An information determination method, a hard disk, a system and a storage medium
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- CHENGDU HUAWEI TECH CO LTD
- Filing Date
- 2025-01-27
- Publication Date
- 2026-08-04
AI Technical Summary
现有技术中，硬盘的掉电保护机制依赖超级电容，存在因超级电容失效导致数据丢失的风险，且缺乏有效的剩余寿命确定方法。
通过获取硬盘中与超级电容相关的器件温度，利用温度与寿命之间的对应关系，确定超级电容的目标温度和剩余寿命，及时采取更换或维护措施，避免超级电容失效。
It improves the reliability of the power-loss protection mechanism, avoids the risk of data loss due to supercapacitor failure, reduces hardware costs and complexity, and enhances the hard drive's operational security and user experience.
Smart Images
Figure CN122507541A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of storage technology, and in particular to an information determination method, hard disk, system and storage medium. Background Technology
[0002] Currently, power-loss protection mechanisms on hard drives can be implemented using supercapacitors. During data storage, data is first temporarily cached in double data rate synchronous dynamic random access memory (DDR SDRAM), and then transferred from the DDR SDRAM cache to NAND flash memory chips. If an unexpected power outage occurs during this process, the supercapacitor will use its stored energy to write the data from the DDR SDRAM to the NAND flash memory chips, thus preventing data loss.
[0003] To ensure the hard drive's power-loss protection mechanism functions properly and to prevent data loss due to supercapacitor failure, determining the remaining lifespan of the supercapacitor has become a pressing issue. Summary of the Invention
[0004] This application provides an information determination method, a hard disk, a system, and a storage medium, which can enhance the reliability of the hard disk's power-loss protection mechanism and avoid the risk of data loss due to the failure of the supercapacitor in the hard disk.
[0005] In a first aspect, an information determination method is provided, the method comprising: obtaining a first temperature of a target device in a hard disk, the target device being a device in the hard disk whose temperature is related to that of a supercapacitor; determining a target temperature of the supercapacitor based on the first temperature and a first correspondence, the first correspondence characterizing the correspondence between the temperature of the target device and the temperature of the supercapacitor; and determining the remaining lifespan of the supercapacitor based on the initial lifespan of the supercapacitor and the target temperature.
[0006] This method can be executed by the hard drive, or by a module applied to the hard drive (such as a processor, chip, or chip system), or by a logic module or software that can implement all or part of the hard drive's functions.
[0007] The above solution can determine the target temperature of the supercapacitor based on the first temperature of the components related to the temperature of the supercapacitor in the hard drive, and determine the remaining lifespan of the supercapacitor based on the initial lifespan of the supercapacitor and the target temperature. This allows for timely measures to be taken when the supercapacitor is nearing the end of its lifespan based on its remaining lifespan, thereby avoiding the risk of data loss due to the failure of the supercapacitor in the hard drive.
[0008] It should be understood that a hard drive can be a backup power drive, meaning it can still supply power to protect data in the event of a power outage; this hard drive contains a supercapacitor. The target device is the component whose temperature is related to the supercapacitor within the hard drive. When the external power supply to the hard drive is interrupted, the supercapacitor can release electrical energy to provide power to the hard drive, ensuring that the hard drive has enough time to complete operations such as data writing, thereby preventing data loss. Temperature changes in the target device can be transferred to the supercapacitor through heat conduction.
[0009] In one possible implementation, the hard drive can be a solid-state drive (SSD), such as a quad-level cell (QLC) SSD.
[0010] In one possible implementation, the target device includes at least one of an application-specific integrated circuit (ASIC) chip, a NAND flash memory chip, a double data rate synchronous dynamic random access memory (DDR SDRAM), and a circuit board.
[0011] For example, the target device can be an ASIC chip and a NAND Flash memory chip.
[0012] In one possible implementation, the first temperature of the target device in the hard disk is periodically acquired; for each cycle, the target temperature of the supercapacitor is determined based on the first temperature and a first correspondence; and the remaining lifespan of the supercapacitor is determined based on the initial lifespan of the supercapacitor and the target temperature.
[0013] The above solution enhances the reliability of the power-loss protection mechanism by periodically determining the remaining lifespan of the supercapacitor, so as to detect and alert the supercapacitor in time when it is approaching the end of its lifespan, and avoids the risk of data loss due to the failure of the supercapacitor in the hard drive.
[0014] In one possible implementation, determining the target temperature of the supercapacitor based on a first temperature and a first correspondence includes: determining multiple second temperatures of the supercapacitor based on multiple first temperatures and the first correspondence; and performing calculations on the multiple second temperatures to obtain the target temperature of the supercapacitor.
[0015] Among them, multiple second temperatures can reflect the temperature distribution of the supercapacitor within the first time period.
[0016] The above scheme obtains the target temperature of the supercapacitor by calculating multiple second temperatures, which can smooth out random errors and improve the accuracy of the determined target temperature.
[0017] In one possible implementation, the remaining lifetime of the supercapacitor is determined based on its initial lifetime and target temperature, including: determining the target lifetime loss of the supercapacitor based on the target temperature and a second correspondence, where the second correspondence characterizes the relationship between the temperature and lifetime loss of the supercapacitor; and calculating the difference between the initial lifetime and the target lifetime loss to obtain the remaining lifetime of the supercapacitor.
[0018] Among them, the target lifetime loss can be the lifetime loss of the supercapacitor caused by the target temperature.
