Test device and working machine

Abstract

This invention provides a testing apparatus and a working machine, comprising a testing mechanism, a crimping mechanism, and a temperature control mechanism. The testing mechanism has a test seat with a support portion for holding electronic components. The crimping mechanism has a connector for crimping the electronic components in the test seat to perform testing operations. The temperature control mechanism has a first temperature control unit and a second temperature control unit. The first temperature control unit has a first temperature controller for temperature control of the connector. The second temperature control unit has a first flow channel with an intermediate fluid in the connector, and the intermediate fluid exchanges heat with the connector for energy reuse to achieve a preset test temperature. The intermediate fluid is then transported by a conveyor to a second flow channel located in the test seat. The second flow channel blows the intermediate fluid with the preset test temperature to the support portion of the test seat to temperature control the electronic components, thereby saving temperature control energy costs.

Description

Technical Field

[0001] This invention relates to a testing device that saves energy costs and is space-efficient. Background Technology

[0002] Currently, electronic components undergo cold or hot testing in testing equipment to eliminate defective products. Taking cold testing as an example, the testing equipment is equipped with an electrically connected circuit board and a test socket with probes for holding and testing electronic components. Above the test socket, a pressure fixture capable of Z-axis displacement is arranged to press the electronic components onto the test socket. A temperature controller with refrigerant is installed on the top surface of the pressure fixture. The refrigerant temperature control of the pressure fixture maintains a preset low test temperature. The pressure fixture presses against the electronic components to perform heat exchange, so that the electronic components maintain the preset low test temperature and perform cold testing on the test socket.

[0003] Because the probes of the test socket are made of metal, the multiple contacts on the bottom surface of the electronic component exchange heat with the multiple probes, conducting low temperatures and causing the temperature of the electronic component to deviate from the preset test temperature. Therefore, manufacturers have opened through holes on the side of the test socket's support portion and independently configured a dedicated high-low temperature circulation machine to supply low-temperature gas to the support portion of the test socket, so that the bottom surface of the electronic component is placed in the low-temperature environment of the support portion for cold testing. However, the high-low temperature circulation machine dedicated to providing the low-temperature gas for the test socket is not only expensive, increasing the energy cost of the testing equipment, but also, especially when there are many testing devices, more expensive high-temperature circulation machines are required, which will inevitably increase energy costs significantly. Furthermore, manufacturers also need to plan a separate area to place the high-low temperature circulation machine, which occupies a considerable amount of space. If multiple high-low temperature circulation machines are configured, it will be even more inconvenient for the space configuration of the testing equipment. Summary of the Invention

[0004] The purpose of this invention is to provide a testing device.

[0005] This invention provides a testing device, characterized in that it comprises:

[0006] At least one testing facility: at least one test stand with a support portion is provided for holding and testing electronic components;

[0007] At least one crimping mechanism: at least one mounting device and at least one connector are provided, the mounting device being capable of assembling the connector, and the connector being capable of crimping the electronic component of the test socket;

[0008] At least one temperature control mechanism: A first temperature control unit and a second temperature control unit are provided. The first temperature control unit is configured with at least one first temperature controller above and / or inside the connector for temperature control of the connector. The second temperature control unit includes at least one first flow channel, at least one second flow channel, and at least one conveyor. The intermediate fluid in the first flow channel can exchange heat with the first temperature controller or the connector to have a preset test temperature. The second flow channel is provided in the test seat for inputting the intermediate fluid to the receiving part. The conveyor can transport the intermediate fluid with the preset test temperature between the first flow channel and the second flow channel.

[0009] The testing apparatus, wherein: the second temperature control unit of the temperature control mechanism has the first flow channel inside the connector for conveying the intermediate fluid.

[0010] The testing apparatus, wherein: the second temperature control unit of the temperature control mechanism is provided with a first intermediate tube having the first flow channel on the bottom surface of the connector for conveying the intermediate fluid.

[0011] The testing apparatus, wherein: the second temperature control unit of the temperature control mechanism provides a first intermediate tube having the first flow channel between the connector and the first temperature controller for conveying the intermediate fluid.

