Connecting device for chip testing

Abstract

The utility model relates to the technical field of chip testing, in particular to a connecting device for chip testing, which comprises a circuit board, a connecting testing seat arranged on the circuit board, a testing groove arranged in the connecting testing seat and a testing chip arranged in the testing groove, and further comprises a jacking assembly. The jacking assembly is used for jacking out a test chip located in the test groove, the test chip can be conveniently taken out, the jacking assembly comprises a jacking frame, four sets of sliding rods, four sets of mounting frames, four sets of springs, four sets of connecting plates, a jacking column and a pressing plate, the test groove is communicated with a groove, the top ends of the four sets of sliding rods are connected with the bottom end of the jacking frame, and the top ends of the four sets of sliding rods are connected with the bottom end of the jacking frame. The four sets of sliding rods are symmetrically installed, the four sets of installation frames are installed at the bottom end of the groove, and the four sets of sliding rods are slidably connected with the four sets of installation frames correspondingly. According to the connecting device for the chip test, the test chip can be conveniently taken out from the connecting test seat, so that the test time is shortened, and the test efficiency is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, and specifically relates to a connection device for chip testing. Background Art

[0002] In order to avoid faulty chips being soldered onto an integrated circuit, resulting in problems with the integrated circuit and wasting manpower and material resources for repair, chips are generally tested before being installed on the integrated circuit.

[0003] Chip testing requires placing it in a testing device for detection. The testing device includes a testing circuit board and a connection test socket. The testing circuit board is connected to an oscilloscope. The test chip is placed in the connection test socket for connection testing, and the chip condition is observed through the oscilloscope. However, due to the small size of the chip, it is inconvenient to remove it from the connection test socket after testing, increasing the chip testing time and reducing the testing efficiency. Therefore, a connection device for chip testing is needed. Summary of the Utility Model

[0004] (1) Technical Problem to be Solved

[0005] Aiming at the deficiencies of the prior art, the utility model provides a connection device for chip testing that facilitates the removal of the test chip from the connection test socket, thereby reducing the testing time and improving the testing efficiency.

[0006] (2) Technical Solution

[0007] To achieve the above object, the utility model provides the following technical solution: A connection device for chip testing, including a circuit board, a connection test socket is arranged on the circuit board, a test slot is arranged in the connection test socket, a test chip is placed in the test slot, and a jacking component is further included. The jacking component is used to jack out the test chip located in the test slot to facilitate the removal of the test chip. The jacking component includes a jacking frame, four groups of sliding rods, four groups of mounting frames, four groups of springs, four groups of connecting plates, a jacking column and a pressing plate. A groove is communicated with the test slot. The tops of the four groups of sliding rods are all connected to the bottom end of the jacking frame. The four groups of sliding rods are symmetrically installed. The four groups of mounting frames are installed at the bottom end of the groove. The four groups of sliding rods are respectively slidably connected with the four groups of mounting frames. The four groups of connecting plates are respectively connected to the bottom ends of the four groups of sliding rods. The four groups of springs are respectively sleeved on the four groups of sliding rods. The bottom ends of the four groups of springs are respectively connected to the top ends of the four groups of connecting plates. The top ends of the four groups of springs are respectively connected to the four groups of mounting frames. The jacking column is installed at the bottom end of the jacking frame. A first through hole is communicated with the groove. A rotating shaft is arranged on the pressing plate. The rotating shaft is rotatably connected with the first through hole. One end of the pressing plate located in the groove is slidably attached to the bottom end of the jacking column.

[0008] Preferably, four groups of rubber pads are arranged at the top end of the jacking frame.

[0009] Preferably, two groups of second through holes are communicated with the groove, and an exhaust fan is arranged in one of the two groups of second through holes.

[0010] Preferably, it further includes two groups of filter nets. Two mounting rings are arranged on the connection test seat, and the two filter nets are respectively installed in the two mounting rings.

[0011] Preferably, a rubber sleeve is arranged in the groove, and the rubber sleeve is sleeved with the pressing plate.

[0012] Preferably, two pin shafts are arranged on the mounting ring, a pin slot is arranged on the connection test seat, and the pin shafts are clamped with the pin slot.

