Industrial signal universal automatic testing device and system

Abstract

This invention provides a general-purpose automatic testing device and system for industrial signals, comprising a signal source unit, an input / output impedance switching unit, an input / output channel switch matrix unit, an MCU unit, a power supply circuit unit, and testing equipment. The signal source unit sends various types of I / O test signals according to configuration information. The input / output impedance switching unit switches the input / output impedance values ​​to achieve I / O signal testing under different input / output impedance values. The input / output channel switch matrix unit automatically switches the test channel for different signal types. The MCU unit controls the input / output impedance values, the on / off state of the input / output channel switches, and the output voltage value of the power supply circuit unit. The power supply circuit unit provides the test voltage, and the testing equipment displays the test results of the signal under test. This invention can be applied to the testing of general-purpose I / O products, has comprehensive signal type coverage, good test reproducibility, is suitable for long-cycle testing, and saves manpower and human error.

Description

Technical Field

[0001] This invention belongs to the field of industrial signal testing technology, and in particular relates to a general-purpose automatic testing device and system for industrial signals. Background Technology

[0002] In the manufacturing process of industrial equipment, to ensure quality, products require extensive signal testing during design and development, testing and verification, and mass production. Many tests are highly repetitive and cannot be performed in parallel, resulting in significant manpower consumption. In particular, when there are many similar products, the test items highly overlap, yet retesting is unavoidable. Each new product and design change faces the same challenge. Among these, I / O signals are the most basic electrical signals, such as voltage / current / resistance signals, and most product functions are transmitted using general-purpose I / O signals.

[0003] Currently, automated testing devices are used for the most commonly used I / O signals (such as voltage and current). While these devices can reduce manpower to some extent for mass production inspection, voltage and current signals require relatively few tests, making their effectiveness minimal for design, development, and testing verification stages. However, complex signals such as RTDs, thermocouples, switching signals, and frequency signals require a much wider range of tests, necessitating significant resource investment in design, development, testing verification, and mass production. Furthermore, existing automated measurement devices do not support test item selection or custom input, nor do they provide intelligent monitoring and alarm functions. Summary of the Invention

[0004] The purpose of this invention is to address the lack of universal testing devices in existing industrial signal testing. It proposes a universal automatic testing device and system for industrial signals, which can cover the basic testing content of most industrial I / O signals. This saves manpower, reduces human interference, offers good test reproducibility, and allows for long-cycle testing. The technical solution is as follows:

[0005] An industrial signal universal automatic testing device includes: a signal source unit, an input impedance switching unit, an input channel switch matrix unit, an output channel switch matrix unit, an output impedance switching unit, an MCU unit, a power supply circuit unit, and testing equipment.

[0006] The signal source unit receives the configuration information preset by the host computer and sends corresponding IO signals. The signal types include at least voltage signals, current signals, RTD signals, thermocouple signals, switch signals, and frequency signals.

[0007] The input impedance switching unit is used to switch the value of the input impedance to enable IO signal testing under different input impedance values.

[0008] The input channel switch matrix unit automatically switches the test channel according to the current signal type being tested, and its output is connected to the product under test.

[0009] The output channel switch matrix unit receives the output signal from the product under test and automatically switches the test channel according to the signal type currently being tested by the product under test.

[0010] The output impedance switching unit is used to switch the value of the output impedance, enabling IO signal testing under different output impedance values.

[0011] The MCU unit receives configuration signals preset by the host computer, and controls at least the impedance values ​​of the input impedance switching and output impedance switching units, the switching on and off of the input channel switch matrix unit and the output channel switch matrix unit, and the output voltage value of the power supply circuit unit.

[0012] The power supply circuit unit is used to provide the test voltage to the product under test.

[0013] The testing equipment is a measuring device with an accuracy at least one order of magnitude higher than that of the product under test, used to display the test results of the tested signal.

[0014] Optionally, the input channel switch matrix unit includes at least a first control switch, a second control switch, and a third control switch.

[0015] The first control switch is connected to the output of the signal source unit and is subject to the on / off control of the MCU unit to switch the signal channel to the corresponding signal source port.