[0012] The testing device, wherein: the second temperature control unit of the temperature control mechanism is provided with a second intermediate tube having the second flow channel on the top surface of the test seat, the second flow channel being able to deliver the intermediate fluid having a preset test temperature toward the receiving part.

[0013] The testing apparatus wherein: the second temperature control unit of the temperature control mechanism is provided with the second flow channel on at least one side plate of the test seat, which is capable of delivering the intermediate fluid to the receiving part.

[0014] The testing apparatus, wherein the conveyor of the temperature control mechanism is provided with at least one conveying pipe, which can connect the first flow channel and the second flow channel.

[0015] The testing apparatus, wherein: at least one of the delivery tubes comprises a plurality of delivery tubes, the fixed ends of the plurality of delivery tubes are respectively fixed to the first flow channel or the second flow channel, and the free ends can be connected or separated from each other.

[0016] The testing apparatus wherein the holder of the crimping mechanism is capable of driving the connector to move in at least one direction.

[0017] The present invention also provides a work machine, characterized in that it comprises:

[0018] Machine tool;

[0019] Feeding device: disposed on the machine and equipped with at least one feeder for accommodating at least one electronic component to be tested;

[0020] Material receiving device: disposed on the machine and provided with at least one material receiving device for accommodating at least one measured electronic component;

[0021] At least one of the aforementioned testing devices is configured on the machine tool for testing, crimping, and temperature control of at least one of the electronic components;

[0022] Transfer device: disposed on the machine tool and provided with at least one transfer device for transferring at least one of the electronic components;

[0023] Central control unit: Used to control and integrate the operation of various devices to perform automated operations.

[0024] With the above structure, the temperature control mechanism utilizes the connector and the first temperature control unit for energy reuse, while the intermediate fluid of the second temperature control unit has a preset test temperature. The intermediate fluid with the preset test temperature is delivered to the test socket to control the temperature control electronic components. There is no need to configure an expensive and dedicated high and low temperature cycle machine, thus achieving the practical benefit of saving energy costs.

[0025] In a preferred embodiment of the present invention, a testing device is provided in which a second temperature control unit of the temperature control mechanism is combined with a first temperature control unit and a connector to reuse energy so that the intermediate fluid has a preset test temperature, and the intermediate fluid with the preset test temperature is input into the support part of the test seat for temperature control electronic components. There is no need to plan a dedicated area to place the high and low temperature cycle machine, thus achieving practical benefits that are conducive to space configuration. Attached Figure Description

[0026] Figure 1 This is a schematic diagram of the first embodiment of the testing device of the present invention.

[0027] Figure 2 This is a schematic diagram (a) of the use of the testing device of the present invention.

[0028] Figure 3 This is a schematic diagram (II) of the use of the testing device of the present invention.

[0029] Figure 4 This is a schematic diagram of a second embodiment of the testing device of the present invention.

[0030] Figure 5 This is a schematic diagram of the machine used in this invention.

[0031] Explanation of reference numerals in the attached drawings: Test device 10; Circuit board 11; Test base 12; Support 121; Side plates 122, 123; Probe 124; Transfer arm 13; Pressing fixture 14; First temperature controller 15; Body 151; Chamber 152; Sealing plate 153; Fin 154; Input pipe 155; Output pipe 156; First flow channel 161; First tube body 162; First flow section 163; Second flow section 164; Second tube body 165; First conveying pipe 171; Second conveying pipe 172; First joint 1721; Third conveying pipe 173; Second joint 1731; Electronic component 20; Contact 21; Machine base 30; Feeding device 40; Receiving device 50; Transfer device 60; First transferor 61; Second transferor 62; Third transferor 63. Detailed Implementation

[0032] To provide a better understanding of the present invention, a preferred embodiment is described in detail below with reference to the accompanying drawings:

[0033] Please see Figure 1 The present invention provides a testing device 10, which includes at least one testing mechanism, at least one pressing mechanism and at least one temperature control mechanism.

