Multi-station test sorting machine

Abstract

The utility model relates to the technical field of sorting machines, and discloses a multi-station test sorting machine, which comprises a sorting machine main body, a multi-shaft moving test head and a plurality of test discs, the multi-shaft moving test head and the test discs are arranged on the sorting machine main body, a door frame is arranged on the outer wall of the sorting machine main body, the door frame corresponds to a side edge opening of the sorting machine main body, and a protective door is rotatably connected in the door frame. A plurality of multi-section telescopic sliding rails are fixedly installed in the sorting machine body, a plurality of test discs are installed on the multi-section telescopic sliding rails respectively, the test discs are movably and slidably connected into the sorting machine body through the multi-section telescopic sliding rails, and a cleaning unit is installed on the side wall of the protective door. According to the utility model, the rotatable protective door is arranged on the sorting machine main body, the test disc can slide out of the sorting machine main body through the multi-section telescopic slide rail, so that a chip can be conveniently placed on the test disc and can be conveniently taken out of the test disc, and the possibility that dust enters the sorting machine main body can be reduced by the inclined protective door, so that the practicability is improved; and the chip can be conveniently tested.

Description

Technical Field

[0001] The utility model relates to the technical field of sorting machines, in particular to a multi-station test sorting machine. Background Technique

[0002] Semiconductor manufacturing is the production link with the highest industrial technology difficulty mastered by humans so far. After its production and manufacturing are completed, semiconductor devices need to be automatically conveyed to the test station one by one. The pins of the chips to be tested are connected to the functional modules of the tester through the bases and special connecting wires on the test station. The test sorting machine applies input signals to the chips and collects output signals to determine whether the functions and performances of the chips meet the design specification requirements.

[0003] The prior art such as the patent with the publication number of CN220862098U discloses a multi-station test sorting machine, including a sorting machine body. A frame is fixedly installed on the surface of the sorting machine body. A sliding plate is slidably connected to the bottom surface of the frame. An adjusting plate is slidably connected to the bottom surface of the sliding plate. A test head is arranged on the bottom surface of the adjusting plate. A test disk is slidably connected to the surface of the sorting machine body. A controller is arranged on the right side of the frame. A fixing block is fixedly installed on the surface of the frame, and a baffle is inserted into the fixing block. In this utility model, the inside of the sorting machine body can be protected by using the baffle to prevent dust and sundries from entering the inside of the sorting machine body, causing pollution to the test disk and the test head and affecting the test function of the chips. By using the placement box, it is convenient for personnel to remove the baffle and place it in the placement box, facilitating the use of the baffle by personnel.

[0004] The prior art still has deficiencies:

[0005] When the multi-station test sorting machine in the above prior art needs to place chips on the test disk, the baffle needs to be in an open state for a long time to place the chips on the test disk. The baffle in the normally open state is still likely to cause dust to enter. At the same time, it is necessary to place the chips on the test disk or take them out from the test disk inside the sorting machine body, and it is not easy to pick up and place the chips. For this reason, a multi-station test sorting machine is proposed. Content of the Utility Model

[0006] Aiming at the deficiencies of the prior art, the utility model provides a multi-station test sorting machine, which is convenient for testing chips, convenient for picking up and placing chips, and at the same time reduces the possibility of dust entering the sorting machine and affecting the test effect.

[0007] To achieve the above object, the present utility model provides the following technical solutions: A multi-station test and sorting machine, comprising a sorting machine main body, a multi-axis moving test head installed on the sorting machine main body, and multiple test plates. A door frame is installed on the outer wall of the sorting machine main body, corresponding to the side opening of the sorting machine main body. A protective door is rotatably connected inside the door frame. Multiple multi-section telescopic slide rails are fixedly installed inside the sorting machine main body, and multiple test plates are respectively installed on the multiple multi-section telescopic slide rails. The test plates are movably slidably connected inside the sorting machine main body through the multi-section telescopic slide rails. A cleaning unit is installed on the side wall of the protective door.

[0008] Preferably, a sealing groove is provided on the inner wall of the outer side of the door frame, and the upper end of the protective door is rotatably connected inside the sealing groove.

[0009] Preferably, the protective door includes a glass frame door rotatably connected to the inner wall of the sealing groove. A narrow door is rotatably connected to the lower end of the glass frame door. The upper end height of the narrow door is the upper surface of the test plate. A handle is fixedly connected to the outer wall of the narrow door. The cleaning unit is installed inside the narrow door.

[0010] Preferably, the cleaning unit includes a fixed air pipe fixedly installed inside the narrow door. A plurality of air jet heads are fixedly communicated with the outer wall of the fixed air pipe. A conveying air pipe is fixedly communicated with the outer wall of the fixed air pipe, and one end of the conveying air pipe penetrates to the outside of the narrow door.

