Design method of parallel test architecture of integrated display unit based on ethernet technology

The parallel testing architecture designed using Ethernet technology, and the testing system composed of AFDX emulation cards and switches, solves the high cost problem of parallel testing of multiple IDU devices, and achieves efficient and low-cost testing results.

CN122449979APending Publication Date: 2026-07-24SHANGHAI ZONGQUE INTELLIGENT TECHNOLOGY CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SHANGHAI ZONGQUE INTELLIGENT TECHNOLOGY CO LTD
Filing Date
2026-04-29
Publication Date
2026-07-24

AI Technical Summary

Technical Problem

In existing technologies, the hardware cost of parallel testing solutions for multiple IDU devices based on AFDX emulation cards is high, resulting in excessively high testing system costs and making it difficult to efficiently perform parallel testing of multiple IDU devices.

Method used

A parallel testing architecture was designed using Ethernet technology. The test system consisted of an AFDX simulation card, first and second Ethernet switches, and Ethernet cards. The switch link structure was configured using multicast and VLAN technologies, and the underlying protocol stack of the Ethernet cards was reconstructed into an ARINC664 bus network monitoring terminal to achieve parallel testing of multiple IDU devices.

Benefits of technology

It reduces the hardware cost of parallel testing of IDU devices, improves testing efficiency, enables parallel testing of multiple IDU devices, and ensures accurate forwarding of data link topology and identification of test data.

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Abstract

The application discloses a kind of parallel test architecture design methods of integrated display unit based on Ethernet technology, comprising the following steps: S10, setting includes AFDX simulation card, first Ethernet switch, second Ethernet switch, Ethernet card for testing system to test 6 IDU products simultaneously;S20, AFDX simulation card is used as data sending test module, and ARINC664 test data frame needed by IDU product work is generated by AFDX simulation card through test program control;S30, two Ethernet switches are configured as special topological structure needed for adapting multiple IDU parallel work;S40, the public port 1 of first Ethernet switch is connected with AFDX simulation card port A, receives the test data of simulation card, and is forwarded to other ports in multicast group 1 by multicast form;S50, each port in multicast group 1 of first Ethernet switch receives the test data returned by each IDU product interface A;S60, reconstructs the bottom protocol stack of Ethernet card based on NPCAP.
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Description

Technical Field

[0001] This invention belongs to the field of airborne bus communication technology, specifically relating to a design method for a parallel test architecture of an integrated display unit based on Ethernet technology. Background Technology

[0002] As the core unit of the avionics system of commercial large aircraft, the reliability of the Integrated Display Unit (IDU) directly affects the aircraft's operational safety and overall safety. Therefore, researching how to improve the testing technology for the reliability of IDU equipment is of great significance to the entire avionics system.

[0003] Data communication between IDU devices and other subsystems in the avionics system is primarily conducted via the ARINC664 bus network. Therefore, the main content of IDU device reliability testing is testing the reliability performance of its ARINC664 bus interface. Commercial aircraft cockpits typically deploy five IDU devices. The standard testing approach for scenarios where multiple IDU devices operate in parallel involves using multiple AFDX simulation cards to construct a test environment and testing each IDU device separately. Figure 1 As shown in the diagram, this scheme uses six AFDX emulation cards to provide 12 test ports. Each test port is connected to a communication port of a single IDU device. The test program controls the AFDX emulation cards to perform data transmission and reception tests on various communication ports of multiple IDU devices, thus completing the testing of all ARINC664 interfaces of multiple IDU devices. Due to the high cost of AFDX emulation cards, building a test system based on this existing design architecture will result in high hardware costs. Summary of the Invention

[0004] In view of the above-mentioned problems, the present invention provides a design method for a parallel test architecture of integrated display unit based on Ethernet technology, which is used to reduce the hardware cost required for parallel testing of IDU products and improve the production testing efficiency of IDU products by introducing a parallel test architecture.