[0034] At least one testing facility is provided with at least one test stand with a support portion for holding and testing electronic components.

[0035] In this embodiment, the testing mechanism is provided with an electrically connected circuit board 11 and a test base 12. The test base 12 has a recessed support portion 121 from the top surface to the bottom surface. A plurality of side plates 122 and 123 are formed around the periphery of the support portion 121. A plurality of probes 124 are provided on the bottom surface of the support portion 121. One end of the plurality of probes 124 protrudes from the support portion 121 to make contact with the contacts of an electronic component (not shown in the figure), and the other end is electrically connected to the circuit board 11. The circuit board 11 can perform testing operations on the electronic component through the probes 124 of the test base 12.

[0036] At least one crimping mechanism is provided with at least one mounting device and at least one connector, the mounting device being capable of assembling the connector, and the connector being capable of crimping the electronic components of the test socket.

[0037] Depending on the operational requirements, the mounting device can be configured as a fixed unit or as a movable unit capable of moving the connector in at least one direction. For example, if the mounting device is a fixed unit, the test base 12 can move relative to the mounting device. Alternatively, the mounting device can be a transfer arm capable of moving in at least one direction, and can move relative to the test base 12. Of course, it is also permissible for the mounting device and the test base to move relative to each other.

[0038] In this embodiment, the mounting device is a transfer arm 13, which is driven by a drive source (not shown) to move in the Z direction. Furthermore, the drive source may be a linear motor, a pressure cylinder, or include a motor and at least one transmission assembly, which may be a pulley assembly or a screw and socket assembly.

[0039] Depending on the operational requirements, the connector can perform either a simple crimping operation on electronic components or a combination of crimping and transfer operations. For example, the connector may have a crimping fixture for crimping electronic components. Alternatively, the connector may have a crimping fixture with a suction port for crimping and transferring electronic components. In this embodiment, the connector is a crimping fixture 14 for crimping electronic components, and the crimping fixture 14 can be moved in the Z-direction by the transfer arm 13.

[0040] Depending on the operational requirements, at least one float (not shown in the figure) can be configured between the connector and the mounting device. The float can cause the connector to float in at least one direction, thereby buffering and / or fine-tuning the accurate crimping of electronic components.

[0041] At least one temperature control mechanism is provided with a first temperature control unit and a second temperature control unit. The first temperature control unit is provided with at least one first temperature controller above and / or inside the connector for temperature control of the connector. The second temperature control unit includes at least one first flow channel, at least one second flow channel and at least one conveyor. The intermediate fluid in the at least one first flow channel can exchange heat with the first temperature controller or the connector to have a preset test temperature. The at least one second flow channel is provided in the test seat for inputting intermediate fluid to the receiving part. The conveyor can transport intermediate fluid with a preset test temperature between the first flow channel and the second flow channel.

[0042] Depending on the operational requirements, the interior of the first flow channel is equipped with multiple fins to increase the heat exchange area.

[0043] Depending on the operational requirements, the first temperature controller may be a heating element, a cooling wafer, or a device containing a first fluid (e.g., a refrigerant); for example, the first temperature controller may be a device containing a first fluid and may be disposed above the connector. For example, the first temperature controller may be a cooling wafer or a heating element and may be disposed inside the connector; this is not limited to this embodiment.

[0044] In this embodiment, a first temperature control unit is configured with a first temperature controller 15 above the pressure fixture 14. The body 151 of the first temperature controller 15 has a recessed chamber 152 extending from the bottom to the top to accommodate the fins 154 of the sealing plate 153. The sealing plate 153 can seal the bottom surface of the chamber 152. The first temperature controller 15 has an input pipe 155 communicating with the chamber 152 in its body 151 to input a first fluid (such as refrigerant) with a preset test temperature into the chamber 152. The refrigerant can exchange heat with the fins 154 and the pressure fixture 14, thereby giving the pressure fixture 14 the preset test temperature. The first temperature controller 15 has an output pipe 156 communicating with the chamber 152 in its body 151 to output the heat-exchanged first fluid.