[0016] The second control switch is connected to the input channel of the product under test and is controlled by the MCU unit. It is used to switch the signal to one or more channels of the product under test, so as to realize the simultaneous testing of one or more channels.

[0017] The third control switch is connected to the input impedance switching unit and is controlled by the MCU unit to switch the signal channel to different impedance loops.

[0018] Optionally, the output channel switch matrix unit includes at least a fourth control switch, a fifth control switch, and a sixth control switch.

[0019] The fourth control switch is connected to the output channel of the product under test and is controlled by the MCU unit to switch the signal to one or more channels of the product under test, so as to realize the simultaneous testing of one or more channels.

[0020] The fifth control switch is connected to the output impedance switching unit and is controlled by the MCU unit to switch the signal channel to different impedance loops.

[0021] The sixth control switch is connected to the test equipment and is controlled by the MCU unit to switch the signal channel to the corresponding port of the test equipment according to the current test signal type.

[0022] Optionally, the input impedance switching unit and the output impedance switching unit can adjust the impedance value by one or more combinations of plug-in resistors, adjustable resistors, and sliding rheostats.

[0023] Optionally, the input channel switch matrix unit and the output channel switch matrix unit can achieve automatic switching of test signal types by one or more combinations of registers, double-pole double-throw switches, and magnetic latching relays.

[0024] Optionally, the input channel switch matrix unit and the input channel switch matrix unit can achieve automatic switching of test signal types by combining registers and magnetic latching relays, including:

[0025] The register uses at least one shift register. The number of shift registers is determined according to the number of I / O signals to be tested. When there are N signal output control channels of the shift register, the Mth signal output control channel of the first shift register is connected to the Lth pin of the second shift register, so that the number of signal output channels is expanded to 2N, and so on.

[0026] The input of the magnetic latching relay is connected to the output of the shift register, and its output signal drives the input channel switch matrix unit or the output channel switch matrix unit.

[0027] Optionally, the MCU unit is used to control the output voltage value of the power supply unit, including at least controlling the power supply sag, power failure, and ultimate voltage states, to realize IO signal testing in the power supply sag, power failure, and ultimate voltage states.

[0028] Optionally, an industrial signal general automatic testing device further includes: a signal monitoring unit connected to the MCU unit, used to monitor whether the input signal of the signal source unit is normal, and when an abnormal signal is detected, to feed back to the host computer for debugging.

[0029] Optionally, a general-purpose automatic testing device for industrial signals further includes a remote monitoring and alarm unit configured in a host computer software. When the output result of the testing device is abnormal, the host computer monitors the test result and outputs alarm information.

[0030] A general-purpose automatic testing system for industrial signals, equipped with any one of the general-purpose automatic testing devices for industrial signals described above, comprising:

[0031] The signal testing module is used to test one or more I / O signals of the product under test. According to the set test conditions, it receives test signals and feeds back the test results.

[0032] The main control module receives configuration information from the host computer and controls the input / output impedance values, the switching on / off of the input / output channel switch matrix units, and the voltage value of the power supply.

[0033] The network communication module obtains the configuration information from the host computer to the main control module via RS-485 communication and transmits the test result data to the host computer, thereby realizing data transmission and communication between local and remote systems.

[0034] The remote monitoring module receives the test result data output by the network communication module in real time and implements a visual monitoring function in the remote client.

[0035] Compared with the prior art, this application has the following beneficial effects:

[0036] This invention proposes a general-purpose automatic testing device and system for industrial signals, applicable to the testing of temperature transmitter products, general-purpose I / O products, etc. It includes automatic testing of general-purpose I / O signals such as voltage, current, RTD, thermocouple, switch quantity, and frequency quantity, covering most of the basic testing contents of I / O signals in products. Based on the configuration information of the host computer, it can realize one-click automatic testing, intelligent monitoring and alarm functions. This invention has good test reproducibility, is suitable for long-cycle testing, saves manpower and reduces interference from human factors. Attached Figure Description

[0037] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the provided drawings without creative effort.

[0038] Figure 1 This is a schematic diagram of a general-purpose automatic testing device for industrial signals provided in an embodiment of the present invention.

