A holographic storage in-data intelligence analysis system and method implementing storage-as-analysis

Abstract

The application discloses a holographic storage in-data intelligent analysis system and method, which realizes storage and analysis. Test data is encoded into a plurality of two-dimensional data pages. According to a preset analysis task requirement, the two-dimensional data pages are stored in corresponding spatial positions of a holographic storage medium. According to the preset analysis task requirement, an optical analysis engine is configured. The optical analysis engine receives diffracted light formed according to a spatial position of target test data in the holographic storage medium, performs operation on the diffracted light, and outputs a conclusion light field. The conclusion light field is received and converted to obtain a conclusion electrical signal. According to the conclusion electrical signal, analysis conclusion information is fed back to a test device. The analysis engine is embedded in a storage reading light path, so that the reading light path becomes the analysis light path, and data emission and conclusion generation are completely coincident in time and space, so that the effect of storage and analysis and reading and conclusion is realized.

Description

Technical Field

[0001] This invention relates to the field of holographic data processing technology, and in particular to a holographic storage near-data intelligent analysis system and method that realizes storage-as-analysis. Background Technology

[0002] As integrated circuit manufacturing processes continue to shrink and chip complexity increases exponentially, the amount of test data for a single chip is growing dramatically. Test data includes massive test vectors, expected responses, actual response waveforms captured during testing, timing parameters, power consumption information, and associated yield and diagnostic data. Currently, automated testing equipment primarily relies on high-speed solid-state drives or disk arrays for storage, which faces challenges such as high storage costs, insufficient reliability of long-term archiving, and low efficiency in data retrieval and analysis.

[0003] Holographic data storage, as a volumetric storage technology, features high storage density, fast data transmission rate, long data lifetime, and resistance to electromagnetic interference. However, existing holographic storage systems still require converting the reconstructed optical signals into electrical signals after data is read, before transmitting them to a separate electronic computer for processing and analysis. Essentially, it remains a serial architecture of "reading → photoelectric conversion → electrical domain transmission → electrical domain computation." This serial architecture has the following problems: First, the image sensor's frame rate limits the data readout speed, making the photoelectric conversion stage a bottleneck in the entire data flow; second, the back-and-forth transmission of large amounts of data between the storage medium and the processor causes significant energy consumption and latency, with the energy consumption of data transmission exceeding the energy consumption of computation itself; third, there is a delay of seconds to minutes between data reading and analysis completion, which cannot meet the requirements for real-time fault detection and feedback in chip testing.

[0004] Furthermore, the aforementioned serial architecture suffers from a deep-seated mismatch between requirements and implementation. In chip testing scenarios, engineers focus not on the data itself, but on the analytical conclusions extracted from it (such as whether the waveform is abnormal, whether there is a spatial pattern in the yield distribution, and where the root cause of the failure is located). The aforementioned serial architecture consumes most of its time and energy on data storage / retrieval and reciprocal transmission, while the truly needed analysis and conclusion generation are delayed until the very end of the process. This is fundamentally contradictory to the "conclusion-oriented" business nature of chip testing. Summary of the Invention

[0005] Considering that the existing serial architecture of holographic storage systems suffers from problems such as photoelectric conversion rate bottleneck, high data transmission energy consumption, and insufficient real-time analysis, it is impossible to effectively complete the conclusion-oriented business in chip testing.

[0006] To address the above problems, this invention provides a holographic storage-based intelligent data analysis system that enables storage-as-analysis, comprising:

[0007] The writing module is used to encode the test data into several two-dimensional data pages; according to the preset analysis task requirements, each two-dimensional data page is stored in the corresponding spatial location of the holographic storage medium;

[0008] The control module is used to configure the optical analysis engine according to the preset analysis task requirements;

[0009] The optical analysis engine receives the diffracted light corresponding to the spatial position of the target test data within the holographic storage medium, performs calculations on the diffracted light, and outputs a conclusion light field; wherein, the diffracted light carries target test data information;

[0010] The detection module is used to receive and convert the conclusion light field to obtain the conclusion electrical signal;

[0011] The control module also feeds back the analysis conclusion information to the testing equipment based on the conclusion electrical signal.

[0012] Optionally, the writing module includes a first spatial light modulator, which generates a plurality of two-dimensional data pages based on the test data; wherein the two-dimensional data pages correspond to a two-dimensional light field distribution pattern.

[0013] The first spatial light modulator is illuminated by the signal light emitted by the light source module to generate several coded light fields that correspond one-to-one with each two-dimensional data page.

