Thickness measuring device

Abstract

The utility model provides a thickness measuring device. The thickness measuring device comprises a substrate, a first probe assembly, a second probe assembly, a first sensing mechanism and a second sensing mechanism. The first probe assembly is movably arranged on the substrate along a first direction. The second probe assembly and the first probe assembly are arranged along a first direction, and the second probe assembly is movably arranged on the substrate along the first direction. The first sensing mechanism is in contact with the first probe assembly and is used for sensing the position of the first probe assembly. The second sensing mechanism is in contact with the second probe assembly and is used for sensing the position of the second probe assembly. According to the utility model, the thickness measuring device is not influenced by the positioning of the object, so that the measuring error caused by the positioning deviation of the object can be avoided, and the measuring accuracy of the thickness of the object is ensured.

Description

Technical Field

[0001] The utility model generally relates to the technical field of measuring instruments, and more specifically to a thickness measuring device. Background Art

[0002] At present, the existing thickness measurement method is to fix the product on the fixture, measure the product and the fixture positioning surface respectively, and calculate the thickness of the product by the difference between the two measurements. However, due to the deviation of the fixture positioning of the product, the measurement error will increase, resulting in insufficient measurement accuracy. Utility Model Content

[0003] A series of simplified concepts are introduced in the utility model content section, which will be further described in detail in the detailed implementation section. The utility model content section of the utility model does not mean to attempt to define the key features and essential technical features of the technical solution claimed for protection, nor does it mean to attempt to determine the scope of protection of the technical solution claimed for protection.

[0004] In order to at least partially solve the above problems, the utility model provides a thickness measuring device, the thickness measuring device comprising:

[0005] substrate;

[0006] a first probe assembly, the first probe assembly being movably disposed on the substrate along a first direction;

[0007] A second probe assembly, wherein the second probe assembly and the first probe assembly are arranged along the first direction, and the second probe assembly is movably disposed on the substrate along the first direction;

[0008] a first sensing mechanism, the first sensing mechanism being in contact with the first probe assembly and being used to sense a position of the first probe assembly; and

[0009] The second sensing mechanism is in contact with the second probe assembly and is used to sense the position of the second probe assembly.

[0010] According to the thickness measuring device of the utility model, when measuring the thickness of an object, the first probe assembly and the second probe assembly clamp the object, and then the first sensing mechanism and the second sensing mechanism respectively sense the displacement of the first probe assembly and the second probe assembly, so that the thickness of the object can be measured. Therefore, the thickness measurement of the object is calculated by the displacement of the first probe assembly and the second probe assembly, and is not affected by the positioning of the object. Therefore, the measurement error caused by the positioning deviation of the object can be avoided, thereby ensuring the accuracy of the measurement of the thickness of the object.

[0011] Optionally, the first sensing mechanism includes a first sensing end, the first sensing end is connected to the first probe assembly and is retractable along the first direction, the first sensing mechanism is configured to send an electrical signal according to a retractable stroke of the first sensing end, and the retractable stroke of the first sensing end is not less than a moving stroke of the first probe assembly relative to the substrate; and / or

[0012] The second sensing mechanism includes a second sensing end, which is connected to the second probe assembly and is retractable along the first direction. The second sensing mechanism is configured to emit an electrical signal according to the retractable stroke of the second sensing end, and the retractable stroke of the second sensing end is not less than the moving stroke of the second probe assembly relative to the substrate.

[0013] Optionally, the thickness measuring device further comprises a slide rail extending along the first direction, and the first probe assembly and the second probe assembly are both arranged on the slide rail.

[0014] Optionally, the first probe assembly includes a first moving block and a first probe, the first moving block is slidably connected to the slide rail, and the first probe is arranged on the first moving block; the second probe assembly includes a second moving block and a second probe, the second moving block is slidably connected to the slide rail, and the second probe is arranged on the second moving block.

[0015] Optionally, the thickness measuring device further comprises a detection platform, the detection platform is provided with a limit protrusion, and the limit protrusion is used for sleeve-mounting the product to be measured.

[0016] Optionally, the limiting protrusion is located above the first moving block, the limiting protrusion is provided with a through slot, the first probe extends into the through slot, and the second probe is located outside the through slot.

