Waveform-based test report generation method, electronic device, and storage medium

Abstract

This application provides a waveform-based test report generation method, electronic device, and storage medium. The waveform-based test report generation method is applied to energy storage systems. The method includes: acquiring test waveform data of the energy storage system, the test waveform data including the voltage and / or current of the energy storage system; acquiring a waveform to be analyzed from the test waveform data; performing at least one of state analysis, convergence analysis, and parameter calculation on the waveform to be analyzed to obtain analysis results, the analysis results including at least one of time delay results, convergence results, and parameter results; and generating a test report based on the analysis results. Through the above method, automated analysis of test waveform data of energy storage systems can be achieved, reducing the analysis time for test personnel, improving analysis efficiency, automatically generating test reports, and reducing the professional requirements for test personnel.

Description

Technical Field

[0001] This application relates to the field of simulation testing technology, and in particular to a waveform-based test report generation method, electronic device, and storage medium. Background Technology

[0002] Energy storage systems are typically tested using simulation systems to obtain test waveform data for parameters such as voltage and current. For example, a real-time digital simulation system (RTDS) is used to simulate the operating characteristics of energy storage systems and obtain test waveform data for parameters such as voltage and current. Current technology relies on manual analysis of the test waveform data by testing personnel, but this requires a certain level of knowledge from the personnel, placing high demands on their skills. Furthermore, the large volume of test waveform data makes manual analysis laborious and time-consuming, resulting in low efficiency. Summary of the Invention

[0003] The main technical problem addressed by this application is to provide a waveform-based test report generation method, electronic device, and storage medium that can automatically analyze test waveform data of energy storage systems, thereby improving analysis efficiency.

[0004] In a first aspect, this application provides a waveform-based test report generation method applied to an energy storage system. The method includes: acquiring test waveform data of the energy storage system, the test waveform data including the voltage and / or current of the energy storage system; acquiring a waveform to be analyzed from the test waveform data; performing at least one of state analysis, convergence analysis, and parameter calculation on the waveform to be analyzed to obtain an analysis result, the analysis result including at least one of time delay result, convergence result, and parameter result; and generating a test report based on the analysis result.

[0005] In the technical solution of this application embodiment, by performing at least one of state analysis, convergence analysis and parameter calculation on the waveform to be analyzed, the analysis result can be obtained, which can realize the automated analysis of the test waveform data of the energy storage system, reduce the analysis time of the test personnel, improve the analysis efficiency, automatically generate test reports, and reduce the professional requirements of the test personnel.

[0006] In some embodiments, the waveform to be analyzed includes a reference waveform and a response waveform corresponding to the reference waveform; the step of performing at least one of state analysis, convergence analysis, and parameter calculation on the waveform to be analyzed includes: determining a reference time corresponding to the state switching of the reference waveform based on preset conditions; obtaining the switching time of the response waveform based on the reference time; and generating the time delay result based on the reference time and the switching time.

[0007] In the technical solution of this application embodiment, a reference waveform and a response waveform are obtained from test waveform data. Based on pre-set preset conditions, the moment when the reference waveform undergoes a state switch is automatically identified as the reference moment, enabling the identification of the reference waveform's state switch. The switching moment of the corresponding response waveform is obtained based on the reference moment of the reference waveform. A time delay result is generated based on the reference moment and the switching moment. The time delay result is used to confirm whether there is an anomaly in the energy storage system, thereby achieving automated analysis, reducing the analysis time for test personnel, and improving analysis efficiency.

[0008] In some embodiments, obtaining the switching time of the response waveform based on the reference time includes: performing wavelet transform on the response waveform within a preset window based on the reference time to determine the switching time.

[0009] In the technical solution of this application embodiment, wavelet transform is performed on the response waveform within a preset window based on the reference time, which can reduce the influence of noise and improve the accuracy of the switching time.

[0010] In some embodiments, generating the delay result based on the reference time and the switching time includes: subtracting the reference time from the switching time to obtain the delay result.

[0011] In the technical solution of this application embodiment, the time difference between the reference time and the switching time is calculated to obtain the time delay result of the response waveform relative to the reference waveform, thereby realizing automated analysis, reducing the analysis time of testers, and improving analysis efficiency.

[0012] In some embodiments, performing at least one of state analysis, convergence analysis, and parameter calculation on the waveform to be analyzed includes: obtaining a state curve in the waveform to be analyzed; performing detrending processing on the state curve to obtain a detrending curve; and analyzing the convergence of the detrending curve to obtain the convergence result.

[0013] In the technical solution of this application embodiment, convergence results are obtained by detrending the state curve, and the presence of anomalies in the energy storage system is confirmed by the convergence results, thereby realizing automated analysis, reducing the analysis time of testers and improving analysis efficiency.

[0014] In some embodiments, performing at least one of state analysis, convergence analysis, and parameter calculation on the waveform to be analyzed includes: calculating the parameters of the waveform to be analyzed based on a preset calculation method to generate the parameter results.

[0015] In the technical solution of this application embodiment, the parameters of the waveform to be analyzed are calculated by a preset calculation method, which can realize automatic parameter calculation, reduce the analysis time of testers, and improve analysis efficiency.

[0016] In some embodiments, after the step of obtaining the waveform to be analyzed from the test waveform data, the method further includes: performing harmonic filtering on the waveform to be analyzed; identifying outliers in the waveform to be analyzed, and marking the outliers on the waveform to be analyzed.

[0017] In the technical solution of this application embodiment, by performing harmonic filtering on the waveform to be analyzed, outliers are identified and marked, and noise reduction processing can be performed on the waveform to be analyzed to improve the accuracy of the analysis.