[0045] Depending on the operational requirements, the second temperature control unit can have a first flow channel inside the connector to transport the intermediate fluid and allow the intermediate fluid to exchange heat with the connector to achieve a preset test temperature. For example, the first flow channel can be opened inside the pressure fixture 14.

[0046] According to the operational requirements, the second temperature control unit can be configured with a first intermediate tube (not shown in the figure) with a first flow channel at an appropriate position on the bottom surface of the connector to transport the intermediate fluid and allow the intermediate fluid to exchange heat with the connector at a preset test temperature.

[0047] Depending on the operational requirements, the second temperature control unit can be configured with a first intermediate pipe (not shown) having a first flow channel between the connector and the first temperature controller 15 for conveying intermediate fluid.

[0048] As mentioned above, the intermediate fluid can be a gas at room temperature. For example, the room temperature gas supply equipment currently configured on the test machine provides room temperature gas as the intermediate fluid.

[0049] In this embodiment, the second temperature control unit has a first flow channel 161 arranged in the X direction inside the pressure fixture 14. The first inlet of the first flow channel 161 is connected to the first tube 162. The first tube 162 is connected to the test machine (not shown in the figure). The existing room temperature gas supply equipment provides room temperature gas as an intermediate fluid for inputting the room temperature intermediate fluid into the first flow channel 161. The first outlet of the first flow channel 161 is connected to the conveyor, so that the intermediate fluid that has been heat exchanged and has a preset test temperature can be output.

[0050] Depending on the operational requirements, the second temperature control unit can open a second flow channel communicating with the receiving portion 121 on at least one side plate of the test holder 12, so as to input the intermediate fluid with a preset test temperature into the receiving portion 121.

[0051] Depending on the operational requirements, the second temperature control unit can be provided with a second intermediate tube (not shown in the figure) having a second flow channel on the top surface of the test base 12, and the second outlet of the second flow channel can be directed toward the receiving part 121 to deliver intermediate fluid.

[0052] In this embodiment, the second temperature control unit is provided with a second flow channel in the test base 12. The second flow channel includes a first flow section 163 and a second flow section 164. The first flow section 163 is arranged in the X direction inside one side plate 122 of the test base 12 and communicates with the receiving part 121 so as to input the intermediate fluid with a preset test temperature into the receiving part 121. The second flow section 164 is arranged in the X direction inside the other side plate 123 of the test base 12. One end of the second flow section 164 communicates with the receiving part 121 and the other end is connected to the second tube 165 so as to output the heat-exchanged intermediate fluid of the receiving part 121.

[0053] Depending on the operational requirements, the conveyor is equipped with at least one conveying pipe that can connect the first flow channel 161 and the second flow channel to convey an intermediate fluid with a preset test temperature.

[0054] In this embodiment, the conveying pipe of the conveyor is a first conveying pipe 171. One end of the first conveying pipe 171 is connected to the first outlet of the first flow channel 161, and the other end is connected to the first flow section 163 of the second flow channel. The first conveying pipe 171 can convey the intermediate fluid with a preset test temperature in the first flow channel 161 to the first flow section 163 of the second flow channel.

[0055] Please see Figure 2 , Figure 3 The test base 12 of the test device 10 supports the electronic component 20 to be tested in the support portion 121. The contact 21 of the electronic component 20 is electrically connected to the probe 124 of the test base 12. The input pipe 155 of the first temperature controller 15 of the temperature control mechanism introduces refrigerant into the chamber 152. The refrigerant in the chamber 152 exchanges heat with the pressure fixture 14 through the sealing plate 153, so that the pressure fixture 14 maintains the preset test temperature.

