Batch resistance test fixture structure
By designing a batch resistance test fixture structure and using probes and PCBA board wiring methods, the problems of low electrode testing efficiency and difficult positioning in the prior art are solved, and efficient batch testing is achieved.
Patent Information
- Application Number
- CN202421181310.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-27
- Publication Date
- 2025-05-06
- Estimated Expiration
- 2034-05-27
AI Technical Summary
In the prior art, the electrode testing efficiency of semiconductor chip gas sensors is low, making it difficult to conduct batch testing, and there are problems with difficult positioning and test deviations.
Design a batch resistance test fixture structure, wire tiny electrodes through the PCBA board through a probe, externalize the test lines, and use the alignment holes to eliminate difficult positioning and test deviation problems, and improve test efficiency.
It effectively improves the efficiency of electrode testing, realizes batch testing, eliminates the problems of difficult positioning and test deviation, and has significant technical effects.
Smart Images
Figure CN222838099U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of sensor testing, and more specifically, to a batch resistance testing fixture structure. Background Art
[0002] Planar ceramic electrode sheets are widely used in semiconductor chip gas sensors, and have a series of advantages such as low manufacturing threshold, small size, high single-chip output, and low cost. However, the heater at the core of semiconductor chip gas sensors is difficult to detect and monitor during its preparation due to its small area and high single-chip density. In the actual production process, the pre-cut planar ceramic sheet is screen-printed to complete the hole filling process, and the metal electrode is prepared. It is necessary to test whether the hole filling process is good and whether the front and back sides are conductive.
[0003] In the prior art, the use of multimeters for point testing consumes a lot of time and manual work, and is very inefficient. Due to problems with electrodes and electrode spacing, it is impossible to use existing testing equipment for testing. That is, the technical problem of the prior art is that the electrode testing efficiency is low and it is difficult to perform batch testing.
[0004] Therefore, how to provide a batch resistance test fixture structure that can overcome the difficult positioning problems and test deviation problems in the prior art and effectively improve the electrode testing efficiency has become a technical problem that needs to be urgently solved by technical personnel in this field. Utility Model Content
[0005] In order to solve the above technical problems, the present application provides a batch resistance test fixture structure, which uses probes to wire tiny electrodes through the PCBA board, externalizes the test circuit, and uses alignment holes to eliminate difficult positioning problems and test deviation problems, thereby effectively improving the test efficiency.
[0006] The technical solutions provided by this application are as follows:
[0007] The present application provides a batch resistance test fixture structure, including: a sample test table for carrying a sample to be tested; a PCBA board arranged on the upper part of the sample test table; a test probe welded on the PCBA board for contacting the electrode of the sample to be tested; the PCBA board is used to externally lead out the lead of the electrode of the sample to be tested and connect it to a source meter; the test probe array is arranged on the PCBA board, and the positions of the test probes correspond one-to-one to the positions of the electrodes of the sample to be tested; and a terminal block connected in series with the test probes for connecting to a test instrument.
[0008] Furthermore, in a preferred embodiment of the present invention, the sample test bench comprises: a fine-tuning platform; a sample bench body disposed on the fine-tuning platform; and a sample positioning groove for fixing the sample to be tested is disposed on the sample bench body.
[0009] Furthermore, in a preferred embodiment of the present invention, the sample positioning groove is manufactured by a turning and milling process, and the sample positioning groove is a three-sided groove structure with one opening.
[0010] Furthermore, in a preferred embodiment of the present invention, the sample testing platform further comprises: a fixed limiting sliding block provided at the opening of the sample positioning groove for positioning the sample to be tested.
[0011] Furthermore, in a preferred embodiment of the present invention, the sample stage body is made of brass, and the thickness of the sample stage body is 2-4 mm.
[0012] Furthermore, in a preferred embodiment of the present invention, the depth of the sample positioning groove is 0.5 mm.
[0013] Furthermore, in a preferred embodiment of the present invention, the sample stage body is fixed on the fine-tuning platform by screws.
