Imaging system and sorting machine

Abstract

The utility model relates to the field of machine vision. The utility model specifically relates to an imaging system. The imaging system comprises an image acquisition device used for acquiring an image of the surface of a to-be-measured object; the light source system is used for projecting light to the surface of a to-be-measured object; the light source system at least comprises a first light source and a second light source which are arranged on the side of an optical axis of the image acquisition device, the first light source is used for projecting first light with a first width, the first light passes through a first height section of the optical axis, and the second light source is used for projecting second light with a second width, and the second light passes through a second height section of the optical axis. Wherein the first height section and the second height section are staggered or partially overlapped in the extension direction of the optical axis. The imaging system disclosed by the utility model can cover different height sections, has better adaptability, and can illuminate to-be-measured objects in different height ranges. Through the light source system comprising the multiple light sources, the illumination uniformity of the imaging system can be improved, and it is guaranteed that the imaging system has higher imaging integrity and definition.

Description

Technical Field

[0001] The present disclosure relates to the field of machine vision, and particularly to an imaging system and a sorting machine. Background Art

[0002] In current imaging systems of machine vision, most are designed based on a standard product of a single type of object to be measured, and the heights of the objects to be measured are basically the same. However, for scenarios where there are large differences in the heights of the objects to be measured, such as in the case of ore samples with different particle sizes as the objects to be measured, since there is a certain angle between the light-emitting direction of the light source of the imaging system and the optical axis of the imaging lens, the light intensities received by the objects to be measured with different heights are inconsistent, or some objects to be measured at certain heights cannot directly receive light on their surfaces, resulting in poor illumination uniformity of the machine vision imaging system for the objects to be measured. It is easy to occur that the imaging of the objects to be measured cannot be performed, or the imaging is unclear or uneven, etc., resulting in low integrity and clarity of the imaging of machine vision. The applicable height range of current machine vision illumination and imaging is small, and it cannot take into account a variety of objects to be measured with large height differences, and the adaptability is poor. Summary of the Utility Model

[0003] To overcome the problems existing in the related art, an exemplary embodiment of the present disclosure provides an imaging system, including: an image acquisition device for acquiring an image of the surface of an object to be measured; a light source system for projecting light onto the surface of the object to be measured; wherein, the light source system at least includes a first light source and a second light source, which are arranged on the side of the optical axis of the image acquisition device, the first light source is used for projecting a first light ray with a first width, the first light ray passes through a first height segment of the optical axis, the second light source is used for projecting a second light ray with a second width, the second light ray passes through a second height segment of the optical axis, wherein, the first height segment and the second height segment are offset or partially overlapped in the extending direction of the optical axis.

[0004] In some embodiments, the first light source and the second light source are respectively arranged on both sides of the optical axis.

[0005] In some embodiments, the intersection point of the optical path center of the first light ray and the optical axis is located at the height center of the first height segment; and / or, the intersection point of the optical path center of the second light ray and the optical axis is located at the height center of the second height segment.

[0006] In some embodiments, the height of the highest point of the first height segment is greater than or equal to the height of the lowest point of the second height segment.

[0007] In some embodiments, the imaging system further includes: a first lens movably disposed at the light outlet of the first light source for adjusting the optical path of the first light; and / or, a second lens movably disposed at the light outlet of the second light source for adjusting the optical path of the second light.

[0008] In some embodiments, the second lens is configured to move away from or close to the second light source along the optical path center of the second light to change the second width of the second light; and / or, the second lens is configured to rotate to change the second angle between the optical path center of the second light and the optical axis.

[0009] In some embodiments, the imaging system further includes: a ranging device for obtaining the height information of the surface of the object to be measured; at least the second lens adjusts the optical path of the second light based on the height information.

[0010] In some embodiments, the first light covers at least half of the imaging width of the image acquisition device on both sides of the optical axis in the first height segment; and / or, the second light covers at least half of the imaging width of the image acquisition device on both sides of the optical axis in the second height segment.

[0011] In some embodiments, the first angle between the optical path center of the first light and the optical axis is determined based on the first height, the first width, and the imaging width of the first height segment; and / or, the second angle between the optical path center of the second light and the optical axis is determined based on the second height, the second width, and the imaging width of the second height segment.

[0012] In some embodiments, the height position of the first light source is determined based on the first angle, the width of the first light source, the imaging width, and the height position of the image acquisition device; and / or, the height position of the second light source is determined based on the second angle, the width of the second light source, the imaging width, and the height position of the image acquisition device.

[0013] In a second aspect, the present disclosure further provides a sorting machine, including: a conveying device for conveying the object to be measured; the imaging system according to any one of the above embodiments, disposed above the conveying device for acquiring an image of the surface of the object to be measured; an identification device for determining the category of the object to be measured according to the image of the surface of the object to be measured; a sorting device disposed downstream of the conveying device for sorting the object to be measured according to the category of the object to be measured.

[0014] It should be understood that the above general description and the following detailed description are only exemplary and explanatory, and cannot limit the present disclosure.

[0015] Through the embodiments of the present disclosure, light rays covering multiple height segments are emitted by a light source system including a plurality of light sources, which can illuminate and image an object to be measured in different height ranges, ensure that the light source can fully illuminate the surfaces of objects to be measured at different heights, improve the lighting applicability of the imaging system, and ensure higher imaging integrity and clarity of the imaging system. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The present disclosure can be better understood by describing exemplary embodiments of the present disclosure in conjunction with the accompanying drawings. In the drawings:

[0017] Figure 1 FIG. is a schematic structural diagram of an imaging system shown in an exemplary embodiment of the present disclosure;

[0018] Figure 2 FIG. is a schematic structural diagram of an imaging system shown in another exemplary embodiment of the present disclosure;

[0019] Figure 3 FIG. is a schematic optical path diagram of an imaging system shown in an exemplary embodiment of the present disclosure. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0020] The following will describe the specific embodiments of the present disclosure. It should be noted that in the specific description of these embodiments, for the sake of concise description, this specification may not describe all features of the actual embodiments in detail. It should be understood that in the actual implementation of any embodiment, just as in the process of any engineering project or design project, in order to achieve the specific goals of the developer and to meet system-related or business-related restrictions, various specific decisions are often made, which may also change from one embodiment to another. In addition, it can also be understood that although the efforts made in this development process may be complex and lengthy, for those of ordinary skill in the art related to the content of the present disclosure, some design, manufacturing, or production changes based on the technical content disclosed in the present disclosure are only conventional technical means and should not be understood as the content of the present disclosure being insufficient.

[0021] Unless otherwise defined, technical terms or scientific terms used in the claims and the specification shall have the ordinary meanings as understood by those of ordinary skill in the technical field to which the present disclosure pertains. The terms "first", "second" and similar terms used in the specification and claims of this utility model patent application do not denote any order, quantity or importance, but are only used to distinguish different components. The terms such as "a" or "an" do not denote a quantity limitation, but mean that there is at least one. The terms such as "comprising" or "including" mean that the elements or objects appearing before "comprising" or "including" cover the elements or objects listed after "comprising" or "including" and their equivalent elements, and do not exclude other elements or objects. The terms such as "connected" or "coupled" are not limited to physical or mechanical connections, nor are they limited to direct or indirect connections.

