Low-resistance POGO PIN test probe

Abstract

The utility model discloses a low resistance POGO PIN test probe, one end of a first probe head and one end of a second probe head are respectively arranged in a tube body in a sliding manner, a spring is arranged in a middle cavity, two ends of the spring are respectively abutted against the first probe head and the second probe head, the spring comprises a middle section, a first inclined section and a second inclined section, and the first inclined section and the second inclined section are arranged at two ends of the spring. The first inclined section abuts against the first needle head, the second inclined section abuts against the second needle head, the vertical projection of the side wall of one side of the first inclined section and the vertical projection of the side wall of one side of the second inclined section coincide with the cambered surface side wall of the middle section, the other side of the first inclined section and the other side of the second inclined section are inclined sides, and the width of the first inclined section and the width of the second inclined section are gradually increased in the extending direction from the ends to the middle section. According to the utility model, the inclined section generates a large acting force in the inclined direction when the needle head is pressed downwards, so that the needle head can be pushed upwards while applying an acting force in the horizontal direction to the needle head to abut against the inner wall of the tube body, the contact stability of the needle head and the tube body is ensured, and the contact resistance value of the probe is effectively reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of test probe devices, in particular to a low-resistance POGO PIN test probe. Background Art

[0002] In the prior art, the conventional POGO PIN test probe is assembled from four parts: an upper needle, a lower needle, a spring, and a tube body, and is commonly used for QFN package testing. During the test, the needle of the conventional POGO PIN probe contacts the object to be tested and then presses down. During the pressing process, the spring reaction force pushes the needle, but the spring has a certain flexibility, and the direction of its reaction force is random and unrestricted. This will cause the upper needle to have insufficient contact or virtual contact with the inside of the tube body, thereby affecting the accuracy and service life of the test. In this case, the test board will be mistested, and the test efficiency will be greatly reduced.

[0003] Moreover, with the development of high-end test chip field, the requirements for POGO PIN probe test life and test resistance stability are getting higher and higher. Conventional POGO PIN test probes can no longer meet the existing market demand due to the above shortcomings. Conventional POGO PIN test impedance is high and test accuracy is low, resulting in a shorter life of the probe used by customers, which cannot meet the client's requirements for high life and high test accuracy.

[0004] In the prior art, such as the contact probe and the socket for testing electrical components with application number 202111319070.X, the eccentric structure (irregular structure) of the spring positioning part on the plunger (needle) is used to increase the contact load of the contact probe and reduce the resistance value of the contact probe that is greater than the allowable resistance value, thereby improving the reliability of the electrical test of the socket. However, it changes the structure of the needle, which, on the one hand, increases the number of processing steps and the difficulty of processing the needle, and the special-shaped needle structure is also easily damaged. Utility Model Content

[0005] The purpose of the utility model is to provide a low-resistance POGO PIN test probe, which abuts against a needle through the inclined section on the spring. When the inclined section is pressed down by the needle, it generates a large force in the inclined direction, which can push the needle upward and apply a force in the horizontal direction to the needle to abut the needle against the inner wall of the tube body, thereby avoiding virtual contact between the needle and the tube body, ensuring the stability of the contact between the two, and effectively reducing the contact resistance of the probe.

[0006] To achieve the above-mentioned purpose, the technical solution adopted by the utility model is: a low-resistance POGO PIN test probe, comprising a tube body, a first needle, a second needle and a spring, one end of the first needle and the second needle are respectively slidably arranged in the middle cavity of the tube body, the spring is arranged in the middle cavity and the two ends are respectively abutted against the first needle and the second needle, the spring comprises a middle section, and a first inclined section and a second inclined section respectively connected to the two ends of the middle section, the first inclined section is abutted against the first needle, the second inclined section is abutted against the second needle, the vertical projection of the side wall on one side of the first inclined section and the second inclined section coincides with the arc side wall of the middle section, the other side is an inclined side, and the width of the first inclined section and the second inclined section gradually increases from their respective ends to the middle section.

[0007] As a further optimization, the vertical projection of the side wall of the non-inclined side of the first inclined section and / or the second inclined section is a semicircular arc, and the semicircular arc structure has a larger contact surface to abut against the side wall of the tube body.

[0008] As a further optimization, the angle between the central axis of the first inclined section and / or the second inclined section and the central axis of the middle section is α, 5°≤α≤20°, preferably α=15°.

[0009] As a further optimization, the width of the middle section is 0.35-0.4 cm, and the width of the first inclined section and the second inclined section at one end away from the middle section is 0.28-0.31 cm.

