Automobile electronic hardware testing device and system

Abstract

The utility model discloses an automobile electronic hardware testing device and system, and relates to the field of automobile electronics. The automobile electronic hardware testing device provided by the utility model can realize multiple functions of sleep current testing, open-drain PWM input testing, differential PWM input testing and the like of a tested sample piece in a wide voltage input range (namely 8V-60V), expensive and large-scale testing equipment such as a signal generator, a load box and the like does not need to be utilized, the testing cost can be reduced, and the testing efficiency is improved. Meanwhile, the construction time and labor cost of an experimental environment are greatly saved, the testing efficiency can be improved, and the application range is wide. In addition, the automobile electronic hardware testing device provided by the utility model can also realize a function of adjusting a resistance value of 0-10 megohms, so that a switch ground drift test can be carried out, and the application scenarios of the automobile electronic hardware testing device are further enriched.

Description

Technical Field

[0001] The utility model relates to the field of automotive electronics, in particular to an automotive electronics hardware testing device. The utility model also relates to an automotive electronics hardware testing system including the above-mentioned automotive electronics hardware testing device. Background Technique

[0002] In the common automotive electronics hardware development process, for the debugging of test samples and hardware testing in the hardware development stage, various testing devices are often used to connect the wiring harness of the device under test or through flying wires. The various testing devices can include electronic loads, multimeters, signal generators, and color ring resistors, etc.

[0003] The existing testing methods often face problems such as complex test environment setup, inconvenient connection of testing devices, and many limitations of testing devices. For example, in the sleep current test, a high-precision multimeter is required, and the rated values of the multimeter fuses required for different projects are different. Often, different high-precision multimeter devices are needed to test different projects; for another example, in the switch test, it is necessary to simulate working conditions such as pulse width modulation (PWM), and it is necessary to purchase a variety of devices to build a test environment for simulation, resulting in low test efficiency.

[0004] Therefore, how to get rid of expensive testing devices and improve test efficiency in automotive electronics hardware testing is a technical problem that those skilled in the art need to solve at present. Summary of the Utility Model

[0005] The purpose of the utility model is to provide an automotive electronics hardware testing device, thereby reducing the test cost and improving the test efficiency. Another purpose of the utility model is to provide an automotive electronics hardware testing system including the above-mentioned automotive electronics hardware testing device.

[0006] To solve the above technical problems, the utility model provides an automotive electronics hardware testing device. The automotive electronics hardware testing device is grounded with the device under test. The automotive electronics hardware testing device includes: a power supply module, a relay selection module, a collection & signal amplification module, an MCU module, and a PWM output circuit module;

[0007] The power supply module is connected to the relay selection module, the relay selection module is connected to the device under test, the MCU module is respectively connected to the power supply module, the relay selection module, the collection & signal amplification module, and the PWM output circuit module, and the relay selection module is connected to the collection & signal amplification module;

[0008] A power supply module is used to convert the input voltage provided by an input power supply and supply power to a relay selection module, a collection & signal amplification module, an MCU module, a PWM output circuit module, and a DUT (device under test) according to the converted voltage. The voltage range of the input voltage includes: 8V to 60V.

[0009] The relay selection module includes multiple relays and control components corresponding to each of the multiple relays.

[0010] The MCU module is used to control the multiple control components to turn on or off the multiple relays respectively when performing a sleep current test on the DUT, so that the voltage of the DUT is the test voltage required for the sleep current test.

[0011] The collection & signal amplification module is used to amplify the signal of the sleep current flowing through the relay selection module when performing a sleep current test on the DUT.

[0012] The MCU module is also used to perform A / D acquisition on the voltage signal after signal amplification to determine the sleep current of the DUT when performing a sleep current test on the DUT. It is used to output a PWM signal to the PWM output circuit module during a single-ended PWM input test or a differential PWM input test.

[0013] The PWM output circuit module is used to output a single-ended PWM signal or a differential PWM signal to the DUT.

[0014] Optionally, the collection & signal amplification module includes: a first sampling resistor, a second sampling resistor, a first current monitor, and a second current monitor.

[0015] The resistance value of the first sampling resistor is less than that of the second sampling resistor. The first sampling resistor and the second sampling resistor are respectively connected to different relays in the relay selection module.

[0016] The first current monitor is connected to the first sampling resistor. The first current monitor is used to amplify the signal of the sleep current flowing through the first sampling resistor.

[0017] The second current monitor is connected to the second sampling resistor. The second current monitor is used to amplify the signal of the sleep current flowing through the second sampling resistor.

[0018] Optionally, the relay selection module includes: a first relay, a second relay, a third relay, a first NPN transistor, a second NPN transistor, and a third NPN transistor.

[0019] The first relay is connected to the first NPN transistor. The second relay is connected to the first sampling resistor and the second NPN transistor. The third relay is connected to the second sampling resistor and the third NPN transistor.

[0020] The first NPN transistor is used to control the conduction and disconnection of the first relay based on the control of the MCU module; the first relay is used to keep the DUT in a normal working state when it is conducting.

[0021] The second NPN transistor is used to control the conduction and disconnection of the second relay based on the control of the MCU module; the third NPN transistor is used to control the conduction and disconnection of the third relay based on the control of the MCU module; the second relay and the third relay are used to put the DUT into a sleep state when they are conducting.

[0022] Optionally, the PWM output circuit module includes: an open-drain PWM output circuit module and a differential PWM output circuit module;

[0023] The MCU module is used to output a PWM signal to the open-drain PWM output circuit module during single-ended PWM input testing; and is used to output a PWM signal to the differential PWM output circuit module during differential PWM input testing.

