Magnetic impurity detection system

Abstract

The utility model provides a magnetic impurity detection system, which relates to the technical field of lithium battery magnetic impurity detection, and comprises a central control device, a platform device, a support device, a Raman laser device and an optical detection device, the Raman laser device and the optical detection device are both arranged on the supporting device and are connected with the platform device through the supporting device; a to-be-detected sample can be placed on the platform device, and the position of the to-be-detected sample can be moved step by step; the Raman laser device, the optical detection device and the platform device are electrically connected with the central control device. According to the utility model, the optical detection result of the optical detection device is corrected, the accurate size and quantity information of the magnetic metal impurities is finally obtained, the accuracy of the magnetic metal particle test result is greatly improved, and the problem that iron phosphide and magnetic metal particles cannot be distinguished in the existing technical scheme in the industry is solved. And the interference of the iron phosphide particles on the magnetic metal particle test result is caused.

Description

Technical Field

[0001] The utility model relates to the technical field of lithium battery magnetic impurity detection, and more specifically to a magnetic impurity detection system. Background Art

[0002] As the core energy source of modern electronic devices, lithium batteries have become the research focus in the field of battery technology due to their high energy density, long cycle life and low environmental impact. 4 As one of the positive electrode materials, lithium iron phosphate is widely used in various types of lithium batteries due to its excellent volume expansion performance, high cycle stability and high safety standards. These characteristics make lithium iron phosphate one of the most successful commercial positive electrode materials and provide an important material basis for the development of the lithium battery industry.

[0003] Although lithium iron phosphate materials have many advantages, some challenges still exist in their preparation process. In the preparation and synthesis process of lithium iron phosphate, magnetic metal impurities are inevitably generated. These impurities will not only pierce the battery separator and accelerate the self-discharge of the battery cell, but may also cause safety problems for the battery cell. Therefore, effectively controlling the content of magnetic metal impurities in lithium iron phosphate materials has become the key to improving battery performance and safety.

[0004] At present, the technology commonly used in the industry to detect magnetic metal impurities is to use magnetic rods for adsorption and combined with optical microscopy for analysis to determine the number and size of impurities. However, this method has obvious limitations. For example, iron phosphide impurities that are easily produced during high-temperature sintering will be adsorbed by magnetic rods due to their easy magnetization characteristics, thereby interfering with the test results of magnetic metal particles. This interference makes the test results of magnetic metal impurities higher and less accurate, affecting the accurate assessment of material quality.

[0005] In summary, the existing detection technology of magnetic metal impurities in lithium iron phosphate materials faces significant challenges. The presence of magnetic metal impurities not only affects the performance and safety of the battery, but the existing detection methods are also unable to accurately assess the actual situation of magnetic impurities due to the interference of iron phosphide impurities. This situation shows that developing a method that can accurately identify and quantify magnetic metal impurities in lithium iron phosphate is of great significance for improving the performance and safety of lithium batteries. Utility Model Content

[0006] In order to solve the above problems, the utility model provides a magnetic impurity detection system, comprising:

[0007] Central control device, platform device, support device, Raman laser device and optical detection device;

[0008] The Raman laser device and the optical detection device are both arranged on the supporting device, and are connected to the platform device through the supporting device;

[0009] The platform device can place a sample to be detected on it, and can step and move the position of the sample to be detected so as to correspond to the Raman laser device and the optical detection device;

[0010] The Raman laser device, the optical detection device and the platform device are all electrically connected to the central control device.

[0011] Preferably, the platform device comprises a stage frame, a moving mechanism and a sample loading mechanism;

[0012] The stage frame includes a frame body and a moving slot provided in the frame body;

[0013] The moving mechanism is arranged in the moving groove and connected to the frame body;

[0014] The sample loading mechanism is connected to the moving mechanism and can move in the moving groove based on the moving mechanism.

[0015] Preferably, the moving mechanism includes an X-axis slide rail arranged in the moving groove, and a Y-axis moving part connected to the X-axis slide rail and capable of moving along the length direction of the X-axis slide rail. The sample loading mechanism is connected to the Y-axis moving part and capable of moving along the length direction of the Y-axis moving part.

[0016] Preferably, the moving groove is a rectangular moving groove;

[0017] The moving mechanism comprises two X-direction slide rails, which are symmetrically arranged on two corresponding and parallel sides of the moving groove;

[0018] The Y-direction moving part is connected to both of the two X-direction slide rails.

[0019] Preferably, the moving mechanism further comprises a supporting portion;

[0020] The support part includes a Y-direction support rail symmetrically arranged on the inner side of the moving groove and a support cross bar respectively connected to the two Y-direction support rails;

[0021] The Y-direction support rail is perpendicular to the X-direction slide rail;

[0022] The supporting cross bar is connected to the sample loading mechanism.

[0023] Preferably, the sample loading mechanism comprises a sample loading platform, and a Y-axis connecting portion, a Y-axis moving motor and a transverse connecting portion arranged at the lower end of the sample loading platform;

[0024] The sample loading platform is connected to the Y-direction moving part through the Y-direction connecting part at the lower end, and can be driven by the Y-direction moving motor to move along the length direction of the Y-direction moving part;

[0025] The sample loading platform is connected to the supporting cross bar via the transverse connecting portion at the lower end, and can move synchronously along the length direction of the supporting cross bar when the Y-direction moving portion moves along the X-direction slide rail.

[0026] Preferably, the sample loading mechanism further comprises a material leveling module;

[0027] The material leveling module includes two outer wall X rails and two outer wall Y rails arranged around the upper end of the sample carrier, a lateral moving part connected to the two outer wall X rails, a lateral moving motor connected to the lateral moving part, a longitudinal moving part connected to the two outer wall Y rails, and a longitudinal moving motor connected to the longitudinal moving part;

[0028] Two symmetrically arranged outer wall X rails and two symmetrically arranged outer wall Y rails enclose a rectangle corresponding to the outer shape of the sample carrier;

[0029] In the vertical direction, the outer wall Y track has a spatial height higher than the outer wall X track;

[0030] The lower end of the transverse moving part is connected to a transverse bar for transversely flattening the sample to be tested;

[0031] The lower end of the longitudinal moving part is connected to a longitudinal bar for longitudinally flattening the sample to be tested;

[0032] The transverse gear bar can rotate around the transverse moving part; the longitudinal gear bar can rotate around the longitudinal moving part.