[0019] The above solution can determine the current lifespan loss (i.e., target lifespan loss) of the supercapacitor and determine the remaining lifespan of the supercapacitor by calculating the difference between the initial lifespan and the target lifespan loss. It does not require additional hardware to be added to the hard drive's circuit board to determine the remaining lifespan of the supercapacitor, thus reducing the space occupied by the hard drive's circuit board, avoiding the complexity of hardware installation and maintenance, and reducing costs.
[0020] In one possible implementation, the remaining lifespan of the supercapacitor can be determined periodically. For the Nth period, the initial lifespan can be the remaining lifespan of the supercapacitor determined in the (N-1)th period, where N is a positive integer greater than 1. In the 1st period, the initial lifespan is the baseline lifespan of the supercapacitor specified by the manufacturer at the time the hard drive leaves the factory.
[0021] In one possible implementation, the information determination method further includes: sending a first prompt message when the target temperature meets a preset temperature threshold, the first prompt message being used to indicate that the temperature of the supercapacitor is abnormal.
[0022] The target temperature meeting the preset temperature threshold can be a target temperature greater than a first temperature threshold; conversely, the target temperature meeting the preset temperature threshold can be a target temperature less than or equal to a second temperature threshold. The first temperature threshold is greater than the second temperature threshold.
[0023] The first prompt message can be generated when the target temperature meets the preset temperature threshold. Sending the first prompt message can be the hard drive reporting the first prompt message to the host so that the host can output the first prompt message. Users can maintain the hard drive based on the first prompt message, which can prevent safety hazards caused by abnormal temperature of the supercapacitor (such as spontaneous combustion due to excessive temperature), thereby improving the overall safety of the hard drive during operation.
[0024] In one possible implementation, the information determination method further includes: sending a second prompt message when the remaining lifetime is less than the remaining lifetime threshold, the second prompt message being used to indicate that the supercapacitor's remaining lifetime is insufficient.
[0025] Sending the second prompt message can be a process where the hard drive reports the second prompt message to the host so that the host can output the first prompt message. The user can then replace the hard drive based on the first prompt message to avoid the risk of data loss due to the failure of the supercapacitor in the hard drive.
[0026] In one possible implementation, the information determination method further includes: performing discharge detection on the supercapacitor, obtaining the discharge detection result, and sending a third prompt message when the discharge detection result indicates that the discharge detection has passed and the remaining lifetime threshold is greater than or equal to the remaining lifetime threshold. The third prompt message is used to indicate that there is no abnormality in the supercapacitor.
[0027] Sending a third prompt message can be a process where the hard drive reports a third prompt message to the host, so that the host can control the hard drive to perform data writing operations based on the third prompt message, thus ensuring the security and reliability of the writing process.
[0028] It should be understood that determining the remaining lifespan of a supercapacitor can be done actively by the hard drive or in response to a detection command from the host.
[0029] In one possible implementation, before acquiring the first temperature of the target device in the hard disk, the method further includes: receiving a detection command for detecting the remaining lifetime of the supercapacitor. The hard disk may respond to the detection command by acquiring the first temperature of the target device in the hard disk, the target device being a device in the hard disk whose temperature is related to that of the supercapacitor; determining the target temperature of the supercapacitor based on the first temperature and a first correspondence, the first correspondence representing the correspondence between the temperature of the target device and the temperature of the supercapacitor; and determining the remaining lifetime of the supercapacitor based on its initial lifetime and the target temperature.
[0030] In one possible implementation, the method also includes sending the remaining lifetime of the supercapacitor.
[0031] Specifically, the hard drive can report the remaining lifespan of the supercapacitor to the host so that the host can take measures based on the remaining lifespan to ensure the security and reliability of data writing.
[0032] In one possible implementation, after receiving the remaining lifetime of the supercapacitor, the host generates and outputs a second prompt message if it determines that the remaining lifetime of the supercapacitor is less than the remaining lifetime threshold.
[0033] In one possible implementation, the host sends a detection command to the hard drive to detect the remaining lifespan of the supercapacitors in the hard drive.
[0034] Secondly, embodiments of this application also provide a hard disk, which includes a processor and memory. The memory stores program instructions, and the processor is used to call the program instructions to execute the methods in the first aspect and various possible implementations of the first aspect.
[0035] Thirdly, embodiments of this application also provide an information determination system, the system including a host and a hard disk; the hard disk is used to acquire a first temperature of a target device in the hard disk, the target device being a device in the hard disk related to the temperature of a supercapacitor; based on the first temperature and a first correspondence, a target temperature of the supercapacitor is determined, the first correspondence characterizing the correspondence between the temperature of the target device and the temperature of the supercapacitor; based on the initial lifetime of the supercapacitor and the target temperature, the remaining lifetime of the supercapacitor is determined; the host is used to output a second prompt message when the remaining lifetime of the supercapacitor is less than a remaining lifetime threshold, the second prompt message being used to indicate that the remaining lifetime of the supercapacitor is insufficient.
[0036] In one possible implementation, the second notification message could be generated and sent to the host by the hard drive when the remaining lifespan of the supercapacitor is less than a remaining lifespan threshold. Alternatively, the second notification message could be generated by the host upon receiving the remaining lifespan of the supercapacitor from the hard drive and determining that the remaining lifespan of the supercapacitor is less than the remaining lifespan threshold.
[0037] In one possible implementation, the detection command is used to detect the remaining lifetime of the supercapacitor.
[0038] Fourthly, embodiments of this application also provide a computer-readable storage medium for storing a computer program that, when executed on a computer or processor, causes the computer or processor to implement the methods of the first aspect and various possible implementations of the first aspect.