[0024] Optionally, the open-drain PWM output circuit module includes: a first unidirectional zener diode, a first NMOS transistor, and a first bidirectional zener diode;

[0025] The G pole of the first NMOS transistor is connected to the first GPIO port of the MCU module, the D pole of the first NMOS transistor is connected to the PWM output port of the MCU module, and the S pole of the first NMOS transistor is grounded; the anode of the first unidirectional zener diode is connected to the S pole of the first NMOS transistor, and the cathode of the first unidirectional zener diode is connected to the G pole of the first NMOS transistor; one end of the first bidirectional zener diode is connected to the D pole of the first NMOS transistor, and the other end of the first bidirectional zener diode is grounded;

[0026] The first unidirectional zener diode is used for clamping the GS voltage of the first NMOS transistor to protect the first NMOS transistor from damage;

[0027] The first NMOS transistor is used to conduct when the first GPIO port of the MCU module outputs a high level;

[0028] The first bidirectional zener diode is used for surge and electrostatic protection to prevent the DS pole of the first NMOS transistor from being broken down.

[0029] Optionally, the differential PWM output circuit module includes: a first operational amplifier, a second operational amplifier, a second bidirectional zener diode, and a third bidirectional zener diode;

[0030] The non-inverting input terminal of the first operational amplifier is connected to the second GPIO port of the MCU module, and the output terminal of the first operational amplifier is connected to the inverting input terminal of the second operational amplifier and the first differential signal output plug-in; the output terminal of the second operational amplifier is connected to the second differential signal output plug-in; the first differential signal output plug-in is connected to the positive input of the DUT, and the second differential signal output plug-in is connected to the negative input of the DUT;

[0031] The output level of the first operational amplifier is consistent with the output level of the second GPIO port of the MCU module; the first operational amplifier is used to output a high level to the first differential signal output plug-in when the second GPIO port of the MCU module outputs a high level;

[0032] The second operational amplifier is used to output a low level to the second differential signal output plug-in when the second GPIO port of the MCU module outputs a high level.

[0033] Optionally, the automotive electronics hardware test device further includes: a resistor array; the resistor array is respectively connected to the MCU module and the DUT;

[0034] The resistor array includes multiple ranges of resistors, and the configurable resistance range of the multiple ranges of resistors is 0 to 10 MΩ;

[0035] The resistor matrix is used to adjust the resistance value when performing a switching ground drift test on the DUT.

[0036] Optionally, the automotive electronics hardware test device further includes: a touch display screen; the touch display screen is respectively connected to the power supply module and the MCU module;

[0037] The power supply module is used to supply power to the screen backlight of the touch display screen;

[0038] The MCU module is used to control the touch display screen to perform screen display through the SPI bus to output the test result; it is also used to read the touch signal input by the user based on the touch display screen through the SPI bus to obtain the touch position of the user, and switch the test mode according to the touch position;

[0039] The touch display screen is used to receive the touch signal; it is also used to output the test result.

[0040] Optionally, the automotive electronics hardware test device further includes: a display screen and a multi-functional button; the display screen and the multi-functional button are both connected to the power supply module and the MCU module;

[0041] The power supply module is used to supply power to the screen backlight of the display screen and the multi-functional button;

[0042] The MCU module is used to control the display screen to perform screen display through the SPI bus to output test results; it is also used to switch the test mode according to the input of the multifunctional button.

[0043] The display screen is used to output test results.

[0044] The multifunctional button is used for users to select the test mode.

[0045] This application also provides an automotive electronics hardware test system. The automotive electronics hardware test system includes an input power supply UBD, a device under test, and the above-mentioned automotive electronics hardware test device.

[0046] The UBD is connected to the automotive electronics hardware test device, and the automotive electronics hardware test device is connected to the device under test.

[0047] The UBD is used to provide an input voltage to the automotive electronics hardware test device; the voltage range of the input voltage includes: 8V to 60V.

[0048] The automotive electronics hardware test device is used to convert the input voltage, supply power to the device under test according to the converted voltage, and perform a sleep current test, a single-ended PWM input test, or a differential PWM input test on the device under test.

[0049] Compared with the above-mentioned background technology, the automotive electronics hardware test device provided by the present invention can realize various functions such as sleep current test, open-drain PWM input test, and differential PWM input test with a wide voltage input range (i.e., 8V to 60V). It does not need to use expensive and large test equipment such as signal generators and load boxes, which can reduce the test cost, and at the same time greatly save the time and labor cost for building the experimental environment, improve the test efficiency, and have a wide application range.

[0050] In addition, the automotive electronics hardware test device provided by the present invention can also realize the function of adjusting the resistance value from 0 to 10MΩ, so that the switch ground drift test can be carried out, further enriching the application scenarios of the automotive electronics hardware test device. BRIEF DESCRIPTION OF THE DRAWINGS

[0051] Figure 1 It is a schematic diagram of an automotive electronics hardware test device provided by the present invention.

[0052] Figure 2 It is a schematic diagram of a power supply module provided by the present invention.

[0053] Figure 3 It is a schematic diagram of a relay gating module and a collection & signal amplification module provided by the present invention.

