Method for determining offset, determining moving route and controlling needle to be measured

Abstract

The disclosure provides a method for determining an offset, a method for determining a moving route, a method for controlling a needle to be measured, and a control system. The method for determining the offset comprises: controlling a standard needle to move in a first direction, determining a first coordinate when a needle head of the standard needle passes through a first light beam and a second coordinate when the needle head passes through a second light beam; controlling the needle to be measured to move in the first direction, determining a third coordinate when a needle head of the needle to be measured passes through the first light beam and a fourth coordinate when the needle head passes through the second light beam; and determining a first offset of the needle head of the needle to be measured relative to the needle head of the standard needle in the first direction based on the first coordinate, the second coordinate, the third coordinate, and the fourth coordinate. The technical solution of the disclosure can be used to determine the offset of the needle to be measured, and is beneficial to improving the machining precision when the needle-shaped tool is applied.

Description

Technical Field

[0001] This disclosure relates to the field of data processing technology, and in particular to a method for determining offset, a method for determining movement path, a method for controlling the probe under test, and a control system. Background Technology

[0002] In manufacturing and precision machining, various needle-like tools are widely used in processes such as dispensing, testing, and spraying, including dispensing needles, testing needles, and spraying needles. For these needle-like tools, even a slight deviation in the needle tip due to deformation can directly affect the process's effectiveness. For example, with a dispensing needle, if the needle tip deforms relative to a standard dispensing needle, when both needles are in the same position, the needle tip of the current dispensing needle will deviate from the standard needle's trajectory. This deviation means that when the current dispensing needle moves along a preset path, its trajectory will not overlap with that of the standard dispensing needle moving along the same path. Consequently, the actual dispensing trajectory of the current dispensing needle deviates from the preset trajectory planned by the standard dispensing needle, thus affecting the accuracy and reliability of the dispensing process. Summary of the Invention

[0003] This disclosure provides a method for determining offset, a method for determining movement path, a method for controlling the probe under test, and a control system to solve one or more of the above-mentioned technical problems.

[0004] In a first aspect, embodiments of this disclosure provide a method for determining an offset, including:

[0005] Control the standard needle to move along the first direction, and determine the first coordinate when the tip of the standard needle passes through the first beam and the second coordinate when it passes through the second beam;

[0006] Control the needle to be tested to move along the first direction, and determine the third coordinate when the needle tip passes through the first beam and the fourth coordinate when it passes through the second beam;

[0007] Based on the first coordinate, second coordinate, third coordinate, and fourth coordinate, determine the first offset of the needle tip of the test needle relative to the needle tip of the standard needle in the first direction.

[0008] Optionally, the method further includes:

[0009] Control the standard needle to move along the second direction, and determine the fifth coordinate when the tip of the standard needle passes through the first beam and the sixth coordinate when it passes through the second beam;

[0010] Control the needle to be tested to move along the second direction, and determine the seventh coordinate when the needle tip passes through the first beam and the eighth coordinate when it passes through the second beam.

[0011] Based on the fifth, sixth, seventh, and eighth coordinates, determine the second offset of the needle tip of the test needle relative to the needle tip of the standard needle in the second direction.

[0012] Optionally, the method further includes:

[0013] Control the standard needle to move from the first starting position to the first ending position along a third direction, and determine the ninth coordinate of the needle tip when the standard needle moves to the first ending position;

[0014] Control the probe to be tested to move from the first starting position to the first ending position along a third direction, and determine the tenth coordinate of the probe tip when the probe to be tested moves to the first ending position;

[0015] Determine the difference between the tenth and ninth coordinates in the third direction;

[0016] Based on the third coordinate difference, the third offset of the needle tip of the test needle relative to the needle tip of the standard needle in the third direction is determined.

[0017] Optionally, the first coordinate is determined based on at least one of the eleventh and twelfth coordinates; the eleventh coordinate includes the coordinates when the tip of the standard needle enters the first beam; the twelfth coordinate includes the coordinates when the tip of the standard needle leaves the first beam.

[0018] Optionally, when the first coordinate is determined based on the eleventh and twelfth coordinates, the steps for determining the first coordinate are as follows:

[0019] Determine the first pre-configured weight for the eleventh coordinate and the second pre-configured weight for the twelfth coordinate;

[0020] The first coordinate is determined based on the eleventh coordinate, the twelfth coordinate, the first weight, and the second weight.

[0021] Optionally, when the first coordinate is determined based on the eleventh or twelfth coordinate, the steps for determining the first coordinate are as follows:

[0022] Use the eleventh or twelfth coordinate as the first coordinate.

[0023] Optionally, controlling the standard needle to move along the first direction includes: controlling the standard needle to move from a second starting position to a second ending position along the first direction;

[0024] Controlling the movement of the probe under test along the first direction includes: controlling the probe under test to move from the second starting position to the second ending position along the first direction.

[0025] Optionally, based on the first coordinate, second coordinate, third coordinate, and fourth coordinate, determining the first offset of the needle tip of the test needle relative to the needle tip of the standard needle in the first direction includes:

[0026] Determine the first coordinate difference between the third coordinate and the first coordinate in the first direction, and determine the second coordinate difference between the fourth coordinate and the second coordinate in the first direction;

[0027] The first offset is determined based on the first coordinate difference and the second coordinate difference.

[0028] Optionally, determining the first offset based on the first coordinate difference and the second coordinate difference includes:

[0029] Determine the third weight pre-configured for the first coordinate difference and the fourth weight pre-configured for the second coordinate difference;

[0030] The first offset is determined based on the first coordinate difference, the second coordinate difference, the third weight, and the fourth weight.

[0031] Optionally, the first beam is emitted by a first through-beam sensor; the second beam is emitted by a second through-beam sensor.

[0032] Secondly, embodiments of this disclosure provide a method for determining a movement route, including:

[0033] The offset of the needle tip of the test needle relative to the needle tip of the standard needle is determined; the offset includes a first offset of the needle tip of the test needle relative to the needle tip of the standard needle in a first direction; the first offset is determined by performing the offset determination method provided in the embodiments of this disclosure.

[0034] Based on the offset, the preset movement path is compensated to obtain the compensated movement path, so that when the needle under test moves according to the compensated movement path, the first movement trajectory of the needle tip overlaps with the second movement trajectory of the standard needle when it moves according to the preset movement path.

[0035] Optionally, the offset may also include a second offset of the tip of the test needle relative to the tip of the standard needle in a second direction.

[0036] Optionally, the offset may also include a third offset of the needle tip of the test needle relative to the needle tip of the standard needle in a third direction.

[0037] Thirdly, embodiments of this disclosure provide a method for controlling a probe, including:

[0038] The compensated movement route is determined by performing the movement route determination method provided in the embodiments of this disclosure.

[0039] Control the probe to be tested to move along the compensated path.

[0040] Fourthly, embodiments of this disclosure provide a control system, including: an offset determination module, a movement route determination module, and a control module;

[0041] An offset determination module is used to determine the offset of the needle tip of the test needle relative to the needle tip of a standard needle; the offset includes a first offset of the needle tip of the test needle relative to the needle tip of the standard needle in a first direction; the first offset is determined by the offset determination method provided in the embodiments of this disclosure.

[0042] The movement route determination module is used to execute the movement route determination method provided in the embodiments of this disclosure to obtain the compensated movement route;

[0043] The control module is used to execute the control method of the probe under test provided in the embodiments of this disclosure, and to control the probe under test to move according to the compensated movement path.

[0044] Optionally, the offset may also include a second offset of the tip of the test needle relative to the tip of the standard needle in a second direction.

[0045] Optionally, the offset may also include a third offset of the tip of the test needle relative to the tip of the standard needle in a third direction.

[0046] In some embodiments of this disclosure, by controlling the movement of a standard needle and a test needle along a first direction, the coordinates of the standard needle and the test needle when they pass through the first beam are determined, thereby detecting the offset of the needle-like tool. After determining the offset of the needle-like tool, it can be used to determine whether the needle-like tool meets the usage requirements, reducing the impact of the needle-like tool on machining quality. The needle-like tool can also be corrected, or the process of controlling its movement can be compensated, which helps improve the accuracy of machining using the needle-like tool.

[0047] This disclosure also relates to a method for determining a movement path, which uses the aforementioned method for determining offset to determine the offset of the probe under test, and compensates for the preset movement path of the probe under test based on the offset of the probe under test. Even if the probe under test has a certain offset, the impact of the offset of the probe under test on the machining accuracy can be reduced by compensating for the movement path.

[0048] This disclosure also relates to a method for controlling a probe, which uses the aforementioned method for determining the movement path to control the movement of the probe.

[0049] This disclosure also relates to a control system in which an offset determination module performs the aforementioned offset determination method to determine the offset of the probe under test. A movement path determination module performs the aforementioned movement path determination method.

