Transmission electron microscope sample jig

Abstract

The utility model relates to the field of sample jigs, and discloses a transmission electron microscope sample jig which comprises a bottom plate, a first vertical plate is fixedly connected to the outer wall of the upper end of the bottom plate, a hollow pipe is slidably connected to the outer wall of the front end of the first vertical plate, and a fixing block is fixedly connected to the outer wall of the left end of the hollow pipe. A buffer ring is fixedly connected to the outer wall of the left end of the fixing block, a limiting assembly is arranged on the inner wall of the upper end of the first vertical plate and used for fixing the hollow pipe, a clamping assembly is arranged on the outer wall of the upper end of the bottom plate and used for fixing a chip, and the clamping assembly comprises a second vertical plate; the outer wall of the bottom end of the second vertical plate is fixedly connected to the outer wall of the upper end of the bottom plate. According to the utility model, through the arrangement of the hollow pipe, the fixing block and the buffer ring, the situation that the chip is damaged due to the fact that the impact force of the clamping block on the chip is too large under the elastic force action of the first spring when the push plate is not grasped can be prevented, and the chip is protected.

Description

Technical Field

[0001] The utility model relates to the field of sample fixtures, and particularly to a transmission electron microscope sample fixture. Background Art

[0002] A transmission electron microscope sample is a specific material sample prepared for observation and analysis using a transmission electron microscope.

[0003] Upon retrieval, Chinese Patent Publication No.: CN 207502434U discloses a transmission electron microscope sample fixture, which includes: a fixed baffle, which includes a first fixed baffle and a second fixed baffle arranged at intervals, a movable baffle, which is arranged between the two parts of the fixed baffle, a sample is fixed between the movable baffle and the second fixed baffle, a built-in spring, one end of which is connected to the first fixed baffle and the other end is connected to the movable baffle, and a handle, the bottom end of which is connected to the movable baffle and the top end passes through the first fixed baffle and then protrudes. By fixing the sample in the fixture, the phenomenon that the sample topples during copper ring adhesion can be effectively prevented, thereby shortening the time for preparing TEM samples and increasing the success rate of TEM sample preparation.

[0004] In the above technology, a certain space is left between the movable baffle and the right fixed baffle for placing the chip. After placing the chip, slowly release the handle, and the compressed built-in spring pushes the movable baffle to move to the right until it contacts the chip, thereby completely fixing the chip. If a mistake is made and the handle is not grasped, the movable baffle will impact the chip under the push of the built-in spring, easily causing damage to the chip. Therefore, a transmission electron microscope sample fixture is proposed to solve the above problems. Summary of the Utility Model

[0005] To make up for the above deficiencies, the utility model provides a transmission electron microscope sample fixture, aiming to improve the problem that if a mistake is made and the handle is not grasped, the movable baffle will impact the chip under the push of the built-in spring, easily causing damage to the chip in the prior art.

[0006] To achieve the above object, the utility model adopts the following technical scheme: A transmission electron microscope sample fixture, including a bottom plate, a vertical plate one is fixedly connected to the outer wall of the upper end of the bottom plate, a hollow tube is slidably connected to the outer wall of the front end of the vertical plate one, a fixed block is fixedly connected to the outer wall of the left end of the hollow tube, a buffer ring is fixedly connected to the outer wall of the left end of the fixed block, a limiting component is arranged on the inner wall of the upper end of the vertical plate one, the limiting component is used for fixing the hollow tube, and a clamping component is arranged on the outer wall of the upper end of the bottom plate, the clamping component is used for fixing the chip.

[0007] As a further description of the above technical scheme:

[0008] The clamping assembly includes a second vertical plate, the outer wall of the bottom end of the second vertical plate is fixedly connected to the outer wall of the upper end of the bottom plate, a positioning block is fixedly connected to the outer wall of the upper end of the bottom plate, a clamping plate is elastically connected to the outer wall of the right end of the first vertical plate through a first spring, a guide rod is fixedly connected to the outer wall of the left end of the clamping plate, a connecting rod is fixedly connected to the outer wall of the left end of the clamping plate, and a push plate is fixedly connected to the outer wall of the left end of the connecting rod.

