Test system and method for device response time in black light factory
By combining a test fixture, robotic arm, and controller, the response time testing of equipment in a lights-out factory is automated, solving the problems of high cost and low efficiency caused by manual operation and achieving fully automated testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- STATE NUCLEAR POWER AUTOMATION SYST ENGCO
- Filing Date
- 2026-03-20
- Publication Date
- 2026-06-23
Smart Images
Figure CN122261104A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of automated testing technology, and in particular to a testing system and method for testing the response time of equipment in a dark factory. Background Technology
[0002] Response time testing is a necessary test item for "unattended, autonomous closed-loop, and data-connected" dark factory equipment. Traditionally, testing is carried out by connecting a multi-channel signal generator, an oscilloscope, and the equipment under test. According to the test procedure, the tester needs to manually modify the input value of the multi-channel signal generator to generate a stop signal or a dedicated signal, and record the response time on the oscilloscope by waveform.
[0003] However, after each test, the tester needs to manually reset the device, and after completing multiple tests for the same item, the tester needs to rewire the device under test. This increases the risk of human error, increases testing costs, and reduces testing efficiency. Summary of the Invention
[0004] The technical problem to be solved by the present invention is to overcome the shortcomings of existing technologies in equipment downtime and dedicated function response time testing, which are characterized by high cost and low efficiency of manual testing, and to provide a testing system and method for equipment response time in dark factories.
[0005] The present invention solves the above-mentioned technical problems through the following technical solution:
[0006] In a first aspect, the present invention provides a testing system for equipment response time in a lights-out factory, the testing system comprising a testing fixture, a robotic arm, and a controller; the robotic arm, the controller, and the testing fixture are electrically connected.
[0007] The controller is used to send control commands to the test fixture;
[0008] The test fixture is used to send test signals to all devices under test in the lights-out factory to perform device response time tests according to pre-compiled test cases when the control command is received, and to send a test report to the controller; the device response time test includes a shutdown function response time test and a dedicated function response time test;
[0009] And after a single device response time test is completed, a reset command is sent to the robotic arm;
[0010] The robotic arm is used to reset the stop signal and dedicated signal generated by the device under test when the reset command is received;
[0011] The controller is also used to calculate the shutdown function response time and the dedicated function response time based on the test report.
[0012] Preferably, the shutdown function response time test includes at least one of the following: intermediate range neutron flux rate reactor shutdown test, reactor coolant pump low speed reactor shutdown test, and pressurizer high pressure reactor shutdown test; the dedicated function response time test includes at least one of neutron flux rate doubling, RCP bearing water temperature, and containment radiation dose rate.
[0013] Preferably, the control commands include at least one of the following: start control command, equipment test and change control command, mid-process sleep control command, test count cycle command, and test function change control command; the test signals include at least one of the following: voltage signal, current signal, pulse RTD signal, and thermocouple signal.
[0014] Preferably, the test report includes the first time when the device under test receives the voltage signal, the second time when the device under test issues a shutdown signal, the third time when the device under test receives the pulse RTD signal, and the fourth time when the device under test issues a dedicated signal.
[0015] The controller is further configured to calculate the shutdown function response time based on the first time and the second time, and to calculate the dedicated function response time based on the third time and the fourth time.
[0016] Preferably, the test fixture is further configured to send an initialization signal to the device under test without a stack stop and without a dedicated state when it receives an initialization command sent by the controller.
[0017] Secondly, the present invention provides a method for testing equipment response time in a lights-out factory, implemented using the equipment response time testing system for a lights-out factory as described in the first aspect, the testing method comprising:
[0018] The controller sends control commands to the test fixture;
[0019] When the test fixture receives the control command, it sends test signals to all devices under test in the lights-out factory to perform device response time tests according to pre-compiled test cases, and sends a test report to the controller; the device response time test includes a stop function response time test and a dedicated function response time test; and after a single device response time test is completed, it sends a reset command to the robotic arm;
[0020] When the robotic arm receives the reset command, it resets the stop signal and dedicated signal generated by the device under test.
