Force and torque measuring system based on multi-channel CMOS (Complementary Metal Oxide Semiconductor) sensor

Abstract

The utility model provides a force and torque measuring system based on a multichannel CMOS sensor, which comprises a first platform and a second platform which are oppositely arranged, a deformation structure is arranged between the first platform and the second platform, and a multichannel CMOS sensor body and a light emitting diode array are both arranged on the first platform or the second platform. Any channel on the multi-channel CMOS sensor body captures an optical signal which is emitted by the light emitting diode array and is reflected by the second platform. The light intensity of different wavelengths detected by the multi-channel CMOS sensor body can change along with the change of the relative position between the second platform and the first platform, the change is caused by deflection of a mechanical mechanism under different loads, and an electric signal generated in the multi-channel CMOS sensor body corresponds to the change of the light intensity. Specific force and / or torque loads can be accurately mapped, and the accuracy and reliability of measurement can be improved.

Description

Technical Field

[0001] The utility model relates to the technical field of force and torque detection, and particularly to a force and torque measurement system based on a multi-channel CMOS sensor. Background Art

[0002] In various applications, the measurement of force and torque is fundamental, from industrial automation to medical robotics. Over the years, many transduction technologies have been used to achieve these measurements, including but not limited to strain gauges, optical sensing, capacitive sensing, magnetic field sensing, and piezoelectric sensing. These technologies all have their unique advantages and limitations, which form their applicability to different applications.

[0003] The existing Chinese patent application document with the publication number CN104634496A discloses a measuring device and method for electromagnetic force or electromagnetic torque. The measuring device includes: a first support platform for mounting a first electromagnetic device and a second support platform for mounting a second electromagnetic device; the first support platform is provided with a driving mechanism for driving the first electromagnetic device to move, so as to adjust the relative position and attitude between the first electromagnetic device and the second electromagnetic device; a sensor for detecting electromagnetic force or electromagnetic torque is provided on the second support platform; the measuring device further includes a first current source for supplying current to the first electromagnetic device and a second current source for supplying current to the second electromagnetic device.

[0004] One of the inherent challenges in force and torque sensing is the limited signal information that can be obtained. The amount of available information is directly proportional to the number of sensor elements integrated into the structure. Therefore, in order to capture a comprehensive picture of the applied force and torque, a large number of sensors need to be placed on various parts of the device.

[0005] However, even with an extensive sensor network, the accuracy and reliability of the measurement will be affected by the non-linear effects inherent in the sensor principle itself. For example, a strain gauge may exhibit non-uniform deformation along its length when subjected to bending or shear forces. This non-uniformity results in a non-linear response, complicating the interpretation of the sensor signal. Similarly, in a capacitive sensor, the geometry of the electrodes, especially at the edges of the capacitor plates, can introduce non-linearity. Magnetic field sensors are not immune to these challenges either; the relationship between force and magnetic field strength may become non-linear, especially when the air gap change between magnetic components is introduced by the applied force.

[0006] Traditionally, addressing these non - linear effects involves two methods. The first method is to deploy a large number of sensors in different parts of the device, aiming to capture the non - linear effects and provide a more accurate representation of the applied forces and torques. The second method relies on complex, highly non - linear algorithms to interpret the sensor signals. While this may produce more accurate results, it comes at the cost of increased computational load, making it unsuitable for real - time applications, especially when dealing with multiple sensor pairs where complex inverse kinematic relationships need to be derived from non - linear signals. Even with these strategies, challenges remain. Sensor signals are vulnerable to variations caused by multiple motions of the underlying structure, leading to ambiguities and an infinite number of potential solutions for the actual motion. Therefore, there is an urgent need for a more reliable and accurate method for force and torque measurement. Summary of the Invention

[0007] Aiming at the defects in the prior art, the object of the present utility model is to provide a force and torque measurement system based on a multi - channel CMOS sensor.

[0008] A force and torque measurement system based on a multi - channel CMOS sensor according to the present utility model includes a first platform, a second platform, a multi - channel CMOS sensor body, a light - emitting diode array, and a deformation structure. The first platform and the second platform are arranged opposite to each other, and the deformation structure is arranged between the first platform and the second platform;

[0009] The multi - channel CMOS sensor body is arranged on the first platform, the light - emitting diode array is arranged on the second platform, the multi - channel CMOS sensor body and the light - emitting diode array are arranged opposite to each other, and any channel on the multi - channel CMOS sensor body captures the optical signal emitted by the light - emitting diode array;

[0010] Or, the multi - channel CMOS sensor body is arranged on the second platform, the light - emitting diode array is arranged on the first platform, the multi - channel CMOS sensor body and the light - emitting diode array are arranged opposite to each other, and any channel on the multi - channel CMOS sensor body captures the optical signal emitted by the light - emitting diode array;

[0011] Or, both the multi - channel CMOS sensor body and the light - emitting diode array are arranged on the first platform, and any channel on the multi - channel CMOS sensor body captures the optical signal emitted by the light - emitting diode array and reflected by the second platform;

[0012] Or, both the multi - channel CMOS sensor body and the light - emitting diode array are arranged on the second platform, and any channel on the multi - channel CMOS sensor body captures the optical signal emitted by the light - emitting diode array and reflected by the first platform.

