail. The ultrasonic probe position stop block is used to physically limit the ultrasonic probe and control the ultrasonic probe to be installed at the target center position.

7. A flaw detection test device based on a four-probe wheel structure, characterized in that, The device includes: The adjustment module is used to adjust the installation position of the ultrasonic probe wheel by means of an automatic gain strategy based on wave height when the ultrasonic probe wheel is installed on the four-wheel mobile platform, so that the ultrasonic probe wheel is in the position to be inspected. The scanning module is used to perform damage scanning on the ultrasonic probe wheel when the four-wheel mobile platform moves automatically, and to obtain the probe wheel test results of the ultrasonic probe wheel; The evaluation module is used to perform state evaluation processing on the ultrasonic probe test results based on the probe test results through a state evaluation strategy, so as to obtain the flaw detection test results corresponding to the probe test results.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 4.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 4.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 4.

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