[0018] In some embodiments, the harmonic filtering process of the waveform to be analyzed includes: obtaining harmonic components through Fourier transform; and removing harmonics from the waveform to be analyzed based on the harmonic components, so as to perform harmonic filtering process on the waveform to be analyzed.

[0019] In the technical solution of this application embodiment, harmonic components are obtained through Fourier transform, and harmonics of the waveform to be analyzed are removed based on the harmonic components to achieve harmonic filtering processing, thereby reducing the distortion of the waveform to be analyzed and improving the accuracy of the analysis.

[0020] In some embodiments, after the step of calculating the parameters of the waveform to be analyzed based on a preset calculation method, the method further includes: calibrating the parameters onto the waveform to be analyzed to obtain a target waveform.

[0021] In the technical solution of this application embodiment, the parameters are calibrated onto the waveform to be analyzed to obtain the target waveform, which can intuitively present the parameters in the target waveform, making it easier for testers to analyze the target waveform and thus improving the analysis efficiency.

[0022] In some embodiments, generating a test report based on the analysis results includes: generating test results based on the analysis results and a preset expression; and generating the test report based on the parameter results, the test results, and the target waveform.

[0023] In the technical solution of this application embodiment, at least one of the time delay result, parameter result, and convergence result in the analysis result is substituted into a preset expression to generate test results, so as to realize the automatic generation of test results and automatic generation of test reports, which reduces the requirements for the professional knowledge of testers and thus improves analysis efficiency.

[0024] In some embodiments, obtaining the waveform to be analyzed from the test waveform data includes: calculating the waveform to be analyzed from the test waveform data according to a preset waveform formula.

[0025] In the technical solution of this application embodiment, the test waveform data is calculated according to a preset waveform formula to generate a specific waveform to be analyzed, such as a special waveform of electrochemical energy storage, thereby realizing the automated analysis of the specific waveform to be analyzed.

[0026] In some embodiments, acquiring test waveform data of the energy storage system includes: generating a script for a simulation system; sending the script to the simulation system so that the simulation system executes the script to perform simulation testing on the energy storage system and obtain the test waveform data; and receiving the test waveform data sent by the simulation system.

[0027] In the technical solution of this application embodiment, a script for generating a simulation system is used to control the simulation system in the form of a script; the simulation system executes the script to perform simulation testing on the energy storage system to generate test waveform data, thereby realizing the export of the test waveform data of the simulation system.

[0028] Secondly, this application provides an electronic device applied to an energy storage system. The electronic device includes: an acquisition module, configured to acquire test waveform data of the energy storage system and acquire a waveform to be analyzed from the test waveform data, wherein the test waveform data includes the voltage and / or current of the energy storage system; and an analysis module, configured to perform at least one of state analysis, convergence analysis, and parameter calculation on the waveform to be analyzed to obtain an analysis result, wherein the analysis result includes at least one of time delay result, convergence result, and parameter result.

[0029] Thirdly, this application provides a non-volatile computer-readable storage medium storing program instructions thereon, which, when executed by a processor, implement the waveform-based test report generation method described in any of the above embodiments.

[0030] Fourthly, this application provides a computer program product, including a computer program that, when executed by a processor, implements the waveform-based test report generation method described in any of the above embodiments.

[0031] It is understood that the beneficial effects of the second to fourth aspects mentioned above can be found in the relevant descriptions in the first aspect mentioned above, and will not be repeated here.

[0032] The above description is only an overview of the technical solution of this application. In order to better understand the technical means of this application and to implement it in accordance with the contents of the specification, and to make the above and other objects, features and advantages of this application more obvious and understandable, the following are specific embodiments of this application. Attached Figure Description

[0033] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0034] Figure 1 This is a schematic diagram of the structure of an embodiment of the simulation testing system provided in this application.

[0035] Figure 2 This is a flowchart illustrating an embodiment of the waveform-based test report generation method provided in this application.

[0036] Figure 3 for Figure 2 A flowchart illustrating an embodiment of step S101.

[0037] Figure 4 for Figure 3 The diagram shows a timing schematic of an embodiment of the interaction between the electronic device and the simulation system.

[0038] Figure 5 for Figure 2 A flowchart illustrating an embodiment of step S102.

[0039] Figure 6 for Figure 5 A schematic diagram of an embodiment of the reference waveform and response waveform.

[0040] Figure 7 for Figure 2 A flowchart illustrating another embodiment of step S102.

[0041] Figure 8 for Figure 7 The diagram shows an embodiment of the waveform to be analyzed.

[0042] Figure 9A for Figure 7 The diagram shows an embodiment of the state curve.

[0043] Figure 9B for Figure 7 The diagram shows an embodiment of the detrending curve.

[0044] Figure 10 for Figure 2 A flowchart illustrating another embodiment of step S102.

[0045] Figure 11A for Figure 10 The diagram shows a waveform of an embodiment of the waveform to be analyzed, which contains harmonics.

[0046] Figure 11B for Figure 10 The diagram shows an embodiment of the waveform to be analyzed after harmonic removal.

[0047] Figure 12 for Figure 10 A schematic diagram of an embodiment of the target waveform is shown.

[0048] Figure 13 This is a schematic diagram of an embodiment of the non-volatile computer-readable storage medium provided in this application. Detailed Implementation

[0049] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0050] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the application; the terms “comprising” and “having”, and any variations thereof, in the specification, claims, and foregoing description of the drawings are intended to cover non-exclusive inclusion.

[0051] In the description of the embodiments of this application, technical terms such as "first" and "second" are used only to distinguish different objects and should not be construed as indicating or implying relative importance or implicitly specifying the number, specific order, or primary and secondary relationship of the indicated technical features. In the description of the embodiments of this application, "multiple" means two or more, unless otherwise explicitly defined.