[0009] As a further description of the above technical solution:

[0010] The limiting assembly includes an inlay block, and the lower outer wall of the inlay block is elastically connected to an inlay block through a second spring.

[0011] As a further description of the above technical solution:

[0012] One end of the first spring is fixedly connected to the outer wall of the right end of the first vertical plate, and the other end of the first spring is fixedly connected to the outer wall of the left end of the clamping plate.

[0013] As a further description of the above technical solution:

[0014] The outer wall of the bottom end of the clamping plate is slidably connected to the outer wall of the upper end of the bottom plate.

[0015] As a further description of the above technical solution:

[0016] One end of the second spring is fixedly connected to the outer wall of the upper end of the first vertical plate, and the other end of the second spring is fixedly connected to the lower outer wall of the inlay block.

[0017] As a further description of the above technical solution:

[0018] The lower outer wall of the inlay block is slidably connected to the inner wall of the upper end of the first vertical plate, and the outer wall of the bottom end of the inlay block is clamped to the inner wall of the upper end of the hollow tube.

[0019] As a further description of the above technical solution:

[0020] The outer wall of the connecting rod penetrates and is slidably connected to the inner wall of the right end of the positioning block, and the outer wall of the connecting rod penetrates and is slidably connected to the inner wall of the right end of the first vertical plate.

[0021] The utility model has the following beneficial effects:

[0022] 1. In the utility model, by arranging a hollow tube, a fixed block and a buffer ring, it is possible to prevent the impact force of the clamping block on the chip from being too large under the elastic force of the first spring when the push plate is not grasped, thus avoiding the damage of the chip and protecting the chip.

[0023] 2. In the present utility model, by providing a positioning block and a connecting rod, the clamping plate can move more stably to the right under the elastic force of the first spring, and the force when the clamping plate presses against the outer wall of the left end of the chip is also more uniform. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 FIG. 1 is a three-dimensional schematic diagram of a transmission electron microscope sample fixture proposed by the present utility model;

[0025] Figure 2 FIG. 2 is a schematic diagram of a hollow tube of a transmission electron microscope sample fixture proposed by the present utility model;

[0026] Figure 3 FIG. 3 is a schematic diagram of a transmission electron microscope sample fixture proposed by the present utility model Figure 1 with an enlarged view at A.

[0027] LEGEND:

[0028] 1. Bottom plate; 2. Second vertical plate; 3. Connecting rod; 4. First spring; 5. Guide rod; 6. First vertical plate; 7. Pushing plate; 8. Fixed block; 9. Positioning block; 10. Clamping plate; 11. Buffer ring; 12. Hollow tube; 13. Second spring; 14. Insert block. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0029] The following will clearly and completely describe the technical solutions in the embodiments of the present utility model with reference to the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present utility model without creative efforts shall fall within the protection scope of the present utility model.

[0030] Refer to Figure 1 and Figure 2, An embodiment provided by the present utility model: A transmission electron microscope sample fixture, including a bottom plate 1, the bottom plate 1 provides support for the sliding of the clamping plate 10. A vertical plate one 6 is fixedly connected to the outer wall of the upper end of the bottom plate 1, the vertical plate one 6 provides support for the sliding of the connecting rod 3, the vertical plate one 6 provides support for the sliding of the guide rod 5. A hollow tube 12 is slidably connected to the outer wall of the front end of the vertical plate one 6. Move the hollow tube 12 to the left, and fix the position of the hollow tube 12 by clamping the block 14 on the inner wall of the hollow tube 12, which can prevent the clamping plate 10 from moving too fast due to the rapid release of the push plate 7 and causing damage to the chip. A fixed block 8 is fixedly connected to the outer wall of the left end of the hollow tube 12, the fixed block 8 is convenient for moving the hollow tube 12 to the left. A buffer ring 11 is fixedly connected to the outer wall of the left end of the fixed block 8, the buffer ring 11 can provide protection for the outer wall of the left end of the fixed block 8 and improve the service life of the fixed block 8. A limiting component is arranged on the inner wall of the upper end of the vertical plate one 6, and the limiting component is used for fixing the hollow tube 12. A clamping component is arranged on the outer wall of the upper end of the bottom plate 1, and the clamping component is used for fixing the chip.