[0022] Currently, in some technologies, an imaging system may include an image acquisition device and a light source. A single visual light source is used to illuminate an object to be measured, and the image acquisition device is used to acquire an image of the surface of the illuminated object to be measured. The object to be measured may be disposed below the image acquisition device so that the image acquisition device can acquire an image of the object to be measured. The object to be measured may also be placed on the surface of a transmission device, and the transmission device is used to convey the object to be measured to the imaging system. The object to be measured is illuminated by the light source and the image acquisition device is used to acquire an image of the surface of the object to be measured. For the case of illumination by a single visual light source, it is only possible to illuminate a single standard object to be measured or objects to be measured with relatively small height differences. For objects to be measured with relatively large height differences, such as ore samples with relatively large particle size differences, or for objects to be measured with relatively high heights, since there is a certain angle between the light rays emitted by the light source of the imaging system and the optical axis of the image acquisition device, when the light source illuminates an object to be measured with a relatively high height, it is impossible to illuminate the object to be measured completely, or only part of the surface of the object to be measured can be illuminated and the illumination of the object to be measured is uneven. The illumination intensity of the lower part of the object to be measured is stronger, while the illumination intensity of the upper part of the object to be measured is weaker or the illumination light rays cannot cover the upper part of the object to be measured, resulting in low integrity and clarity of the image when the image acquisition device of the imaging system acquires an image of the object to be measured, and poor imaging effect. The imaging system in the current technology can only detect objects to be measured within a relatively small height range and cannot accommodate objects to be measured with a variety of relatively large height differences, so its universality is poor.

[0023] To solve the above problems, the exemplary embodiments of the present disclosure provide an imaging system, such as Figure 1As shown, it may include an image acquisition device 10 and a light source system. The light source system can be used to illuminate the object to be measured 50, and the image acquisition device 10 can acquire an image of the surface of the object to be measured 50 illuminated by the light source system. The object to be measured can be placed on an experimental table or other tabletop; it can also be placed on a conveying device. The object to be measured can be conveyed by the conveying device, and the imaging system is arranged above the conveying device to acquire an image of the upper surface of the object to be measured. The conveying device can be a conveyor belt or the like, and the object to be measured 50 can be placed on the surface of the conveying device so as to obtain a clear image of the surface of the object to be measured 50 through the light source system and the image acquisition device 10.

[0024] The image acquisition device 10 can be used to acquire an image of the surface of the object to be measured 50. The image acquisition device 10 can be a camera capable of taking an image of the surface of the object to be measured 50. The image acquisition device 10 can also be a light sensor for receiving the light reflected by the surface of the object to be measured 50, so that the image acquisition device 10 can acquire an image of the surface of the object to be measured 50. Through the image acquisition device 10, the surface information of the object to be measured 50 can be acquired.

[0025] A light source system can be used to project light onto the surface of an object 50 to be measured. Among them, the light source system at least includes a first light source 21 and a second light source 22, which are arranged on the side of the optical axis 11 of the image acquisition device 10. The first light source 21 is used to project a first light beam 211 with a first width, and the first light beam 211 passes through the first height section 213 of the optical axis 11. The second light source 22 is used to project a second light beam 221 with a second width, and the second light beam 221 passes through the second height section 223 of the optical axis 11. Among them, the first height section 213 and the second height section 223 are offset or partially overlapped in the extending direction of the optical axis 11. The light source system can project light onto the surface of the object 50 to be measured to realize the illumination of the surface of the object 50 to be measured, so as to facilitate the acquisition of a clearer surface image of the object 50 to be measured through the image acquisition device 10. The light source system can include multiple light sources, at least including the first light source 21 and the second light source 22. Both the first light source 21 and the second light source 22 can be arranged on the side of the optical axis 11 of the image acquisition device 10 and can be arranged avoiding the optical axis 11 of the image acquisition device 10 to prevent interference between the first light source 21, the second light source 22 and the image acquisition device 10 and prevent the images acquired by the image acquisition device 10 from being blocked by the first light source 21 and the second light source 22. The first light source 21 and the second light source 22 can be arranged at different heights. The first light source 21 can project a first light beam 211 onto the surface of the object 50 to be measured. The first width of the first light beam 211 can be determined according to the model and size of the first light source 21. The first light beam 211 can pass through the first height section 213 of the optical axis 11. Among them, the first light beam 211 can be projected onto the surface of the object 50 to be measured. For the object 50 to be measured with a height within the range of the first height section 213 of the optical axis 11, by projecting the first light beam 211 onto the surface of the object 50 to be measured, the entire upper surface of the object 50 to be measured can be covered, and the illumination intensity is uniform. The second light source 22 can project a second light beam 221 onto the surface of the object 50 to be measured. The second width of the second light beam 221 can be determined according to the model and size of the second light source 22. The second light beam 221 can pass through the second height section 223 of the optical axis 11. Among them, the second light beam 221 can be projected onto the surface of the object 50 to be measured. For the object 50 to be measured with a height within the range of the second height section 223 of the optical axis 11, by projecting the second light beam 221 onto the surface of the object 50 to be measured, the entire upper surface of the object 50 to be measured can be covered, and the illumination intensity is uniform. The first height section 213 and the second height section 223 can be offset in the extending direction of the optical axis 11, so that the height ranges that the first light source 21 and the second light source 22 can illuminate are different, thereby making the height range that the light source system can illuminate larger. For various objects 50 to be measured with different heights, uniform illumination of the entire upper surface of the object 50 to be measured can be realized, so as to obtain the surface image of the object 50 to be measured, which has better universality.The first height segment 213 and the second height segment 223 can also partially overlap, enabling the first light source 21 and the second light source 22 to achieve uniform illumination of the object under test 50 in a continuous height region. This ensures uniform illumination for various objects under test 50 with different heights. Moreover, when the height of the object under test 50 is in the overlapping region of the first height segment 213 and the second height segment 223, the first light source 21 and the second light source 22 can jointly illuminate the object under test 50, thereby increasing the light irradiation intensity on the surface of the object under test 50 to ensure a clearer surface image of the object under test 50. The first light source 21 and the second light source 22 can be strip light sources, capable of emitting strip-shaped first light 211 and second light 221 to illuminate the surface of the object under test 50. The image acquisition device 10 can be a line-scanning imaging device, capable of acquiring the strip-shaped region image of the object under test 50 illuminated by the first light source 21 and the second light source 22. The object under test 50 can be arranged on a conveying device, such as a conveyor belt, and the conveying device drives the object under test 50 to move. The first light source 21 and the second light source 22 can continuously emit light to illuminate the surface of the object under test 50 arranged on the conveying device. During the process of the conveying device transporting the object under test 50, the light emitted by the first light source 21 and the second light source 22 can irradiate the entire surface of the object under test 50. By continuously acquiring the image of the surface of the object under test 50 through the image acquisition device 10 during the process of the conveying device driving the object under test 50 to move, the image acquisition device 10 can acquire multiple strip-shaped region images of the surface of the object under test 50, and ultimately obtain the complete image of the surface of the object under test 50.