[0021] The controller calculates the shutdown function response time and the dedicated function response time based on the test report.
[0022] Preferably, the shutdown function response time test includes at least one of the following: intermediate range neutron flux rate reactor shutdown test, reactor coolant pump low speed reactor shutdown test, and pressurizer high pressure reactor shutdown test; the dedicated function response time test includes at least one of neutron flux rate doubling, RCP bearing water temperature, and containment radiation dose rate.
[0023] Preferably, the control commands include at least one of the following: start control command, equipment test and change control command, mid-process sleep control command, test count cycle command, and test function change control command; the test signals include at least one of the following: voltage signal, current signal, pulse RTD signal, and thermocouple signal.
[0024] Preferably, the test report includes the first time the device under test (DUT) receives the voltage signal, the second time the DUT issues a shutdown signal, the third time the DUT receives the pulsed RTD signal, and the fourth time the DUT issues a dedicated signal. The step of calculating the shutdown function response time and the dedicated function response time based on the test report includes:
[0025] The controller calculates the shutdown function response time based on the first time and the second time, and calculates the dedicated function response time based on the third time and the fourth time.
[0026] Preferably, the test method further includes:
[0027] When the test fixture receives the initialization command sent by the controller, it sends an initialization signal to the device under test indicating no stack stoppage and no dedicated state.
[0028] The significant advantages of this invention are: it provides a testing system and method for equipment response time in a dark factory environment. Using a test fixture, test signals are sent to all devices under test (DUTs) within the dark factory according to pre-compiled test cases to test their response time, and a test report is sent to the controller. The controller calculates the response time of the shutdown function and the response time of the dedicated function based on the test report. This invention achieves fully automated response time testing in a dark factory environment, eliminating frequent manual wiring and reset operations, reducing manual testing costs, and improving testing efficiency. Attached Figure Description
[0029] Figure 1 This is a schematic diagram of the equipment response time testing system for a dark factory according to Embodiment 1 of the present invention.
[0030] Figure 2 This is the first flowchart of a testing method for equipment response time in a dark factory according to Embodiment 2 of the present invention.
[0031] Figure 3 This is a second flowchart of the testing method for equipment response time in a dark factory according to Embodiment 2 of the present invention.
[0032] Figure 4 This is a schematic diagram of the robotic arm resetting in the equipment response time test method for a dark factory according to Embodiment 2 of the present invention. Detailed Implementation
[0033] The present invention will be further illustrated by way of embodiments below, but the present invention is not limited to the scope of the embodiments described herein.
[0034] Example 1
[0035] This embodiment provides a testing system for equipment response time in a lights-out factory, referring to... Figure 1 The testing system includes a test fixture 101, a robotic arm 102, and a controller 103; the robotic arm 102 and the controller 103 are electrically connected to the test fixture 101.
[0036] Controller 103 is used to send control commands to test fixture 101;
[0037] Test fixture 101 is used to send test signals to all devices under test in the lights-out factory to perform device response time tests according to pre-compiled test cases when a control command is received, and to send a test report to controller 103; the device response time test includes the shutdown function response time test and the dedicated function response time test;
[0038] And after the single device response time test is completed, a reset command is sent to the robotic arm 102;
[0039] The robotic arm 102 is used to reset the stop signal and dedicated signal generated by the device under test when a reset command is received;
[0040] The controller 103 is also used to calculate the shutdown function response time and the dedicated function response time based on the test report.
[0041] Among them, the shutdown function response time test includes at least one of the following: intermediate range neutron flux rate reactor shutdown test, reactor coolant pump low speed reactor shutdown test, and pressurizer high pressure reactor shutdown test; the dedicated function response time test includes at least one of the following: neutron flux rate doubling, RCP bearing water temperature, and containment radiation dose rate.
[0042] The control commands include at least one of the following: start control command, equipment test and replacement control command, mid-term sleep control command, test cycle command, and test function replacement control command; the test signals include at least one of the following: voltage signal, current signal, pulse RTD signal, and thermocouple signal.
