Display assembly testing device

Abstract

The utility model discloses a display assembly testing device, comprising a cabinet and a J1 pin row, the J1 pin row comprises 46 pins, the J1 pin row is packaged in the cabinet and is connected with external equipment through an equipment panel of the cabinet, the cabinet also internally comprises a TAXI signal module, and the TAXI signal module is connected with the J1 pin row. A first pin to a fifth pin of the J1 pin row are connected to a signal input pin of the TAXI signal module, and a direct current input pin of the TAXI signal module is connected to a 220V AC input power supply through the direct current power supply module. According to the utility model, TAXI video signals or NTSC video signals can be provided and displayed for the display assembly, six different positions installed on an airplane are simulated for testing, and finally a test result consistent with a manual is completed; the successful development of the utility model can establish a complete test on the display component, so that the high-efficiency and high-quality maintenance of the component becomes possible, a large amount of investment cost of outsourcing equipment can be saved, the domestic replacement test is realized, and the safety test requirement of the component is met.

Description

Technical Field

[0001] The utility model relates to the technical field of testing, in particular to a display component testing device. Background Art

[0002] The display assembly used in civil aircraft is a liquid crystal display (LCD) that displays flight information required by the crew. The aircraft's host processor receives graphical data and commands via a high-speed coaxial TAXI bus. The display assembly processes the input video data, displays the image, and reports status information back to the ARINC 429 bus. The display assembly primarily consists of a chassis, interface board, I / O board, video processing board, power supply board, backlight driver assembly, backlight assembly, and LCD assembly.

[0003] Each B737NG aircraft is equipped with six display modules, representing a significant number of critical flight information displays. However, the video processing and power supply circuit boards within these display modules are prone to intermittent failures, resulting in a high replacement rate. However, maintenance of these modules in China is currently heavily monopolized by the OEM, Honeywell, resulting in high repair costs and long maintenance cycles, placing significant operational and cost pressures on domestic aviation users. Therefore, it is imperative to independently develop a test system for this project and establish maintenance capabilities in China. Utility Model Content

[0004] In view of this, an object of the present invention is to provide a display component testing device that can overcome the problems existing in the background technology.

[0005] The purpose of this utility model is achieved through the following technical solutions:

[0006] A display component testing device includes a chassis and a J1 pin strip. The J1 pin strip is encapsulated within the chassis and connected to an external device via a device test panel of the chassis. The chassis also includes a TAXI signal module for transmitting TAXI signals. Pins B-A1, B-B1, B-C1, B-D1, and B-E1 of the TAXI signal module are respectively connected to pins 1 through 5 of the J1 pin strip. Pins 1 through 5 of the J1 pin strip are also respectively connected to ground via a normally open switch.

[0007] The TAXI signal output pin and GND pin of the TAXI signal module are connected to the equipment test panel of the chassis through a cable; the +15VDC, -15VDC, +5VDC and GND pins of the TAXI signal module are connected to an external 220VAC power supply through a DC power supply module; the 28VDC HI and 28VDC LO input pins of the TAXI signal module are connected to an external 220VAC power supply through a 28VDC module;

[0008] The 28VDC HI and 28VDC LO output pins of the TAXI signal module are connected to the corresponding pins of the J1 pin row.

[0009] Furthermore, the meaning and connection relationship of each pin of the J1 pin row are shown in the following table:

[0010]

[0011]

[0012]

[0013] Furthermore, the equipment test panel of the chassis includes an AMMETER / VOLTMETER display area, a DSI operation area, a TEST POINT test area, an INDICATOR LAMP indication area, an ANI test area, a 28VDC POWER operation area, a 220VAC operation area, a 429OUTPUT test area, a BNC operation area, and a CONNECTJ1 interface for external connection to the J1 pin row.

[0014] The beneficial effects of the present invention are as follows: the present invention can provide a display module with a TAXI video signal or an NTSC video signal, simulate the installation in different positions on the aircraft for testing, and finally complete the test results consistent with the manual; currently OEM repairs are mainly carried out by replacing the internal faulty circuit board, which is costly and has a long cycle. The successful development of the present invention can serve as a basic component, laying a good foundation for the later combination with the test platform to establish a complete test of the display module, making efficient and high-quality maintenance of the component possible, and saving a lot of investment costs for purchased equipment, realizing domestic substitution testing, and meeting component safety testing requirements.