[0050] The above overview is for illustrative purposes only and is not intended to be limiting in any way. Further aspects, embodiments, and features of this disclosure will become readily apparent from the accompanying drawings and the following detailed description, in addition to the illustrative aspects, embodiments, and features described above. Attached Figure Description

[0051] To more clearly illustrate the technical solutions in the embodiments of this disclosure, the accompanying drawings used in the following description of the embodiments will be provided as examples. The drawings described below are merely embodiments of this disclosure. For those skilled in the art, other drawings can be obtained based on the provided drawings without creative effort. The drawings are used to provide a further understanding of this disclosure and constitute a part of the specification. They are used together with the embodiments of this disclosure to explain this disclosure and do not constitute a limitation of this disclosure.

[0052] Figure 1 A schematic diagram of an exemplary three-dimensional spatial coordinate system consistent with some embodiments of this disclosure is shown.

[0053] Figure 2 A flowchart of an exemplary determination method consistent with some embodiments of this disclosure is shown.

[0054] Figure 3A and Figure 3B An exemplary projection of coordinates onto the XOY plane, consistent with different embodiments of this disclosure, is shown.

[0055] Figure 4 A flowchart illustrating an exemplary method for determining a movement route consistent with some embodiments of this disclosure is shown.

[0056] Figure 5 A flowchart illustrating an exemplary method for controlling a probe consistent with some embodiments of this disclosure is shown.

[0057] Figure 6 A schematic diagram of the structure of an exemplary control system consistent with some embodiments of this disclosure is shown.

[0058] Figure 7 A block diagram of an exemplary electronic device consistent with some embodiments of this disclosure is shown. Detailed Implementation

[0059] In the following description, only certain exemplary embodiments are briefly described. As those skilled in the art will recognize, the described embodiments can be modified in various ways without departing from the spirit or scope of this disclosure. Therefore, the drawings and description are to be considered exemplary in nature and not restrictive.

[0060] In the description of this disclosure, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise," etc., indicating orientation or positional relationships based on the orientation or positional relationships shown in the accompanying drawings, are only for the convenience of describing this disclosure and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this disclosure. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more features. In the description of this disclosure, "a plurality of" means two or more, unless otherwise expressly and specifically defined.

[0061] In the description of this disclosure, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," and "joint" should be interpreted broadly. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections, electrical connections, or connections that allow for communication; they can refer to direct connections or indirect connections through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this disclosure according to the specific circumstances.

[0062] In this disclosure, unless otherwise expressly specified and limited, "above" or "below" a second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of a second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" a second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature. In the description of this disclosure, "at least one" or "at least one of" multiple objects refers to any object or combination of multiple objects, for example, "at least one of a1, a2, a3" includes: "a1 alone," "a2 alone," "a3 alone," "a1 and a2," "a1 and a3," "a2 and a3," or "a1, a2, and a3."

[0063] The following disclosure provides numerous different embodiments or examples for implementing various structures of this disclosure. To simplify the disclosure, specific examples of components and arrangements are described below. These are merely examples and are not intended to limit the scope of this disclosure. Furthermore, reference numerals and / or letters may be repeated in different examples; such repetition is for simplification and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. In addition, various specific examples of processes and materials are provided in this disclosure, but those skilled in the art will recognize the application of other processes and / or the use of other materials.

[0064] The embodiments of this disclosure are described below with reference to the accompanying drawings. It should be understood that the embodiments described herein are for illustration and explanation only and are not intended to limit this disclosure.

[0065] To facilitate understanding of the technical solutions of the embodiments of this disclosure, the related technologies of the embodiments of this disclosure are described below. The following related technologies are optional solutions and can be combined with the technical solutions of the embodiments of this disclosure in any way, and all of them fall within the protection scope of the embodiments of this disclosure.

[0066] This disclosure relates to a method for determining offset. In some embodiments, the method for determining offset may first control a standard needle to move along a first direction, and determine a first coordinate of the standard needle tip when it passes through a first light beam and a second coordinate when it passes through a second light beam. Then, control the needle to be tested to move along the first direction, and determine a third coordinate of the needle tip when it passes through the first light beam and a fourth coordinate when it passes through the second light beam. Finally, based on the first, second, third, and fourth coordinates, determine a first offset of the needle tip of the needle to be tested relative to the needle tip of the standard needle in the first direction.

[0067] In some embodiments, the method for determining the offset may first control the probe under test to move along a first direction, and determine the third coordinate of the probe tip when it passes through the first beam and the fourth coordinate when it passes through the second beam. Then, control the standard probe to move along the first direction, and determine the first coordinate of the standard probe tip when it passes through the first beam and the second coordinate when it passes through the second beam. Then, based on the first, second, third, and fourth coordinates, determine the first offset of the probe tip relative to the standard probe tip in the first direction.

[0068] In some embodiments of this disclosure, the standard needle and the needle to be tested can be various needle-like tools controlled by a three-axis servo system in the manufacturing and precision machining fields, such as dispensing needles, testing needles, and spraying needles. The standard needle can be a precisely calibrated needle-like tool used as a reference, and the needle to be tested can refer to a needle-like tool whose offset is to be determined.

[0069] In some embodiments of this disclosure, the first and second beams can be beams emitted by photoelectric sensors. The beam width can be adjusted according to specific application requirements. A narrower beam enables high-precision measurement. A wider beam can accommodate a wider range of detection needs. In some embodiments, the beam width is determined based on the diameter of the probe tip. For example, a preset coefficient is used, and the probe tip diameter is multiplied by the preset coefficient to obtain a set beam width. Beams with a width less than the set width are defined as narrow beams, and beams with a width greater than the set width are defined as wide beams. In some embodiments, the beam width can be multiplied by another coefficient based on the set width, depending on the detection accuracy.

[0070] It should be noted that, in the embodiments of this disclosure, the beam widths of the first beam and the second beam are not specifically limited. Meanwhile, the through-beam sensor can achieve precise and stable beam emission; in some embodiments, the beam can be emitted via the through-beam sensor. For example, the first beam is emitted by the first through-beam sensor, and the second beam is emitted by the second through-beam sensor.

[0071] In some embodiments of this disclosure, the coordinates of the needle tip (e.g., the first, second, third, and fourth coordinates mentioned above, and other coordinates of the needle tip mentioned below) can be the coordinates of a pre-defined position in the needle tip within a pre-constructed three-dimensional spatial coordinate system. The position of the needle tip can be determined using the coordinates of the needle tip. For example, the pre-defined position in the needle tip can be the tip position of the needle, or it can be another position of the needle tip, such as a preset position above the needle tip (e.g., 0.05 cm above the needle tip). This disclosure does not specifically limit the pre-defined position in its embodiments.

[0072] In some embodiments of this disclosure, the coordinates of the standard needle and the needle to be tested can refer to the coordinates of a specified position of the standard needle and the needle to be tested in a pre-constructed three-dimensional spatial coordinate system. Correspondingly, the positions of the standard needle and the needle to be tested can be the positions of a specified position of the standard needle and the needle to be tested in a pre-constructed three-dimensional spatial coordinate system. The positions of the standard needle and the needle to be tested (e.g., the first starting position, the first ending position, the second starting position, and the second ending position, etc., hereinafter and to be discussed) can be calibrated using the coordinates of the standard needle and the needle to be tested. For example, the specified position of the standard needle and the needle to be tested can be the tail position of the needle tip, the middle position of the standard needle and the needle to be tested, or other positions of the standard needle and the needle to be tested, such as a preset position below the tail (e.g., 0.1 cm below the tail). It should be noted that the specified position is not specifically limited in the embodiments of this disclosure.

[0073] In some embodiments of this disclosure, the first direction, the second direction, and the third direction can be any three different directions. In some embodiments of this disclosure, the first direction, the second direction, and the third direction can be three mutually perpendicular directions. In some embodiments of this disclosure, the first direction, the second direction, and the third direction are not specifically limited. For ease of description, in some embodiments, the first direction represents the X-axis direction or the Y-axis direction in a pre-constructed three-dimensional spatial coordinate system, the second direction represents the Y-axis direction or the X-axis direction in a pre-constructed three-dimensional spatial coordinate system, and the third direction represents the Z-axis direction in a pre-constructed three-dimensional spatial coordinate system. For example, when the first direction is the X-axis direction, the second direction is the Y-axis direction; and when the first direction is the Y-axis direction, the second direction is the X-axis direction.

[0074] In one example, reference Figure 1 , Figure 1 A schematic diagram of an exemplary three-dimensional spatial coordinate system consistent with some embodiments of the present disclosure is shown, wherein the first direction refers to the X-axis direction, the second direction is the Y-axis direction, and the third direction refers to the Z-axis direction.

[0075] In some embodiments of this disclosure, the offset of the test needle tip relative to the standard needle tip can be the positional difference between the test needle tip and the standard needle tip when the test needle and the standard needle are in the same position. This offset can include one or more of the following: a first offset of the test needle tip relative to the standard needle tip in a first direction; a second offset of the test needle tip relative to the standard needle tip in a second direction; or a third offset of the test needle tip relative to the standard needle tip in a third direction.

[0076] In some embodiments of this disclosure, the offset of the test needle tip relative to the standard needle tip is caused, for example, by needle tip deformation. Causes of needle tip deformation may include overuse or wear, manufacturing errors, and external impacts or collisions.

