Multifunctional sample table for electron probe X-ray microscopic analyzer
By designing the dovetail groove, steel ruler and fixed column of the multifunctional sample table, the adaptability problem of existing instruments to irregular samples is solved, effective fixation and height calibration of irregular samples is achieved, and the testing scope is expanded.
Patent Information
- Application Number
- CN202422002533.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-19
- Publication Date
- 2025-07-04
- Estimated Expiration
- 2034-08-19
AI Technical Summary
Existing electronic probe X-ray microscope analyzers can only test samples of specific sizes and surface levels, and cannot adapt to samples with irregular upper and lower surfaces.
A multifunctional sample table is designed, including dovetail grooves, steel rulers, adjustment circular plates and fixed columns. They are matched with the instrument slide rails through dovetail grooves. The steel rulers are used for height calibration, the adjustment circular plates are used for height adjustment, and the fixed columns are used for fixing irregular samples.
It realizes effective fixation and height calibration of irregular samples on the upper and lower surfaces, expands the scope of application of testable samples, and improves sample installation quality and testing efficiency.
Smart Images
Figure CN223065208U_ABST
Abstract
Description
Technical Field
[0001] The utility model belongs to the technical field of material analysis and testing, and specifically relates to a multi-functional sample stage for an electron probe X-ray microanalyzer. Background Art
[0002] An electron probe X-ray microanalyzer irradiates the surface of a sample with an electron beam to generate characteristic X-rays from the sample, and qualitatively, quantitatively, and performs point, line, and surface analysis on the micro-region of the sample surface based on the wavelength and intensity of the characteristic X-rays. It has a wide range of applications in the fields of geology, minerals, materials, etc.
[0003] Electron probe X-ray microanalysis has high requirements for test samples, requiring a polished and flat surface, and a fixed working distance needs to be maintained during testing. The sample is placed in the sample stage for testing. Currently, only metallographic inlaid and polished specimens with specific sizes and specimens with horizontal upper and lower surfaces can be placed in the sample stage for testing, and the height of the sample cannot exceed 20 mm. Content of the Utility Model
[0004] In view of the problems in the background art, the utility model provides a multi-functional sample stage for an electron probe X-ray microanalyzer. The technical solution includes: a stage body, dovetail grooves, a steel ruler, and an adjusting circular plate. A pair of dovetail grooves are provided at the bottom of the stage body, and a first side and a second side are provided with the symmetry plane of the stage body length direction as the dividing line; at the middle position of the top surface of the stage body, a steel ruler installation bolt hole is opened, and a steel ruler installation bolt is installed in the steel ruler installation bolt hole. The steel ruler installation bolt passes through the through hole in the middle of the steel ruler and is connected to the steel ruler installation bolt hole;
[0005] A through threaded hole is opened on the upper end surface of the stage body, and an adjusting circular plate is provided through threaded connection inside the through threaded hole; the through threaded hole is located on the second side of the symmetry plane; a concave table is opened on the first side of the stage body, and a fixing column is integrally fixed at the edge of the first side of the concave table. A plurality of fixing bolt holes are opened on the fixing column, and a jackscrew is installed in the fixing bolt holes. The fixing bolt holes face the second side of the concave table.
[0006] The stage body is of a cuboid structure.
[0007] The dovetail grooves are arranged along the length direction of the stage body.
[0008] The height of the stage body is 70 mm, and the depth of the concave table is 50 mm.
[0009] The steel ruler installation bolt hole is located in the direction of the second side of the symmetry plane.
[0010] When the number of fixing columns exceeds two, the adjacent fixing columns are equally spaced.
[0011] The plurality of fixing bolt holes are arranged in a straight line along the height direction.
[0012] The size of the notch in the dovetail groove is the same as the upper width of the instrument slide rail.
[0013] A strip-shaped groove is provided at the center position of the bottom surface of the adjusting circular plate.
[0014] The beneficial effects of the utility model are as follows:
[0015] 1. The concave platform, fixed columns and set screws are added as the clamping areas for samples with irregular upper and lower surfaces, solving the problem that such samples can only be tested by being inlaid into regular samples.
[0016] 2. A steel straightedge for comparing the installation height of the sample is added, and the installed sample is compared with the preset straightedge height, improving the installation quality of the sample.