[0014] According to the preset analysis task requirements, each encoded light field and the reference light emitted by the light source module are simultaneously irradiated onto the spatial location corresponding to the holographic storage medium, thereby storing each two-dimensional data page into the spatial location corresponding to the holographic storage medium; wherein, the preset analysis task requirements include the operation type of the preset analysis task.

[0015] Optionally, the optical analysis engine includes a second spatial light modulator;

[0016] The control module configures the transmittance function of the second spatial light modulator according to the preset analysis task requirements; wherein the transmittance function is matched with the analysis operator of the preset analysis task.

[0017] Optionally, the optical analysis engine further includes a first Fourier lens and a second Fourier lens;

[0018] The first Fourier lens is used to perform spatial domain to frequency domain transformation on the diffracted light to obtain the transformed light field;

[0019] The second spatial light modulator is used to perform calculations on the transformed diffracted light transmitted therethrough to obtain the calculated light field;

[0020] The second Fourier lens is used to transform the optical field of the calculation result from the frequency domain to the spatial domain to obtain the conclusion optical field.

[0021] Optionally, the detection module includes a photoelectric detection array;

[0022] The photoelectric detection array is used to receive the conclusion light field and perform photoelectric conversion on the conclusion light field to obtain the conclusion electrical signal;

[0023] The control module analyzes and transmits the electrical signals representing the conclusions, and feeds back the analysis conclusion information to the testing equipment.

[0024] As one aspect of the present invention, the present invention also provides a method for intelligent analysis of near-data within holographic storage that enables storage-as-analysis, comprising:

[0025] The test data is encoded into several two-dimensional data pages; according to the preset analysis task requirements, each two-dimensional data page is stored in the corresponding spatial location of the holographic storage medium.

[0026] Configure the optical analysis engine according to the preset analysis task requirements;

[0027] The optical analysis engine receives the diffracted light corresponding to the spatial position of the target test data within the holographic storage medium, performs calculations on the diffracted light, and outputs a conclusion light field; wherein, the diffracted light carries the target test data information;

[0028] The conclusion optical field is received and converted to obtain the conclusion electrical signal; based on the conclusion electrical signal, the analysis conclusion information is fed back to the testing equipment.

[0029] Optionally, the test data is encoded into several two-dimensional data pages; according to the preset analysis task requirements, each two-dimensional data page is stored in the corresponding spatial location of the holographic storage medium, including:

[0030] A first spatial light modulator generates several two-dimensional data pages based on the test data encoding; wherein, the two-dimensional data pages correspond to two-dimensional light field distribution patterns;

[0031] The first spatial light modulator is illuminated with signal light to generate several coded light fields that correspond one-to-one with each two-dimensional data page.

[0032] According to the preset analysis task requirements, each encoded light field and reference light are simultaneously irradiated onto the spatial location corresponding to the holographic storage medium, thereby storing each two-dimensional data page into the spatial location corresponding to the holographic storage medium; wherein, the preset analysis task requirements include the operation type of the preset analysis task.

[0033] Optionally, according to the preset analysis task requirements, an optical analysis engine is configured, including:

[0034] According to the preset analysis task requirements, the transmittance function of the second spatial light modulator of the optical analysis engine is configured; wherein the transmittance function is matched with the analysis operator of the preset analysis task.

[0035] Optionally, operations are performed on the diffracted light to output a conclusion light field, including:

[0036] A first Fourier lens and a second Fourier lens are configured in the optical analysis engine;

[0037] The diffracted light is transformed from the spatial domain to the frequency domain by the first Fourier lens to obtain the transformed light field;

[0038] The transformed diffracted light transmitted through the second spatial light modulator is processed to obtain the resulting light field;

[0039] The calculated light field is transformed from the frequency domain to the spatial domain by the second Fourier lens to obtain the final light field.

[0040] Optionally, the conclusion optical field is received and converted to obtain a conclusion electrical signal; based on the conclusion electrical signal, analysis conclusion information is fed back to the testing equipment, including:

[0041] The conclusion light field is received by a photoelectric detection array, and the conclusion light field is converted into a photoelectric signal to obtain the conclusion electrical signal.

[0042] The electrical signals representing the conclusions are analyzed and transmitted, and the analysis results are fed back to the testing equipment.