[0005] To solve the above-mentioned technical problems, the present invention adopts the following technical solution: A method for designing a parallel test architecture for a comprehensive display unit based on Ethernet technology includes the following steps: S10 is a test system that includes an AFDX emulation card, a first Ethernet switch, a second Ethernet switch, and an Ethernet card to test six IDU products simultaneously. S20, the AFDX emulation card is used as a data transmission test module. The test program controls the AFDX emulation card to generate ARINC664 test data frames required for the operation of the IDU product, and sends them to the corresponding ports of the first Ethernet switch through ports A and B of the AFDX emulation card respectively. S30 configures two Ethernet switches into a dedicated topology to accommodate multiple IDUs working in parallel. S40, the first Ethernet switch's public port 1 is connected to AFDX emulation card port A, receives the emulation card's test data, and forwards it to other ports in multicast group 1 via multicast, thereby sending it to ARINC664 test interface A of each IDU device; the first Ethernet switch's public port 2 is connected to AFDX emulation card port B, receives the emulation card's test data, and forwards it to other ports in multicast group 2 via multicast, thereby sending it to ARINC664 test interface B of each IDU device. S50: Each port in multicast group 1 of the first Ethernet switch receives test data returned by each IDU product interface A, and forwards it to the external port group 1 of the switch through the internal link of the first Ethernet switch. Then, it forwards it to the receiving port group 1 of the second Ethernet switch through the external connection between the two Ethernet switches. Finally, it forwards the data to the common receiving port through the internal link of the second Ethernet switch, and the Ethernet card performs operations including data monitoring and parsing. Similarly, each port in multicast group 2 of the first Ethernet switch receives test data returned by each product interface B, and forwards it to the external port group 2 of the first Ethernet switch through the internal link of the first Ethernet switch. Then, it forwards it to the receiving port group 2 of Ethernet switch 2 through the external connection between the two Ethernet switches. Finally, it forwards the data to the common receiving port through the internal link of the second Ethernet switch, and the Ethernet card performs operations including data monitoring and parsing. S60 reconstructs the underlying protocol stack of the Ethernet card based on NPCAP, transforming the Ethernet card interface into a data monitoring terminal for the ARINC664 bus network. It receives response data from each IDU product forwarded from port 24 of the second Ethernet switch, and distinguishes each test data by link ID to determine whether the working status of each IDU product is normal.

[0006] Preferably, in S30, configuring the two Ethernet switches into a dedicated topology to accommodate the parallel operation of multiple IDUs includes: ports 13 to 18 of the first Ethernet switch are respectively connected to the ARINC664 interface A of each IDU product, and together with port 19 of the first Ethernet switch, they form multicast group 1; ports 20 to 25 of the first Ethernet switch are respectively connected to the ARINC664 interface B of each IDU product, and together with port 26 of the first Ethernet switch, they form multicast group 2; ports 1 to 12 of the two Ethernet switches are connected one by one via external network cables; each link of ports 1 to 12 of the second Ethernet switch is configured with a unique link ID, and the data frames received by each port 1 to 12 are identified by ID.

[0007] Preferably, the internal link settings of the second Ethernet switch in S50 include: Configure VLANs by adding all the ports that need to be configured to the corresponding VLANs. A total of 12 VLANs are designed, corresponding to ports 1 to 12 respectively. Configure port 24 as a public port and receive all VLAN data; After configuring the second Ethernet switch, execute the save command to save the configuration to the second Ethernet switch.

[0008] Preferably, the internal link settings of the first Ethernet switch in S50 include: Configure port isolation groups. Design two port isolation groups. Isolation group 1 includes ports 13 to 18, all of which are interconnected with port 19. Isolation group 2 includes ports 20 to 25, all of which are interconnected with port 26. After configuring the first Ethernet switch, execute the save command to save the configuration to the first Ethernet switch.

[0009] The present invention has the following beneficial effects: (1) Based on VLAN technology and port isolation technology, the Ethernet switch link structure is modified to ensure that ARINC664 test data can be forwarded in accordance with the specified link structure and realize the data link topology required for parallel testing of multiple IDUs.