[0039] Figure 2 This is a logic block diagram of the combination of the input channel switch matrix unit and the input impedance switching unit of a general-purpose automatic test device for industrial signals provided in an embodiment of the present invention.

[0040] Figure 3 The present invention provides a logic block diagram of the combination of the output channel switching matrix unit and the output impedance switching unit of a general-purpose automatic test device for industrial signals.

[0041] Figure 4 This is a schematic diagram of the register circuit of a general-purpose automatic test device for industrial signals provided in an embodiment of the present invention.

[0042] Figure 5 This is a schematic diagram of the relay circuit of a general-purpose automatic testing device for industrial signals provided in an embodiment of the present invention.

[0043] Figure 6 An alarm logic flowchart of a general-purpose automatic testing device for industrial signals provided in an embodiment of the present invention.

[0044] Figure 7 This is a schematic diagram of the structure of a general automatic testing system for industrial signals provided in an embodiment of the present invention. Detailed Implementation

[0045] Exemplary embodiments of the present disclosure will now be described in more detail with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.

[0046] First Embodiment

[0047] See Figure 1 This embodiment provides a general-purpose automatic testing device for industrial signals, which realizes a general-purpose automatic testing function for industrial I / O signals.

[0048] Specifically, the general-purpose automatic testing device for industrial signals provided in this embodiment includes a signal source unit 101, an input impedance switching unit 102, an input channel switch matrix unit 103, an output channel switch matrix unit 104, an output impedance switching unit 105, a testing device 106, an MCU unit 107, a power supply circuit unit 108, a signal monitoring unit 109, and a remote monitoring and alarm unit 110.

[0049] First, the host computer software is configured according to the type and quantity of signals required for testing the product under test. After the configuration is completed, the industrial I / O signals are automatically tested using the general-purpose automatic testing device for industrial signals provided in this embodiment.

[0050] The signal source unit 101 receives the configuration information preset by the host computer and sends corresponding IO signals. The signal types include voltage signals, current signals, RTD signals, thermocouple signals, switch signals, and frequency signals. The signal monitoring unit 109 is connected to the MCU unit 107 and is used to monitor whether the input signals of the product under test are normal. When an abnormal signal is detected, it feeds back to the host computer for debugging.

[0051] The input impedance switching unit 102 receives the IO signal sent from the signal source unit and is used to switch the value of the input impedance to realize IO signal testing under different input impedance values, including testing of input impedance and lead resistance. The input impedance switching unit can be implemented by plug-in resistors, adjustable resistors, sliding rheostats, etc. Specifically, the impedance value is set according to the performance specifications of the product under test. For example, if the input circuit impedance of a 3 / 4-wire RTD is ≤10Ω, the signal of the product under test cannot exceed the specification. Therefore, a 10Ω impedance is connected in series in each loop of the 3 / 4-wire RTD before testing. Alternatively, the impedance can be gradually increased to test the maximum allowable circuit impedance of the product under test.

[0052] The input channel switch matrix unit 103 receives instructions from the MCU unit 107 based on the current signal type being tested, and automatically switches the test channel. Its output is connected to the product under test.

[0053] Specifically, the input channel switch matrix unit 103 includes a first control switch, a second control switch, and a third control switch, see [link to relevant documentation]. Figure 2 .

[0054] The first control switch is connected to the output of the signal source unit and is subject to the on / off control of the MCU unit to switch the signal channel to the corresponding signal source port.

[0055] The second control switch is connected to the input channel of the product under test and is controlled by the MCU unit. It is used to switch the signal to one or more channels of the product under test, so as to realize the simultaneous testing of one or more channels.

[0056] The third control switch is connected to the input impedance switching unit and is controlled by the MCU unit to switch the signal channel to different impedance loops.

[0057] The output channel switch matrix unit 104 receives the output signal from the product under test and automatically switches the test channel according to the signal type currently being tested by the product under test and the instructions sent by the MCU unit.

[0058] Specifically, the output channel switch matrix unit includes a fourth control switch, a fifth control switch, and a sixth control switch, see [link / reference]. Figure 3 .

[0059] The fourth control switch is connected to the output channel of the product under test and is controlled by the MCU unit to switch the signal to one or more channels of the product under test, so as to realize the simultaneous testing of one or more channels.