[0054] Figure 4A flowchart of the sleep current test provided by the present utility model;

[0055] Figure 5 A schematic diagram of an open-drain PWM output circuit module provided by the present utility model;

[0056] Figure 6 A schematic diagram of a differential PWM output circuit module provided by the present utility model;

[0057] Figure 7 A schematic diagram of a resistor array provided by the present utility model;

[0058] Figure 8 A schematic diagram of a connector of a (touch) display screen provided by the present utility model;

[0059] Figure 9 A schematic diagram of a multi-functional button provided by the present utility model;

[0060] Figure 10 A schematic diagram of another automotive electronic hardware test device provided by the present utility model. Detailed implementation manners

[0061] The core of the present utility model is to provide an automotive electronic hardware test device, thereby reducing the test cost and improving the test efficiency.

[0062] The automotive electronic hardware test device provided by the present utility model only requires an adjustable input power supply as external power supply, and can complete multiple tests such as sleep current test, switch ground drift test, open-drain PWM input test, and differential PWM input test without other devices. The automotive electronic hardware test device and the device under test share the same ground, and at the same time, the automotive electronic hardware test device can provide power for the device under test. The switch acquisition circuit and PWM acquisition circuit of the device under test can be connected to the automotive electronic hardware test device through a wire harness, so as to complete the construction of the test environment for the above multiple tests.

[0063] In order to enable those skilled in the art to better understand the solution of the present utility model, the present utility model will be further described in detail below with reference to the drawings and specific implementation manners.

[0064] Please refer to Figure 1 , Figure 1 A schematic diagram of an automotive electronic hardware test device provided by the present utility model.

[0065] The automotive electronics hardware test device is grounded with the device under test. The automotive electronics hardware test device may include: a power supply module, a relay gating module, a collection & signal amplification module, a microcontroller unit (MCU) module, and a pulse width modulation (PWM) output circuit module.

[0066] The power supply module is connected to the relay gating module, the relay gating module is connected to the device under test, the MCU module is respectively connected to the power supply module, the relay gating module, the collection & signal amplification module, and the PWM output circuit module, and the relay gating module is connected to the collection & signal amplification module.

[0067] The power supply module is used to convert the input voltage provided by the input power supply (UBD), and supply power to the relay gating module, the collection & signal amplification module, the MCU module, the PWM output circuit module, and the device under test according to the converted voltage.

[0068] It should be noted that the automotive electronics hardware test device provided by the present utility model can be applicable to a 12V system of commercial vehicles, a 24V system of passenger vehicles, as well as a specific battery management system (BMS) or other 48V systems. At this time, the voltage range of the input voltage provided by the input power supply can include: 8V to 60V. Therefore, a chip with a wide voltage input range can be selected for the power supply module, so that the automotive electronics hardware test device can be applied to the above-mentioned multiple scenarios.

[0069] Among them, the wide voltage input range can include: 8V to 60V.

[0070] The relay gating module includes a plurality of relays and control components corresponding to each of the plurality of relays.

[0071] The MCU module is used to control the plurality of control components to respectively conduct or disconnect the plurality of relays when performing a sleep current test on the device under test, so that the voltage of the device under test is the test voltage required for the sleep current test.

[0072] Since the specification requirements corresponding to different devices under test are different, the sleep current can range from the nanoampere level to about the ten milliampere level, with a large span. Therefore, the relay gating module can include a plurality of relays, and the plurality of relays can be respectively connected to sampling resistors with different resistance values, so as to divide the sleep current into intervals and respectively collect and test the sleep current in different intervals.

[0073] The collection & signal amplification module is used to amplify the signal of the sleep current flowing through the relay gating module when performing a sleep current test on the device under test.

[0074] The MCU module selects multiple relays in the relay selection module. At this time, the sleep current will flow through the turned-on relays, and the acquisition & signal amplification module can amplify the signal of this sleep current, which is beneficial for subsequent A / D acquisition.

[0075] The MCU module is also used to perform A / D acquisition on the voltage signal after signal amplification when testing the sleep current of the device under test, so as to determine the sleep current of the device under test; and is used to output a PWM signal to the PWM output circuit module during open-drain PWM input testing or differential PWM input testing.

[0076] The PWM output circuit module is used to output an open-drain PWM signal or a differential PWM signal to the device under test.

[0077] In some implementation manners, the PWM output circuit module may include: an open-drain PWM output circuit module and a differential PWM output circuit module.

[0078] At this time, the MCU module is used to output a PWM signal to the open-drain PWM output circuit module during open-drain PWM input testing; and is used to output a PWM signal to the differential PWM output circuit module during differential PWM input testing.

[0079] Through the above-mentioned automotive electronics hardware test device, various functions such as sleep current testing with a wide voltage input range (i.e., 8V to 60V), open-drain PWM input testing, and differential PWM input testing can be realized. There is no need to use expensive and large test equipment such as signal generators and load boxes, which can reduce the test cost, and at the same time greatly save the time and labor cost for building the experimental environment, improve the test efficiency, and have a wide application range.

[0080] Please refer to Figure 2 , Figure 2 which is a schematic diagram of a power supply module provided by the present utility model.

[0081] The power supply module may include a switching power supply (DC / DC) module and a linear voltage regulator (low dropout regulator, LDO) module.

[0082] At this time, the DC / DC module is respectively connected to the LDO module and the relay selection module, the relay selection module is connected to the device under test, the MCU module is respectively connected to the LDO module, the relay selection module, the acquisition & signal amplification module, and the PWM output circuit module, and the relay selection module is connected to the acquisition & signal amplification module.