[0017] 3. Multiple fixed columns and multiple through threaded holes are provided, so that multiple samples with regular and flat upper and lower surfaces and samples with irregular and flat upper and lower surfaces can be detected simultaneously. Description of the Drawings
[0018] Figure 1 It is a schematic structural diagram of a partial perspective view of an embodiment of a multifunctional sample stage for an electron probe X-ray microanalyzer of the utility model;
[0019] Figure 2 It is a front view schematic diagram of the steel straightedge in the embodiment of the utility model;
[0020] Figure 3 It is a schematic structural diagram of the adjusting circular plate in the embodiment of the utility model.
[0021] Wherein: 1 - table body, 2 - dovetail groove, 3 - steel straightedge installation bolt hole, 4 - steel straightedge, 5 - through threaded hole, 6 - adjusting circular plate, 7 - concave platform, 8 - fixed column, 9 - fixed bolt hole, 10 - set screw. Detailed Embodiment
[0022] The following further describes the utility model in detail with reference to the drawings.
[0023] As Figures 1 to 3 shown in the embodiment of the utility model, it includes: a table body 1, a dovetail groove 2, a steel straightedge 4 and an adjusting circular plate 6. The overall height of the cuboid table body 1 is 70 mm. A pair of dovetail grooves 2 are provided at the bottom of the table body 1 along the length direction of the table body 1. The first side and the second side are divided by the symmetry plane in the length direction of the table body 1. A steel straightedge installation bolt hole 3 is opened at the middle position on the top of the symmetry plane. A steel straightedge installation bolt is installed in the steel straightedge installation bolt hole 3. The steel straightedge installation bolt (not shown in the figure) passes through the through hole in the middle of the steel straightedge 4 and is connected to the steel straightedge installation bolt hole 3 to fix the relative position between the steel straightedge 4 and the table body 1.
[0024] There are three through threaded holes 5 on the upper end surface of the frustum 1, and an adjusting circular plate 6 is provided inside the through threaded hole through threaded connection; the through threaded hole 5 is located on the second side of the steel ruler installation bolt hole 3; a concave platform 7 is provided on the first side of the frustum 1, the depth of the concave platform 7 is 50 mm, and three equally spaced fixed columns 8 are integrally fixed on the edge of the first side of the concave platform 7. A number of fixing bolt holes 9 are provided on the fixed columns 8, and set screws 10 are installed in the fixing bolt holes 9, and the fixing bolt holes 9 face the second side of the concave platform 7.
[0025] In this embodiment, a number of fixing bolt holes 9 are provided on one side surface of the fixed column 8, and the number of fixing bolt holes 9 are arranged in a straight line along the height direction; the set screws 10 installed in the fixing bolt holes 9 can, during use, select a fixing bolt hole 9 with a suitable height to install a set screw 10 with a suitable length according to the height of the sample, and at the same time adjust the depth of the sample fixing bolt according to the size of the sample to cooperate with the second side of the concave platform 7 (the opposite side where the fixed column 8 is installed) to fix the sample.
[0026] In this embodiment, the size of the notch of the dovetail groove 2 is the same as the upper end width of the instrument slide rail, ensuring that the sample table can be placed on the instrument slide rail. Specifically, the maximum width of the notch of the dovetail groove 2 is 30 mm.
[0027] In this embodiment, the depth of the through threaded hole 5 is the same as the height of the frustum 1, and the thread on the inner wall of the through threaded hole 5 is threadedly connected to the outer periphery of the adjusting circular plate 6; a strip-shaped groove is provided at the center position of the bottom surface of the adjusting circular plate 6, and there are threads around it that can cooperate with the through threaded hole 5. During use, the side of the adjusting circular plate 6 with the groove faces downward, and the adjusting circular plate 6 is driven to move up and down while rotating through the cooperation of a screwdriver and the groove, so that the adjusting circular plate 6 can stay at different heights of the through threaded hole 5 according to the needs of the sample.
[0028] Before testing, first install the sample into the frustum 1;
[0029] For samples with regular and flat upper and lower surfaces, the samples with regular and flat upper and lower surfaces are installed above the adjusting circular plate 6 through carbon glue, and the upper end surface of the samples with regular and flat upper and lower surfaces is not higher than the upper surface of the frustum 1; before installing the samples with regular and flat upper and lower surfaces, the side of the adjusting circular plate 6 with the groove faces downward, and the sample is fixed on the side of the adjusting circular plate without the groove with carbon glue. The adjusting circular plate is driven to move through the cooperation of a screwdriver and the groove, so that the test surface of the sample is visually level with the upper plane at the highest center of the frustum 1. Then install the steel ruler 4 on the middle steel ruler installation bolt hole with a steel ruler installation bolt, move the adjusting circular plate 6 up and down, and confirm again that the sample is just below the steel ruler 4; remove the steel ruler 4, and the installation of the samples with regular and flat upper and lower surfaces is completed.