[0077] In some embodiments of this disclosure, the method for determining the offset utilizes beam detection technology. By analyzing the coordinate changes of a standard needle and a needle under test as they pass through a first beam and a second beam, a first offset of the needle tip of the needle under test relative to the needle tip of the standard needle can be determined in a first direction. Beam detection technology is non-contact, highly sensitive, and has high resolution, enabling precise detection of minute offsets caused by needle deformation between the standard needle tip and the needle tip under test. Determining the offset by recording the coordinate changes of the standard needle and the needle under test as they pass through the first and second beams, based on beam detection technology, improves the accuracy of the determined offset. In some embodiments, after determining the offset of the needle under test relative to the standard needle, the suitability of the needle under test can be determined based on the offset, and the needle under test can be processed accordingly. Alternatively, in some embodiments, even when the offset is not zero, compensation can be made to the movement path of the needle under test based on the offset of the needle under test relative to the standard needle, which improves the processing accuracy when using the needle under test for machining.

[0078] In addition, the offset determination method involved in some embodiments of this disclosure can determine the offset by controlling the movement of the standard needle and the needle to be tested separately and combining it with beam detection technology. This makes the offset determination process fast and convenient, thereby improving the offset determination efficiency.

[0079] Furthermore, the offset determination method involved in some embodiments of this disclosure has relatively relaxed requirements for the arrangement of the first and second beams. The standard needle and the needle under test can pass through the first and second beams sequentially, without strict control over their relative positions, angles, or fixed spacing. This relaxed beam arrangement requirement significantly reduces the accuracy requirements of the photoelectric sensor, thereby reducing the difficulty of its installation and debugging. For example, when the first beam is emitted by the first through-beam sensor and the second beam is emitted by the second through-beam sensor, there is no need for precise installation and debugging of the first and second through-beam sensors to ensure that the first beam emitted by the first through-beam sensor is parallel to either the first or second direction, and the second beam emitted by the second through-beam sensor is parallel to either the second or first direction. The beams emitted by the first and second through-beam sensors can cover the paths of the standard needle and the needle under test, respectively.

[0080] In some embodiments of this disclosure, the method for determining the offset can be used to determine the offset of the tip of a dispensing needle to be tested relative to the tip of a standard dispensing needle. The needle to be tested can be a dispensing needle to be tested, and the standard needle can be a standard dispensing needle. In some embodiments of this disclosure, the method for determining the offset can also be used to determine the offset of the tip of a test needle to be tested relative to the tip of a standard test needle. The needle to be tested can refer to a test needle to be tested, and the standard needle can refer to a standard test needle. In some embodiments of this disclosure, the method for determining the offset can also be used to determine the offset of the tip of a spray needle to be tested relative to the tip of a standard spray needle. The needle to be tested can refer to a spray needle to be tested, and the standard needle can refer to a standard spray needle. The standard needle is not limited to a needle-shaped tool capable of performing dispensing, testing, or spraying functions; it can also be a needle-shaped tool used for other purposes (e.g., detection).

[0081] Furthermore, it should be noted that the execution entities for determining the offset, determining the movement route, or controlling the probe under test involved in this disclosure can also be applications, services, instances, functional modules in software form, virtual machines (VMs), or cloud servers, or hardware devices (such as servers or terminal devices) or hardware chips that have the functions of determining the offset, determining the movement route, or controlling the probe under test. The hardware chip can be a CPU (Central Processing Unit), GPU (Graphics Processing), FPGA (Field Programmable Gate Array), NPU (Neural-network Processing Unit), AI (Artificial Intelligence) accelerator card, or DPU (Data Processing Unit), etc.

[0082] The technical solutions of this disclosure and how they solve the aforementioned technical problems are described in detail below with specific embodiments. The following related technologies are optional solutions and can be arbitrarily combined with the technical solutions of the embodiments of this disclosure, all of which fall within the protection scope of the embodiments of this disclosure. Identical or similar concepts or processes may not be described again in some embodiments.

[0083] Figure 2 A flowchart of an exemplary determination method 200 consistent with some embodiments of the present disclosure is shown, which may include steps S202-S206.

[0084] In step S202, the standard needle is controlled to move along the first direction, and the first coordinate of the standard needle tip when it passes through the first beam and the second coordinate when it passes through the second beam are determined.

[0085] In step S204, the probe to be tested is controlled to move along the first direction, and the third coordinate of the probe tip when it passes through the first beam and the fourth coordinate when it passes through the second beam are determined.

[0086] In step S206, based on the first coordinate, the second coordinate, the third coordinate, and the fourth coordinate, the first offset of the needle tip of the test needle relative to the needle tip of the standard needle in the first direction is determined.

[0087] In some embodiments of this disclosure, the execution order of steps S202 and S204 is not specifically limited. For example, step S202 may be executed first and step S204 may be executed later, or step S204 may be executed first and step S202 may be executed later.

[0088] In one possible implementation, the through-beam sensor can achieve precise and stable beam emission; in some embodiments, the beam can be emitted by the through-beam sensor. For example, a first beam is emitted by a first through-beam sensor, and a second beam is emitted by a second through-beam sensor.

[0089] In some embodiments of this disclosure, the first direction, the second direction, and the third direction can be any three different directions. In some embodiments of this disclosure, the first direction, the second direction, and the third direction can be three mutually perpendicular directions. In some embodiments of this disclosure, the first direction, the second direction, and the third direction are not specifically limited. For ease of description, in some embodiments, the first direction refers to the X-axis direction or the Y-axis direction in a pre-constructed three-dimensional spatial coordinate system, the second direction refers to the Y-axis direction or the X-axis direction in a pre-constructed three-dimensional spatial coordinate system, and the third direction refers to the Z-axis direction in a pre-constructed three-dimensional spatial coordinate system.

[0090] In one example, such as Figure 1 , Figure 3A , Figure 3B As shown, the first direction is the X-axis direction, and the second direction is the Y-axis direction.

[0091] In another example, the first direction is the Y-axis direction, and the second direction is the X-axis direction.

[0092] In some embodiments of this disclosure, the offset of the test needle tip relative to the standard needle tip can refer to the positional difference between the test needle tip and the standard needle tip when the test needle and the standard needle are in the same position. The offset can include one or more of the following: a first offset of the test needle tip relative to the standard needle tip in a first direction, a second offset of the test needle tip relative to the standard needle tip in a second direction, or a third offset of the test needle tip relative to the standard needle tip in a third direction.

[0093] In some embodiments, the offset may include a first offset.

[0094] In one possible implementation, the offset may include a first offset, and may further include at least one of a second offset or a third offset.

[0095] In one possible implementation, when determining the second offset, the standard needle can first be moved along the second direction to determine the fifth coordinate of the standard needle tip when it passes the first beam and the sixth coordinate when it passes the second beam. Then, the needle to be tested is moved along the second direction to determine the seventh coordinate of the needle tip when it passes the first beam and the eighth coordinate when it passes the second beam. Afterwards, based on the fifth, sixth, seventh, and eighth coordinates, the second offset of the needle tip relative to the standard needle tip in the second direction is determined.

[0096] In one possible implementation, when determining the second offset, the probe under test can first be moved along the second direction to determine the seventh coordinate of the probe tip when it passes the first beam and the eighth coordinate when it passes the second beam. Then, the standard probe is moved along the second direction to determine the fifth coordinate of the standard probe tip when it passes the first beam and the sixth coordinate when it passes the second beam. Afterward, based on the fifth, sixth, seventh, and eighth coordinates, the second offset of the probe tip relative to the standard probe tip in the second direction is determined.

[0097] In this embodiment of the disclosure, the method for determining the second offset is similar in principle to the method for determining the first offset. The following will focus on describing the determination process of the first offset in detail. The method for determining the second offset can be deduced by analogy based on the description of the determination process of the first offset.

[0098] In one possible implementation, during the process of controlling the standard needle to move along the first direction, and ensuring that the tips of both the standard needle and the test needle pass through the first beam and the second beam, a second starting position and a second ending position can be pre-selected. The line connecting the second starting position and the second ending position is parallel to the first direction, and the line connecting the second starting position and the second ending position passes through both the first beam and the second beam. In this case, controlling the standard needle to move along the first direction from the second starting position to the second ending position achieves the control of the standard needle moving along the first direction, ensuring that the tip of the standard needle passes through both the first beam and the second beam during this movement. Similarly, controlling the test needle to move along the first direction from the second starting position to the second ending position achieves the control of the test needle moving along the first direction, ensuring that the tip of the test needle passes through both the first beam and the second beam during this movement.

[0099] In some embodiments, Figure 3A and Figure 3B An exemplary projection of coordinates onto the XOY plane, consistent with different embodiments of this disclosure, is shown. The first direction is the X-axis, the second direction is the Y-axis, a selected second starting position is point A, and a selected second ending position is point B. The line connecting point A and point B is parallel to the first direction. The line connecting point A and point B passes through a first beam L1 and a second beam L2. The movement of the standard needle along the first direction is controlled by moving it from point A to point B, ensuring that the needle tip passes through both the first beam L1 and the second beam L2 during this movement. Similarly, the movement of the test needle along the first direction is controlled by moving it from point A to point B. The positions of the first beam L1 and the second beam L2 ensure that the needle tip passes through both beams during the movement of the test needle along the first direction from point A to point B.

