Sapphire glass micro through hole processing method based on laser-induced etching process
By combining femtosecond laser modification and coaxial plasma activation with a three-stage etching process, the problems of controllability of the modified area and uneven etching rate in the processing of micro-vias in sapphire glass have been solved. This has enabled efficient and low-damage processing of high aspect ratio micro-vias, which is suitable for the manufacturing of sapphire devices in high-end fields.
Patent Information
- Application Number
- CN202610645427.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-05-12
- Publication Date
- 2026-06-23
AI Technical Summary
Existing laser-induced etching processes for processing micro-vias in sapphire glass suffer from problems such as poor controllability of the modified area, uneven etching rate, and poor process compatibility. They are difficult to achieve efficient and high-precision processing of micro-vias with high aspect ratios, and have poor adaptability and high cost.
By employing femtosecond laser precision modification, coaxial plasma activation, and a three-stage etching process, combined with a domestically produced femtosecond laser module, and by limiting laser parameters and etching solution ratios, high-precision modification and selective etching of sapphire glass are achieved. Combined with low-temperature annealing, processing quality and efficiency are ensured.
It achieves high aspect ratio and low damage processing of sapphire glass micro-vias, with high processing precision, low cost, and strong adaptability. It is suitable for high-end fields such as all-sapphire fiber optic Fabry-Perot cavity high-temperature pressure sensors and LED packaging, meeting the requirements of extreme environments.