[0043] The beneficial effects of the above-mentioned technical solutions provided in the embodiments of the present invention include at least the following:

[0044] This invention provides a holographic storage near-data intelligent analysis system and method that enables storage-as-analysis. The system encodes test data into several two-dimensional data pages. Based on preset analysis task requirements, each two-dimensional data page is stored in a spatial location corresponding to the holographic storage medium. An optical analysis engine is configured according to the preset analysis task requirements. The optical analysis engine receives diffracted light corresponding to the spatial location of the target test data within the holographic storage medium, performs calculations on the diffracted light, and outputs a conclusion light field. The conclusion light field is received and converted to obtain a conclusion electrical signal. Based on the conclusion electrical signal, analysis conclusion information is fed back to the testing equipment. This invention embeds the analysis engine into the storage readout optical path, making the "readout optical path" simultaneously the "analysis optical path," ensuring that "data output" and "conclusion generation" completely overlap in time and space, achieving the effect of "storage-as-analysis, readout-as-conclusion," and reducing the latency and energy consumption caused by photoelectric conversion and electrical domain data transmission at the architectural level.

[0045] The present invention realizes a holographic storage near-data intelligent analysis system and method that realizes storage as analysis. By changing the processing paradigm of test data, the storage medium is no longer a "warehouse" of data, but a "factory" of analysis. The process of writing data is the process of analysis readiness, and the moment the data is addressed is the moment the analysis is completed. The moment the light is emitted from the storage medium, it no longer carries the original data but the analysis conclusion.

[0046] Other features and advantages of the invention will be set forth in the following description, and will be apparent in part from the description, or may be learned by practicing the invention. The objects and other advantages of the invention may be realized and obtained by means of the structures particularly pointed out in the written description and the accompanying drawings.

[0047] The technical solution of the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. Attached Figure Description

[0048] The accompanying drawings are provided to further illustrate the invention and form part of the specification. They are used in conjunction with embodiments of the invention to explain the invention and do not constitute a limitation thereof. In the drawings:

[0049] Figure 1 This is a schematic diagram of the structure of a holographic storage near-data intelligent analysis system that realizes storage-as-analysis, provided in an embodiment of the present invention;

[0050] Figure 2 It is the optical path structure corresponding to the near-data intelligent analysis system within holographic storage.

[0051] Figure 3 This is a flowchart illustrating a method for intelligent analysis of near-data within holographic storage that enables storage as analysis, provided in an embodiment of the present invention. Detailed Implementation

[0052] Exemplary embodiments of the present disclosure will now be described in more detail with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.

[0053] In the description of this invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," "outer," "far," "near," "front," and "rear," etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the accompanying drawings and are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0054] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0055] Please see Figure 1 As shown, one embodiment of this application provides a holographic storage near-data intelligent analysis system that realizes storage-as-analysis. This holographic storage near-data intelligent analysis system includes:

[0056] The writing module is used to encode the test data into several two-dimensional data pages; according to the preset analysis task requirements, each two-dimensional data page is stored in the corresponding spatial location of the holographic storage medium;

[0057] The control module is used to configure the optical analysis engine according to the preset analysis task requirements;

[0058] The optical analysis engine receives the diffracted light corresponding to the spatial position of the target test data within the holographic storage medium, performs calculations on the diffracted light, and outputs the conclusion light field; the diffracted light carries the target test data information.

[0059] The detection module is used to receive and convert the conclusion light field to obtain the conclusion electrical signal;

[0060] The control module also feeds back the analysis conclusion information to the testing equipment based on the conclusion electrical signal.

[0061] The analysis system embeds the analysis engine into the storage read optical path, making the "read optical path" also the "analysis optical path". This allows the "data output" and "conclusion generation" to completely overlap in time and space, achieving the effect of "storage is analysis, and reading is conclusion". This reduces the latency and energy consumption caused by photoelectric conversion and electrical domain data transmission at the architectural level.

[0062] In another embodiment, the writing module includes a first spatial light modulator, which generates a plurality of two-dimensional data pages based on test data encoding; wherein the two-dimensional data pages correspond to a two-dimensional light field distribution pattern;

[0063] The first spatial light modulator is illuminated by the signal light emitted by the light source module to generate several coded light fields that correspond one-to-one with each two-dimensional data page.

[0064] According to the preset analysis task requirements, the reference light emitted by each encoded light field and light source module is simultaneously irradiated onto the corresponding spatial location of the holographic storage medium, thereby storing each two-dimensional data page into the corresponding spatial location of the holographic storage medium; wherein, the preset analysis task requirements include the operation type of the preset analysis task.

[0065] In another embodiment, the optical analysis engine includes a second spatial light modulator;

[0066] The control module configures the transmittance function of the second spatial light modulator according to the preset analysis task requirements; wherein the transmittance function is matched with the analysis operator of the preset analysis task.