[0010] (2) Based on the NPCAP Ethernet capture tool, the underlying protocol stack of the Ethernet card is reconstructed and transformed into a monitoring terminal that can monitor Ethernet data frames based on the IEEE 802.1Q protocol, thereby realizing the function of identifying test data of multiple IDU products.

[0011] (3) With a commercial Ethernet switch with a customized link structure as the core and AFDX simulation card and Ethernet technology as the foundation, parallel testing of multiple IDU products can be achieved. Attached Figure Description

[0012] Figure 1 This is a schematic diagram of a parallel testing architecture for multiple IDU devices based on an AFDX simulation card in the existing technology. Figure 2 This is a flowchart illustrating the steps of a parallel test architecture design method for an integrated display unit based on Ethernet technology, according to an embodiment of the present invention. Figure 3 This is a schematic diagram of a parallel testing architecture for an integrated display unit based on Ethernet technology in one embodiment of the present invention; Figure 4 This is a schematic diagram of the internal links of the second Ethernet switch in a specific application example of the present invention; Figure 5 This is a schematic diagram of the internal links of the first Ethernet switch in a specific application example of the present invention; Figure 6 This is a schematic diagram of the ARINC664 test data frame message format in a specific application example of the present invention. Detailed Implementation

[0013] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0014] Reference Figure 2 The diagram shows a flowchart of a parallel test architecture design method for an integrated display unit based on Ethernet technology according to an embodiment of the present invention, including the following steps: S10 is equipped with a test system including an AFDX emulation card, a first Ethernet switch, a second Ethernet switch, and Ethernet cards to simultaneously test six IDU products. The test system includes components such as... Figure 3 As shown; S20, using the AFDX emulation card as a data transmission test module, the test program controls the AFDX emulation card to generate ARINC664 test data frames required for the IDU product to function. The data frame format is as follows: Figure 6As shown, the ARINC664 test data frame message consists of multi-byte code, aligned by bytes (8 bits), and is composed of "sequence number", "main command", "length", "test item", "test parameter" or "test sub-command", which are sent to the corresponding ports of the first Ethernet switch through ports A and B of the AFDX simulation card, respectively. S30 configures two Ethernet switches into a dedicated topology to accommodate multiple IDUs working in parallel. S40, the first Ethernet switch's public port 1 is connected to AFDX emulation card port A, receives the emulation card's test data, and forwards it to other ports in multicast group 1 via multicast, thereby sending it to ARINC664 test interface A of each IDU device; the first Ethernet switch's public port 2 is connected to AFDX emulation card port B, receives the emulation card's test data, and forwards it to other ports in multicast group 2 via multicast, thereby sending it to ARINC664 test interface B of each IDU device. S50: Each port in multicast group 1 of the first Ethernet switch receives test data returned by each IDU product interface A, and forwards it to the external port group 1 of the switch through the internal link of the first Ethernet switch. Then, it forwards it to the receiving port group 1 of the second Ethernet switch through the external connection between the two Ethernet switches. Finally, it forwards the data to the common receiving port through the internal link of the second Ethernet switch, and the Ethernet card performs operations including data monitoring and parsing. Similarly, each port in multicast group 2 of the first Ethernet switch receives test data returned by each product interface B, and forwards it to the external port group 2 of the first Ethernet switch through the internal link of the first Ethernet switch. Then, it forwards it to the receiving port group 2 of Ethernet switch 2 through the external connection between the two Ethernet switches. Finally, it forwards the data to the common receiving port through the internal link of the second Ethernet switch, and the Ethernet card performs operations including data monitoring and parsing. S60 reconstructs the underlying protocol stack of the Ethernet card based on NPCAP, transforming the Ethernet card interface into a data monitoring terminal for the ARINC664 bus network. It receives response data from each IDU product forwarded from port 24 of the second Ethernet switch, and distinguishes each test data by link ID to determine whether the working status of each IDU product is normal.