[0033] Preferably, the support device comprises a vertical bracket vertically connected to the platform device and a horizontal cantilever connected to the vertical bracket;

[0034] The Raman laser device comprises a laser transceiver mechanism disposed on the horizontal cantilever, and a spectral mechanism connected to the laser transceiver mechanism;

[0035] The optical detection device comprises an optical imaging mechanism disposed on the horizontal cantilever;

[0036] The optical imaging mechanism is electrically connected to the central control device.

[0037] Preferably, the magnetic impurity detection system further comprises an outer cover connected to the platform device and capable of placing the platform device, the supporting device, the Raman laser device and the optical detection device therein.

[0038] Preferably, the central control device includes a central processing unit, and an input module, an output module, a power supply module and a storage module, all of which are connected to the central processing unit via a bus.

[0039] The utility model provides a magnetic impurity detection system, comprising: a central control device, a platform device, a supporting device, a Raman laser device and an optical detection device; the Raman laser device and the optical detection device are both arranged on the supporting device and connected to the platform device through the supporting device; a sample to be detected can be placed on the platform device, and the position of the sample to be detected can be moved step by step so as to correspond to the Raman laser device and the optical detection device; the Raman laser device, the optical detection device and the platform device are all electrically connected to the central control device.

[0040] The utility model integrates an optical detection system and a Raman laser system into one device based on the difference in the intrinsic chemical structure of iron phosphide and magnetic metal particles, uses a Raman laser device to identify iron phosphide and magnetic metal particles, distinguishes magnetic metal particles from iron phosphide, realizes correction of the optical detection result of the optical detection device, and finally obtains accurate information on the size and quantity of magnetic metal impurities, greatly improving the accuracy of the test results of magnetic metal particles, and solving the problem that the existing technical solutions in the industry cannot distinguish between iron phosphide and magnetic metal particles, resulting in interference of iron phosphide particles with the test results of magnetic metal particles. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] Figure 1 This is a schematic diagram of the overall structure and connection relationship of the magnetic impurity detection system of the utility model;

[0042] Figure 2 A schematic diagram of the detection results obtained by the optical detection device of the magnetic impurity detection system of the utility model;

[0043] Figure 3 It is a schematic diagram of the top view of the platform device of the magnetic impurity detection system of the utility model;

[0044] Figure 4 It is a structural schematic diagram of the connection relationship and movement direction between the Y-direction moving part, the Y-direction connecting part and the lateral connecting part of the magnetic impurity detection system of the utility model;

[0045] Figure 5 It is a front view structural schematic diagram of the sample loading mechanism of the magnetic impurity detection system of the utility model;

[0046] Figure 6 It is a side view structural schematic diagram of the sample loading mechanism of the magnetic impurity detection system of the utility model;

[0047] Figure 7It is a schematic diagram of the top view of the material voucher module of the magnetic impurity detection system of the utility model;

[0048] Figure 8 It is a schematic diagram of the spatial position relationship between the transverse moving part and the longitudinal moving part of the magnetic impurity detection system of the utility model;

[0049] Fig. 9 This is a schematic diagram of the circuit connection relationship of the central control device of the magnetic impurity detection system of the utility model;

[0050] Fig.10 The figure is a schematic diagram of the flow of the magnetic impurity detection method of the utility model.

[0051] Reference numerals:

[0052] 100, magnetic impurity detection system;

[0053] 1, central control device; 11, central processing unit; 12, bus; 13, input module; 14, output module; 15, power supply module; 16, storage module; 2, platform device; 21, stage frame; 211, frame body; 212, moving slot; 22, moving mechanism; 221, X-axis slide rail; 222, Y-axis moving part; 223, supporting part; 2231, supporting crossbar; 2232, Y-axis supporting rail; 23, sample loading mechanism; 231, sample loading platform; 232, Y-axis connecting part; 233, Y-axis moving motor; 234, horizontal Connecting part; 235, material leveling module; 2351, outer wall X-rail; 2352, outer wall Y-rail; 2353, lateral moving part; 2354, lateral stop bar; 2355, lateral moving motor; 2356, longitudinal moving part; 2357, longitudinal stop bar; 2358, longitudinal moving motor; 3, supporting device; 31, vertical bracket; 32, horizontal cantilever; 4, Raman laser device; 41, laser transceiver mechanism; 42, spectral mechanism; 5, optical detection device; 51, optical imaging mechanism; 6, outer cover; 200, sample to be detected.

[0054] The purpose, features and advantages of the present invention will be further described in conjunction with the embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0055] The embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application, and cannot be understood as limiting the present application.

[0056] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0057] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of this application, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0058] In this application, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0059] In the present application, unless otherwise clearly specified and limited, a first feature being “above” or “below” a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being “above”, “above”, and “above” a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being “below”, “below”, and “below” a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0060] refer to Figure 1 The utility model provides a magnetic impurity detection system, comprising:

[0061] Central control device 1, platform device 2, support device 3, Raman laser device 4 and optical detection device 5;

[0062] The Raman laser device 4 and the optical detection device 5 are both arranged on the supporting device 3, and connected to the platform device 2 through the supporting device 3;

[0063] The platform device 2 can place a sample 200 to be detected, and can step and move the position of the sample 200 to be detected so as to correspond to the Raman laser device 4 and the optical detection device 5;

[0064] The Raman laser device 4 , the optical detection device 5 and the platform device 2 are all electrically connected to the central control device 1 .

[0065] As mentioned above, the Raman laser detection device involved in the utility model is an instrument for material analysis using the principle of Raman scattering. It identifies and analyzes the molecular structure of the material by detecting the frequency shift of the sample to the scattered light of the laser light source. Raman scattering is an inelastic scattering process of light-matter interaction, in which the incident photons interact with the sample molecules and are scattered at a frequency different from the incident light. This change in frequency (i.e., Raman shift) is closely related to the vibration mode of the molecule, and can therefore be used as a fingerprint for detecting specific molecules and compounds.

[0066] Raman laser detection devices usually include the following main parts:

[0067] Laser source: provides monochromatic light as the light source for detection. Commonly used laser wavelengths include visible light, near infrared or ultraviolet light, etc. The selected wavelength will affect the efficiency of Raman scattering and the response of the sample.