[0067] In another embodiment, the optical analysis engine further includes a first Fourier lens and a second Fourier lens;

[0068] The first Fourier lens is used to transform the diffracted light from the spatial domain to the frequency domain to obtain the transformed light field;

[0069] The second spatial light modulator is used to perform calculations on the transformed diffracted light passing through it to obtain the calculated light field;

[0070] The second Fourier lens is used to transform the calculated optical field from the frequency domain to the spatial domain to obtain the final optical field.

[0071] In another embodiment, the detection module includes a photoelectric detection array;

[0072] The photoelectric detection array is used to receive the conclusion light field and perform photoelectric conversion on the conclusion light field to obtain the conclusion electrical signal;

[0073] The control module analyzes and transmits the conclusion electrical signals, and feeds back the analysis conclusion information to the test equipment.

[0074] Please see Figure 2The light source module includes a laser source and a beam splitter; the laser source generates a coherent beam; the coherent beam is split by the beam splitter to form a signal beam and a reference beam. The writing module includes a first spatial light modulator (SLM), which is disposed in the transmission optical path of the signal beam. It is used to encode the test data generated on the chip into a two-dimensional light field distribution pattern and form an interference pattern with the reference beam in the holographic storage medium, thereby completing the holographic recording of the test data. The holographic storage medium can be, but is not limited to, a volume holographic storage medium, which stores the test data generated on the chip in volume holographic form. The test data can be encoded and recorded in the volume space of the holographic storage medium in the form of two-dimensional data pages. Each two-dimensional data page can include, but is not limited to, at least one of test vectors, expected response, actual response waveform, timing parameters, power consumption information, yield, and diagnostic data. During the process of writing test data into the holographic storage medium, according to the preset analysis task requirements, each two-dimensional data page corresponding to the test data can be stored in different spatial locations inside the holographic storage medium in an analysis-friendly logical organization manner, so that the relevant two-dimensional data pages can be read and processed in parallel in the optical domain during subsequent analysis.

[0075] Chip testing generates various types of raw test data, including but not limited to test vector sets, actual response waveform sequences, timing parameter tables, power consumption curves, and wafer yield distribution maps. This raw test data is heterogeneous; after preprocessing, it is uniformly arranged into a two-dimensional data matrix, and then modulated into a two-dimensional light field encoding pattern by a first spatial light modulator. In this two-dimensional light field encoding pattern, the grayscale value or phase value of each pixel unit corresponds to one or more data bits, forming a standardized holographic data page.

[0076] The holographic storage medium has a three-dimensional volume space. Based on the preset analysis task requirements, related data pages are written into adjacent spatial locations within the holographic storage medium, forming several data page groups. For example, the waveform anomaly detection group can be stored in the front left region of the medium, filled with Mississippi lines, centrally storing measured waveform data and corresponding reference waveforms; the yield spatial pattern recognition group can be stored in the central region of the medium, filled with a dot matrix, centrally storing the position coordinates of each chip on the wafer and yield values; the fault root cause localization group can be stored in the rear right region of the medium, filled with grid lines, centrally storing fault type labels, failure addresses, and corresponding diagnostic data. Each data page group is staggered along the spatial multiplexing dimension (horizontal X-axis) and angular multiplexing dimension (vertical Y-axis) within the volume space, ensuring that during subsequent addressing, a single reference light incident can simultaneously excite the diffracted light of multiple adjacent data pages within the data page group, achieving parallel reading and analysis.

[0077] The optical analysis engine may include, but is not limited to, a first Fourier lens, a second spatial light modulator (SLM), and a second Fourier lens. In practice, the spatial location where the target test data (i.e., the test data to be analyzed) is stored within the holographic storage medium is first determined. Reference light emitted from the light source module illuminates this spatial location, causing diffraction. This diffraction carries the information of the target test data. The diffraction is transmitted to the optical analysis engine and passes directly through the first Fourier lens, the second spatial light modulator, and the second Fourier lens sequentially without any photoelectric conversion. This optical analysis engine transforms the traditional "data reading optical path" into an "integrated data reading and intelligent analysis optical path." It is understood that the optical analysis engine may include multiple parallel sub-engines, each including a first Fourier lens, a second spatial light modulator, and a second Fourier lens. Furthermore, the second spatial light modulator within each sub-engine can correspond to different analysis algorithms, enabling the optical analysis engine to analyze diffraction from different spatial locations in parallel.