[0015] A specific application embodiment, further as follows: Figure 3As shown, in S30, the dedicated topology required for the parallel operation of multiple IDUs by configuring two Ethernet switches includes: ports 13 to 18 of the first Ethernet switch are respectively connected to the ARINC664 interface A of each IDU product, and form multicast group 1 with port 19 of the first Ethernet switch; ports 20 to 25 of the first Ethernet switch are respectively connected to the ARINC664 interface B of each IDU product, and form multicast group 2 with port 26 of the first Ethernet switch; ports 1 to 12 of the two Ethernet switches are connected one by one through external network cables; each link of ports 1 to 12 of the second Ethernet switch is configured with a unique link ID, and the data frames received by each port 1 to 12 are identified by ID.

[0016] In a specific application example, the internal link settings of the second Ethernet switch in the S50 include: Configure VLANs by adding all the ports that need to be configured to the corresponding VLANs. A total of 12 VLANs are designed, corresponding to ports 1 to 12 respectively. Configure port 24 as a public port and receive all VLAN data; After configuring the second Ethernet switch, execute the save command to save the configuration to the second Ethernet switch, ensuring that the new configuration is effective every time the switch is powered on.

[0017] A specific application example shows that the internal link settings of the first Ethernet switch in the S50 include: Configure port isolation groups. Design two port isolation groups: Isolation group 1 includes ports 13 to 18, all of which are interconnected with port 19; Isolation group 2 includes ports 20 to 25, all of which are interconnected with port 26. Specific configuration steps can be as follows: (a) Execute the command system-view to enter the system view; (b) Execute the command interface interface-type interface-number to enter the corresponding interface view; (c) Execute the command port-isolate enable in the interface view to configure the port as a Layer 2 isolation mode; (d) Repeat steps b to c until all ports 13 to 18 are configured in Layer 2 isolation mode and configured to communicate with port 19 to form multicast group 1. (e) Execute the command `quit` to return to the system view; (f) Repeat steps b to e until all ports 20 to 25 are configured in Layer 2 isolation mode and configured to communicate with port 26 to form multicast group 2.

[0018] After configuring the first Ethernet switch, execute the save command to save the configuration to the first Ethernet switch.

[0019] In test scenarios where multiple IDU products operate in parallel, the test data packets sent by the AFDX emulation card are simultaneously forwarded to each IDU product via an Ethernet switch. As a dedicated device, the AFDX emulation card can only send and receive standard data frames conforming to the ARINC664 protocol frame format. For modified data frames with added link IDs, the AFDX emulation card considers them as error frames and discards them. Therefore, it is impossible to use the AFDX emulation card to receive and distinguish the test data returned by each IDU product.

[0020] NPCAP (Networking Packet Capture) is an open-source packet capture and analysis driver for the Windows platform. It captures and processes raw data packets without being processed by the operating system's network protocols, enabling the capture and monitoring of Ethernet data frames based on the IEEE 802.1Q protocol. Therefore, in this embodiment of the invention, the data monitoring software is developed based on the NPCAP toolkit. It uses the NDIS interface to filter data frames, avoiding interference from noisy frames generated by built-in system applications, and uses LibPcap to implement low-level control of the network card, allowing direct manipulation of MAC frames to achieve data monitoring of 802.1Q Ethernet data frames based on ARINC664 frames.

[0021] The Ethernet data communication control module of this data monitoring software is developed and designed based on NPCAP. It encapsulates the various function functions provided by NPCAP into a DLL file that can be called by the host computer software, thereby completing the MAC layer operation function based on ARINC664 bus data.

[0022] NPCAP provides a large number of operation library functions and structures for Windows system program development, including functions for obtaining device list information, obtaining advanced information of installed devices, opening adapters, capturing data packets, filtering data packets, analyzing and processing data packets, analyzing and processing offline heap files, sending data packets, and collecting and statistically analyzing network traffic. Specific functions are shown in Table 1.

[0023]

[0024] It should be understood that the exemplary embodiments described herein are illustrative and not restrictive. Although one or more embodiments of the invention have been described in conjunction with the accompanying drawings, those skilled in the art will understand that various changes in form and detail may be made without departing from the spirit and scope of the invention as defined by the appended claims.