[0052] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0053] In the description of the embodiments in this application, the term "and / or" is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. Additionally, the character " / " in this document generally indicates that the preceding and following related objects have an "or" relationship.

[0054] In the description of the embodiments of this application, the term "multiple" refers to two or more (including two), similarly, "multiple sets" refers to two or more (including two sets), and "multiple pieces" refers to two or more (including two pieces).

[0055] In the description of the embodiments of this application, unless otherwise expressly specified and limited, the technical terms such as "installation," "connection," "joining," and "fixing" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. For those skilled in the art, the specific meaning of the above terms in the embodiments of this application can be understood according to the specific circumstances.

[0056] Energy storage technology, as a key technology for the rapid development of smart grids, renewable energy integration, distributed generation, microgrids, and electric vehicles, has witnessed tremendous growth in these fields, while simultaneously promoting the upgrading of energy storage technology and driving the rapid growth in demand for energy storage. To date, various energy storage methods have been developed and widely applied in all aspects of the power grid, including generation, transmission, distribution, and consumption. The technology's maturity is gradually improving, and it has broad application prospects. To fully leverage the advantages of energy storage technology and ensure the safe, stable, and efficient operation of energy storage systems, simulation testing is necessary to verify the operating characteristics of energy storage systems under various operating conditions.

[0057] Real-time digital simulation systems (RDS) are used to simulate and test the operational characteristics of energy storage systems, obtaining test waveform data for parameters such as voltage and current. Energy storage systems include, but are not limited to, energy storage valves. Test personnel can manually analyze the test waveform data to determine the operational characteristics of the energy storage system, thereby optimizing its control parameters based on these characteristics. However, the test waveform data generated by the RDS requires manual analysis by test personnel, demanding a certain level of expertise and thus placing high demands on them. Furthermore, the large volume of test waveform data generated by RDS results in a significant workload for manual analysis, requiring substantial time investment and leading to low efficiency.

[0058] Based on the above considerations, this application provides a waveform-based test report generation method, electronic device, and storage medium. The waveform-based test report generation method is applied to energy storage systems. The method includes: acquiring test waveform data of the energy storage system, the test waveform data including the voltage and / or current of the energy storage system; obtaining a waveform to be analyzed from the test waveform data; performing at least one of state analysis, convergence analysis, and parameter calculation on the waveform to be analyzed to obtain analysis results, the analysis results including at least one of time delay results, convergence results, and parameter results; and generating a test report based on the analysis results. By acquiring test waveform data of the energy storage system, obtaining a waveform to be analyzed from the test waveform data, and performing at least one of state analysis, convergence analysis, and parameter calculation on the waveform to be analyzed to obtain analysis results, the method achieves automated analysis of test waveform data of the energy storage system, reduces the analysis time of test personnel, improves analysis efficiency, automatically generates test reports, and reduces the professional requirements of test personnel.

[0059] According to some embodiments of this application, please refer to Figure 1 , Figure 1 This is a schematic diagram of an embodiment of the simulation testing system provided in this application. The simulation testing system 1 is applied to an energy storage system. The simulation testing system 1 includes an electronic device 2 and a simulation system 3 that are connected in communication, wherein the simulation system 3 includes, but is not limited to, a real-time digital simulation system.

[0060] Simulation system 3 is used to simulate and test the energy storage system, testing the current and / or voltage of the entire system to generate simulation data of relevant operating characteristics, and then sending the simulation data to electronic device 2. Electronic device 2 is used to automatically analyze the simulation data generated by simulation system 3 to generate simulation results. By setting up electronic device 2, which is communicatively connected to simulation system 3, simulation testing system 1 can automatically simulate and test the energy storage system and generate simulation results, improving testing efficiency.

[0061] In a specific implementation scenario, the energy storage system includes energy storage valves, such as flexible DC energy storage valves. Electronic device 2 can communicate with simulation system 3 via TCP / IP protocol, and electronic device 2 may include, but is not limited to, microcomputers, servers, host computers, laptops, or tablets.

[0062] According to some embodiments of this application, please refer to Figure 2 , Figure 2 This is a flowchart illustrating an embodiment of the waveform-based test report generation method provided in this application. The waveform-based test report generation method of this embodiment is applied to the aforementioned electronic device 2, i.e., to an energy storage system. The waveform-based test report generation method includes the following steps.

[0063] S101: Obtain test waveform data of the energy storage system.

[0064] Electronic device 2 acquires test waveform data of the energy storage system, including the voltage and / or current of the energy storage system. For example, simulation system 3 tests the energy storage system to obtain test waveform data, and electronic device 2 acquires the test waveform data of the energy storage system sent by simulation system 3. Specifically, simulation system 3 performs simulation tests on the energy storage valve of the energy storage system, generates test waveform data, and sends the test waveform data to electronic device 2. The test waveform data includes the voltage and / or current of the energy storage valve.

[0065] In some embodiments, the test waveform data may include the voltage of the energy storage system, the test waveform data may include the current of the energy storage system, and the test waveform data may also include the voltage and current of the energy storage system.

[0066] S102: Obtain the waveform to be analyzed from the test waveform data, and perform at least one of the following on the waveform to be analyzed: state analysis, convergence analysis, and parameter calculation to obtain the analysis result.

[0067] Electronic device 2 acquires the waveform to be analyzed from the test waveform data, and performs at least one of the following on the waveform to be analyzed: state analysis, convergence analysis, and parameter calculation to obtain the analysis result. The analysis result includes at least one of the following: time delay result, convergence result, and parameter result.