[0026] Through the imaging system of this embodiment, by means of a light source system including a first light source 21 and a second light source 22, multiple light sources can respectively illuminate the object to be measured 50 at different height segments, ensuring that the entire surface of the object to be measured at different heights can be illuminated by the light source system, thus guaranteeing the integrity of the illumination of the light source system. In addition, for different objects to be measured 50 with large height differences, uniform illumination can be achieved, enabling the light source system of the imaging system to have higher illumination uniformity. By respectively arranging the first light source 21 and the second light source 22 on the side of the optical axis 11 of the image acquisition device 10, the image acquisition device 10 can be avoided, effectively preventing the imaging of the image acquisition device 10 from being affected and ensuring the imaging integrity of the imaging system. By using multiple light sources to respectively illuminate the object to be measured 50 at different height segments, the imaging system has a wide illumination range and strong universality, can illuminate the object to be measured 50 with a relatively high height, and can completely cover the surface of each object to be measured 50 even when there are large height differences among the objects to be measured 50. For the first height segment 213 and the second height segment 223 that can be illuminated by the first light source 21 and the second light source 22 respectively, their height range areas do not overlap, enabling the light source system of the imaging system to have a wide illumination range to adapt to more types of objects to be measured 50; in the case where the height range areas of the first height segment 213 and the second height segment 223 overlap, when the height of the object to be measured 50 is within the overlapping area, the first light source 21 and the second light source 22 can be simultaneously turned on to achieve supplementary lighting for the object to be measured 50, with high illumination brightness. Moreover, for the uneven surface of the object to be measured 50, it can be avoided that the concave parts on the surface of the object to be measured 50 are blocked by the convex parts on the surface of the object to be measured 50, ensuring that the illumination system can completely and evenly illuminate the surface of the object to be measured 50 to achieve a better illumination effect, thereby guaranteeing the imaging clarity and imaging stability of the imaging system.

[0027] In some embodiments, such as Figure 1As shown, the first light source 21 and the second light source 22 can be respectively arranged on both sides of the optical axis 11. The first light source 21 and the second light source 22 can be arranged around the optical axis 11, so that the first light source 21 and the second light source 22 are respectively arranged on both sides of the optical axis 11. The light-emitting end of the first light source 21 can be inclined at a certain angle towards the optical axis 11, so that the first light ray 211 emitted by the first light source 21 irradiates towards the direction where the optical axis 11 is located, so that the first light ray 211 intersects with the optical axis 11 in the first height section 213. The light-emitting end of the second light source 22 can be inclined at a certain angle towards the optical axis 11, so that the second light ray 221 emitted by the second light source 22 irradiates towards the direction where the optical axis 11 is located, so that the second light ray 221 intersects with the optical axis 11 at the second height end. The first light source 21 and the second light source 22 can be respectively arranged on both sides of the optical axis 11, so that the first light ray 211 and the second light ray 221 irradiate the object to be measured 50 at different angles. Through this embodiment, the first light source 21 and the second light source 22 can be respectively arranged on both sides of the optical axis 11 to illuminate the object to be measured 50 in different directions. For the object to be measured 50 with an uneven surface, the first light source 21 and the second light source 22 arranged on both sides of the optical axis 11 can avoid the situation that some areas on the surface of the object to be measured 50 are blocked due to the protrusions or depressions on the surface of the object to be measured 50, so that the surface of the object to be measured 50 can be illuminated by the first light source 21 and the second light source 22. It can effectively avoid the situation that some parts of the surface of the object to be measured 50 cannot be illuminated or the illumination intensity is uneven, and can ensure the integrity and uniformity of the illumination of the object to be measured 50 by the light source system. Arranging the first light source 21 and the second light source 22 on both sides of the optical axis 11 respectively can make the first light source 21 and the second light source 22 avoid each other and prevent the first light source 21 and the second light source 22 from interfering with each other. Since the installation of the first light source 21 and the second light source 22 requires a certain space and needs to avoid the optical axis 11, if the first light source 21 and the second light source 22 are arranged on the same side of the optical axis 11, it is easy to cause the space occupied by the light source system to be too large, which is not conducive to the installation of the imaging system. And when the first light source 21 and the second light source 22 are arranged on the same side of the optical axis 11, the first light source 21 and the second light source 22 may interfere with each other, resulting in the first light ray 211 emitted by the first light source 21 being blocked by the second light source 22, or the second light ray 221 emitted by the second light source 22 being blocked by the first light source 21, resulting in the light source device being unable to illuminate the complete surface of the object to be measured 50, resulting in incomplete imaging. Arranging the first light source 21 and the second light source 22 on both sides of the optical axis 11 respectively can make the first light source 21 and the second light source 22 not interfere with each other and can be arranged staggeredly, effectively saving the space occupied by the light source system and facilitating installation.If the first light source 21 and the second light source 22 are arranged on the same side of the optical axis 11, to avoid mutual interference between the light sources, it is necessary to adjust the angles between the first light source 21 and the second light source 22 and the optical axis 11, so that the angle between the first light source 21 or the second light source 22 and the optical axis 11 is increased to avoid other light sources. However, after increasing the angle between the first light source 21 or the second light source 22 and the optical axis 11, it is easy to cause the change of the first height segment 213 or the second height segment 223 that can be illuminated by the light source, resulting in a reduction in the illumination range, or causing the first light source 21 or the second light source 22 to be unable to illuminate the top surface of the object to be measured. Therefore, arranging the first light source 21 and the second light source 22 on both sides of the optical axis 11 respectively can make the first light source 21 and the second light source 22 not interfere with each other, and the included angles formed by the first light source 21 and the second light source 22 and the optical axis 11 are both small, which can ensure that the first light source 21 and the second light source 22 can illuminate the entire upper surface of the object to be measured 50, so as to ensure the imaging integrity of the imaging system and have high clarity at the same time.

[0028] In some embodiments, as Figure 1 shown, the intersection point of the optical path center of the first light ray 211 and the optical axis 11 can be located at the height center of the first height segment 213; and / or, the intersection point of the optical path center of the second light ray 221 and the optical axis 11 can be located at the height center of the second height segment 223. The first light source 21 and the second light source 22 can be respectively arranged at different heights on both sides of the optical axis 11, so that the first light ray 211 and the second light ray 221 intersect with the optical axis 11 at different heights respectively. The intersection point of the optical path center of the first light ray 211 and the optical axis 11 can be located at the height center of the first height segment 213. The intersection of the optical path center of the first light ray 211 at the height center of the first height segment 213 and the optical axis 11 can enable the image acquisition device 10 to capture stronger light energy at the height center of the first height segment 213, so that the optical path of the first light ray 211 can be maximally concentrated in the area where the image acquisition device 10 can acquire images, thereby improving the brightness and clarity of the images acquired by the image acquisition device 10. When the intersection point of the optical path center of the first light ray 211 and the optical axis 11 is located at the height center of the first height segment 213, the light intensity distribution within the irradiation area of the first light ray 211 can be made more uniform, avoiding local overexposure or insufficient light intensity. The intersection of the optical path center of the second light ray 221 at the height center of the second height segment 223 and the optical axis 11 can enable the image acquisition device 10 to capture stronger light energy at the height center of the second height segment 223, so that the optical path of the second light ray 221 can be maximally concentrated in the area where the image acquisition device 10 can acquire images, thereby improving the brightness and clarity of the images acquired by the image acquisition device 10. When the intersection point of the optical path center of the second light ray 221 and the optical axis 11 is located at the height center of the second height segment 223, the light intensity distribution within the irradiation area of the second light ray 221 can be made more uniform, avoiding local overexposure or insufficient light intensity.