[0031] Referring to Figure 1 and Figure 2 , the clamping component includes a vertical plate two 2, the outer wall of the left end of the vertical plate two 2 cooperates with the outer wall of the right end of the clamping plate 10 to clamp the chip. The outer wall of the bottom end of the vertical plate two 2 is fixedly connected to the outer wall of the upper end of the bottom plate 1. A positioning block 9 is fixedly connected to the outer wall of the upper end of the bottom plate 1, the positioning block 9 provides guidance for the sliding of the connecting rod 3. The outer wall of the right end of the vertical plate one 6 is elastically connected with a clamping plate 10 through a spring one 4, and the clamping plate 10 moves to the right under the elastic force of the spring one 4 to cooperate with the vertical plate two 2 to clamp the chip. The outer wall of the bottom end of the clamping plate 10 is slidably connected to the outer wall of the upper end of the bottom plate 1. One end of the spring one 4 is fixedly connected to the outer wall of the right end of the vertical plate one 6, and the other end of the spring one 4 is fixedly connected to the outer wall of the left end of the clamping plate 10. A guide rod 5 is fixedly connected to the outer wall of the left end of the clamping plate 10, and the outer wall of the guide rod 5 penetrates and is slidably connected to the inner wall of the right end of the vertical plate one 6. The arrangement of the guide rod 5 is to prevent the spring one 4 from being bent too much. A connecting rod 3 is fixedly connected to the outer wall of the left end of the clamping plate 10, there are four connecting rods 3, the connecting rod 3 makes the extrusion of the clamping plate 10 on the chip more uniform through the limitation of the positioning block 9, and prevents the chip from being damaged due to uneven extrusion. The outer wall of the connecting rod 3 penetrates and is slidably connected to the inner wall of the right end of the positioning block 9, the outer wall of the connecting rod 3 penetrates and is slidably connected to the inner wall of the right end of the vertical plate one 6. A push plate 7 is fixedly connected to the outer wall of the left end of the connecting rod 3, the push plate 7 is used to connect the connecting rod 3, and the clamping plate 10 is driven to move through the push plate 7 and the connecting rod 3.

[0032] Referring to Figure 1 and Figure 3, the limiting component includes an insert block 14 which is clamped on the inner wall of the upper end of the hollow tube 12 to fix the position of the hollow tube 12. When the outer wall of the bottom end of the insert block 14 leaves the inner wall of the upper end of the hollow tube 12, the fixation of the hollow tube 12 is released. The outer wall of the lower side of the insert block 14 is slidably connected to the inner wall of the upper end of the first vertical plate 6. The outer wall of the bottom end of the insert block 14 is clamped on the inner wall of the upper end of the hollow tube 12. The outer wall of the lower side of the insert block 14 is elastically connected to an insert block 14 through a second spring 13. One end of the second spring 13 is fixedly connected to the outer wall of the upper end of the first vertical plate 6, and the other end of the second spring 13 is fixedly connected to the outer wall of the lower side of the insert block 14.