[0068] Sample Chamber: The location where the sample to be tested is placed. The sample can be solid, liquid or gas.

[0069] Optical system: includes lenses and filters, which are used to focus the laser onto the sample and collect the light scattered by the sample, while filtering out unwanted light frequencies and retaining only the Raman scattered light.

[0070] Spectrometer: used to analyze the frequency distribution of the collected scattered light. The spectrometer can decompose the scattered light into different frequency components to obtain the Raman spectrum.

[0071] Detector: Converts the light signal analyzed by the spectrometer into an electrical signal, usually using a charge coupled device (CCD) or a photomultiplier tube (PMT).

[0072] Data processing system: used to receive the electrical signal from the detector and convert it into a visual Raman spectrum. By analyzing these spectra, the molecular composition and structural information in the sample can be identified.

[0073] Raman laser detection devices are widely used in many fields such as materials science, chemistry, biomedicine, and environmental monitoring due to their non-destructiveness, high sensitivity, and ability to be used for a variety of sample analyses (without special preparation), as well as the ability to provide detailed molecular structure information. Through Raman spectroscopy, researchers can obtain important information about the chemical composition, molecular structure, crystal morphology, and intermolecular interactions of materials.

[0074] In the present invention, the optical detection device 5 is an optical detection device (such as JOMESA HFD) that uses an optical method to detect and distinguish magnetic particles, and its working principle is based on the difference in light reflection characteristics between magnetic particles and non-magnetic particles (such as carbon materials). This device is similar to a microscope, but it is specially configured with an optical system for identifying magnetic particles, such as a light source of a specific wavelength and a corresponding detection system to distinguish between reflective magnetic particles and non-reflective non-magnetic particles.

[0075] It should be noted that when the optical detection device 5 is used to perform detection based on an optical method, reference Figure 2 In the partial fragment of the detection result, it can be seen in the field of view of the obtained sample that some areas are bright and some areas are dark. This is because the focusing plane is inconsistent. Each particle has a certain three-dimensional structure, and the point on its focal plane is bright. If the focus point is changed, other positions of the particle will also light up. Therefore, when the optical detection device 5 performs detection, a judgment can be made based on the result. The main particles with reflective bright spots are magnetic particles.

[0076] In the present technology, the optical detection device 5 provides preliminary magnetic impurity detection results, while the Raman laser device 4 provides molecular-level precision verification for these results, ensuring the accuracy and reliability of the detection results.

[0077] In the present invention, the Raman laser device 4 is used, mainly because the unique ability of Raman laser detection is used to distinguish between iron phosphide and magnetic metal impurities, which may be difficult to distinguish in optical detection. Raman spectroscopy is based on the Raman effect, that is, when light is irradiated onto a material, most of the light will be scattered at the same frequency, while a small part of the light will undergo energy transfer due to interaction with molecular vibration or rotation, resulting in a change in the frequency of the scattered light. This frequency change is specific to different chemical substances, so it can be used to identify the molecular structure of the material. Magnetic metal particles usually do not produce Raman scattering signals, while iron phosphide, as a substance with a molecular structure, will produce a specific Raman response signal, allowing it to be detected and identified by the Raman laser device 4.

[0078] The Raman laser device 4 is used to correct the detection results of the optical detection device 5 by accurately distinguishing whether the particles detected by the optical system are iron phosphide or magnetic metal impurities. Optical detection systems, such as microscopes or other imaging devices, can provide information about the number, size and morphology of particles in the sample, but they may not be able to distinguish between iron phosphide and magnetic metal impurities. By coupling the Raman laser detection system with the optical detection system, the molecular structure information provided by the Raman spectrum can be used to verify and correct the results of the optical detection, thereby obtaining more accurate information on the number and size of magnetic metal impurities.

[0079] As mentioned above, the central control device 1 may be a desktop computer, a laptop computer, a tablet computer, a smart mobile device, such as a mobile phone, a notebook, an e-reader, etc., which has a certain computing capability and a device capable of installing an operating system that controls the system.

[0080] As mentioned above, the platform device 2 can place the sample 200 to be detected, and during the detection process, adjust the position of the sample 200 to be detected, and realize data collection and analysis of particles in the sample 200 to be detected by step adjustment.

[0081] As mentioned above, the supporting device 3 can fix and suspend the Raman laser device 4 and the optical detection device 5 above the platform device 2 based on the platform device 2, so that they can correspond to the position of the sample 200 to be detected and provide stable support.

[0082] In summary, based on the difference in the intrinsic chemical structure of iron phosphide and magnetic metal particles, the utility model integrates the optical detection system and the Raman laser system into one device, uses the Raman laser device 4 to identify iron phosphide and magnetic metal particles, distinguishes the magnetic metal particles from iron phosphide, and realizes the correction of the optical detection result of the optical detection device 5, and finally obtains the accurate size and quantity information of the magnetic metal impurities, converts the quantitative information into qualitative results to eliminate interference, greatly improves the accuracy of the magnetic metal particle test results, and solves the problem that the existing technical solutions in the industry cannot distinguish between iron phosphide and magnetic metal particles, resulting in the interference of iron phosphide particles on the magnetic metal particle test results.

[0083] For further reference, Figure 3 , the platform device 2 includes a stage frame 21, a moving mechanism 22 and a sample loading mechanism 23;

[0084] The stage frame 21 includes a frame body 211 and a moving slot 212 provided in the frame body 211;

[0085] The moving mechanism 22 is disposed in the moving groove 212 and connected to the frame body 211;

[0086] The sample loading mechanism 23 is connected to the moving mechanism 22 and can move in the moving groove 212 based on the moving mechanism 22 .

[0087] As mentioned above, the stage frame 21 is a frame structure, in which a moving groove 212 is provided. The groove can be a hollow groove, or a region recessed downward from the top of the stage frame 21 , and the region is used to place the moving mechanism 22 and the sample loading mechanism 23 .

[0088] As mentioned above, the moving mechanism 22 is disposed in the moving groove 212;

[0089] The sample loading mechanism 23 is used to place the sample 200 to be detected, and the sample loading mechanism 23 is connected to the moving mechanism 22, and can move within the corresponding area in the moving groove 212 under the control of the moving mechanism 22, and adjust to the position corresponding to the Raman laser device 4 and the optical detection device 5 to perform corresponding detection.