[0043] In this embodiment, the test fixture 101 is electrically connected to the device under test (DUT) within the lights-out factory. Based on several test cases pre-compiled according to shutdown or dedicated function test procedures, it sends test signals to all DUTs within the lights-out factory to perform device response time tests. It then sends test reports for each DUT after the shutdown function response time test and the dedicated function response time test to the controller 103, enabling the controller 103 to calculate the response time based on the test reports. After the test fixture 101 completes the single test corresponding to the shutdown function response time test or the dedicated function response time test for each DUT, it sends a reset command to the robotic arm 102. Upon receiving the reset command, the robotic arm 102 clicks the reset button on the current DUT.
[0044] If testing needs to be started, controller 103 sends a start control command to test fixture 101 to control test fixture 101 to start equipment response time testing; if testing needs to be paused midway, controller 103 sends a midway sleep control command to test fixture 101; if the number of tests needs to be adjusted, controller 103 sends a test number cycle command to test fixture 101; if the device under test needs to be replaced, controller 103 sends an equipment test change control command to test fixture 101; if the test function needs to be changed from reactor shutdown function response time test to dedicated function response time test, controller 103 sends a test function change control command to test fixture 101.
[0045] When the test fixture 101 receives a control command, it sends voltage signals, current signals, pulsed RTD signals, and thermocouple signals to all devices under test in the lights-out factory according to pre-compiled test cases to perform device response time tests. The voltage signal can be used to characterize the reactor shutdown function response time test, and the current signal can be used to characterize the dedicated function response time test. The pulsed RTD signal can also be used to characterize the reactor shutdown function response time test, and the thermocouple signal can be used to characterize the dedicated function response time test. During the reactor shutdown function response time test and the dedicated function response time test, the voltage signal, current signal, pulsed RTD signal, and thermocouple signal can be arbitrarily interchanged.
[0046] For example, the process of using a test system to perform shutdown function tests is illustrated by taking the intermediate range neutron flux rate reactor shutdown test, the low speed reactor coolant pump reactor shutdown test, and the high pressure pressurizer reactor shutdown test as examples of shutdown function response time testing; the process of using a test system to perform dedicated function tests is illustrated by taking the RCP bearing water temperature test as an example of dedicated function response time testing.
[0047] During the intermediate-range neutron flux rate reactor shutdown test, test fixture 101 excites a voltage signal of 3.446V to the IRMSV (intermediate-range neutron flux rate) of the ACD sequence of the device under test, and excites a voltage signal of 3.549V to the IRMSV of the B sequence of the device under test, so that it generates an intermediate-range neutron flux rate reactor shutdown signal. The device under test is in normal operating condition and there is no shutdown signal.
[0048] Test fixture 101 changes the voltage of the IRMSV signal of sequence A of the device under test (DUT) to 3.549V and records the first time the signal is transmitted. At this time, both sequences A and B of the DUT generate intermediate-range neutron flux rate reactor shutdown signals. After a 4-out-of-2 logic function, the DUT generates a shutdown signal, and the second time the shutdown occurs is recorded. Finally, the response time waveform of the shutdown (e.g., signal name 52-UV-A1) is measured and recorded. Test fixture 101 sends a 3.446V voltage signal to the IRMSV of sequence ABCD of the DUT to eliminate the shutdown condition and sends a reset command to robotic arm 102. After receiving the reset command, robotic arm 102 clicks a button to clear the latched shutdown signal. Controller 103 calculates the first response time of the shutdown function based on the aforementioned first and second times.
[0049] During the reactor shutdown test at low reactor coolant pump speed, test fixture 101 excites a 119.4375Hz pulse signal to the RCS-ST281 (RCS pump speed) of the ABD sequence of the device under test, and the RCS-ST281 of the C sequence of the device under test is excited at 108.0625Hz, causing the reactor coolant pump to shut down at low speed. The device under test is in normal operating condition and there is no shutdown signal.
