Test device for conducting sensitivity test

Abstract

The utility model discloses a testing device for testing conduction sensitivity, which integrates a pulse source power supply, a pulse excitation waveform generation module, a damping sine wave generation module and a power line peak signal generation module into a whole. The controller and the test signal selection circuit are used for controlling the pulse source power supply to be connected with the pulse excitation waveform generation module, the damping sine wave generation module and the power line peak signal generation module, and controlling the modules to work and output corresponding test signals, so that pulse signals with various different waveforms can be generated; for example, rectangular waves, spike pulses and the like are used for simulating real interference signals; the test equipment is also provided with a plurality of independent output channels, interference signals can be applied to a plurality of tested equipment at the same time, an accurate time synchronization function can be realized, and synchronous output of a plurality of pulse signals is ensured, so that a real complex interference scene is better simulated, and the test precision is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of conduction sensitivity testing, in particular to a test device for conduction sensitivity testing. Background Art

[0002] Electronic equipment can be easily affected by various external interference signals in an electromagnetic environment. These interference signals can enter the equipment through power lines, signal lines, or ground lines, causing abnormal operation, misoperation, or even failure of the electronic components or circuits of the equipment. In order to ensure that electronic equipment has good anti-interference capabilities and can operate normally in a complex electromagnetic environment, it is usually necessary to conduct transmission sensitivity tests on electronic equipment. Conducted sensitivity testing is used to evaluate the sensitivity of electronic equipment to interference caused by interfering power lines, signal lines, or ground lines conducted in the external electromagnetic environment. Conducted sensitivity testing helps to ensure the reliability, stability, and safety of the equipment, and improve its adaptability and usability in the actual use of electronic equipment.

[0003] At present, there is no dedicated test device for conducting sensitivity test. Usually, a test platform for a single project is directly built. Different test platforms need to be built for different test projects. This will not only complicate the test process, but also because there are certain differences in potential and power supply voltage when building different test platforms. Therefore, the test accuracy for different test projects may be different, which may also have an adverse effect on the quality of the tested products. Utility Model Content

[0004] In order to overcome the above-mentioned deficiencies in the prior art, the purpose of the utility model is to provide a test device which can simultaneously meet the needs of a variety of different test items, has high test accuracy and unified test standards.

[0005] A test device for conducting sensitivity testing, comprising: a pulse source power supply, the pulse source power supply comprising a high-voltage power supply, an energy storage unit and a polarity switching unit, the high-voltage power supply being used to convert alternating current into high-voltage direct current and charge the energy storage unit, the energy storage unit being connected to the polarity switching unit, the polarity switching unit being used to switch the output voltage polarity of the energy storage unit; a pulse excitation waveform generating module, the pulse excitation waveform module being used to generate a pulse signal; a damped sine wave generating module, the damped sine wave generating module being used to generate a sine wave signal of a certain frequency; a power line spike signal generating module, the voltage line spike signal generating module Used to generate a power spike pulse signal; a test signal selection circuit, the input end of the test signal selection circuit is connected to the pulse source power supply, and the multiple output ends of the test signal selection circuit are respectively connected to the pulse excitation waveform generating module, the damped sine wave generating module, and the power line spike signal generating module, and the test signal selection circuit is used to control the pulse source power supply to be connected to the pulse excitation waveform generating module, the damped sine wave generating module, and the power line spike signal generating module; a controller, the controller is connected to the polarity switching unit, the test signal selection circuit, the pulse excitation waveform generating module, the damped sine wave generating module, and the power line spike signal generating module.

[0006] Preferably, the test device comprises a plurality of damped sine wave generating modules.

[0007] Preferably, the test device includes a 0.01MHz damped sine wave generating module, a 0.1MHz damped sine wave generating module, a 1MHz damped sine wave generating module, a 10MHz damped sine wave generating module, a 30MHz damped sine wave generating module and a 100MHz damped sine wave generating module.

[0008] Preferably, the pulse source power supply, pulse excitation waveform generating module, damped sine wave generating module, power line peak signal generating module, test signal selection circuit and controller are integrated in a cabinet.

[0009] Preferably, the mechanism is provided with a touch screen, and the controller is connected to the touch screen.