[0068] In some embodiments, the electronic device 2 performs state analysis on the waveform to be analyzed to obtain a time delay result, performs convergence analysis on the waveform to be analyzed to obtain a convergence result, and performs parameter calculation on the waveform to be analyzed to obtain a parameter result.

[0069] In some embodiments, the electronic device 2 performs state analysis on the waveform to be analyzed to obtain an analysis result; or, the electronic device 2 performs convergence analysis on the waveform to be analyzed to obtain an analysis result; or, the electronic device 2 performs parameter calculation on the waveform to be analyzed to obtain an analysis result; or, the electronic device 2 performs both state analysis and convergence analysis on the waveform to be analyzed to obtain an analysis result; or, the electronic device 2 performs both state analysis and parameter calculation on the waveform to be analyzed to obtain an analysis result; or, the electronic device 2 performs both state analysis, convergence analysis, and parameter calculation on the waveform to be analyzed to obtain an analysis result.

[0070] The time delay results include the time delay between two correlated waveforms to be analyzed; the parameter results include the waveform parameters of the waveforms to be analyzed; and the convergence results include whether the waveforms to be analyzed converge when they correspond to different states. The time delay results, parameter results, and convergence results can all be used to judge the energy storage system and confirm its operating characteristics.

[0071] S103: Generate a test report based on the analysis results.

[0072] Electronic device 2 can generate a test report based on at least one of the time delay results, convergence results, and parameter results in the analysis results. The test report can intuitively show the operating characteristics of the energy storage system.

[0073] The electronic device 2 of this application obtains the analysis result by performing at least one of state analysis, convergence analysis and parameter calculation on the waveform to be analyzed. It can realize the automated analysis of test waveform data of energy storage system, reduce the analysis time of test personnel, improve analysis efficiency, automatically generate test reports, and reduce the professional requirements of test personnel.

[0074] According to some embodiments of this application, please refer to Figure 3 and Figure 4 , Figure 3 for Figure 2 A flowchart illustrating an embodiment of step S101 is shown below. Figure 4 for Figure 3 The diagram illustrates the timing of an embodiment of the interaction between the electronic device and the simulation system. Step S101 includes the following steps.

[0075] S201: Script to generate simulation system 3.

[0076] Electronic device 2 pre-configures test cases, for example, testers pre-configure test cases on electronic device 2. Electronic device 2 generates a script for simulation system 3 based on the test cases, and configures instructions in the script to instruct simulation system 3 to perform simulation tests. These instructions in the script may include, but are not limited to, the ComtradePlotSave instruction, the fopen instruction, the fgets instruction, or the ListenOnPortHandshake instruction.

[0077] S202: Send the script to simulation system 3 so that simulation system 3 can execute the script to perform simulation tests on the energy storage system and obtain test waveform data.

[0078] Electronic device 2 sends the script to simulation system 3. Simulation system 3 executes the instructions in the script to perform simulation testing on the energy storage system and obtains the data required for the test during the simulation test, thus obtaining the test waveform data.

[0079] In some embodiments, electronic device 2 establishes communication with simulation system 3 via TCP / IP protocol. Simulation system 3 sets electronic device 2 as a server using the ListenOnPort function. Electronic device 2 sends scripts to simulation system 3 through a network channel, thereby controlling simulation system 3. After electronic device 2 sends the scripts to simulation system 3, simulation system 3 automatically executes the scripts. After the simulation test is completed, electronic device 2 can control simulation system 3 to store test waveform data using the ComtradePlotSave instruction in the script. For example, simulation system 3 can obtain the binary information of the saved file, i.e., the test waveform data, using the fopen or fgets instruction, and send the test waveform data back to electronic device 2 using the ListenOnPortHandshake instruction.

[0080] In this application, electronic device 2 and simulation system 3 transmit data via TCP / IP protocol; electronic device 2 generates scripts for simulation system 3 and remotely controls simulation system 3 in the form of scripts; simulation system 3 executes the scripts to perform simulation tests on the energy storage system to generate test waveform data, and transmits the test waveform data to electronic device 2. This enables electronic device 2 to automatically control simulation system 3, export test waveform data, etc., and improves the feasibility of automatically analyzing test waveform data generated by simulation system 3 through electronic device 2.

[0081] According to some embodiments of this application, please refer to Figure 5 , Figure 5 for Figure 2A schematic flowchart of an embodiment of step S102 is shown. The waveform to be analyzed includes a reference waveform and a response waveform corresponding to the reference waveform. During the simulation test, when the simulation parameters of the energy storage system change, the measured parameters related to those simulation parameters also change accordingly. In this case, the waveform corresponding to the simulation parameters can be used as the reference waveform, and the waveform corresponding to the measured parameters related to those simulation parameters can be used as the response waveform. It is understood that there is a correlation between the reference waveform and the corresponding response waveform.

[0082] In some embodiments, when the analog switch of the energy storage system in simulation system 3 switches from an open state to a closed state, the states of other components in the circuit containing the analog switch of the energy storage system will change. For example, the data generated by the analog switch can generate a reference waveform, and the data generated by other components can generate a response waveform.

[0083] In some embodiments, the electronic device 2 can obtain a reference waveform and a response waveform corresponding to the reference waveform based on voltage, or the electronic device 2 can obtain a reference waveform and a response waveform corresponding to the reference waveform based on current.

[0084] Step S102 specifically includes the following steps.

[0085] S301: Determine the reference time corresponding to the state switching of the reference waveform based on preset conditions.

