InDel molecular marker related to wheat kernel length trait and application
The InDel-labeled PCR method was used to detect wheat grain length traits. By utilizing specific primer sequences F and R, the problem of low accuracy in wheat breeding was solved, enabling seedling screening and early selection, thus improving breeding efficiency and accuracy.
CN122357776APending Publication Date: 2026-07-10INST OF GENETICS & DEVELOPMENTAL BIOLOGY CHINESE ACAD OF SCI
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-05-19
- Publication Date
- 2026-07-10
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Figure CN122357776A_ABST
Abstract
This invention discloses an InDel molecular marker associated with wheat grain length and its application. This InDel molecular marker can be used to identify wheat grain length traits or for wheat breeding. The primer sequences for amplifying the InDel molecular marker include an upstream primer F and a downstream primer R. The sequence of the upstream primer F is shown in SEQ ID NO.1, and the sequence of the downstream primer R is shown in SEQ ID NO.2. The molecular marker provided by this invention has been validated in multiple varieties, and the detection results are highly consistent with the grain length phenotype. It can be used to extract leaf DNA at the seedling stage for early selection, providing a direct and effective molecular tool for the genetic improvement of wheat grain length. It can be widely applied in high-yield and high-quality wheat breeding practices.
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