[0011] Preferably, the air jet heads are obliquely distributed, and the output end height of the air jet heads is higher than the upper surface of the test plate.

[0012] Preferably, an air extraction hood communicated with the inside thereof is fixedly installed on the back of the sorting machine main body, and an air extraction pipe is fixedly communicated with the outer end of the air extraction hood.

[0013] Preferably, a plurality of partition plates are fixedly connected to the inner wall of the air extraction hood, and the suction force output by the air extraction pipe is dispersed by the plurality of partition plates.

[0014] Compared with the prior art, the present utility model has the following beneficial effects:

[0015] 1. By installing a rotatable protective door on the sorting machine main body in the present utility model, the test plate can slide out of the sorting machine main body through the multi-section telescopic slide rail, which is convenient for putting the chip on the test plate and taking the chip off the test plate. The inclined protective door can reduce the possibility of dust entering the inside of the sorting machine main body, improve the practicability, and facilitate the testing of the chip.

[0016] 2. The protective door in the present utility model is composed of a glass frame door and a narrow door. Therefore, when it is necessary to place or take the chip on the test plate, only the narrow door needs to be opened to pull out the test plate from the sorting machine main body, reducing the area of opening the sorting machine main body, and thus reducing the entry of dust.

[0017] 3. In the present utility model, a cleaning unit is installed on the narrow door, and an air extraction structure composed of an air extraction hood, an air extraction pipe, and a partition plate is installed on the main body of the sorting machine. When the test tray with chips is pushed into the main body of the sorting machine, the surface can be cleaned by the cleaning unit. At the same time, after the narrow door is closed, the cleaning unit can also blow the dust on the test tray and the chips towards the air extraction hood, and cooperate with the suction force of the air extraction pipe to suck away the dust inside the main body of the sorting machine, thereby cleaning the inside of the main body of the sorting machine and improving the accuracy of chip testing.

[0018] Other features and advantages of the present utility model will be described in the following description, and in part, will be obvious from the description, or can be understood by implementing the present utility model. The objectives and other advantages of the present utility model can be achieved and obtained through the structures pointed out in the description, claims, and drawings. Brief Description of the Drawings

[0019] Figure 1 is a schematic diagram of the overall structure of the present utility model;

[0020] Figure 2 is a schematic diagram of another state structure of the test tray of the present utility model;

[0021] Figure 3 is a schematic diagram of the structure when the protective door of the present utility model is fully opened;

[0022] Figure 4 is a schematic diagram of the position structure of the air extraction pipe and the air extraction hood of the present utility model;

[0023] Figure 5 is a schematic diagram of the structure of the protective door and the cleaning unit of the present utility model.

[0024] In the figure: 1, main body of the sorting machine; 2, test head; 3, door frame; 4, protective door; 41, glass frame door; 42, narrow door; 43, handle; 5, multi-joint telescopic slide rail; 6, test tray; 7, cleaning unit; 71, fixed air pipe; 72, air jet head; 73, conveying air pipe; 8, air extraction hood; 9, air extraction pipe; 10, partition plate; 11, sealing groove. Detailed Embodiment

[0025] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present utility model.

[0026] Please refer to Figures 1-5, the multi-station test and sorting machine of this embodiment includes a sorting machine main body 1, a multi-axis moving test head 2 and multiple test disks 6 installed on the sorting machine main body 1. A door frame 3 is installed on the outer wall of the sorting machine main body 1, and the door frame 3 corresponds to the side opening of the sorting machine main body 1. A protective door 4 is rotatably connected inside the door frame 3. Multiple multi-section telescopic slide rails 5 are fixedly installed inside the sorting machine main body 1, and multiple test disks 6 are respectively installed on the multiple multi-section telescopic slide rails 5. The test disks 6 are movably slidably connected inside the sorting machine main body 1 through the multi-section telescopic slide rails 5. A cleaning unit 7 is installed on the side wall of the protective door 4.

[0027] As Figure 1 Figure 3 As shown, the structure of the multi-station test and sorting machine in the present invention is similar to that of the existing multi-station test and sorting machine. For example, the existing technology is CN220862098U. The main improvement points of the present invention are as follows: The sorting machine main body 1, the multi-axis moving test head 2 and the test disks 6 in the present invention are all prior arts. The multi-axis moving test head 2 can move horizontally and vertically inside the sorting machine main body 1. When it is necessary to test the chip, rotate the protective door 4. The upper end of the protective door 4 is rotatably connected to the door frame 3, and then open the protective door 4. The door frame 3 supports the protective door 4, so that the opening at the side wall of the sorting machine main body 1 is opened. At this time, the test disk 6 inside the sorting machine main body 1 can be pulled. The test disk 6 slides out of the sorting machine main body 1 through the multi-section telescopic slide rail 5, and then rotate the protective door 4 back. The lower end of the protective door 4 is placed on the multi-section telescopic slide rail 5, and the protective door 4 is inclined. At this time, the chip can be placed on the test disk 6. The protective door 4 can block the opening of the sorting machine main body 1 within a certain range, reducing the entry of external dust. After the chips are placed, open the protective door 4 again, push the test disk 6 back into the sorting machine main body 1, and rotate the protective door 4 back to block the side opening of the sorting machine main body 1. At this time, the chip on the test disk 6 can be tested through the multi-axis moving test head 2, which is convenient for taking and placing the chip, and the opening at the side wall of the sorting machine main body 1 will not be continuously in a fully open state, reducing the entry of dust, facilitating the testing of the chip, and improving the practicability.