[0033] Working principle: Place the chip to be clamped on the bottom plate 1, between the second vertical plate 2 and the clamping plate 10. By releasing the push plate 7, the elastic force of the first spring 4 pushes the clamping plate 10 to move leftward. The bottom of the clamping plate 10 slides on the bottom plate 1, and the guide rod 5 on the outer wall of its left end slides in the first vertical plate 6 to ensure the stability of the movement. And the four connecting rods 3 are limited by the positioning block 9. When the push plate 7 moves to the outer wall of the left end of the buffer ring 11, the fixation of the hollow tube 12 is released by moving the insert block 14. The elastic force of the first spring 4 continues to drive the clamping plate 10, the connecting rod 3 and the push plate 7 to move rightward. The rightward movement of the push plate 7 drives the fixed block 8 and the hollow tube 12 to move. The movement of the clamping plate 10 causes the outer wall of its right end to squeeze the chip, and cooperates with the second vertical plate 2 to clamp the chip. Then, gently stick the copper ring on the upper cross-section position of the chip with tweezers.

[0034] Finally, it should be noted that the above are only the preferred embodiments of the present invention and are not used to limit the present invention. Although the present invention has been described in detail with reference to the foregoing embodiments, for those skilled in the art, they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some of the technical features. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A transmission electron microscope sample fixture, comprising a base plate (1), characterized in that: A vertical plate (6) is fixedly connected to the outer wall of the upper end of the base plate (1), a hollow tube (12) is slidably connected to the outer wall of the front end of the vertical plate (6), a fixing block (8) is fixedly connected to the outer wall of the left end of the hollow tube (12), a buffer ring (11) is fixedly connected to the outer wall of the left end of the fixing block (8), a limiting component is provided on the inner wall of the upper end of the vertical plate (6), the limiting component is used to fix the hollow tube (12), and a clamping component is provided on the outer wall of the upper end of the base plate (1), the clamping component is used to fix the chip.

2. A transmission electron microscope sample fixture according to claim 1, characterized in that: The clamping assembly comprises a vertical plate 2 (2), the bottom outer wall of the vertical plate 2 (2) is fixedly connected to the upper outer wall of the bottom plate (1), a positioning block (9) is fixedly connected to the upper outer wall of the bottom plate (1), a clamping plate (10) is elastically connected to the right outer wall of the vertical plate 1 (6) via a spring 1 (4), a guide rod (5) is fixedly connected to the left outer wall of the clamping plate (10), a connecting rod (3) is fixedly connected to the left outer wall of the clamping plate (10), and a push plate (7) is fixedly connected to the left outer wall of the connecting rod (3).

3. The transmission electron microscope sample fixture according to claim 1, characterized in that: The limiting assembly comprises an insert (14), and the lower outer wall of the insert (14) is elastically connected to the insert (14) via a second spring (13).

4. A transmission electron microscope sample fixture according to claim 2, characterized in that: One end of the spring 1 (4) is fixedly connected to the right outer wall of the vertical plate 1 (6), and the other end of the spring 1 (4) is fixedly connected to the left outer wall of the clamping plate (10).

5. The transmission electron microscope sample fixture according to claim 2, characterized in that: The outer wall of the bottom end of the clamping plate (10) is slidably connected to the outer wall of the upper end of the bottom plate (1).

6. A transmission electron microscope sample fixture according to claim 3, characterized in that: One end of the second spring (13) is fixedly connected to the upper outer wall of the first vertical plate (6), and the other end of the second spring (13) is fixedly connected to the lower outer wall of the insert (14).

7. The transmission electron microscope sample fixture according to claim 3, characterized in that: The lower outer wall of the insert (14) is slidably connected to the upper inner wall of the vertical plate (6), and the bottom outer wall of the insert (14) is clamped on the upper inner wall of the hollow tube (12).

8. The transmission electron microscope sample fixture according to claim 2, characterized in that: The outer wall of the connecting rod (3) penetrates through and is slidably connected to the inner wall of the right end of the positioning block (9), and the outer wall of the connecting rod (3) penetrates through and is slidably connected to the inner wall of the right end of the vertical plate (6).

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