Screening clamp of feed-through capacitor

Abstract

The utility model relates to a screening clamp for feed-through capacitors. The screening clamp comprises a first clamping seat and a second clamping seat which are detachably connected. The first clamping seat is provided with at least one first connecting part and m accommodating cavities; the first connecting part is provided with a first electric connecting point, a contact part electrically connected with the first electric connecting point is arranged in the accommodating cavity, and the contact part can be in contact with a shell of the feed-through capacitor in the accommodating cavity; the second clamping seat is provided with a second connecting part detachably connected with the first connecting part, m fasteners in one-to-one correspondence with the accommodating cavities, and an inserting structure; the second connecting part is provided with a second electric connecting point, and when the first connecting part is connected with the second connecting part, the second electric connecting point is in contact with the second electric connecting point; the plug-in structure is provided with first electrodes and second electrodes, each first electrode is electrically connected with one second electric connection point, and each second electrode is electrically connected with one fastener. The quick connector is simple in structure and convenient to disassemble and assemble, and can realize quick connection with a screening circuit.

Description

Technical Field

[0001] The utility model relates to the technical field of feedthrough capacitor detection, in particular to a screening fixture for feedthrough capacitors. Background Art

[0002] In order to improve the reliability of feedthrough capacitor filters and reduce the failure rate, early failure products are usually removed by aging screening tests. The aging screening test of feedthrough capacitors refers to selecting appropriate aging conditions (such as a high-temperature and high-voltage environment), and according to the set aging time, exposing the feedthrough capacitors to be tested in the aging environment for accelerated aging tests. In the screening process, one or more feedthrough capacitors are first installed on a fixture, so that the shell of the feedthrough capacitor contacts one electrode plate of the fixture, and the lead pins of the feedthrough capacitor contact the other electrode plate of the fixture. Then, the two electrode plates of the fixture are electrically connected to an aging substrate with a plug-in slot equipped in the screening device. A high-temperature environment is formed for the feedthrough capacitors in the screening device, and a high voltage is output to the feedthrough capacitors through the aging substrate for screening to judge the load capacity of the feedthrough capacitors for high temperature and high voltage. If the feedthrough capacitor does not show a short circuit or a current exceeding the set value within the specified time, it is a qualified product; otherwise, it is an unqualified product and needs to be removed.

[0003] To increase the number of feedthrough capacitors detected at one time, the existing technology uses an existing vertical plug-in screening fixture, which allows batch testing of multiple feedthrough capacitors at one time. For example, Chinese Patent CN215894776U provides a vertical plug-in screening fixture for feedthrough capacitor filters. The screening fixture of this patent includes an upper layer plate and a lower layer plate composed of a positioning plate and an insulating plate. A plurality of sleeves are penetrated in the upper layer plate, and a pressure pin is elastically connected in the sleeve. During the test, the shell of the feedthrough capacitor needs to be fixed on the lower layer plate first, then the pressure pin of the upper layer plate is pressed against the lead pins of the feedthrough capacitor, and then the fixture is connected to the screening circuit through a conducting wire. The overall structure of the fixture is relatively complex, the manufacturing cost is relatively high, and the fixture needs to be connected to the screening circuit through a conducting wire, so it is easily restricted by the circuit during installation and is inconvenient to disassemble and assemble. Summary of the Utility Model

[0004] Based on this, the purpose of the present utility model is to provide a screening fixture for feedthrough capacitors, which has a simple structure, is convenient to disassemble and assemble, and can realize quick connection with the screening circuit.

[0005] A screening fixture for a feedthrough capacitor, comprising a first clamping seat and a second clamping seat detachably connected; the first clamping seat has at least one first connecting component and m accommodating cavities, where m≥1; the first connecting component is provided with a first electrical connection point, and a contact component electrically connected to the first electrical connection point is arranged in the accommodating cavity, and the contact component can contact the shell of the feedthrough capacitor to be tested placed in the accommodating cavity; the second clamping seat has a second connecting component detachably connected to the first connecting component, a joining component for joining the leads of the feedthrough capacitor to be tested, and a plugging structure that can be reversibly plugged into a screening device; the second connecting component is provided with a second electrical connection point, and when the first connecting component is connected to the second connecting component, the second electrical connection point contacts the second electrical connection point; the plugging structure has a first electrode and a second electrode; the first electrode corresponds to the second electrical connection point one by one and is electrically connected to the second electrical connection point; the second electrode corresponds to the joining component one by one and is electrically connected to the joining component; the first electrode and the second electrode are respectively used for accessing a screening circuit.