[0010] As a further optimization, the first inclined section and the second inclined section are symmetrically arranged, so that when the first inclined section and the second inclined section apply a reaction force to the first needle and the second needle, the overall stability of the spring can be maintained to avoid generating torque.

[0011] As a further optimization, the material of the spring is piano wire.

[0012] As a further optimization, the surface of the spring is provided with a nickel-plated and gold-plated coating.

[0013] As a further optimization, the first needle and the second needle are made of beryllium copper, and both are provided with nickel-plated and gold-plated coatings; the inner walls at both ends of the tube body are provided with gold-plated coatings, which can achieve smoother contact and movement of the needle therein.

[0014] Compared with the prior art, the utility model has the following beneficial effects:

[0015] The inclined section on the spring is in contact with the needle, and when the inclined section is pressed down by the needle, it generates a large force in the inclined direction. The needle can be pushed upward and a horizontal force is applied to the needle to make the needle contact with the inner wall of the tube body, thereby avoiding virtual contact between the needle and the tube body, ensuring the stability of the contact between the two, and effectively reducing the contact resistance of the probe. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a structural diagram of the utility model.

[0017] Figure 2 It is a structural diagram of the spring of the utility model.

[0018] Figure 3 It is a schematic diagram of the connection between the first needle and / or the second needle and the spring of the utility model.

[0019] Figure 4 It is a schematic diagram of the application state of the utility model. DETAILED DESCRIPTION

[0020] The following are specific embodiments of the present invention and the accompanying drawings to further describe the technical solution of the present invention, but the present invention is not limited to these embodiments.

[0021] like Figures 1 to 3 As shown, a low resistance POGO PIN test probe comprises a tube body 10, a first needle 21, a second needle 22 and a spring 30. One end of each of the first needle 21 and the second needle 22 is slidably disposed in a middle cavity 100 of the tube body 10. The spring 30 is disposed in the middle cavity 100 and its two ends are respectively in contact with the first needle 21 and the second needle 22. The spring 30 comprises a middle section 31, and a first inclined section 32 and a second inclined section 33 respectively connected to the two ends of the middle section 31. The first inclined section 32 and the second inclined section 33 are symmetrically disposed. The first inclined section 32 is in contact with the first needle 21. The second inclined section 33 abuts against the second needle 22, that is, the contact tip 2b on the needles (the first needle 21 and the second needle 22) located in the middle cavity 100 extends into the first inclined section 32 and the second inclined section 33, and the column 2a on the needle located in the middle cavity 100 moves in the middle cavity 100, and the vertical projections of the side walls on one side of the first inclined section 32 and the second inclined section 33 coincide with the arcuate side wall of the middle section 31, and the other side is the inclined side, and the widths of the first inclined section 32 and the second inclined section 33 increase from their respective ends to the middle section 31.

[0022] In the present invention, the structure of the middle section 31 is a conventional spring structure, and the widths of the first inclined section 32 and the second inclined section 33 at the opposite ends thereof gradually narrow along their respective extension directions, that is, the formed inner diameter gradually narrows, and because the side wall on one side and the side wall of the middle section 31 are located in the same arc surface, and the other side is an inclined side, wherein the axis thereof and the central axis of the middle section 31 have a certain angle, when the test probe performs a test action, the compressed first needle 21 and the second needle 22 are respectively pressed toward the first inclined section 32 and the second inclined section 33, for example, the first needle 21 moves downward to press the first inclined section 32, but due to the inclined state of the first inclined section 32, the side wall on the contact tip 2b of the first needle 21 located in the same horizontal plane can only partially contact the first inclined section 32, that is, the contact tip 2b first contacts the inclined side of the first inclined section 32, combined with Figure 4 As shown, during the process of pressing down the inclined side, the inclined side exerts an inclined reaction force on the contact tip 2b due to the elastic force, that is, the force F of the first inclined section 32 on the first needle 21 1 According to the force analysis, the first inclined section 32 forms a vertical force F on the first needle 21. 11 The first needle 21 forms a first contact surface with the upper edge of the tube body 10, and forms a horizontal component force F 12 The first needle 21 forms a second contact surface with the inner wall of the tube body 10. Similarly, the force F acting on the second needle 22 by the second inclined section 33 is 2 The second inclined section 33 also forms a vertical force F on the second needle 22. 21 The second needle 22 forms a third contact surface with the lower edge of the tube body 10, and forms a horizontal component force F 22 The second needle 22 forms a fourth contact surface with the inner wall of the tube body 10, that is, the first needle 21 and the second needle 22 are respectively pushed horizontally to abut against part of the inner wall of the tube body 10, and the abutment is maintained when the spring 30 is compressed. Therefore, the first needle 21 and the second needle 22 can be kept in full and stable contact with the inner wall of the tube body 10, avoiding possible shaking of the first needle 21 and the second needle 22, or virtual contact with the inner wall of the tube body 10, which can effectively reduce the contact resistance of the probe.