[0090] Furthermore, the moving mechanism 22 includes an X-direction slide rail 221 disposed in the moving groove 212, and a Y-direction moving portion 222 connected to the X-direction slide rail 221 and capable of moving along the length direction of the X-direction slide rail 221 (see Figure 4 ), the sample loading mechanism 23 is connected to the Y-direction moving portion 222 and can move along the length direction of the Y-direction moving portion 222.

[0091] As mentioned above, in order to achieve adjustable positions of the sample loading mechanism 23 in the horizontal direction and to move and adjust during the detection process, the present invention adopts X and Y direction movement methods, wherein the moving mechanism 22 includes an X-direction slide rail 221 and a Y-direction moving part 222, both of which are arranged in the moving groove 212.

[0092] As mentioned above, the Y-direction moving part 222 is connected to the X-direction slide rail 221 and can move along the X-direction slide rail 221;

[0093] Then, the Y-moving part 222 is connected to the sample loading mechanism 23, and the sample loading mechanism 23 can move along the length direction of the Y-moving part 222. Thus, the sample loading mechanism 23 can be moved arbitrarily in the X and Y directions through the Y-moving part 222 and the X-slide rail 221, thereby improving the detection efficiency and accuracy.

[0094] It should be noted that in the present technology, the reason why the sample needs to be moved step by step is to ensure that the Raman laser device 4 and the optical detection device 5 can comprehensively and accurately analyze and detect the magnetic impurities on the sample. The step-by-step movement allows the system to scan the entire sample surface step by step and systematically, thereby ensuring that every part can be detected without omission. This method is particularly important for accurately locating and identifying the distribution of tiny particles, because these particles may be unevenly distributed and vary in number and size.

[0095] By moving step by step, every part of the sample can be carefully inspected and analyzed. This is very important to ensure the integrity and representativeness of the data, especially when the overall quality or impurity distribution of the sample needs to be evaluated.

[0096] When performing detailed analysis of the sample, the step-by-step movement enables the Raman laser device 4 and the optical detection device 5 to observe and record data at a finer scale. This allows for higher resolution images and spectral data to be obtained, improving the understanding of impurity characteristics (such as size, shape and chemical composition).

[0097] For specific particles, such as magnetic metal impurities and iron phosphide, precise location and identification is required. The step-by-step movement allows the system to locate each detected particle and then analyze it in detail with the Raman laser, ensuring that different types of impurities can be distinguished.

[0098] Through step-by-step scanning, data from different parts can be systematically collected and integrated to form a comprehensive understanding of the overall condition of the sample. This is very useful for evaluating sample quality, determining impurity distribution patterns, and optimizing manufacturing processes.

[0099] In summary, in this technology, the step-by-step movement of the sample is essential to ensure that the Raman laser device 4 and the optical detection device 5 can efficiently and accurately detect impurities. This method improves the comprehensiveness and accuracy of the detection, thereby being able to more effectively evaluate and control the magnetic impurities in the lithium iron phosphate material and ensure the performance and safety of the battery product.

[0100] Furthermore, the moving groove 212 is a rectangular moving groove 212;

[0101] The moving mechanism 22 includes two X-direction slide rails 221, which are symmetrically arranged on two corresponding and parallel sides of the moving groove 212;

[0102] The Y-direction moving portion 222 is connected to both of the two X-direction slide rails 221 .

[0103] The moving groove 212 is a rectangular groove. Two X-direction slide rails 221 are symmetrically arranged in the X direction of the rectangle. A Y-direction moving part 222 is arranged between the two X-direction slide rails 221. The Y-direction moving part 222 can be one or more.

[0104] Furthermore, the moving mechanism 22 also includes a supporting portion 223;

[0105] The support portion 223 includes a Y-direction support rail 2232 symmetrically arranged inside the moving groove 212 and a support cross bar 2231 respectively connected to the two Y-direction support rails 2232;

[0106] The Y-direction support rail 2232 is perpendicular to the X-direction slide rail 221;

[0107] The supporting cross bar 2231 is connected to the sample loading mechanism 23 .

[0108] It should be noted that when the Y-moving portion 222 moves along the X-moving rail 221, the middle sample loading mechanism 23 is connected to the Y-moving portion 222, and is equivalent to being suspended on the Y-moving portion 222, and is provided with support force by the X-moving rails 221 at both ends. At this time, if the system as a whole or the desktop on which the system is placed vibrates or shakes, it is very likely to cause the Y-moving portion 222 to shake synchronously.

[0109] For Raman laser detection and optical detection, the vibration or poor stability of the sample does have a significant impact on the detection accuracy. This impact is mainly based on the following reasons:

[0110] Raman laser detection

[0111] Focus shift: Raman spectroscopy relies on precise alignment of the laser focus with the sample to ensure that spectral data is collected from a specific area. Slight vibrations or instabilities in the sample may cause the laser focus to deviate from the target area, thereby reducing the intensity of the signal or capturing the wrong signal, affecting the accuracy and reliability of the results.

[0112] Signal-to-noise ratio: Sample vibration increases background noise and reduces the signal-to-noise ratio (SNR). In Raman spectroscopy, a high signal-to-noise ratio is key to obtaining clear, reliable spectral data. Signal quality degradation caused by vibration makes spectral interpretation more difficult and affects the accuracy of the analysis results.

[0113] Optical Inspection

[0114] Image blur: In optical inspection, such as using a microscope for sample observation and analysis, sample stability is critical to obtaining a clear image. Shaking or vibration of the sample will cause image blur, affecting analysts' identification and measurement of sample features.

[0115] Measurement Errors: For situations where precise measurement of sample characteristics is required, such as particle size, morphology, etc., any movement of the sample will directly affect the accuracy of the measurement. When performing size measurements or particle counting, sample instability can lead to significant measurement errors.

[0116] Many application scenarios, such as materials science, chemical analysis, and biomedical research, have extremely high requirements for the accuracy of test results. Even a small error may lead to unreliable results. Experimental reproducibility is an important aspect of scientific research. Poor sample stability will lead to poor data reproducibility, affecting the validity of experimental results. Sample instability may require repeated measurements to obtain reliable data, which not only increases the time and cost of analysis, but may also cause sample damage due to repeated operations.

[0117] Therefore, ensuring the stability of samples during Raman laser detection and optical detection is of vital importance to ensuring detection accuracy, improving analysis efficiency and ensuring data reliability.