[0050] Test fixture 101 changes the pulse of the RCS-ST281 signal of the device under test (DUT) A sequence to 108.0625Hz, records the first time the signal is sent, and at this time, after the AC sequence of the DUT undergoes a 4-out-of-2 logic, the DUT generates a shutdown signal, recording the second time the shutdown occurs. Finally, the response time waveform of the shutdown (e.g., signal name 52-UV-A2) is measured and recorded. Test fixture 101 excites a 119.4375Hz pulse signal to the RCS-ST281 of the DUT ABCD sequence to eliminate the shutdown condition, and sends a reset command to the robotic arm 102. After receiving the reset command, the robotic arm 102 clicks a button to clear the latched shutdown signal, and the controller 103 calculates the second response time of the shutdown function based on the aforementioned first and second times.
[0051] During the shutdown test of the pressurizer high-pressure reactor, the test fixture 101 excites a current signal of 15.35mA to the RCS-PT191 (pressurizer pressure) of the BCD sequence of the device under test, and the RCS-PT191 of the C sequence of the device under test is excited to 17.41mA, causing the pressurizer high-pressure reactor to shut down. The device under test is in normal operating condition and there is no shutdown signal.
[0052] Test fixture 101 changes the current of the RCS-PT191 signal of the D sequence of the device under test (DUT) to 18.65mA, and records the first time the signal is sent. At this time, after the DUT's CD sequence undergoes a 4-out-of-2 logic, the DUT generates a shutdown signal, and records the second time the shutdown occurs. Finally, the response time waveform of the shutdown (e.g., signal name 52-UV-A3) is measured and recorded. Test fixture 101 excites a 15.35mA current signal to the RCS-PT191 of the DUT's ABCD sequence to eliminate the shutdown condition, and sends a reset command to the robotic arm 102. After receiving the reset command, the robotic arm 102 clicks a button to clear the latched shutdown signal. The controller 103 calculates the third response time of the shutdown function based on the aforementioned first and second times.
[0053] During the dedicated function test of RCP bearing water temperature, test fixture 101 excites the RCP bearing water temperature RCS-TE213X of the ACD sequence of the device under test to 80.75℃ (corresponding to PT100 RTD of 131.18Ω), and the RCS-TE213B of the B sequence of the device under test to 89.25℃ (corresponding to PT100 RTD of 134.42Ω), triggering the dedicated signal of the RCP circuit breaker of the B sequence. The device under test is in normal operating condition and there is no shutdown signal.
[0054] Test fixture 101 changes the RCP bearing water temperature RCS-TE213X excitation of the A sequence of the device under test to 89.25℃, and records the third time of signal transmission. At this time, after the CD sequence of the device under test undergoes a 4-out-of-2 logic, the device under test generates a dedicated signal for the RCP circuit breaker, and records the fourth time of the dedicated signal generation. Finally, the response time waveform of the valve driven by the dedicated signal (e.g., signal name CCS-V207) is measured and recorded. Test fixture 101 excites the RCP bearing water temperature RCS-TE213X of the ABCD sequence of the device under test to 80.75℃, eliminates the dedicated condition, and sends a reset command to robotic arm 102. After receiving the reset command, robotic arm 102 clicks the button to clear the latched dedicated signal. Controller 103 calculates the fourth response time of the dedicated function based on the aforementioned third and fourth times.
[0055] In one embodiment, the test report includes the first time when the device under test (DUT) receives a voltage signal, the second time when the DUT issues a shutdown signal, the third time when the DUT receives a pulsed RTD signal, and the fourth time when the DUT issues a dedicated signal.
[0056] The controller 103 is also used to calculate the shutdown function response time based on the first time and the second time, and to calculate the dedicated function response time based on the third time and the fourth time.
[0057] The controller 103 determines the difference between the first time and the second time as the shutdown function response time, and the difference between the third time and the fourth time as the dedicated function response time. It sets a calibration ratio parameter based on the test error of the test equipment, and adjusts and corrects the shutdown function response time or the dedicated function response time based on the calibration ratio parameter, so as to improve the test efficiency and test result accuracy of the shutdown and dedicated function response time of the equipment.