[0039] Fifthly, embodiments of this application also provide a computer program product containing instructions that, when executed on a computer or processor, cause the computer or processor to implement the methods of the first aspect and various possible implementations of the first aspect.
[0040] In a sixth aspect, embodiments of this application also provide a chip system including a memory and a processor, the processor being configured to execute a computer program stored in the memory to implement the methods of the first aspect and various possible implementations of the first aspect.
[0041] Optionally, the chip system may also include a communication interface for enabling communication between the chip system and external devices.
[0042] In a seventh aspect, embodiments of this application also provide a computing device, characterized in that it includes a processor and a solid-state drive provided in the second aspect.
[0043] The beneficial effects of the technical solutions in the second to seventh aspects of this application can be referred to the beneficial effects of the technical solutions in the first aspect, and will not be repeated here. Attached Figure Description
[0044] Figure 1 This is a schematic diagram of the structure of an information determination system 100 provided in an embodiment of this application;
[0045] Figure 2 This is a schematic diagram of the structure of another information determination system 100 according to an embodiment of this application;
[0046] Figure 3 This is a flowchart illustrating an information determination method 300 provided in an embodiment of this application;
[0047] Figure 4 This is a flowchart illustrating an information determination method 400 provided in an embodiment of this application;
[0048] Figure 5 This is a flowchart illustrating an information determination method 500 provided in an embodiment of this application;
[0049] Figure 6 This is a schematic diagram of the structure of a hard disk provided in an embodiment of this application;
[0050] Figure 7 This is a schematic diagram of the structure of a computing device provided in an embodiment of this application. Detailed Implementation
[0051] The technical solutions in the embodiments of this application will now be described with reference to the accompanying drawings.
[0052] In the description of the embodiments of this application, unless otherwise stated, " / " means "or"; for example, A / B can mean A or B; "and / or" in this document is merely a description of the relationship between related objects, indicating that three relationships can exist; for example, A and / or B can mean: A exists alone, A and B exist simultaneously, or B exists alone. Furthermore, in the description of the embodiments of this application, "multiple" refers to two or more.
[0053] Hereinafter, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first," "second," or "third" may explicitly or implicitly include one or more of that feature.
[0054] Figure 1 This is a schematic diagram of the architecture of an information determination system provided in an embodiment of this application. The information determination system 100 includes a host 101 and a hard disk 102. The hard disk 102 is a hard disk containing a supercapacitor capable of providing backup power. The ability of the hard disk 102 to provide backup power can be understood as the hard disk 102 still being able to supply power to protect data in the event of a power outage. A supercapacitor can also be called a double-layer capacitor.
[0055] In this embodiment, the host 101 is connected to the hard disk 102. However, the connection method between the host 101 and the hard disk 102 is not limited in this application. For example, the host 101 and the hard disk 102 can be connected via a Serial Advanced Technology Attachment (SATA) interface, a Serial Attached Small Computer System Interface (SAS) interface, a Peripheral Component Interconnect Express (PCIe) interface, or a Non-Volatile Memory Express (NVMe) interface.
[0056] In this embodiment, the host 101 can interact with the hard disk 102, access the data stored in the hard disk 102, and detect the remaining lifespan of the supercapacitor in the hard disk 102 to ensure normal data reading and writing, and avoid data loss due to supercapacitor failure. The host 101 can be a server, personal computer, or other similar device.
[0057] Figure 2 This is a schematic diagram of another information determination system provided in an embodiment of this application. The following is combined with… Figure 2 The internal structure of hard disk 102 and the way the host accesses the data stored on the hard disk are explained in detail.
[0058] like Figure 2As shown, the hard disk 102 may include an application-specific integrated circuit (ASIC), multiple NAND flash memory chips, double data rate synchronous dynamic random access memory (DDR SDRAM), and a supercapacitor. The NAND flash memory chips are capable of retaining stored data even after power is lost. Each NAND flash memory chip may consist of multiple floating-gate transistors, and each floating-gate transistor can store one or more bits of data. Figure 2 The number of NAND Flash memory chips shown is 4 as an example. DDR SDRAM can also be called DDR. ASICs are equipped with PCIe INF (PCI Express Interface), control path, Static Random Access Memory (SRAM), and NFI to realize data processing.
[0059] PCIe INF, also known as PCI Express interface, is used to communicate with the host 101 to transmit data and instructions.
[0060] Control Path can parse and execute read and write commands from the host, and manage operations within hard disk 102, such as coordinating data read and write operations.
[0061] SRAM: Used as a cache memory. Due to its high speed and stable data, SRAM can cache frequently read and written data and address mappings, thereby improving the overall read and write performance of the hard drive.
[0062] NFI stands for NAND Flash Interface, which is responsible for communicating with NAND flash memory chips and transmitting data and control signals. It enables the physical connection and logical interaction between the hard disk 102 control module and the NAND flash memory chips.
[0063] In one possible implementation, the hard disk 102 can be a solid state drive (SSD), such as a quad-level cell (QLC) SSD, a triple-level cell (TLC) SSD, or a single-level cell (SLC) SSD.
[0064] Hard drive 102 can respond to data write commands from the host via Control Path, first writing data to its DDR SDRAM. DDR SDRAM acts as a data intermediary, temporarily storing data about to be written to the NAND flash memory. Subsequently, the data is written from the DDR SDRAM to the NAND flash memory. If a sudden power outage occurs while data is being written to the DDR SDRAM, the supercapacitor can sustain the writing of the data from the DDR SDRAM to the NAND flash memory, preventing data loss.
