Circuit board testing device and system

Abstract

The embodiment of the utility model provides a circuit board testing device and system. The circuit board testing device comprises a displacement module, a driving module and a plurality of testing channels, the displacement module is used for driving the driving module to move among the driving positions corresponding to the plurality of test channels, and different test channels in the plurality of test channels correspond to different driving positions; the driving module is used for driving the to-be-tested circuit board placed on the test channel corresponding to the driving position to be electrically connected with the test channel when the driving module moves to the driving position; and the test channel is used for generating a test signal after being electrically connected with the circuit board to be tested and sending the test signal to the test host. According to the application, in the process of testing the to-be-tested circuit board in a certain test channel, the feeding device can place the to-be-tested circuit board on other test channels at the same time, so that after the test is finished, the displacement module drives the driving module to move to the test channel where the to-be-tested circuit board is placed, and then the next round of test can be started.

Description

Technical Field

[0001] The embodiments of the present application relate to the technical field of circuit board production, and in particular to a circuit board testing device and system. Background Art

[0002] After the circuit board production is completed, the circuit board needs to be tested. Usually, multiple tests such as static parameter test, dynamic parameter test, signal integrity test, EMC test, etc. are carried out. This is mainly achieved by manually connecting the circuit board to the corresponding test interface.

[0003] As circuit technology enters the era of ultra-large-scale integration, circuit board testing has become more complex. Currently, a test access port is mainly defined inside the electronic device, and the circuit board to be tested is moved to the test device through a robotic arm or other device. The test device is connected to this test access port to perform multiple tests on the internal nodes.

[0004] However, in the existing testing process, devices such as robotic arms need to wait until the circuit board to be tested is completed before loading, resulting in a long testing time for a single circuit board and low testing efficiency. Utility Model Content

[0005] In order to solve the above technical problems, the embodiments of the present application provide a circuit board testing device and system to at least solve or alleviate the above problems.

[0006] According to a first aspect of an embodiment of the present application, a circuit board testing device is provided, comprising: a displacement module, a drive module and a plurality of test channels; the displacement module is configured to drive the drive module to move between drive positions corresponding to the plurality of test channels, different test channels among the plurality of test channels corresponding to different drive positions; the drive module is configured to drive a circuit board to be tested placed on the test channel corresponding to the drive position to be electrically connected to the test channel when moving to the drive position; the test channel is configured to generate a test signal after being electrically connected to the circuit board to be tested, and to send the test signal to a test host.

[0007] Optionally, the test channel may include: a probe and a support pin; the probe is used to electrically connect to the interface on the circuit board to be tested; the support pin is used to drive the circuit board to be tested after the driving module stops driving the circuit board to be tested, so that the interface on the circuit board to be tested is disconnected from the probe.

[0008] Optionally, the circuit board testing device may further include: a first positioning module, used to limit the relative position of the circuit board to be tested and the test channel when the feeding device places the circuit board to be tested on the test channel, so that the circuit board to be tested is placed above the test channel; a second positioning module, used to limit the relative position of the circuit board to be tested and the test channel when the driving module drives the circuit board to be tested to be electrically connected to the test channel, so that the interface of the circuit board to be tested is aligned with the probe.

[0009] Optionally, the displacement module may include: a first piston, a first piston rod, a permanent magnet and a first cylinder, the first piston is fixedly connected to the driving module, the first piston is sleeved on the outside of the first piston rod, both ends of the first piston rod are connected to the first cylinder, and the permanent magnet is arranged on the inside of the first piston rod; the first cylinder is used to drive the permanent magnet to move along the axial direction of the first piston rod; the permanent magnet is used to drive the first piston to move along the axial direction of the first piston rod; the first piston is used to drive the driving module to move along the axial direction of the first piston rod, so that the driving module moves between the driving positions corresponding to the multiple test channels.

[0010] Optionally, the displacement module may also include: a displacement sensor and a first processor, the displacement sensor is arranged at one end of the first piston rod; the displacement sensor is used to obtain a first distance between the first piston and one end of the first piston rod, and send the first distance to the first processor; the first processor is used to control the first cylinder in response to the first distance, so that the first cylinder drives the permanent magnet to drive the first piston to move, so that the first piston drives the drive module to move to the drive position corresponding to the test channel.