[0118] In the utility model, in the moving mechanism 22, in addition to the X-axis slide rail 221 and the Y-axis moving part 222 controlling the movement of the sample loading mechanism 23, a support part 223 is also provided. Therefore, during the movement of the sample loading mechanism 23, it is not simply connected to the Y-axis moving part 222 and suspended between the two X-axis slide rails 221, resulting in insufficient stability. Instead, the support part 223 provides support through the Y-axis support rail 2232 during the movement of the sample loading mechanism 23.

[0119] The advantages of improving the stability of samples under test when using Raman laser and optical detection are:

[0120] By introducing the support part 223, including the Y-direction support rail 2232 and the support crossbar 2231, this design enables the sample loading mechanism 23 to obtain additional support during the movement in the X-direction and the Y-direction. This structure not only balances the weight of the sample loading mechanism 23, but also reduces the vibration and deviation that may occur during the movement, thereby improving the stability of the entire detection system.

[0121] The design of the support portion 223 allows for more precise position control of the sample loading mechanism 23. When performing Raman laser and optical detection, accurate positioning of the sample to be detected is particularly critical, because even a slight position deviation may lead to inaccurate detection results. The coordination of the Y-axis support rail 2232 and the support crossbar 2231 ensures the positioning accuracy of the sample during the entire detection process.

[0122] For samples with complex shapes or different sizes, stable and precise support and positioning are particularly important. This technology provides a sturdy support structure that allows the system to adapt to a variety of different types of samples, regardless of weight, shape or material, while maintaining good stability and accuracy.

[0123] During Raman laser and optical detection, any errors caused by sample movement or vibration will affect the accuracy of the detection results. By enhancing the structural stability of the system, these errors can be greatly reduced, thereby improving the reliability of the data.

[0124] The stable sample positioning and movement mechanism allows for a smoother detection process without the need for frequent adjustment or repositioning of samples. This not only improves detection efficiency, but also reduces operational complexity, making the detection process more user-friendly.

[0125] When performing multi-point or full-scan inspections, the improved stability makes the data collected from different positions more consistent, facilitating data integration and analysis. This is particularly important for applications that require highly accurate and comprehensive analysis, such as in materials science, nanotechnology and other fields.

[0126] In summary, the technology of the support part 223 provided in the utility model significantly improves the stability of the sample to be detected during Raman laser and optical detection through its unique structural design, thereby ensuring high accuracy and high reliability of the detection results. This technical advantage is of great significance for improving the efficiency and accuracy of magnetic impurity detection.

[0127] For further reference, Figure 5 (front view) and Figure 6 (Side view), the sample loading mechanism 23 includes a sample loading platform 231, and a Y-direction connecting portion 232, a Y-direction moving motor 233 and a lateral connecting portion 234 provided at the lower end of the sample loading platform 231;

[0128] The sample loading platform 231 is connected to the Y-direction moving part 222 via the Y-direction connecting part 232 at the lower end, and can be driven by the Y-direction moving motor 233 to move along the length direction of the Y-direction moving part 222;

[0129] The sample loading platform 231 is connected to the supporting cross bar 2231 via the transverse connecting portion 234 at the lower end, and can be synchronously moved along the length direction of the supporting cross bar 2231 when the Y-direction moving portion 222 moves along the X-direction slide rail 221 .

[0130] For further reference, Figure 7 , the sample loading mechanism 23 also includes a material leveling module 235;

[0131] The material leveling module 235 includes two outer wall X-rails 2351 and two outer wall Y-rails 2352 arranged around the upper end of the sample loading platform 231, a transverse moving part 2353 connected to the two outer wall X-rails 2351, a transverse moving motor 2355 connected to the transverse moving part 2353, a longitudinal moving part 2356 connected to the two outer wall Y-rails 2352, and a longitudinal moving motor 2358 connected to the longitudinal moving part 2356;

[0132] The two symmetrically arranged outer wall X rails 2351 and the two symmetrically arranged outer wall Y rails 2352 enclose a rectangle corresponding to the outer shape of the sample carrier 231;

[0133] In the vertical direction, the outer wall Y rail 2352 has a spatial height higher than the outer wall X rail 2351;

[0134] The lower end of the transverse moving part 2353 is connected to a transverse stop bar 2354 for transversely flattening the sample 200 to be tested;

[0135] The lower end of the longitudinal moving part 2356 is connected to a longitudinal stop bar 2357 for longitudinally flattening the sample 200 to be tested;

[0136] The transverse bar 2354 can rotate around the transverse moving portion 2353 ; the longitudinal bar 2357 can rotate around the longitudinal moving portion 2356 .

[0137] As mentioned above, the transverse baffle 2354 and the longitudinal baffle 2357 are both made of non-magnetic materials, such as rubber, polytetrafluoroethylene, glass, acrylic, quartz, etc.

[0138] It should be noted that when performing Raman laser testing and optical testing, the preparation and placement of samples have a significant impact on the test results. Especially in the detection of granular materials, such as the identification and detection of magnetic impurities, the stacking and distribution of samples is a key factor. Specific influencing factors may include the following aspects:

[0139] Signal interference and coverage: In Raman laser detection, if sample particles are stacked together, the signals between them may interfere with each other, especially when the detected signal comes from multiple layers of particles, the signal of the bottom layer of particles may be blocked or absorbed by the upper layer of particles, resulting in inaccurate detection signals. When the sample is spread out, each particle can independently receive the laser and send out a signal, reducing signal interference and coverage and improving detection accuracy.

[0140] Uniformity of sample characteristics: In optical detection, the accumulation of samples may lead to uneven light distribution and affect the image quality. Areas where particles are stacked may cause errors in image analysis due to shadows or reflections, while flattened samples can ensure uniform light exposure and improve the accuracy of image analysis.

[0141] Thermal effect: In Raman detection, laser irradiation may cause local heating of the sample. If the particles are stacked, the accumulation of heat may affect the Raman signal of some particles and even change the chemical structure of the sample. Laying the sample flat helps to disperse the heat and reduce the detection error caused by thermal effect.

[0142] Detection efficiency and operability

[0143] Convenience of sample processing: Tiled samples are easy to handle and analyze, and can quickly and accurately locate the area of ​​interest for testing. Stacked samples may require additional time to separate or select the appropriate test point.