[0013] Preferably, the channels on the multi-channel CMOS sensor body are correspondingly arranged with the light-emitting diodes in the light-emitting diode array.

[0014] Preferably, both the multi-channel CMOS sensor body and the light-emitting diode array are arranged on the first platform, and the light-emitting diode array is arranged on the periphery of the multi-channel CMOS sensor body.

[0015] Preferably, both the multi-channel CMOS sensor body and the light-emitting diode array are arranged on the second platform, and the light-emitting diode array is arranged on the periphery of the multi-channel CMOS sensor body.

[0016] Preferably, an optical isolation cover is arranged between the first platform and the second platform, and both the multi-channel CMOS sensor body and the light-emitting diode array are located inside the optical isolation cover.

[0017] Preferably, the optical isolation cover is installed on the second platform, a serrated groove is arranged on the first platform, a serrated protrusion is arranged on the side of the optical isolation cover away from the second platform, and the serrated protrusion is inserted into the serrated groove;

[0018] Or, the optical isolation cover is installed on the first platform, a serrated groove is arranged on the second platform, a serrated protrusion is arranged on the side of the optical isolation cover away from the second platform, and the serrated protrusion is inserted into the serrated groove.

[0019] Preferably, both the multi-channel CMOS sensor body and the light-emitting diode array are arranged on the first platform, and the optical isolation cover is installed on the second platform;

[0020] A reflection area is formed inside the optical isolation cover, and any channel on the multi-channel CMOS sensor body captures the optical signal emitted by the light-emitting diode array that passes through the reflection area.

[0021] Preferably, the light-emitting diode array is arranged in a circular pattern around the multi-channel CMOS sensor body, and the shape of the reflection area is arc-shaped.

[0022] Preferably, both the multi-channel CMOS sensor body and the light-emitting diode array are arranged on the second platform, and the optical isolation cover is installed on the first platform;

[0023] A reflection area is formed inside the optical isolation cover, and any channel on the multi-channel CMOS sensor body captures the optical signal emitted by the light-emitting diode array that passes through the reflection area.

[0024] Preferably, the light-emitting diode array is arranged in a circular pattern around the CMOS sensor body, and the shape of the reflection area is arc-shaped.

[0025] Compared with the prior art, the utility model has the following beneficial effects:

[0026] 1. The light intensities of different wavelengths detected by the multi-channel CMOS sensor body of the utility model will change with the change of the relative position between the second platform and the first platform, and these changes are caused by the deflection of the mechanical mechanism under different loads. The electrical signals generated from the multi-channel CMOS sensor body, corresponding to the change of the light intensity, can be accurately mapped to specific force and / or torque loads, which helps to improve the accuracy and reliability of the measurement.

[0027] 2. Through the cooperation of the serrated protrusions and serrated grooves of the light isolation cover, on the one hand, the external light can be blocked to ensure the measurement accuracy, and on the other hand, the relative movement between the light isolation cover and another platform is allowed. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] By reading the following detailed description of the non-limiting embodiments with reference to the accompanying drawings, other features, objects and advantages of the utility model will become more apparent:

[0029] Figure 1 It is the schematic diagram of the measurement system in the first embodiment mainly embodied by the utility model;

[0030] Figure 2 It is the schematic diagram of the measurement system in the third embodiment mainly embodied by the utility model;

[0031] Figure 3 It is the schematic diagram of the overall structure of the measurement system in the third embodiment mainly embodied by the utility model.

[0032] REFERENCE MARKS

[0033] The first platform 1

[0034] The second platform 2

[0035] The multi-channel CMOS sensor body 3

[0036] The light-emitting diode array 4

[0037] The deformation structure 5

[0038] The light isolation cover 6

[0039] The reflection area 7 DETAILED DESCRIPTION OF THE EMBODIMENTS

[0040] The present utility model will be described in detail below in conjunction with specific embodiments. The following embodiments will help those skilled in the art to further understand the present utility model, but do not limit the present utility model in any form. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present utility model, several changes and improvements can still be made. These all belong to the protection scope of the present utility model.