[0006] The screening fixture for the feedthrough capacitor of the present utility model fixes at least one feedthrough capacitor through two detachably connected clamping seats, and can realize quick connection with a screening circuit through the plugging structure arranged on one of the clamping seats.

[0007] Further, when m≥2, the accommodating cavities and the joining components are both arranged in an array.

[0008] Further, the first clamping seat has two first connecting components, and the two first connecting components are respectively located on both sides of the first clamping seat along a first direction; the second clamping seat has two second connecting components, and the two first connecting components are respectively located on both sides of the second clamping seat along the first direction.

[0009] Further, the connection mode between the first connecting component and the second connecting component is plugging or buckling.

[0010] Further, the accommodating cavity is in the shape of a stepped hole, including a coaxial large through-hole and a small through-hole, the diameter of the large through-hole is greater than or equal to the maximum diameter of the shell of the feedthrough capacitor to be tested; the diameter of the small through-hole is less than the minimum diameter of the shell and greater than or equal to the diameter of the lead.

[0011] Further, the diameter of the large through-hole is 1.2 - 1.5 times the maximum diameter of the shell.

[0012] Further, the depth of the large through-hole is 0.8 - 1.0 times the height of the shell.

[0013] Further, the contact member includes a conductive ring disposed at the bottom of the large through-hole, through which the lead pin can pass and contact the housing of the feedthrough capacitor placed in the accommodation cavity.

[0014] Further, one end face of the joint member facing the accommodation cavity forms n inwardly recessed supporting grooves, where n ≥ 1.

[0015] Further, the plug-in structure is a gold finger.

[0016] For better understanding and implementation, the present utility model will be described in detail below with reference to the accompanying drawings. Description of the Drawings

[0017] Figure 1 is a schematic structural diagram of an existing feedthrough capacitor;

[0018] Figure 2 is a schematic structural diagram of an embodiment of a screening fixture for a feedthrough capacitor of the present utility model;

[0019] Figure 3 is a schematic structural diagram of a first clamping seat in an embodiment of a screening fixture for a feedthrough capacitor of the present utility model;

[0020] Figure 4 is a top view of an implementation manner of a first clamping seat in an embodiment of a screening fixture for a feedthrough capacitor of the present utility model;

[0021] Figure 5 is a partial cross-sectional view of a first clamping seat in an embodiment of a screening fixture for a feedthrough capacitor of the present utility model;

[0022] Figure 6 is a schematic structural diagram of a second clamping seat in an embodiment of a screening fixture for a feedthrough capacitor of the present utility model;

[0023] Figure 7 is a schematic structural diagram of an implementation manner of a joint member of a second clamping seat in an embodiment of a screening fixture for a feedthrough capacitor of the present utility model;

[0024] Figure 8 is a schematic structural diagram of the first clamping seat and the second clamping seat fixing the feedthrough capacitor in an embodiment of a screening fixture for a feedthrough capacitor of the present utility model;

[0025] Figure 9 is a top view of another implementation manner of a first clamping seat in an embodiment of a screening fixture for a feedthrough capacitor of the present utility model;

[0026] Figure 10A structural schematic diagram of another implementation manner of a joint member of a second clamping seat in one embodiment of a screening fixture for feedthrough capacitors of the utility model;

[0027] Reference numerals:

[0028] 1. Through-hole capacitor; 11. Shell; 12. Disc capacitor; 13. Lead pin;

[0029] 10. First clamping seat; 100. First clamping body; 1000. Accommodating cavity; 1001. Large through hole; 1002. Small through hole; 1003. Contact component; 1003a. Conductive ring; 1004. Conductive sheet; 102. First connecting component; 1020. First electrical connecting point;

[0030] 20, second clamping seat; 200, second clamping body; 2000, joint member; 2000a, supporting groove; 202, second connecting member; 2020, second electrical connection point; 204, plug-in structure; 2041, first electrode; 2042, second electrode; 201, first wiring; 203, second wiring;

[0031] D1, first direction; D2, second direction. DETAILED DESCRIPTION

[0032] It should be clear that the described embodiments are only some embodiments of the embodiments of the present application, rather than all embodiments. Based on the embodiments in the embodiments of the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the embodiments of the present application.