[0013] The utility model provides a connection device for chip testing, and the beneficial effects thereof are as follows:

[0014] When it is necessary to take out the test chip after the test is completed, by pressing one end of the pressing plate, the other end of the pressing plate can be lifted by the rotation of the rotating shaft, so that the ejector pin can be pushed upward, and at the same time, the mounting frame can be pushed upward. By the upward movement of the mounting frame, the test chip can be lifted and pushed out of the test slot. Therefore, it is convenient to take out the test chip from the connection test seat. Through the spring, the connecting plate and the sliding rod, when the pressing plate is not pressed, the jacking frame can be driven to reset. Therefore, a connection device for chip testing is provided, which is convenient to take out the test chip from the connection test seat, thereby reducing the test time and improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is an isometric structural view of the utility model;

[0016] Figure 2 It is a structural view of the pressing plate, the ejector pin and their connection of the utility model;

[0017] Figure 3 It is a structural view of the filter net, the mounting ring and their connection of the utility model;

[0018] Figure 4 It is a structural view of the mounting frame, the sliding rod and their connection of the utility model.

[0019] REFERENCE MARKS:

[0020] 1. Circuit board; 2. Connection test seat; 3. Test chip; 4. Jacking frame; 5. Sliding rod; 6. Mounting frame; 7. Spring; 8. Connecting plate; 9. Ejector pin; 10. Pressing plate; 11. Rotating shaft; 12. Rubber pad; 13. Exhaust fan; 14. Filter net; 15. Mounting ring; 16. Rubber sleeve; 17. Pin shaft. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0021] The following will clearly and completely describe the technical solutions in the embodiments of the present utility model in conjunction with the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present utility model without creative efforts shall fall within the protection scope of the present utility model.

[0022] Please refer to Figure 1 - Figure 4 , a connection device for chip testing, including a circuit board 1, a connection test socket 2 is arranged on the circuit board 1, a test slot is arranged in the connection test socket 2, a test chip 3 is placed in the test slot, and a jacking component is further included. The jacking component is used to jack out the test chip 3 located in the test slot to facilitate the removal of the test chip 3. The jacking component includes a jacking frame 4, four groups of sliding rods 5, four groups of mounting frames 6, four groups of springs 7, four groups of connecting plates 8, a jacking post 9 and a pressing plate 10. A groove is communicated with the test slot. The top ends of the four groups of sliding rods 5 are all connected to the bottom end of the jacking frame 4. The four groups of sliding rods 5 are symmetrically installed. The four groups of mounting frames 6 are installed at the bottom end of the groove. The four groups of sliding rods 5 are respectively slidably connected with the four groups of mounting frames 6. The four groups of connecting plates 8 are respectively connected to the bottom ends of the four groups of sliding rods 5. The four groups of springs 7 are respectively sleeved on the four groups of sliding rods 5. The bottom ends of the four groups of springs 7 are respectively connected to the top ends of the four groups of connecting plates 8. The top ends of the four groups of springs 7 are respectively connected to the four groups of mounting frames 6. The jacking post 9 is installed at the bottom end of the jacking frame 4. A first through hole is communicated with the groove. A rotating shaft 11 is arranged on the pressing plate 10. The rotating shaft 11 is rotatably connected with the first through hole. One end of the pressing plate 10 located in the groove is in sliding fit with the bottom end of the jacking post 9; when the test chip 3 needs to be taken out after the test is completed, by pressing one end of the pressing plate 10, the rotation of the rotating shaft 11 causes the other end of the pressing plate 10 to tilt up. By this, the jacking post 9 can be pushed upward, and at the same time, the mounting frame 6 can be pushed upward. By the upward movement of the mounting frame 6, the test chip 3 can be lifted and pushed out of the test slot. Therefore, the test chip 3 can be conveniently taken out from the connection test socket 2. Through the springs 7, the connecting plates 8 and the sliding rods 5, when the pressing plate 10 is not pressed, the jacking frame 4 can be driven to reset. Therefore, a connection device for chip testing is provided that can conveniently take out the test chip 3 from the connection test socket 2, thereby reducing the test time and improving the test efficiency.

[0023] Please refer to Figure 3 and Figure 4 , four groups of rubber pads 12 are arranged at the top end of the jacking frame 4; when the jacking frame 4 lifts the test chip 3, the rubber pads 12 can play a certain protective role for the test chip 3 and reduce the possibility of the jacking frame 4 damaging the test chip 3.

[0024] Please refer to Figure 3, there are two sets of second through holes connected to the groove, and an exhaust fan 13 is arranged in one of the second through holes; when the test chip 3 is running for testing, it will generate a certain amount of heat, and the exhaust fan 13 can blow air into the groove to play a certain role in cooling.