[0011] Optionally, the displacement module may further include: a guide rail and a slider cooperating with the guide rail; the axis of the guide rail is parallel to the axis of the first piston rod; the slider is fixedly connected to the driving module; when the driving module moves along the axis direction of the first piston rod, the slider moves along the axis direction of the guide rail.

[0012] Optionally, the driving module may include: a connecting plate, a baffle, a second cylinder and a second piston rod, the connecting plate is fixedly connected to the second cylinder, the first end of the second piston rod is connected to the second cylinder, the second end of the second piston rod is fixedly connected to the baffle, and a connecting column is provided on the surface of the baffle opposite to the test channel; the second cylinder is used to control the second piston rod to move along the axial direction of the second piston rod between the first starting position and the first ending position to drive the baffle to move between the second starting position and the second ending position, and the baffle is used to drive the connecting column to move along the axial direction of the second piston rod when moving between the second starting position and the second ending position, and drive the circuit board to be tested placed on the test channel corresponding to the driving position to be electrically connected to the test channel through the connecting column.

[0013] Optionally, the driving module may further include: a start sensor, which is installed on the second cylinder; the start sensor is used to generate an in-position signal when the circuit board to be tested is placed on the test channel to which the driving module moves, and to generate a stop signal when the test of the circuit board to be tested is completed; the second cylinder is used to control the second piston rod to move from the first starting position to the first end position according to the in-position signal, so as to drive the baffle to move from the second starting position to the second end position, and to control the second piston rod to move from the first end position to the first starting position according to the stop signal, so as to drive the baffle to move from the second end position to the second starting position.

[0014] According to a second aspect of an embodiment of the present application, a circuit board testing system is provided, comprising: a circuit board testing device and a feeding device as described in the first aspect of the embodiment; the feeding device is used to place a circuit board to be tested on a test channel included in the circuit board testing device, and to remove the circuit board to be tested from the test channel after the test is completed.

[0015] Optionally, the difference between the time it takes for the circuit board testing device to move from the position of one test channel to the position of another test channel and the time it takes for the feeding device to move the circuit board to be tested from the test channel and place another circuit board to be tested in the test channel is less than a preset time threshold.

[0016] It can be seen from the above technical solution that by setting up multiple test channels, during the process of testing the circuit board to be tested in a certain test channel, the feeding device can simultaneously place the circuit board to be tested on other test channels, so that after the test is completed, the displacement module drives the driving module to move to the test channel where the circuit board to be tested is placed, and the next round of testing can be started, thereby reducing the waiting time of the feeding device and improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments recorded in the embodiments of the present application. For ordinary technicians in this field, other drawings can also be obtained based on these drawings.

[0018] Figure 1 is a schematic diagram of a circuit board testing device according to an embodiment of the present application;

[0019] Figure 2 This is a schematic structural diagram of a circuit board testing device according to an embodiment of the present application;

[0020] Figure 3 This is a schematic diagram of the structure of a test channel according to an embodiment of the present application;

[0021] Figure 4 is a cross-sectional view of a first piston rod according to an embodiment of the present application;

[0022] Figure 5 This is a schematic structural diagram of a driving module according to an embodiment of the present application;

[0023] Figure 6 It is a structural diagram of a circuit board testing system according to an embodiment of the present application.

[0024] List of reference numerals:

[0025] 100: Circuit board testing device 101: Displacement module 102: Drive module

[0026] 103: Test channel 10: Circuit board to be tested 1011: First piston

[0027] 1012: First piston rod 1013: Permanent magnet 1014: First cylinder

[0028] 1015: Displacement sensor 1016: Guide rail 1017: Slider

[0029] 1021: Connecting plate 1022: Baffle 10221: Connecting column

[0030] 1023: Second cylinder 1024: Second piston rod 1025: Start sensor

[0031] 1031: Probe 1032: Support needle 104: First positioning module

[0032] 105: Second positioning module 200: Circuit board testing system 201: Feeding device

[0033] 20: Test host DETAILED DESCRIPTION

[0034] In order to enable those skilled in the art to better understand the technical solutions in the embodiments of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the embodiments of the present application, all other embodiments obtained by ordinary technicians in this field should fall within the scope of protection of the embodiments of the present application.