[0029] In some embodiments, the height of the highest point of the first height segment 213 may be greater than or equal to the height of the lowest point of the second height segment 223. The height of the highest point of the first height segment 213 may be greater than the height of the lowest point of the second height segment 223. Between the first height segment 213 and the second height segment 223, there is a coincident height range. For the object to be measured 50 within the coincident height range, it can be illuminated by either the first light source 21 or the second light source 22, or jointly illuminated by the first light source 21 and the second light source 22. For the object to be measured 50 with a certain height difference, its height may be at the junction of the first height segment 213 and the second height segment 223. During the detection process, the object to be measured 50 disposed on the surface of the conveying device may move up and down, resulting in fluctuations in the height of the object to be measured 50 at the junction of the first height segment 213 and the second height segment 223, causing the first light source 21 or the second light source 22 to be unable to emit light to illuminate the object to be measured 50. By making the height of the highest point of the first height segment 213 greater than the height of the lowest point of the second height segment 223, the object to be measured 50 within the coincident height range can be illuminated by either the first light source 21 or the second light source 22, or jointly illuminated by the first light source 21 and the second light source 22, so as to ensure the illumination integrity and illumination intensity of the object to be measured 50. In some cases, the first light source 21 or the second light source 22 may be disturbed, causing fluctuations in the range of the first height segment 213 or the second height segment 223, resulting in an unilluminated area between the first height segment 213 and the second height segment 223, and the object to be measured 50 with a height within this area cannot be illuminated, resulting in the object to be measured 50 being unable to be imaged normally. By making the height of the highest point of the first height segment 213 greater than the height of the lowest point of the second height segment 223, it can effectively avoid the occurrence of an unilluminated area due to the disturbance of the first light source 21 and the second light source 22, ensure the illumination integrity of the object to be measured 50, and avoid the situation where part of the surface of the object to be measured 50 cannot be illuminated or the illumination is uneven.

[0030] The height of the highest point of the first height segment 213 may be equal to the height of the lowest point of the second height segment 223, so that the height ranges corresponding to the first height segment 213 and the second height segment 223 are continuous, and the maximum height endpoint of the first height segment 213 and the minimum height endpoint of the second height segment 223 may coincide. As Figure 1 、 Figure 2As shown, the coincidence of the first height segment 213 and the second height segment 223 at the highest point of the first height segment 213 enables the first light source 21 and the second light source 22 to illuminate the object to be measured 50 within a continuous height range. For the case where the maximum height endpoint of the first height segment 213 coincides with the minimum height endpoint of the second height segment 223, the height range that the first light source 21 and the second light source 22 can illuminate is larger, enabling the light source system to have a larger illumination height range, effectively increasing the height range of the object to be measured 50 that the imaging system can image, and improving the universality of the imaging system. Moreover, for the object to be measured 50 near the maximum height endpoint of the first height segment 213 and the minimum height endpoint of the second height segment 223, it can be illuminated by a single light source, avoiding unclear imaging caused by overexposure, and improving the imaging clarity of the imaging system. Through this embodiment, by setting the first height segment 213 and the second height segment 223, different illumination ranges of the light source system can be determined according to the types or situations of different objects to be measured 50 to adapt to a variety of objects to be measured 50, enabling illumination of objects to be measured 50 within a larger height range and having better adaptability.

[0031] In some embodiments, such as Figure 2As shown, the imaging system may further include: a first lens 31 movably disposed at the light exit of the first light source 21 for adjusting the optical path of the first light ray 211; and / or, a second lens 32 movably disposed at the light exit of the second light source 22 for adjusting the optical path of the second light ray 221. The first lens 31 may be a convex lens, and the first lens 31 may be disposed at the light exit of the first light source 21. The first lens 31 can be translated or rotated. By translating and rotating the first lens 31, the relative positional relationship between the first lens 31 and the first light source 21 can be changed, which may include: the distance between the first lens 31 and the first light source 21, and the relative inclination angle between the first lens 31 and the first light ray 211 emitted by the first light source 21, etc., so that the light emitted by the first light source 21 passes through the first lens 31 and exits, and the optical path of the first light ray 211 can be changed. The focus of the first light ray 211 can be changed by moving the first lens 31 to adjust the first light ray 211 to converge or diverge, or to adjust the deflection angle of the first light ray 211 to change the irradiation direction of the first light ray 211, etc. The first lens 31 may be a concave lens, and the first lens 31 can be translated along the width direction parallel to the first light ray 211, and the irradiation direction of the optical path of the first light ray 211 can be changed. The second lens 32 may be disposed at the light exit of the second light source 22, and the second lens 32 may be a convex lens. The second lens 32 can be translated or rotated. By translating and rotating the second lens 32, the relative positional relationship between the second lens 32 and the second light source 22 can be changed, which may include: the distance between the second lens 32 and the second light source 22, and the relative inclination angle between the second lens 32 and the second light ray 221 emitted by the second light source 22, etc., so that the light emitted by the second light source 22 passes through the second lens 32 and exits, and the optical path of the second light ray 221 can be changed. The focus of the second light ray 221 can be changed by moving the second lens 32 to adjust the second light ray 221 to converge or diverge, or to adjust the deflection angle of the second light ray 221 to change the irradiation direction of the second light ray 221, etc. The second lens 32 may be a concave lens, and the second lens 32 can be translated along the width direction parallel to the second light ray 221, and the irradiation direction of the optical path of the second light ray 221 can be changed. Through this embodiment, the relative position between the first lens 31 and the light exit of the first light source 21 can be changed by the movable first lens 31 and second lens 32, so as to change the light direction and realize the adjustment of the optical paths of the first light ray 211 and the second light ray 221. The first lens 31 and the second lens 32 can be moved according to the height or position of the object to be measured 50 to change the optical paths of the first light ray 211 and the second light ray 221, so that the first light ray 211 and the second light ray 221 cover the entire surface of the object to be measured 50 and uniformly irradiate the surface of the object to be measured 50, thereby ensuring the stable and clear imaging quality of the image acquisition device 10.Through the first lens 31 and the second lens 32, when there are fewer light sources, by changing the relative distance between the first lens 31 and the first light source 21, the optical path direction and the first width of the optical path of the first light ray 211 can be changed, etc., so that the first light ray 211 can illuminate a larger height range without replacing the light source or adjusting the position of the light source, making the adjustment of the first light ray 211 simpler. By changing the relative distance between the second lens 32 and the second light source 22, the optical path direction and the first width of the optical path of the second light ray 221 can be changed, etc., so that the second light ray 221 can illuminate a larger height range without replacing the light source or adjusting the position of the light source, making the adjustment of the second light ray 221 simpler. Through the first lens 31 and the second lens 32, cost can be saved. When the number of light sources is small, by changing the optical path through the first lens 31 and the second lens 32, the number of light sources can be reduced, effectively reducing costs.

