Anti-light interference test device for integrated receiver
By designing an anti-light interference test device containing an interference lamp, the problem that the prior art fails to effectively test the anti-interference capability of the integrated receiver is solved, and effective evaluation and improvement of the product's anti-light interference performance is achieved.
Patent Information
- Application Number
- CN202421785674.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-26
- Publication Date
- 2025-05-30
- Estimated Expiration
- 2034-07-26
AI Technical Summary
The existing test devices failed to effectively test the anti-interference ability of the integrated receiver in a high-light wave environment, which affected the actual application effect of the product.
An anti-light interference test device including a work box, a power supply base, a signal transmitter and an interference lamp was designed. The anti-interference ability of the integrated receiver was tested by simulating a high-light wave environment through the interference lamp.
It realizes effective testing of the signal reception ability of the integrated receiver in a high-light wave environment, and improves the product's anti-light interference performance and practical application effect.
Smart Images

Figure CN222928404U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of anti-light interference test devices, and particularly to an anti-light interference test device for an integrated receiver. Background Art
[0002] In an infrared communication system, there are usually two main components: a transmitter and a receiver. The transmitter is responsible for converting an electrical signal into an infrared light signal and transmitting it through an infrared ray to the receiver. The receiver is responsible for receiving these infrared light signals and converting them back into electrical signals for subsequent processing or analysis. Among them, an integrated receiver usually integrates components such as an infrared receiving diode, a signal amplification circuit, and a demodulation circuit to achieve the reception and processing of infrared signals.
[0003] In the related art, there are already test devices that can test whether an integrated receiver can receive a signal. In practical applications, signal interference problems may occur when used in a high-light wave environment, but these test devices usually do not consider the anti-interference ability test in a high-light wave environment, which is likely to affect the actual application effect of the product, so improvement is needed. Utility Model Content
[0004] In order to achieve the test of the anti-light interference of an integrated receiver, this application provides an anti-light interference test device for an integrated receiver.
[0005] An anti-light interference test device for an integrated receiver provided by this application adopts the following technical solutions:
[0006] An anti-light interference test device for an integrated receiver includes a working box, a power-on seat, a signal transmitter, and an interference lamp; one side of the working box is provided with a working cavity; the power-on seat is arranged in the working cavity; the signal transmitter and the integrated receiver are respectively electrically connected to both ends of the power-on seat; the interference lamp is arranged in the working cavity.
[0007] By adopting the above technical solutions, in practical applications, first install the integrated receiver on the power-on seat to achieve power-on of the integrated receiver, and the power-on seat simultaneously powers on the signal transmitter to enable the signal transmitter to emit an infrared signal. At this time, the interference lamp makes the working cavity in a high-light wave environment, and observe the working state of the integrated receiver to determine whether the integrated receiver can normally receive the infrared signal, so as to achieve the test of the anti-light interference of the integrated receiver.
[0008] Preferably, the interference lamp is located between the signal transmitter and the integrated receiver.
[0009] By adopting the above technical solution, by arranging the interference lamp between the signal transmitter and the integrated receiver, the interference effect of the interference lamp on the infrared signal is ensured, thereby improving the effect of the anti-light interference test on the integrated receiver.
[0010] Preferably, the interference lamp includes a lamp holder and a plurality of bulbs. The lamp holder is arranged on the inner side wall of the working box and is electrically connected to the power supply seat. The plurality of bulbs are arranged at intervals along the length direction of the lamp holder and are electrically connected to the lamp holder.
[0011] By adopting the above technical solution, by arranging the lamp holder and a plurality of bulbs, the lamp holder realizes the installation of the interference lamp and provides an installation basis for the plurality of bulbs to supply power to the bulbs.
[0012] Preferably, the lamp holder is detachably connected to the working box.
[0013] By adopting the above technical solution, by arranging the lamp holder to be detachably connected to the working box, it is convenient to replace the interference lamp. By replacing different types of interference lamps, different spectral interference environments can be simulated, thereby improving the effect of the anti-light interference test on the integrated receiver.
[0014] Preferably, the bulb is detachably connected to the lamp holder.
[0015] By adopting the above technical solution, by arranging the bulb to be detachably connected to the lamp holder, when one of the bulbs is damaged, it can be repaired or replaced individually, and the repair can be achieved without disassembling the interference lamp, so as to facilitate the repair of the interference lamp.
[0016] Preferably, the anti-light interference test device further includes a processor, and the processor is electrically connected to the integrated receiver. The processor is used to receive the signal of the integrated receiver and process it.
[0017] By adopting the above technical solution, by arranging the processor, after the processor receives the signal of the integrated receiver, it automatically records and analyzes the signal. The staff can make a judgment based on the analyzed information, thereby improving the effect of the anti-light interference test on the integrated receiver.
[0018] Preferably, the anti-light interference test device further includes a terminal display, and the terminal display is electrically connected to the processor.
[0019] By adopting the above technical solution, by arranging the terminal display, the analyzed information is displayed, so as to facilitate the staff to analyze the data after the test.