[0086] Electronic device 2 can be pre-set with preset conditions to determine when the reference waveform is undergoing state switching. Based on these preset conditions, electronic device 2 determines the reference time corresponding to the state switching of the reference waveform. Since different states of the energy storage system can be triggered by preset conditions, it is possible to determine whether the reference waveform is undergoing state switching by whether the preset conditions are met.

[0087] The preset conditions include, but are not limited to, at least one of analog, digital, and external quantities. Analog quantities can represent changes in a reference waveform, such as waveform rise, waveform fall, end of rise, or initial state. Digital quantities can represent analog switches in simulation system 3, including but not limited to fault-triggered switches and analog disconnectors. Since the energy storage system can generate corresponding signals when switching states, external quantities can represent state changes in the energy storage system, such as the change from a locked state to an unlocked state. The specific content of the preset conditions can be set based on actual simulation testing requirements and is not limited here.

[0088] Electronic device 2 determines whether the reference waveform is undergoing a state transition based on preset conditions. When it is determined that the reference waveform is undergoing a state transition, the time corresponding to the state transition is taken as the reference time.

[0089] In some embodiments, the electronic device 2 determines, based on preset conditions, that the reference waveform corresponding to the analog switch of the simulation system 3 has switched from an open state to a closed state. In this case, the moment when the reference waveform switches from the open state to the closed state is the reference time.

[0090] S302: Obtain the switching time of the response waveform based on the reference time.

[0091] When the reference waveform undergoes a state transition, the state of the corresponding response waveform may not change immediately, but may exhibit a certain lag. Therefore, the transition time corresponding to the state transition of the response waveform is different from the reference time of the reference waveform. Electronic device 2 calculates the transition time of the corresponding response waveform using the reference time of the reference waveform as a standard. It can be understood that the transition time is the time corresponding to the state transition of the response waveform.

[0092] In one embodiment, when the analog switch of the simulation system 3 switches from an open state to a closed state, the states of other components in the circuit containing the analog switch may switch in response to the state change. The electronic device 2 can obtain the switching times of the response waveforms of the other components based on the reference time of the reference waveform corresponding to the analog switch.

[0093] S303: Generate delay results based on the reference time and the switching time.

[0094] Electronic device 2 generates delay results based on the reference time and the switching time.

[0095] This application obtains a reference waveform and its corresponding response waveform from test waveform data. Based on pre-set conditions, it automatically identifies the moment when the reference waveform undergoes a state transition as the reference time, enabling the identification of the reference waveform's state transition. The transition time of the corresponding response waveform is obtained based on the reference time of the reference waveform. A time delay result is generated based on the reference time and the transition time. The time delay result is used to confirm whether there are any anomalies in the energy storage system, thereby achieving automated analysis, reducing the analysis time for test personnel, and improving analysis efficiency.

[0096] According to some embodiments of this application, please refer to Figure 6 , Figure 6 for Figure 5 A schematic diagram of an embodiment of the reference waveform and the response waveform. Step S302 further includes: performing wavelet transform on the response waveform within a preset window based on the reference time to determine the switching time.

[0097] Specifically, electronic device 2 can perform wavelet transform on the response waveform within a preset window based on a reference time to determine the switching time. Optionally, electronic device 2 can be pre-set with a preset window of a certain width; for example, a tester can pre-set a preset window on electronic device 2.

[0098] In some embodiments, the electronic device 2 can set a preset window at the waveform corresponding to the reference time in the response waveform, and perform wavelet transform on the response waveform within the preset window to identify the switching time corresponding to the reference time in the response waveform. The electronic device 2 can set the center time of the preset window at the reference time. The width of the preset window can be set based on actual simulation test requirements and is not limited here. Wavelet transform (WT) refers to a transform analysis method in the prior art.

[0099] This application reduces the impact of noise and improves the accuracy of the switching time by performing wavelet transform on the response waveform within a preset window based on a reference time.

[0100] According to some embodiments of this application, step S303 includes: subtracting the reference time from the switching time to obtain the delay result.

[0101] Electronic device 2 subtracts the reference time from the switching time to obtain the time delay result, that is, it calculates the time difference between the switching time and the reference time. It can be understood that the time delay result includes the time delay between the response waveform and the corresponding reference waveform.

[0102] This application calculates the time difference between the reference time and the switching time to obtain the time delay result of the response waveform relative to the reference waveform, thereby achieving automated analysis, reducing the analysis time of testers, and improving analysis efficiency.

[0103] According to some embodiments of this application, please refer to Figure 7 , Figure 7 for Figure 2 A flowchart illustrating another embodiment of step S102. Step S102 includes the following steps.

[0104] S401: Obtain the state curve in the waveform to be analyzed.

[0105] The state of the waveform to be analyzed includes, but is not limited to, at least one of the following: linear change state, nonlinear change state, step response state, and steady state. Different states of the waveform to be analyzed have different curve characteristics, and the state curves include, but are not limited to, at least one of the following: linear change curve, nonlinear change curve, step response curve, and steady state curve. The electronic device 2 acquires the state curves corresponding to different states of the waveform to be analyzed.

[0106] In some embodiments, such as Figure 8 The upper part of the waveform diagram represents the active power waveform to be analyzed during charging, and the lower part represents the reactive power waveform to be analyzed during charging. Time A represents the trigger time, the time between time A and time B represents the delay time, time C represents the response time, and the time between time C and time D represents the adjustment time. Electronic device 2 analyzes the waveform to be analyzed and obtains the waveform between time B and time C as a step response state, and acquires the active power waveform and the reactive power waveform between time B and time C as state curves.

[0107] S402: Perform detrending processing on the state curve to obtain a detrending curve.