[0028] As Figure 3 As shown, a sealing groove 11 is opened on the inner wall of the outer side of the door frame 3, and the upper end of the protective door 4 is rotatably connected in the sealing groove 11; when the protective door 4 is closed, the protective door 4 rotates into the sealing groove 11, and the protective door 4 cooperates with the sealing groove 11 to improve the sealing performance of the sorting machine main body 1, thereby preventing dust from entering.

[0029] As Figure 2 , Figure 3 and Figure 5As shown in the figure, the protective door 4 includes a glass frame door 41 rotatably connected to the inner wall of the sealing groove 11. The lower end of the glass frame door 41 is rotatably connected to a narrow door 42. The upper end of the narrow door 42 reaches the upper surface of the height test plate 6. A handle 43 is fixedly connected to the outer wall of the narrow door 42. The cleaning unit 7 is installed inside the narrow door 42. When it is necessary to pull out the test plate 6 from the sorting machine main body 1, pull the handle 43 to rotate the narrow door 42 relative to the glass frame door 41, thereby opening the narrow door 42. At this time, the test plate 6 can be pulled out from the sorting machine main body 1. Only opening the narrow door 42 can reduce the opening area of the side wall of the sorting machine main body 1, and further reduce the possibility of external dust entering the sorting machine main body 1, ensuring the accuracy of chip testing. When it is necessary to perform maintenance or cleaning inside the sorting machine main body 1, the glass frame door 41 can be rotated to completely open the opening on the side wall of the sorting machine main body 1 for convenient cleaning. When the glass frame door 41 is closed, the test state of the chips on the test plate 6 can also be seen through the glass.

[0030] As Figure 5 shown in the figure, the cleaning unit 7 includes a fixed air pipe 71 fixedly installed inside the narrow door 42. A plurality of air jet nozzles 72 are fixedly communicated with the outer wall of the fixed air pipe 71. A conveying air pipe 73 is fixedly communicated with the outer wall of the fixed air pipe 71. One end of the conveying air pipe 73 penetrates outside the narrow door 42. When the narrow door 42 is opened and turned to the horizontal position, after the chips on the test plate 6 outside the sorting machine main body 1 are placed, an external air pump is used to supply gas to the conveying air pipe 73. The gas is conveyed into the fixed air pipe 71 at the bottom surface of the narrow door 42 at this time and ejected from the air jet nozzles 72 on the fixed air pipe 71. At this time, the test plate 6 can be pushed into the sorting machine main body 1. The ejected gas can clean the dust on the upper surface of the test plate 6 and the surface of the chips, thereby preventing dust from being brought into the sorting machine main body 1, improving the cleaning effect, and ensuring the accuracy of chip testing.

[0031] As Figure 5 shown in the figure, the air jet nozzles 72 are inclinedly distributed, and the output end of the air jet nozzles 72 is higher than the upper surface of the test plate 6. When the narrow door 42 is in the horizontal position, the inclinedly distributed air jet nozzles 72 can blow the dust on the test plate 6 and the chips outward for dust removal. At the same time, when the narrow door 42 is turned to the vertical state, the gas ejected from the air jet nozzles 72 can also clean the dust on the upper surface of the test plate 6 and the chips, improving the cleaning degree and ensuring the accuracy of chip testing.

[0032] As Figure 2 and Figure 4As shown in the figure, an air extraction hood 8 communicating with the inside of the sorting machine main body 1 is fixedly installed on the back surface of the sorting machine main body 1, and the outer end of the air extraction hood 8 is fixedly communicated with an air extraction pipe 9; the outer end of the air extraction pipe 9 is communicated with an external air extraction pump. The dust inside the sorting machine main body 1 can be extracted through the cooperation of the air extraction pipe 9 and the air extraction hood 8, and the air blown on the upper surface of the test disk 6 located inside the sorting machine main body 1 by the air jet head 72 is used to improve the cleaning of the chip, reduce the dust inside the sorting machine main body 1, and improve the accuracy of chip testing.