[0014] Furthermore, in a preferred embodiment of the present invention, the test probe is specifically a spring probe, and the test probe is arranged on the PCBA board through a welding structure.
[0015] Furthermore, in a preferred embodiment of the present invention, it further comprises: an alignment hole structure provided on the sample stage body and the PCBA board.
[0016] Furthermore, in a preferred embodiment of the utility model, it further includes: a mounting seat; a longitudinal track provided on the mounting seat; a position adjustment seat installed on the longitudinal track; and the position adjustment seat is used to drive the PCBA board to move up and down.
[0017] Furthermore, in a preferred embodiment of the present invention, it further comprises: a bearing positioning block provided on the longitudinal track, wherein the bearing positioning block is used to limit the longitudinal height of the PCBA board.
[0018] Compared with the prior art, the batch resistance test fixture structure provided by the utility model includes: a sample test bench for carrying the sample to be tested; a PCBA board arranged on the upper part of the sample test bench; a test probe welded on the PCBA board for contacting the electrode of the sample to be tested; the PCBA board is used to externally lead out the leads of the electrode of the sample to be tested and connect to a source meter; and the test probe is connected in series with the terminal block for connecting to the test meter. Compared with the prior art, the batch resistance test fixture structure involved in the utility model uses a probe to externalize the test circuit of the tiny electrode through the PCBA board, which effectively improves the test efficiency. The internal wiring of the PCBA board leads out the electrode test leads and connects them to the source meter for multi-channel testing. In addition, the scheme also uses alignment holes to eliminate the problem of difficult positioning and test deviation, and has significant technical effects. BRIEF DESCRIPTION OF THE DRAWINGS
[0019] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.
[0020] Figure 1 A schematic diagram of the principle of a batch resistance test fixture structure provided by an embodiment of the utility model;
[0021] Figure 2 A top view of the upper structure of a batch resistance test fixture structure provided by an embodiment of the utility model;
[0022] Figure 3 A top view of the lower structure of the batch resistance test fixture structure provided by an embodiment of the utility model;
[0023] Figure 4 It is a schematic diagram of a sample to be tested according to an embodiment of the present utility model. DETAILED DESCRIPTION
[0024] In order to enable those skilled in the art to better understand the technical solutions in the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of this application.
[0025] It should be noted that when an element is referred to as being "fixed on" or "set on" another element, it can be directly on the other element or indirectly set on the other element; when an element is referred to as being "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element.
[0026] It should be understood that the terms "length", "width", "up", "down", "front", "back", "first", "second", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.
[0027] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of this application, "multiple" and "several" mean two or more, unless otherwise clearly and specifically defined.
[0028] It should be noted that the structures, proportions, sizes, etc. illustrated in the drawings of this specification are only used to match the contents disclosed in the specification for people familiar with this technology to understand and read, and are not used to limit the conditions under which this application can be implemented. Therefore, they have no substantive technical significance. Any structural modification, change in proportional relationship or adjustment of size should still fall within the scope of the technical content disclosed in this application without affecting the effects and purposes that can be achieved by this application.
[0029] like Figures 1 to 4As shown, the batch resistance test fixture structure provided by the embodiment of the present application includes: a sample test table 1 for carrying a sample 6 to be tested; a PCBA board 2 arranged on the upper part of the sample test table 1; a test probe 3 welded on the PCBA board 2 for contacting the electrode of the sample 6 to be tested; the PCBA board 2 is used for the external placement of the lead of the electrode of the sample 6 to be tested and connected to the source meter; the test probes 3 are arranged in an array on the PCBA board 2, and the positions of the test probes 3 correspond to the positions of the electrodes of the sample 6 to be tested one by one; and the terminal block 4 connected in series with the test probes 3 for connecting to the test meter. Compared with the prior art, the batch resistance test fixture structure involved in the utility model externalizes the test circuit by placing the tiny electrode through the PCBA board 2 through the probe, which effectively improves the test efficiency. The internal wiring of the PCBA board 2 leads out the electrode test lead and connects it to the source meter for multi-channel testing. In addition, the present solution also uses alignment holes to eliminate the problem of difficult positioning and test deviation, and has significant technical effects.