[0100] In some embodiments, reference Figure 3A and Figure 3BA third starting position can be selected as point C, and a third ending position as point D. The line connecting points C and D is parallel to the second direction, and this line passes through the first beam L1 and the second beam L2. In this case, the standard needle can be controlled to move along the second direction from point C to point D, ensuring that its tip passes through both the first beam L1 and the second beam L2 during this movement. Similarly, the needle under test can be controlled to move along the second direction from point C to point D. The positions of the first beam L1 and the second beam L2 ensure that the needle tip passes through both beams during the movement of the needle under test along the first direction from point A to point B.

[0101] In one possible implementation, the first coordinate is determined based on at least one of an eleventh coordinate and a twelfth coordinate. The eleventh coordinate may include the coordinates when the tip of the standard needle enters the first beam L1, and the twelfth coordinate may include the coordinates when the tip of the standard needle leaves the first beam L1. For example, when the beam widths of the first beam L1 and the second beam L2 reach a set width, the first coordinate can be determined simultaneously based on both the eleventh and twelfth coordinates; conversely, when the beam widths of the first beam L1 and the second beam L2 are less than the set width, the first coordinate can be determined based on either the eleventh or twelfth coordinate.

[0102] In some embodiments, the first coordinate can be determined based on the coordinates of the intersection point between the standard needle and the first beam L1 during the movement of the standard needle along the first direction. For example, in some embodiments, the first beam L1 and the second beam L2 are collimated beams with narrow widths. When the standard needle moves along the first direction, it blocks the optical path of the first beam L1, and no distinction is made between the eleventh and twelfth coordinates. The first coordinate is determined based on the coordinates of the position where the standard needle blocks the first beam L1.

[0103] When the beam widths of the first beam L1 and the second beam L2 reach the set width, the first coordinate can be determined simultaneously based on the eleventh and twelfth coordinates, which helps improve the accuracy of the first coordinate. However, when the beam widths of the first beam L1 and the second beam L2 are less than the set width, the difference between the eleventh and twelfth coordinates is small or indistinguishable, and either the eleventh or twelfth coordinate can be directly used as the first coordinate. The second coordinate of the standard needle when its tip passes through the second beam L2 can be determined using the same or a similar method.

[0104] In some embodiments, a first beam L1 and a second beam L2 are formed using a through-beam sensor. When a standard needle or a needle under test passes through the first beam L1 and the second beam L2, the needle tip blocks the first beam L1. The through-beam sensor records the moment when the first beam L1 and the second beam L2 are blocked. By combining this with the speed of the controlled movement of the standard needle or the needle under test, the coordinates of the needle tip passing through the first beam L1 and the second beam L2 can be determined. In some embodiments, the coordinates of the needle tip entering the first beam L1 can be determined based on the falling edge of the through-beam sensor output signal, and the coordinates of the needle tip leaving the first beam L1 can be determined based on the rising edge of the through-beam sensor output signal. Using the rising and falling edges of the through-beam sensor output signal to determine the coordinates of the needle tip entering or leaving the beam improves the accuracy of the determined coordinate values ​​and helps maintain good consistency in multiple tests.

[0105] In some embodiments, such as Figure 3A As shown, the first direction is the X-axis direction, the second direction is the Y-axis direction, the selected second starting position is point A, the selected second ending position is point B, and the line connecting point A and point B is parallel to the first direction. The beam widths of the first beam L1 and the second beam L2 are less than the set width.

[0106] During the process of controlling the standard needle to move from point A to point B along the first direction, the needle tip will sequentially pass through the first light beam L1 and the second light beam L2. Based on the data collected by the photoelectric sensor, the coordinates E when the needle tip blocks the first light beam L1 and F when the needle tip blocks the second light beam L2 can be determined. Here, the first coordinate can be E, and the second coordinate can be F.

[0107] In this embodiment, the probe to be tested is controlled to move along a first direction, and the third coordinate of the probe tip when it passes through the first beam L1 and the fourth coordinate when it passes through the second beam L2 are determined. This can be based on the coordinate I (i.e., the third coordinate) of the probe tip blocking the first beam L1. Figure 3A (not shown in the image), and the coordinate J (i.e., the fourth coordinate) of the second beam L2 blocked by the needle tip of the needle under test. Figure 3A (Not shown in the image) is determined.

[0108] In some embodiments, during the process of controlling the standard needle to move from point C to point D along the second direction, the tip of the standard needle passes through the first beam L1 and the second beam L2 in sequence. Based on the data collected by the photoelectric sensor, the coordinates G (i.e., the fifth coordinate) of the standard needle tip when it passes through the first beam L1 and the coordinates H (i.e., the sixth coordinate) of the standard needle tip when it passes through the second beam L2 can be determined.

[0109] During the process of controlling the needle to be tested to move from point C to point D along the second direction, the tip of the needle will sequentially pass through the first beam L1 and the second beam L2. Based on the data collected by the photoelectric sensor, the coordinate K (i.e., the seventh coordinate) of the needle tip when it passes through the first beam L1 can be determined. Figure 3A (Not shown in the image), the coordinate L (i.e., the eighth coordinate) of the needle tip when it passes through the second beam L2. Figure 3A (Not shown in the image).

[0110] In one possible implementation, the first coordinate is determined based on the eleventh and twelfth coordinates. A first weight pre-configured for the eleventh coordinate and a second weight pre-configured for the twelfth coordinate can be determined first. Then, the first coordinate is determined based on the eleventh coordinate, the twelfth coordinate, the first weight, and the second weight.

[0111] For example, if both the first and second weights are 0.5, when determining the first coordinate based on both the eleventh and twelfth coordinates, the first coordinate can be determined by averaging the eleventh and twelfth coordinates. Alternatively, the first weight can be configured to be 0.3, the second weight to be 0.7, and so on.

[0112] In one example, such as Figure 3B As shown, the first direction is the X-axis direction, the second direction is the Y-axis direction, the selected second starting position is point A, the selected second ending position is point B, and the line connecting point A and point B is parallel to the first direction. The beam widths of the first beam L1 and the second beam L2 are both greater than the set width. In this case, during the process of controlling the standard needle to move from point A to point B along the first direction, the tip of the standard needle will sequentially enter the first beam L1, leave the first beam L1, enter the second beam L2, and leave the second beam L2. Based on the data collected by the photoelectric sensor, the eleventh coordinate of the standard needle tip when entering the first beam L1 can be determined as coordinate E', the twelfth coordinate of the standard needle tip when leaving the first beam L1 is coordinate E'', the thirteenth coordinate of the standard needle tip when entering the second beam L2 is coordinate F', and the fourteenth coordinate of the standard needle tip when leaving the second beam L2 is coordinate F''.

[0113] During the process of controlling the probe to be tested to move from point A to point B along the first direction, the probe tip will sequentially enter the first beam L1, leave the first beam L1, enter the second beam L2, and leave the second beam L2. Based on the data collected by the photoelectric sensor, the fifteenth coordinate of the probe tip when it enters the first beam L1 can be determined as coordinate I'( Figure 3B (not shown in the image), the sixteenth coordinate of the needle tip when it leaves the first beam L1 is coordinate I. Figure 3B (Not shown in the image), the seventeenth coordinate of the needle tip when it enters the second beam L2 is coordinate J' ( Figure 3B (not shown in the image), the eighteenth coordinate of the needle tip when it leaves the second beam L2 is coordinate J. Figure 3B (Not shown in the image).

[0114] Given coordinates E', E'', F', and F'', the first coordinate E can be determined by averaging E' and E''. Figure 3B (Not shown in the image). For example, coordinate E = (coordinate E' + coordinate E”) / 2. Similarly, the second coordinate F can be determined by averaging coordinates F' and F”. Figure 3B (Not shown in the image). For example, coordinate F = (coordinate F' + coordinate F”) / 2. Correspondingly, given coordinates I', I”, J', and J”, the third coordinate can be determined by averaging coordinates I' and I”. Figure 3B (Not shown in the image). For example, coordinate I = (coordinate I' + coordinate I”) / 2. Similarly, the fourth coordinate, coordinate J, can be determined by averaging coordinates J' and J”. Figure 3B (Not shown in the image). For example, coordinate J = (coordinate J' + coordinate J”) / 2.

[0115] In some embodiments, during the process of controlling the standard needle to move from point C to point D along the second direction, the tip of the standard needle will sequentially enter the first beam L1, leave the first beam L1, enter the second beam L2, and leave the second beam L2. Based on the data collected by the photoelectric sensor, the nineteenth coordinate of the standard needle tip when it enters the first beam L1 can be determined as coordinate G', the twentieth coordinate of the standard needle tip when it leaves the first beam L1 can be determined as coordinate G', the twenty-first coordinate of the standard needle tip when it enters the second beam L2 can be determined as coordinate H', and the twenty-second coordinate of the standard needle tip when it leaves the second beam L2 can be determined as coordinate H'.