[0108] Electronic device 2 performs detrending processing on the state curve to obtain a corresponding detrending curve. For example, electronic device 2 can remove the slope of the state curve to achieve detrending processing, and the curve after removing the slope is the detrending curve.

[0109] In some embodiments, such as Figure 9A The curve shown represents the state curve in the waveform to be analyzed acquired by electronic device 2. The expression for the state curve can be ax + b. To facilitate calculation, electronic device 2 can perform detrending processing on the state curve to obtain the following... Figure 9B The detrending curve shown is illustrated. It can be understood that electronic device 2 removes 'a' from the expression, resulting in the curve expressed as x+b, which is the detrending curve.

[0110] S403: Analyze the convergence of the detrending curve to obtain convergence results.

[0111] Electronic device 2 analyzes the convergence of the detrending curve to confirm whether the change in the detrending curve tends towards 0, thus obtaining a convergence result. The convergence result includes convergence and non-convergence. When the change in the detrending curve tends towards 0, it indicates that the detrending curve has converged; when the change in the detrending curve does not tend towards 0, it indicates that the detrending curve has not converged.

[0112] like Figure 9B As shown, the detrending curve gradually approaches the convergence horizontal line, and the electronic device 2 confirms that the change of the detrending curve tends to 0, that is, the convergence result is convergence.

[0113] This application obtains convergence results by detrending the state curves, and uses the convergence results to confirm whether there are any anomalies in the energy storage system. For example, if the convergence result is converged, it is determined that the energy storage system is operating normally; if the convergence result is non-convergent, it is determined that the energy storage system is operating abnormally. This achieves automated analysis, reduces the analysis time of testers, and improves analysis efficiency.

[0114] According to some embodiments of this application, please refer to Figure 10 , Figure 10 for Figure 2 A flowchart illustrating another embodiment of step S102. Step S102 includes the following steps.

[0115] S501: Calculates the parameters of the waveform to be analyzed based on a preset calculation method to generate parameter results.

[0116] Electronic device 2 can be pre-set with a preset calculation method for the parameters, for example, the tester can pre-set a preset calculation method on electronic device 2. Electronic device 2 calculates the parameters of the waveform to be analyzed based on the preset calculation method to generate parameter results.

[0117] The parameters of the waveform to be analyzed include, but are not limited to, at least one of the following: response time, settling time, steady state, overshoot, peak signal, reactive power support, support time, and accuracy. When simulation system 3 is applied to power application scenarios (such as energy storage systems), the parameters of the waveform to be analyzed include, but are not limited to, at least one of the following: charging response time, discharging response time, trigger time, settling time, and conversion time of the energy storage system.

[0118] It is understandable that different waveforms require different parameters to be calculated, and different parameters require different preset calculation methods. The specific content of the preset calculation method can be set based on the actual simulation test requirements, and is not limited here.

[0119] This application calculates the parameters of the waveform to be analyzed using a preset calculation method, enabling automatic parameter calculation. This reduces the analysis time for testers and improves analysis efficiency.

[0120] According to some embodiments of this application, after obtaining the waveform to be analyzed from the test waveform data in step S102, the method of this application further includes: performing harmonic filtering on the waveform to be analyzed; identifying outliers in the waveform to be analyzed, and marking the outliers on the waveform to be analyzed.

[0121] After acquiring the waveform to be analyzed from the test waveform data, electronic device 2 can perform harmonic filtering on the waveform to be analyzed; identify outliers in the waveform to be analyzed, and mark the outliers on the waveform to be analyzed. Electronic device 2 can analyze the waveform to be analyzed to obtain the harmonics in the waveform to be analyzed, and remove the harmonics in the waveform to be analyzed, thereby realizing harmonic filtering on the waveform to be analyzed.

[0122] Electronic device 2 can use outlier identification algorithms, such as the Local Outlier Factor (LOF) algorithm, to identify outliers in the waveform to be analyzed and mark them in the waveform to be analyzed, so that electronic device 2 can automatically ignore the marked outliers based on the marking results in the subsequent parameter analysis process.

[0123] This application improves the accuracy of analysis by performing harmonic filtering on the waveform to be analyzed, identifying and marking outliers, and thus reducing noise in the waveform.

[0124] According to some embodiments of this application, harmonic filtering of the waveform to be analyzed specifically includes: obtaining harmonic components through Fourier transform; and removing harmonics from the waveform to be analyzed based on the harmonic components, so as to perform harmonic filtering on the waveform to be analyzed.

[0125] Because the control frequency of voltage / current is extremely high, reaching the microsecond level, high-frequency jitter often exists in the control of voltage / current. For example, a segment of the waveform under analysis that fluctuates at high frequencies can be represented as harmonics. Harmonics in the waveform under analysis may affect the calculation of subsequent parameters; therefore, removing harmonics can improve the accuracy of parameter calculations.

[0126] Electronic device 2 can obtain the harmonic components of the waveform to be analyzed through Fourier transform, and remove the harmonics of the waveform to be analyzed based on the harmonic components to complete the harmonic filtering process of the waveform to be analyzed.

[0127] In some embodiments, such as Figure 11A In the waveform to be analyzed shown, harmonics exist in the waveform between time P and time Q. After obtaining the harmonic components of the waveform between time P and time Q through Fourier transform, electronic device 2 removes the harmonics based on the harmonic components, resulting in the waveform shown below. Figure 11B The waveform to be analyzed is shown below. Among them, Figure 11B The black lines in the diagram represent the waveform to be analyzed after harmonics have been removed.

[0128] This application obtains harmonic components through Fourier transform, and removes harmonics from the waveform to be analyzed based on the harmonic components to achieve harmonic filtering processing, thereby reducing the distortion of the waveform to be analyzed and improving the accuracy of the analysis.

