Off-line test equipment main-grid-free product test tool clamp

Abstract

The utility model discloses an off-line test equipment main grid-free product test work fixture, relates to the work fixture technology field, and comprises a strip-shaped clamping pedestal and two rows of probe installation hole assemblies arranged on the strip-shaped clamping pedestal along the length direction, each row of probe installation hole assemblies comprises a plurality of probe installation holes, and the probe installation holes are arranged on the strip-shaped clamping pedestal. Probe mounting holes of the two rows of probe mounting hole assemblies are arranged in a staggered manner, each probe mounting hole is internally provided with a probe mounting seat, each probe mounting seat is internally provided with a probe, and the widening silver bar assembly is in contact with the probe. According to the utility model, the problem that an off-line testing machine cannot test products without main grids (0BB) is solved, on the basis of the original testing tool clamp, a single row of probe holes are increased into double rows of probe holes, and the widened silver row assembly with the width is increased, so that the contact area with a battery piece is increased; therefore, the test of a main-grid-free (0BB) product is realized.

Description

Technical Field

[0001] The utility model relates to the technical field of tooling fixtures, and more specifically to the technical field of tooling fixtures for testing off-line testing equipment without a main grid product. Background Art

[0002] The metal electrodes on the front and back of the cell are used to conduct internal current and can be divided into the main grid (Busbar) and the sub-grid (also known as the fine grid, Finger). The main grid mainly collects the current of the sub-grid and connects it in series, while the sub-grid is used to collect photogenerated carriers. With the development of battery technology, the grid line pattern has developed from 4BB and 5BB to MBB (Multiple-Busbar, 9-15 grids) and SMBB (Super-Multiple Busbar, 16 grids and above). Increasing the number of main grids can reduce the width of the main grid, thereby reducing the consumption of silver paste. The current mainstream MBB technology is 9-12BB, that is, 9-12 main grids are printed on a single cell.

[0003] A tooling fixture is required for testing busbar products. The existing tooling fixture is a mounting base with a single row of 36 copper probe holes and a silver bus bar contact to achieve testing. This single row of probes is not suitable for testing products without busbars due to the presence of gaps. Specifically, the contact area between the single row of 36 copper probe holes and the silver bus bar is insufficient, resulting in poor conductivity of the battery cell and inability to complete the test. Therefore, the single row of 36 copper probe holes and the silver bus bar cannot be used to test products without busbars.

[0004] How to solve the problem that offline testers cannot test products without main grid has become the direction of efforts of technical personnel in this field. Utility Model Content

[0005] The purpose of the utility model is to solve the above technical problems and provide an off-line test equipment without main grid product testing fixture.

[0006] In order to achieve the above-mentioned purpose, the utility model specifically adopts the following technical solutions:

[0007] The utility model provides a main-grid-free product testing tool fixture for off-line testing equipment, comprising a strip-shaped clamping base and two rows of probe mounting hole assemblies arranged on the strip-shaped clamping base along the length direction, each row of the probe mounting hole assemblies comprises a plurality of probe mounting holes, the probe mounting holes of the two rows of the probe mounting hole assemblies are staggered, a probe mounting seat is installed in each of the probe mounting holes, a probe is installed in each of the probe mounting seats, and a widened silver row assembly in contact with the probe is also included.

[0008] Specifically, during the test, the battery cell to be tested is set between the probe and the widened silver busbar assembly. This solution solves the problem that the offline test machine cannot test busbar-free (0BB) products. Based on the original test fixture, this solution increases the single-row probe holes to double-row probe holes and increases the width of the widened silver busbar assembly, thereby increasing the contact area with the battery cell; thereby realizing the test of busbar-free (0BB) products.

[0009] The advantage of this solution is that it is more suitable for on-site testing environments, and adds the offline tester's test function for busbar-free (0BB) products. It is suitable for the HJT cell half-cell production process, and adds the offline tester's test function for busbar-free (0BB) products.

[0010] In one embodiment, any three adjacent probe mounting holes in two rows of the probe mounting hole assemblies are arranged in a triangle.

[0011] In one embodiment, the strip-shaped clamping base is made of copper, and each row of the probe mounting hole assemblies includes 36 probe mounting holes.

[0012] Specifically, a total of 72 copper probe holes are added to double rows and the silver row is widened to increase the contact area between the probes, the silver row and the battery cell; thereby enabling testing of busbar-free (0BB) products.

[0013] In one embodiment, each of the probe mounting seats is fixed in the corresponding probe mounting hole, and both ends thereof extend out of the corresponding probe mounting hole.

[0014] In one embodiment, both ends of all the probe mounting seats are aligned, one end is used to mount the corresponding probe, and the other end is sealed and designed to limit the corresponding probe.

[0015] In one embodiment, the strip-shaped clamping base is a square strip, and the strip-shaped clamping base is provided with at least one set of fixing holes, one set of conductive wire holes and one set of reserved holes. Specifically, the three sets of holes can be adjusted to their respective uses according to needs.