[0030] For a sample with irregular and uneven upper and lower surfaces, first adjust the height, then fix it with carbon glue, then lock it with the setscrew 10, and finally check the height with the steel straightedge 4. Specifically, first place the sample with irregular and uneven upper and lower surfaces in the concave table 7, then lift the sample with irregular and uneven upper and lower surfaces so that the highest point at the upper end of the sample with irregular and uneven upper and lower surfaces is flush with the upper end face of the table body 1; then use carbon glue to fix one side of the sample with irregular and uneven upper and lower surfaces to the second surface of the concave table 7; then select the setscrew 10 at a suitable position on the fixing column 8 and rotate the setscrew 10 to hold the other side of the sample with irregular and uneven upper and lower surfaces to fix it; finally, install the steel straightedge 4 on the middle steel straightedge installation bolt hole with the steel straightedge installation bolt, and confirm again that the sample is just below the steel straightedge 4; remove the steel straightedge 4, and the installation of the sample with irregular and uneven upper and lower surfaces is completed.
[0031] After the sample is installed, move the entire table body 1 and install the dovetail groove 2 below into the instrument slide rail and fix it, and then adjust the electron beam of the electron probe X-ray microanalyzer to irradiate the sample surface for testing.
Claims
1. A multifunctional sample stage for an electron probe X-ray microanalyzer, characterized in that Including: A frustum (1), dovetail grooves (2), a steel straightedge (4), and an adjusting circular plate (6). A pair of dovetail grooves (2) are provided at the bottom of the frustum (1). The first side and the second side are separated by the symmetric plane in the length direction of the frustum (1). In the middle position of the top surface of the frustum (1), a steel ruler mounting bolt hole (3) is opened. A steel ruler mounting bolt is installed in the steel ruler mounting bolt hole (3), and the steel ruler mounting bolt passes through the through hole in the middle of the steel straightedge (4) and is connected to the steel ruler mounting bolt hole (3). A through threaded hole (5) is opened on the upper end surface of the frustum (1), and an adjusting circular plate (6) is provided inside the through threaded hole through threaded connection. The through threaded hole (5) is located on the second side of the symmetric plane. A concave platform (7) is opened on the first side of the frustum (1). A fixing column (8) is integrally and fixedly provided at the edge of the first side of the concave platform (7). A plurality of fixing bolt holes (9) are opened on the fixing column (8), and set screws (10) are installed in the fixing bolt holes (9). The fixing bolt holes (9) face the second side of the concave platform (7).
2. The multifunctional sample stage for an electron probe X-ray microanalyzer according to claim 1, characterized in that, The frustum (1) has a cuboid structure.
3. The multifunctional sample stage for an electron probe X-ray microanalyzer according to claim 2, wherein, The dovetail grooves (2) are arranged along the length direction of the frustum (1).
4. A multi-functional sample stage for an electron probe X-ray microanalyzer according to any one of claims 1 to 3, characterized in that, The height of the frustum (1) is 70 mm, and the depth of the concave platform (7) is 50 mm.
5. A multifunctional sample stage for an electron probe X-ray microanalyzer according to claim 1, characterized in that, The steel ruler mounting bolt hole (3) is located in the direction of the second side of the symmetric plane.
6. The multifunctional sample stage for an electron probe X-ray microanalyzer according to claim 1, wherein When the number of the fixing columns (8) exceeds two, the adjacent fixing columns (8) are equidistant.
7. The multifunctional sample stage for an electron probe X-ray microanalyzer according to claim 1, characterized in that, The plurality of fixing bolt holes (9) are arranged in a straight line along the height direction.
8. The multifunctional sample stage for an electron probe X-ray microanalyzer according to claim 1, characterized in that, The size of the notch in the dovetail groove (2) is the same as the upper width of the instrument slide rail.
9. The multifunctional sample stage for an electron probe X-ray microanalyzer according to claim 1, characterized in that, A strip-shaped groove is opened at the center position of the bottom surface of the adjusting circular plate (6).