[0015] Other advantages, objectives, and features of the present invention will be described in detail in the following description and, to some extent, will be apparent to those skilled in the art upon examination and study of the following or may be learned from practice of the present invention. The objectives and other advantages of the present invention may be realized and obtained through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to make the purpose, technical solutions and advantages of the present invention more clear, the present invention will be further described in detail below with reference to the accompanying drawings, in which:

[0017] Figure 1 This is a schematic diagram of the circuit connection of the utility model;

[0018] Figure 2 Schematic diagram of cable connection;

[0019] Figure 3 This is a schematic diagram of the device panel;

[0020] Figure 4 This is a test connection diagram. DETAILED DESCRIPTION

[0021] The preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings. It should be understood that the preferred embodiments are only for illustrating the present invention and are not intended to limit the scope of protection of the present invention.

[0022] like Figure 1 As shown, a display component testing device of the present invention includes a chassis and a J1 pin row. The J1 pin row is encapsulated in the chassis and connected to an external device through a device test panel of the chassis. The chassis also includes a TAXI signal module. The TAXI signal module is used to send TAXI signals. The B-A1, B-B1, B-C1, B-D1, and B-E1 pins of the TAXI signal module are respectively connected to the first to fifth pins of the J1 pin row. The first to fifth pins of the J1 pin row are also connected to the ground terminal through a normally open switch.

[0023] The TAXI signal output pin and GND pin of the TAXI signal module are connected to the equipment test panel of the chassis through a cable; the +15VDC, -15VDC, +5VDC and GND pins of the TAXI signal module are connected to an external 220VAC power supply through a DC power supply module; the 28VDC HI and 28VDC LO input pins of the TAXI signal module are connected to an external 220VAC power supply through a 28VDC module;

[0024] Connect the 28VDC HI and 28VDC LO output pins of the TAXI signal module to the corresponding pins on the J1 pin strip.

[0025] In this embodiment, the meaning and connection relationship of each pin of the J1 pin row are shown in the following table:

[0026]

[0027]

[0028]

[0029] from Figure 1 As can be seen from the figure, among the above pins, the 21st and 31st pins constitute the ARINC 429 data output test circuit, the 23rd, 24th and 33rd pins constitute the power input circuit of the remote light sensor, the 25th, 35th and 29th pins constitute the signal test circuit of the remote light sensor, the 7th, 17th and 27th pins constitute the signal test circuit of the area brightness control input, the 8th, 18th and 28th pins constitute the signal test circuit of the shadow brightness control input, the 9th, 19th and 29th pins constitute the signal test circuit of the independent unit brightness control input; and the 12th, 13th and 14th pins constitute the signal test circuit of the time indicator.

[0030] like Figure 3 As shown in the figure, the corresponding relationship between the J1 pin row and the device test panel of the chassis is connected through the cable. The functions of the various marks on the test device panel are shown in the following table:

[0031]

[0032]

[0033] like Figure 3 As shown in the figure, the device panel of the device of the present invention is rationally divided into various functional areas, which can realize the test operation and status display of multiple test items. In this embodiment, the device test panel of the chassis includes an AMMETER / VOLTMETER display area (i.e., an ammeter / voltmeter display area), a DSI operation area (display interface operation area), a TEST POINT test area (discrete test point area), an INDICATOR LAMP indication area (time indicator indication area), an ANI operation area (brightness adjustment potentiometer area), a 28VDC POWER operation area (28VDC power supply operation area), a 220VAC operation area (external 220VAC power supply operation area), a 429OUTPUT test area (ARINC 429 output test area), a BNC operation area (TAXI signal output area), and a CONNECT J1 interface for external connection to the J1 pin row.

[0034] like Figure 4As shown, after analyzing the project, it is found that this is an LCD display that primarily receives taxi data information from the DEU or NTSC video signal from the camera, processes it internally, and displays graphics on the LCD screen. The test method described in the manual primarily utilizes automatic test equipment, primarily simulating the taxi data bus for graphic display testing. Actual testing utilizes a display component test bench based on the present invention. This test bench provides taxi data signals, power supply, test ports, brightness adjustment potentiometer, and a 429 output test port for DU testing. The DU position can be defined manually or by software. Combined with the NTSC video signal provided by a DVD player, it can perform DU display function testing, brightness adjustment function testing, and 429 data output testing.

[0035] Using the display component test bench to test, you can complete the test of all data ports of the display component, achieve the purpose of testing its function, performance, and interface, and meet the display component testing requirements.