[0078] Specifically, the first Fourier lens is used to perform a spatial-domain to frequency-domain transformation on the diffracted light to obtain the transformed light field; the second spatial light modulator is used to perform calculations on the transformed diffracted light passing through it to obtain the calculated light field; the second Fourier lens is used to perform a frequency-domain to spatial-domain transformation on the calculated light field to obtain the conclusion light field. The second spatial light modulator can be programmed with its own transmittance function to implement different analysis algorithms. For example, the control module can configure the transmittance function of the second spatial light modulator according to the preset analysis task requirements, making it equivalent to the corresponding analysis operator (such as convolution kernel, matched filter, weight matrix, etc.). The transmittance function can be, but is not limited to, a two-dimensional transmittance function; the analysis algorithms can include, but are not limited to, waveform anomaly detection algorithms, yield spatial pattern recognition algorithms, fault root cause localization algorithms, and test data clustering analysis algorithms. In actual operation, the transmittance function of the second spatial light modulator can be adjusted through the control module. For example, for convolution operations, the convolution theorem of Fourier transform is used to multiply the signal to be analyzed with the Fourier spectrum of the convolution kernel in the optical domain, and then the convolution result is obtained by inverse Fourier transform; for correlation recognition operations, the conjugate spectrum of the signal to be analyzed with the template signal is multiplied in the optical domain, and then the correlation peak is obtained by inverse Fourier transform.

[0079] Understandably, data addressing is performed by illuminating the spatial location of the target test data stored in the holographic storage medium with reference light. Simultaneously, the analysis process begins. The diffracted light carrying the target test data exits the holographic storage medium and, without any photoelectric conversion or electrical domain transmission, directly performs a sequence of operations in the optical analysis engine, including Fourier transform (corresponding to the first Fourier lens), spectral modulation (corresponding to the second spatial light modulator), and inverse Fourier transform (corresponding to the second Fourier lens). Since all operations in the optical path are performed at the speed of light, and the operations and readings share the same optical path, "data found" and "data analyzed" occur almost simultaneously.

[0080] The final output of this invention is a conclusion rather than data. After the photoelectric detection array receives the conclusion light field after completing the optical analysis (at this time, the spatial distribution of the light signal of the conclusion light field is no longer the encoded image of the original test data, but the encoded image of the analysis conclusion, such as the position and intensity of the correlation peak, the confidence distribution of the classification result, etc.), the above conclusion light field is converted into an electrical signal and the analysis conclusion information is directly output, instead of outputting the original test data for subsequent processing.

[0081] The detection module may include a photoelectric detection array capable of photoelectric conversion. This photoelectric detection is located at the output of the optical analysis engine. Unlike traditional photodetectors used to "read data page images," the photoelectric detection array of this invention receives the light field distribution that has already undergone optical analysis. That is, the received light intensity distribution directly corresponds to the analysis conclusions of the target test data (such as correlation peak intensity, classification confidence, anomaly score, etc.), rather than the original test data itself. It can be understood that the photoelectric conversion object of this invention changes from "data to be analyzed" to "the result of completed analysis," and the amount of electrical signals required for transmission and processing is drastically reduced from massive amounts of data to a small number of conclusions.

[0082] The control module can also analyze and transmit the conclusion electrical signal, and feed back the analysis conclusion information to the testing equipment. It can be understood that the control module is connected to the first spatial light modulator, the second spatial light modulator, and the photoelectric detection array, and is used to configure the transmittance functions of the first and second spatial light modulators, receive the conclusion electrical signal generated by the photoelectric detection array, and control the start and termination of the analysis process.

[0083] The control module also feeds back the analysis results to the automated testing equipment in real time to guide the dynamic adjustment of subsequent chip testing strategies (such as test vector optimization, adaptive adjustment of test parameters, and immediate screening of defective chips), thus realizing real-time closed-loop feedback control of chip testing.

[0084] This invention can be used to implement spatial pattern recognition of wafer yield. In practical applications, the holographic storage medium stores the spatial location and yield information of a batch of chips on the wafer. The convolution kernel frequencies corresponding to multiple known spatial patterns (such as high yield at the center, low yield at the edges, and banded anomalies) are loaded into different channels of the optical analysis engine. Reference light addresses the data page storing the yield distribution data from the holographic storage medium. Simultaneously, when the data page is located, the yield distribution information it carries enters the optical analysis engine, where convolution operations are performed in parallel with multiple pattern convolution kernels. The photoelectric detection array displays the correlation peak intensity distribution of each pattern's matching degree, directly outputting the pattern with the highest matching degree as the recognition result. Ultimately, the engineer obtains the conclusion that "the yield of this batch of wafers is lower at the edges," rather than a spreadsheet of yield data.