[0016] In one embodiment, the widened silver bar assembly is provided with at least one set of fixing holes, one set of conductive wire holes and one set of reserved holes. Specifically, the three sets of holes can be adjusted to their respective uses according to needs.

[0017] In one embodiment, the widened silver bar assembly includes a first strip plate and a second strip plate superimposed on the first strip plate along the length direction, and the first strip plate and the second strip plate have the same width and are both greater than the width of the strip-shaped clamping base.

[0018] In one embodiment, the second strip plate is located in the middle of the first strip plate, and the first strip plate and the second strip plate are formed integrally.

[0019] In one embodiment, the width of the first strip plate and the second strip plate is 5 mm.

[0020] The beneficial effects of the utility model are as follows:

[0021] 1. The utility model has a reasonable design. The battery cell to be tested is arranged on the probe and the widened silver busbar assembly. This solution solves the problem that the offline test machine cannot test the busbar-free (0BB) product. Based on the original test fixture, this solution increases the single-row probe holes to double-row probe holes and increases the width of the widened silver busbar assembly, thereby increasing the contact area with the battery cell; thereby realizing the test of the busbar-free (0BB) product.

[0022] 2. The advantage of the utility model is that it is more suitable for on-site testing environments and adds the testing function of the offline testing machine for busbar-free (0BB) products.

[0023] 3. Applicable to the half-cell production process of HJT solar cells, adding the offline tester's test function for busbar-free (0BB) products. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 It is a structural schematic diagram of the utility model;

[0025] Figure 2 It is a structural schematic diagram of a strip clamping base;

[0026] Figure 3 It is a schematic diagram of the structure of the widened silver bar assembly;

[0027] Figure numerals: 1 - strip-shaped clamping base, 2 - probe mounting base, 3 - first strip plate, 4 - second strip plate, 5 - probe mounting hole assembly. DETAILED DESCRIPTION

[0028] In order to make the purpose, technical scheme and advantages of the embodiments of the utility model clearer, the technical scheme in the embodiments of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiments of the utility model. Obviously, the described embodiments are part of the embodiments of the utility model, not all of the embodiments. Generally, the components of the embodiments of the utility model described and shown in the drawings here can be arranged and designed in various different configurations.

[0029] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the present invention to be protected, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0030] It should be noted that similar reference numerals and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further defined and explained in the subsequent drawings. In addition, the terms "first", "second", etc. are only used to distinguish the description and cannot be understood as indicating or implying relative importance.

[0031] In the description of the embodiments of the present invention, it should be noted that the terms "inside", "outside", "upper", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, or are the orientations or positional relationships in which the utility model product is usually placed when in use. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0032] Example 1

[0033] like Figures 1 to 3 As shown, this embodiment provides an off-line test equipment without a main grid product test fixture, including a strip clamping base 1 and two rows of probe mounting hole assemblies 5 arranged on the strip clamping base 1 along the length direction, each row of probe mounting hole assemblies 5 includes a plurality of probe mounting holes, the probe mounting holes of the two rows of probe mounting hole assemblies 5 are staggered, each probe mounting hole is installed with a probe mounting seat 2, each probe mounting seat 2 is installed with a probe, and also includes a widened silver row assembly in contact with the probe.

[0034] Specifically, during the test, the battery cell to be tested is set between the probe and the widened silver busbar assembly. This solution solves the problem that the offline test machine cannot test busbar-free (0BB) products. Based on the original test fixture, this solution increases the single-row probe holes to double-row probe holes and increases the width of the widened silver busbar assembly, thereby increasing the contact area with the battery cell; thereby realizing the test of busbar-free (0BB) products.

[0035] The advantage of this solution is that it is more suitable for on-site testing environments, and adds the offline tester's test function for busbar-free (0BB) products. It is suitable for the HJT cell half-cell production process, and adds the offline tester's test function for busbar-free (0BB) products.

[0036] Example 2

[0037] like Figures 1 to 3 As shown, this embodiment provides an off-line test equipment without a main grid product test fixture, including a strip clamping base 1 and two rows of probe mounting hole assemblies 5 arranged on the strip clamping base 1 along the length direction, each row of probe mounting hole assemblies 5 includes a plurality of probe mounting holes, the probe mounting holes of the two rows of probe mounting hole assemblies 5 are staggered, each probe mounting hole is installed with a probe mounting seat 2, each probe mounting seat 2 is installed with a probe, and also includes a widened silver row assembly in contact with the probe.

[0038] Any three adjacent probe mounting holes in the two rows of probe mounting hole assemblies 5 are arranged in a triangle.

[0039] The strip-shaped clamping base 1 is made of copper, and each row of probe mounting hole assemblies 5 includes 36 probe mounting holes.

[0040] Specifically, a total of 72 copper probe holes are added to double rows and the silver row is widened to increase the contact area between the probes, the silver row and the battery cell; thereby enabling testing of busbar-free (0BB) products.