[0035] Figure 1 is a schematic diagram of a circuit board testing device according to an embodiment of the present application. Figure 2 FIG. 1 is a schematic structural diagram of a circuit board testing device according to an embodiment of the present invention. Figure 1-2 As shown, the circuit board testing device 100 includes a displacement module 101, a drive module 102, and multiple test channels 103. The displacement module 101 is used to drive the drive module 102 to move between drive positions corresponding to the multiple test channels 103, with different test channels 103 corresponding to different drive positions. The drive module 102 is used to drive the circuit board 10 to be tested, placed on the test channel 103 corresponding to the drive position, to electrically connect with the test channel 103 when moving to the drive position. The test channel 103 is used to generate a test signal after being electrically connected to the circuit board 10 to be tested, and transmit the test signal to the test host 20.

[0036] In order to improve the efficiency of circuit board testing, a plurality of test channels 103 are provided in the circuit board testing device 100. When conducting circuit board testing, a feeding device, such as a robotic arm, will first place the circuit board 10 to be tested on a certain test channel 103. After placement is completed, the displacement module 101 will drive the driving module 102 to move to the driving position corresponding to the test channel 103 where the circuit board 10 to be tested is placed. The driving position corresponding to the test channel 103 can be 10 cm above the test channel 103, 5 cm above the test channel 103, etc. After that, when the driving module 102 reaches the driving position, it drives the circuit board 10 to be tested placed on the test channel 103 corresponding to the driving position to be electrically connected to the test channel 103. At this time, the test channel 103 will generate a test signal and send it to the test host 20. The test host 20 will analyze the test signal and obtain the test result of the circuit board 10 to be tested. After the feeding device places the circuit board 10 to be tested, while the circuit board testing device 100 is testing the circuit board 10 to be tested, the feeding device will place another circuit board 10 to be tested on another test channel 103. After the circuit board testing device 100 completes the test of the circuit board 10 to be tested placed for the first time, the above process is repeated to implement the test of another circuit board 10 to be tested.

[0037] It should be noted that the multiple test channels 103 can be arranged in a straight line, and the distance between the test channels 103 depends on the volume of the drive module 102 and the feeding speed of the feeding device. While ensuring the normal operation of the drive module 102, it is also necessary to ensure that the feeding device completes the operation of placing the circuit board 10 under test on the test channel 103 at least once during the process of testing the circuit board 10 under test.

[0038] In an embodiment of the present application, multiple test channels 103 are set up. When a certain test channel 103 is testing a circuit board 10 to be tested, the feeding device can simultaneously place the circuit board 10 to be tested on other test channels 103. After the test is completed, the displacement module 101 drives the driving module 102 to move to the test channel 103 where the circuit board 10 to be tested is placed, and the next round of testing can be started, thereby reducing the waiting time of the feeding device and improving the test efficiency.

[0039] Figure 3 This is a schematic diagram of the structure of a test channel according to an embodiment of the present application. Figure 3 As shown, the test channel 103 includes a probe 1031 and a support pin 1032. The probe 1031 is used to electrically connect to the interface on the circuit board 10 to be tested. The support pin 1032 is used to drive the circuit board 10 to be tested after the driving module 102 stops driving the circuit board 10 to disconnect the interface on the circuit board 10 to the probe 1031.

[0040] The test channel 103 can include multiple probes 1031 and multiple support pins 1032. The support pins 1032 are retractable and elastic devices. When the driving module 102 drives the circuit board 10 to be tested, which is placed on the test channel 103 corresponding to the driving position, to be electrically connected to the test channel 103, the support pins 1032 are gradually compressed under the pressure of the circuit board 10 to be tested. The interface on the circuit board 10 to be tested is aligned with the probes 1031. Finally, the probes 1031 are inserted into the interface on the circuit board 10 to complete the electrical connection. After the test is completed, the driving module 102 stops driving the circuit board 10 to be tested, and the support pins 1032 provide elastic force to the circuit board 10 to disconnect the interface on the circuit board 10 to be tested from the probes 1031.

[0041] It should be noted that the number of probes 1031 in the test channel 103 can be set as required according to the actual situation of the circuit board 10 to be tested, and the probes 1031 are set in corresponding holes and slots, such as Figure 3 The probes 1031 are not provided in some of the holes shown in the figure. In fact, whether the probes 1031 are provided in the holes needs to be determined according to the model of the circuit board 10 to be tested.

