Universal array type low-temperature device test fixture

Abstract

The utility model relates to a universal array type low-temperature device test fixture. The universal array type low-temperature device test fixture comprises a fixture cold plate, a connection transition rod and a support rod, the jig cold plate is used for mounting a low-temperature device; the number of the jig cold plates is at least one, the jig cold plates are sequentially installed above the connecting transition rod in a linear array mode, and the supporting rod is fixedly connected to the lower portion of the connecting transition rod. The jig cold plate is L-shaped and comprises a first cold plate part and a second cold plate part vertically arranged on one side of the end part of the first cold plate part; the first cold plate part and the second cold plate part are each provided with a plurality of first through holes, and the side wall and the bottom of the first cold plate part are each provided with a plurality of threaded holes. According to the utility model, the number and types of test devices can be increased, multiple types of low-temperature devices can be tested at one time, and the test efficiency and test types are accelerated.

Description

Technical Field

[0001] The utility model relates to the technical field of low-temperature communication testing, in particular to a universal array-type low-temperature device testing fixture. Background Art

[0002] Cryogenic devices require low-temperature testing to verify their performance. During this testing process, the device must be fixedly mounted on a low-temperature testing platform. A single low-temperature test requires both cooling and warming, resulting in a relatively long test cycle.

[0003] Currently, testing simply involves fixing low-temperature devices on the cold plate of the test platform with pressure strips, which takes up a large amount of platform space. Only one or two devices can be tested at a time, resulting in extremely low test efficiency. In addition, only a single device can be tested at a time.

[0004] Therefore, in order to improve the test efficiency, it is urgent to design a universal array-type low-temperature device test fixture that can increase the number of test devices. Utility Model Content

[0005] In order to address the deficiencies in the prior art, the purpose of the present invention is to provide a universal array-type low-temperature device test fixture, which can increase the number or types of low-temperature test devices in the same test space and solve the problem of low test efficiency.

[0006] In order to achieve the above purpose, the present invention adopts the following technical solutions:

[0007] A universal array-type low-temperature device test fixture comprises a fixture cold plate, a connecting transition rod and a support rod; the fixture cold plate is used to install the low-temperature device; the number of the fixture cold plate is at least one, and each fixture cold plate is sequentially installed above the connecting transition rod in a linear array, and the support rod is connected and fixed below the connecting transition rod.

[0008] The fixture cold plate is L-shaped, including a first cold plate portion and a second cold plate portion vertically arranged on one side of the end of the first cold plate portion; a plurality of first through holes are provided on the first cold plate portion and the second cold plate portion, and a plurality of threaded holes are provided on the side wall and bottom of the first cold plate portion.

[0009] Preferably, according to the present invention, the threaded hole at the bottom of the first cold plate portion is provided on the bottom surface of the lower half of the first cold plate portion; and the thickness of the lower half of the first cold plate portion is greater than that of the upper half.

[0010] Preferably, according to the present invention, the connecting transition rod is a long rod, and a plurality of countersunk step holes are sequentially provided on the long sides of the connecting transition rod, and the plurality of countersunk step holes are arranged in an array.

[0011] According to the preferred embodiment of the present invention, a protrusion is provided on the long side of the top of the connecting transition rod.

[0012] According to the preferred embodiment of the present invention, the countersunk step hole includes a screw mounting hole and a groove arranged below the screw mounting hole.

[0013] According to a preferred embodiment of the present invention, the support rod is in an I-shape, comprising a first support portion and a second support portion arranged in parallel, and an intermediate support portion vertically connected between the first support portion and the second support portion.

[0014] According to the preferred embodiment of the present invention, a plurality of second through holes are provided on the first supporting portion, and a third through hole is provided on the second supporting portion; and the third through hole is a waist-shaped hole.

[0015] According to the preferred embodiment of the present invention, the spacing between two adjacent second through holes on the first supporting portion of the support rod and the spacing between two adjacent countersunk step holes on the connecting transition rod are consistent with the spacing between the threaded holes on the side edges of the fixture cold plate mounting.

[0016] Preferably, according to the present invention, the fixture cold plate, the connecting transition rod and the supporting rod are all made of oxygen-free copper material, and the surface is plated with a gold layer.

[0017] According to the preferred embodiment of the present invention, the fixture cold plate is connected to the test platform cold plate through a flexible cold belt.

[0018] Compared with the prior art, the advantages of the present invention are:

[0019] From the above solutions, it can be seen that the universal array-type low-temperature device test fixture described in the present invention can increase the number and types of test devices, and can test multiple low-temperature devices at a time, thereby speeding up test efficiency and test types. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 This is a schematic diagram of the structure of a universal array-type low-temperature device test fixture;

[0021] Figure 2 It is a structural diagram of the cold plate of the fixture;

[0022] Figure 3 Schematic diagram of the structure connecting the transition rod;

[0023] Figure 4 Schematic diagram of the structure of the support rod;

[0024] Figure 5 Schematic diagram of the fixture structure with low-temperature test devices installed Figure 1 ;

[0025] Figure 6Schematic diagram of the fixture structure with low-temperature test devices installed Figure 2 .