[0017] Optionally, the thickness measuring device also includes an elastic member, which is disposed on the substrate and connected to the first probe assembly or the second probe assembly; the elastic member is configured to apply a force to one of the first probe assembly and the second probe assembly toward the other of the first probe assembly and the second probe assembly.

[0018] Optionally, the thickness measuring device also includes an adjusting block and a fastener, the adjusting block is connected to the elastic member; the adjusting block is provided with an adjusting groove, the adjusting groove extends along the first direction, the fastener is passed through the adjusting groove to the adjusting block, the fastener is passed through the substrate and is threadedly connected to the substrate.

[0019] Optionally, the thickness measuring device further comprises a clamping mechanism, wherein the clamping mechanism is disposed on the substrate, and the clamping mechanism at least partially extends between the first probe assembly and the second probe assembly, and is used to drive the first probe assembly and the second probe assembly to move in opposite directions.

[0020] Optionally, the clamping mechanism includes a driving element, a first push block and a second push block, the driving element is arranged on the substrate, the driving element includes two driving ends, and the two driving ends are respectively connected to the first push block and the second push block; the first push block and the second push block extend between the first probe assembly and the second probe assembly, and the driving element is configured to drive the first push block and the second push block to move along the first direction. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] The following drawings of the embodiments of the present invention are used as part of the present invention for understanding the present invention. The drawings show the embodiments of the present invention and their descriptions, and are used to explain the principles of the present invention. In the drawings,

[0022] Figure 1 A three-dimensional schematic diagram of a thickness measuring device according to a preferred embodiment of the present invention;

[0023] Figure 2 for Figure 1 A top view of the thickness measuring device in FIG. 1 ; and

[0024] Figure 3 For along Figure 2 Schematic diagram of the cross section taken along the midline AA.

[0025] Description of Reference Numerals

[0026] 100: Base plate 101: Fixing block

[0027] 110: Testing table 111: Support plate

[0028] 112: Platform plate 113: Limiting bump

[0029] 114: Through slot 120: Slide rail

[0030] 121: Slider 130: First probe assembly

[0031] 131: first moving block 132: first probe

[0032] 140: second probe assembly 141: second moving block

[0033] 142: second probe 150: first sensing mechanism

[0034] 151: first sensing end 160: second sensing mechanism

[0035] 161: second sensing end 170: elastic member

[0036] 171: Adjustment block 172: Connecting column

[0037] 173: Connector 174: Adjustment slot

[0038] 122: Limit pin 180: Clamp mechanism

[0039] 181: driving element 182: first push block

[0040] 183: Second push block 190: Fastener

[0041] D1: First direction D2: Second direction DETAILED DESCRIPTION

[0042] In the following description, a large number of specific details are given to provide a more thorough understanding of the present invention. However, it is obvious to those skilled in the art that the present invention can be implemented without one or more of these details. In other examples, in order to avoid confusion with the present invention, some technical features known in the art are not described.

[0043] In this document, ordinal numbers such as "first" and "second" cited in the present invention are merely identifiers and do not have any other meanings, such as a specific order, etc. Moreover, for example, the term "first component" itself does not imply the existence of the "second component", and the term "second component" itself does not imply the existence of the "first component".

[0044] In this document, “upper”, “lower”, “front”, “back”, “left”, “right”, etc. are only used to indicate the relative position relationship between related parts, rather than to limit the absolute positions of these related parts.

[0045] In this document, “equal”, “same”, etc. are not strictly limited in a mathematical and / or geometric sense, but also include errors that can be understood by those skilled in the art and are allowed in manufacturing or use.

[0046] Unless otherwise stated, the numerical ranges herein include not only the entire range within its two endpoints but also include several sub-ranges contained therein.

[0047] Figures 1 to 3A thickness measuring device according to the utility model is shown, and the thickness measuring device includes a substrate 100, a first probe assembly 130, a second probe assembly 140, a first sensing mechanism 150, and a second sensing mechanism 160. The first probe assembly 130 is movably disposed on the substrate 100 along a first direction D1. The second probe assembly 140 and the first probe assembly 130 are arranged along the first direction D1, and the second probe assembly 140 is movably disposed on the substrate 100 along the first direction D1. The first sensing mechanism 150 contacts the first probe assembly 130 for sensing the position of the first probe assembly 130. The second sensing mechanism 160 contacts the second probe assembly 140 for sensing the position of the second probe assembly 140.