[0060] The fifth control switch is connected to the output impedance switching unit and is controlled by the MCU unit to switch the signal channel to different impedance loops.

[0061] The sixth control switch is connected to the test equipment and is controlled by the MCU unit to switch the signal channel to the corresponding port of the test equipment according to the current test signal type.

[0062] The aforementioned input channel switch matrix unit and output channel switch matrix unit can achieve automatic switching of test signal types through one or more combinations of registers, double-pole double-throw switches, and magnetic latching relays.

[0063] In an optional embodiment, the register employs at least one shift register, and the number of shift registers is determined according to the number of required test IO signals. When the shift register has N signal output control channels, the Mth signal output control channel of the first shift register is connected to the Lth pin of the second shift register, thus expanding the signal output channels to 2N, and so on. The input of the magnetic latching relay is connected to the output of the shift register, and its output signal drives the input channel switch matrix unit or the output channel switch matrix unit.

[0064] The output impedance switching unit 105 is used to switch the output impedance value to achieve IO signal testing under different output impedance values. The output impedance switching unit can be implemented using plug-in resistors, adjustable resistors, sliding rheostats, etc. The impedance value can be set according to the performance specifications of the product under test. When the output impedance value is switched to the maximum value, the maximum load capacity test is achieved.

[0065] The testing device 106 is a measuring device with an accuracy at least one order of magnitude higher than that of the product under test, used to display the test results of the product under test, such as six and a half digits.

[0066] The MCU unit 107 receives configuration signals preset by the host computer, controls the impedance values ​​of the input impedance switching unit and the output impedance switching unit, controls the switching on and off of the input channel switch matrix unit and the output channel switch matrix unit, and controls the output voltage value of the power supply unit. Controlling the switching on and off of the input channel switch matrix unit and the output channel switch matrix unit allows for the selection of different signals to be tested, including voltage signals, current signals, RTD signals, thermocouple signals, switching signals, and frequency signals. Controlling the output voltage value of the power supply unit includes controlling power supply sag, power-down, and ultimate voltage states, enabling IO signal testing under these states.

[0067] The power supply unit 108 is used to provide the test voltage to the product under test.

[0068] The remote monitoring and alarm unit 110 is configured in the host computer software. When the test equipment outputs an abnormal result, the host computer monitors the test result and outputs alarm information.

[0069] The following will provide a more detailed description of the specific circuit structure of the input / output channel switch matrix unit and the input / output impedance switching unit of the general-purpose automatic test device for industrial signals provided in this embodiment:

[0070] See Figure 4 This embodiment provides an industrial signal general-purpose automatic testing device with an 8-bit shift register chip. The MCU (microprocessor) controls the output level states of the eight channels QA to QH of the shift register chip through pins 10 to 14. The QH1 pin of the first register chip can be connected to a pin (e.g., pin 14) of the second register chip as a control signal, effectively connecting the two shift register chips in series, expanding the output control channels to 16 bits. Similarly, the MCU and shift registers together form the control signals needed to drive the various switches of the automatic testing fixture.

[0071] See Figure 5This embodiment provides a magnetic latching relay for a general-purpose automatic testing device for industrial signals. SW6A and SW6B are two sets of switches for the same magnetic latching relay. The bases of transistors Q11 and Q12 are connected to the output of a shift register. When the base of Q11 is high, the coil between pins 1 and 5 of the magnetic latching relay is energized, and pins 3 and 4, as well as pins 8 and 7, are engaged. When the base of Q11 is low, pins 3 and 4, and pins 8 and 7 remain engaged. Only when the base of Q12 is high is the coil between pins 10 and 6 of the magnetic latching relay energized, and the coil between pins 1 and 5 demagnetized. At this time, pins 3 and 2, and pins 8 and 9 are engaged. The magnetic latching relay can maintain a long-term output drive signal, ensuring that there will be no driving failure when using a switch matrix, thus reducing the load capacity of the power supply.