[0032] In some embodiments, the second lens 32 can be used to move away from or close to the second light source 22 along the optical path center of the second light ray 221 to change the second width of the second light ray 221; and / or, the second lens 32 can be used to rotate to change the second angle between the optical path center of the second light ray 221 and the optical axis 11. The center line of the second lens 32 can be aligned with the optical path center of the second light ray 221. The second lens 32 can be translated along the optical path center of the second light ray 221 and translated along the irradiation direction of the second light ray 221 to move the second lens 32 away from or close to the second light source 22, change the distance between the second lens 32 and the second light source 22, and thus change the focus of the second light ray 221. The second lens 32 can be moved along the optical path center of the second light ray 221 and the second lens 32 can be moved away from the second light source 22, enabling the second light ray 221 to pass through the lens, making the focusing focus of the second light ray 221 closer to the second light source 22, making the divergence angle of the second light ray 221 smaller, and thus reducing the second width of the second light ray 221. The second lens 32 can also be moved along the optical path center of the second light ray 221 and the second lens 32 can be moved close to the second light source 22, enabling the second light ray 221 to pass through the lens, making the focusing focus of the second light ray 221 away from the second light source 22, making the second light ray 221 have a larger light divergence angle, and thus increasing the second width of the second light ray 221, so that the second light ray 221 emitted by the second light source 22 can cover the object to be measured 50, thereby ensuring the intensity and breadth of the second light ray 221 irradiating the object to be measured 50. In the case where the height of the object to be measured 50 is higher than the highest height of the second height segment 223, the distance between the second lens 32 and the second light source 22 can be changed to move the second lens 32 close to the second light source 22, increase the second width of the second light ray 221, and increase the irradiation range of the second light ray 221, so that the second light ray 221 emitted by the second light source 22 can cover the surface of the object to be measured 50 to ensure the illumination of the surface of the relatively high object to be measured 50 and ensure the integrity and clarity of imaging. In the case where the height of the object to be measured 50 is within the range of the first height segment 213, the second lens 32 can be translated to increase the width of the second light ray 221 and make it a scattered light, which can irradiate the object to be measured 50 located in the first height segment 213, realize the supplementary lighting of the object to be measured 50, improve the light intensity of the surface illumination of the object to be measured 50, and improve the clarity of imaging.

[0033] The second lens 32 can also be used for rotation to change the second angle between the optical path center of the second light ray 221 and the optical axis 11. The second lens 32 can be rotated so that the optical path center of the second light ray 221 is offset from the center line of the second lens 32 and is no longer aligned. After the second light ray 221 passes through the second lens 32, the optical path can be changed, so that the second angle between the optical path center of the second light ray 221 and the optical axis 11 is changed. By rotating the second lens 32, the area that the second light ray 221 can illuminate can be changed, and the illumination direction of the second light ray 221 can be adjusted to ensure that the second light ray 221 can cover the surface of the object 50 to be measured, ensuring the integrity and clarity of the imaging of the object 50 to be measured and avoiding the incomplete illumination of the object 50 to be measured caused by the position deviation of the object 50 to be measured or the position deviation of the second light source 22.

[0034] In some embodiments, the first lens 31 can be used to move away from or close to the first light source 21 along the optical path center of the first light ray 211 to change the second width of the first light ray 211; and / or, the first lens 31 can be used for rotation to change the second angle between the optical path center of the first light ray 211 and the optical axis 11. When the height of the object 50 to be measured is higher than the highest height of the first height segment 213, the distance between the first lens 31 and the first light source 21 can be changed to move the first lens 31 closer to the first light source 21, increasing the first width of the first light ray 211 and enlarging the irradiation range of the first light ray 211, so that the first light ray 211 emitted by the first light source 21 can cover the surface of the object 50 to be measured, ensuring the illumination of the surface of the relatively high object 50 to be measured, assisting the second light source 22 in supplementing light to the surface of the object 50 to be measured, and ensuring the integrity and clarity of the imaging. The first lens 31 can also be rotated so that the optical path center of the first light ray 211 is offset from the center line of the first lens 31 and is no longer aligned. After the first light ray 211 passes through the first lens 31, the optical path can be changed, so that the first angle between the optical path center of the first light ray 211 and the optical axis 11 is changed. The ability of the first lens 31 to rotate can change the area that the first light ray 211 can illuminate, and can adjust the illumination direction of the first light ray 211 to ensure that the first light ray 211 can cover the surface of the object 50 to be measured, ensuring the integrity and clarity of the imaging of the object 50 to be measured and avoiding the incomplete illumination of the object 50 to be measured caused by the position deviation of the object 50 to be measured or the position deviation of the first light source 21.

[0035] In some embodiments, such as Figure 1 、 Figure 2As shown, the imaging system may further include: a ranging device 40 for obtaining the height information of the surface of the object 50 to be measured; at least the second lens 32 adjusts the optical path of the second light beam 221 based on the height information. The imaging system may further include a ranging device 40. The ranging device 40 may be disposed upstream of the light source system and the image acquisition device 10, so that before the light source system illuminates the object 50 to be measured and the surface image of the object 50 to be measured is acquired through the image acquisition device 10, the height information of the surface of the object 50 to be measured can be determined by the ranging device 40. The distance between the object 50 to be measured and the ranging device 40 can be detected by the ranging device 40, so as to obtain the height information of the object 50 to be measured. The height information of the object 50 to be measured can be directly detected by the ranging device 40, or multiple height information of the same object 50 to be measured at different positions can be obtained by the ranging device 40, and the final height information of the object 50 to be measured can be determined by calculation. In the imaging system, at least the second lens 32 can adjust the optical path of the second light beam 221 based on the height information of the object 50 to be measured. When the height of the object 50 to be measured is within the first height range 213, the second lens 32 can be translated or rotated to change the irradiation angle of the second light beam 221 and irradiate the surface of the object 50 to be measured. On the basis that the first light source 21 irradiates the object 50 to be measured, by moving the second lens 32, the second light beam 221 emitted by the second light source 22 supplements the light of the object 50 to be measured, so as to ensure the light intensity of illuminating the object 50 to be measured, improve the clarity of the object image to be measured, and ensure the reliability of image detection. When the height of the object 50 to be measured is greater than the maximum value of the second height range 223, the irradiation angle of the second light beam 221 can be changed or the second width of the second light beam 221 can be changed by translating or rotating the second lens 32, so that the irradiation range of the second light beam 221 covers the surface of the object 50 to be measured, thereby avoiding the incomplete illumination of the object 50 to be measured caused by the position deviation of the object 50 to be measured or the position deviation of the second light source 22. The first lens 31 can also adjust the optical path of the first light beam 211 based on the height information. When the height of the object 50 to be measured is within the second height range 223, the first lens 31 can be translated or rotated to change the irradiation angle of the first light beam 211 and irradiate the surface of the object 50 to be measured. On the basis that the second light source 22 irradiates the object 50 to be measured, by moving the first lens 31, the first light beam 211 emitted by the first light source 21 supplements the light of the object 50 to be measured, so as to ensure the light intensity of illuminating the object 50 to be measured, improve the clarity of the object image to be measured, and ensure the reliability of image detection.