[0058] In one embodiment, the test fixture 101 is also used to send an initialization signal with no stack stop and no dedicated state to the device under test when it receives an initialization command sent by the controller 103.
[0059] In this embodiment, if each shutdown and dedicated function response time test includes 30 cyclic tests, after the test fixture 101 finishes a single test, it receives the initialization command sent by the controller 103 and automatically sends an initialization signal to the device under test currently being tested to initialize its status, so as not to interfere with the test status and test results of the next device response time test.
[0060] This embodiment provides a testing system for equipment response time in a lights-out factory environment. Using a test fixture, test signals are sent to all devices under test (DUTs) within the factory according to pre-compiled test cases to test their response time, and a test report is sent to the controller. The controller calculates the response time of the shutdown function and the response time of the dedicated function based on the test report. This invention achieves fully automated response time testing in a lights-out factory environment, eliminating frequent manual wiring and reset operations, reducing manual testing costs, and improving testing efficiency.
[0061] Example 2
[0062] This embodiment provides a testing method for equipment response time in a lights-out factory, such as... Figure 2 As shown, the test is implemented using the equipment response time test system for a lights-out factory as described in Example 1. The test method includes:
[0063] S11. The controller sends control commands to the test fixture;
[0064] S12. When the test fixture receives the control command, it sends test signals to all the devices under test in the dark factory according to the pre-compiled test cases to perform device response time tests, sends test reports to the controller, and sends reset commands to the robotic arm after a single device response time test is completed; the device response time test includes the shutdown function response time test and the dedicated function response time test;
[0065] S13. When the robotic arm receives a reset command, it resets the stop signal and dedicated signal generated by the device under test.
[0066] S14. The controller calculates the shutdown function response time and the dedicated function response time based on the test report.
[0067] Among them, the shutdown function response time test includes at least one of the following: intermediate range neutron flux rate reactor shutdown test, reactor coolant pump low speed reactor shutdown test, and pressurizer high pressure reactor shutdown test; the dedicated function response time test includes at least one of the following: neutron flux rate doubling, RCP bearing water temperature, and containment radiation dose rate.
[0068] The control commands include at least one of the following: start control command, equipment test and replacement control command, mid-term sleep control command, test cycle command, and test function replacement control command; the test signals include at least one of the following: voltage signal, current signal, pulse RTD signal, and thermocouple signal.
[0069] For steps S11-S14 above, the test fixture is electrically connected to the device under test (DUT) in the lights-out factory. Based on several test cases pre-compiled according to the shutdown or dedicated function test procedures, test signals are sent to all DUTs in the lights-out factory to perform device response time tests. Test reports for each DUT after the shutdown function response time test and dedicated function response time test are sent to the controller, allowing the controller to calculate the response time based on the test reports. After the test fixture completes the single test corresponding to the shutdown function response time test or dedicated function response time test for each DUT, a reset command is sent to the robotic arm. Upon receiving the reset command, the robotic arm clicks the reset button on the current DUT.
[0070] To start a test, the controller sends a start control command to the test fixture to initiate the device response time test. To pause the test midway, the controller sends a mid-test sleep control command to the test fixture. To adjust the number of tests, the controller sends a test cycle command to the test fixture. To change the device under test, the controller sends a device test change control command to the test fixture. To change the test function from the reactor shutdown function response time test to the dedicated function response time test, the controller sends a test function change control command to the test fixture.
[0071] When the test fixture receives a control command, it sends voltage signals, current signals, pulsed RTD signals, and thermocouple signals to all devices under test in the lights-out factory according to pre-compiled test cases to perform device response time tests. The voltage signal can be used to characterize the shutdown function response time test, and the current signal can be used to characterize the dedicated function response time test. The pulsed RTD signal can also be used to characterize the shutdown function response time test, and the thermocouple signal can be used to characterize the dedicated function response time test. During the shutdown function response time test and the dedicated function response time test, the voltage signal, current signal, pulsed RTD signal, and thermocouple signal can be arbitrarily interchanged.