[0020] Preferably, the interference lamp further includes a light intensity controller, and the light intensity controller is electrically connected to the processor.
[0021] By adopting the above technical solution, by setting up a light intensity controller to adjust the brightness of the interfering lamp, different levels of light wave interference can be simulated, and the performance of the integrated receiver under different interference degrees can be evaluated more comprehensively.
[0022] In summary, the present application includes at least one of the following beneficial technical effects:
[0023] 1. In practical applications, first install the integrated receiver on the power supply base to power on the integrated receiver. The power supply base simultaneously powers on the signal transmitter so that the signal transmitter emits an infrared signal. At this time, the interfering lamp makes the working cavity in a high light wave environment, and observe the working state of the integrated receiver to determine whether the integrated receiver can normally receive the infrared signal, so as to realize the test of the integrated receiver's resistance to light interference;
[0024] 2. By setting the lamp base to be detachably connected to the working box, it is convenient to replace the interfering lamp. By replacing different types of interfering lamps, different spectral interference environments can be simulated, thereby improving the effect of the test on the integrated receiver's resistance to light interference;
[0025] 3. By setting up a light intensity controller to adjust the brightness of the interfering lamp, different levels of light wave interference can be simulated, and the performance of the integrated receiver under different interference degrees can be evaluated more comprehensively. BRIEF DESCRIPTION OF THE DRAWINGS
[0026] Figure 1 is a schematic diagram of the overall structure of the anti-light interference test device in the embodiment of the present application;
[0027] Figure 2 is a schematic cross-sectional structure diagram of the anti-light interference test device in the embodiment of the present application.
[0028] Reference numerals: 1, working box; 11, working cavity; 12, opening; 2, power supply base; 3, signal transmitter; 4, interfering lamp; 41, lamp base; 42, lamp bulb; 5, integrated receiver. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0029] The following uses specific specific examples to illustrate the implementation manners of the present application. Those skilled in the art can easily understand other advantages and effects of the present application from the information disclosed in the present application. The present application can also be implemented or applied through other different specific implementation manners. Various details in the present application can also be modified or changed according to different viewpoints and application systems without departing from the spirit of the present application. It should be noted that, without conflict, the embodiments in the present application and the features in the embodiments can be combined with each other.
[0030] This application can be embodied in many different forms and is not limited to the embodiments described herein. In the description of this application, the reference to the representation of terms such as "one embodiment", "some embodiments", "example", "specific example", or "some examples" means that the specific features, structures, materials, or characteristics represented in connection with the embodiment or example are included in at least one embodiment or example of this application.
[0031] In the description of this application, the meaning of "a plurality" is two or more unless otherwise specifically defined.
[0032] The following Figure 1-2 will further elaborate on this application in detail.
[0033] An embodiment of this application discloses an anti-light interference test device for an integrated receiver.
[0034] Referring Figure 1 and Figure 2 , the anti-light interference test device includes a working box 1, a power-on seat 2, a signal transmitter 3, and an interference lamp 4. The working box 1 is arranged in an "L"-shaped box shape. A working cavity 11 is provided at the bottom of the working box 1, and an opening 12 is formed on one side of the working box 1, so that the working cavity 11 is communicated with the outside of the working box 1.
[0035] The power-on seat 2 is fixedly connected to the working box 1 and is located in the working cavity 11. The power-on seat 2 is connected to an external power supply. The signal transmitter 3 is installed at one end of the power-on seat 2 far from the opening 12 to achieve electrical connection between the signal transmitter 3 and the power-on seat 2. The integrated receiver 5 is installed at one end of the power-on seat 2 close to the opening 12 to achieve electrical connection between the integrated receiver 5 and the power-on seat 2. Among them, the interference lamp 4 is fixedly connected to the inner side wall of the working box 1 so that the interference lamp 4 is located in the working cavity 11. When the interference lamp 4 works, the working cavity 11 is in a high light wave environment.
[0036] In practical applications, first install the integrated receiver 5 to be tested on the power-on seat 2 so that the integrated receiver 5 is powered on. And because the signal transmitter 3 is electrically connected to the power-on seat 2, the signal transmitter 3 is powered on and works. The signal transmitter 3 emits an infrared signal, and the integrated receiver 5 receives the infrared signal. During this process, the interference lamp 4 makes the working cavity 11 in a high light wave environment, and observes the working state of the integrated receiver 5 to judge whether the integrated receiver 5 can normally receive the infrared signal, so as to realize the anti-light interference test of the integrated receiver 5.
[0037] In some embodiments, the interference lamp 4 is located between the signal transmitter 3 and the integrated receiver 5 to fully interfere with the infrared signal emitted by the signal transmitter 3, so as to ensure the interference effect of the interference lamp 4 on the infrared signal, and further improve the effect of the anti-light interference test of the integrated receiver 5.