[0085] In one embodiment, the steps of the detection module receiving and converting the conclusion light field to obtain the conclusion electrical signal, and the control module feeding back the analysis conclusion information to the testing equipment based on the conclusion electrical signal, can be specifically implemented as follows:

[0086] Step A1: The photoelectric detection array receives the conclusion light field output by the optical analysis engine, and the conclusion light field is in the... A complex amplitude optical signal is generated at the pixel location, and the photoelectric detection array converts the complex amplitude optical signal into a complex amplitude electrical signal. subscript and These represent the row index and column index of the photoelectric detection array, respectively. The range of values ​​is to , The range of values ​​is to , and These represent the total number of rows and the total number of columns of the photoelectric detection array, respectively.

[0087] Step A2: The control module configures the center coordinates of the region of interest according to the preset analysis task requirements. and Gaussian kernel bandwidth parameters subscript Indicates the center, and These represent the row and column coordinates of the center of the region of interest on the photoelectric detection array, respectively.

[0088] Wherein, the center coordinates of the region of interest The central location of the region that needs to be focused on in the conclusion light field specified for the preset analysis task. The bandwidth parameter of the Gaussian kernel is used to adjust the radius range of the region of interest. The value is a positive integer and , and All of these are dynamically configured by the control module according to the operation type of the current preset analysis task and stored in the control module;

[0089] Step A3: The control module determines the complex amplitude electrical signal at each pixel position. The center coordinates of the region of interest and the Gaussian kernel bandwidth parameter Calculate the light field attention focusing factor of the light field in the conclusion. ;

[0090] Specifically, the light field attention focusing factor can be determined according to the following formula. :

[0091]

[0092] in, The complex amplitude electrical signal represents The square of the modulus, that is, the conclusion that the light field in the pixel The electrical signal intensity corresponding to the light intensity at a given location; For the natural constant An exponential function with base 0; the numerator of the formula is represented by the region of interest centered at 0. Centered on, with The sum of the intensity of the photoelectric signal across the entire optical field is a Gaussian weighted average of the bandwidth. The denominator of the formula represents the sum of the intensity of the photoelectric signal across the entire optical field. The optical field attention focusing factor is... It is a dimensionless scalar, and its range of values ​​is 1. When the denominator At that time, the light field attention focusing factor ;

[0093] Step A4: The control module sets the light field attention focusing factor. As part of the analysis conclusions, the information is fed back to the testing equipment through the detection module.

[0094] The working principle of the above technical solution is based on a phased collaborative framework of "optical domain analysis and electrical domain evaluation".

[0095] In the optical path stage, the optical analysis engine completes all calculations on the diffracted light within the optical domain, directly outputting a conclusion light field carrying the analysis results. The two-dimensional spatial distribution of this conclusion light field (i.e., the complex amplitude at each pixel position) corresponds to the analysis results completed within the optical domain. In the electrical domain evaluation stage, the photoelectric detection array receives the aforementioned conclusion light field and converts it into a complex amplitude electrical signal. The digital signal is presented in a digital form, where the value of each pixel is the quantized expression of the complex amplitude of the light field at that location. Based on this, the control module calculates the light field attention focusing factor according to the spatial region of interest in the preset analysis task. This is used to quantify the energy concentration of effective analytical conclusions in the light field. Finally, the control module will... As part of the analysis results, it is fed back to the testing equipment along with the conclusions.

[0096] The above technical solution brings the following beneficial effects:

[0097] This provides a quantifiable spatial quality assessment index for optical domain analysis conclusions. The above technical solution utilizes calculations... This method quantitatively describes the degree of concentration of effective information from the light field within the region of interest in the analysis, thus providing a spatial quality evaluation index to the light domain analysis conclusions. The testing equipment can then determine the reliability of the current analysis conclusions, thereby more rationally guiding adjustments to subsequent testing strategies.

[0098] This evaluation process does not add any additional data stream latency. The calculations are based on the electrical signal data output by the photodetector array during the conventional photoelectric conversion process, without requiring additional exposure, readout, or scanning operations on the optical path. The evaluation results and conclusions are acquired synchronously with the electrical signals, without increasing the serial delay of the data stream.

[0099] The above technical solution adds the dimension of conclusion credibility to the analysis conclusions fed back to the testing equipment, in addition to the content of the conclusions, thereby enhancing the information value of the system to the testing equipment.

[0100] Please see Figure 3 As shown, an embodiment of this application provides a method for intelligent analysis of near-data within holographic storage that enables storage-as-analysis. This method includes:

[0101] The test data is encoded into several two-dimensional data pages; according to the preset analysis task requirements, each two-dimensional data page is stored in the corresponding spatial location of the holographic storage medium.