[0010] The above technical scheme has the following beneficial effects: the test device for conducting sensitivity test integrates a pulse source power supply, a pulse excitation waveform generating module, a damped sine wave generating module, and a power line spike signal generating module into one, and controls the pulse source power supply to be connected with the pulse excitation waveform generating module, the damped sine wave generating module, and the power line spike signal generating module through a controller and a test signal selection circuit, controls each module to output a corresponding test signal, and can generate a variety of pulse signals with different waveforms, such as rectangular waves, spike pulses, etc. to simulate real interference signals; the test equipment also has multiple independent output channels, which can apply interference signals to multiple tested devices at the same time, can realize accurate time synchronization function, and ensure the synchronous output of multiple pulse signals, so as to better simulate real complex interference scenarios and improve test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] Figure 1 The figure is a schematic diagram of the appearance structure of an embodiment of the utility model.

[0012] Figure 2 It is a structural block diagram of an embodiment of the utility model.

[0013] Component number description: 1. Cabinet; 2. Pulse excitation waveform generating module; 3. Damped sine wave generating module; 4. Power line spike signal generating module; 5. Touch screen; 6. Pulse source power supply; 7. Test signal selection circuit. DETAILED DESCRIPTION

[0014] The following is a description of the implementation of the present invention by means of specific embodiments. People familiar with the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification.

[0015] Example embodiments will now be described more fully with reference to the accompanying drawings. However, example embodiments can be implemented in a variety of forms and should not be construed as being limited to the examples set forth herein; on the contrary, these embodiments are provided so that the utility model will be more comprehensive and complete, and the concept of the example embodiments will be fully conveyed to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, many specific details are provided to provide a full understanding of the embodiments of the utility model. However, those skilled in the art will appreciate that the technical solution of the utility model can be practiced while omitting one or more of the specific details, or other methods, components, devices, steps, etc. may be adopted.

[0016] like Figure 1 , 2As shown, the utility model discloses a test device for conducting sensitivity test, which comprises: a pulse source power supply 6, a pulse excitation waveform generating module 2, a damped sine wave generating module 3, a power line spike signal generating module 4, a test signal selection circuit 7 and a controller. The above-mentioned pulse source power supply 6, pulse excitation waveform generating module 2, damped sine wave generating module 3, power line spike signal generating module 4, test signal selection circuit 7 and controller are all integrated in a cabinet 1.

[0017] The pulse source power supply 6 includes a high-voltage power supply 61, an energy storage unit 62 and a polarity switching unit 3. The high-voltage power supply 61 is used to convert AC power into high-voltage DC power and charge the energy storage unit 62. The energy storage unit 62 is set as the power supply for each module of the device, which can ensure the power demand of multiple signal generating modules. At the same time, the power supply of each module can be completely separated from the external power supply, so as to better prevent the interference signal brought by the power supply itself from affecting each signal generating module. According to the standard, when conducting high-voltage electrostatic tests, positive polarity tests and negative polarity tests need to be performed separately. By setting the polarity switching unit 63, the polarity of the power supply can be automatically switched according to the needs. The polarity switching unit 63 is used to switch the output voltage polarity of the energy storage unit.

[0018] The pulse excitation waveform module 2 is used to generate a pulse signal. The pulse excitation waveform module 2 can generate a pulse waveform with the rise time, pulse width and pulse repetition frequency specified by the standard, and is mainly used for the CS115 cable bundle injection conduction sensitivity test. The damped sine wave generating module 3 is used to generate a sine wave signal of a certain frequency. Due to the needs of different test scenarios, the damped sine wave generating module 3 can be set in multiples, including a 0.01MHz damped sine wave generating module, a 0.1MHz damped sine wave generating module, a 1MHz damped sine wave generating module, a 10MHz damped sine wave generating module, a 30MHz damped sine wave generating module and a 100MHz damped sine wave generating module, which can output damped sine waves of 0.01MHz, 0.1MHz, 1MHz, 10MHz, 30MHz and 100MHz frequency points respectively, and is mainly used for CS116 cable and power line damped sine transient conduction sensitivity test.

[0019] The voltage line spike signal generating module 4 is used to generate power spike pulse signals. The module can output three power spike pulse signals specified by standards, namely 0.15μs, 5μs, and 10μs spike signals, which are mainly used for CS106 power line spike signal conduction sensitivity test.