[0048] According to the thickness measuring device of the present invention, when measuring the thickness of an object, the first probe assembly 130 and the second probe assembly 140 clamp the object, and then the first sensing mechanism 150 and the second sensing mechanism 160 respectively sense the displacement of the first probe assembly 130 and the second probe assembly 140, so that the thickness of the object (the product to be measured) can be measured. Therefore, the thickness measurement of the object is calculated by the displacement of the first probe assembly 130 and the second probe assembly 140, which is not affected by the positioning of the object, so the measurement error caused by the positioning deviation of the object can be avoided, thereby ensuring the accuracy of the measurement of the thickness of the object.

[0049] Further, the thickness measuring device further includes a slide rail 120, which is fixed to the substrate 100 and extends along the first direction D1. The first probe assembly 130 and the second probe assembly 140 are both disposed on the slide rail 120, so that the first probe assembly 130 and the second probe assembly 140 can both be movable relative to the substrate 100 along the first direction D1, thereby keeping the moving directions of the first probe assembly 130 and the second probe 142 consistent.

[0050] Optionally, two sliders 121 are provided on the slide rail 120 , and both sliders 121 are slidably connected to the slide rail 120 , and the two sliders 121 are respectively connected to the first probe assembly 130 and the second probe assembly 140 , so that the first probe assembly 130 and the second probe assembly 140 are slidably installed on the slide rail 120 .

[0051] A limit pin 122 is provided at each end of the slide rail 120. When the two sliders 121 connecting the first probe assembly 130 and the second probe assembly 140 move to the end position of the slide rail 120, they will conflict with the limit pin 122, so that the two limit pins 122 at both ends of the slide rail 120 can limit the moving stroke of the first probe assembly 130 and the second probe assembly 140.

[0052] As one of the alternative solutions, four limit pins 122 may be provided corresponding to the first probe assembly 130 and the second probe assembly 140. The four limit pins 122 are arranged in pairs on both sides of the first probe assembly 130 and the second probe assembly 140, and are used to limit the movement range of the first probe assembly 130 and the second probe assembly 140 respectively.

[0053] Optionally, two fixing blocks 101 are provided on the substrate 100, and the two fixing blocks 101 are provided corresponding to the first sensing mechanism 150 and the second sensing mechanism 160. The first sensing mechanism 150 and the second sensing mechanism 160 are respectively passed through the two fixing blocks 101, and the two fixing blocks 101 are fixed to the substrate 100 by fasteners 190, thereby realizing the installation of the first sensing mechanism 150 and the second sensing mechanism 160.

[0054] Optionally, the first sensing mechanism 150 and the second sensing mechanism 160 are both telescopic displacement sensors, and the telescopic stroke of the first sensing mechanism 150 and the second sensing mechanism 160 can be optionally 12 mm. Through the arrangement of the first probe assembly 130, the first sensing mechanism 150, the second probe assembly 140 and the second sensing mechanism 160, the measuring range of the thickness measuring device can be 0 mm to 16 mm.

[0055] The first sensing mechanism 150 includes a first sensing end 151, which is connected to the first probe assembly 130 and is retractable along the first direction D1. The first sensing mechanism 150 is configured to send an electrical signal according to the retractable stroke of the first sensing end 151, and the retractable stroke of the first sensing end 151 is not less than the moving stroke of the first probe assembly 130 relative to the substrate 100. The second sensing mechanism 160 includes a second sensing end 161, which is connected to the second probe assembly 140 and is retractable along the first direction D1. The second sensing mechanism 160 is configured to send an electrical signal according to the retractable stroke of the second sensing end 161, and the retractable stroke of the second sensing end 161 is not less than the moving stroke of the second probe assembly 140 relative to the substrate 100.

[0056] When the first probe assembly 130 and the second probe assembly 140 are displaced respectively, the first sensing mechanism 150 sends an electrical signal through the telescopic stroke of the first sensing end 151, and the second sensing mechanism 160 sends an electrical signal through the telescopic stroke of the second sensing end 161, thereby sensing the displacement stroke of the first probe assembly 130 and the second probe assembly 140 respectively.

