Memory chip test fixture

Abstract

The utility model relates to the technical field of memory chip testing, in particular to a memory chip testing jig which comprises a supporting plate, supporting columns are fixedly connected to the four corners of the lower end of the supporting plate, a fixing plate is fixedly connected to the rear portion of the upper end of the supporting plate, and a top plate is fixedly connected to the upper end of the fixing plate. Two telescopic rods are connected to the front portion of the upper end of the top plate in a penetrating mode, the output ends of the two telescopic rods are jointly and fixedly connected with a testing instrument, a displayer is arranged at the front end of the testing instrument, connectors are arranged at the left end and the right end of the testing instrument, and two limiting assemblies are arranged at the front portion of the upper end of the supporting plate. Fixing screws are arranged at the left ends of the two limiting assemblies, the supporting plate comprises a supporting plate, a bearing plate is connected to the left end of the supporting plate in a penetrating and inserting mode, and an electrifying plate is fixedly connected to the upper end of the bearing plate. According to the test fixture for the storage chip, the detection process of the storage chip can be facilitated through the supporting plate and the limiting assembly.

Description

Technical Field

[0001] The utility model relates to the technical field of memory chip testing, in particular to a memory chip testing fixture. Background Art

[0002] During the processing and production of memory chips, a test fixture is needed to test the memory chips to ensure the yield rate of the memory chips. There are at least the following disadvantages in the use of existing memory chip test fixtures: 1. It is not easy for the existing memory chip test fixture to position memory chips of different thicknesses, and the memory chips are prone to position shift during the test process; 2. The existing memory chip test fixture has poor stability, troublesome installation and disassembly, and is not convenient for inspection and maintenance. Therefore, we have introduced a new memory chip test fixture. Utility Model Content

[0003] The main purpose of the utility model is to provide a memory chip testing fixture, which can effectively solve the problems in the background technology.

[0004] In order to achieve the above purpose, the technical solution adopted by the utility model is:

[0005] A memory chip testing fixture comprises a support plate, wherein the four corners of the lower end of the support plate are fixedly connected to support columns, the rear portion of the upper end of the support plate is fixedly connected to a fixing plate, the upper end of the fixing plate is fixedly connected to a top plate, the front portion of the upper end of the top plate is interlaced with two telescopic rods, the output ends of the two telescopic rods are commonly fixedly connected to a testing instrument, a display is provided at the front end of the testing instrument, connectors are provided at the left and right ends of the testing instrument, two limit assemblies are provided at the front end of the upper end of the support plate, and fixing screws are provided at the left ends of the two limit assemblies.

[0006] Preferably, the support plate includes a pallet, a receiving plate is inserted and connected to the left end of the pallet, a power-carrying plate is fixedly connected to the upper end of the receiving plate, a fixing block is fixedly connected to the left part of the upper end of the pallet, a No. 1 screw is inserted and connected to the front end of the fixing block, the fixing block is located in front of the receiving plate, and the pallet is fixedly connected to four support columns.

[0007] Preferably, the support plate includes a plate body, the upper end of the plate body is fixedly connected to a support frame, the upper end of the support frame is provided with a slot, the front part of the upper end of the plate body is fixedly connected to two slides, and the two slides are fixedly connected to the support frame.

[0008] Preferably, the limiting assembly includes a support block, the upper end of the support block is inserted and connected with a connecting block, the upper end of the connecting block is fixedly connected with a support plate, the rear part of the upper end of the support plate is inserted and connected with a limiting screw, and the support block is sleeved with the support plate.

[0009] Preferably, the support block comprises a sliding block, a No. 2 screw is inserted and connected to the upper front end of the sliding block, a sliding groove is formed at the lower end of the sliding block, and the sliding block is sleeved with the connecting block.

[0010] Preferably, the two slide grooves are respectively connected to the two slide platforms.

[0011] Preferably, the card slot is sleeved with the receiving plate.

[0012] Preferably, the No. 1 screw passes through the fixing block and is interlacedly connected with the receiving plate.

[0013] Preferably, the two No. 2 screws pass through the two sliding blocks respectively and are interlacedly connected with the two connecting blocks.

[0014] Preferably, the two fixing screws pass through the two sliding blocks respectively and are interlacedly connected with the two sliding tables.

[0015] Preferably, the testing instrument, the display and the two connectors are not in contact with the two limit assemblies.

[0016] Preferably, the support frame does not contact the two support plates.

[0017] Compared with the prior art, the utility model has the following beneficial effects:

[0018] 1. By setting the limit assembly, by sliding the positions of the two support blocks on the two slides, and fixing them respectively by fixing screws, the positions of the two limit assemblies can be adjusted and fixed. By rotating the two limit screws, the two limit screws are in contact with the memory chip to be tested placed in the support plate, the memory chip can be positioned to improve the test stability;

[0019] 2. By setting a support plate, a support frame is set on the support plate, and a slot is set on the support frame, the docking plate is connected with the support frame through insertion, and a No. 1 screw is passed through the fixed block and connected with the docking plate through insertion, the position of the docking plate can be positioned, and the docking plate is easy to install and disassemble, which is convenient for maintenance of the power-carrying plate on the docking plate. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 This is a schematic diagram of the overall structure of a memory chip test fixture of the utility model;

[0021] Figure 2 This is a schematic diagram of the overall structure of a support plate of a memory chip test fixture of the utility model;

[0022] Figure 3 This is a schematic diagram of the overall structure of a support plate of a memory chip test fixture of the utility model;

[0023] Figure 4This is a schematic diagram of the overall structure of a limit assembly of a memory chip test fixture of the utility model;

[0024] Figure 5 The utility model is a schematic diagram of the overall structure of a support block of a memory chip testing fixture.