[0030] The utility model provides a batch resistance test fixture structure, including two main parts, the upper part structure includes: PCBA board 2, test probe 3, terminal block 4, etc., the lower part structure includes: sample table main body 102, fine-tuning platform 101, etc., specifically including: a sample test table 1 for carrying a sample 6 to be tested; a PCBA board 2 arranged on the upper part of the sample test table 1; a test probe 3 welded on the PCBA board 2 and used for contacting the electrode of the sample 6 to be tested; the PCBA board 2 is used to externally lead out the lead of the electrode of the sample 6 to be tested and connect it to a source meter; the test probe 3 is arranged in an array on the PCBA board 2, and the position of the test probe 3 corresponds to the position of the electrode of the sample 6 to be tested one by one; and the terminal block 4 connected in series with the test probe 3 and used for connecting a test instrument. Compared with the prior art, the batch resistance test fixture structure involved in the utility model uses a probe to externalize the test circuit through the PCBA board 2 with tiny electrodes, which effectively improves the test efficiency. The internal wiring of the PCBA board 2 leads out the electrode test leads and connects them to the source meter for multi-channel testing. In addition, this solution also uses alignment holes to eliminate the problem of difficult positioning and test deviation, and has significant technical effects.
[0031] The technical solution of the utility model is described in detail below in conjunction with specific embodiments:
[0032] Specifically, in a specific embodiment of the present utility model, the sample test platform 1 includes: a fine-tuning platform 101; a sample platform body 102 disposed on the fine-tuning platform 101; and a sample positioning groove 104 for fixing the sample 6 to be tested is disposed on the sample platform body 102.
[0033] Specifically, in the specific embodiment of the present utility model, the sample positioning groove 104 is made by a turning and milling process, and the sample positioning groove 104 is a three-sided groove structure with one opening.
[0034] Specifically, in a specific embodiment of the present utility model, the sample testing platform 1 further comprises: a fixed limiting slider 103 disposed at the opening of the sample positioning groove for positioning the sample 6 to be tested.
[0035] Specifically, in a specific embodiment of the present invention, the sample stage body 102 is made of brass, and the thickness of the sample stage body 102 is 2-4 mm. More specifically, the thickness of the sample stage body 102 is about 3 mm.
[0036] Specifically, in a specific embodiment of the present invention, the depth of the sample positioning groove 104 is 0.5 mm.
[0037] Specifically, in a specific embodiment of the present invention, the sample stage body 102 is fixed on the fine-tuning platform 101 by screws.
[0038] Specifically, in a specific embodiment of the present utility model, the test probe 3 is a spring probe, and the test probe is arranged on the PCBA board 2 through a welding structure. The spring probe can eliminate the influence of slight unevenness, thereby protecting the electrode from being pierced.
[0039] Specifically, in a specific embodiment of the present invention, it also includes: an alignment hole structure 5 provided on the sample stage body 102 and the PCBA board 2 .
[0040] Specifically, in a specific embodiment of the utility model, it also includes: a mounting seat; a longitudinal track arranged on the mounting seat; a position adjustment seat installed on the longitudinal track; and the position adjustment seat is used to drive the PCBA board to move up and down.
[0041] Specifically, in a specific embodiment of the utility model, it also includes: a bearing positioning block arranged on the longitudinal track, and the bearing positioning block is used to limit the longitudinal height of the PCBA board 2.
[0042] To be more specific, the planar ceramic electrode sheet involved in the embodiment of the utility model is widely used in the field of sensors, specifically a fixture structure that can complete large-area testing at one time, and is used for sensor ceramic sheet metal electrode conductivity testing and ceramic sheet resistance value testing.