Claims

1. A method for designing a parallel test architecture for an integrated display unit based on Ethernet technology, characterized in that, Includes the following steps: S10 is a test system that includes an AFDX emulation card, a first Ethernet switch, a second Ethernet switch, and an Ethernet card to test six IDU products simultaneously. S20, the AFDX emulation card is used as a data transmission test module. The test program controls the AFDX emulation card to generate ARINC664 test data frames required for the operation of the IDU product, and sends them to the corresponding ports of the first Ethernet switch through ports A and B of the AFDX emulation card respectively. S30 configures two Ethernet switches into a dedicated topology to accommodate multiple IDUs working in parallel. S40, the first Ethernet switch's public port 1 is connected to AFDX emulation card port A, receives the emulation card's test data, and forwards it to other ports in multicast group 1 via multicast, thereby sending it to ARINC664 test interface A of each IDU device; the first Ethernet switch's public port 2 is connected to AFDX emulation card port B, receives the emulation card's test data, and forwards it to other ports in multicast group 2 via multicast, thereby sending it to ARINC664 test interface B of each IDU device. S50: Each port in multicast group 1 of the first Ethernet switch receives test data returned by each IDU product interface A, and forwards it to the external port group 1 of the switch through the internal link of the first Ethernet switch. Then, it forwards it to the receiving port group 1 of the second Ethernet switch through the external connection between the two Ethernet switches. Finally, it forwards the data to the common receiving port through the internal link of the second Ethernet switch, and the Ethernet card performs operations including data monitoring and parsing. Similarly, each port in multicast group 2 of the first Ethernet switch receives test data returned by each product interface B, and forwards it to the external port group 2 of the first Ethernet switch through the internal link of the first Ethernet switch. Then, it forwards it to the receiving port group 2 of Ethernet switch 2 through the external connection between the two Ethernet switches. Finally, it forwards the data to the common receiving port through the internal link of the second Ethernet switch, and the Ethernet card performs operations including data monitoring and parsing. S60 reconstructs the underlying protocol stack of the Ethernet card based on NPCAP, transforming the Ethernet card interface into a data monitoring terminal for the ARINC664 bus network. It receives response data from each IDU product forwarded from port 24 of the second Ethernet switch, and distinguishes each test data by link ID to determine whether the working status of each IDU product is normal.

2. The parallel test architecture design method for an integrated display unit based on Ethernet technology as described in claim 1, characterized in that, In S30, the two Ethernet switches are configured with a dedicated topology to accommodate the parallel operation of multiple IDUs, including: ports 13 to 18 of the first Ethernet switch are connected to the ARINC664 interface A of each IDU product, and form multicast group 1 with port 19 of the first Ethernet switch; ports 20 to 25 of the first Ethernet switch are connected to the ARINC664 interface B of each IDU product, and form multicast group 2 with port 26 of the first Ethernet switch; ports 1 to 12 of the two Ethernet switches are connected one by one through external network cables; each link of ports 1 to 12 of the second Ethernet switch is configured with a unique link ID, and the data frames received by each port 1 to 12 are identified by ID.

3. The parallel test architecture design method for a comprehensive display unit based on Ethernet technology as described in claim 1, characterized in that, The internal link settings of the second Ethernet switch in the S50 include: Configure VLANs by adding all the ports that need to be configured to the corresponding VLANs. A total of 12 VLANs are designed, corresponding to ports 1 to 12 respectively. Configure port 24 as a public port and receive all VLAN data; After configuring the second Ethernet switch, execute the save command to save the configuration to the second Ethernet switch.

4. The parallel test architecture design method for a comprehensive display unit based on Ethernet technology as described in claim 1, characterized in that, The internal link settings of the first Ethernet switch in the S50 include: Configure port isolation groups. Design two port isolation groups. Isolation group 1 includes ports 13 to 18, all of which are interconnected with port 19. Isolation group 2 includes ports 20 to 25, all of which are interconnected with port 26. After configuring the first Ethernet switch, execute the save command to save the configuration to the first Ethernet switch.