[0041] Example 1

[0042] As Figure 1 shown, a force and torque measurement system based on a multi-channel CMOS sensor according to the present utility model includes a first platform 1, a second platform 2, a multi-channel CMOS sensor body 3, a light-emitting diode array 4, and a deformation structure 5. The first platform 1 and the second platform 2 are arranged opposite to each other, and the deformation structure 5 is arranged between the first platform 1 and the second platform 2.

[0043] The multi-channel CMOS sensor body 3 is arranged on the first platform 1, the light-emitting diode array 4 is arranged on the second platform 2, the multi-channel CMOS sensor body 3 and the light-emitting diode array 4 are arranged opposite to each other, and any channel on the multi-channel CMOS sensor body 3 captures the optical signal emitted by the light-emitting diode array 4. And the channels on the multi-channel CMOS sensor body 3 are arranged corresponding to the light-emitting diodes in the light-emitting diode array 4.

[0044] The light intensities of different wavelengths detected by the multi-channel CMOS sensor body 3 will change with the change of the relative position between the light-emitting diode array 4 and the multi-channel CMOS sensor body 3, and these changes are caused by the deflection of the mechanical mechanism under different loads. The electrical signals generated from the multi-channel CMOS sensor body 3, corresponding to the change of the light intensity, can be accurately mapped to specific force and / or torque loads.

[0045] For ease of understanding, the present application provides a feasible implementation manner: the first platform 1 equipped with the multi-channel CMOS sensor body 3 is fixed on the grounded surface, and the second platform 2 can move in response to the deflection of the structure. It should be noted the relative movement between the multi-channel CMOS sensor body 3 and the light-emitting diode array 4.

[0046] In a feasible embodiment of the present application, in order to reduce the influence of ambient light and improve the measurement accuracy, light shielding is adopted in the design. A light isolation cover 6 is provided between the first platform 1 and the second platform 2, and both the multi-channel CMOS sensor body 3 and the light-emitting diode array 4 are located inside the light isolation cover 6. Specifically, a feasible installation method for the light isolation cover 6 provided by the technical solution of the present application is as follows: The light isolation cover 6 is installed on the second platform 2, a serrated groove is provided on the first platform 1, and a serrated protrusion is provided on the side of the light isolation cover 6 away from the second platform 2, and the serrated protrusion is inserted into the serrated groove. Another feasible installation method for the light isolation cover 6 provided by the technical solution of the present application is as follows: The light isolation cover 6 is installed on the first platform 1, a serrated groove is provided on the second platform 2, and a serrated protrusion is provided on the side of the light isolation cover 6 away from the first platform 1, and the serrated protrusion is inserted into the serrated groove. The serrated feature of the light isolation cover 6 in the present application is designed to have two functions: It blocks external light to ensure the measurement accuracy, and at the same time allows the relative movement of the light isolation cover 6 with respect to another platform.

[0047] It should be noted that: The deformation structure 5 of the present application is an elastic member in the prior art that can correspond to various external loads. For example, the elastic member described in the Chinese patent application document with the publication number CN111829714A. Further, it should be noted that the present application does not make specific limitations on the deformation structure 5.

[0048] Example 2

[0049] Based on Embodiment 1, for a force and torque measurement system based on a multi-channel CMOS sensor provided by the present invention, the difference between the technical solution of this embodiment and that of Embodiment 1 is as follows:

[0050] The multi-channel CMOS sensor body 3 is arranged on the second platform 2, the light-emitting diode array 4 is arranged on the first platform 1, the multi-channel CMOS sensor body 3 and the light-emitting diode array 4 are arranged opposite to each other, and any channel on the multi-channel CMOS sensor body 3 captures the optical signal emitted by the light-emitting diode array 4.

[0051] Example 3

[0052] Based on Embodiment 1, for a force and torque measurement system based on a multi-channel CMOS sensor provided by the present invention, the difference between the technical solution of this embodiment and that of Embodiment 1 is as follows:

[0053] Both the multi-channel CMOS sensor body 3 and the light-emitting diode array 4 are arranged on the first platform 1, and any channel on the multi-channel CMOS sensor body 3 captures the optical signal emitted by the light-emitting diode array 4 that is reflected by the second platform 2.

[0054] The light intensities of different wavelengths detected by the multi-channel CMOS sensor body 3 change with the change of the relative position between the second platform 2 and the first platform 1, and these changes are caused by the deflection of the mechanical mechanism under different loads. The electrical signals generated from the multi-channel CMOS sensor body 3, corresponding to the changes in light intensity, can be accurately mapped to specific force and / or torque loads.