[0072] Furthermore, the input terminals of the magnetic latching relay are connected to plug-in resistors F3, F9, and F4 to simulate the circuit impedance. F4 and F9 can be used to select the input circuit impedance for thermocouple signals, providing two resistance values, which can be adjusted by replacing the plug-in resistors as needed. F3 can be used as the impedance of one circuit for a resistance signal, typically 10Ω. A two-wire resistance signal consists of two similar circuits and resistors; similarly, three-wire and four-limit resistance signals have three or four similar circuits.

[0073] Second Embodiment

[0074] See Figure 6 The following is a flowchart of the alarm logic of a general automatic testing device for industrial signals provided in an embodiment of the present invention. The specific steps are as follows:

[0075] S1: The host computer sends configuration information to the signal source unit;

[0076] S2: The signal monitoring unit detects the signal source value and feeds it back to the host computer;

[0077] S3: The host computer compares the feedback value with the sent value. If the values ​​are the same, proceed to step S4; if the values ​​are different, proceed to step S9.

[0078] S4: The testing equipment detects the output value of the product under test and feeds it back to the host computer;

[0079] S5: The host computer compares the feedback value and the sent value of the test equipment. If the values ​​are consistent, proceed to step S6; if the values ​​are inconsistent, proceed to step S9.

[0080] S6: The testing equipment detects the output value of the product under test and feeds it back to the host computer;

[0081] S7: The host computer records the data and switches to the next test signal to continue the test;

[0082] S8: The host computer determines whether all configuration signal tests have been completed. If yes, the test ends; otherwise, continue to step S1.

[0083] S9: The remote monitoring and alarm unit configured in the host computer outputs alarm information and sends the alarm information to the MCU unit, prompting the test to stop.

[0084] Third Embodiment

[0085] Based on the same concept, the present invention also provides a general-purpose automatic testing system for industrial signals, see below. Figure 7 It includes: a signal testing module, a main control module, a network communication module, and a remote monitoring module.

[0086] The signal testing module is equipped with a general-purpose automatic industrial signal testing device as described in any one of the first embodiments, used to test single or multiple IO signals of the product under test, receive test signals according to the set test conditions, and provide feedback on test results.

[0087] The main control module receives configuration information from the host computer and controls the input / output impedance values ​​and the voltage values ​​of the power supply.

[0088] The network communication module obtains the configuration information from the host computer to the main control module via RS-485 communication and transmits the test result data to the host computer, thereby realizing data transmission and communication between local and remote systems.

[0089] The remote monitoring module receives test result data output by the network communication module in real time and implements visual monitoring function in the remote client.

[0090] The embodiments of the present invention have been described in detail above with reference to the accompanying drawings, but the present invention is not limited to the above embodiments. Even if various changes are made to the present invention, if these changes fall within the scope of the claims of the present invention and their equivalents, they shall still fall within the protection scope of the present invention.

[0091] The term "comprising" and its variations as used herein signify open inclusion, i.e., "including but not limited to". Unless otherwise stated, the term "or" means "and / or". The term "based on" means "at least regionally based on". The terms "one example embodiment" and "one embodiment" mean "at least one example embodiment". The term "another embodiment" means "at least one additional embodiment". The terms "first", "second", etc., may refer to different or the same objects.

Claims

1. An automatic test equipment for industrial signals, characterized in that, include: Signal source unit, input impedance switching unit, input channel switch matrix unit, output channel switch matrix unit, output impedance switching unit, MCU unit, power supply circuit unit, and test equipment; The signal source unit receives the configuration information preset by the host computer and sends corresponding IO signals. The signal types include at least voltage signals, current signals, resistance temperature detector (RTD) signals, thermocouple signals, switch signals, and frequency signals. The input impedance switching unit is used to switch the value of the input impedance to realize IO signal testing under different input impedance values; The input channel switch matrix unit automatically switches the test channel according to the current test signal type, and its output is connected to the product under test. The output channel switching matrix unit receives the output signal from the product under test and automatically switches the test channel according to the signal type currently being tested by the product under test. The output impedance switching unit is used to switch the value of the output impedance to realize IO signal testing under different output impedance values; The MCU unit receives a configuration signal preset by the host computer and controls at least the impedance values ​​of the input impedance switching and output impedance switching units, the switching on and off of the input channel switch matrix unit and the output channel switch matrix unit, and the output voltage value of the power supply circuit unit. The power supply circuit unit is used to provide the test voltage for the product under test; The testing equipment is a measuring device with an accuracy at least one order of magnitude higher than that of the product under test, used to display the test results of the tested signal.