[0116] During the process of controlling the probe to be tested to move from point C to point D along the second direction, the probe tip will sequentially enter the first beam L1, leave the first beam L1, enter the second beam L2, and leave the second beam L2. Based on the data collected by the photoelectric sensor, the twenty-third coordinate of the probe tip when it enters the first beam L1 can be determined as coordinate K'. Figure 3B (not shown in the image), the twenty-fourth coordinate of the needle tip when it leaves the first beam L1 is coordinate K. Figure 3B (Not shown in the image), the twenty-fifth coordinate of the needle tip when it enters the second beam L2 is coordinate L'( Figure 3B (not shown in the image), the twenty-sixth coordinate of the needle tip when it leaves the second beam L2 is coordinate L ( Figure 3B (Not shown in the image).

[0117] Given coordinates G', G'', H', and H''', the fifth coordinate, G''', can be determined by averaging the values ​​of G' and G'''. Figure 3B (Not shown in the image), for example, coordinate G = (coordinate G' + coordinate G”) / 2. Similarly, the sixth coordinate can be determined by averaging coordinates H' and H”. Figure 3B (Not shown in the image), for example, coordinate H = (coordinate H' + coordinate H”) / 2. Correspondingly, given coordinates K', K”, L', and L”, the seventh coordinate can be determined by averaging coordinates K' and K”. Figure 3B (Not shown in the image), for example, coordinate K = (coordinate K' + coordinate K”) / 2. Similarly, the eighth coordinate can be determined by averaging coordinates L' and L”. Figure 3B (not shown in the image), for example, coordinate L = (coordinate L' + coordinate L”) / 2.

[0118] In one possible implementation, when determining the first offset of the needle tip of the test needle relative to the needle tip of the standard needle in a first direction based on the first, second, third, and fourth coordinates, the first coordinate difference between the third and first coordinates in the first direction, and the second coordinate difference between the fourth and second coordinates in the first direction, can be determined first. Then, the first offset is determined based on the first and second coordinate differences.

[0119] When determining the second offset of the needle tip of the test needle relative to the needle tip of the standard needle in the second direction based on the fifth, sixth, seventh, and eighth coordinates, we can first determine the third coordinate difference between the seventh and fifth coordinates in the second direction, and the fourth coordinate difference between the eighth and sixth coordinates in the second direction. Then, based on the third and fourth coordinate differences, we can determine the second offset.

[0120] In one possible implementation, when determining the first offset based on the first coordinate difference and the second coordinate difference, a third weight pre-configured for the first coordinate difference and a fourth weight pre-configured for the second coordinate difference can be determined first. Then, the first offset is determined based on the first coordinate difference, the second coordinate difference, the third weight, and the fourth weight. In some embodiments, both the third weight and the fourth weight can be configured to 0.5, and the first offset can be determined by averaging the first coordinate difference and the second coordinate difference. Alternatively, the third weight can be configured to 0.4, the fourth weight to 0.6, etc.

[0121] Accordingly, when determining the second offset based on the third and fourth coordinate differences, a fifth weight pre-configured for the third coordinate difference and a sixth weight pre-configured for the fourth coordinate difference can be determined first. Then, the second offset is determined based on the third, fourth, fifth, and sixth coordinate differences. In some embodiments, both the fifth and sixth weights can be configured to 0.5, and the second offset can be determined by averaging the third and fourth coordinate differences. Alternatively, the fifth weight can be configured to 0.4, the sixth weight to 0.6, etc.

[0122] In one example, the first coordinate is E, where the coordinate value of E in the first direction is x1. The second coordinate is F, where the coordinate value of F in the first direction is x2. The third coordinate is I, where the coordinate value of I in the first direction is x3. The fourth coordinate is J, where the coordinate value of J in the first direction is x4. In this case, the first coordinate difference is x3 - x1, and the second coordinate difference is x4 - x2. If both the third and fourth weights are 0.5, then the first offset...

[0123]

[0124] The fifth coordinate is Y, where the value of Y in the second direction is y1. The sixth coordinate is Z, where the value of Z in the second direction is y2. The seventh coordinate is a, where the value of a in the second direction is y3. The eighth coordinate is b, where the value of b in the second direction is y4. In this case, the difference between the third and fourth coordinates is y3-y1, and the difference between the fourth and fifth coordinates is y4-y2. If both the fifth and sixth weights are 0.5, then the second offset...

[0125] In some embodiments, when determining the first offset of the needle tip of the test needle relative to the needle tip of the standard needle in a first direction based on the first coordinate, the second coordinate, the third coordinate, and the fourth coordinate, the midpoint coordinate between the first coordinate and the second coordinate, and the midpoint coordinate between the third coordinate and the fourth coordinate can be determined, and the first offset can be determined based on the two midpoint coordinates.

[0126] For example, the first coordinate is E, where the coordinate value of E in the first direction is x1. The second coordinate is F, where the coordinate value of F in the first direction is x2, and the coordinate of the midpoint between the first and second coordinates in the first direction is (x1+x2) / 2. The third coordinate is I, where the coordinate value of I in the first direction is x3. The fourth coordinate is J, where the coordinate value of J in the first direction is x4, and the coordinate of the midpoint between the third and fourth coordinates in the first direction is (x3+x4) / 2. Based on the two midpoint coordinates, the first offset Δx = (x1+x2) / 2 - (x3+x4) / 2 is determined.

[0127] When determining the second offset of the needle tip of the test needle relative to the needle tip of the standard needle in the second direction based on the fifth, sixth, seventh, and eighth coordinates, the midpoint coordinates between the fifth and sixth coordinates and the midpoint coordinates between the seventh and eighth coordinates can be determined. The second offset can be determined based on the two midpoint coordinates.

[0128] For example, the fifth coordinate is coordinate G, where the coordinate value of coordinate G in the second direction is y1. The sixth coordinate is coordinate H, where the coordinate value of coordinate H in the second direction is y2, and the coordinate of the midpoint between the fifth and sixth coordinates in the second direction is (y1+y2) / 2. The seventh coordinate is coordinate K, where the coordinate value of coordinate K in the second direction is y3. The eighth coordinate is coordinate L, where the coordinate value of coordinate L in the second direction is y4, and the coordinate of the midpoint between the seventh and eighth coordinates in the second direction is (y3+y4) / 2. Based on the two midpoint coordinates, the second offset Δy = (y1+y2) / 2 - (y3+y4) / 2 is determined.

[0129] In some embodiments, the first coordinate is determined based on the eleventh and twelfth coordinates, the second coordinate is determined based on the thirteenth and fourteenth coordinates, the third coordinate is determined based on the fifteenth and sixteenth coordinates, and the fourth coordinate is determined based on the seventeenth and eighteenth coordinates. When determining the first offset of the needle tip of the test needle relative to the needle tip of the standard needle in the first direction based on the first, second, third, and fourth coordinates, the midpoint coordinates between the first and second coordinates, and the midpoint coordinates between the third and fourth coordinates can be determined, and the first offset can be determined based on the two midpoint coordinates.

[0130] For example, the eleventh coordinate is E', the twelfth coordinate is E'", and the coordinate value of E' in the first direction is x1, while the coordinate value of E' in the first direction is x2. The thirteenth coordinate is F', the fourteenth coordinate is F'", and the coordinate value of F' in the first direction is x3. The coordinate value of F' in the first direction is x4. The coordinate of the midpoint between the first and second coordinates is (x1+x2+x3+x4) / 4 in the first direction.

[0131] The fifteenth coordinate is I', the sixteenth coordinate is I", with I' having a value of x5 in the first direction and I" having a value of x6 in the first direction. The seventeenth coordinate is J', the eighteenth coordinate is J", with J' having a value of x7 in the first direction and J" having a value of x8 in the first direction. The midpoint between the third and fourth coordinates has a value of (x5+x6+x7+x8) / 4 in the first direction. Based on the two midpoint coordinates, the first offset Δx is determined as (x1+x2+x3+x4) / 4-(x++x6+x7+x8) / 4. The same or similar calculation process can be used to determine the second offset Δy.

[0132] In one possible implementation, when determining the third offset, the standard needle can first be controlled to move from the first starting position to the first ending position along the third direction, and the ninth coordinate of the needle tip when the standard needle moves to the first ending position can be determined. Then, the needle to be tested is controlled to move from the first starting position to the first ending position along the third direction, and the tenth coordinate of the needle tip when the needle to be tested moves to the first ending position can be determined. After that, the third coordinate difference between the tenth coordinate and the ninth coordinate in the third direction is determined. Finally, based on the third coordinate difference, the third offset of the needle tip of the needle to be tested relative to the needle tip of the standard needle in the third direction is determined.

[0133] In one possible implementation, when determining the third offset, the probe under test can first be moved along a third direction from a first starting position to a first ending position, and the tenth coordinate of the probe tip when it reaches the first ending position can be determined. Then, the standard probe is moved along a third direction from a first starting position to a first ending position, and the ninth coordinate of the standard probe when it reaches the first ending position can be determined. Next, the difference between the tenth and ninth coordinates in the third direction can be determined. Finally, based on this third coordinate difference, the third offset of the probe tip relative to the standard probe tip in the third direction can be determined.