[0102] Configure the optical analysis engine according to the preset analysis task requirements;

[0103] The optical analysis engine receives the diffracted light corresponding to the spatial position of the target test data within the holographic storage medium, performs calculations on the diffracted light, and outputs the conclusion light field; the diffracted light carries the target test data information.

[0104] The system receives and converts the conclusion optical field to obtain the conclusion electrical signal; based on the conclusion electrical signal, it feeds back the analysis conclusion information to the testing equipment.

[0105] The beneficial effects of the above embodiments are that the holographic storage near-data intelligent analysis method that realizes storage as analysis embeds the analysis engine into the storage read optical path, so that the "read optical path" also becomes the "analysis optical path", making the "data emission" and "conclusion generation" completely overlap in time and space, realizing the effect of "storage as analysis, reading out as conclusion", reducing the latency and energy consumption caused by photoelectric conversion and electrical domain data transmission from the architectural level.

[0106] In another embodiment, the test data is encoded into several two-dimensional data pages; according to the preset analysis task requirements, each two-dimensional data page is stored in the spatial location corresponding to the holographic storage medium, including:

[0107] The first spatial light modulator generates several two-dimensional data pages based on the test data encoding; wherein, the two-dimensional data pages correspond to two-dimensional light field distribution patterns;

[0108] The first spatial light modulator is illuminated with signal light to generate several coded light fields that correspond one-to-one with each two-dimensional data page.

[0109] According to the preset analysis task requirements, each encoded light field and reference light are simultaneously irradiated onto the corresponding spatial location of the holographic storage medium, thereby storing each two-dimensional data page into the corresponding spatial location of the holographic storage medium; wherein, the preset analysis task requirements include the operation type of the preset analysis task.

[0110] In another embodiment, the optical analysis engine is configured according to preset analysis task requirements, including:

[0111] Based on the preset analysis task requirements, configure the transmittance function of the second spatial light modulator of the optical analysis engine; wherein, the transmittance function is matched with the analysis operator of the preset analysis task.

[0112] In another embodiment, operations are performed on the diffracted light to output a conclusion light field, including:

[0113] Set the first Fourier lens and the second Fourier lens in the optical analysis engine;

[0114] The diffracted light is transformed from the spatial domain to the frequency domain using a first Fourier lens to obtain the transformed light field;

[0115] The transformed diffracted light transmitted through the second spatial light modulator is processed to obtain the resulting light field.

[0116] The calculated optical field is transformed from the frequency domain to the spatial domain by using a second Fourier lens to obtain the final optical field.

[0117] In another embodiment, the conclusion optical field is received and converted to obtain a conclusion electrical signal; based on the conclusion electrical signal, analysis conclusion information is fed back to the testing equipment, including:

[0118] The conclusion light field is received by a photoelectric detection array, and the conclusion light field is converted into a photoelectric signal to obtain the conclusion electrical signal.

[0119] The conclusion is analyzed and transmitted via electrical signals, and the analysis conclusion information is fed back to the testing equipment.

[0120] The intelligent analysis method for near data within holographic storage that realizes storage as analysis in this invention has the same operation and effect as the aforementioned intelligent analysis system for near data within holographic storage that realizes storage as analysis. Therefore, the method for intelligent analysis of near data within holographic storage that realizes storage as analysis will not be described again here.

[0121] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. This disclosure is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this disclosure is limited only by the appended claims. Thus, if these modifications and variations of the invention fall within the scope of the claims of the invention and their equivalents, the invention is also intended to include these modifications and variations.

Claims

1. A holographic storage-based intelligent data analysis system that enables storage-as-analysis, characterized in that, include: The writing module is used to encode the test data into several two-dimensional data pages; according to the preset analysis task requirements, each two-dimensional data page is stored in the corresponding spatial location of the holographic storage medium; The control module is used to configure the optical analysis engine according to the preset analysis task requirements; The optical analysis engine receives the diffracted light corresponding to the spatial position of the target test data within the holographic storage medium, performs calculations on the diffracted light, and outputs a conclusion light field; wherein, the diffracted light carries target test data information; The detection module is used to receive and convert the conclusion light field to obtain the conclusion electrical signal; The control module also feeds back the analysis conclusion information to the testing equipment based on the conclusion electrical signal.