[0057] The first probe assembly 130 and the second probe assembly 140 are in contact with each other at the initial position. When actually measuring the thickness of an object, the object is clamped between the first probe assembly 130 and the second probe assembly 140. The thickness of the object can be calculated by the offset of the first probe assembly 130 relative to the initial position and the offset of the second probe assembly 140 relative to the initial position.

[0058] Furthermore, the first probe assembly 130 includes a first moving block 131 and a first probe 132, the first moving block 131 is fixed to a slider 121 on the slide rail 120, and the first probe 132 is disposed on the first moving block 131. The second probe assembly 140 includes a second moving block 141 and a second probe 142, the second moving block 141 is fixed to another slider 121 on the slide rail 120, and the second probe 142 is disposed on the second moving block 141. The first sensing end 151 of the first sensing mechanism 150 contacts the first moving block 131, and the second sensing end 161 of the second sensing mechanism 160 contacts the second moving block 141, so that the first sensing mechanism 150 and the second sensing mechanism 160 can sense the displacement stroke of the first probe 132 and the second probe 142. The first probe 132 and the second probe 142 are used to clamp the inner and outer sides of the object, so that the thickness of the object can be measured by the offset of the first probe 132 and the second probe 142. The first probe 132 is smaller in size than the first moving block 131 , and the second probe 142 is smaller in size than the second moving block 141 , which facilitates measuring the thickness of a smaller object.

[0059] The thickness measuring device also includes a test platform 110, and the test platform 110 is provided with a limiting protrusion 113, and the limiting protrusion 113 is used to cover the product to be measured, so as to limit the product to be measured, which is convenient for operation. However, since the thickness measuring device according to the utility model uses the displacement stroke of the first probe assembly 130 and the second probe assembly 140 to jointly measure the thickness of the product, the product to be measured does not need to be accurately positioned, and it will not affect the measurement of the thickness of the product to be measured. Therefore, the limiting protrusion 113 can also only play a role in roughly limiting the product to be measured. For example, there can also be a gap between the limiting protrusion 113 and the product to be measured, which greatly reduces the difficulty of measurement.

[0060] In detail, the test platform 110 includes a support plate 111, a platform plate 112 and a limiting protrusion 113. The support plate 111 is fixed to the substrate 100, the platform plate 112 is parallel to the first direction D1 and the second direction D2, and the platform plate 112 is fixed to the top of the support plate 111. The limiting protrusion 113 is fixed to the top surface of the platform plate 112, and the platform plate 112 and the support plate 111 are in an L-shaped structure, so that the first probe assembly 130 can be arranged below the limiting protrusion 113 for easy operation. The limiting protrusion 113 is provided with a through slot 114, which is connected to the bottom surface of the platform plate 112. The first probe 132 extends into the through slot 114, and the second probe 142 is spaced apart from the limiting protrusion 113 along the first direction D1. Therefore, when the product to be measured is sleeved on the limiting protrusion 113, the first probe 132 and the second probe 142 are located on the inner and outer sides of the side wall with the measured product, so that the first probe 132 and the second probe 142 can clamp the product to be measured.

[0061] Further, the thickness measuring device further includes two elastic members 170, and the two elastic members 170 are both disposed on the substrate 100. One elastic member 170 is connected to the first probe assembly 130, and the other elastic member 170 is connected to the second probe assembly 140. The elastic member 170 is configured to apply a force to one of the first probe assembly 130 and the second probe assembly 140 toward the other of the first probe assembly 130 and the second probe assembly 140, so that the first probe assembly 130 and the second probe assembly 140 are pressed together when not subject to other external forces, and no gap is left between the first probe assembly 130 and the second probe assembly 140 when measuring the product, thereby improving the accuracy of the measurement.

[0062] Optionally, the elastic member 170 may be a tension spring or an elastic pull rope.