[0033] As Figure 2 shown in the figure, a plurality of partition plates 10 are fixedly connected to the inner wall of the air extraction hood 8, and the plurality of partition plates 10 disperse the suction force output by the air extraction pipe 9; the partition plates 10 can separate the suction force applied by the air extraction pipe 9, so that the air and dust inside the sorting machine main body 1 can be discharged along the air extraction pipe 9 through the air extraction hood 8.

[0034] The implementation steps of this embodiment are as follows: When it is necessary to test the chip, pull the handle 43 to rotate the narrow door 42 and the glass frame door 41, so that the narrow door 42 is opened. At this time, the test disk 6 can be pulled out from the sorting machine main body 1. At this time, the test disk 6 inside the sorting machine main body 1 can be pulled. The test disk 6 slides out of the sorting machine main body 1 through the multi-section telescopic slide rail 5. At this time, the chip can be placed on the test disk 6. After the chip is placed, gas is transported to the fixed air pipe 71 at the bottom surface of the narrow door 42 at this time through an external air pump and sprayed out from the air jet head 72 on the fixed air pipe 71. At this time, the test disk 6 can be pushed into the sorting machine main body 1. The sprayed gas can clean the dust on the upper surface of the test disk 6 and the surface of the chip, so as to avoid bringing dust into the sorting machine main body 1. After the test disk 6 is pushed in, rotate the narrow door 42, and the narrow door 42 seals the sorting machine main body 1. The gas sprayed out by the air jet head 72 inside the narrow door 42 can also clean the dust on the upper surface of the test disk 6 and the chip. Then, the dust inside the sorting machine main body 1 is extracted through the cooperation of the air extraction pipe 9 and the air extraction hood 8 to reduce the dust inside the sorting machine main body 1. At this time, the chip on the test disk 6 can be tested by the multi-axis moving test head 2.

[0035] Obviously, the above embodiments of the present invention are merely examples for clearly explaining the present invention, rather than limiting the implementation manners of the present invention. For those of ordinary skill in the art in the technical field to which the present invention pertains, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to list all the implementation manners here. Any modifications, equivalent replacements, and improvements made within the spirit and principle of the present invention shall be included in the protection scope of the claims of the present invention.

Claims

1. A multi-station test sorting machine, comprising a sorting machine body (1), a multi-axis movable test head (2) mounted on the sorting machine body (1) and a plurality of test discs (6), characterized in that: A door frame (3) is installed on the outer wall of the sorting machine body (1), the door frame (3) corresponds to the side opening of the sorting machine body (1), a protective door (4) is rotatably connected in the door frame (3), a plurality of multi-section telescopic slide rails (5) are fixedly installed in the sorting machine body (1), a plurality of test discs (6) are respectively installed on the plurality of multi-section telescopic slide rails (5), the test discs (6) are movably slidably connected in the sorting machine body (1) through the multi-section telescopic slide rails (5), and a cleaning unit (7) is installed on the side wall of the protective door (4).

2. A multi-station test sorting machine according to claim 1, characterized in that: A sealing groove (11) is provided on the outer inner wall of the door frame (3), and the upper end of the protective door (4) is rotatably connected in the sealing groove (11).

3. A multi-station test sorting machine according to claim 2, characterized in that: The protective door (4) comprises a glass frame door (41) rotatably connected to the inner wall of the sealing groove (11); the lower end of the glass frame door (41) is rotatably connected to a narrow door (42); the upper end of the narrow door (42) is at a height above the upper surface of the test plate (6); the outer wall of the narrow door (42) is fixedly connected to a handle (43); and the cleaning unit (7) is installed on the inner side of the narrow door (42).

4. A multi-station test sorting machine according to claim 3, characterized in that: The cleaning unit (7) comprises a fixed air pipe (71) fixedly mounted on the inner side of the narrow door (42); the outer wall of the fixed air pipe (71) is fixedly connected to a plurality of nozzles (72); the outer wall of the fixed air pipe (71) is fixedly connected to a delivery air pipe (73); one end of the delivery air pipe (73) passes through to the outside of the narrow door (42).

5. A multi-station test sorting machine according to claim 4, characterized in that: The spray heads (72) are inclined, and the output end of the spray heads (72) is higher than the upper surface of the test plate (6).

6. A multi-station test sorting machine according to claim 5, characterized in that: An exhaust hood (8) connected to the interior of the sorting machine body (1) is fixedly mounted on the back side thereof, and an exhaust pipe (9) is fixedly connected to the outer end of the exhaust hood (8).

7. A multi-station test sorting machine according to claim 6, characterized in that: A plurality of partition plates (10) are fixedly connected to the inner wall of the exhaust hood (8), and the plurality of partition plates (10) disperse the suction force output by the exhaust pipe (9).

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