[0036] In some embodiments, such as Figure 3As shown, the first light ray 211 can cover at least half of the imaging width on both sides of the optical axis 11 in the first height segment 213; and / or, the second light ray 221 can cover at least half of the imaging width on both sides of the optical axis 11 in the second height segment 223. The first light ray 211 can cover at least half of the imaging width on both sides of the optical axis 11 in the first height segment 213, Figure 3 where a is the height center of the first height segment 213 of the first light ray 211, Figure 3 where b is the position of the minimum height of the first height segment 213 of the first light ray 211, Figure 3 where c is the position where the first light ray 211 acquires an image at the position of the minimum height of the first height segment 213, and its width can be half of the imaging width of the image acquisition device 10. When the first light ray 211 is directed towards the position of the object to be measured 50, any edge of the first light ray 211, when irradiating the surface of the object to be measured 50, is at least half of the imaging width of the image acquisition device 10 away from the optical axis 11. As Figure 3 shown, when the first light ray 211 irradiates at the position of the minimum height of the first height segment 213, the distance between the edge on one side of the first light ray 211 and the optical axis 11 is greater than or equal to half of the imaging width, which can ensure that the image acquisition device 10 can completely cover the area irradiated by the first light source 21, ensure that the area irradiated by the first light source 21 can be acquired by the image acquisition device 10, and avoid waste of light energy. In addition, when the edge of the first light ray 211 is too close to the optical axis 11, it may cause edge distortion during imaging. Through this embodiment, the distance between the edge of the first light ray 211 and the optical axis 11 can be ensured, avoiding imaging edge distortion, ensuring the normal imaging of the image acquisition device 10, and making the imaging quality higher. When the second light ray 221 irradiates at the position of the minimum height of the second height segment 223, the distance between the edge on one side of the second light ray 221 and the optical axis 11 is greater than or equal to half of the imaging width, which can ensure that the image acquisition device 10 can completely cover the area irradiated by the second light source 22, ensure that the area irradiated by the second light source 22 can be acquired by the image acquisition device 10, and avoid waste of light energy. In addition, when the edge of the second light ray 221 is too close to the optical axis 11, it may cause edge distortion during imaging. Through this embodiment, the distance between the edge of the second light ray 221 and the optical axis 11 can be ensured, avoiding imaging edge distortion, ensuring the normal imaging of the image acquisition device 10, and making the imaging quality higher.

[0037] In some embodiments, the first included angle 214 between the optical path center of the first light ray 211 and the optical axis 11 may be determined based on the first height, the first width, and the imaging width of the first height segment 213; and / or, the second included angle between the optical path center of the second light ray 221 and the optical axis 11 may be determined based on the second height, the second width, and the imaging width of the second height segment 223. The angle of the first included angle 214 of the optical path center of the first light ray 211 emitted by the first light source 21 may be determined based on the first height, the first width, and the imaging width of the first height segment 213. The angle of the first included angle 214, the first height, the first width, and the imaging width may satisfy the following formula:

[0038]

[0039] Wherein, H1 is the first height of the first height segment 213; W 11 is the first width of the first light ray 211 emitted by the first light source 21; θ1 is the first included angle 214 between the optical path center of the first light ray 211 and the optical axis 11; A is the imaging width, that is, the maximum imaging width that the image acquisition device 10 can acquire. The first height H1 of the first height segment 213 may be determined according to the height of the object to be measured 50. The objects to be measured 50 may be classified according to the height range, and the objects to be measured 50 with similar heights may be divided into the same category. The first height segment 213 is determined according to the height of the objects to be measured 50 in the same category, so that the first height segment 213 can include all possible heights of the current type of objects to be measured 50, thereby determining the first height H1. The first height H1 may be greater than or equal to 60 mm and may be less than or equal to 120 mm. To ensure that the first light source 21 has a larger illumination range and enables the first light source 21 to illuminate higher objects to be measured 50, the first height H1 may be selected as 120 mm. The first width W of the first light ray 211 emitted by the first light source 21 11 may be greater than or equal to 10 mm and may be less than or equal to 20 mm, and may be determined according to the model of the first light source. To ensure that the first light source 21 has a larger illumination range and enables the first light source 21 to illuminate higher objects to be measured 50, the first width W 11 may be selected as 20 mm. The first included angle 214 between the optical path center of the first light ray 211 and the optical axis 11 may be determined according to the above formula. The inclination angle of the first light source 21 may be determined according to the first included angle 214 between the optical path center of the first light ray 211 and the optical axis 11.

[0040] The second included angle of the optical path center of the second light ray 221 emitted by the second light source 22 may be determined based on the second height, the second width, and the imaging width of the second height segment 223. The second included angle, the second height, the second width, and the imaging width may satisfy the following formula:

[0041]

[0042] Among them, H2 is the second height of the second height segment 223; W 21 is the second width of the second light ray 221 emitted by the second light source 22; θ is the second angle between the optical path center of the second light ray 221 and the optical axis 11; A is the imaging width, that is, the maximum imaging width that the image acquisition device 10 can acquire. The second height H2 of the second height segment 223 can be determined according to the height of the object 50 to be measured. The objects 50 to be measured can be classified according to the height range, and the objects 50 to be measured with similar heights can be divided into the same category. The second height segment 223 is determined according to the height of the objects 50 to be measured in the same category, so that the second height segment 223 can include all possible heights of the current type of objects 50 to be measured, thereby determining the second height H2. The second height H2 can be greater than or equal to 60 mm and can be less than or equal to 120 mm. To ensure that the second light source 22 has a larger illumination range and enables the second light source 22 to illuminate higher objects 50 to be measured, the second height H2 can be selected as 120 mm. The first height H1 and the second height H2 can be equal. The second width W of the second light ray 221 emitted by the second light source 22 21 can be greater than or equal to 10 mm and can be less than or equal to 20 mm, and can be determined according to the model of the second light source. To ensure that the second light source 22 has a larger illumination range and enables the second light source 22 to illuminate higher objects 50 to be measured, the second width W 21 can be selected as 20 mm. The first light source 21 and the second light source 22 can be light sources of the same model. Therefore, the first width W 11 and the second width W 21 can also be equal. The second angle between the optical path center of the second light ray 221 and the optical axis 11 can be determined according to the above formula. The inclination angle of the second light source 22 can be determined according to the second angle between the optical path center of the second light ray 221 and the optical axis 11.

[0043] Through this embodiment, the first angle 214 can be determined based on the first height, the first width, and the imaging width, thereby determining the installation angle of the first light source 21 and the angle between the first light source 21 and the optical axis 11, so as to determine the position of the first light source 21 and ensure that the first light source 21 can illuminate the object 50 to be measured within the first height segment 213. The second angle can be determined based on the second height, the second width, and the imaging width, thereby determining the installation angle of the second light source 22 and the angle between the second light source 22 and the optical axis 11, so as to determine the position of the second light source 22 and ensure that the second light source 22 can illuminate the object 50 to be measured within the second height segment 223.

[0044] In some embodiments, the height position of the first light source 21 can be determined based on the first included angle 214, the width of the first light source 21, the imaging width, and the height position of the image acquisition device 10; and / or, the height position of the second light source 22 can be determined based on the second included angle, the width of the second light source 22, the imaging width, and the height position of the image acquisition device 10.