[0055] Furthermore, both the multi-channel CMOS sensor body 3 and the light-emitting diode array 4 are disposed on the first platform 1, and the light-emitting diode array 4 is arranged on the periphery of the multi-channel CMOS sensor body 3. The movement between the first platform 1 and the second platform 2 caused by the applied force or torque will result in changes in the light intensity captured by the multi-channel CMOS sensor body 3. In a feasible embodiment of the present application, in order to reduce the influence of ambient light and improve the measurement accuracy, light shielding is adopted in the design. Specifically, the light isolation cover 6 is installed on the second platform 2, the first platform 1 is provided with serrated grooves, and the side surface of the light isolation cover 6 away from the second platform 2 is provided with serrated protrusions, and the serrated protrusions are inserted into the serrated grooves. A reflection area 7 is formed inside the light isolation cover 6, and any channel on the multi-channel CMOS sensor body 3 captures the optical signal emitted by the light-emitting diode array 4 passing through the reflection area 7. In a preferred embodiment of the present application: the light-emitting diode array 4 is arranged in a circular shape around the multi-channel CMOS sensor body 3, and the shape of the reflection area 7 is arc-shaped.

[0056] For the convenience of understanding, the present application also provides a feasible specific embodiment: the multi-channel CMOS sensor body 3 has 900 (30×30) independent optical channels and shows sensitivity in a wide wavelength range from 400m to 1100nm. To optimize the reflection area 7, the surface can be shaped into a circle and additional surface treatment can be applied to enhance reflection and surface roughness. The 900 independent optical channels provide a rich data set, and each channel provides a unique signal combination corresponding to different relative positions and orientations of the reflection surface. This helps to deduce the different positions and orientations of the upper plate through linear mapping from the optical signals across 900 channels. To calculate the six degrees of freedom of force and torque, a 900x6 matrix is constructed and calibrated during the calibration process. Compared with the camera-based motion capture algorithm, this method has the advantage of computational efficiency. In addition, the calculation of force and torque is more decoupled, having obvious advantages over the traditional technical solutions.

[0057] By arranging the multi-channel CMOS sensor body 3 and the light-emitting diode array 4, the force and / or torque sensor can be implemented in a mechanically deformable structure. This design can directly calculate the one-way local displacement of the sensing pair with respect to the position based on the data of the multi-channel CMOS sensor body 3. When the sensing pairs are simultaneously installed on the first platform 1 or the second platform 2 of the structure, the overall deflection of the structure can be deduced, facilitating the calculation of the total external force and / or moment based on the stiffness of the structure.

[0058] Example 4

[0059] Based on the first embodiment, a force and moment measurement system based on a multi-channel CMOS sensor provided by the present invention. The difference between the technical solution of this embodiment and that of the first embodiment lies in:

[0060] Both the multi-channel CMOS sensor body 3 and the light-emitting diode array 4 are arranged on the second platform 2. Any channel on the multi-channel CMOS sensor body 3 captures the optical signal emitted by the light-emitting diode array 4 and reflected by the first platform 1. The light-emitting diode array 4 is arranged on the periphery of the multi-channel CMOS sensor body 3. The light isolation cover 6 is installed on the first platform 1. There are serrated grooves on the second platform 2, and serrated protrusions are provided on the side of the light isolation cover 6 away from the first platform 1, and the serrated protrusions are inserted into the serrated grooves.

[0061] In a preferred embodiment, a reflection area 7 is formed inside the light isolation cover 6, and any channel on the multi-channel CMOS sensor body 3 captures the optical signal emitted by the light-emitting diode array 4 and passing through the reflection area 7.

[0062] In a preferred embodiment, the light-emitting diode array 4 is arranged in a circular shape around the multi-channel CMOS sensor body 3, and the shape of the reflection area 7 is arc-shaped.

[0063] In the description of the present application, it should be understood that the orientation or positional relationship indicated by the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present application.

[0064] The specific embodiments of the present utility model have been described above. It should be understood that the present utility model is not limited to the above specific embodiments, and those skilled in the art can make various changes or modifications within the scope of the claims, which do not affect the essence of the present utility model. Without conflict, the embodiments of the present application and the features in the embodiments can be combined with each other arbitrarily.