[0042] In an embodiment of the present application, by providing a supporting pin 1032, the circuit board to be tested 10 can be lifted after the test is completed, and the connection between the interface on the circuit board to be tested 10 and the probe 1031 can be disconnected, which can facilitate the feeding device to remove the tested circuit board 10 from the test channel 103.

[0043] Figure 4 is a cross-sectional view of the first piston rod of an embodiment of the present application, as shown in FIG. Figure 1 and Figure 4 As shown, the displacement module 101 includes: a first piston 1011, a first piston rod 1012, a permanent magnet 1013, and a first cylinder 1014. The first piston 1011 is fixedly connected to the driving module 102 and is sleeved on the outside of the first piston rod 1012. Both ends of the first piston rod 1012 are connected to the first cylinder 1014. The permanent magnet 1013 is disposed on the inside of the first piston rod 1012. The first cylinder 1014 is used to drive the permanent magnet 1013 to move along the axis of the first piston rod 1012. The permanent magnet 1013 is used to drive the first piston 1011 to move along the axis of the first piston rod 1012. The first piston 1011 is used to drive the driving module 102 to move along the axis of the first piston rod 1012, so that the driving module 102 moves between the driving positions corresponding to the multiple test channels 103.

[0044] The displacement module 101 may include a rodless cylinder, which specifically includes a first piston 1011, a first piston rod 1012, a permanent magnet 1013 and a first cylinder 1014. The displacement module 101 drives the driving module 102 to move, and the first cylinder 1014 applies pressure to the hollow first piston rod 1012 to drive the permanent magnet 1013 inside the first piston rod 1012 to move along the axis of the first piston rod 1012. At this time, the permanent magnet 1013 acts on another set of magnetic rings inside the first piston 1011. Since the two sets of magnetic rings have opposite magnetic properties, they have a strong mutual attraction. The first piston 1011 will be driven to move along the axis of the first piston rod 1012, and then drive the driving module 102 to move along the axis of the first piston rod 1012, so that the driving module 102 moves between the driving positions corresponding to multiple test channels 103.

[0045] In an embodiment of the present application, the permanent magnet 1013 is driven by the first cylinder 1014 to drive the first piston 1011 to move along the axial direction of the first piston rod 1012, so that the driving module 102 is driven to move between the driving positions corresponding to the multiple test channels 103. The pressure applied by the first cylinder 1014 to the permanent magnet 1013 can be precisely controlled to precisely control the displacement of the driving module 102.

[0046] In one possible implementation, the displacement module 101 may further include a displacement sensor 1015 and a first processor. The displacement sensor 1015 is disposed at one end of the first piston rod 1012. The displacement sensor 1015 is configured to obtain a first distance between the first piston 1011 and one end of the first piston rod 1012 and transmit the first distance to the first processor. The first processor is configured to control the first cylinder 1014 in response to the first distance, so that the first cylinder 1014 drives the permanent magnet 1013 to move the first piston 1011, causing the first piston 1011 to drive the drive module 102 to move to the drive position corresponding to the test channel 103.

[0047] In order to further accurately control the displacement of the driving module 102, a displacement sensor 1015 is provided at one end of the first piston rod 1012. The displacement sensor 1015 can be a sensor such as a laser ranging sensor. In the process of the displacement module 101 driving the driving module 102 to move between the driving positions corresponding to multiple test channels 103, the displacement sensor 1015 can obtain the first distance between the first piston 1011 and one end of the first piston rod 1012 in real time. The first processor then controls the first cylinder 1014 in response to the first distance, for example, by controlling the gas output of the first cylinder 1014, so that the first cylinder 1014 drives the permanent magnet 1013 to drive the first piston 1011 to move, so that the first piston 1011 drives the driving module 102 to move to the driving position corresponding to the test channel 103.

[0048] In an embodiment of the present application, by setting up a displacement sensor 1015, the first distance between the first piston 1011 and one end of the first piston rod 1012 can be obtained in real time during the process of the displacement module 101 driving the driving module 102 to move between the driving positions corresponding to multiple test channels 103, thereby improving the accuracy of controlling the first cylinder 1014 to further accurately control the displacement of the driving module 102.

[0049] In one possible implementation, the displacement module 101 may further include a guide rail 1016 and a slider 1017 that cooperates with the guide rail 1016. The axis of the guide rail 1016 is parallel to the axis of the first piston rod 1012. The slider 1017 is fixedly connected to the drive module 102. When the drive module 102 moves along the axis of the first piston rod 1012, the slider 1017 moves along the axis of the guide rail 1016.