[0065] To prevent the risk of data loss due to supercapacitor failure, embodiments of this application provide an information determination method, applied to... Figure 1 or Figure 2 The information determination system 100 shown can detect the remaining lifespan of the supercapacitor in the hard disk 102, so that when the remaining lifespan of the supercapacitor is determined to be close to the end of its life, timely measures can be taken, such as replacing the hard disk 102, thereby avoiding the risk of data loss caused by the failure of the supercapacitor.
[0066] Figure 3 This is a flowchart illustrating an information determination method 300 provided in an embodiment of this application. This information determination method 300 does not rely on... Figure 3 The specific order is a limitation. It should be understood that in other embodiments, the order of some steps in the method can be interchanged according to actual needs, or some steps can be omitted or deleted. For example, this information determination method 300 can be applied to... Figure 1 and Figure 2 The information shown identifies the hard disk 102 in system 100. For example... Figure 3 As shown, the information determination method 300 includes steps S301 to S303. The following is a detailed explanation of each step.
[0067] S301. Obtain the first temperature of the target device in the hard disk.
[0068] It should be understood that a hard drive can be a backup power drive, meaning it can still supply power to protect data in the event of a power outage; this hard drive contains a supercapacitor. The target device is the component in the hard drive that is temperature-dependent on the supercapacitor. When the external power supply to the hard drive is interrupted, the supercapacitor can release electrical energy to provide power support to the hard drive, ensuring that the hard drive has enough time to complete operations such as data writing, thereby protecting it from data loss.
[0069] In one possible implementation, the hard drive can be an SSD, a hybrid hard disk (HHD), or a hard drive that includes a supercapacitor and is capable of providing backup power.
[0070] In one possible implementation, the target device includes at least one of an ASIC chip, a NAND flash memory chip, a DDR SDRAM, and a circuit board; wherein the ASIC chip, the NAND flash memory chip, the DDR SDRAM, and the supercapacitor are disposed on the circuit board.
[0071] In this embodiment of the application, the first temperature of the target device in the hard disk can be actively collected by the hard disk, or it can be collected by the hard disk in response to receiving a detection command from the host. The detection command is used to detect the remaining lifespan of the supercapacitor.
[0072] In one possible implementation, the target device's temperature can be detected to obtain a first temperature, which is then stored in a specific area, such as a register on a hard drive. When the first temperature of the target device in the hard drive is needed, it can be read from this register.
[0073] Example 1: The hard drive has an internal temperature sensor that can be used to collect the initial temperature of the target device.
[0074] Example 2: The target device has temperature sensing capabilities and can report temperature data in real time or periodically, storing the data in a hard disk register. Examples of target devices include ASIC chips and NAND flash memory chips.
[0075] Based on the above scheme, the first temperature of the target device in the hard drive can be flexibly obtained, so as to determine the target temperature of the supercapacitor in the hard drive based on the first temperature. If the temperature of the supercapacitor is found to be abnormal based on the target temperature, the user will be notified, and if the supercapacitor is found to be nearing the end of its lifespan based on the target temperature, the user will be notified. The user can then maintain or replace the hard drive, thereby reducing potential safety hazards that may occur during the operation of the hard drive.
[0076] S302. Based on the first temperature and the first correspondence, determine the target temperature of the supercapacitor. The first correspondence characterizes the correspondence between the temperature of the target device and the temperature of the supercapacitor.
[0077] In one possible implementation, the temperature of the supercapacitor corresponding to the first temperature can be determined based on the first temperature and the first correspondence, and the temperature of the supercapacitor corresponding to the first temperature can be used as the target temperature.
[0078] In another possible implementation, the temperature of the target device in the hard drive can be acquired multiple times within a first time period, resulting in multiple first temperatures. Then, for each of these first temperatures, based on a first correspondence between the first temperatures and other conditions, the temperature of the supercapacitor corresponding to that first temperature is determined, and this temperature is used as a second temperature. Next, calculations are performed on the second temperatures corresponding to the multiple first temperatures to obtain the target temperature of the supercapacitor. These multiple second temperatures reflect the temperature distribution of the supercapacitor within the first time period.
[0079] The first duration can be understood as the duration used to detect the remaining lifespan of the supercapacitor; when periodically detecting the remaining lifespan of the supercapacitor, the duration for detecting the remaining lifespan of the supercapacitor in each cycle is the first duration. The first duration can be, for example, 30 seconds or 60 seconds.
[0080] The target temperature of the supercapacitor can be obtained by performing calculations on multiple second temperatures in the following way:
[0081] Example 1: Multiple second temperatures can be averaged to obtain the average temperature of the multiple second temperatures, and this average temperature can be used as the target temperature.
[0082] Example 2: A weighted average of multiple second temperatures can be calculated, and this weighted average can be used as the target temperature. When calculating the weighted average, different weights can be assigned to each second temperature based on the difference between each second temperature and the supercapacitor's reference temperature.
[0083] Example 3: The median of multiple second temperatures can be calculated and used as the target temperature. Specifically, the multiple second temperatures can be sorted. If the number of second temperatures is odd, the median is the middle temperature after sorting; if the number of second temperatures is even, the median is the average of the two middle temperatures after sorting.
[0084] The above scheme obtains the target temperature of the supercapacitor by calculating multiple second temperatures, which can smooth out random errors and improve the accuracy of the determined target temperature.