[0023] Furthermore, the vertical projection of the side wall on the non-inclined side of the first inclined section 32 and the second inclined section 33 is a semicircular arc, that is, the side opposite to the inclined side is a semicircular arc structure. On the one hand, it is the same as the structure of the middle section 31, realizing a smooth transition between the first inclined section 32 and the second inclined section 33 and the middle section 31 respectively. On the other hand, the semicircular arc structure has a larger area, which can make it easier to find the contact surface and achieve abutment when abutting against the inner wall of the tube body 10.

[0024] In addition, the angle between the central axis of the first inclined section 32 and the second inclined section 33 and the central axis of the middle section 31 is α, 5°≤α≤20°, preferably α=15°, which can not only ensure the abutment with the contact tip 2b, but also provide a certain strength of reaction force in the horizontal direction.

[0025] In the present invention, the width of the first inclined section 32 and the second inclined section 33 at the end away from the middle section 31 is 0.29 cm, and the outermost four circles of the two are progressively increased, with 0.02 cm as a gear, until the width of the middle section 31 is 0.375 cm.

[0026] More preferably, the material of spring 30 is piano steel wire, which is integrally processed and has a nickel-plated and gold-plated coating on its surface, which can effectively improve its corrosion resistance and make it more wear-resistant, tough and elastic. When the stroke is 0.6mm, the elastic force is 25G±10%, and the elastic force stability is better, with a deviation value within 10%.

[0027] The first needle 21 and the second needle 22 are made of beryllium copper, and both are provided with nickel-plated and gold-plated coatings, which can improve the wear resistance and corrosion resistance of the needles, improve the test stability and service life. The inner walls of both ends of the tube body 10 are provided with gold-plated coatings, and the inner walls are uniform and have a high degree of finish. During the test, the inner wall of the tube body 10 contacts the needle more smoothly and is pressed down more smoothly, the contact resistance is more stable, and the wear resistance of the tube is also better.

[0028] After testing, the resistance data value of the test probe of the utility model is stable within 50mΩ, which is lower than 60-100mΩ of the conventional POGOPIN probe.

[0029] The specific embodiments described herein are merely examples of the spirit of the present invention. Those skilled in the art may make various modifications or additions to the specific embodiments described or replace them in similar ways, but they will not deviate from the spirit of the present invention or exceed the scope defined by the appended claims.

Claims

1. A low resistance POGO PIN test probe, comprising a tube body, a first needle, a second needle and a spring, wherein one end of the first needle and the second needle are respectively slidably disposed in the middle cavity of the tube body, the spring is disposed in the middle cavity and the two ends thereof are respectively in contact with the first needle and the second needle, characterized in that: The spring includes a middle section, and a first inclined section and a second inclined section respectively connected to the two ends of the middle section, the first inclined section abuts against the first needle head, the second inclined section abuts against the second needle head, the vertical projections of the side walls on one side of the first inclined section and the second inclined section coincide with the arc side wall of the middle section, and the other side is an inclined side, and the widths of the first inclined section and the second inclined section increase gradually from their respective ends to the middle section.

2. The low resistance POGO PIN test probe according to claim 1, characterized in that: A vertical projection of a side wall on a non-inclined side of the first inclined section and / or the second inclined section is a semicircular arc.

3. The low resistance POGO PIN test probe according to claim 1 or 2, characterized in that: The angle between the central axis of the first inclined section and / or the second inclined section and the central axis of the middle section is α, 5°≤α≤20°.

4. The low resistance POGO PIN test probe according to claim 3, characterized in that: α＝15°。 5. The low resistance POGO PIN test probe according to claim 1, characterized in that: The width of the middle section is 0.35-0.4 cm, and the width of the first inclined section and the second inclined section at one end away from the middle section is 0.28-0.31 cm.

6. The low resistance POGO PIN test probe according to claim 1, characterized in that: The first inclined section and the second inclined section are symmetrically arranged.

7. The low resistance POGO PIN test probe according to claim 1, characterized in that: The material of the spring is piano wire.

8. The low resistance POGO PIN test probe according to claim 7, characterized in that: The surface of the spring is provided with nickel-plated and gold-plated coatings.

9. The low resistance POGO PIN test probe according to claim 1, characterized in that: The first needle and the second needle are made of beryllium copper, and both are provided with nickel-plated and gold-plated coatings; the inner walls of both ends of the tube body are provided with gold-plated coatings.

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