[0045] The first light source 21 can be disposed on the side of the optical axis 11 of the image acquisition device 10 in the imaging system. To ensure that the position where the first light source 21 is disposed avoids the optical path of the image acquisition device 10, the position of the first light source 21 can be restricted to ensure that the first light source 21 avoids the optical path of the image acquisition device 10 and prevent the first light source 21 from blocking the optical path of the image acquisition device 10, resulting in incomplete imaging and other situations. The position of the first light source 21 can include the height position of the first light source 21 and the angular information of the first light source 21. Among them, the angular information of the first light source 21 is the angle θ1 of the first included angle 214 between the optical path center of the first light ray 211 and the optical axis 11, and the height position of the first light source 21 can be determined based on the first included angle 214, the width of the first light source 21, the imaging width, and the height position of the image acquisition device 10, and the height position of the first light source 21 should be greater than the maximum height of the object to be measured 50 to prevent the first light source 21 from interfering with the object to be measured 50; the height position of the first light source 21 can satisfy the following formula:

[0046]

[0047] Among them, L1 is the distance from the intersection of the optical path center of the first light source 21 and the optical axis 11 of the image acquisition device 10 to the center of the light-emitting port of the first light source 21; θ1 is the angle of the first included angle 214 between the optical path center of the first light source 21 and the optical axis 11 of the image acquisition device 10; W1 is the width of the first light source 21, which is the outer contour information of the first light source 21; α1 is the included angle 13 between the edge light ray on the side close to the first light source 21 and the optical axis 11 among the light rays that can be received by the image acquisition device 10, and α1 can be determined according to the height position of the image acquisition device 10 and the imaging width A; A is the imaging width, that is, the maximum width of the image acquisition device 10 for one-time imaging. Among them, since the intersection of the optical path center of the first light source 21 and the optical axis 11 is located at the height center of the first height segment 213, therefore, the height position of the first light source 21 can be determined according to the distance L1 from the intersection of the optical path center of the first light source 21 and the optical axis 11 to the center of the light-emitting port of the first light source 21 and the height H1 of the first height segment 213. The height position of the first light source 21 can be determined by the above formula, and according to the height position of the first light source 21 and the included angle θ1 between the optical path center of the first light source 21 and the optical axis 11 of the image acquisition device 10, that is, the installation angle of the first light source 21 relative to the optical axis 11, the position of the first light source 21 can be located to avoid interference between the first light source 21 and the image acquisition device 10 and affect the integrity of imaging. The width W1 of the first light source 21 can be greater than or equal to 50 mm and less than or equal to 60 mm. To avoid interference between the first light source 21 and the image acquisition device 10 and affect the integrity of imaging, and at the same time save space, W1 can be set to 50 mm, which is convenient for the first light source 21 to avoid the optical path of the image acquisition device 10, and at the same time can make the volume of the first light source 21 smaller and reduce the installation space. For the angle θ1 of the first included angle 214 between the optical path center of the first light source 21 and the optical axis 11 of the image acquisition device 10, it can satisfy: 7° ≤ θ1 ≤ 10°. Without causing the first light source 21 to block the optical path of the image acquisition device 10, the angle θ1 can be made as small as possible, which can ensure that when the first light source 21 illuminates the surface of the object to be measured 50, the first light ray 211 can evenly and completely cover the surface of the object to be measured 50 to ensure the uniformity of illumination and the integrity of imaging.

[0048] The second light source 22 can be arranged on the side of the optical axis 11 of the image acquisition device 10 in the imaging system. To ensure that the position where the second light source 22 is arranged avoids the optical path of the image acquisition device 10, the position of the second light source 22 can be restricted to ensure that the second light source 22 avoids the optical path of the image acquisition device 10 and prevent the second light source 22 from blocking the optical path of the image acquisition device 10, resulting in incomplete imaging and other situations. The position of the second light source 22 can include the height position of the second light source 22 and the angular information of the second light source 22. Among them, the angular information of the second light source 22 is the second included angle θ2 between the optical path center of the second light ray 221 and the optical axis 11, and the height position of the second light source 22 can be determined based on the second included angle, the width of the second light source 22, the imaging width, and the height position of the image acquisition device 10. Moreover, the height position of the second light source 22 should be greater than the maximum height of the object to be measured 50 to prevent the second light source 22 from interfering with the object to be measured 50. The height position of the second light source 22 can satisfy the following formula:

[0049]

[0050] Among them, L2 is the distance from the intersection of the optical path center of the second light source 22 and the optical axis 11 of the image acquisition device 10 to the center of the light-emitting port of the second light source 22; θ2 is the angle of the second included angle between the optical path center of the second light source 22 and the optical axis 11 of the image acquisition device 10; W2 is the width of the second light source 22, which is the outer contour information of the second light source 22; α1 is the included angle between the edge light ray on the side close to the second light source 22 and the optical axis 11 among the light rays that can be received by the image acquisition device 10, and α2 can be determined according to the height position of the image acquisition device 10 and the imaging width A; A is the imaging width, that is, the maximum width of one-time imaging of the image acquisition device 10. Among them, since the intersection of the optical path center of the second light source 22 and the optical axis 11 is located at the height center of the second height section 223, therefore, the height position of the second light source 22 can be determined according to the distance L2 from the intersection of the optical path center of the second light source 22 and the optical axis 11 to the center of the light-emitting port of the second light source 22 and the height H2 of the second height section 223. The height position of the second light source 22 can be determined by the above formula, and the position of the second light source 22 can be located according to the height position of the second light source 22 and the included angle θ2 between the optical path center of the second light source 22 and the optical axis 11 of the image acquisition device 10, that is, the installation angle of the second light source 22 relative to the optical axis 11, so as to avoid interference between the second light source 22 and the image acquisition device 10 and affect the integrity of imaging. The width W2 of the second light source 22 can be greater than or equal to 50 mm and less than or equal to 60 mm. To avoid interference between the second light source 22 and the image acquisition device 10 and affect the integrity of imaging, and at the same time save space, W2 can be set to 50 mm, which is convenient for the second light source 22 to avoid the optical path of the image acquisition device 10, and at the same time can make the volume of the second light source 22 smaller and reduce the installation space. For the angle θ2 of the second included angle between the optical path center of the second light source 22 and the optical axis 11 of the image acquisition device 10, it can satisfy: 7° ≤ θ2 ≤ 10°. Without causing the second light source 22 to block the optical path of the image acquisition device 10, the angle θ2 can be made as small as possible, which can ensure that when the second light source 22 illuminates the surface of the object 50 to be measured, the second light ray 221 can evenly and completely cover the surface of the object 50 to be measured, so as to ensure the uniformity of illumination and the integrity of imaging.

[0051] Through this embodiment, the height positions of the first light source 21 and the second light source 22 can be determined respectively to ensure that the first light source 21 and the image acquisition device 10 do not interfere with each other, avoid the first light source 21 blocking the optical path of the image acquisition device 10 and resulting in incomplete imaging, ensure the integrity of imaging, and improve the imaging quality. At the same time, it can ensure that there is no interference between the first light source 21 and the object to be measured 50, so as to avoid the first light source 21 colliding with the object to be measured 50 with a higher height and damaging the first light source 21, and can improve the safety of the first light source 21. It can ensure that the second light source 22 and the image acquisition device 10 do not interfere with each other, avoid the second light source 22 blocking the optical path of the image acquisition device 10 and resulting in incomplete imaging, ensure the integrity of imaging, and improve the imaging quality. At the same time, it can ensure that there is no interference between the second light source 22 and the object to be measured 50, so as to avoid the second light source 22 colliding with the object to be measured 50 with a higher height and damaging the first light source 21, and can improve the safety of the second light source 22.