[0144] Improve inspection speed: For samples placed flat, automated scanning and data collection processes are simpler and faster. Stacked samples may require multiple focus adjustments or repositioning, affecting inspection efficiency.

[0145] Considering the principle and operability, laying out the granular samples for Raman laser detection and optical detection can significantly improve the accuracy, efficiency and reliability of detection. The laid-out samples ensure that each particle can be detected independently, reducing signal interference and improving the accuracy of data analysis. It is the preferred method for high-quality magnetic impurity identification and detection.

[0146] In the present invention, a material leveling module 235 is provided on the sample loading mechanism 23. The material leveling module 235 is provided directly above the sample loading platform 231 and faces the direction of the Raman laser device 4 and the optical detection device 5.

[0147] The sample carrier 231 is rectangular, and correspondingly, two outer wall X-rails 2351 and two outer wall Y-rails 2352 are respectively arranged around the top of the sample carrier 231 to enclose the sample carrier 231 in the middle.

[0148] The two outer wall X rails 2351 are symmetrically arranged in the X-axis direction. Similarly, the two outer wall Y rails 2352 are symmetrically arranged in the Y-axis direction, and together form a rectangular area.

[0149] As mentioned above, a transverse moving part 2353 is connected between the two outer wall X-rails 2351 , and the transverse moving part 2353 is connected to a transverse moving motor 2355 . Driven by the transverse moving motor 2355 , the transverse moving part 2353 can move transversely between the two outer wall X-rails 2351 .

[0150] As mentioned above, a longitudinal moving part 2356 is connected between the two outer wall Y rails 2352 , and the longitudinal moving part 2356 is connected to a longitudinal moving motor 2358 . Driven by the longitudinal moving motor 2358 , the longitudinal moving part 2356 can move longitudinally between the two outer wall Y rails 2352 .

[0151] refer to Figure 8 In order to avoid conflict between the longitudinal moving part 2356 and the transverse moving part 2353 during movement, in the vertical direction, equivalent to the Z-axis direction, the spatial height of the outer wall Y-rail 2352 is higher than the outer wall X-rail 2351, resulting in the longitudinal moving part 2356 being higher than the transverse moving part 2353 in the spatial Z-axis direction. When moving, the two can move simultaneously or one after another without affecting each other.

[0152] The lower end of the transverse moving part 2353 is connected to a transverse bar 2354, and the longitudinal moving part 2356 is connected to a longitudinal bar 2357. Since the position of the longitudinal moving part 2356 is higher than that of the transverse moving part 2353, in order to be able to flatten the sample to be tested through the longitudinal bar 2357, the longitudinal bar 2357 needs to be appropriately longer than the length of the transverse bar 2354 in the Z-axis direction.

[0153] In addition, since the longitudinal bar 2357 and the transverse bar 2354 both have a certain length, in order to avoid conflict, the longitudinal bar 2357 and the transverse bar 2354 can rotate around the axis along the longitudinal moving part 2356 and the transverse moving part 2353, so that the current position can be adjusted. When no work is needed, it is only necessary to lift the transverse bar 2354 and / or the longitudinal bar 2357. When any one of them is needed to operate, the bar is dropped to contact the sample 200 to be tested for flattening.

[0154] In addition, in the utility model, the transverse moving part 2353 and the longitudinal moving part 2356 are used to control the transverse bar 2354 and the longitudinal bar 2357 to automatically spread the sample 200 to be tested by moving. On the one hand, the sample can be spread efficiently to improve the accuracy of the test. On the other hand, the problems of pollution and sample loss caused by manual operation are avoided.

[0155] Further, the support device 3 includes a vertical bracket 31 vertically connected to the platform device 2 and a horizontal cantilever 32 connected to the vertical bracket 31;

[0156] The Raman laser device 4 includes a laser transceiver mechanism 41 disposed on the horizontal cantilever 32, and a spectral mechanism 42 connected to the laser transceiver mechanism 41;

[0157] The optical detection device 5 includes an optical imaging mechanism 51 disposed on the horizontal cantilever 32;

[0158] The optical imaging mechanism 51 is electrically connected to the central control device 1 .

[0159] Furthermore, the magnetic impurity detection system also includes an outer cover 6 connected to the platform device 2 and capable of placing the platform device 2, the supporting device 3, the Raman laser device 4 and the optical detection device 5 therein.

[0160] As mentioned above, the outer cover 6 structure is introduced into the magnetic impurity detection system, and the platform device 2, the support device 3, the Raman laser device 4 and the optical detection device 5 of the sample 200 to be detected are all placed inside it, mainly based on the following advantages:

[0161] External light, especially direct sunlight or strong artificial light, may significantly interfere with Raman laser detection and optical detection results. Raman spectroscopy relies on the scattering spectrum of a sample to a laser of a specific wavelength, and interference from external light may increase background noise, reduce the signal-to-noise ratio, and affect the detection and analysis accuracy of Raman signals. Similarly, in optical detection, changes in external light may affect the quality and accuracy of imaging. The use of an outer cover 6 can effectively isolate external light, ensure the stability of the lighting conditions in the detection environment, and improve the accuracy and repeatability of detection data.

[0162] The outer cover 6 also helps maintain the stability of the test environment, such as the control of temperature, humidity and air flow. Fluctuations in environmental conditions may affect the state of the sample and the performance of the test equipment. For example, changes in temperature and humidity may affect the chemical and physical state of the sample, and air flow may introduce dust or other contaminants that interfere with the test process. The outer cover 6 provides a physical isolation that reduces the potential impact of environmental factors on the test results.

[0163] The use of the outer cover 6 can also enhance the safety of the operator, especially when using the Raman laser device 4. The laser may be harmful to the human eyes and skin, and the outer cover 6 can prevent the laser from leaking and protect the operator from laser radiation. In addition, the outer cover 6 also protects the internal equipment from dust, pollution and mechanical damage, thereby extending the service life of the equipment.

[0164] The outer cover 6 provides a relatively closed environment for the sample, reducing direct contact between the sample and the outside world, thereby reducing the risk of the sample being contaminated by dust or pollutants, and ensuring the purity and reliability of the test results.

[0165] If the outer cover 6 is missing, the sample is exposed to external light during detection, which may cause interference to the detection signal. Especially in Raman spectroscopy analysis, external light may increase the signal background noise, reducing the accuracy of signal recognition and analysis. In addition, the sample is more susceptible to environmental factors and pollutants, further reducing the accuracy and reliability of detection.