[0072] For example, the process of using a test system to perform shutdown function tests is illustrated by taking the intermediate range neutron flux rate reactor shutdown test, the low speed reactor coolant pump reactor shutdown test, and the high pressure pressurizer reactor shutdown test as examples of shutdown function response time testing; the process of using a test system to perform dedicated function tests is illustrated by taking the RCP bearing water temperature test as an example of dedicated function response time testing.
[0073] During the intermediate-range neutron flux rate reactor shutdown test, test fixture 101 excites a voltage signal of 3.446V to the IRMSV (intermediate-range neutron flux rate) of the ACD sequence of the device under test, and excites a voltage signal of 3.549V to the IRMSV of the B sequence of the device under test, so that it generates an intermediate-range neutron flux rate reactor shutdown signal. The device under test is in normal operating condition and there is no shutdown signal.
[0074] The test fixture changes the voltage of the IRMSV signal of the A sequence of the device under test (DUT) to 3.549V and records the first time the signal is transmitted. At this time, both the A and B sequences of the DUT generate intermediate-range neutron flux rate reactor shutdown signals. After a 4-out-of-2 logic function, the DUT generates a shutdown signal, and the second time the shutdown occurs is recorded. Finally, the response time waveform of the shutdown (e.g., signal name 52-UV-A1) is measured and recorded. The test fixture then applies a 3.446V voltage signal to the IRMSV of the ABCD sequence of the DUT to eliminate the shutdown condition and sends a reset command to the robotic arm. After receiving the reset command, the robotic arm clicks a button to clear the latched shutdown signal. The controller calculates the first response time of the shutdown function based on the aforementioned first and second times.
[0075] During the reactor shutdown test at low reactor coolant pump speed, the test fixture excites a 119.4375Hz pulse signal to the RCS-ST281 (RCS pump speed) of the ABD sequence of the device under test, and the RCS-ST281 of the C sequence of the device under test is excited at 108.0625Hz, causing the reactor coolant pump to shut down at low speed. The device under test is in normal operating condition and there is no shutdown signal.
[0076] The test fixture modifies the pulse of the RCS-ST281 signal of the device under test (DUT) A sequence to 108.0625Hz, records the first time the signal is sent, and at this time, after the AC sequence of the DUT undergoes a 4-out-of-2 logic, the DUT generates a shutdown signal. The second time the shutdown occurs is recorded, and finally, the response time waveform of the shutdown (e.g., signal name 52-UV-A2) is measured and recorded. The test fixture excites a 119.4375Hz pulse signal to the RCS-ST281 of the DUT ABCD sequence to eliminate the shutdown condition and sends a reset command to the robotic arm. After receiving the reset command, the robotic arm clicks a button to clear the latched shutdown signal. The controller calculates the second response time of the shutdown function based on the aforementioned first and second times.
[0077] During the shutdown test of the pressurizer high-pressure reactor, the test fixture excites a current signal of 15.35mA to the RCS-PT191 (pressurizer pressure) of the BCD sequence of the device under test, and the RCS-PT191 of the C sequence of the device under test is excited to 17.41mA, causing the pressurizer high-pressure reactor to shut down. The device under test is in normal operating condition and there is no shutdown signal.
[0078] Test fixture 101 changes the current of the RCS-PT191 signal of the D sequence of the device under test (DUT) to 18.65mA, and records the first time the signal is sent. At this time, after the DUT's CD sequence undergoes a 4-out-of-2 logic, the DUT generates a shutdown signal, and records the second time the shutdown occurs. Finally, the response time waveform of the shutdown (e.g., signal name 52-UV-A3) is measured and recorded. The test fixture excites a 15.35mA current signal to the RCS-PT191 of the DUT's ABCD sequence to eliminate the shutdown condition, and sends a reset command to the robotic arm. After receiving the reset command, the robotic arm clicks the button to clear the latched shutdown signal. The controller 103 calculates the third response time of the shutdown function based on the aforementioned first and second times.