[0083] The DC / DC module may include: a chip with a wide input voltage range. The DC / DC module is used to convert the input voltage provided by the input power supply to obtain a first voltage, and supply power to the relay gating module and the device under test according to the first voltage.

[0084] The LDO module is used to convert the first voltage to obtain a second voltage, and supply power to the acquisition & signal amplification module, the MCU module, and the PWM output circuit module according to the second voltage.

[0085] In some implementation manners, the first voltage may be 5V, and the second voltage may be 3.3V.

[0086] Specifically, the DC / DC module may select the LMR16020 chip. The input voltage range of the LMR16020 chip can be as high as 60V, so it can cope with the tests of various vehicle controllers; at the same time, the switching frequency can be configured to 500KHz through R107 (shown in Figure 2 ), so that the DC / DC module can output stably. The input voltage can be reduced to 5V through the LMR16020 chip for power supply.

[0087] Specifically, the LDO module may select the TLV70233 chip. The TLV70233 chip can convert 5V to 3.3V, so it can supply power to electronic components with a working voltage of 3.3V such as the STM32F103 chip; at the same time, the current range of the TLV70233 chip can be as high as 300mA, which can meet the maximum working current requirements of the subsequent electrical appliances, and the power supply accuracy of the TLV70233 chip is 2%, so it can stably supply power to the STM32F103 chip.

[0088] It should be noted that Figure 2 the specific settings and specific selections of the electronic components in Figure 2 can be set according to actual needs, and are not limited to

[0089] the shown connection relationship and specific values. Figure 3 Figure 3 Please refer to

[0090] which is a schematic diagram of a relay gating module and an acquisition & signal amplification module provided by the present utility model. Figure 3 Figure 3 Figure 3 Figure 3 Figure 3 Figure 3 Figure 3 Figure 3

[0091] ​The resistance value of the first sampling resistor can be less than that of the second sampling resistor, and the first sampling resistor and the second sampling resistor are respectively connected to different relays in the relay selection module.

[0092] In some implementation manners, the resistance value of the first sampling resistor can be set to 1.65 Ω, and the resistance value of the second sampling resistor can be set to 33 Ω. At this time, the current range of the sleep current flowing through the first sampling resistor can be 0 - 10 mA, and the current range of the sleep current flowing through the second sampling resistor can be 0 - 500 μA, that is, the current range of the sleep current can be 0.5 mA to 10 mA, and the corresponding voltage range can be 0.165 V to 3.3 V.

[0093] The first current monitor is connected to the first sampling resistor; the first current monitor is used for amplifying the signal of the sleep current flowing through the first sampling resistor.

[0094] The second current monitor is connected to the second sampling resistor; the second current monitor is used for amplifying the signal of the sleep current flowing through the second sampling resistor.

[0095] In some implementation manners, INA283 can be selected for the first current monitor and the second current monitor.

[0096] Specifically, the first current monitor and the second current monitor can respectively amplify the sleep current by 200 times.

[0097] The relay selection module can include: a first relay (RLY1 shown in Figure 3 ), a second relay (RLY2 shown in Figure 3 ), a third relay (RLY3 shown in Figure 3 ), a first NPN transistor (Q1 shown in Figure 3 ), a second NPN transistor (Q2 shown in Figure 3 ), and a third NPN transistor (Q3 shown in Figure 3 ).

[0098] Specifically, a power relay with a supply voltage of 5 V and a rated current of 5 A can be selected for the relay, so that the high-power domain controller can also use the relay to work overcurrent.

[0099] The first relay is connected to the first NPN transistor; the second relay is connected to the first sampling resistor and the second NPN transistor, and the third relay is connected to the second sampling resistor and the third NPN transistor.

[0100] It should be noted that the channels corresponding to the second NPN transistor and the third NPN transistor can be respectively connected to different ports of the MCU module. At this time, the relay selection module can have the function of collecting the passing voltage, so that the voltage reaching the device under test (DUT) of the sample to be measured is the test voltage required for the sleep current test.

[0101] The first NPN transistor is used to control the conduction and disconnection of the first relay based on the control of the MCU module. The first relay is used to keep the device under test in a normal working state when it is conducting.

[0102] The second NPN transistor is used to control the conduction and disconnection of the second relay based on the control of the MCU module. The third NPN transistor is used to control the conduction and disconnection of the third relay based on the control of the MCU module. The second relay and the third relay are used to make the device under test enter the sleep state when they are conducting.

[0103] It should be noted that the initial state is that the first relay is conducting, while the second relay and the third relay are not conducting. Since there is no sampling resistor connected to the first relay, the power supply of the DUT can completely pass through the first relay at this time, and the DUT can enter the normal working state. At this time, the current may be as high as 2A. At this time, the relay G5NB-1A-E-DC5V can be selected.

[0104] The MCU module can make the DUT enter the sleep mode after a preset time. Specifically, the preset time can be set to 5 to 10 seconds. At this time, the MCU module can first control the second NPN transistor to conduct and control the first NPN transistor to disconnect. The sleep current can flow through the second relay and form a voltage drop on the first sampling resistor. After being amplified by the first current monitor, it is collected by the MCU module through A / D conversion. Since a full-scale voltage of 3.3V will be formed when the sleep current is 500uA, when the voltage value collected by the MCU module through A / D conversion is not the full-scale voltage, the MCU module can control the third NPN transistor to conduct and control the second NPN transistor to disconnect. Then the sleep current can flow through the third relay and the second sampling resistor.

[0105] In some implementation manners, the relay selection module may further include a second unidirectional voltage stabilizing diode (D2 shown in Figure 3 and a fourth bidirectional voltage stabilizing diode (D1 shown in Figure 3 ).