[0038] In some embodiments, the interference lamp 4 includes a lamp base 41 and a plurality of bulbs 42. The lamp base 41 is fixedly connected to the inner side wall of the working box 1, and the lamp base 41 is electrically connected to the power supply socket 2. The plurality of bulbs 42 are installed on the lamp base 41 along the length direction of the lamp base 41, and each bulb 42 is electrically connected to the lamp base 41 to realize power supply to the bulbs 42. At the same time, since the lamp base 41 and the bulbs 42 have a certain length, there is a certain distance between the end of the power supply socket 2 far away from the opening 12 and the bulbs 42, so that the plurality of bulbs 42 are located between the signal transmitter 3 and the integrated receiver 5.
[0039] In some embodiments, the lamp base 41 is detachably connected to the working box 1 to facilitate the replacement of the entire interference lamp 4. By replacing the interference lamp 4 with different types of bulbs 42, such as LED lamps, incandescent lamps or halogen lamps, etc., an interference environment with different spectra can be simulated, thereby improving the effect of the anti-light interference test on the integrated receiver 5. It should be noted that in this embodiment, the lamp base 41 is fixedly connected to the working box 1 by bolts. In other embodiments, the detachable connection of the lamp base 41 can also be realized by plugging, clamping, etc., which is not limited in this application.
[0040] In some embodiments, the bulb 42 is detachably connected to the lamp base 41. The detachable manner can be, but is not limited to, screw connection, clamping, plugging, etc. In this way, when one of the bulbs 42 is damaged, it can be repaired or replaced individually, and the repair of the interference lamp 4 can be realized without disassembling the interference lamp 4, so as to facilitate the repair of the interference lamp 4.
[0041] In some embodiments, the anti-light interference test device further includes a processor (not shown in the figure). The processor is electrically connected to the power supply socket 2 to realize the electrical connection between the processor and the integrated receiver 5. In actual application, the processor receives the signal of the integrated receiver 5, automatically records and analyzes the signal, and the staff can make a judgment based on the analyzed information, thereby improving the effect of the anti-light interference test on the integrated receiver 5.
[0042] In some embodiments, the anti-light interference test device further includes a terminal display (not shown in the figure). The terminal display is electrically connected to the processor to display the analyzed information, so as to facilitate the staff to analyze the data after the test.
[0043] In some embodiments, the interference lamp 4 further includes a light intensity controller (not shown in the figure). The light intensity controller is electrically connected to the processor and is operated through the terminal display, so that the processor controls the light intensity controller to adjust the brightness of the interference lamp 4, and can simulate different levels of light wave interference to more comprehensively evaluate the performance of the integrated receiver under different interference degrees.
[0044] The implementation principle of this embodiment is as follows: In practical applications, first install the integrated receiver 5 to be tested on the power supply socket 2, so that the integrated receiver 5 is powered on. And since the signal transmitter 3 is electrically connected to the power supply socket 2, the signal transmitter 3 is powered on and works. The signal transmitter 3 emits an infrared signal, and the integrated receiver 5 receives this infrared signal. During this process, the interference lamp 4 makes the working cavity 11 in a high light wave environment, and observes the working state of the integrated receiver 5 to determine whether the integrated receiver 5 can normally receive the infrared signal, so as to realize the test of the integrated receiver 5 against optical interference.
[0045] The above are all the preferred embodiments of this application, and the protection scope of this application is not limited thereby. Therefore, all equivalent changes made according to the structure, shape, and principle of this application shall be covered within the protection scope of this application.
Claims
1. An anti-light interference test device for an integrated receiver, characterized in that: The invention comprises a working box (1), an energizing seat (2), a signal transmitter (3) and an interference lamp (4); a working chamber (11) is provided on one side of the working box (1); the energizing seat (2) is arranged in the working chamber (11); the signal transmitter (3) and an integrated receiver (5) are respectively electrically connected to two ends of the energizing seat (2); and the interference lamp (4) is arranged in the working chamber (11).
2. The anti-light interference test device for an integrated receiver according to claim 1, characterized in that: The interference lamp (4) is located between the signal transmitter (3) and the integrated receiver (5).
3. The anti-light interference test device for an integrated receiver according to claim 1, characterized in that: The interference lamp (4) comprises a lamp holder (41) and a plurality of light bulbs (42); the lamp holder (41) is arranged on the inner wall of the working box (1) and is electrically connected to the power supply holder (2); and the plurality of light bulbs (42) are arranged at intervals along the length direction of the lamp holder (41) and are electrically connected to the lamp holder (41).
4. The anti-light interference test device for an integrated receiver according to claim 3, characterized in that: The lamp holder (41) is detachably connected to the working box (1).
5. The anti-light interference test device for an integrated receiver according to claim 3, characterized in that: The light bulb (42) is detachably connected to the lamp holder (41).
6. The anti-light interference test device for an integrated receiver according to claim 1, characterized in that: The anti-light interference test device also includes a processor, the processor is electrically connected to the integrated receiver (5), and the processor is used to receive and process signals from the integrated receiver (5).
7. The anti-light interference test device for an integrated receiver according to claim 6, characterized in that: The anti-light interference testing device also includes a terminal display, and the terminal display is electrically connected to the processor.
8. The anti-light interference test device for an integrated receiver according to claim 7, characterized in that: The interference lamp (4) also includes a light intensity controller, and the light intensity controller is electrically connected to the processor.