[0041] Example 3

[0042] like Figures 1 to 3 As shown, this embodiment provides an off-line test equipment without a main grid product test fixture, including a strip clamping base 1 and two rows of probe mounting hole assemblies 5 arranged on the strip clamping base 1 along the length direction, each row of probe mounting hole assemblies 5 includes a plurality of probe mounting holes, the probe mounting holes of the two rows of probe mounting hole assemblies 5 are staggered, each probe mounting hole is installed with a probe mounting seat 2, each probe mounting seat 2 is installed with a probe, and also includes a widened silver row assembly in contact with the probe.

[0043] Any three adjacent probe mounting holes in the two rows of probe mounting hole assemblies 5 are arranged in a triangle.

[0044] The strip-shaped clamping base 1 is made of copper, and each row of probe mounting hole assemblies 5 includes 36 probe mounting holes.

[0045] Each probe mounting seat 2 is fixed in a corresponding probe mounting hole, and both ends thereof extend out of the corresponding probe mounting holes.

[0046] Both ends of all probe mounting seats 2 are aligned, one end of which is used to mount the corresponding probe, and the other end is sealed and designed to limit the corresponding probe.

[0047] Example 4

[0048] This embodiment is further optimized on the basis of any one of Embodiments 1 to 3, specifically:

[0049] The strip-shaped clamping base 1 is a square strip, and at least one set of fixing holes, one set of conductive wire holes and one set of reserved holes are provided on the strip-shaped clamping base 1. Specifically, the three sets of holes can be adjusted to each other's uses according to needs.

[0050] The widened silver bar assembly is provided with at least one set of fixing holes, one set of conductive wire holes and one set of reserved holes. Specifically, the three sets of holes can be adjusted to their respective uses according to needs.

[0051] The widened silver bar assembly includes a first strip plate 3 and a second strip plate 4 superimposed on the first strip plate 3 along the length direction. The first strip plate 3 and the second strip plate 4 have the same width and are both greater than the width of the strip-shaped clamping base 1 .

[0052] The second strip plate 4 is located in the middle of the first strip plate 3 , and the first strip plate 3 and the second strip plate 4 are formed in one piece.

[0053] The width of the first strip plate 3 and the second strip plate 4 is 5 mm.

Claims

1. An off-line test equipment without busbar product testing fixture, characterized in that: The invention comprises a strip-shaped clamping base (1) and two rows of probe mounting hole assemblies (5) arranged on the strip-shaped clamping base (1) along the length direction, each row of the probe mounting hole assemblies (5) comprises a plurality of probe mounting holes, the probe mounting holes of the two rows of the probe mounting hole assemblies (5) are arranged in a staggered manner, each of the probe mounting holes is installed with a probe mounting seat (2), each of the probe mounting seats (2) is installed with a probe, and also comprises a widened silver row assembly in contact with the probe.

2. The off-line test equipment without busbar product testing fixture according to claim 1 is characterized in that: Any three adjacent probe mounting holes in the two rows of probe mounting hole assemblies (5) are arranged in a triangle.

3. The off-line test equipment without busbar product testing fixture according to claim 1, characterized in that: The strip-shaped clamping base (1) is made of copper, and each row of the probe mounting hole assemblies (5) comprises 36 probe mounting holes.

4. The off-line test equipment without busbar product testing fixture according to claim 1, characterized in that: Each of the probe mounting seats (2) is fixed in the corresponding probe mounting hole, and both ends thereof extend out of the corresponding probe mounting hole.

5. The off-line test equipment without busbar product testing fixture according to claim 4 is characterized in that: All the probe mounting seats (2) are aligned at both ends, one end of which is used to mount the corresponding probe, and the other end is sealed and designed to limit the position of the corresponding probe.

6. The off-line test equipment without busbar product testing fixture according to claim 1, characterized in that: The strip-shaped clamping base (1) is a square strip, and is provided with at least one group of fixing holes, one group of conductive wire holes and one group of reserved holes.

7. The off-line test equipment without busbar product testing fixture according to claim 1, characterized in that: The widened silver bar assembly is provided with at least one group of fixing holes, one group of conductive wire holes and one group of reserved holes.

8. The off-line test equipment without busbar product testing fixture according to claim 1, characterized in that: The widened silver bar assembly comprises a first strip plate (3) and a second strip plate (4) superimposed on the first strip plate (3) along the length direction, the first strip plate (3) and the second strip plate (4) having the same width and both being greater than the width of the strip-shaped clamping base (1).

9. The off-line test equipment without busbar product testing fixture according to claim 8, characterized in that: The second strip plate (4) is located in the middle of the first strip plate (3), and the first strip plate (3) and the second strip plate (4) are formed in one piece.

10. The off-line test equipment without busbar product testing fixture according to claim 8, characterized in that: The width of the first strip plate (3) and the second strip plate (4) is 5 mm.

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