[0085] In this embodiment, the first correspondence can be a logical relationship, which characterizes the mapping rule between the temperature of the target device and the temperature of the supercapacitor. This logical relationship can be represented, for example, by a function.
[0086] In one possible implementation, multiple sample temperatures of the target device and multiple sample temperatures of the supercapacitor can be obtained in advance, and a fitting algorithm can be used to fit the multiple sample temperatures of the target device and the multiple sample temperatures of the supercapacitor to obtain the logical relationship.
[0087] In the embodiments of this application, the first correspondence can also be a lookup correspondence.
[0088] In one possible implementation, the first correspondence can be pre-set and can be presented in a table, wherein the table stores multiple temperatures of the target device and the temperature of the supercapacitor corresponding to each of the multiple temperatures.
[0089] S303. Determine the remaining lifespan of the supercapacitor based on its initial lifespan and target temperature.
[0090] In this embodiment, the lifespan loss of the supercapacitor caused by the target temperature can be determined based on the target temperature, and this lifespan loss is taken as the target lifespan loss of the supercapacitor. Subsequently, the difference between the initial lifespan of the supercapacitor and the target lifespan loss of the supercapacitor can be calculated, and this difference is used to characterize the remaining lifespan of the supercapacitor.
[0091] The initial lifetime of a supercapacitor can be the remaining lifetime of the supercapacitor determined at the most recent time before the current time.
[0092] It should be noted that the time interval between two consecutive tests of the remaining lifetime of the supercapacitor is less than or equal to the second duration. The second duration can be preset, for example, 24 hours or 48 hours. The specific value of the second duration can be flexibly set, and this application embodiment does not limit the specific value of the second duration.
[0093] For example, the remaining lifetime of a supercapacitor can be represented by L, the initial lifetime can be represented by L1, and the lifetime loss of the supercapacitor caused by the target temperature can be represented by L2, where L = L1 - L2.
[0094] In one possible implementation, the remaining lifespan of the supercapacitor can be determined periodically. For the Nth period, the initial lifespan can be the remaining lifespan of the supercapacitor determined in the (N-1)th period, where N is a positive integer greater than 1. In the 1st period, the initial lifespan is the baseline lifespan of the supercapacitor specified by the manufacturer at the time the hard drive leaves the factory.
[0095] In one possible implementation, the life loss of the supercapacitor caused by the target temperature can be determined by the following method: the target life loss of the supercapacitor is determined based on the target temperature and a second correspondence, where the second correspondence characterizes the relationship between the temperature of the supercapacitor and the life loss.
[0096] The second correspondence can be a logical relationship, which represents the mapping rule between the temperature and lifespan loss of the supercapacitor. This logical relationship can be represented by a function, for example.
[0097] In one possible implementation, the information determination method 300 can be executed actively by the hard disk or in response to a detection command used to detect the remaining lifespan of the supercapacitor in the hard disk. The information determination method 300 can be executed non-periodically. Alternatively, the information determination method 300 can be executed periodically.
[0098] This application provides an information determination method. It involves acquiring a first temperature of a target device in a hard disk, where the target device is a component in the hard disk whose temperature is related to that of a supercapacitor. Based on the first temperature and a first correspondence, a target temperature for the supercapacitor is determined. The first correspondence characterizes the relationship between the temperature of the target device and the temperature of the supercapacitor. Based on the initial lifetime of the supercapacitor and the target temperature, the remaining lifetime of the supercapacitor is determined. This allows for timely intervention when the supercapacitor is nearing the end of its lifespan, thereby avoiding the risk of data loss due to supercapacitor failure in the hard disk.
[0099] Figure 4 This is a flowchart illustrating another information determination method 400 provided in an embodiment of this application. This information determination method 400 can be a refinement of the information determination method 300 in the above embodiments, and can be applied, for example, to... Figure 1 and Figure 2 The information shown identifies the hard disk 102 in system 100. This information identification method 400 does not rely on… Figure 4 The specific order is a limitation. It should be understood that in other embodiments, the order of some steps in the method can be interchanged according to actual needs, or some steps can be omitted or deleted. For example... Figure 4 As shown, the information determination method 400 includes steps S401 to S408, and each step is explained in detail below.
[0100] S401. The hard disk acquires multiple first temperatures of the target device in the hard disk, where the target device is a device whose temperature is related to that of the supercapacitor in the hard disk.
[0101] It should be noted that the implementation process of S401 is the same as that of S301. For details, please refer to the implementation process of S301. The embodiments of this application will not be described again here.
[0102] S402. The hard disk determines multiple second temperatures of the supercapacitor based on multiple first temperatures and a first correspondence, wherein the first correspondence characterizes the correspondence between the temperature of the target device and the temperature of the supercapacitor.
[0103] S403: The hard drive calculates the average of multiple second temperatures to obtain the target temperature of the supercapacitor.
[0104] In one possible implementation, when the target temperature meets a preset temperature threshold, a first alert message is sent to the host computer. This first alert message indicates that the supercapacitor's temperature has become abnormal. Correspondingly, the host computer outputs the first alert message. The first alert message can be presented in at least one of the following forms: text, icon, vibration, light, etc.
[0105] The target temperature meeting the preset temperature threshold can be either a target temperature greater than a first temperature threshold, or a target temperature less than or equal to a second temperature threshold. The first temperature threshold is greater than the second temperature threshold. When the target temperature is greater than the first temperature threshold, it indicates that the supercapacitor is in a high-temperature state; when the target temperature is greater than the second temperature threshold, it indicates that the supercapacitor is in a low-temperature state.