[0043] In the prior art, planar ceramic electrode sheets are widely used in semiconductor chip gas sensors, which have a series of advantages such as low manufacturing threshold, small size, high single-chip output, and low cost. However, the heater at the core of the semiconductor chip gas sensor is difficult to detect and monitor during its preparation due to its small area and high single-chip density. In the actual production process, the pre-cut planar ceramic sheet is completed by screen printing to complete the hole filling process, and the metal electrode is prepared. It is necessary to test whether the hole filling process is good and whether the front and back sides are conductive. Due to the narrow electrode and electrode spacing, there is no suitable fixture or equipment for testing. At present, multimeter single-point measurement is used, which consumes a lot of time and manual work, and the efficiency is very low. Similarly, the heater is prepared by screen printing. After sintering, it is necessary to test whether the heater meets the standards. Due to the problem of electrode and electrode spacing, it is impossible to use existing test equipment for testing. In order to improve the test efficiency, a special test fixture is designed to realize batch testing.
[0044] Therefore, the jig for electrode conduction test and heater resistance value test in the process of preparing planar ceramic sheets involved in the embodiment of the utility model has a sample test table 1 at the bottom, and a fine-tuning platform 101 is used as the overall foundation of the sample test table 1; a sample table body 102 is set on the fine-tuning platform 101, and the sample table body 102 needs to be designed in combination with the processing requirements of the sample to be processed, and a customized special sample table body 102 is obtained by processing the copper plate through a turning and milling process, and further, a sample positioning groove 104 is added in the special sample groove; specifically, the sample positioning groove is a telescopic structure slot 104, which is used to stabilize the sample 6 to be tested; the upper part is based on the PCBA board 2, and a test probe corresponding to the position of the sample electrode is provided at the bottom of the PCBA board 2, specifically, the test probe 3 is a test probe with a spring telescopic structure; one end of the test probe 3 is used to contact and connect with the sample electrode, and the other end of the test probe 3 leads the electrode to the terminal row 4 through the copper wiring arranged inside the PCBA board 2. During the actual operation test, multi-channel testing of multiple electrodes can be conveniently performed through the fixture.
[0045] Specifically, the base adopts a fine-tuning platform 101, and the material of the sample stage body 102 is brass, with a thickness of about 3mm. Through machining and milling with a depth of 0.5mm, a rectangular shape matching the size of the sample 6 to be tested is formed; the lower part is left empty to install a fixed limit slider 103 to fix the sample position, and the sample is placed in the sample positioning groove 104, and the fixed limit slider 103 is used to fix the sample; the upper part is designed with a PCBA board 2 of the same size as the sample, the electrode position is left empty, and the welding positioning test probe 3 is welded; in contact with the sample electrode, the spring probe can eliminate the influence of minor unevenness and protect the electrode from being pierced; the copper wiring is laid inside the PCBA board 2, and the electrode test lead is placed externally, and the terminal row line is set clearly. In actual testing, the test source meter is connected through an external fixture for multi-channel testing to achieve rapid detection of samples.
[0046] In the embodiment of the utility model, the test fixture includes two parts, the lower part includes: a test sample table 6, specifically including: a fine-tuning platform 101, a sample table body 102, and a fixed limit slider 103; the sample table body 102 is fixed on the fine-tuning platform 101 by screws, the sample table body 102 is made of brass, and after a turning and milling process, a concave and convex surface-three-sided structure suitable for the size of the sample to be tested is made, and a fixed limit slider 103 is added to the other side to play a role in limiting and fixing the sample. The upper part of the test fixture is a test part, including: a PCBA board 2, a test probe 3, and a terminal block 4. The test probe 3 is welded to a fixed position of the PCBA board 2, and through an internal circuit, the test probe 3 is connected in series with the terminal block 4, and the terminal block 4 is welded to the PCBA board 2.