[0166] Therefore, the use of the outer cover 6 is an important design consideration to ensure the detection accuracy and result reliability of the magnetic impurity detection system.

[0167] For further reference, Fig. 9 The central control device 1 includes a central processing unit 11, and an input module 13, an output module 14, a power supply module 15 and a storage module 16 which are all connected to the central processing unit 11 through a bus 12.

[0168] As mentioned above, the central processing unit 11 is the CPU, and the bus 12 is the motherboard; the input module 13 can be a device related to input control, for example, it can be a keyboard, mouse, joystick, button, rocker, knob, toggle switch, etc.; the output device can be a display, display screen, touch screen, speaker, instrument, etc. for displaying relevant information; the power supply module 15 can be direct current or alternating current, for example, directly connected to a lithium-ion battery; the storage module 16 can include but is not limited to a solid-state hard drive, a mechanical hard drive, a storage card, a memory card, a network disk, and related storage space in a cloud server, etc.

[0169] In addition, the central control device 1 may be provided with a network module, such as a network adapter, which can be connected to the Internet via a wired or wireless method, and can acquire data and perform control via a mobile smart device.

[0170] In the utility model, all the movable devices used can be provided with corresponding motor drives, and the motors are connected to the central processing unit 11 through the bus 12 so as to move under the control of the central processing unit 11.

[0171] In addition, reference Fig.10 , the utility model also provides a magnetic impurity detection method, using the magnetic impurity detection system as described above;

[0172] The magnetic impurity detection method comprises:

[0173] Step S1, using a magnetic bar to absorb and process and obtain a lithium iron phosphate sample as a sample to be tested 200;

[0174] Step S2, placing the sample 200 to be tested on the platform device 2 of the magnetic impurity detection system;

[0175] Step S3, using the optical detection device 5 and the Raman laser device 4 to detect the sample 200 to be detected, and obtaining detection data;

[0176] Step S4, obtaining the number of magnetic metal particles corresponding to the sample 200 to be detected according to the detection data.

[0177] The above-mentioned magnetic impurity detection method first uses a magnetic rod to adsorb and treat the lithium iron phosphate sample to obtain a sample 200 to be detected, and then performs an optical system analysis on the sample 200 to be detected to obtain information such as the number and size of the magnetic impurities in the material; then uses a Raman laser system to identify the impurity particles and distinguish between iron phosphide and magnetic metal particles; finally, the optical system results are analyzed based on the results of the Raman laser system to obtain accurate magnetic metal particle information, that is, the number of magnetic metal particles corresponding to the sample 200 to be detected.

[0178] Furthermore, the step S3, using the optical detection device 5 and the Raman laser device 4 to detect the sample 200 to be detected and obtain detection data, includes:

[0179] Step S31, focusing and testing the sample 200 to be tested by using the optical detection device 5, and obtaining the number of magnetic impurities corresponding to the sample 200 to be tested;

[0180] Step S32, using the Raman laser device 4 to focus and test the sample 200 to be detected, and obtaining the number of iron phosphide particles corresponding to the sample 200 to be detected;

[0181] Step S33, taking the number of magnetic impurities and the number of iron phosphide particles as the detection data.

[0182] In the above-mentioned steps, step S31 and step S32, any one of the two steps can be detected first.

[0183] Furthermore, the step S4, obtaining the number of magnetic metal particles corresponding to the sample to be tested 200 according to the test data, includes:

[0184] Step S41, calculating the number of magnetic metal particles in the sample 200 to be tested according to the following formula:

[0185] A 2 =A 0 -A 1 ;

[0186] Among them, A 2 A represents the number of magnetic metal particles in the sample to be tested; 0 Represents the amount of magnetic impurities; A 1Represents the number of iron phosphide particles.

[0187] Furthermore, the step S1, using a magnetic bar to adsorb and process and obtain a lithium iron phosphate sample as a sample to be tested 200, includes:

[0188] Step S11, taking lithium iron phosphate raw materials, putting them into a container and a magnetic bar, and mixing them using a mixer;

[0189] Step S12, taking out the magnetic rod after the mixing process, washing it with deionized water, and removing the magnetic particles on the magnetic rod, so as to obtain the sample 200 to be tested;

[0190] Furthermore, the mixing treatment time is 72 hours. The present invention is further described below by specific examples, but it should be understood that these examples are only used for more detailed description and should not be understood as limiting the present invention in any form.

[0191] Example 1

[0192] In this embodiment, a magnetic impurity detection system is used to perform magnetic impurity detection on the sample to be detected.

[0193] 1. Experimental methods:

[0194] (1) Treatment of lithium iron phosphate samples:

[0195] A. Take 100g lithium iron phosphate raw material, put it into a 5L polytetrafluoroethylene barrel, and add 4L deionized water;

[0196] B. Add a cylindrical magnetic bar with a diameter of 3 cm and a length of 10 cm, and a magnetic strength of 6000 Gauss;

[0197] C. Use a drum mixer to mix the materials for 72 hours;

[0198] (2) Transfer of magnetic impurities

[0199] A. Take out the cylindrical magnetic rod after the mixing treatment in step (1), and rinse it three times with deionized water;

[0200] B. Use sterile gloves to remove the magnetic particles from the magnetic rod to obtain the sample to be tested.

[0201] (3) Optical observation of magnetic impurities

[0202] A. Place the magnetic impurities on the sample carrier of the magnetic impurity detection system;

[0203] B. The sample to be tested placed on the sample carrier is flattened by the material flattening module.

[0204] C. Under the control of the central control device, the sample stage is controlled to move in three dimensions to complete the focusing and testing of the optical observation device, and the number of magnetic impurities is A. 0 , the corresponding particle size is L 0 .

[0205] (4) Raman laser observation of magnetic impurities

[0206] A. Under the control of the central control device, the sample stage is moved in three dimensions to complete the focusing and testing of the Raman laser device, and the iron phosphide and magnetic metal particles are identified. The number of iron phosphide particles is A. 1 .

[0207] (5) Data analysis and processing

[0208] The exact number of magnetic metal particles in the sample to be tested is calculated according to the following formula: A 2 :

[0209] A 2 =A 0 -A 1 ;

[0210] Among them, A 2 A represents the number of magnetic metal particles in the sample to be tested; 0 Represents the amount of magnetic impurities; A 1 Represents the number of iron phosphide particles.