[0106] The second unidirectional voltage stabilizing diode can be connected in series with the first relay, the second relay and the third relay to achieve the function of preventing reverse connection.

[0107] The fourth bidirectional voltage stabilizing diode can be connected in parallel with the second unidirectional voltage stabilizing diode to achieve surge and electrostatic protection functions.

[0108] It should be noted that Figure 3 the specific settings and selections of the electronic components in Figure 3 can be set according to actual requirements, and are not limited to

[0109] the connection relationships and specific values shown.

[0110] Please refer to Figure 4 , Figure 4 which is a flowchart of a sleep current test provided by the present utility model. The specific implementation steps of the sleep current test are as follows:

[0111] S401: The MCU module controls the first NPN transistor to conduct, and the second NPN transistor and the third NPN transistor to be disconnected.

[0112] Specifically, the MCU module can select the STM32F103 chip, select an 8 MHz crystal as the main crystal, and select a 32.768 KHz RTC crystal. An external Joint Test Action Group (JTAG) debug port connector is used for program burning and debugging.

[0113] S402: After the MCU module delays for 5 to 10 seconds, it controls the second NPN transistor to conduct and controls the first NPN transistor to be disconnected.

[0114] S403: The MCU module performs A / D acquisition on the channel corresponding to the second NPN transistor to obtain a first A / D value.

[0115] If the MCU module determines that the first A / D value is greater than or equal to 2048, it executes step S404; if the MCU module determines that the value obtained by A / D acquisition is less than 2048, it executes steps S405 to S407.

[0116] S404: The MCU module determines the current value of the sleep current according to the first A / D value and the resistance value of the first sampling resistor.

[0117] S405: The MCU module controls the third NPN transistor to conduct and controls the second NPN transistor to be disconnected.

[0118] S406: The MCU module performs A / D acquisition on the channel corresponding to the third NPN transistor to obtain a second A / D value.

[0119] S407: The MCU module determines the current value of the sleep current based on the second A / D value and the resistance value of the second sampling resistor.

[0120] It should be noted that the MCU module can determine the sleep current of the device under test based on the following formula:

[0121]

[0122] where, I q is the sleep current of the device under test, AD is the value obtained through A / D acquisition, Vref is the reference voltage value of AD (which can be set to 3.3V), and R is the resistance value of the first sampling resistor or the second sampling resistor.

[0123] Specifically, the above formula is derived from the following two formulas:

[0124]

[0125] V0 = 200·R·I q

[0126] where, V0 is the output voltage of the operational amplifier.

[0127] Through the above sleep current testing method, the sleep currents of different current values can be tested respectively, improving the testing accuracy of the sleep current.

[0128] Please refer to Figure 5 , Figure 5 , which is a schematic diagram of an open-drain PWM output circuit module provided by the present utility model.

[0129] The open-drain PWM output circuit module may include: a first unidirectional voltage stabilizing diode (shown as D11 in Figure 5 ), a first NMOS transistor (shown as Q4 in Figure 5 ), and a first bidirectional voltage stabilizing diode (shown as D10 in Figure 5 ).

[0130] The G pole of the first NMOS transistor is connected to the first GPIO port of the MCU module (shown as PWM_PA8 in Figure 5 ), the D pole of the first NMOS transistor is connected to the PWM output port of the MCU module (shown as P5 in Figure 5 ), and the S pole of the first NMOS transistor is grounded; the anode of the first unidirectional voltage stabilizing diode is connected to the S pole of the first NMOS transistor, and the cathode of the first unidirectional voltage stabilizing diode is connected to the G pole of the first NMOS transistor; one end of the first bidirectional voltage stabilizing diode is connected to the D pole of the first NMOS transistor, and the other end of the first bidirectional voltage stabilizing diode is grounded.

[0131] The first unidirectional voltage stabilizing diode is used for clamping the GS - pole voltage of the first NMOS transistor to protect the first NMOS transistor from damage.

[0132] The first NMOS transistor is used to conduct when the first GPIO port of the MCU module outputs a high level. It should be noted that the PWM output port of the MCU module is in a constant - high state. When the first GPIO port outputs a high level, the first NMOS transistor conducts. At this time, the automotive electronic hardware test device has the ability to output PWM signals, and the automotive electronic hardware test device only needs to share the ground with the DUT to achieve open - drain PWM input testing.

[0133] The first bidirectional voltage stabilizing diode is used for surge and electrostatic protection to prevent the DS - pole of the first NMOS transistor from being broken down.

[0134] It should be noted that since the Electronic Control Unit (ECU) has a pull - up resistor, it cannot affect the internal resistance value due to being connected in parallel with an external test device. Therefore, Figure 5 the shown resistor R134 is not surface - mounted in the open - drain PWM output circuit module.

[0135] In some implementation modes, the base of the first NMOS transistor can also be connected to the SIGIN connector (SIGIN shown in Figure 5 ). The SIGIN connector is connected to the signal output terminal of the signal generator, and at the same time, the signal generator shares the ground with the open - drain PWM output circuit module. Therefore, when the MCU module is not working, the signal generator can also control the conduction and disconnection of the first NMOS transistor. Therefore, the open - drain PWM output circuit module can also output a PWM wave with the same frequency and duty cycle as the signal generator. At this time, the open - drain PWM output circuit module can also be compatible with the test requirements of special frequencies and duty cycles that may exist outside the MCU module.