[0134] In some embodiments, the ninth and tenth coordinates can be directly determined using data acquired by the tool setter sensor, which helps improve sensitivity and accuracy. Alternatively, the ninth and tenth coordinates can be determined using other auxiliary methods (such as reference point detection, visual inspection equipment, or optical measurement) in conjunction with sensor data. Furthermore, the ninth and tenth coordinates can be further determined through algorithmic processing (e.g., interpolation calculation, error compensation algorithm) or by referring to preset calibration data, thereby improving the overall accuracy and robustness of the detection.

[0135] The method for determining the offset provided in this embodiment utilizes beam detection technology. By assessing the coordinate changes of the standard needle and the needle under test as they pass through the first and second beams, the method can determine a first offset of the needle tip of the needle under test relative to the needle tip of the standard needle in a first direction. Beam detection technology is non-contact, highly sensitive, and has high resolution, enabling it to accurately detect minute offsets caused by needle deformation between the standard needle tip and the needle tip under test. By determining the offset by recording the coordinate changes of the standard needle and the needle under test as they pass through the first and second beams using beam detection technology, the accuracy of the determined offset can be improved.

[0136] In addition, the offset determination method provided in some embodiments of this disclosure can determine the offset by controlling the movement of the standard needle and the needle to be tested separately and combining it with beam detection technology. This makes the offset determination process fast and convenient, thereby improving the offset determination efficiency.

[0137] Furthermore, the offset determination method provided in some embodiments of this disclosure has relatively relaxed requirements for the arrangement of the first and second beams, allowing the standard needle and the needle under test to pass through the first and second beams sequentially, respectively, without the need for strict control over the relative position, included angle, or fixed spacing of the first and second beams. This relaxed beam arrangement requirement significantly reduces the accuracy requirements of the photoelectric sensor, thereby reducing the difficulty of installing and debugging the photoelectric sensor. For example, when the first beam is emitted by the first through-beam sensor and the second through-beam sensor emits the second beam, it is not necessary to precisely install and debug the first and second through-beam sensors to ensure that the first beam emitted by the first through-beam sensor is parallel to the first or second direction, and the second beam emitted by the second through-beam sensor is parallel to the second or first direction, so that the beams emitted by the first and second through-beam sensors can cover the paths of the standard needle and the needle under test, respectively.

[0138] Some embodiments of this disclosure further relate to a method for determining a movement path. This method first determines the offset of the needle tip of the test needle relative to the needle tip of a standard needle. Then, based on the offset, a preset movement path is compensated to obtain a compensated movement path, such that the first movement trajectory of the needle tip when the test needle moves along the compensated movement path overlaps with or is close to the second movement trajectory of the standard needle when it moves along the preset movement path.

[0139] In some embodiments of this disclosure, the offset may include a first offset, and may also include at least one of a second offset or a third offset. The offset is determined by performing the offset determination method involved in some embodiments of this disclosure.

[0140] In some embodiments of this disclosure, the preset movement route is compensated based on the offset to obtain the compensated movement route. This can be achieved by correcting or adjusting the offset to compensate for the offset in the preset movement route.

[0141] In some embodiments of this disclosure, the preset movement path can be planned based on the preset movement trajectory of the standard needle tip. Specifically, the standard needle is controlled to move according to the preset movement path, and the second movement trajectory of the needle tip when the standard needle moves according to the preset movement path is the preset movement trajectory. However, if the needle tip of the test needle is offset relative to the needle tip of the standard needle, then if the test needle is still controlled to move according to the preset movement path, the actual movement trajectory of the needle tip when moving according to the preset movement path will deviate from the preset movement trajectory. In this case, the test needle will be unable to complete the corresponding task or operation according to the preset movement trajectory, thereby affecting the corresponding process effect.

[0142] In some embodiments of this disclosure, the method for determining the movement path involves, after determining the offset, compensating for the preset movement path based on the offset. This ensures that the first movement trajectory of the needle under test, when moving along the compensated movement path, overlaps or approaches the second movement trajectory of the standard needle, when moving along the preset movement path. When there is an offset between the needle under test and the standard needle, compensating for the movement path allows the first movement trajectory of the needle under test to overlap with the second movement trajectory of the standard needle (e.g., the preset movement path). This ensures that even when there is an offset between the needle under test and the standard needle, the corresponding operation or task can still be completed, guaranteeing the desired process effect.

[0143] Furthermore, the offset is determined using beam detection technology, which utilizes the coordinate changes of the standard needle and the needle under test as they pass through the first and second beams. Beam detection technology is characterized by its non-contact nature, high sensitivity, and high resolution, enabling it to accurately detect minute offsets between the tips of the standard and the needles under test. By recording the coordinate changes of the standard and the needles under test as they pass through the first and second beams, the accuracy of the determined offset can be improved, thereby enhancing the accuracy of the determined movement path.

[0144] Meanwhile, by controlling the movement of the standard needle and the needle under test separately, and combining it with beam detection technology, the offset can be determined. This makes the offset determination process fast and convenient, thereby improving the efficiency of offset determination, which in turn improves the efficiency of determining the compensated movement path.

[0145] Furthermore, the offset is determined using beam detection technology, utilizing the coordinate changes of the standard needle and the needle under test as they pass through the first and second beams. This offset determination method has relatively relaxed requirements for the arrangement of the first and second beams, eliminating the need for strict control over their relative positions, angles, or fixed spacing. This relaxed beam arrangement requirement significantly reduces the accuracy requirements and installation and debugging difficulty of the photoelectric sensor, making the process of determining the compensated movement path faster and more convenient.

[0146] The method for determining the movement path involved in some embodiments of this disclosure can be used to make the actual dispensing trajectory of the dispensing needle under test close to a preset dispensing trajectory planned according to a standard dispensing needle. For example, by compensating for the preset movement path based on the offset, so that the first movement trajectory of the needle head when the dispensing needle under test moves according to the compensated movement path overlaps with the second movement trajectory of the needle head when the standard dispensing needle moves according to the preset movement path, the actual dispensing trajectory of the dispensing needle under test can be made close to the preset dispensing trajectory planned according to the standard dispensing needle. In this case, the needle under test can be the dispensing needle under test, and the standard needle can be the standard dispensing needle.

[0147] The method for determining the movement path disclosed in this embodiment can also be used to make the actual test trajectory of the test probe under test close to the preset test trajectory planned according to the standard test probe. For example, by compensating the preset movement path based on the offset, so that the first movement trajectory of the test probe under test when moving according to the compensated movement path overlaps with the second movement trajectory of the standard test probe when moving according to the preset movement path, the actual test trajectory of the test probe under test can be made close to the preset test trajectory planned according to the standard test probe. In this case, the test probe under test can be the test probe under test, and the standard probe can be the standard test probe.

[0148] The method for determining the movement path disclosed in this embodiment can also be used to make the actual spraying trajectory of the spray needle under test close to the preset spraying trajectory planned according to the standard spray needle. For example, by compensating the preset movement path based on the offset, so that the first movement trajectory of the spray needle under test when moving according to the compensated movement path overlaps with the second movement trajectory of the standard spray needle when moving according to the preset movement path, the actual spraying trajectory of the spray needle under test can be made close to the preset spraying trajectory planned according to the standard spray needle. In this case, the spray needle under test can be the spray needle under test, and the standard needle can be the standard spray needle.

[0149] In addition, it should be noted that the application scenarios of the method for determining the movement route involved in the embodiments of this disclosure are not specifically limited. In addition to the above-mentioned application scenarios, the method for determining the movement route involved in the embodiments of this disclosure can also be applied to other scenarios.

[0150] Corresponding to the offset determination method provided in some embodiments of this disclosure, this disclosure also provides a method for determining the movement route. Figure 4 A flowchart of an exemplary method 400 for determining a movement route, consistent with some embodiments of this disclosure, is provided, which may include steps S402-S404.

[0151] In step S402, the offset of the needle tip of the test needle relative to the needle tip of the standard needle is determined; the offset includes a first offset of the needle tip of the test needle relative to the needle tip of the standard needle in a first direction; wherein the first offset can be determined by performing the offset determination method provided in the foregoing embodiments.

[0152] In step S404, the preset movement path is compensated based on the offset to obtain the compensated movement path, so that the first movement trajectory of the needle when the needle under test moves according to the compensated movement path overlaps with the second movement trajectory of the standard needle when it moves according to the preset movement path.

[0153] In some embodiments of this disclosure, the offset may further include at least one of a second offset or a third offset, wherein the second offset represents the offset of the tip of the test needle relative to the tip of the standard needle in a second direction; and the third offset represents the offset of the tip of the test needle relative to the tip of the standard needle in a third direction. Both the second and third offsets can be determined by performing the offset determination method involved in the foregoing embodiments.

[0154] In some embodiments of this disclosure, the preset movement route is compensated based on the offset to obtain the compensated movement route. This can be achieved by correcting or adjusting the offset to compensate for the offset in the preset movement route.