[0026] in:

[0027] 1. Fixture cold plate, 2. Connecting transition rod, 3. Support rod, 4. Cryogenic device, 11. First cold plate part, 12. Second cold plate part, 13. First through hole, 14. Threaded hole, 21. Protrusion, 22. Countersunk step hole, 23. Groove, 31. First support part, 32. Intermediate support part, 33. Second support part, 34. Second through hole, 35. Third through hole. DETAILED DESCRIPTION

[0028] The present invention will be further described below with reference to the accompanying drawings:

[0029] like Figure 1 A universal array-type cryogenic device test fixture is shown, comprising a fixture cold plate 1, connecting transition rods 2, and support rods 3. The cryogenic test device 4 is mounted on the fixture cold plate 1. There is at least one fixture cold plate 1, each mounted in a linear array above the connecting transition rods 2. The support rods 3 are connected and fixed below the connecting transition rods 2.

[0030] like Figure 2 As shown, the fixture cold plate 1 is L-shaped, including a first cold plate portion 11 and a second cold plate portion 12 vertically arranged on one side of the end of the first cold plate portion 11; a plurality of first through holes 13 are provided on the first cold plate portion 11 and the second cold plate portion 12, and threaded holes 14 are provided on the side wall and bottom of the first cold plate portion 11. The first through holes 13 are used to install the cryogenic device 4. By designing the fixture cold plate 1 into an L-shape and providing a plurality of first through holes 13 on the first cold plate portion 11 and the second cold plate portion 12, it can adapt to the assembly methods of different cryogenic devices. Figure 5 and Figure 6 It can be seen that the fixture cold plate 1 can be suitable for the assembly of different types of cryogenic devices. In this embodiment, the six first through holes 13 on the first cold plate portion 11 can be used to assemble devices such as cryogenic isolators, and the three first through holes 13 on the second cold plate portion 12 can be used to assemble cryogenic amplifiers. The threaded holes 14 are used to be fixedly connected to the connecting transition rod 2. The threaded holes 14 at the bottom of the first cold plate portion 11 are arranged on the bottom surface of the lower half of the first cold plate portion 11. The thickness of the lower half of the first cold plate portion 11 is designed to be greater than the thickness of the upper half, and the side walls and bottom of the first cold plate portion 11 are provided with threaded holes of different sizes, which can meet the installation requirements of different screws.

[0031] like Figure 3As shown, the connecting transition rod 2 is a long rod, and a plurality of countersunk step holes 22 are sequentially provided on the long sides of the connecting transition rod 2, and the plurality of countersunk step holes 22 are arranged in an array; a protrusion 21 is provided on the long side of the top of the connecting transition rod 2; the countersunk step hole 22 includes a screw mounting hole and a groove 23 provided below the screw mounting hole. In order to minimize the volume of the test structure, the length of the connecting transition rod 2 is an integer multiple of the length of the mounting side of the fixture cold plate 1. The protrusion 21 acts as a limiter, facilitating the installation of the fixture cold plate 1 on the connecting transition rod 2. The groove 23 is for the screws to sink into, ensuring that the connecting transition rod 2 is in close contact with the fixture cold plate 1 and the support rod 3 when connected, thereby ensuring the stability of the connection.

[0032] like Figure 4 As shown, the support rod 3 is I-shaped and includes a first support portion 31 and a second support portion 33 arranged in parallel, and an intermediate support portion 32 perpendicularly connected between the first and second support portions 31 and 33. A second through-hole 34 is provided in the first support portion 31, and a third through-hole 35 is provided in the second support portion 33. The third through-hole 35 is a waist-shaped hole. Different test platform cold plates have different hole spacings, and the hole positions when installed on different dilution refrigerator cold plates may also vary. By designing the third through-hole 35 as a waist-shaped hole, installation on different cold plates or cold plates is facilitated. Preferably, the waist-shaped holes are spaced 20 to 30 mm apart. The spacing between two adjacent second through-holes 34 on the first support portion 31 of the support rod 3 and the spacing between two adjacent stepped holes 22 on the connecting transition rod 2 are consistent with the spacing between the threaded holes on the mounting side edges of the fixture cold plate 1. The length of the first support portion 31 corresponds to the width of the first cold plate portion 11 of the fixture cold plate 1. The two complement each other to facilitate assembly of the fixture cold plate, connecting transition rod, and support rod. The length of the second support portion 32 is greater than that of the first support portion 31 . The length of the second support portion 32 is designed to match the cold plate hole position of the test platform. The longer length can ensure the stability of the installation.

[0033] To ensure better cooling transfer, the fixture cold plate 1, the connecting transition rod 2, and the support rod 3 are all made of oxygen-free copper, the surface of which can be polished and gold-plated. A flexible cold belt can be used to connect the fixture cold plate 1 and the test platform cold plate.

