Test circuit for pogo block pin card

Abstract

The utility model relates to a test circuit used for a pogo block pin card, comprising a PCB, the center of the PCB is connected with a product to be tested, the PCB is connected with a clock module, a power supply test module and an external connector connected with a test device, the clock module is connected with the product to be tested through a coaxial cable, the power supply test module is connected with the product to be tested, and the external connector is connected with the test device. And the to-be-tested product is connected with the test equipment through the outer connector. According to the utility model, the product test quality can be improved, and the use cost can be reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of switching structures, in particular to a test circuit for a pogo block pin card. Background Art

[0002] In today's electronic testing industry, in order to meet the needs of test functions, many test signal products need to be transferred. The existing pogoblock transfer method generally uses a soft cable to directly connect the pogoblock to the WIB board to achieve communication between the test board and the WIB board. This structure seems simple, but when there is a large relative movement between some test products and the WIB board, this structure will have many problems, such as the soft cable will be too long, and there will be interference between the soft cable and the moving part, causing the soft cable to be damaged and unable to test or inaccurate testing. If you want to avoid the above situation, you have to add some other auxiliary components, such as drag chains. This not only increases the complexity of the structure, but also auxiliary components such as drag chains also require a certain amount of space for movement and installation, which may also increase the overall size of the entire machine.

[0003] After searching, the patent: A pre-test platform based on FPGA and V93000 test machine (CN202011195229.7), including FPGA and V93000 test machine, the V93000 test machine is connected to the power module of the FPGA through the MSDPS board to power the FPGA and peripheral circuits, and the V93000 test machine is directly connected to the IO module of the FPGA through the Pogo block module; the pre-test platform also includes a BPI FLASH module, a NorFLASH module, a clock module and an SCI module; wherein the BPI FLASH module is directly connected to the FPGA to store the netlist file of the SoC chip; the NorFLASH module is connected to the FPGA after voltage conversion to store the program running file of the SoC chip; the FPGA configures the clock module through the SPI port; the SCI module realizes the control of the FPGA over the serial port reading and writing, and interconnects with other peripherals for data transmission. Among them, the test quality of the clock test module is not high.

[0004] In view of the above-mentioned defects, the designer has actively carried out research and innovation in order to create a new structure of the test circuit for the pogo block pin card, making it more valuable for industrial use. Utility Model Content

[0005] In order to solve the above technical problems, the purpose of the utility model is to provide a test circuit for a pogo block pin card.

[0006] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0007] A test circuit for a pogo block pin card includes a PCB board, a product to be tested is connected to the center of the PCB board, a clock module, a power supply test module and an external connector connected to a test device are connected to the PCB board, the clock module is connected to the product to be tested via a coaxial cable, the power supply test module is connected to the product to be tested, and the product to be tested is connected to the test device via an external connector.

[0008] Preferably, in the test circuit for a pogo block pin card, the clock module includes a crystal and an active crystal oscillator.

[0009] Preferably, in the test circuit for the pogo block pin card, the crystal is a 32.768k crystal.

[0010] Preferably, in the test circuit for a pogo block pin card, the active crystal oscillator adopts a 24 MHz active crystal oscillator.

[0011] Preferably, in the test circuit for a pogo block pin card, the external connector includes a straight connector directly connected to the test equipment, an SMA connector and a reserved hole for inserting a test lead.

[0012] By means of the above solution, the utility model has at least the following advantages:

[0013] The utility model can improve the quality of product testing and can shorten the wiring length on the PCB through the coaxial cable, thereby achieving the purpose of reducing costs.

[0014] The above description is only an overview of the technical solution of the utility model. In order to more clearly understand the technical means of the utility model and implement it according to the contents of the specification, the following is a detailed description of the preferred embodiments of the utility model in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the technical solutions of the embodiments of the utility model, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the utility model and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying creative work.

[0016] Figure 1 It is a principle block diagram of the utility model;

[0017] Figure 2It is a circuit diagram of the clock module and the external connector of the utility model;

[0018] Figure 3 It is a circuit diagram of the power supply test module of the utility model. DETAILED DESCRIPTION

[0019] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various different configurations.

[0020] Therefore, the following detailed description of the embodiments of the present application provided in the accompanying drawings is not intended to limit the scope of the present application for which protection is sought, but merely represents selected embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present application.

[0021] Example

[0022] like Figure 1 and Figure 3 As shown, a test circuit for a pogo block pin card includes a PCB board 1, a product to be tested 2 is connected to the center of the PCB board 1, a clock module 3, a power supply test module 4 and an external connector 5 connected to the test equipment are connected to the PCB board 1, the clock module 3 is connected to the product to be tested 2 through a coaxial cable, the power supply test module 4 is connected to the product to be tested, and the product to be tested 2 is connected to the test equipment through the external connector 5.

[0023] The clock module of the utility model adopts a coaxial cable to the product to be tested, which can shorten the wiring of the PCB and improve the quality of the signal, thereby improving the quality of the test.

[0024] like Figure 2 As shown, the clock module 3 includes a crystal and an active crystal oscillator. The crystal adopts a 32.768k crystal, and the active crystal oscillator adopts a 24MHz active crystal oscillator. At the same time, the external connector 5 includes a straight connector directly connected to the test equipment, an SMA connector and a reserved hole for inserting a test lead.

[0025] The test operation mode of the present invention is an existing operation known to those skilled in the art and will not be described in detail.

[0026] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0027] In the description of this application, it should be noted that the terms "vertical", "horizontal", "inside", "outside", etc. indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, or the positions or positional relationships in which the product of the application is usually placed when in use. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on this application. In addition, the terms "first", "second", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.

[0028] In addition, the terms "horizontal", "vertical" and the like do not mean that the components are required to be absolutely horizontal or vertical, but can be slightly tilted. For example, "horizontal" only means that its direction is more horizontal than "vertical", and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0029] In the description of this application, it should also be noted that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0030] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. It should be pointed out that a person skilled in the art can make several improvements and modifications without departing from the technical principle of the present invention, and these improvements and modifications should also be regarded as within the protection scope of the present invention.

Claims

1. A test circuit for a pogo block pin card, characterized in that: The invention comprises a PCB board (1), a product to be tested (2) is connected to the center of the PCB board (1), a clock module (3), a power supply test module (4) and an external connector (5) connected to a test device are connected to the PCB board (1), the clock module (3) is connected to the product to be tested (2) via a coaxial cable, the power supply test module (4) is connected to the product to be tested, and the product to be tested (2) is connected to the test device via the external connector (5).

2. A test circuit for a pogo block pin card according to claim 1, characterized in that: The clock module (3) comprises a crystal and an active crystal oscillator.

3. A test circuit for a pogo block pin card according to claim 2, characterized in that: The crystal used is a 32.768k crystal.

4. A test circuit for a pogo block pin card according to claim 2, characterized in that: The active crystal oscillator adopts a 24 MHz active crystal oscillator.

5. A test circuit for a pogo block pin card according to claim 1, characterized in that: The external connector (5) comprises a straight connector directly connected to the test equipment, an SMA connector and a reserved hole for inserting a test lead.

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