[0136] It should be noted that Figure 5 the specific settings and specific selections of the electronic components in Figure 5 can be set according to actual needs and are not limited to

[0137] the shown connection relationship and specific values.

[0138] Please refer to Figure 6 , Figure 6 which is a schematic diagram of a differential PWM output circuit module provided by the present utility model.

[0139] The differential PWM output circuit module may include: a first operational amplifier (U8 shown in Figure 6 ), a second operational amplifier (U9 shown in Figure 6 ), a second bidirectional voltage stabilizing diode (D5 shown in Figure 6 ), and a third bidirectional voltage stabilizing diode (D6 shown in Figure 6 ).

[0140] The non-inverting input terminal of the first operational amplifier is connected to the second GPIO port of the MCU module (DIF_PWM_PA9 shown in Figure 6 ), and the output terminal of the first operational amplifier is connected to the inverting input terminal of the second operational amplifier and a first differential signal output plug-in (DIFF+ shown in Figure 6 ); the output terminal of the second operational amplifier is connected to a second differential signal output plug-in (DIFF- shown in Figure 6 ); the first differential signal output plug-in is connected to the input positive electrode of the sample to be measured, and the second differential signal output plug-in is connected to the input negative electrode of the sample to be measured.

[0141] The first operational amplifier can be used as a follower, and the output level of the first operational amplifier is consistent with the output level of the second GPIO port of the MCU module. The first operational amplifier is used to output a high level to the first differential signal output plug-in when the second GPIO port of the MCU module outputs a high level.

[0142] The second operational amplifier can be used as a comparator. When the first operational amplifier outputs a high level, the second operational amplifier will be greater than its comparison value VCC / 2, so the second operational amplifier will output a low level. The second operational amplifier is used to output a low level to the second differential signal output plug-in when the second GPIO port of the MCU module outputs a high level.

[0143] Specifically, the first operational amplifier and the second operational amplifier can select the OPA320A chip. Since the OPA320A chip is a rail-to-rail operational amplifier and its output can reach its supply voltage, the differential voltage output by the differential PWM output circuit module can reach the operational amplifier power supply voltage, and this voltage can be selected as 5V or 3.3V through a jumper cap (not shown in the drawings). By selecting the operational amplifier power supply voltage as 3.3V or 5V through the jumper cap, the differential waveform level can be adjusted, so as to adapt to more voltage working conditions.

[0144] By adopting the OPA320A chip with a cut-off frequency of 2 MHz, it can support all cases with a common duty cycle accuracy of 20 KHz 1% and below, up to a differential waveform output with a 2 MHz 50% duty cycle.

[0145] It should be noted that Figure 6 the specific settings and selections of the electronic components in Figure 6 can be set according to actual requirements, and are not limited to

[0146] The automotive electronics hardware test device may further include: a resistor array. The resistor array is respectively connected to the MCU module and the device under test.

[0147] Please refer to Figure 7 , Figure 7 which is a schematic diagram of a resistor array provided by the present utility model.

[0148] The resistor array may include multiple ranges of resistors, and the configurable resistor range of the multiple ranges of resistors is 0 to 10 MΩ.

[0149] Specifically, the multiple ranges of resistors may be seven ranges, and the seven ranges of resistors can be connected through connectors (shown in Figure 7 H4 to H8, H10, and H11 in

[0150] The resistance accuracy of the resistor matrix can be 1%. And since the automotive electronics hardware test device does not need to be used in high and low temperature environments, the accuracy of the resistor matrix is relatively high at this time, and it can be applied to various test items that require external matching resistors, such as low effective switch ground drift test, etc.

[0151] The resistor matrix is used to adjust the resistance value when performing a switch ground drift test on the device under test.

[0152] It should be noted that Figure 7 the specific settings and selections of the electronic components in Figure 7 can be set according to actual requirements, and are not limited to

[0153] Through the combination of the above resistors and connectors, different resistance values can be quickly adjusted, and it can be used for switch circuit ground drift test items and other small current test items that require external resistors.

[0154] Optionally, the automotive electronics hardware test device may further include: a touch display screen. The touch display screen is respectively connected to the power supply module and the MCU module.

[0155] The power supply module is used to supply power for the screen backlight of the touch display screen.

[0156] The MCU module is used to control the touch display screen through the SPI bus for screen display to output test results; it is also used to read the touch signals input by the user based on the touch display screen through the SPI bus to obtain the touch position of the user, and switch the test mode according to the touch position.

[0157] The touch display screen is used to receive touch signals; it is also used to output test results.

[0158] Optionally, the automotive electronics hardware test device further includes: a display screen and a multifunctional button. Both the display screen and the multifunctional button are connected to the power supply module and the MCU module.

[0159] The power supply module is used to supply power to the screen backlight of the display screen and the multifunctional button.

[0160] The MCU module is used to control the display screen through the SPI bus for screen display to output test results; it is also used to switch the test mode according to the input of the multifunctional button.

[0161] The display screen is used to output test results.

[0162] The multifunctional button is used for the user to select the test mode.

[0163] Please refer to Figure 8 and Figure 9 , Figure 8 , which is a schematic diagram of a connector of a (touch) display screen provided by the present invention, Figure 9 , which is a schematic diagram of a multifunctional button provided by the present invention.

[0164] Specifically, the (touch) display screen can be connected to the MCU module through a connector (shown as U4 in Figure 8 ).