[0063] Furthermore, the thickness measuring device further includes two adjusting blocks 171 and two fasteners 190, and the side walls of the first moving block 131 and the second moving block 141 are provided with connecting members 173, and the adjusting blocks 171 are provided with connecting posts 172. The adjusting blocks 171 are provided in a one-to-one correspondence with the elastic members 170. The first end of the elastic member 170 is connected to the connecting member 173 on the side wall of the first moving block 131 or the second moving block 141, and the second end of the elastic member 170 is connected to the connecting post 172 on the adjusting block 171. The two fasteners 190 are respectively correspondingly penetrated into the two adjusting blocks 171, thereby fixing the adjusting blocks 171 to the substrate 100, so as to have elastic force on the first probe assembly 130 and the second probe assembly 140 through the elastic member 170. The adjusting block 171 is provided with an adjusting slot 174, which extends along the first direction D1. The fastener 190 is inserted into the adjusting block 171 through the adjusting slot 174. The end of the fastener 190 is inserted into the substrate 100 and is threadedly connected with the substrate 100. When the fastener 190 is tightened, the adjusting block 171 is fixed relative to the substrate 100, and the adjusting block 171 moves relative to the fastener 190 along the first direction D1 through the adjusting slot 174, so that the position of the adjusting block 171 can be adjusted, thereby adjusting the elastic force of the elastic member 170 on the first probe assembly 130 or the second probe assembly 140.

[0064] Reference Figure 1 The thickness measuring device further includes a clamping mechanism 180, which is disposed on the substrate 100. The clamping mechanism 180 includes a portion extending at least partially between the first probe assembly 130 and the second probe assembly 140, and is used to drive the first probe assembly 130 and the second probe assembly 140 to move in the opposite direction, so that the first probe 132 and the second probe 142 are changed from the state of mutual contact at the initial position to the state of separation of the first probe 132 and the second probe 142, so as to facilitate the placement of the product to be measured. When the clamping mechanism 180 does not contact the first probe assembly 130 and the second probe assembly 140, the first probe 132 and the second probe 142 can be restored to the initial position under the action of the elastic member 170. Therefore, under the cooperation of the clamping mechanism 180 and the elastic member 170, the automatic driving of the first probe 132 and the second probe 142 can be realized, and there is no need to manually move the first probe 132 and the second probe 142, which is convenient for operation.

[0065] In detail, the clamp mechanism 180 includes a driving element 181, a first push block 182 and a second push block 183. The driving element 181 is fixed to the substrate 100. The driving element 181 includes two driving ends, and the two driving ends are respectively connected to the first push block 182 and the second push block 183. The first push block 182 and the second push block 183 extend between the first probe assembly 130 and the second probe assembly 140, and the driving element 181 is configured to drive the first push block 182 and the second push block 183 to move along the first direction D1. When the driving element 181 drives the first push block 182 and the second push block 183 to contact each other, the first push block 182 is spaced apart from the first moving block 131, and the second push block 183 is spaced apart from the second moving block 141. At this time, the first moving block 131 and the second moving block 141 are close to each other under the action of the two elastic members 170 until the first probe 132 and the second probe 142 are in contact with each other, and the first moving block 131 and the second moving block 141 are located at the initial position. When the driving element 181 drives the first pushing block 182 and the second pushing block 183 to move away from each other along the first direction D1, the first pushing block 182 pushes the first moving block 131, and the second pushing block 183 pushes the second moving block 141, so that the first probe 132 and the second probe 142 are separated, thereby facilitating the placement of the product to be measured.

[0066] Optionally, the driving element 181 is a clamping cylinder or a double-actuator linear motor, which can realize the driving of the first push block 182 and the second push block 183 .

[0067] In summary, when using the thickness measuring device according to the present invention, the first probe 132 and the second probe 142 are located at the initial position, and then the driving element 181 is started, and the first push block 182 and the second push block 183 are respectively used to drive the first movable block 131 and the second movable block 141 to move away from each other, so that the first probe 132 and the second probe 142 are spaced apart. At this time, the product to be measured is sleeved onto the limiting protrusion 113, and then the first push block 182 and the second push block 183 are driven to approach each other by the driving element 181 until the first push block 182 is separated from the first movable block 131, and the second push block 183 is separated from the second movable block 141. Under the action of the two elastic members 170, the first probe 132 and the second probe 142 are clamped on the inner and outer sides of the side wall of the product to be measured, and finally the thickness of the product is calculated by the displacement stroke of the first probe 132 and the second probe 142 relative to the initial position.

[0068] The thickness measuring device according to the utility model can be used to measure the thickness of the battery shell, can be used to measure the thickness of the battery shell rivets, and can also be used to measure other products, all of which are within the protection scope of the utility model.