[0034] The method of using the universal array-type low-temperature device test fixture described in the utility model is as follows:

[0035] During the test, first fix the low-temperature test device 4 to the L surface of the fixture cold plate 1 with screws, then install the fixture cold plate 1 with the low-temperature device on the connecting transition rod 2 along the small convex edge, with a middle space reserved for installing the support rod 3. When assembling the support rod 3, connect the short side of the support plate 3 to the fixture cold plate 1 through the connecting transition rod, and fix the fixture cold plate 1 with the low-temperature device, the connecting transition rod 2, and the support rod 3 together with screws to form a unified assembly. When the entire assembly is assembled, the entire assembly is fixed to the cold plate inside the test platform through the waist-shaped hole on the long side of the support rod 3 during the test, and the test cable connector is connected to the connector of the low-temperature test device 1, and then the low-temperature test is performed.

[0036] To expedite testing, the connecting transition rod 2 can be lengthened based on the number of cryogenic devices being tested, allowing for more fixture cold plate holes to be installed along the long sides. Alternatively, the assembly can be arranged topologically within the test platform as a single unit. The fixture cold plate 1 can be configured with multiple mounting holes on its L-surface for testing different cryogenic devices.

[0037] like Figure 5 and Figure 6 As shown, the present invention can be used to measure a variety of different low-temperature devices and can also serve as a mounting bracket for the installation layout of quantum computer quantum devices. By designing the fixture cold plate and providing different holes on the fixture cold plate, it can adapt to the installation of different devices. Figure 5 and Figure 6 The figure shows that an amplifier and an isolator are installed on the same fixture. In addition, mixers, bias tees, single-section circulators and other devices can also be installed.

[0038] The above-described embodiments are merely descriptions of preferred implementation methods of the present invention and are not intended to limit the scope of the present invention. Without departing from the design spirit of the present invention, various modifications and improvements made to the technical solutions of the present invention by ordinary technicians in this field should fall within the scope of protection determined by the claims of the present invention.

Claims

1. A universal array-type low-temperature device test fixture, characterized in that: The invention comprises a fixture cold plate (1), a connecting transition rod (2) and a support rod (3); the fixture cold plate (1) is used to install a low-temperature device (4); the number of the fixture cold plate (1) is at least one, and each fixture cold plate (1) is sequentially installed above the connecting transition rod (2) in a linear array, and the support rod (3) is connected and fixed below the connecting transition rod (2); The fixture cold plate (1) is L-shaped, comprising a first cold plate portion (11) and a second cold plate portion (12) vertically arranged on one side of the end of the first cold plate portion (11); a plurality of first through holes (13) are provided on the first cold plate portion (11) and the second cold plate portion (12), and a plurality of threaded holes (14) are provided on the side wall and bottom of the first cold plate portion (11).

2. The universal array-type low-temperature device test fixture according to claim 1, characterized in that: The threaded hole (14) at the bottom of the first cold plate portion (11) is arranged on the bottom surface of the lower half of the first cold plate portion (11); the thickness of the lower half of the first cold plate portion (11) is greater than the thickness of the upper half.

3. The universal array-type low-temperature device test fixture according to claim 1, characterized in that: The connecting transition rod (2) is a long rod, and a plurality of countersunk step holes (22) are sequentially provided on the long sides of the connecting transition rod (2), and the plurality of countersunk step holes (22) are arranged in an array.

4. The universal array-type low-temperature device test fixture according to claim 3, characterized in that: A protrusion (21) is provided on the long side of the top of the connecting transition rod (2).

5. The universal array-type low-temperature device test fixture according to claim 3, characterized in that: The countersunk step hole (22) comprises a screw mounting hole and a groove (23) arranged below the screw mounting hole.

6. The universal array-type low-temperature device test fixture according to claim 3, characterized in that: The support rod (3) is in an I-shape, comprising a first support portion (31) and a second support portion (33) arranged in parallel, and an intermediate support portion (32) vertically connected between the first support portion (31) and the second support portion (33).

7. The universal array-type low-temperature device test fixture according to claim 6, characterized in that: The first supporting portion (31) is provided with a second through hole (34), and the second supporting portion (33) is provided with a third through hole (35); the third through hole (35) is a waist-shaped hole.

8. The universal array-type low-temperature device test fixture according to claim 7, characterized in that: The spacing between two adjacent second through holes (34) on the first supporting portion (31) of the support rod (3) and the spacing between two adjacent countersunk step holes (22) on the connecting transition rod (2) are consistent with the spacing between the side edge threaded holes (14) of the fixture cold plate (1) installation.

9. The universal array-type low-temperature device test fixture according to claim 1, characterized in that: The fixture cold plate (1), the connecting transition rod (2) and the supporting rod (3) are all made of oxygen-free copper material, and the surface is plated with a gold layer.

10. The universal array-type low-temperature device test fixture according to any one of claims 1 to 9, characterized in that: The fixture cold plate (1) is connected to the test platform cold plate via a flexible cold belt.

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