[0106] It should be understood that when supercapacitors are exposed to high temperatures for extended periods, their internal materials undergo physical and chemical changes, such as electrode material degradation and electrolyte decomposition. These changes lead to a gradual decline in supercapacitor performance, eventually resulting in failure. Conversely, when supercapacitors are exposed to low temperatures, their equivalent series resistance (ESR) and DC internal resistance (DCR) may increase, leading to a reduced power-off retention time and thus increasing the risk of data loss or corruption.
[0107] The above solution allows users to maintain the hard drive based on the initial prompt information, preventing safety hazards caused by abnormal temperatures of the supercapacitor (such as the supercapacitor potentially igniting at high temperatures), thereby improving the overall safety of the hard drive during operation.
[0108] S404. Based on the target temperature and the second correspondence, the hard disk determines the target life loss of the supercapacitor. The second correspondence characterizes the relationship between the temperature and life loss of the supercapacitor.
[0109] S405: The hard drive calculates the difference between the initial lifespan and the target lifespan loss to obtain the remaining lifespan of the supercapacitor.
[0110] It should be noted that any of the steps S406, S407, and S408 can be executed after S405.
[0111] S406. The hard drive sends the remaining lifespan of the supercapacitor to the host. Correspondingly, the host receives the remaining lifespan of the supercapacitor and, if the remaining lifespan is less than the remaining lifespan threshold, outputs a second warning message indicating that the supercapacitor's remaining lifespan is insufficient.
[0112] The second prompt message can be presented in at least one of the following forms: text, icon, vibration, light, etc.
[0113] Based on the above solution, users can replace the hard drive based on the second prompt information to avoid the risk of data loss due to the failure of the supercapacitor in the hard drive.
[0114] S407. If the remaining lifespan is less than the remaining lifespan threshold, the hard drive sends a second notification message to the host. The second notification message indicates that the supercapacitor's remaining lifespan is insufficient. Correspondingly, the host receives the second notification message and outputs it.
[0115] Based on the above solution, users can replace the hard drive based on the first prompt information to avoid the risk of data loss due to the failure of the supercapacitor in the hard drive.
[0116] S408: The hard drive performs a discharge detection on the supercapacitor, obtains the discharge detection result, and if the discharge detection result indicates that the discharge detection has passed and the remaining lifespan is greater than or equal to the remaining lifespan threshold, it sends a third prompt message to the host. The third prompt message indicates that the supercapacitor is not abnormal. Accordingly, the host controls the hard drive to perform a data write operation based on the third prompt message.
[0117] The third prompt message can be presented in at least one of the following forms: text, icon, vibration, light, etc.
[0118] Based on the above scheme, the host can control the hard drive to perform data writing operations upon receiving a third prompt message, ensuring the security and reliability of the writing process.
[0119] In S408, the third notification message is generated by the hard drive and sent to the host. Of course, the third notification message can also be generated by the host; in this case, the hard drive can send the discharge detection result and the remaining lifespan of the supercapacitor to the host, and the host can generate the third notification message if the discharge detection result indicates that the discharge detection has passed and the remaining lifespan threshold is greater than or equal to the remaining lifespan threshold.
[0120] In one possible implementation, the host can output a third notification message to inform the user that the supercapacitor is functioning normally, allowing the user to use the hard drive with peace of mind and improving the user experience.
[0121] In this embodiment, the information determination method 400 can be executed actively by the hard disk or in response to a detection command used to detect the remaining lifespan of the supercapacitor in the hard disk. The information determination method 400 can be executed non-periodically, or it can be executed periodically.
[0122] In one possible implementation, the information determination method 400 is executed periodically. For the Nth cycle, the initial lifetime can be the remaining lifetime of the supercapacitor determined in the (N-1)th cycle, where N is a positive integer greater than 1. In the 1st cycle, the initial lifetime is the baseline lifetime of the supercapacitor specified by the manufacturer at the time the hard drive leaves the factory.
[0123] It should be noted that the descriptions of the same steps and contents in the embodiments of this application as in other embodiments can be referred to the descriptions in other embodiments, and will not be repeated here.
[0124] This application provides an information determination method that can determine the target temperature of a supercapacitor based on the first temperature of a device in the hard disk that is related to the temperature of the supercapacitor, and determine the remaining lifespan of the supercapacitor based on the initial lifespan of the supercapacitor and the target temperature, so as to take timely measures when the supercapacitor is nearing the end of its lifespan based on the remaining lifespan of the supercapacitor, thereby avoiding the risk of data loss caused by the failure of the supercapacitor in the hard disk.
[0125] Figure 5 This is a flowchart illustrating another information determination method 500 provided in this application embodiment. This information determination method 500 can be a refinement of the information determination method 300 or information determination method 400 in the above embodiments, and can be applied to the information determination system 100 in the above embodiments. This information determination method 500 does not... Figure 5 The specific order is a limitation. It should be understood that in other embodiments, the order of some steps in the method can be interchanged according to actual needs, or some steps can be omitted or deleted. For example... Figure 5 The information determination method 500 shown can perform the following steps:
[0126] 1. The host computer sends a test command to the hard drive to check the remaining lifespan of the supercapacitor. The hard drive receives this test command via a communication module. This test command may be, for example, a design fortification (DFT) command. This communication module is used for communication between the hard drive and the host computer.
[0127] 2. The hard drive's communication module can send this detection command to the hard drive's processor. This communication module can be the front end (FE) section of the hard drive.