[0025] In the figure: 1. support plate; 2. support column; 3. fixed plate; 4. top plate; 5. telescopic rod; 6. limit assembly; 7. test instrument; 8. display; 9. connector; 10. fixing screw; 11. support plate; 12. power plate; 13. receiving plate; 14. fixing block; 15. No. 1 screw; 111. plate body; 112. support frame; 113. slide; 114. slot; 61. support block; 62. connecting block; 63. support plate; 64. limit screw; 611. slide block; 612. No. 2 screw; 613. slide slot. DETAILED DESCRIPTION

[0026] In order to make the technical means, creative features, objectives and effects achieved by the present invention easy to understand, the present invention is further described below in conjunction with specific implementation methods.

[0027] In the description of the present invention, it should be noted that the terms "upper", "lower", "inner", "outer", "front end", "rear end", "two ends", "one end", "the other end" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operate in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In addition, the terms "first" and "second" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance.

[0028] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "provided with", "connected", etc. should be understood in a broad sense. For example, "connected" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0029] See also Figure 1-5 , the utility model provides a technical solution:

[0030] A memory chip testing fixture comprises a support plate 1, wherein the four corners of the lower end of the support plate 1 are fixedly connected to support columns 2, the rear part of the upper end of the support plate 1 is fixedly connected to a fixing plate 3, the upper end of the fixing plate 3 is fixedly connected to a top plate 4, the front part of the upper end of the top plate 4 is interlaced with two telescopic rods 5, the output ends of the two telescopic rods 5 are commonly fixedly connected to a testing instrument 7, the front end of the testing instrument 7 is provided with a display 8, the left and right ends of the testing instrument 7 are provided with connectors 9, the front part of the upper end of the support plate 1 is provided with two limit assemblies 6, and the left ends of the two limit assemblies 6 are provided with fixing screws 10.

[0031] In this embodiment, the support plate 1 includes a support plate 11, a receiving plate 13 is inserted and connected to the left end of the support plate 11, and a power-carrying plate 12 is fixedly connected to the upper end of the receiving plate 13, a fixing block 14 is fixedly connected to the left part of the upper end of the support plate 11, and a No. 1 screw 15 is inserted and connected to the front end of the fixing block 14, and the fixing block 14 is located at the front part of the receiving plate 13, and the support plate 11 is fixedly connected to the four support columns 2; the support plate 11 includes a plate body 111, a support frame 112 is fixedly connected to the upper end of the plate body 111, and a slot 114 is opened at the upper end of the support frame 112, and two slides 113 are fixedly connected to the front end of the upper end of the plate body 111, and the two slides 113 are fixedly connected to the support frame 112; the slot 114 and the receiving plate 13 is sleeved; No. 1 screw 15 passes through the fixed block 14 and is connected with the receiving plate 13 through an interlacing connection; the two fixed screws 10 respectively pass through the two sliders 611 and are connected with the two slides 113 through an interlacing connection; the testing instrument 7, the display 8 and the two connectors 9 are not in contact with the two limit assemblies 6; the support frame 112 and the two support plates 63 are not in contact with each other. The storage chip testing process is supported by setting the support plate 1, the receiving plate 13 is connected with the support frame 112 through an interlacing connection, and the No. 1 screw 15 passes through the fixed block 14 and is connected with the receiving plate 13 through an interlacing connection, so that the position of the receiving plate 13 can be positioned to improve stability, and the receiving plate 13 is easy to install and disassemble, which is convenient for maintenance.

[0032] In this embodiment, the limiting component 6 includes a support block 61, the upper end of the support block 61 is inserted and connected with a connecting block 62, the upper end of the connecting block 62 is fixedly connected with a support plate 63, the upper rear end of the support plate 63 is inserted and connected with a limiting screw 64, and the support block 61 is sleeved with the support plate 1; the support block 61 includes a slider 611, the upper front end of the slider 611 is inserted and connected with a No. 2 screw 612, the lower end of the slider 611 is provided with a slide groove 613, and the slider 611 is sleeved with the connecting block 62; the two slide grooves 613 are respectively sleeved with the two slides 113; the two No. 2 screws 612 respectively pass through the two sliders 611 and are inserted and connected with the two connecting blocks 62, and the storage chip is limited by setting the limiting component 6, and the two The support blocks 61 are respectively socketed with the two slides 113. By sliding the two support blocks 61 on the two slides 113 and fixing them respectively by fixing screws 10, the positions of the two limit assemblies 6 can be adjusted and fixed. By rotating the two limit screws 64, the two limit screws 64 are made to contact the storage chips to be tested placed in the support plate 1, so that the storage chips can be positioned to improve the test stability. By adjusting the connection length between the two support blocks 61 and the two connecting blocks 62 and fixing them respectively by No. 2 screws 612, the use length of the two limit assemblies 6 can be adjusted to improve the flexibility of positioning storage chips of different sizes.