[0069] Unless otherwise defined, the technical and scientific terms used herein have the same meaning as those generally understood by those skilled in the art in the technical field of the present invention. The terms used herein are only for describing specific implementation purposes and are not intended to limit the present invention. Terms such as "setting" appearing in this article may indicate that one component is directly attached to another component, or that one component is attached to another component through an intermediate. Features described in this article in one embodiment may be applied to another embodiment alone or in combination with other features, unless the feature is not applicable in the other embodiment or otherwise specified.

[0070] The utility model has been described through the above embodiments, but it should be understood that the above embodiments are only for the purpose of example and description, and are not intended to limit the utility model to the described embodiments. It can be understood by those skilled in the art that more variations and modifications can be made according to the teachings of the utility model, and these variations and modifications all fall within the scope of the protection claimed by the utility model.

Claims

1. A thickness measuring device, characterized in that: The thickness measuring device comprises: substrate; a first probe assembly, the first probe assembly being movably disposed on the substrate along a first direction; A second probe assembly, wherein the second probe assembly and the first probe assembly are arranged along the first direction, and the second probe assembly is movably disposed on the substrate along the first direction; a first sensing mechanism, the first sensing mechanism being in contact with the first probe assembly and being used to sense a position of the first probe assembly; and The second sensing mechanism is in contact with the second probe assembly and is used to sense the position of the second probe assembly.

2. The thickness measuring device according to claim 1, characterized in that: The first sensing mechanism comprises a first sensing end, the first sensing end is connected to the first probe assembly and is retractable along the first direction, the first sensing mechanism is configured to send an electrical signal according to a retractable stroke of the first sensing end, and the retractable stroke of the first sensing end is not less than a moving stroke of the first probe assembly relative to the substrate; and / or The second sensing mechanism includes a second sensing end, which is connected to the second probe assembly and is retractable along the first direction. The second sensing mechanism is configured to emit an electrical signal according to the retractable stroke of the second sensing end, and the retractable stroke of the second sensing end is not less than the moving stroke of the second probe assembly relative to the substrate.

3. The thickness measuring device according to claim 1, characterized in that: The thickness measuring device further includes a slide rail extending along the first direction, and the first probe assembly and the second probe assembly are both disposed on the slide rail.

4. The thickness measuring device according to claim 3, characterized in that: The first probe assembly includes a first moving block and a first probe, the first moving block is slidably connected to the slide rail, and the first probe is arranged on the first moving block; the second probe assembly includes a second moving block and a second probe, the second moving block is slidably connected to the slide rail, and the second probe is arranged on the second moving block.

5. The thickness measuring device according to claim 4, characterized in that: The thickness measuring device further comprises a detection platform, and the detection platform is provided with a limiting protrusion, and the limiting protrusion is used for sleeve-mounting the product to be measured.

6. The thickness measuring device according to claim 5, characterized in that: The limiting protrusion is located above the first moving block, and the limiting protrusion is provided with a through slot, the first probe extends into the through slot, and the second probe is located outside the through slot.

7. The thickness measuring device according to claim 1, characterized in that: The thickness measuring device also includes an elastic member, which is disposed on the substrate and connected to the first probe assembly or the second probe assembly; the elastic member is configured to apply a force to one of the first probe assembly and the second probe assembly toward the other of the first probe assembly and the second probe assembly.

8. The thickness measuring device according to claim 7, characterized in that: The thickness measuring device also includes an adjustment block and a fastener, wherein the adjustment block is connected to the elastic member; the adjustment block is provided with an adjustment groove, wherein the adjustment groove extends along the first direction, the fastener is passed through the adjustment groove to the adjustment block, and the fastener is passed through the substrate and is threadedly connected to the substrate.

9. The thickness measuring device according to claim 7, characterized in that: The thickness measuring device further comprises a clamping mechanism, which is disposed on the substrate and at least partially extends between the first probe assembly and the second probe assembly and is used to drive the first probe assembly and the second probe assembly to move in opposite directions.

10. The thickness measuring device according to claim 9, characterized in that: The clamping mechanism includes a driving element, a first push block and a second push block, the driving element is arranged on the substrate, the driving element includes two driving ends, and the two driving ends are respectively connected to the first push block and the second push block; the first push block and the second push block extend between the first probe assembly and the second probe assembly, and the driving element is configured to drive the first push block and the second push block to move along the first direction.

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