[0128] 3. The processor can respond to the detection command to obtain the first temperature of the target device in the hard disk, the target device being the device in the hard disk whose temperature is related to that of the supercapacitor; based on the first temperature and the first correspondence, the target temperature of the supercapacitor is determined, the first correspondence characterizing the correspondence between the temperature of the target device and the temperature of the supercapacitor; based on the initial lifespan of the supercapacitor and the target temperature, the remaining lifespan of the supercapacitor is determined.
[0129] In one possible implementation, the processor can perform discharge detection on the supercapacitor and obtain the discharge detection result.
[0130] 4. The host sends a query command to the hard drive.
[0131] 5. The hard drive's communication module receives the query command and forwards it to the hard drive's processor. Correspondingly, the hard drive's processor responds to the query command by sending the remaining lifespan of the supercapacitor to the host via the communication module. Based on this remaining lifespan, timely measures can be taken when the supercapacitor is nearing the end of its lifespan, thereby avoiding the risk of data loss due to supercapacitor failure in the hard drive.
[0132] The query command can be used to query the remaining lifespan of a supercapacitor. Alternatively, the query command can be used to query the remaining lifespan of a supercapacitor and the discharge test results.
[0133] It should be understood that the remaining lifespan of the supercapacitor and the discharge detection results can be recorded in VendorSmart information; VendorSmart information refers to information from a set of self-monitoring, analysis, and reporting technologies embedded in the hard drive.
[0134] In one possible implementation, the hard drive's processor can periodically check the hard drive's target temperature, remaining lifespan, and discharge status. If any of these conditions becomes abnormal, the processor can report the abnormality to the host or record the reported abnormality information in the VendorSmart information.
[0135] in, Figure 5 The example used is the hard drive responding to a detection command from the host to test the supercapacitor's lifespan. Of course, the hard drive can also actively test the supercapacitor's lifespan.
[0136] in, Figure 5 The remaining lifespan of the supercapacitor can be sent to the host by the hard drive in response to a query command from the host. Of course, the hard drive can also proactively report the supercapacitor's remaining lifespan to the host.
[0137] This application provides an information determination method that can determine the lifespan of a supercapacitor. Based on the lifespan of the supercapacitor, timely measures can be taken when the supercapacitor is nearing the end of its lifespan, thereby avoiding the risk of data loss due to the failure of the supercapacitor in the hard drive and reducing the probability of hard drive failure caused by the supercapacitor.
[0138] This application also provides a hard disk, such as... Figure 6 As shown, the hard disk 6 includes a processor 61 and a memory 62. The memory 62 stores program instructions, and the processor 61 is used to call the program instructions to execute the methods in the above method embodiments. The hard disk may be, for example, a solid-state drive (SSD).
[0139] This application also provides a computing device, such as... Figure 7 As shown, the computing device 7 includes a processor 71 and a hard disk 72. For example, the processor 71 may be a central processing unit (CPU) of a host computer, and the hard disk 72 may be an SSD.
[0140] This application also provides a computer-readable storage medium storing a computer program thereon, which, when executed by a processor, implements the method described in the above method embodiments.
[0141] This application also provides a computer program product that, when run on a computing device, enables the computing device to implement the method described in the above method embodiments.
[0142] This application provides a chip, including a processor, for calling and executing instructions stored in a memory, causing a computing device with the chip installed to perform the method described in the above method embodiments.
[0143] This application also provides a chip system including a processor coupled to a memory. The processor executes a computer program stored in the memory to implement the method described in the above embodiments. The chip system can be a single chip or a chip module composed of multiple chips.
[0144] In the above embodiments, implementation can be achieved, in whole or in part, through software, hardware, firmware, or any combination thereof. When implemented in software, it can be implemented, in whole or in part, as a computer program product. A computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, all or part of the flow or function according to the embodiments of this application is generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in or transmitted through a computer-readable storage medium. The computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, fiber optic, digital subscriber line) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center that integrates one or more available media. The available medium can be a magnetic medium (e.g., floppy disk, hard disk, or magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., a solid-state disk (SSD)).
[0145] Those skilled in the art will understand that implementing all or part of the processes in the above embodiments can be accomplished by a computer program instructing related hardware. This program can be stored in a computer-readable storage medium, and when executed, it can include the processes described in the above method embodiments. The aforementioned storage medium can include various media capable of storing program code, such as ROM or random access memory (RAM), magnetic disks, or optical disks.
[0146] The naming or numbering of steps in this application does not mean that the steps in the method flow must be executed in the time / logical order indicated by the naming or numbering. The execution order of the named or numbered process steps can be changed according to the technical purpose to be achieved, as long as the same or similar technical effect can be achieved.
[0147] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail or recorded in a certain embodiment, please refer to the relevant descriptions of other embodiments.
[0148] In the embodiments provided in this application, it should be understood that the disclosed apparatus / device and method can be implemented in other ways. For example, the apparatus / device embodiments described above are merely illustrative. For instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.
[0149] It should be understood that in the description of this application and the appended claims, the terms "comprising," "including," "having," and any variations thereof are intended to cover a non-exclusive inclusion and mean "including but not limited to," unless otherwise specifically emphasized. For example, a process, method, system, product, or apparatus that includes a series of steps or modules is not necessarily limited to those steps or modules that are explicitly listed, but may include other steps or modules that are not explicitly listed or that are inherent to such process, method, product, or apparatus.