[0079] During the dedicated function test of RCP bearing water temperature, test fixture 101 excites the RCP bearing water temperature RCS-TE213X of the ACD sequence of the device under test to 80.75℃ (corresponding to PT100 RTD of 131.18Ω), and the RCS-TE213B of the B sequence of the device under test to 89.25℃ (corresponding to PT100 RTD of 134.42Ω), triggering the dedicated signal of the RCP circuit breaker of the B sequence. The device under test is in normal operating condition and there is no shutdown signal.
[0080] Test fixture 101 changes the RCP bearing water temperature RCS-TE213X excitation of the A sequence of the device under test to 89.25℃, and records the third time of signal transmission. At this time, after the CD sequence of the device under test undergoes a 4-out-of-2 logic, the device under test generates a dedicated signal for the RCP circuit breaker, and records the fourth time of the dedicated signal generation. Finally, the response time waveform of the valve driven by the dedicated signal (e.g., signal name CCS-V207) is measured and recorded. Test fixture 101 excites the RCP bearing water temperature RCS-TE213X of the ABCD sequence of the device under test to 80.75℃, eliminates the dedicated condition, and sends a reset command to the robotic arm 102. After receiving the reset command, the robotic arm 102 clicks the button to clear the latched dedicated signal. The controller 103 calculates the response time of the dedicated function based on the aforementioned third and fourth times.
[0081] In one embodiment, the test report includes the first time when the device under test (DUT) receives a voltage signal, the second time when the DUT issues a shutdown signal, the third time when the DUT receives a pulsed RTD signal, and the fourth time when the DUT issues a dedicated signal. Step S14 specifically includes:
[0082] S141. The controller calculates the shutdown function response time based on the first and second times, and calculates the dedicated function response time based on the third and fourth times.
[0083] The difference between the first and second times is determined as the shutdown function response time, and the difference between the third and fourth times is determined as the dedicated function response time. A calibration ratio parameter is set according to the test error of the test equipment, and the shutdown function response time or dedicated function response time is adjusted and corrected based on the calibration ratio parameter to improve the test efficiency and test result accuracy of the equipment's shutdown and dedicated function response time.
[0084] In one embodiment, such as Figure 3 As shown, the test method also includes:
[0085] S15. When the test fixture receives the initialization command sent by the controller, it sends an initialization signal to the device under test indicating no stack stop and no dedicated state.
[0086] In this embodiment, if each shutdown and dedicated function response time test includes 30 cyclic tests, after the test fixture 101 finishes a single test, it receives the initialization command sent by the controller 103 and automatically sends an initialization signal to the device under test currently being tested to initialize its status, so as not to interfere with the test status and test results of the next device response time test.
[0087] like Figure 4 The diagram shows a robotic arm in a test system for equipment response time in a dark factory, which performs a reset operation to achieve fully automated operation of response time testing in a dark factory environment. This eliminates frequent manual wiring operations and integrates a robotic arm with visual recognition and force control capabilities. After detecting a stop signal or a dedicated signal trigger event, the robotic arm automatically performs equipment reset and resumes the test process.
[0088] This embodiment provides a method for testing the response time of equipment in a lights-out factory. The test fixture sends test signals to all devices under test (DUTs) within the factory according to pre-compiled test cases to perform response time testing, and sends a test report to the controller. The controller calculates the response time of the shutdown function and the response time of the dedicated function based on the test report. This invention achieves fully automated response time testing in a lights-out factory environment, eliminating frequent manual wiring and reset operations, reducing manual testing costs, and improving testing efficiency.
[0089] While specific embodiments of the present invention have been described above, those skilled in the art should understand that these are merely illustrative examples, and the scope of protection of the present invention is defined by the appended claims. Those skilled in the art can make various changes or modifications to these embodiments without departing from the principles and essence of the present invention, but all such changes and modifications fall within the scope of protection of the present invention.