[0033] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "upper", "lower", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In the description of the present invention, unless otherwise specified, "multiple" means two or more.

[0034] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be an intermediate element. When an element is considered to be "connected" or "fixedly connected" to another element, it may be directly connected to the other element or there may be an intermediate element at the same time.

[0035] Existing feedthrough capacitors have many different shapes. Figure 1shows the structure of one of the existing feedthrough capacitors. As Figure 1 shown, the feedthrough capacitor 1 to be measured includes a housing 11, a disc-shaped capacitor 12 disposed inside the housing 11, and a pin 13 located at the central axis position of the housing 11 and passing through the housing 11 and the disc-shaped capacitor 12.

[0036] Figures 2 - 8 shows a specific structure of an embodiment of the screening fixture for the feedthrough capacitor of the present invention. As Figure 2 shown, the screening fixture for the feedthrough capacitor of this embodiment includes a first clamping seat 10 and a second clamping seat 20 that are detachably connected. During use, the feedthrough capacitor 1 to be measured is clamped between the first clamping seat 10 and the second clamping seat 20.

[0037] Specifically, as Figures 3 - 5 shown, the first clamping seat 10 is integrally in a long strip-shaped block structure, which includes a first clamping body 100 and first connecting components 102 provided at both ends of the first clamping body 100 along the first direction D1. The first clamping body 100 is provided with m accommodation cavities 1000, and each accommodation cavity 1000 can accommodate a housing 11 of a feedthrough capacitor 1 to be measured, where m≥1, and in this embodiment, m = 9, and the accommodation cavities 1000 are arranged in a single-row array. As shown in FIGS. 3 and Figure 5 shown, the accommodation cavity 1000 is in the shape of a stepped hole, which includes a coaxial circular large through-hole 1001 and a circular small through-hole 1002. The diameter of the large through-hole 1001 is greater than or equal to the maximum diameter of the housing 11 of the feedthrough capacitor 1 to allow the housing 11 to extend into the hole; the diameter of the small through-hole 1002 is smaller than the minimum diameter of the housing 11 and greater than or equal to the diameter of the pin 13 of the feedthrough capacitor 1 to allow the pin 13 to pass through, and at the same time prevent the housing 11 from further extending, playing a limiting role on the housing 11. When the feedthrough capacitor 1 to be measured is placed in the accommodation cavity 1000, the housing 11 is clamped in the large through-hole 1001, and one end of the pin 13 passes through the small through-hole 1002. The diameter of the large through-hole 1001 is preferably 1.2 - 1.5 times the maximum diameter of the housing 11 to ensure that the large through-hole 1001 plays a limiting role on the housing 11 in the horizontal direction. If the diameter of the large through-hole 1001 is too small, when placing the feedthrough capacitor 1 to be measured, the side wall of the large through-hole 1001 will form friction on the housing 11, causing damage to the housing 11; if the diameter of the large through-hole 1001 is too large, the virtual space between the large through-hole 1001 and the housing 11 is relatively large, which will weaken or even invalidate the limiting effect on the housing 11, and the feedthrough capacitor 1 to be measured is prone to displacement. In addition, the depth of the large through-hole 1001 is preferably 0.8 - 1.0 times the height of the housing 11 to ensure that the large through-hole 1001 plays a limiting role on the housing 11 in the vertical direction. If the depth of the large through-hole 1001 is too small, the feedthrough capacitor 1 to be measured is prone to tipping or even falling; if the depth is too large, it will affect the installation of the feedthrough capacitor 1 to be measured.

[0038] A contact component 1003 is provided in the accommodating cavity 1000, and the contact component 1003 includes a conductive ring 1003a. The conductive ring 1003a is arranged at the bottom of the large through hole 1001. When the through-hole capacitor 1 to be tested is placed in the accommodating cavity 1000, the conductive ring 1003a contacts the shell 11 of the through-hole capacitor 1 to be tested. Two adjacent conductive rings 1003a are connected by an inverted "U"-shaped conductive sheet 1004. The first connecting component 102 is provided with a first electrical connection point 1020, and the first electrical connection points 1020 in the two first connecting components 102 are respectively connected to the conductive rings 1003a in the adjacent accommodating cavity 1000 through the conductive sheet 1004.