[0047] More specifically, the following briefly describes the manufacturing process of the fixture structure:
[0048] (1) Making the sample stage body 102: Milling grooves on three sides of the brass substrate to form a sample positioning groove, wherein the size of the sample positioning groove is similar to the size of the sample to be measured;
[0049] (2) Use fixing screws to fix the sample stage body 102 to the fine-tuning platform 101;
[0050] (3) Use screws to install the fixed limit slider 103 on the sample stage body 102 to limit the position of the sample 6 to be tested;
[0051] (4) Solder the test probe 3 and the terminal block 4 to the PCBA board 2;
[0052] Through the above steps, the test fixture is completed.
[0053] In a specific embodiment of the present invention, the testing process includes the following steps:
[0054] The sample 6 to be tested is aligned with the alignment hole structure and placed into the groove of the sample stage body 102 , the fixed limiting slider is moved to press against the sample 6 to be tested, and the fixed limiting slider 102 is locked by screws to achieve clamping of the sample 6 to be tested.
[0055] Further, the PCBA board 2 is aligned with the alignment hole structure 5, placed above the sample 6 to be tested, and a certain clamping force is applied so that the test probe 3 of the PCBA board 2 and the electrode of the sample 6 to be tested are both in contact;
[0056] Furthermore, the terminal row 4 on the PCBA board is used to quickly clamp the sample 6 to improve the efficiency of testing the sample 6. In summary, the test fixture structure involved in the embodiment of the utility model uses the test probe 3 to pass the tiny electrode through the wiring of the PCBA board 2 and externalize the test circuit, and at the same time uses the alignment hole structure 5 to eliminate the problem of difficult positioning and test deviation in the prior art, effectively improving the test efficiency, and having significant technical effects compared with the prior art.
[0057] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present invention. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.
Claims
1. A batch resistance test fixture structure, characterized in that: include: A sample test bench for carrying the sample to be tested; A PCBA board arranged on the upper part of the sample testing platform; A test probe welded on the PCBA board for contacting the electrode of the sample under test; The PCBA board is used to externally lead out the leads of the electrodes of the sample under test and connect them to the source meter; The test probe array is arranged on the PCBA board, and the positions of the test probes correspond one-to-one to the positions of the electrodes of the tested sample; Connected in series with the test probe, it is used to connect to the terminal block of the test instrument.
2. The batch resistor test fixture structure according to claim 1, characterized in that: The sample testing platform comprises: a fine-tuning platform; a sample platform body arranged on the fine-tuning platform; and a sample positioning groove for fixing the sample to be tested is arranged on the sample platform body.
3. The batch resistor test fixture structure according to claim 2, characterized in that: The sample positioning groove is manufactured by a turning and milling process, and the sample positioning groove is a three-sided groove structure with one opening.
4. The batch resistor test fixture structure according to claim 3 is characterized in that: The sample testing platform further comprises: a fixed limiting sliding block arranged at the opening of the sample positioning groove and used for positioning the sample to be tested.
5. The batch resistor test fixture structure according to claim 2, characterized in that: The sample stage body is made of brass, and the thickness of the sample stage body is 2-4 mm; and / or the depth of the sample positioning groove is 0.5 mm.
6. The batch resistor test fixture structure according to claim 2, characterized in that: The sample stage body is fixed on the fine-tuning platform by screws.
7. The batch resistor test fixture structure according to claim 1, characterized in that: The test probe is specifically a spring probe, and the test probe is arranged on the PCBA board through a welding structure.
8. The batch resistor test fixture structure according to claim 2, characterized in that: Also includes: An alignment hole structure is provided on the sample stage body and the PCBA board.
9. The batch resistor test fixture structure according to any one of claims 1 to 8, characterized in that: Also includes: Mounting seat; A longitudinal track provided on the mounting seat; A position adjustment seat installed on the longitudinal track; The position adjustment seat is used to drive the PCBA board to move up and down.
10. The batch resistor test fixture structure according to claim 9, characterized in that: Also includes: A bearing positioning block is arranged on the longitudinal track, and the bearing positioning block is used to limit the longitudinal height of the PCBA board.