2. An automatic test apparatus for industrial signals as claimed in claim 1, characterized in that The input channel switch matrix unit includes at least a first control switch, a second control switch, and a third control switch; The first control switch is connected to the output of the signal source unit and receives on / off control from the MCU unit to switch the signal channel to the corresponding signal source port; The second control switch is connected to the input channel of the product under test and is controlled by the MCU unit to switch the signal to one or more channels of the product under test, so as to realize the simultaneous testing of one or more channels. The third control switch is connected to the input impedance switching unit and is controlled by the MCU unit to switch the signal channel to different impedance loops.

3. An automatic test apparatus for industrial signals as claimed in claim 1, characterized in that, The output channel switch matrix unit includes at least a fourth control switch, a fifth control switch, and a sixth control switch; The fourth control switch is connected to the output channel of the product under test and is controlled by the MCU unit. It is used to switch the signal to one or more channels of the product under test, so as to realize the simultaneous testing of one or more channels. The fifth control switch is connected to the output impedance switching unit and is controlled by the MCU unit to switch the signal channel to different impedance loops; The sixth control switch is connected to the test equipment and is controlled by the MCU unit to switch the signal channel to the corresponding port of the test equipment according to the current test signal type.

4. An automatic test apparatus for industrial signals as claimed in claim 1, characterized in that, The input impedance switching unit and the output impedance switching unit adjust the impedance value by one or more combinations of plug-in resistors, adjustable resistors, and sliding rheostats.

5. An automatic test apparatus for industrial signals as recited in claim 1, wherein The input channel switch matrix unit and the output channel switch matrix unit automatically switch the test signal type using one or more combinations of registers, double-pole double-throw switches, and magnetic latching relays.

6. An automatic test apparatus for industrial signals as claimed in claim 5, characterized in that The input channel switch matrix unit and the input channel switch matrix unit, which use a combination of registers and magnetic latching relays to achieve automatic switching of test signal types, include the following methods: The register uses at least one shift register. The number of shift registers is determined according to the number of I / O signals to be tested. When there are N signal output control channels of the shift register, the Mth signal output control channel of the first shift register is connected to the Lth pin of the second shift register, thus expanding the signal output channels to 2N, and so on. The input of the magnetic latching relay is connected to the output of the shift register, and its output signal drives the input channel switch matrix unit or the output channel switch matrix unit.

7. An automatic test apparatus for industrial signals as claimed in claim 1, characterized in that, The MCU unit is used to control the output voltage value of the power supply unit, including at least controlling the power supply sag, power failure, and extreme voltage states, and realizing IO signal testing in the power supply sag, power failure, and extreme voltage states.

8. An automatic test apparatus for industrial signals as claimed in claim 1, characterized in that, Also includes: The signal monitoring unit is connected to the MCU unit and is used to monitor whether the input signal of the signal source unit is normal. When an abnormal signal is detected, it is fed back to the host computer for debugging.

9. The general-purpose automatic testing device for industrial signals as described in claim 1, characterized in that, It also includes a remote monitoring and alarm unit, configured in the host computer software. When the test equipment outputs an abnormal result, the host computer monitors the test result and outputs alarm information.

10. An industrial signal universal automatic test system, characterized in that, Equipped with a general-purpose automatic testing device for industrial signals as described in any one of claims 1-9, comprising: The signal testing module is used to test one or more I / O signals of the product under test. According to the set test conditions, it receives test signals and feeds back test results. The main control module receives configuration information from the host computer and controls the input / output impedance values, the switching on / off of the input / output channel switch matrix units, and the voltage value of the power supply. The network communication module obtains the configuration information from the host computer to the main control module via the 485 communication method, and transmits the test result data to the host computer, thereby realizing data transmission and communication between local and remote systems. The remote monitoring module receives the test result data output by the network communication module in real time and implements a visual monitoring function in the remote client.

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