[0039] like Figure 6 As shown, the second clamping seat 20 is a rectangular "T" plate-shaped structure as a whole, which includes a second clamping body 200 and two second connecting parts 202 disposed on the second clamping body 200 and detachably connected to the first connecting part 102, and a plug-in structure 204 disposed on the second clamping body 200. The two second connecting parts 202 are located on both sides of the second clamping body 200 along the first direction D1, and the plug-in structure 204 is located on one side of the second clamping body 200 along the second direction D2, wherein the second direction D2 is perpendicular to the first direction D1.

[0040] The two second connecting parts 202 are respectively provided with a second electrical connection point 2020. When the second connecting part 202 is connected to the first connecting part 102, the second electrical connection point 2020 will contact the first electrical connection point 1020. Here, the detachable connection between the first connecting part 102 and the second connecting part 202 includes plugging, buckling or fixing by fasteners. In this embodiment, the detachable connection between the two is plugging, specifically: the first connecting part 102 is a slot, and the second connecting part 202 is a plug board adapted to the slot, and the first clamping seat 10 and the second clamping seat 20 are connected by plugging the first connecting part 102 and the second connecting part 202.

[0041] The other side of the second clamping body 200 along the second direction D2 relative to the plug-in structure 204 is provided with a coupling member 2000 which is arranged in a single row array and is used to couple the lead pins 13 of the through-hole capacitor 1 to be tested. Figure 7 As shown, the joint member 2000 is a cylinder, and its end surface facing the accommodating cavity 1000 is a supporting surface for abutting the end of the guide needle 13. The supporting surface is preferably an arc surface concave inward to form a supporting groove 2000a, so that when the end of the guide needle 13 abuts against the joint member 2000, it can be fixed in the supporting groove 2000a to prevent the guide needle 13 from detaching from the joint member 2000.

[0042] The plug-in structure 204 is specifically a gold finger, which includes a first electrode 2041 and a second electrode 2042. Each first electrode 2041 is electrically connected to the second electrical connection point 2020 of a first connection component 102 through a first wiring 201, and each second electrode 2042 is electrically connected to a bonding component 2000 through a second wiring 203.

[0043] In the above screening fixture, the accommodating cavities 1000 on the first clamping seat 10 can also be distributed in a matrix array of a rows and b columns (for example, in a matrix array of 3 rows and 3 columns). Correspondingly, the bonding components 2000 on the second clamping seat 20 are also distributed in a matrix array of a rows and b columns. The above first electrodes 2041 and second electrodes 2042, bonding components 2000, contact components 1003, and first electrical connection points 1020 and second electrical connection points 2020 are all conductive metals. In this way, when the first electrode 2041 and the second electrode 2042 are respectively connected to the positive and negative poles of the screening circuit, the current flows through the first electrode 2041, the first wiring 201, the second electrical connection point 2020, the first electrical connection point 1020, the conductive sheet 1004, the conductive ring 1003a, the to-be-tested feedthrough capacitor 1, the bonding component 2000, the second wiring 203, and the second electrode 2042 in sequence, forming a circuit loop. And the to-be-tested feedthrough capacitors 1 to be tested are connected in parallel, so they will not affect each other.

[0044] As an optional way, the above first clamping seat 10 can have only one first connection component 102. Correspondingly, the second clamping seat 20 can also have only one second connection component 202, as long as it is ensured that the to-be-tested feedthrough capacitors 1 are connected in parallel. Of course, by plugging two first connection components 102 into two second connection components 202 respectively, the to-be-tested feedthrough capacitor 1 can be better clamped between the first clamping seat 10 and the second clamping seat 20, avoiding its displacement, poor contact or even dropping.

[0045] As Figure 8 shown, before the test, the to-be-tested feedthrough capacitor 1 to be tested is placed upside down in the accommodating cavity 1000, so that the housing 11 of the to-be-tested feedthrough capacitor 1 contacts the contact component 1003 in the accommodating cavity 1000, but the contact component 1003 does not contact the lead pin 13; then the second clamping seat 20 is brought close to the first clamping seat 10, so that each bonding component 2000 respectively abuts against the lead pin 13 of a to-be-tested feedthrough capacitor 1, and through the cooperation of the first connection component 102 and the second connection component 202, the second clamping seat 20 is connected to the first clamping seat 10, and the to-be-tested feedthrough capacitor 1 is firmly clamped between the first clamping seat 10 and the second clamping seat 20.