Claims
1. A testing system for equipment response time in a lights-out factory, characterized in that, The testing system includes a testing fixture, a robotic arm, and a controller; the robotic arm and the controller are electrically connected to the testing fixture. The controller is used to send control commands to the test fixture; The test fixture is used to send test signals to all devices under test in the lights-out factory to perform device response time tests according to pre-compiled test cases when the control command is received, and to send a test report to the controller; the device response time test includes a shutdown function response time test and a dedicated function response time test; And after a single device response time test is completed, a reset command is sent to the robotic arm; The robotic arm is used to reset the stop signal and dedicated signal generated by the device under test when the reset command is received; The controller is also used to calculate the shutdown function response time and the dedicated function response time based on the test report.
2. The equipment response time testing system for lights-out factories as described in claim 1, characterized in that, The shutdown function response time test includes at least one of the following: intermediate range neutron flux rate reactor shutdown test, reactor coolant pump low speed reactor shutdown test, and pressurizer high pressure reactor shutdown test; the dedicated function response time test includes at least one of the following: neutron flux rate doubling, RCP bearing water temperature, and containment radiation dose rate.
3. The equipment response time testing system for lights-out factories as described in claim 1, characterized in that, The control commands include at least one of the following: start control command, equipment test and replacement control command, mid-term sleep control command, test count cycle command, and test function replacement control command; the test signals include at least one of the following: voltage signal, current signal, pulse RTD signal, and thermocouple signal.
4. The equipment response time testing system for lights-out factories as described in claim 1, characterized in that, The test report includes the first time when the device under test receives the voltage signal, the second time when the device under test issues a shutdown signal, the third time when the device under test receives the pulse RTD signal, and the fourth time when the device under test issues a special signal. The controller is further configured to calculate the shutdown function response time based on the first time and the second time, and to calculate the dedicated function response time based on the third time and the fourth time.
5. The equipment response time testing system for lights-out factories as described in claim 3, characterized in that, The test fixture is also used to send an initialization signal to the device under test with no stack stop and no dedicated state when it receives the initialization command sent by the controller.
6. A method for testing equipment response time in a lights-out factory, characterized in that, The test is implemented using the equipment response time testing system for lights-out factories as described in any one of claims 1-5, wherein the testing method includes: The controller sends control commands to the test fixture; When the test fixture receives the control command, it sends test signals to all devices under test in the lights-out factory to perform device response time tests according to pre-compiled test cases, and sends a test report to the controller; the device response time test includes a stop function response time test and a dedicated function response time test; and after a single device response time test is completed, it sends a reset command to the robotic arm; When the robotic arm receives the reset command, it resets the stop signal and dedicated signal generated by the device under test. The controller calculates the shutdown function response time and the dedicated function response time based on the test report.
7. The test method for equipment response time in a lights-out factory as described in claim 6, characterized in that, The shutdown function response time test includes at least one of the following: intermediate range neutron flux rate reactor shutdown test, reactor coolant pump low speed reactor shutdown test, and pressurizer high pressure reactor shutdown test; the dedicated function response time test includes at least one of the following: neutron flux rate doubling, RCP bearing water temperature, and containment radiation dose rate.
8. The test method for equipment response time in a lights-out factory as described in claim 6, characterized in that, The control commands include at least one of the following: start control command, equipment test and replacement control command, mid-term sleep control command, test count cycle command, and test function replacement control command; the test signals include at least one of the following: voltage signal, current signal, pulse RTD signal, and thermocouple signal.
9. The test method for equipment response time in a lights-out factory as described in claim 6, characterized in that, The test report includes the first time the device under test (DUT) receives the voltage signal, the second time the DUT issues a shutdown signal, the third time the DUT receives the pulsed RTD signal, and the fourth time the DUT issues a dedicated signal. The steps of calculating the shutdown function response time and the dedicated function response time based on the test report include: The controller calculates the shutdown function response time based on the first time and the second time, and calculates the dedicated function response time based on the third time and the fourth time.
10. The test method for equipment response time in a lights-out factory as described in claim 8, characterized in that, The testing method also includes: When the test fixture receives the initialization command sent by the controller, it sends an initialization signal to the device under test indicating no stack stoppage and no dedicated state.