[0036] This comprehensive testing system for display components enables efficient, high-quality repairs and significantly reduces equipment investment. This system breaks the OEM monopoly in this repair sector, enabling domestically produced testing alternatives. It also promotes the advancement and development of testing technology.

[0037] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the utility model and are not limiting. Although the utility model is described in detail with reference to the preferred embodiments, ordinary technicians in this field should understand that the technical solution of the utility model can be modified or replaced by equivalents without departing from the purpose and scope of the technical solution, which should be included in the scope of the claims of the utility model.

Claims

1. A display component testing device, characterized in that: The device includes a chassis and a J1 pin row. The J1 pin row is encapsulated in the chassis and connected to an external device through a device test panel of the chassis. The chassis also includes a TAXI signal module. The TAXI signal module is used to send TAXI signals. The B-A1, B-B1, B-C1, B-D1, and B-E1 pins of the TAXI signal module are respectively connected to the first to fifth pins of the J1 pin row. The first to fifth pins of the J1 pin row are also respectively connected to a ground terminal via a normally open switch. The TAXI signal output pin and GND pin of the TAXI signal module are connected to the equipment test panel of the chassis through a cable; the +15VDC, -15VDC, +5VDC and GND pins of the TAXI signal module are connected to an external 220VAC power supply through a DC power supply module; the 28VDC HI and 28VDC LO input pins of the TAXI signal module are connected to an external 220VAC power supply through a 28VDC module; The 28VDC HI and 28VDC LO output pins of the TAXI signal module are connected to the corresponding pins of the J1 pin row.

2. A display component testing device according to claim 1, characterized in that: The meaning and connection relationship of each pin of the J1 pin row are shown in the following table: Numbers 1 to 5: J1 pins are DU Identification Pins; No. 6: J1 pin means NVM configuration enable; No. 7: J1 pin means Zone Brightness Control Input; Number 8: J1 pin means Shade Brightness Control Input; Number 9: J1 pin means Individual Unit Brightness Control Input; No. 10: J1 pin means Test; No. 11: J1 pin meaning is NC; Number 12: J1 pin means Elapsed Time Indicator Power (+5 V); No. 13: J1 pin means ETI ground; Number 14: J1 pin means Elapsed Time Indicator Data Out; No. 15: J1 pin meaning is NC; No. 16: J1 pin meaning is PING_PONG; Number 17: J1 pin means +10 V Reference for Zone Brightness Control; No. 18: J1 pin means ZONE_REF; No. 19: J1 pin means +10 V Reference for Zone Brightness Control; No. 20: J1 pin means Test; No. 21: J1 pin meaning is 429-A; No. 22: J1 pin meaning is NC; Serial number 23: J1 pin meaning +15 VDC to Remote Light Sensor; No. 24: J1 pin means Return Line from Remote Light Sensor; No. 25: J1 pin means Remote Light Sensor High Signal In; No. 26: J1 pin meaning is NC; No. 27: J1 pin means Zone Brightness Return Line; No. 28: J1 pin means Shade Brightness Return Line; No. 29: J1 pin means Individual Unit Brightness Return Line; No. 30: J1 pin meaning is NC; No. 31: J1 pin meaning is 429-B; No. 32: J1 pin meaning is NC; No. 33: J1 pin means -15 VDC to Remote Light Sensor; No. 34: J1 pin means RS-232 calibration port; No. 35: J1 pin meaning RLS data LO; Numbers 36 to 39: J1 pins are NC. No. 40: J1 pin means Test; No. 41: J1 pin means VREF program mode Vpp; Number 42: J1 pin means Watch dog FPGA test; No. 43: J1 pin meaning Discrete, enables calibration mode; Numbers 44 to 46: J1 pins represent the RS-232 calibration port. Numbers 47 to 49: J1 pins are NC. No. 50: J1 pin means Test; Numbers 51 to 57: J1 pins are NC. Number 58: J1 pin means 28VDC LO; Serial number 59: J1 pin means 28VDC HI.

3. The display component testing device according to claim 1, wherein: The equipment test panel of the chassis includes an AMMETER / VOLTMETER display area, a DSI operation area, a TEST POINT test area, an INDICATOR LAMP indication area, an ANI test area, a 28VDC POWER operation area, a 220VAC operation area, a 429OUTPUT test area, a BNC operation area, and a CONNECT J1 interface for external connection to the J1 pin row.

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