[0046] The screening device (not shown) is usually provided with an aging substrate (not shown) as a connection area for the through-hole capacitor 1 to be tested to be connected to the screening circuit, and the existing aging substrate (not shown) is usually provided with a plurality of plug-in slots. After the through-hole capacitor 1 to be tested is fixed between the first clamping seat 10 and the second clamping seat 20, the plug-in structure 204 of the second clamping seat 20 is inserted into the plug-in slot of the aging substrate (not shown), so that the first electrode 2041 and the second electrode 2042 are respectively electrically connected to the positive electrode and the negative electrode of the screening circuit (not shown).

[0047] During the test, the screening device (not shown) outputs a high voltage. If the detection unit of the screening device (not shown) detects that a short circuit occurs in the circuit loop where the through-hole capacitor 1 to be tested is located or the current flowing through the circuit loop exceeds the set value, it indicates that the through-hole capacitor 1 to be tested in the circuit loop is in an abnormal state (for example, the disc capacitor in the through-hole capacitor 1 to be tested is broken down), then the through-hole capacitor 1 to be tested is a defective product.

[0048] In this way, the through-hole capacitor 1 to be tested is reversibly fixed by cooperating with the detachable first clamping seat 10 and the second clamping seat 20, and the second clamping seat 20 is vertically inserted into the plug-in slot of the aging substrate (not shown) through the plug-in structure 204 of the second clamping seat 20 to achieve a quick connection with the screening circuit. After the test is completed, the second clamping seat 20 is pulled out and the second clamping seat 20 is separated from the first clamping seat 10, and the through-hole capacitor 1 to be tested that has been tested can be taken out to continue testing the next batch of through-hole capacitors 1 to be tested.

[0049] In other embodiments, one joint member 2000 may correspond to multiple accommodating cavities 1000, so that one joint member 2000 can simultaneously connect the lead pins 13 of multiple through-hole capacitors 1 to be tested. The following description will be made by taking one joint member 2000 corresponding to three accommodating cavities 1000 as an example. Figures 9 - 10 As shown, in this embodiment, the accommodating chambers 1000 are arranged in a matrix array of 3 rows and 9 columns, and the coupling members 2000 are arranged in a single-row matrix. Each coupling member 2000 is provided with 3 supporting grooves 2000a, which can respectively engage the lead pins 13 of the 3 through-hole capacitors 1 to be tested in the same column. These 3 through-hole capacitors 1 to be tested are connected in parallel, which is equivalent to forming a large through-hole capacitor 1 to be tested. At the same time, the through-hole capacitors 1 to be tested connected by different coupling members 2000 are also connected in parallel.

[0050] During the test, the screening device (not shown) outputs a high voltage. If the detection unit of the screening device (not shown) detects that the circuit loop where the same group of through-hole capacitors 1 to be tested is short-circuited or the current flowing through the circuit loop exceeds the set value, it means that at least one through-hole capacitor 1 to be tested in the circuit loop is in an abnormal state. In order to determine which one or several through-hole capacitors 1 to be tested in the group of through-hole capacitors 1 to be tested are short-circuited due to being in an abnormal state, further manual detection with a detection instrument is required to screen out unqualified products.

[0051] The above two implementations of joining the lead pin 13 of a through-hole capacitor 1 to be tested by a joint 2000 and joining the lead pins 13 of multiple through-hole capacitors 1 to be tested by a joint 2000 have their own advantages and disadvantages: the implementation of joining the lead pin 13 of a through-hole capacitor 1 to be tested by a joint 2000 does not require additional manual operations and has high detection efficiency, but due to space limitations, it is only applicable to through-hole capacitors with smaller volumes. The implementation of joining the lead pins 13 of multiple through-hole capacitors 1 to be tested by a joint 2000 can be used for large-scale initial screening, with low cost, but requires manual detection for further confirmation.