[0056] Since the first flow channel 161 of the temperature control mechanism is located inside the pressure fixture 14, the existing ambient temperature gas supply equipment of the testing machine (not shown) inputs ambient temperature intermediate fluid into the first flow channel 161 through the first pipe 162. Utilizing the preset test temperature of the pressure fixture 14 for energy reuse, the intermediate fluid in the first flow channel 161 exchanges heat with the pressure fixture 14, causing the intermediate fluid to cool from ambient temperature to the preset test temperature. The first flow channel 161 then outputs the intermediate fluid with the preset test temperature to the first delivery pipe 17. 1. The first delivery pipe 171 delivers the intermediate fluid to the first flow section 163 of the second flow channel. The first flow section 163 inputs the intermediate fluid with a preset test temperature into the support part 121 of the test socket 12, so that the intermediate fluid with a preset test temperature flows between the bottom surface of the electronic component 20 and the support part 121, thereby controlling the temperature of the bottom surface of the electronic component 20, the plurality of solder balls 21 and the plurality of probes 124 of the test socket 12. There is no need to separately configure an expensive high and low temperature cycle machine, achieving the practical benefit of saving energy costs.

[0057] Therefore, the transfer arm 13 of the pressing mechanism drives the first temperature controller 15, the pressing fixture 14 and the first flow channel 161 to move downward in the Z direction, so that the pressing fixture 14 presses the top surface of the electronic component 20. The first temperature controller 15 of the temperature control mechanism controls the temperature of the electronic component 20 through the pressing fixture 14, and in conjunction with the second flow channel, it inputs an intermediate fluid with a preset test temperature to the support part 121 of the test seat 12 to control the temperature of the electronic component 20, thereby ensuring that the electronic component 20 maintains the preset test temperature in the test seat 12 to perform cold testing.

[0058] After the intermediate fluid input into the support portion 121 of the test base 12 undergoes heat exchange with the electronic components 20 and probes 124, the second temperature control unit can output the heat-exchanged intermediate fluid through the second flow section 164 of the second flow channel to the second tube 165, and then discharge it from the second tube 165.

[0059] Please see Figure 4 The second embodiment of the test device 10 of the present invention is designed in a manner similar to the first embodiment, except that the conveyor of the temperature control mechanism includes a plurality of conveying tubes, the fixed ends of the plurality of conveying tubes are respectively fixed to the first flow channel 161 or the second flow channel, while the free ends can be connected or separated from each other.

[0060] In this embodiment, the plurality of delivery pipes include a second delivery pipe 172 and a third delivery pipe 173. The fixed end of the second delivery pipe 172 is connected to the first outlet of the first flow channel 161, and the free end is provided with a first joint 1721. The fixed end of the third delivery pipe 173 is connected to the first flow section 163 of the second flow channel, and the free end is provided with a second joint 1731. The first joint 1721 and the second joint 1731 can be connected to or separated from each other. When connected to each other, the second delivery pipe 172 and the third delivery pipe 173 can reliably deliver the intermediate fluid. When separated from each other, it is convenient to replace the connector (e.g., replace the pressure jig 14 of different sizes) to improve ease of use.

[0061] Please see Figures 1-3 and Figure 5The testing device 10 of the present invention is applied to an electronic component processing machine. The processing machine includes a machine base 30, a feeding device 40, a receiving device 50, a testing device 10, a transfer device 60, and a central control device (not shown in the figure). The feeding device 40 is disposed on the machine base 30 and is provided with at least one feeder to accommodate at least one electronic component to be tested. The receiving device 50 is disposed on the machine base 30 and is provided with at least one receiver to accommodate at least one electronic component that has already been tested. The testing device 10 of the present invention is disposed on the machine base 30 and includes at least one testing mechanism, at least one crimping mechanism, and... At least one temperature control mechanism and at least one testing mechanism are provided with a test seat 12 having a support portion 121 for supporting and testing electronic components. At least one crimping mechanism is provided with at least one mounting device and at least one connector. The mounting device can assemble the connector, and the connector can crimp the electronic components of the test seat 12. At least one temperature control mechanism is provided with a first temperature control unit and a second temperature control unit. The first temperature control unit has at least one first temperature controller disposed above and / or inside the connector for temperature control of the connector. The second temperature control unit includes at least one first flow channel 161, at least one second flow channel, and... The first flow channel 161, with one less conveyor, allows the intermediate fluid to exchange heat with the first temperature controller 15 or connector to achieve a preset test temperature. A second flow channel is located on the test seat 12 to allow the intermediate fluid to be input to the receiving portion 121. The conveyor can transport the intermediate fluid with the preset test temperature between the first flow channel 161 and the second flow channel. A transfer device 60 is mounted on the machine base 30 and includes at least one transferor for transferring electronic components. In this embodiment, the transfer device 60 includes a first transferor 61 to extract the electronic component to be tested from the feeder of the feeding device 40. The components are transferred to the second transfer unit 62, and the third transfer unit 63 transports the electronic components to be tested to the test socket 12 of the test device 10 for testing. The third transfer unit 63 moves the tested electronic components into the second transfer unit 62, and the first transfer unit 61 takes out the tested electronic components from the second transfer unit 62. According to the test results, the tested electronic components are transported to the receiver of the receiving device 50 for sorting and storage. The central control device (not shown) is used to control and integrate the operation of each device to perform automated operation and achieve the practical benefit of improving work efficiency.