[0050] The displacement module 101 can also include a guide rail 1016 and a slider 1017 cooperating with the guide rail 1016. When the first piston 1011, the first piston rod 1012, the permanent magnet 1013 and the first cylinder 1014 drive the driving module 102 to move, the slider 1017 is driven by the driving module 102 and moves along the axial direction of the guide rail 1016.

[0051] In an embodiment of the present application, by providing a guide rail 1016 and a slider 1017 cooperating with the guide rail 1016, the running trajectory of the driving module 102 can be further fixed, and there is no need to provide a device similar to the first cylinder 1014 again, thereby saving production costs and usage costs.

[0052] Figure 5 This is a schematic diagram of the structure of a driving module according to an embodiment of the present application. Figure 5As shown, the driving module 102 includes: a connecting plate 1021, a baffle 1022, a second cylinder 1023 and a second piston rod 1024, the connecting plate 1021 is fixedly connected to the second cylinder 1023, the first end of the second piston rod 1024 is connected to the second cylinder 1023, the second end of the second piston rod 1024 is fixedly connected to the baffle 1022, and a connecting column 10221 is provided on the surface of the baffle 1022 opposite to the test channel 103. The second cylinder 1023 is used to control the second piston rod 1024 to move along the axial direction of the second piston rod 1024 between the first starting position and the first ending position, so as to drive the baffle 1022 to move between the second starting position and the second ending position. The baffle 1022 is used to drive the connecting column 10221 to move along the axial direction of the second piston rod 1024 when moving between the second starting position and the second ending position, and drive the circuit board 10 to be tested placed on the test channel 103 corresponding to the driving position to be electrically connected to the test channel 103 through the connecting column 10221.

[0053] When the drive module 102 drives the circuit board under test 10 placed on the test channel 103 corresponding to the drive position to electrically connect with the test channel 103, the second cylinder 1023 drives the second piston rod 1024. The second piston rod 1024 drives the baffle 1022, which in turn drives the connecting pins 10221. The connecting pins 10221 apply pressure to the circuit board under test 10, thereby electrically connecting the circuit board under test 10 to the test channel 103. The arrangement of the connecting pins 10221 is determined by the shape of the circuit board under test 10, ensuring that when the connecting pins 10221 apply pressure to the circuit board under test 10, they do not apply pressure to the components on the circuit board under test 10.

[0054] In the embodiment of the present application, by providing the connecting pillars 10221 , instead of applying pressure directly to the circuit board 10 under test through the baffle 1022 , components on the circuit board 10 under test can be avoided, thereby protecting the circuit board 10 under test.

[0055] In one possible implementation, the drive module 102 may further include a start sensor 1025 mounted on the second cylinder 1023. The start sensor 1025 is configured to generate an in-position signal when a circuit board 10 to be tested is placed on the test channel 103 to which the drive module 102 has moved, and to generate a stop signal when testing of the circuit board 10 to be tested is complete. The second cylinder 1023 is configured to control the second piston rod 1024 to move from a first starting position to a first end position based on the in-position signal, thereby driving the baffle 1022 to move from a second starting position to a second end position, and to control the second piston rod 1024 to move from the first end position to the first starting position based on the stop signal, thereby driving the baffle 1022 to move from the second end position to the second starting position.

[0056] Since the driving module 102 needs to avoid driving the second piston rod 1024 and other components to move during the movement, and at the same time, it needs to stop applying pressure to the circuit board to be tested 10 after the test is completed, in order to achieve precise control, a start sensor 1025 is also provided in the driving module 102. The start sensor 1025 can be a device such as a magnetic switch. When the driving module 102 moves between the driving positions corresponding to multiple test channels 103, the start sensor 1025 generates a control signal, and the second cylinder 1023 stops working according to the control signal. When the circuit board to be tested 10 is placed on the test channel 103 to which the driving module 102 moves, the start sensor 1025 generates a position signal, and the second cylinder 1023 controls the second piston rod 1024 to move from the first starting position to the first end position according to the position signal. When the second piston rod 1024 is in the first end position, the baffle 1022 moves from the second starting position to the second end position, and the circuit board to be tested 10 is electrically connected to the test channel 103. After the test is completed, the start sensor 1025 generates a termination signal, and the second cylinder 1023 controls the second piston rod 1024 to move from the first end position to the first start position according to the termination signal, and the baffle 1022 moves from the second end position to the second start position. The circuit board 10 to be tested is disconnected from the test channel 103, and the driving module 102 meets the conditions of being driven by the displacement module 101.