[0020] The test signal selection circuit 7 includes an input terminal and multiple output terminals, wherein the input terminal is connected to the pulse source power supply 6, and the multiple output terminals are respectively connected to the pulse excitation waveform generating module 2, the damped sine wave generating module 3, and the power line spike signal generating module 4. The test signal selection circuit 7 is used to control the pulse source power supply to be connected to the pulse excitation waveform generating module, the damped sine wave generating module, and the power line spike signal generating module. The controller is connected to the polarity switching unit 63, the test signal selection circuit 7, the pulse excitation waveform generating module 2, the damped sine wave generating module 3, and the power line spike signal generating module 4. The controller can control the actions of the above-mentioned unit modules respectively. For the convenience of operation, the controller is also connected to a touch screen 5, and the touch screen 5 is installed on the cabinet 1.

[0021] When the test device is in use, according to the test requirements, the controller controls the pulse source power supply 6 to connect with the above-mentioned corresponding test signal generating module. The pulse source power supply 6 can be connected to one or multiple test signal generating modules at the same time. The system determines the voltage range to be used according to the test requirements and parameter settings, and transfers the output control signal to the corresponding test signal generating module to output the corresponding transient sensitivity test waveform and meet the transient conduction sensitivity test of the test requirements.

[0022] The test device for conducting sensitivity test integrates a pulse source power supply, a pulse excitation waveform generating module, a damped sine wave generating module, and a power line spike signal generating module into one, and controls the pulse source power supply to be connected with the pulse excitation waveform generating module, the damped sine wave generating module, and the power line spike signal generating module through a controller and a test signal selection circuit, controls each module to output a corresponding test signal, and can generate a variety of pulse signals with different waveforms, such as rectangular waves, spike pulses, etc. to simulate real interference signals; the test equipment also has multiple independent output channels, which can apply interference signals to multiple tested devices at the same time, can realize accurate time synchronization function, and ensure the synchronous output of multiple pulse signals, so as to better simulate real complex interference scenarios and improve test accuracy.

[0023] The above embodiments are merely illustrative of the principles and effects of the present invention, and are not intended to limit the present invention. Anyone familiar with the technology may modify or alter the above embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or alterations made by a person of ordinary skill in the art without departing from the spirit and technical concept disclosed in the present invention shall still be covered by the claims of the present invention.

Claims

1. A test device for conducting sensitivity testing, characterized in that: It includes: A pulse source power supply, the pulse source power supply comprising a high-voltage power supply, an energy storage unit and a polarity switching unit, the high-voltage power supply is used to convert alternating current into high-voltage direct current and charge the energy storage unit, the energy storage unit is connected to the polarity switching unit, and the polarity switching unit is used to switch the output voltage polarity of the energy storage unit; A pulse excitation waveform generating module, wherein the pulse excitation waveform generating module is used to generate a pulse signal; A damped sine wave generating module, wherein the damped sine wave generating module is used to generate a sine wave signal of a certain frequency; A power line spike signal generating module, the power line spike signal generating module is used to generate a power spike pulse signal; A test signal selection circuit, wherein the input end of the test signal selection circuit is connected to the pulse source power supply, and the multiple output ends of the test signal selection circuit are respectively connected to the pulse excitation waveform generating module, the damped sine wave generating module, and the power line spike signal generating module, and the test signal selection circuit is used to control the pulse source power supply to be connected to the pulse excitation waveform generating module, the damped sine wave generating module, and the power line spike signal generating module; A controller is connected with the polarity switching unit, the test signal selection circuit, the pulse excitation waveform generation module, the damped sine wave generation module, and the power line peak signal generation module.

2. The test device for conducting sensitivity testing according to claim 1, characterized in that: The test device includes a plurality of damped sine wave generating modules.

3. The test device for conducting sensitivity testing according to claim 2, characterized in that: The test device includes a 0.01MHz damped sine wave generating module, a 0.1MHz damped sine wave generating module, a 1MHz damped sine wave generating module, a 10MHz damped sine wave generating module, a 30MHz damped sine wave generating module and a 100MHz damped sine wave generating module.

4. The test device for conducting sensitivity testing according to claim 1, characterized in that: The pulse source power supply, the pulse excitation waveform generating module, the damped sine wave generating module, the power line peak signal generating module, the test signal selecting circuit and the controller are integrated in a cabinet.

5. The test device for conducting sensitivity testing according to claim 4, characterized in that: The cabinet is provided with a touch screen, and the controller is connected to the touch screen.

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