[0155] The method for determining the movement path provided in some embodiments of this disclosure, after determining the offset, can compensate for the preset movement path based on the offset, so that the first movement trajectory of the needle under test when moving according to the compensated movement path overlaps with the second movement trajectory of the standard needle when moving according to the preset movement path. By compensating the movement path, the offset of the needle under test relative to the needle of the standard needle can be compensated, so that the first movement trajectory of the needle under test overlaps with the second movement trajectory of the standard needle when moving according to the preset movement path (e.g., the preset movement path). This allows the corresponding operation or task to be completed according to the second movement trajectory even when the needle under test is offset relative to the needle of the standard needle, thereby ensuring the corresponding process effect.

[0156] Furthermore, beam detection technology is characterized by its non-contact nature, high sensitivity, and high resolution, enabling it to accurately detect minute offsets between the standard needle tip and the needle under test. Based on beam detection technology, the offset is determined by recording the coordinate changes of the standard needle and the needle under test as they pass through the first and second beams. This improves the accuracy of the determined offset, providing precise data support for determining the movement path. This allows the first movement trajectory of the needle under test to overlap with the second movement trajectory (i.e., the preset movement trajectory) of the standard needle as it moves along the preset path.

[0157] Meanwhile, by controlling the movement of the standard needle and the needle under test separately, and combining it with beam detection technology, the process of determining the offset can be made fast and convenient, improving the efficiency of offset determination and the efficiency of determining the compensated movement path.

[0158] Furthermore, the method for determining the offset places relatively loose requirements on the arrangement of the first and second beams, allowing the standard needle and the needle under test to pass through the first and second beams sequentially, without strictly controlling their relative positions, angles, or fixed spacing. This relaxed beam arrangement requirement significantly reduces the accuracy requirements of the photoelectric sensor, thereby reducing the difficulty of installing and debugging the sensor, and consequently making the process of determining the compensated movement path faster and more convenient.

[0159] Corresponding to the methods for determining offsets and determining movement paths provided in some embodiments of this disclosure, this disclosure also provides a method for controlling the probe under test. Figure 5 A flowchart of an exemplary method 500 for controlling a probe, consistent with some embodiments of this disclosure, is provided, which may include steps S502-S504.

[0160] In step S502, the compensated movement route is determined; the compensated movement route is determined by performing the movement route determination method provided in the embodiments of this disclosure.

[0161] In step S504, the probe to be tested is controlled to move along the compensated movement path.

[0162] In some embodiments of this disclosure, the offset includes a first offset. In some embodiments, the offset may further include at least one of a second offset or a third offset. The offset is determined by performing the offset determination method involved in the embodiments of this disclosure.

[0163] In this embodiment of the disclosure, the compensated movement route is determined by performing the movement route determination method involved in this disclosure.

[0164] The control method for the test needle provided in this embodiment controls the test needle to move along a compensated movement path, so that the first movement trajectory of the test needle when moving along the compensated movement path overlaps with the second movement trajectory of the standard needle when moving along a preset movement path. This ensures that even when there is a deviation between the test needle tip and the standard needle tip, the corresponding operation or task can still be completed according to the second movement trajectory, which is beneficial to ensuring the corresponding process effect.

[0165] Furthermore, beam detection technology is characterized by its non-contact nature, high sensitivity, and high resolution, enabling it to accurately detect minute offsets between the standard needle tip and the needle under test. Based on beam detection technology, the offset is determined by recording the coordinate changes of the standard needle and the needle under test as they pass through the first and second beams. This improves the accuracy of the determined offset, providing precise data support for compensation. Consequently, the first movement trajectory of the needle under test can overlap with the second movement trajectory (i.e., the preset movement trajectory) of the standard needle as it moves along a preset path.

[0166] Meanwhile, by controlling the movement of the standard needle and the needle under test separately, and combining it with beam detection technology, the process of determining the offset can be fast and convenient, thereby improving the efficiency of offset determination and, in turn, improving the efficiency of determining the compensated movement path.

[0167] Furthermore, the offset is determined using beam detection technology, utilizing the coordinate changes of the standard needle and the needle under test as they pass through the first and second beams. This offset determination method has relatively relaxed requirements for the arrangement of the first and second beams, allowing the standard needle and the needle under test to pass through them sequentially without strictly controlling their relative positions, angles, or fixed spacing. This relaxed beam arrangement requirement significantly reduces the accuracy requirements of the photoelectric sensor, thereby reducing the difficulty of installing and debugging the sensor, and making the process of determining the compensated movement path faster and more convenient.

[0168] Corresponding to the offset determination method, the movement path determination method, and the control method of the probe provided in some embodiments of this disclosure, this disclosure also provides a control system. Figure 6 A schematic diagram of the structure of an exemplary control system 600 consistent with some embodiments of the present disclosure is shown. The control system 600 may include: an offset determination module 602, a movement route determination module 604, and a control module 606.

[0169] In some embodiments, the offset determination module 602 can determine the offset of the tip of the test needle relative to the tip of a standard needle. The offset may include a first offset of the tip of the test needle relative to the tip of the standard needle in a first direction. The first offset can be determined by performing the offset determination method provided in the foregoing embodiments.

[0170] In some embodiments, the movement route determination module 604 can be used to execute the movement route determination method provided in the embodiments of this disclosure to obtain a compensated movement route.

[0171] In some embodiments, the control module 606 can be used to execute the control method for the probe provided in the embodiments of this disclosure, and control the probe to move according to the compensated movement path.

[0172] In some embodiments of this disclosure, the offset may include a first offset. In some embodiments, the offset may further include at least one of a second offset or a third offset. The offset is determined by performing the offset determination method involved in the foregoing embodiments.

[0173] The control system provided in some embodiments of this disclosure controls the test needle to move along a compensated movement path, so that the first movement trajectory of the test needle when moving along the compensated movement path overlaps with the second movement trajectory of the standard needle when moving along a preset movement path. This ensures that even when the test needle tip is offset relative to the standard needle tip, the corresponding operation or task can still be completed according to the second movement trajectory, thereby guaranteeing the corresponding process effect.

[0174] Furthermore, the offset is determined using beam detection technology, utilizing the coordinate changes of the standard needle and the needle under test as they pass through the first and second beams. Beam detection technology is non-contact, highly sensitive, and high-resolution, enabling it to accurately detect minute offsets between the tips of the standard and the needle under test. By recording the coordinate changes of the standard and the needle under test as they pass through the first and second beams, the accuracy of the determined offset can be improved, providing precise data support for compensation. This allows the first movement trajectory of the needle under test to overlap with the second movement trajectory (e.g., the preset movement trajectory) of the standard needle as it moves along a preset path.

[0175] Meanwhile, by controlling the movement of the standard needle and the needle under test separately, and combining it with beam detection technology, the process of determining the offset can be fast and convenient, thereby improving the efficiency of offset determination and the efficiency of determining the compensated movement path.

[0176] Furthermore, the offset is determined using beam detection technology, utilizing the coordinate changes of the standard needle and the needle under test as they pass through the first and second beams. This offset determination method has relatively relaxed requirements for the arrangement of the first and second beams, allowing the standard needle and the needle under test to pass through them sequentially without strictly controlling their relative positions, angles, or fixed spacing. This relaxed beam arrangement requirement significantly reduces the accuracy requirements of the photoelectric sensor, thereby reducing the difficulty of installing and debugging the sensor, and making the process of determining the compensated movement path faster and more convenient.

[0177] Regarding the modules / units included in the various devices and products described in the above embodiments, they can be software modules / units, hardware modules / units, or a combination of both. For example, for various devices and products applied to or integrated into a chip, all of their modules / units can be implemented using hardware methods such as circuits, or at least some modules / units can be implemented using software programs that run on a processor integrated within the chip, while the remaining (if any) modules / units can be implemented using hardware methods such as circuits; for various devices and products applied to or integrated into a chip module, all of their modules / units can be implemented using hardware methods such as circuits, and different modules / units can be located in the same component (e.g., chip, circuit module, etc.) or different components of the chip module, or at least some modules / units can be implemented using hardware methods such as circuits. The components can be implemented using software programs that run on the processor integrated within the chip module. The remaining (if any) modules / units can be implemented using hardware methods such as circuits. For various devices and products applied to or integrated into the terminal, each of its components / units can be implemented using hardware methods such as circuits. Different modules / units can be located in the same component (e.g., chip, circuit module, etc.) or in different components within the terminal. Alternatively, at least some modules / units can be implemented using software programs that run on the processor integrated within the terminal, while the remaining (if any) modules / units can be implemented using hardware methods such as circuits.

[0178] Figure 7 A block diagram of an exemplary electronic device consistent with some embodiments of this disclosure is shown. For example... Figure 7 As shown, the electronic device includes a memory 702 and a processor 704. The memory 702 may store a computer program that can run on the processor 704. When the processor 704 executes the computer program, it implements the methods described in the above embodiments. The number of memories 702 and processors 704 may be one or more.

[0179] The electronic device also includes:

[0180] The communication interface 706 is used to communicate with external devices and perform data exchange and transmission.

[0181] If the memory 702, processor 704, and communication interface 706 are implemented independently, they can be interconnected via a bus to communicate with each other. This bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. This bus can be divided into address bus, data bus, control bus, etc. For ease of representation, Figure 7 The bus is represented by a single thick line, but this does not mean that there is only one bus or one type of bus.