[0025] Please refer to Figure 1 and Figure 3 , it also includes two sets of filter nets 14, and there are two sets of mounting rings 15 arranged on the connection test seat 2, and the two sets of filter nets 14 are respectively installed in the two sets of mounting rings 15; the filter nets 14 can reduce the possibility of dust entering the groove from the second through holes.

[0026] Please refer to Figure 2 , Figure 3 and Figure 4 , a rubber sleeve 16 is arranged in the groove, and the rubber sleeve 16 is sleeved with the pressing plate 10; the rubber sleeve 16 can reduce the possibility of dust entering the groove from the first through hole.

[0027] Please refer to Figure 1 and Figure 3 , there are two sets of pin shafts 17 arranged on the mounting ring 15, and a pin slot is arranged on the connection test seat 2, and the pin shaft 17 is clamped with the pin slot; the pin shaft 17 facilitates the removal of the mounting ring 15 to clean the filter net 14.

[0028] In summary, when the chip testing connection device is in use and the test chip 3 needs to be taken out after the test is completed, by pressing one end of the pressing plate 10, the other end of the pressing plate 10 can be lifted by the rotation of the rotating shaft 11, so that the ejector pin 9 can be pushed upward, and at the same time, the mounting bracket 6 can be pushed upward. By the upward movement of the mounting bracket 6, the test chip 3 can be lifted and pushed out of the test slot. Therefore, the test chip 3 can be conveniently taken out from the connection test seat 2. Through the spring 7, the connecting plate 8 and the sliding rod 5, when the pressing plate 10 is not pressed, the jacking frame 4 can be driven to reset.

[0029] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited by the above embodiments. What is described in the above embodiments and the specification only illustrates the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention will have various changes and improvements, and these changes and improvements all fall within the scope of the present invention claimed. The scope of protection claimed by the present invention is defined by the appended claims and their equivalents.

Claims

1. A connection device for chip testing, comprising a circuit board (1), a connection test socket (2) is arranged on the circuit board (1), a test slot is arranged in the connection test socket (2), and a test chip (3) is placed in the test slot, characterized in that, Further included are: A jacking component, which is used to jack out the test chip (3) located in the test slot, facilitating the removal of the test chip (3). The jacking component includes a jacking frame (4), four sets of sliding rods (5), four sets of mounting frames (6), four sets of springs (7), four sets of connecting plates (8), a jacking post (9) and a pressing plate (10). A groove is communicatively arranged with the test slot. The tops of the four sets of sliding rods (5) are all connected to the bottom end of the jacking frame (4). The four sets of sliding rods (5) are symmetrically installed. The four sets of mounting frames (6) are installed at the bottom end of the groove. The four sets of sliding rods (5) are respectively slidably connected to the four sets of mounting frames (6). The four sets of connecting plates (8) are respectively connected to the bottom ends of the four sets of sliding rods (5). The four sets of springs (7) are respectively sleeved on the four sets of sliding rods (5). The bottom ends of the four sets of springs (7) are respectively connected to the top ends of the four sets of connecting plates (8). The top ends of the four sets of springs (7) are respectively connected to the four sets of mounting frames (6). The jacking post (9) is installed at the bottom end of the jacking frame (4). A first through hole is communicatively arranged in the groove. A rotating shaft (11) is arranged on the pressing plate (10). The rotating shaft (11) is rotatably connected to the first through hole. One end of the pressing plate (10) located in the groove is slidably fitted with the bottom end of the jacking post (9).

2. The connection device for chip testing according to claim 1, characterized in that: Four sets of rubber pads (12) are arranged at the top end of the jacking frame (4).

3. The connection device for chip testing according to claim 2, characterized in that: Two sets of second through holes are communicatively arranged in the groove. An exhaust fan (13) is arranged in one of the second through holes.

4. A connection device for chip testing according to claim 3, characterized in that: Two sets of filter nets (14) are further included. Two sets of mounting rings (15) are arranged on the connection test seat (2). The two sets of filter nets (14) are respectively installed in the two sets of mounting rings (15).

5. The connection device for chip testing according to claim 4, characterized in that: A rubber sleeve (16) is arranged in the groove. The rubber sleeve (16) is sleeved on the pressing plate (10).

6. The connection device for chip testing according to claim 5, wherein: Two sets of pin shafts (17) are arranged on the mounting ring (15). A pin slot is arranged on the connection test seat (2). The pin shaft (17) is clamped with the pin slot.

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