[0211] 2. Data analysis, calculation and results:

[0212] The low compaction density lithium iron phosphate sample provided in Example 1 was tested, and the results are as follows:

[0213] (1)A 0 =83;

[0214] (2)A 1 =5;

[0215] (3)A 2 =A 0 -A 1 =83-5=78 pieces.

[0216] Example 2

[0217] In this embodiment, the experimental method in Example 1 was used for detection, and the data analysis calculation and results are as follows:

[0218] (1)A 0 =105;

[0219] (2)A 1 =22 pieces;

[0220] (3)A 2 =A 0 -A 1 =105-22=83 pieces.

[0221] In summary, based on the difference in the intrinsic chemical structure of iron phosphide and magnetic metal particles, the utility model integrates an optical detection system and a Raman laser system into one device, uses a Raman laser device to identify iron phosphide and magnetic metal particles, distinguishes magnetic metal particles from iron phosphide, and realizes correction of the optical detection results of the optical detection device, and finally obtains accurate information on the size and quantity of magnetic metal impurities, greatly improving the accuracy of the test results of magnetic metal particles, and solving the problem that the existing technical solutions in the industry cannot distinguish between iron phosphide and magnetic metal particles, resulting in interference of iron phosphide particles with the test results of magnetic metal particles.

[0222] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus the necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the utility model can be essentially or the part that contributes to the prior art can be embodied in the form of a software product, and the computer software product is stored in a storage medium (such as ROM / RAM, disk, CD) as described above, including a number of instructions to enable a terminal device (which can be a mobile phone, computer, server, or network device, etc.) to execute the methods described in each embodiment of the utility model. The above is only a preferred embodiment of the utility model, and does not limit the patent scope of the utility model. All equivalent structures or equivalent process changes made using the contents of the utility model specification and drawings, or directly or indirectly used in other related technical fields, are similarly included in the patent protection scope of the utility model.

Claims

1. A magnetic impurity detection system, characterized in that: include: Central control device, platform device, support device, Raman laser device and optical detection device; The Raman laser device and the optical detection device are both arranged on the supporting device, and are connected to the platform device through the supporting device; The platform device can place a sample to be detected on it, and can step and move the position of the sample to be detected so as to correspond to the Raman laser device and the optical detection device; The Raman laser device, the optical detection device and the platform device are all electrically connected to the central control device.

2. The magnetic impurity detection system according to claim 1, characterized in that: The platform device includes a stage frame, a moving mechanism and a sample loading mechanism; The stage frame includes a frame body and a moving slot provided in the frame body; The moving mechanism is arranged in the moving groove and connected to the frame body; The sample loading mechanism is connected to the moving mechanism and can move in the moving groove based on the moving mechanism.

3. The magnetic impurity detection system according to claim 2, characterized in that: The moving mechanism includes an X-axis slide rail arranged in the moving groove, and a Y-axis moving part connected to the X-axis slide rail and capable of moving along the length direction of the X-axis slide rail. The sample loading mechanism is connected to the Y-axis moving part and can move along the length direction of the Y-axis moving part.

4. The magnetic impurity detection system according to claim 3, characterized in that: The moving groove is a rectangular moving groove; The moving mechanism comprises two X-direction slide rails, which are symmetrically arranged on two corresponding and parallel sides of the moving groove; The Y-direction moving part is connected to both of the two X-direction slide rails.

5. The magnetic impurity detection system according to claim 3, characterized in that: The moving mechanism further includes a supporting portion; The support part includes a Y-direction support rail symmetrically arranged on the inner side of the moving groove and a support cross bar respectively connected to the two Y-direction support rails; The Y-direction support rail is perpendicular to the X-direction slide rail; The supporting cross bar is connected to the sample loading mechanism.

6. The magnetic impurity detection system according to claim 5, characterized in that: The sample loading mechanism includes a sample loading platform, and a Y-direction connecting portion, a Y-direction moving motor and a transverse connecting portion arranged at the lower end of the sample loading platform; The sample loading platform is connected to the Y-direction moving part through the Y-direction connecting part at the lower end, and can be driven by the Y-direction moving motor to move along the length direction of the Y-direction moving part; The sample loading platform is connected to the supporting cross bar via the transverse connecting portion at the lower end, and can move synchronously along the length direction of the supporting cross bar when the Y-direction moving portion moves along the X-direction slide rail.

7. The magnetic impurity detection system according to claim 6, characterized in that: The sample loading mechanism also includes a material leveling module; The material leveling module includes two outer wall X rails and two outer wall Y rails arranged around the upper end of the sample carrier, a lateral moving part connected to the two outer wall X rails, a lateral moving motor connected to the lateral moving part, a longitudinal moving part connected to the two outer wall Y rails, and a longitudinal moving motor connected to the longitudinal moving part; Two symmetrically arranged outer wall X rails and two symmetrically arranged outer wall Y rails enclose a rectangle corresponding to the outer shape of the sample carrier; In the vertical direction, the outer wall Y track has a spatial height higher than the outer wall X track; The lower end of the transverse moving part is connected to a transverse bar for transversely flattening the sample to be tested; The lower end of the longitudinal moving part is connected to a longitudinal bar for longitudinally flattening the sample to be tested; The transverse gear bar can rotate around the transverse moving part; the longitudinal gear bar can rotate around the longitudinal moving part.

8. The magnetic impurity detection system according to claim 2, characterized in that: The support device includes a vertical bracket vertically connected to the platform device and a horizontal cantilever connected to the vertical bracket; The Raman laser device comprises a laser transceiver mechanism disposed on the horizontal cantilever, and a spectral mechanism connected to the laser transceiver mechanism; The optical detection device comprises an optical imaging mechanism disposed on the horizontal cantilever; The optical imaging mechanism is electrically connected to the central control device.

9. The magnetic impurity detection system according to claim 1, characterized in that: The magnetic impurity detection system also includes an outer cover connected to the platform device and capable of placing the platform device, the supporting device, the Raman laser device and the optical detection device therein.

10. The magnetic impurity detection system according to claim 1, characterized in that: The central control device includes a central processing unit, and an input module, an output module, a power supply module and a storage module which are all connected to the central processing unit via a bus.

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