[0182] Optionally, if the memory 702, processor 704, and communication interface 706 are integrated on a single chip, then the memory 702, processor 704, and communication interface 706 can communicate with each other through an internal interface. Some embodiments of this disclosure provide a computer-readable storage medium storing a computer program that, when executed by a processor, implements the methods provided in the embodiments of this disclosure.

[0183] Some embodiments of this disclosure also provide a chip including a processor for calling and executing instructions stored in a memory, causing a communication device on which the chip is mounted to perform the methods provided in some embodiments of this disclosure.

[0184] Some embodiments of this disclosure also provide a chip, including: an input interface, an output interface, a processor, and a memory. The input interface, output interface, processor, and memory are connected through an internal connection path. The processor is used to execute code in the memory. When the code is executed, the processor is used to execute the methods provided in some embodiments of this disclosure.

[0185] It should be understood that the aforementioned processor can be a Central Processing Unit (CPU), or other general-purpose processors, Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field-Programmable Gate Arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. General-purpose processors can be microprocessors or any conventional processor. It is worth noting that the processor can be a processor supporting Advanced Reduced Instruction Set Machines (ARM) architecture.

[0186] Further, optionally, the aforementioned memory may include read-only memory and random access memory, and may also include non-volatile random access memory. The memory may be volatile or non-volatile, or may include both. Non-volatile memory may include read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), or flash memory. Volatile memory may include random access memory (RAM), which serves as an external cache. Many forms of RAM are available by way of example, but not limitation. Examples include Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDR SDRAM), Enhanced Synchronous DRAM (ESDRAM), Synchlink DRAM (SLDRAM), and Direct Rambus RAM (DR RAM).

[0187] In the above embodiments, implementation can be achieved, in whole or in part, by software, hardware, firmware, or any combination thereof. When implemented in software, it can be implemented, in whole or in part, as a computer program product. A computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, all or part of the flow or function according to this disclosure is generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transferred from one computer-readable storage medium to another.

[0188] In the description of this specification, references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this disclosure. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of those different embodiments or examples.

[0189] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this disclosure, "a plurality of" means two or more, unless otherwise explicitly specified.

[0190] Any process or method description in the flowchart or otherwise herein can be understood as representing a module, segment, or portion of code comprising one or more executable instructions for implementing a particular logical function or process. Furthermore, the scope of the preferred embodiments of this disclosure includes additional implementations in which functions may be performed not in the order shown or discussed, including substantially simultaneously or in reverse order depending on the functionality involved.

[0191] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a sequenced list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus or device (such as a computer-based system, a processor-included system or other system that can fetch and execute instructions from, an instruction execution system, apparatus or device).

[0192] It should be understood that various parts of this disclosure can be implemented using hardware, software, firmware, or a combination thereof. In the above embodiments, multiple steps or methods can be implemented using software or firmware stored in memory and executed by a suitable instruction execution system. All or part of the steps of the methods in the above embodiments can be implemented by a program instructing related hardware, the program being stored in a computer-readable storage medium, which, when executed, includes one or a combination of the steps of the method embodiments.

[0193] Furthermore, the functional units in the various embodiments of this disclosure can be integrated into a processing module, or each unit can exist physically separately, or two or more units can be integrated into a module. The integrated module can be implemented in hardware or as a software functional module. If the integrated module is implemented as a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium. This storage medium can be a read-only memory, a disk, or an optical disk, etc.

[0194] The above are merely specific embodiments of this disclosure, but the scope of protection of this disclosure is not limited thereto. Any person skilled in the art can easily conceive of various variations or substitutions within the technical scope disclosed in this disclosure, and these should all be included within the scope of protection of this disclosure. Therefore, the scope of protection of this disclosure should be determined by the scope of the claims.

Claims

1. A method for determining an offset, comprising: Control the standard needle to move along a first direction, and determine the first coordinate of the needle tip when it passes through the first light beam and the second coordinate when it passes through the second light beam; Control the needle to be tested to move along the first direction, and determine the third coordinate of the needle tip when it passes through the first beam and the fourth coordinate when it passes through the second beam; Based on the first coordinate, the second coordinate, the third coordinate, and the fourth coordinate, a first offset of the needle tip of the test needle relative to the needle tip of the standard needle in the first direction is determined.

2. The method according to claim 1, wherein, Also includes: Control the standard needle to move along the second direction, and determine the fifth coordinate when the tip of the standard needle passes through the first beam and the sixth coordinate when it passes through the second beam; Control the needle to be tested to move along the second direction, and determine the seventh coordinate when the tip of the needle passes through the first beam and the eighth coordinate when it passes through the second beam; Based on the fifth coordinate, the sixth coordinate, the seventh coordinate, and the eighth coordinate, the second offset of the needle tip of the test needle relative to the needle tip of the standard needle in the second direction is determined.

3. The method according to claim 1 or 2, wherein, Also includes: Control the standard needle to move from a first starting position to a first ending position along a third direction, and determine the ninth coordinate of the needle tip when the standard needle moves to the first ending position; Control the probe to be tested to move from the first starting position to the first ending position along the third direction, and determine the tenth coordinate of the probe tip when the probe to be tested moves to the first ending position; Determine the third coordinate difference between the tenth coordinate and the ninth coordinate in the third direction; Based on the third coordinate difference, the third offset of the needle tip of the test needle relative to the needle tip of the standard needle in a third direction is determined.

4. The method according to claim 1, wherein, The first coordinate is determined based on at least one of the eleventh and twelfth coordinates; the eleventh coordinate includes the coordinates when the tip of the standard needle enters the first beam; the twelfth coordinate includes the coordinates when the tip of the standard needle leaves the first beam.

5. The method according to claim 4, wherein, When the first coordinate is determined based on the eleventh and twelfth coordinates, the steps for determining the first coordinate are as follows: Determine a first weight pre-configured for the eleventh coordinate and a second weight pre-configured for the twelfth coordinate; The first coordinate is determined based on the eleventh coordinate, the twelfth coordinate, the first weight, and the second weight.

6. The method according to claim 4, wherein, When the first coordinate is determined based on the eleventh coordinate or the twelfth coordinate, the steps for determining the first coordinate are as follows: The eleventh coordinate or the twelfth coordinate is taken as the first coordinate.

7. The method according to claim 1, wherein, The control of the standard needle to move along the first direction includes: controlling the standard needle to move from a second starting position to a second ending position along the first direction; The control of the probe to be tested moving along the first direction includes: controlling the probe to be tested to move from the second starting position to the second ending position along the first direction.

8. The method according to claim 1, wherein, The determination of the first offset of the needle tip of the test needle relative to the needle tip of the standard needle in the first direction based on the first coordinate, the second coordinate, the third coordinate, and the fourth coordinate includes: Determine the first coordinate difference between the third coordinate and the first coordinate in the first direction, and determine the second coordinate difference between the fourth coordinate and the second coordinate in the first direction; The first offset is determined based on the first coordinate difference and the second coordinate difference.

9. The method according to claim 8, wherein, Determining the first offset based on the first coordinate difference and the second coordinate difference includes: Determine a third weight pre-configured for the first coordinate difference and a fourth weight pre-configured for the second coordinate difference; The first offset is determined based on the first coordinate difference, the second coordinate difference, the third weight, and the fourth weight.

10. The method according to claim 1, wherein, The first beam is emitted by a first through-beam sensor; the second beam is emitted by a second through-beam sensor.

11. A method for determining a movement route, comprising: Determine the offset of the tip of the test needle relative to the tip of a standard needle; the offset includes a first offset of the tip of the test needle relative to the tip of the standard needle in a first direction; the first offset is determined by performing the method as described in any one of claims 1-10; Based on the offset, the preset movement path is compensated to obtain the compensated movement path, so that the first movement trajectory of the needle when the needle under test moves according to the compensated movement path overlaps with the second movement trajectory of the needle when the standard needle moves according to the preset movement path.

12. The method according to claim 11, wherein, The offset also includes a second offset of the tip of the test needle relative to the tip of the standard needle in a second direction.

13. The method according to claim 11 or 12, wherein, The offset also includes a third offset of the needle tip of the test needle relative to the needle tip of the standard needle in a third direction.

14. A method for controlling a probe, comprising: Determine the compensated movement route; The compensated movement route is determined by performing the method as described in any one of claims 11-13; The probe under test is controlled to move along the compensated movement path.

15. A control system, comprising: Offset determination module, movement route determination module, and control module; The offset determination module is used to determine the offset of the needle tip of the test needle relative to the needle tip of the standard needle; the offset includes a first offset of the needle tip of the test needle relative to the needle tip of the standard needle in a first direction; the first offset is determined by performing the method as described in any one of claims 1-10; The movement route determination module is used to execute the method of any one of claims 11-13 to obtain the compensated movement route; The control module is used to execute the method as described in claim 14, controlling the probe to be tested to move along the compensated movement path.

16. The system according to claim 15, wherein the offset further includes a second offset of the tip of the test needle relative to the tip of the standard needle in a second direction.

17. The system according to claim 15 or 16, wherein the offset further includes a third offset of the tip of the test needle relative to the tip of the standard needle in a third direction.

Images