[0052] Compared with the prior art, the screening fixture for through-hole capacitors described in the utility model fixes at least one through-hole capacitor to be tested through two detachably connected clamping seats, and is quickly connected to the screening circuit through a plug-in structure provided on one of the clamping seats. The utility model has a simple overall structure, can fix the through-hole capacitor to be tested in the fixture and connect it to the screening circuit, is easy to disassemble and assemble, simple to operate, and highly practical.

[0053] The above-mentioned embodiments only express several implementation methods of the utility model, and the description is relatively specific and detailed, but it cannot be understood as limiting the scope of the utility model patent. It should be pointed out that for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the utility model, and the utility model is also intended to include these modifications and modifications.

Claims

1. A screening fixture for feedthrough capacitors, characterized in that: It comprises a first clamping seat (10) and a second clamping seat (20) which are detachably connected; The first clamping seat (10) has at least one first connecting component (102) and m accommodating cavities (1000), wherein m≥1; the first connecting component (102) is provided with a first electrical connection point (1020), the accommodating cavity (1000) is provided with a contact component (1003) electrically connected to the first electrical connection point (1020), and the contact component (1003) can contact the shell (11) of the through-hole capacitor (1) to be tested placed in the accommodating cavity; The second clamping seat (20) comprises a second connecting component (202) detachably connected to the first connecting component (102), a coupling member (2000) for coupling with the lead pin (13) of the through-hole capacitor (1) to be tested, and a plug-in structure (204) reversibly pluggable with a screening device; The second connecting component (202) is provided with a second electrical connection point (2020), and when the first connecting component (102) is connected to the second connecting component (202), the second electrical connection point (2020) contacts the second electrical connection point (2020); The plug-in structure (204) comprises a first electrode (2041) and a second electrode (2042); the first electrode (2041) corresponds one-to-one to the second electrical connection point (2020) and is electrically connected to the second electrical connection point (2020); the second electrode (2042) corresponds one-to-one to the joint member (2000) and is electrically connected to the joint member (2000); the first electrode (2041) and the second electrode (2042) are respectively used for connecting to a screening circuit.

2. The screening fixture for feedthrough capacitors according to claim 1, characterized in that: When m≥2, the accommodating cavity (1000) and the engaging member (2000) are both distributed in an array.

3. The screening fixture for feedthrough capacitors according to claim 1, characterized in that: The first clamping seat (10) has two first connecting parts (102), and the two first connecting parts (102) are respectively located on two sides of the first clamping seat (10) along the first direction; The second clamping seat (20) has two second connecting parts (202), and the two first connecting parts (102) are respectively located on two sides of the second clamping seat (20) along the first direction.

4. The screening fixture for feedthrough capacitors according to claim 1, characterized in that: The first connecting component (102) and the second connecting component (202) are connected in a plug-in or snap-on manner.

5. The screening fixture for feedthrough capacitors according to claim 1, characterized in that: The accommodating cavity (1000) is in the shape of a stepped hole, comprising a coaxial large through hole (1001) and a small through hole (1002); the diameter of the large through hole (1001) is greater than or equal to the maximum diameter of the shell (11) of the through-hole capacitor (1) to be tested; the diameter of the small through hole (1002) is less than the minimum diameter of the shell (11) and greater than or equal to the diameter of the lead pin (13).

6. The screening fixture for feedthrough capacitors according to claim 5, characterized in that: The diameter of the large through hole (1001) is 1.2-1.5 times the maximum diameter of the shell (11).

7. The screening fixture for feedthrough capacitors according to claim 6, characterized in that: The depth of the large through hole (1001) is 0.8-1.0 times the height of the housing (11).

8. The screening fixture for feedthrough capacitors according to claim 5, characterized in that: The contact component (1003) comprises a conductive ring (1003a), which is arranged at the bottom of the large through hole (1001) and allows the lead pin (13) to pass through and contact the shell (11) of the through-hole capacitor (1) to be tested placed in the accommodating cavity (1000).

9. The screening fixture for feedthrough capacitors according to claim 1, characterized in that: The end surface of the joint member (2000) facing the accommodating cavity (1000) is formed with n inwardly recessed supporting grooves (2000a), wherein n≥1.

10. The screening fixture for feedthrough capacitors according to claim 1, characterized in that: The plug-in structure (204) is a gold finger.

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