[0165] Specifically, when the power supply module includes a DC / DC module and an LDO module, the DC / DC module is used to supply power to the screen backlight of the (touch) display screen; the LDO module is used to supply power to the multifunctional button.

[0166] Specifically, the brightness of the (touch) display screen can be adjusted by adjusting the resistor R104 (shown in Figure 8 ).

[0167] Optionally, the automotive electronics hardware test device can also include the above-mentioned touch display screen and the above-mentioned multifunctional button at the same time.

[0168] In some other implementation manners, since the sleep state working conditions of some commercial vehicle projects are not fixed but in a polling state, and the sleep current is a curve with a certain period at this time, the MCU module can continuously perform A / D acquisition on the channel corresponding to the second relay, and output the sleep current curve, the maximum value of the sleep current, and the minimum value of the sleep current to the (touch) display screen, so that the test execution engineer can read the data.

[0169] In some other implementation manners, the MCU module can also perform A / D acquisition on the voltages corresponding to the resistor R83 and the resistor R99 (shown in Figure 3 ), and the (touch) display screen can output the values obtained by the above A / D acquisition. Therefore, the test execution engineer can determine whether the voltage of the DUT meets the test voltage required for the sleep current test according to the above values.

[0170] It should be noted that Figure 8 and Figure 9 The specific settings and specific selections of the electronic components in can be set according to actual requirements, and are not limited to Figure 8 and Figure 9 the connection relationships and specific values shown.

[0171] Please refer to Figure 10 which Figure 10 is a schematic diagram of another automotive electronic hardware test device provided by the present utility model. At this time, the power supply module of the automotive electronic hardware test device includes: a DC / DC module and an LDO module. The PWM output circuit module includes: an open-drain PWM output circuit module and a differential PWM output circuit module. The relay selection module is connected to the power line output module and supplies power to the device under test through the power line output module. And the automotive electronic hardware test device further includes a resistor array module and a display screen & touch screen module. It should be noted that the display screen & touch screen module can only include a touch display screen, or include both a touch display screen and a multi-functional key at the same time, or include both a display screen and a multi-functional key at the same time.

[0172] The present application also provides an automotive electronic hardware test system. The automotive electronic hardware test system includes an input power supply UBD, a device under test, and the above-mentioned automotive electronic hardware test device.

[0173] The UBD is connected to the automotive electronic hardware test device, and the automotive electronic hardware test device is connected to the device under test.

[0174] The UBD is used to provide an input voltage to the automotive electronic hardware test device; the voltage range of the input voltage includes: 8V to 60V.

[0175] An automotive electronics hardware test device is used to convert the input voltage, supply power to the device under test according to the converted voltage, and perform a sleep current test, an open-drain PWM input test, or a differential PWM input test on the device under test.

[0176] In some implementation manners, the automotive electronics hardware test device can also be used to perform a switching ground drift test on the device under test.

[0177] In this article, each embodiment is described in a progressive, or parallel, or a combination of progressive and parallel manners. Each embodiment focuses on the differences from other embodiments. For the same or similar parts among the embodiments, reference can be made to each other.

[0178] It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that an article or device including a series of elements not only includes those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such article or device. Without further limitation, an element defined by the statement "including one..." does not exclude the existence of another identical element in the article or device including the above element.

[0179] The above has introduced the automotive electronics hardware test device provided by the present utility model in detail. Specific examples are used in this article to elaborate on the principle and implementation manner of the present utility model. The description of the above embodiments is only used to help understand the method and its core idea of the present utility model. It should be pointed out that for those of ordinary skill in the art in this technical field, without departing from the principle of the present utility model, several improvements and modifications can be made to the present utility model, and these improvements and modifications also fall within the protection scope of the claims of the present utility model.

Claims

1. An automotive electronic hardware testing device, characterized in that, The automotive electronics hardware testing device is grounded with the device under test. The automotive electronics hardware testing device includes: a power supply module, a relay selection module, a collection & signal amplification module, an MCU module, and a PWM output circuit module; The power supply module is connected to the relay selection module, the relay selection module is connected to the device under test, the MCU module is respectively connected to the power supply module, the relay selection module, the collection & signal amplification module, and the PWM output circuit module, and the relay selection module is connected to the collection & signal amplification module; The power supply module is used to convert the input voltage provided by the input power supply and supply power to the relay selection module, the collection & signal amplification module, the MCU module, the PWM output circuit module, and the device under test according to the converted voltage; the voltage range of the input voltage includes: 8V to 60V; The relay selection module includes a plurality of relays and respective control components corresponding to the plurality of relays; The MCU module is used to control the plurality of control components to respectively conduct or disconnect the plurality of relays when performing a sleep current test on the device under test, so that the voltage of the device under test is the test voltage required for the sleep current test; The collection & signal amplification module is used to amplify the signal of the sleep current flowing through the relay selection module when performing a sleep current test on the device under test; The MCU module is further used to perform A / D collection on the voltage signal after signal amplification when performing a sleep current test on the device under test to determine the sleep current of the device under test; and is used to output a PWM signal to the PWM output circuit module during a single-ended PWM input test or a differential PWM input test; The PWM output circuit module is used to output a single-ended PWM signal or a differential PWM signal to the device under test.

2. The automotive electronic hardware testing device according to claim 1, wherein The collection & signal amplification module includes: a first sampling resistor, a second sampling resistor, a first current monitor, and a second current monitor; The resistance value of the first sampling resistor is less than that of the second sampling resistor; the first sampling resistor and the second sampling resistor are respectively connected to different relays in the relay selection module; The first current monitor is connected to the first sampling resistor; the first current monitor is used to amplify the signal of the sleep current flowing through the first sampling resistor; The second current monitor is connected to the second sampling resistor; the second current monitor is used to amplify the signal of the sleep current flowing through the second sampling resistor.