[0150] In the description of this application, unless otherwise stated, " / " indicates that the objects before and after are in an "or" relationship. For example, A / B can mean A or B. "And / or" in this application is used to describe the relationship between the related objects, indicating that there can be three relationships. For example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone. A and B can be singular or plural.
[0151] Furthermore, in the description of this application, unless otherwise stated, "multiple" means two or more. "At least one of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one of a, b, or c can mean: a, b, c, ab, ac, bc, or abc, where a, b, and c can be single or multiple.
[0152] As used in this application specification and the appended claims, the term "if" may be interpreted, depending on the context, as "when," "once," "in response to determination," or "in response to detection." Similarly, the phrase "if determined" or "if detected [the described condition or event]" may be interpreted, depending on the context, as meaning "once determined," "in response to determination," "once detected [the described condition or event]," or "in response to detection [the described condition or event]."
[0153] Furthermore, in the description of this application and the appended claims, the terms "first," "second," etc., are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence, nor should they be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. It should be understood that such data can be interchanged where appropriate so that the embodiments described herein can be implemented in a sequence other than that illustrated or described herein; features defined as "first" or "second" may explicitly or implicitly include at least one of those features.
[0154] In the embodiments of this application, the words "exemplarily" or "for example" are used to indicate examples, illustrations, or explanations. Any embodiment or design described as "exemplarily" or "for example" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design solutions. Specifically, the use of the words "exemplarily" or "for example" is intended to present the relevant concepts in a specific manner.
[0155] References to "one embodiment" or "some embodiments" in this specification mean that one or more embodiments of this application include a specific feature, structure, or characteristic described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized.
[0156] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.
Claims
1. A method for determining information, characterized in that, The method includes: The first temperature of a target device in the hard disk is obtained, wherein the target device is a device in the hard disk whose temperature is related to that of the supercapacitor; Based on the first temperature and the first correspondence, the target temperature of the supercapacitor is determined, wherein the first correspondence characterizes the correspondence between the temperature of the target device and the temperature of the supercapacitor; The remaining lifespan of the supercapacitor is determined based on its initial lifespan and the target temperature.
2. The method according to claim 1, characterized in that, The process of obtaining the first temperature of the target device in the hard disk includes: The initial temperature of the target device in the hard drive is periodically acquired; Accordingly, determining the target temperature of the supercapacitor based on the first temperature and the first correspondence includes: For each cycle, the target temperature of the supercapacitor is determined based on the first temperature and the first correspondence.
3. The method according to claim 1 or 2, characterized in that, Determining the target temperature of the supercapacitor based on the first temperature and the first correspondence includes: Based on multiple first temperatures and the first correspondence, multiple second temperatures of the supercapacitor are determined; The target temperature of the supercapacitor is obtained by performing calculations on the plurality of second temperatures.
4. The method according to any one of claims 1 to 3, characterized in that, Determining the remaining lifespan of the supercapacitor based on its initial lifespan and the target temperature includes: Based on the target temperature and the second correspondence, the target lifetime loss of the supercapacitor is determined, whereby the second correspondence characterizes the relationship between the temperature and lifetime loss of the supercapacitor. The remaining lifespan of the supercapacitor is obtained by calculating the difference between the initial lifespan and the target lifespan loss.
5. The method according to any one of claims 1 to 4, characterized in that, The method further includes: If the target temperature meets the preset temperature threshold, a first prompt message is sent, which is used to indicate that the temperature of the supercapacitor is abnormal.
6. The method according to any one of claims 1 to 5, characterized in that, The method further includes: If the remaining lifespan is less than the remaining lifespan threshold, a second prompt message is sent to indicate that the supercapacitor's remaining lifespan is insufficient.
7. The method according to any one of claims 1 to 6, characterized in that, Before obtaining the first temperature of the target device in the hard disk, the method further includes: Receive a detection command, the detection command being used to detect the remaining lifespan of the supercapacitor; Accordingly, the method further includes: Send the remaining lifespan of the supercapacitor.
8. The method according to any one of claims 1 to 7, characterized in that, The target device includes at least one of the following: an application-specific integrated circuit (ASIC) chip, a NAND flash memory chip, a double data rate synchronous dynamic random access memory (DDR SDRAM), and a circuit board.
9. A hard disk, characterized in that, The hard disk includes a processor and memory, the memory stores program instructions, and the processor is used to invoke the program instructions to execute the method as described in any one of claims 1-8.
10. An information determination system, characterized in that, The system includes a host and a hard disk; The hard disk is used to obtain the first temperature of a target device in the hard disk, wherein the target device is a device in the hard disk whose temperature is related to that of the supercapacitor. Based on the first temperature and the first correspondence, the target temperature of the supercapacitor is determined, wherein the first correspondence characterizes the correspondence between the temperature of the target device and the temperature of the supercapacitor; The remaining lifespan of the supercapacitor is determined based on its initial lifespan and the target temperature. The host is configured to output a second prompt message when the remaining lifespan of the supercapacitor is less than the remaining lifespan threshold, the second prompt message being used to indicate that the remaining lifespan of the supercapacitor is insufficient.
11. A computer-readable storage medium for storing a computer program, characterized in that, When the computer program is run on a computer or processor, it causes the computer or processor to perform the method of any one of claims 1 to 8.
12. A computer program product, the computer program product comprising instructions, characterized in that, When the instructions are executed on a computer or processor, the computer or processor performs the method of any one of claims 1 to 8.
13. A chip system, characterized in that, The chip system includes a memory and a processor, the processor being configured to execute a computer program stored in the memory to implement the method as described in any one of claims 1 to 8.