[0129] In some embodiments, the electronic device 2 can record harmonic components into the parameter results and report them to the test personnel for analysis.

[0130] According to some embodiments of this application, after step S501, the method of this application further includes: calibrating parameters into the waveform to be analyzed to obtain the target waveform.

[0131] Electronic device 2 can calibrate parameters onto the corresponding waveform to be analyzed in order to obtain the target waveform. Electronic device 2 can use dashed lines, arrows, text, etc., to calibrate parameters onto the corresponding positions of the waveform to be analyzed, thereby obtaining the target waveform with parameters.

[0132] In some embodiments, the electronic device 2 calibrates the parameters to, for example... Figure 11B From the waveform to be analyzed shown, the following is obtained: Figure 12 The target waveform is shown. The parameters include at least one of steady-state, peak, reactive power support, accuracy, response time, settling time, and support time.

[0133] This application obtains the target waveform by calibrating parameters onto the waveform to be analyzed, and can intuitively present the parameters in the target waveform, which facilitates the analysis of the target waveform by testers, thereby improving the analysis efficiency.

[0134] According to some embodiments of this application, step S103 includes: generating test results based on analysis results and preset expressions; and generating a test report based on parameter results, test results, and target waveform.

[0135] Electronic device 2 is pre-set with a preset expression to represent the test results, for example, a preset expression is pre-set by the tester on electronic device 2. Electronic device 2 substitutes the analysis results into the preset expression to generate the test results. Electronic device 2 can substitute at least one of the time delay results, parameter results, and convergence results from the analysis results into the preset expression to generate the test results. Electronic device 2 then generates a test report based on the parameter results, the test results, and the target waveform.

[0136] The test results can indicate whether there are any anomalies in latency, parameter parameters, or convergence. For example, if the latency is within a preset range, the test requirements are met; if the latency exceeds the preset range, the test results are abnormal.

[0137] The test results are presented in the form of expressions. The specific content of the preset expressions can be set based on the actual simulation test requirements, and is not limited here.

[0138] Electronic device 2 generates a test report based on parameter results, test results, and target waveform. The test report may include at least one of the following: parameters of the waveform to be analyzed, harmonic components of the waveform to be analyzed, expression of test results, and target waveform.

[0139] This application generates test results automatically by substituting at least one of the time delay results, parameter results, and convergence results from the analysis results into a preset expression, thereby reducing the professional knowledge requirements of testers and improving analysis efficiency.

[0140] According to some embodiments of this application, step S102 of obtaining the waveform to be analyzed from the test waveform data includes: calculating the waveform to be analyzed from the test waveform data according to a preset waveform formula.

[0141] Electronic device 2 is pre-set with a preset waveform formula for calculating the waveform to be analyzed. For example, the tester sets the preset waveform formula on electronic device 2. Electronic device 2 calculates the waveform to be analyzed from the test waveform data according to the preset waveform formula.

[0142] The waveform to be analyzed, generated by electronic device 2 based on the test waveform data according to a preset waveform formula, can be a power waveform, etc. The specific content of the preset waveform formula can be set based on the actual simulation test requirements and is not limited here.

[0143] In some embodiments, the preset waveform formula can be power = current * voltage. For example, current can include instantaneous current and voltage can include instantaneous voltage. When it is necessary to calculate instantaneous power, the electronic device 2 can substitute multiple instantaneous currents and multiple instantaneous voltages into the preset waveform formula to calculate multiple instantaneous powers, and generate corresponding instantaneous power waveforms based on the multiple instantaneous powers as the waveform to be analyzed.

[0144] This application calculates the test waveform data according to a preset waveform formula, which can generate a specific waveform to be analyzed, such as a special waveform of electrochemical energy storage, thereby realizing the automated analysis of a specific waveform to be analyzed.

[0145] According to some embodiments of this application, please refer to Figure 1 Electronic device 2 is used in energy storage system. Electronic device 2 includes acquisition module 21, analysis module 22 and generation module 23.

[0146] The acquisition module 21 is used to acquire test waveform data of the energy storage system and obtain the waveform to be analyzed from the test waveform data. The test waveform data includes the voltage and / or current of the energy storage system.

[0147] Analysis module 22 is used to perform at least one of the following on the waveform to be analyzed: state analysis, convergence analysis, and parameter calculation, to obtain analysis results. The analysis results include at least one of the following: time delay results, convergence results, and parameter results.

[0148] Module 23 is used to generate a test report based on the analysis results.

[0149] In this embodiment, the electronic device 2 acquires the test waveform data of the energy storage system through the acquisition module 21, and obtains the waveform to be analyzed from the test waveform data. The analysis module 22 performs at least one of state analysis, convergence analysis, and parameter calculation on the waveform to be analyzed to obtain the analysis result. This realizes automated analysis of the test waveform data of the energy storage system, reduces the analysis time of test personnel, improves analysis efficiency, automatically generates test reports, and reduces the professional requirements of test personnel.

[0150] Please see Figure 13 , Figure 13 This is a schematic diagram of an embodiment of the non-volatile computer-readable storage medium provided in this application. The non-volatile computer-readable storage medium 4 stores program instructions 41, which, when executed by a processor, implement the steps of any of the waveform-based test report generation methods described above.

[0151] According to some embodiments of this application, this application also provides a computer program product. The computer program product includes a computer program that, when executed by a processor, implements the steps of any of the waveform-based test report generation methods described above.