3. The automotive electronic hardware testing device according to claim 2, wherein, The relay selection module includes: a first relay, a second relay, a third relay, a first NPN transistor, a second NPN transistor, and a third NPN transistor; The first relay is connected to the first NPN transistor; the second relay is connected to the first sampling resistor and the second NPN transistor, and the third relay is connected to the second sampling resistor and the third NPN transistor; The first NPN transistor is used to control the conduction and disconnection of the first relay based on the control of the MCU module; the first relay is used to keep the DUT in a normal working state when it is conducting; The second NPN transistor is used to control the conduction and disconnection of the second relay based on the control of the MCU module; the third NPN transistor is used to control the conduction and disconnection of the third relay based on the control of the MCU module; the second relay and the third relay are used to put the DUT into a sleep state when they are conducting.

4. The automotive electronic hardware testing device according to claim 1, wherein, The PWM output circuit module includes an open-drain PWM output circuit module and a differential PWM output circuit module; The MCU module is used to output a PWM signal to the open-drain PWM output circuit module during single-ended PWM input testing; and is used to output a PWM signal to the differential PWM output circuit module during differential PWM input testing.

5. The automotive electronic hardware testing device according to claim 4, characterized in that, The open-drain PWM output circuit module includes a first unidirectional zener diode, a first NMOS transistor, and a first bidirectional zener diode; The G pole of the first NMOS transistor is connected to the first GPIO port of the MCU module, the D pole of the first NMOS transistor is connected to the PWM output port of the MCU module, and the S pole of the first NMOS transistor is grounded; the anode of the first unidirectional zener diode is connected to the S pole of the first NMOS transistor, and the cathode of the first unidirectional zener diode is connected to the G pole of the first NMOS transistor; one end of the first bidirectional zener diode is connected to the D pole of the first NMOS transistor, and the other end of the first bidirectional zener diode is grounded; The first unidirectional zener diode is used for clamping the GS voltage of the first NMOS transistor, Protect the first NMOS transistor from being damaged; The first NMOS transistor is used to conduct when the first GPIO port of the MCU module outputs a high level; The first bidirectional zener diode is used for surge and electrostatic protection to prevent the DS pole of the first NMOS transistor from being broken down.

6. The automotive electronic hardware testing device according to claim 4, characterized in that The differential PWM output circuit module includes a first operational amplifier, a second operational amplifier, a second bidirectional zener diode, and a third bidirectional zener diode; The non-inverting input terminal of the first operational amplifier is connected to the second GPIO port of the MCU module, the output terminal of the first operational amplifier is connected to the inverting input terminal of the second operational amplifier and a first differential signal output plug; the output terminal of the second operational amplifier is connected to a second differential signal output plug; the first differential signal output plug is connected to the positive input of the DUT, and the second differential signal output plug is connected to the negative input of the DUT; The output level of the first operational amplifier is consistent with the output level of the second GPIO port of the MCU module; the first operational amplifier is used to output a high level to the first differential signal output plug when the second GPIO port of the MCU module outputs a high level; The second operational amplifier is configured to output a low level to the second differential signal output plug when the second GPIO port of the MCU module outputs a high level.

7. The automotive electronic hardware testing device according to claim 1, wherein The automotive electronic hardware test device further includes: a resistor array; the resistor array is respectively connected to the MCU module and the device under test. The resistor array includes multiple ranges of resistors, and the configurable resistance range of the multiple ranges of resistors is 0 to 9.999999 MΩ. The resistor matrix is used to adjust the resistance value when performing a switching ground drift test on the device under test.

8. The automotive electronic hardware testing device according to claim 1, characterized in that, The automotive electronic hardware test device further includes: a touch display screen; the touch display screen is respectively connected to the power supply module and the MCU module. The power supply module is used to supply power to the screen backlight of the touch display screen. The MCU module is used to control the touch display screen to perform screen display through the SPI bus to output test results; it is also used to read the touch signal input by the user based on the touch display screen through the SPI bus, obtain the touch position of the user, and switch the test mode according to the touch position. The touch display screen is used to receive the touch signal; it is also used to output the test results.

9. The automotive electronic hardware testing device according to claim 1, wherein, The automotive electronic hardware test device further includes: a display screen and multifunctional keys; the display screen and the multifunctional keys are both connected to the power supply module and the MCU module. The power supply module is used to supply power to the screen backlight of the display screen and the multifunctional keys. The MCU module is used to control the display screen to perform screen display through the SPI bus to output test results; it is also used to switch the test mode according to the input of the multifunctional keys. The display screen is used to output the test results. The multifunctional keys are used for the user to select the test mode.

10. An automotive electronic hardware testing system, characterized in that, The automotive electronic hardware test system includes an input power supply UBD, a device under test, and the automotive electronic hardware test device according to any one of claims 1 to 9. The UBD is connected to the automotive electronic hardware test device, and the automotive electronic hardware test device is connected to the device under test. The UBD is used to provide an input voltage to the automotive electronic hardware test device. The voltage range of the input voltage includes: 8V to 60V. The automotive electronic hardware test device is used to convert the input voltage, supply power to the device under test according to the converted voltage, and perform a sleep current test, a single-ended PWM input test, or a differential PWM input test on the device under test.

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