2. The holographic storage near-data intelligent analysis system for realizing storage-as-analysis as described in claim 1, characterized in that: The writing module includes a first spatial light modulator, which generates several two-dimensional data pages based on the test data encoding; wherein, the two-dimensional data pages correspond to a two-dimensional light field distribution pattern. The first spatial light modulator is illuminated by the signal light emitted by the light source module to generate several coded light fields that correspond one-to-one with each two-dimensional data page. According to the preset analysis task requirements, each encoded light field and the reference light emitted by the light source module are simultaneously irradiated onto the spatial location corresponding to the holographic storage medium, thereby storing each two-dimensional data page into the spatial location corresponding to the holographic storage medium; wherein, the preset analysis task requirements include the operation type of the preset analysis task.

3. The holographic storage near-data intelligent analysis system for realizing storage-as-analysis as described in claim 2, characterized in that: The optical analysis engine includes a second spatial light modulator; The control module configures the transmittance function of the second spatial light modulator according to the preset analysis task requirements; wherein the transmittance function is matched with the analysis operator of the preset analysis task.

4. The holographic storage near-data intelligent analysis system for realizing storage-as-analysis as described in claim 3, characterized in that: The optical analysis engine also includes a first Fourier lens and a second Fourier lens; The first Fourier lens is used to perform spatial domain to frequency domain transformation on the diffracted light to obtain the transformed light field; The second spatial light modulator is used to perform calculations on the transformed diffracted light transmitted therethrough to obtain the calculated light field; The second Fourier lens is used to transform the optical field of the calculation result from the frequency domain to the spatial domain to obtain the conclusion optical field.

5. The holographic storage near-data intelligent analysis system for realizing storage-as-analysis as described in claim 4, characterized in that: The detection module includes a photoelectric detection array; The photoelectric detection array is used to receive the conclusion light field and perform photoelectric conversion on the conclusion light field to obtain the conclusion electrical signal; The control module analyzes and transmits the electrical signals representing the conclusions, and feeds back the analysis conclusion information to the testing equipment.

6. A method for intelligent analysis of near-data within holographic storage that enables storage-as-analysis, characterized in that, include: The test data is encoded into several two-dimensional data pages; according to the preset analysis task requirements, each two-dimensional data page is stored in the corresponding spatial location of the holographic storage medium. Configure the optical analysis engine according to the preset analysis task requirements; The optical analysis engine receives the diffracted light corresponding to the spatial position of the target test data within the holographic storage medium, performs calculations on the diffracted light, and outputs a conclusion light field; wherein, the diffracted light carries the target test data information; The conclusion optical field is received and converted to obtain the conclusion electrical signal; based on the conclusion electrical signal, the analysis conclusion information is fed back to the testing equipment.

7. The method for intelligent analysis of near-data within holographic storage as described in claim 6, characterized in that: The test data is encoded into several two-dimensional data pages; according to the preset analysis task requirements, each two-dimensional data page is stored in the corresponding spatial location of the holographic storage medium, including: A first spatial light modulator generates several two-dimensional data pages based on the test data encoding; wherein, the two-dimensional data pages correspond to two-dimensional light field distribution patterns; The first spatial light modulator is illuminated with signal light to generate several coded light fields that correspond one-to-one with each two-dimensional data page. According to the preset analysis task requirements, each encoded light field and reference light are simultaneously irradiated onto the spatial location corresponding to the holographic storage medium, thereby storing each two-dimensional data page into the spatial location corresponding to the holographic storage medium; wherein, the preset analysis task requirements include the operation type of the preset analysis task.

8. The method for intelligent analysis of near-data within holographic storage as described in claim 7, characterized in that: Configure the optical analysis engine according to the preset analysis task requirements, including: According to the preset analysis task requirements, the transmittance function of the second spatial light modulator of the optical analysis engine is configured; wherein the transmittance function is matched with the analysis operator of the preset analysis task.

9. The method for intelligent analysis of near-data within holographic storage as described in claim 8, characterized in that: Perform calculations on the diffracted light and output the resulting light field, including: A first Fourier lens and a second Fourier lens are configured in the optical analysis engine; The diffracted light is transformed from the spatial domain to the frequency domain by the first Fourier lens to obtain the transformed light field; The transformed diffracted light transmitted through the second spatial light modulator is processed to obtain the resulting light field; The calculated light field is transformed from the frequency domain to the spatial domain by the second Fourier lens to obtain the final light field.

10. The method for intelligent analysis of near-data within holographic storage as described in claim 9, characterized in that: The conclusion optical field is received and converted to obtain the conclusion electrical signal; Based on the aforementioned conclusion electrical signal, the analysis conclusion information is fed back to the testing equipment, including: The conclusion light field is received by a photoelectric detection array, and the conclusion light field is converted into a photoelectric signal to obtain the conclusion electrical signal. The electrical signals representing the conclusions are analyzed and transmitted, and the analysis results are fed back to the testing equipment.

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