Claims

1. A testing device, characterized in that, Include: At least one testing facility: at least one test stand with a support portion is provided for holding and testing electronic components; At least one crimping mechanism: at least one mounting device and at least one connector are provided, the mounting device being capable of assembling the connector, and the connector being capable of crimping the electronic component of the test socket; At least one temperature control mechanism: A first temperature control unit and a second temperature control unit are provided. The first temperature control unit is configured with at least one first temperature controller above and / or inside the connector for temperature control of the connector. The second temperature control unit includes at least one first flow channel, at least one second flow channel, and at least one conveyor. The intermediate fluid in the first flow channel can exchange heat with the first temperature controller or the connector to have a preset test temperature. The second flow channel is provided in the test seat for inputting the intermediate fluid to the receiving part. The conveyor can transport the intermediate fluid with the preset test temperature between the first flow channel and the second flow channel.

2. The testing apparatus as described in claim 1, characterized in that: The second temperature control unit of the temperature control mechanism has the first flow channel inside the connector for conveying the intermediate fluid.

3. The testing apparatus as described in claim 1, characterized in that: The second temperature control unit of the temperature control mechanism is provided with a first intermediate tube having the first flow channel on the bottom surface of the connector for conveying the intermediate fluid.

4. The testing apparatus as described in claim 1, characterized in that: The second temperature control unit of the temperature control mechanism provides a first intermediate tube with the first flow channel between the connector and the first temperature controller for conveying the intermediate fluid.

5. The testing apparatus as described in claim 1, characterized in that: The second temperature control unit of the temperature control mechanism is provided with a second intermediate tube having the second flow channel on the top surface of the test seat. The second flow channel can deliver the intermediate fluid with a preset test temperature toward the support part.

6. The testing apparatus as described in claim 1, characterized in that: The second temperature control unit of the temperature control mechanism has the second flow channel on at least one side plate of the test seat, which can deliver the intermediate fluid to the receiving part.

7. The testing apparatus as described in claim 1, characterized in that: The conveyor of the temperature control mechanism is provided with at least one conveying pipe that can connect the first flow channel and the second flow channel.

8. The testing apparatus as described in claim 7, characterized in that: At least one of the conveying pipes comprises a plurality of the conveying pipes, the fixed ends of the plurality of the conveying pipes being fixed to the first flow channel or the second flow channel respectively, while the free ends are capable of being connected or separated from each other.

9. The testing apparatus as described in claim 1, characterized in that: The mounting device of the crimping mechanism can drive the connector to move in at least one direction.

10. A work machine, characterized in that, Include: Machine tool; Feeding device: disposed on the machine and equipped with at least one feeder for accommodating at least one electronic component to be tested; Material receiving device: disposed on the machine and provided with at least one material receiving device for accommodating at least one measured electronic component; At least one testing device as described in claim 1: disposed on the machine tool for testing, pressing and temperature control of at least one of the electronic components; Transfer device: disposed on the machine tool and provided with at least one transfer device for transferring at least one of the electronic components; Central control unit: Used to control and integrate the operation of various devices to perform automated operations.

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