Claims

1. A force and torque measurement system based on a multi-channel CMOS sensor, characterized in that, It includes a first platform (1), a second platform (2), a multi-channel CMOS sensor body (3), a light-emitting diode array (4), and a deformation structure (5). The first platform (1) and the second platform (2) are arranged opposite to each other, and the deformation structure (5) is arranged between the first platform (1) and the second platform (2). The multi-channel CMOS sensor body (3) is arranged on the first platform (1), the light-emitting diode array (4) is arranged on the second platform (2), the multi-channel CMOS sensor body (3) and the light-emitting diode array (4) are arranged opposite to each other, and any channel on the multi-channel CMOS sensor body (3) captures the optical signal emitted by the light-emitting diode array (4). Or, the multi-channel CMOS sensor body (3) is arranged on the second platform (2), the light-emitting diode array (4) is arranged on the first platform (1), the multi-channel CMOS sensor body (3) and the light-emitting diode array (4) are arranged opposite to each other, and any channel on the multi-channel CMOS sensor body (3) captures the optical signal emitted by the light-emitting diode array (4). Or, both the multi-channel CMOS sensor body (3) and the light-emitting diode array (4) are arranged on the first platform (1), and any channel on the multi-channel CMOS sensor body (3) captures the optical signal emitted by the light-emitting diode array (4) and reflected by the second platform (2). Or, both the multi-channel CMOS sensor body (3) and the light-emitting diode array (4) are arranged on the second platform (2), and any channel on the multi-channel CMOS sensor body (3) captures the optical signal emitted by the light-emitting diode array (4) and reflected by the first platform (1).

2. The force and torque measurement system based on a multi-channel CMOS sensor according to claim 1, wherein The channels on the multi-channel CMOS sensor body (3) are arranged corresponding to the light-emitting diodes in the light-emitting diode array (4).

3. The force and torque measurement system based on a multi-channel CMOS sensor according to claim 1, characterized in that, Both the multi-channel CMOS sensor body (3) and the light-emitting diode array (4) are arranged on the first platform (1), and the light-emitting diode array (4) is arranged on the periphery of the multi-channel CMOS sensor body (3).

4. The force and torque measurement system based on a multi-channel CMOS sensor according to claim 1, wherein Both the multi-channel CMOS sensor body (3) and the light-emitting diode array (4) are arranged on the second platform (2), and the light-emitting diode array (4) is arranged on the periphery of the multi-channel CMOS sensor body (3).

5. The force and torque measurement system based on a multi-channel CMOS sensor according to claim 1, characterized in that, An optical isolation cover (6) is arranged between the first platform (1) and the second platform (2), and both the multi-channel CMOS sensor body (3) and the light-emitting diode array (4) are located inside the optical isolation cover (6).

6. The force and torque measurement system based on a multi-channel CMOS sensor according to claim 5, characterized in that, The optical isolation cover (6) is installed on the second platform (2), a serrated groove is arranged on the first platform (1), and a serrated protrusion is arranged on the side of the optical isolation cover (6) away from the second platform (2), and the serrated protrusion is inserted into the serrated groove. Alternatively, the optical isolation cover (6) is installed on the first platform (1), the second platform (2) is provided with a serrated groove, and the side of the optical isolation cover (6) away from the second platform (2) is provided with a serrated protrusion, and the serrated protrusion is inserted into the serrated groove.

7. The force and torque measurement system based on a multi-channel CMOS sensor according to claim 5, wherein, Both the multi-channel CMOS sensor body (3) and the light-emitting diode array (4) are arranged on the first platform (1), and the optical isolation cover (6) is installed on the second platform (2); A reflection area (7) is formed inside the optical isolation cover (6), and any channel on the multi-channel CMOS sensor body (3) captures the optical signal emitted by the light-emitting diode array (4) and passing through the reflection area (7).

8. The force and torque measurement system based on a multi-channel CMOS sensor according to claim 7, characterized in that, The light-emitting diode array (4) is arranged in a circular shape around the multi-channel CMOS sensor body (3), and the shape of the reflection area (7) is arc-shaped.

9. The force and torque measurement system based on a multi-channel CMOS sensor according to claim 5, characterized in that, Both the multi-channel CMOS sensor body (3) and the light-emitting diode array (4) are arranged on the second platform (2), and the optical isolation cover (6) is installed on the first platform (1); A reflection area (7) is formed inside the optical isolation cover (6), and any channel on the multi-channel CMOS sensor body (3) captures the optical signal emitted by the light-emitting diode array (4) and passing through the reflection area (7).

10. The force and torque measurement system based on a multi-channel CMOS sensor according to claim 9, wherein The light-emitting diode array (4) is arranged in a circular shape around the CMOS sensor body, and the shape of the reflection area (7) is arc-shaped.

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