[0152] The above scheme provides a waveform-based test report generation method applied to energy storage systems. The method includes: acquiring test waveform data of the energy storage system, the test waveform data including the voltage and / or current of the energy storage system; acquiring the waveform to be analyzed from the test waveform data; performing at least one of state analysis, convergence analysis, and parameter calculation on the waveform to be analyzed to obtain analysis results, the analysis results including at least one of time delay results, convergence results, and parameter results; and generating a test report based on the analysis results.

[0153] In some embodiments, the functions or modules of the apparatus provided in this application can be used to perform the methods described in the above method embodiments. The specific implementation can be referred to the description of the above method embodiments, and for the sake of brevity, it will not be repeated here.

[0154] The description of the various embodiments above tends to emphasize the differences between the various embodiments. The similarities or similarities between them can be referred to, and for the sake of brevity, they will not be repeated here.

[0155] In the several embodiments provided in this application, it should be understood that the disclosed methods and apparatus can be implemented in other ways. For example, the apparatus implementations described above are merely illustrative. For instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the mutual coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection of devices or units may be electrical, mechanical, or other forms.

[0156] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0157] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) or processor to execute all or part of the steps of the methods of various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0158] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and not to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. These modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application, and they should all be covered within the scope of the claims and specification of this application. In particular, as long as there is no structural conflict, the various technical features mentioned in the embodiments can be combined in any way. This application is not limited to the specific embodiments disclosed herein, but includes all technical solutions falling within the scope of the claims.

Claims

1. A waveform-based test report generation method, characterized in that, Applied to energy storage systems, the method includes: Acquire test waveform data of the energy storage system, the test waveform data including the voltage and / or current of the energy storage system; The waveform to be analyzed is obtained from the test waveform data, and at least one of state analysis, convergence analysis and parameter calculation is performed on the waveform to be analyzed to obtain the analysis result, which includes at least one of time delay result, convergence result and parameter result; A test report is generated based on the analysis results.

2. The waveform-based test report generation method according to claim 1, characterized in that, The waveform to be analyzed includes a reference waveform and a response waveform corresponding to the reference waveform; The process of performing at least one of state analysis, convergence analysis, and parameter calculation on the waveform to be analyzed includes: The reference time corresponding to the state switching of the reference waveform is determined based on preset conditions; The switching time of the response waveform is obtained based on the reference time; The delay result is generated based on the reference time and the switching time.

3. The waveform-based test report generation method according to claim 2, characterized in that, The switching time of obtaining the response waveform based on the reference time includes: Based on the reference time, wavelet transform is performed on the response waveform within a preset window to determine the switching time.

4. The waveform-based test report generation method according to claim 2 or 3, characterized in that, The generation of the delay result based on the reference time and the switching time includes: The time delay result is obtained by subtracting the reference time from the switching time.

5. The waveform-based test report generation method according to any one of claims 1-4, characterized in that, The process of performing at least one of state analysis, convergence analysis, and parameter calculation on the waveform to be analyzed includes: Obtain the state curve from the waveform to be analyzed; The state curve is detrended to obtain a detrended curve; The convergence result is obtained by analyzing the convergence of the detrending curve.

6. The waveform-based test report generation method according to any one of claims 1-5, characterized in that, The process of performing at least one of state analysis, convergence analysis, and parameter calculation on the waveform to be analyzed includes: The parameters of the waveform to be analyzed are calculated based on a preset calculation method to generate the parameter results.

7. The waveform-based test report generation method according to claim 6, characterized in that, After the step of obtaining the waveform to be analyzed from the test waveform data, the method further includes: The waveform to be analyzed is subjected to harmonic filtering. Identify outliers in the waveform to be analyzed and mark the outliers on the waveform to be analyzed.

8. The waveform-based test report generation method according to claim 7, characterized in that, The harmonic filtering process for the waveform to be analyzed includes: Harmonic components are obtained through Fourier transform; Harmonics in the waveform to be analyzed are removed based on the harmonic components to perform harmonic filtering on the waveform to be analyzed.

9. The waveform-based test report generation method according to claim 6, characterized in that, After the step of calculating the parameters of the waveform to be analyzed based on a preset calculation method, the method further includes: The parameters are calibrated onto the waveform to be analyzed to obtain the target waveform.

10. The waveform-based test report generation method according to claim 9, characterized in that, The generation of the test report based on the analysis results includes: Test results are generated based on the analysis results and the preset expression; The test report is generated based on the parameter results, the test results, and the target waveform.

11. The waveform-based test report generation method according to claim 1, characterized in that, The step of obtaining the waveform to be analyzed from the test waveform data includes: The waveform to be analyzed is obtained by calculating the test waveform data according to the preset waveform formula.

12. The waveform-based test report generation method according to claim 1, characterized in that, The acquisition of test waveform data of the energy storage system includes: Scripts for generating simulation systems; The script is sent to the simulation system so that the simulation system executes the script to perform simulation testing on the energy storage system and obtains the test waveform data. Receive test waveform data sent by the simulation system.

13. An electronic device, characterized in that, The electronic device, used in an energy storage system, includes: The acquisition module is used to acquire test waveform data of the energy storage system and to acquire the waveform to be analyzed from the test waveform data, wherein the test waveform data includes the voltage and / or current of the energy storage system. The analysis module is used to perform at least one of state analysis, convergence analysis, and parameter calculation on the waveform to be analyzed to obtain analysis results, wherein the analysis results include at least one of time delay results, convergence results, and parameter results; The generation module is used to generate a test report based on the analysis results.

14. A non-volatile computer-readable storage medium storing program instructions thereon, characterized in that, When the program instructions are executed by the processor, they implement the waveform-based test report generation method according to any one of claims 1 to 12.

15. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the waveform-based test report generation method as described in any one of claims 1 to 12.

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