[0033] It should be noted that the utility model is a memory chip test fixture. During use, the receiving plate 13 is inserted and connected with the support frame 112, and the position of the receiving plate 13 is positioned by the No. 1 screw 15, so as to position the power-on plate 12. The receiving plate 13 is easy to install and disassemble, which is convenient for disassembling and repairing the power-on plate 12 on the receiving plate 13, thereby improving flexibility. The memory chip to be tested is placed on the power-on plate 12, and the positions of the two limit assemblies 6 can be adjusted and fixed by sliding the two support blocks 61 on the two slides 113 and fixing them respectively by the fixing screws 10. By rotating the two limit screws 64, the two limit screws 64 are in contact with the memory chip to be tested placed in the support plate 1, so that the memory chip can be positioned to avoid the position displacement of the memory chip during the test. The test harness is connected to the two connectors 9 respectively to test the memory chip, and the test data is displayed on the display 8 to improve the test stability.

[0034] The above shows and describes the basic principle and main features of the utility model and the advantages of the utility model. Those skilled in the art should understand that the utility model is not limited by the above embodiments. The above embodiments and descriptions are only for explaining the principle of the utility model. Without departing from the spirit and scope of the utility model, the utility model may have various changes and improvements, which fall within the scope of the utility model to be protected. The scope of protection claimed by the utility model is defined by the attached claims and their equivalents.

Claims

1. A memory chip test fixture, comprising a support plate (1), characterized in that: The four corners of the lower end of the support plate (1) are fixedly connected to support columns (2); the rear part of the upper end of the support plate (1) is fixedly connected to a fixing plate (3); the upper end of the fixing plate (3) is fixedly connected to a top plate (4); the front part of the upper end of the top plate (4) is interlaced with two telescopic rods (5); the output ends of the two telescopic rods (5) are commonly fixedly connected to a testing instrument (7); a display (8) is provided at the front end of the testing instrument (7); connectors (9) are provided at both left and right ends of the testing instrument (7); two limit assemblies (6) are provided at the front part of the upper end of the support plate (1); and the left ends of the two limit assemblies (6) are each provided with a fixing screw (10).

2. A memory chip test fixture according to claim 1, characterized in that: The support plate (1) comprises a support plate (11), the left end of the support plate (11) is connected with a receiving plate (13) through insertion, the upper end of the receiving plate (13) is fixedly connected with a power supply plate (12), the left part of the upper end of the support plate (11) is fixedly connected with a fixing block (14), the front end of the fixing block (14) is connected with a No. 1 screw rod (15) through insertion, the fixing block (14) is located in front of the receiving plate (13), and the support plate (11) is fixedly connected with four support columns (2).

3. A memory chip test fixture according to claim 2, characterized in that: The support plate (11) comprises a plate body (111), the upper end of the plate body (111) is fixedly connected to a support frame (112), the upper end of the support frame (112) is provided with a slot (114), the front part of the upper end of the plate body (111) is fixedly connected to two slides (113), and the two slides (113) are both fixedly connected to the support frame (112).

4. The memory chip test fixture according to claim 1, characterized in that: The limiting assembly (6) comprises a support block (61), the upper end of the support block (61) is connected with a connecting block (62), the upper end of the connecting block (62) is fixedly connected with a support plate (63), the upper rear end of the support plate (63) is connected with a limiting screw (64), and the support block (61) is sleeved with the support plate (1).

5. A memory chip test fixture according to claim 4, characterized in that: The support block (61) comprises a sliding block (611), a second screw rod (612) is inserted and connected to the upper front end of the sliding block (611), a sliding groove (613) is formed at the lower end of the sliding block (611), and the sliding block (611) is sleeved with the connecting block (62).

6. A memory chip test fixture according to claim 5, characterized in that: The two slide grooves (613) are respectively sleeved with the two slide platforms (113).

7. The memory chip test fixture according to claim 3, characterized in that: The card slot (114) is sleeved with the receiving plate (13).

8. The memory chip test fixture according to claim 2, characterized in that: The No. 1 screw rod (15) passes through the fixing block (14) and is interlacedly connected with the receiving plate (13).

9. The memory chip test fixture according to claim 5, characterized in that: The two No. 2 screw rods (612) respectively pass through the two sliders (611) and are interlacedly connected with the two connecting blocks (62).

10. The memory chip test fixture according to claim 1, characterized in that: The two fixing screw rods (10) respectively pass through the two sliding blocks (611) and are interlacedly connected with the two sliding tables (113).

11. The memory chip test fixture according to claim 1, characterized in that: The testing instrument (7), the display (8) and the two connectors (9) are not in contact with the two limit assemblies (6).

12. The memory chip test fixture according to claim 3, characterized in that: The support frame (112) is not in contact with the two support plates (63).

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