[0052] Based on the same inventive concept, the present disclosure also provides a sorting machine, which may include: a conveying device, an imaging system as described in any one of the foregoing embodiments, an identification device, and a sorting device.

[0053] The conveying device can be used to convey the object to be measured 50. The conveying device can be a conveyor belt or the like. The object to be measured 50 can be placed on the conveying device, and the object to be measured 50 can be conveyed to the imaging system through the conveying device to obtain an image of the surface of the object to be measured 50.

[0054] The imaging system as described in any one of the foregoing embodiments can be arranged above the conveying device and is used to obtain an image of the surface of the object to be measured 50. The imaging system can include an image acquisition device 10 and a light source system. The surface of the object to be measured 50 on the conveying device can be illuminated through the light source system, and an image of the surface of the object to be measured 50 can be obtained through the image acquisition device.

[0055] The identification device can be used to determine the category of the object to be measured 50 according to the image of the surface of the object to be measured 50. The identification device can be communicatively connected to the imaging system and can determine the category to which each object to be measured 50 belongs according to the image of the surface of the object to be measured 50 obtained by the imaging system and based on the characteristics of the surface of the object to be measured 50.

[0056] The sorting device is arranged downstream of the conveying device and is used to sort the object to be measured 50 according to the category of the object to be measured 50. The sorting device can be arranged downstream of the conveying device. The object to be measured 50 can be conveyed by the conveying device to the imaging system to obtain an image of the surface of the object to be measured 50. After the category of the object to be measured 50 is determined by the identification device, the object to be measured 50 is conveyed by the conveying device to the sorting device, and the sorting device can sort the object to be measured 50 according to the category of the object to be measured 50, so that the objects to be measured 50 belonging to different categories are separated from each other.

[0057] Through the sorting machine of this embodiment, the object to be measured 50 can be conveyed by the conveying device, and the image of the object to be measured 50 can be obtained through the imaging system, so as to obtain a clear and complete image of the surface of the object to be measured 50, which is convenient for the recognition and classification of the recognition device. Based on the recognition device to recognize and classify the image of the object to be measured 50, and finally, different types of objects to be measured 50 are sorted through the sorting device according to the classification, so that the objects to be measured 50 can be accurately and quickly classified and sorted, with high recognition accuracy and sorting accuracy.

[0058] This application uses specific terms to describe the embodiments of this application. Such as "one embodiment", "an embodiment", and / or "some embodiments" mean a certain feature, structure or characteristic related to at least one embodiment of this application. Therefore, it should be emphasized and noted that the "one embodiment" or "an embodiment" or "an alternative embodiment" mentioned twice or more at different positions in this specification does not necessarily refer to the same embodiment. In addition, certain features, structures or characteristics in one or more embodiments of this application can be combined appropriately.

[0059] In the context of this application, unless the context clearly indicates an exception, the words "a", "one", "a kind of" and / or "the" etc. do not specifically refer to the singular, but may also include the plural. Generally speaking, the terms "include" and "comprise" only indicate the inclusion of the steps and elements that have been clearly identified, and these steps and elements do not constitute an exclusive list. The method or device may also include other steps or elements.

[0060] Similarly, it should be noted that, in order to simplify the expression of this application disclosure and thus help the understanding of one or more application embodiments, in the previous description of the embodiments of this application, sometimes multiple features are merged into one embodiment, drawing or its description. However, this disclosure method does not mean that the features required by the object of this application are more than those mentioned in the claims. In fact, the features of the embodiment are less than all the features of the single embodiment disclosed above.

[0061] The basic concepts have been described above. Obviously, for those skilled in the art, the above disclosure is only an example and does not constitute a limitation to this application. Although it is not explicitly stated here, those skilled in the art may make various modifications, improvements and corrections to this application. Such modifications, improvements and corrections are proposed in this application, so such modifications, improvements and corrections still belong to the spirit and scope of the embodiments of this application.

Claims

1. An imaging system, comprising: An image acquisition device for acquiring an image of the surface of an object to be measured; A light source system for projecting light onto the surface of the object to be measured; wherein, The light source system at least includes a first light source and a second light source, which are arranged on the side of the optical axis of the image acquisition device. The first light source is used for projecting a first light ray with a first width, and the first light ray passes through a first height section of the optical axis. The second light source is used for projecting a second light ray with a second width, and the second light ray passes through a second height section of the optical axis. Wherein, the first height section and the second height section are offset or partially overlapped in the extending direction of the optical axis.

2. The imaging system according to claim 1, wherein, The first light source and the second light source are respectively arranged on both sides of the optical axis.

3. The imaging system according to claim 2, wherein, The intersection point of the optical path center of the first light ray and the optical axis is located at the height center of the first height section; and / or, The intersection point of the optical path center of the second light ray and the optical axis is located at the height center of the second height section.

4. The imaging system according to claim 2, wherein, The height of the highest point of the first height section is greater than or equal to the height of the lowest point of the second height section.

5. The imaging system according to claim 4, wherein, The imaging system further includes: A first lens movably arranged at the light outlet of the first light source for adjusting the optical path of the first light ray; and / or, A second lens movably arranged at the light outlet of the second light source for adjusting the optical path of the second light ray.

6. The imaging system according to claim 5, wherein, The second lens is used to move away from or close to the second light source along the optical path center of the second light ray to change the second width of the second light ray; and / or, The second lens is used to rotate to change the second included angle between the optical path center of the second light ray and the optical axis.

7. The imaging system according to claim 6, wherein, The imaging system further includes: A ranging device for acquiring the height information of the surface of the object to be measured; At least the second lens adjusts the optical path of the second light ray based on the height information.

8. The imaging system according to any one of claims 2-7, wherein, The first light ray covers at least half of the imaging width on both sides of the optical axis in the first height section; and / or, The second light ray covers at least half of the imaging width on both sides of the optical axis in the second height section.

9. The imaging system according to claim 8, wherein, The first included angle between the optical path center of the first light ray and the optical axis is determined based on the first height, the first width of the first height section, and the imaging width; and / or, The second included angle between the optical path center of the second light ray and the optical axis is determined based on the second height, the second width of the second height section, and the imaging width.

10. The imaging system according to claim 9, wherein, The height position of the first light source is determined based on the first included angle, the width of the first light source, the imaging width, and the height position of the image acquisition device; and / or, The height position of the second light source is determined based on the second included angle, the width of the second light source, the imaging width, and the height position of the image acquisition device.

11. A sorting machine, comprising: a conveying device for conveying an object to be measured; the imaging system according to any one of claims 1-10, disposed above the conveying device for acquiring an image of the surface of the object to be measured; an identification device for determining the category of the object to be measured according to the image of the surface of the object to be measured; a sorting device disposed downstream of the conveying device for sorting the object to be measured according to the category of the object to be measured.

Images