[0057] In the embodiment of the present application, by providing the start sensor 1025 , the driving of the circuit board 10 to be tested by the driving module 102 can be further accurately controlled.

[0058] Figure 6 FIG. 1 is a schematic diagram of a circuit board testing system according to an embodiment of the present invention. Figure 6 As shown, the circuit board testing system 200 includes: the circuit board testing device 100 as described in the above embodiment and a feeding device 201. The feeding device 201 is used to place the circuit board 10 to be tested on the test channel included in the circuit board testing device 100 and remove the circuit board 10 to be tested from the test channel after the test is completed.

[0059] In the circuit board testing device 100, multiple test channels are provided. When conducting circuit board testing, first, the feeding device 201, such as a robotic arm, will place the circuit board 10 to be tested on a certain test channel. After placement, the displacement module in the circuit board testing device 100 will drive the driving module in the circuit board testing device 100 to move to the driving position corresponding to the test channel where the circuit board 10 to be tested is placed. The circuit board testing device 100 includes multiple test channels. The driving position corresponding to the test channel can be 10 cm above the test channel, 5 cm above the test channel, etc. After that, when the driving module reaches the driving position, it drives the circuit board 10 to be tested placed on the test channel corresponding to the driving position to be electrically connected to the test channel. At this time, the test channel will generate a test signal and send it to the test host. The test host will analyze the test signal and obtain the test result of the circuit board 10 to be tested. After the feeding device places the circuit board 10 to be tested, while the circuit board testing device 100 is testing the circuit board 10 to be tested, the feeding device will place another circuit board 10 to be tested on another test channel. After the circuit board testing device 100 completes the test of the circuit board 10 to be tested placed for the first time, the above process is repeated to implement the test of another circuit board 10 to be tested.

[0060] It should be noted that the multiple test channels in the circuit board testing device 100 can be arranged in sequence along a straight line, and the distance between the test channels depends on the volume of the driver module and the feeding speed of the feeding device 201. While ensuring the normal operation of the driver module, it is also necessary to ensure that the feeding device 201 completes the operation of placing the circuit board 10 to be tested on the test channel at least once during the process of testing the circuit board 10 to be tested.

[0061] In an embodiment of the present application, multiple test channels are set in the circuit board testing device 100. When a certain test channel is testing the circuit board 10 to be tested, the feeding device 201 can simultaneously place the circuit board 10 to be tested on other test channels, so that after the test is completed, the circuit board testing device 100 can start the next round of testing, thereby reducing the waiting time of the feeding device 201 and improving the test efficiency.

[0062] In one possible implementation, the difference between the time it takes for the circuit board testing device 100 to move from one test channel position to another test channel position and the time it takes for the feeding device 201 to move the circuit board 10 to be tested from the test channel and place another circuit board 10 to be tested in the test channel is less than a preset time threshold.

[0063] For example, the time it takes for the feeding device 201 to move the circuit board 10 to be tested from the test channel and place another circuit board 10 to be tested in the test channel is 50 seconds. Then, the time it takes for the circuit board testing device 100 to move from the position of one test channel to the position of another test channel can be controlled within 40 seconds. The time it takes for the circuit board testing device 100 to move from the position of one test channel to the position of another test channel can be reduced by setting more test channels and reducing the spacing between the test channels.

[0064] In an embodiment of the present application, the time for the feeding device 201 to move the circuit board 10 to be tested from the test channel and place another circuit board 10 to be tested in the test channel is usually a fixed time, and the time for the circuit board testing device 100 to test the circuit board 10 to be tested is usually also a fixed time. Therefore, by setting the time for the circuit board testing device 100 to move from the position of one test channel to the position of another test channel, the efficiency of the circuit board testing can be improved.

[0065] The specific implementation of the circuit board testing device 100 in the circuit board testing system 200 can be found in the corresponding description in the aforementioned circuit board testing device embodiment and will not be repeated here. Those skilled in the art will clearly understand that for the sake of convenience and brevity, the specific operating process of the circuit board testing device 100 described above can be found in the corresponding description in the aforementioned circuit board testing device embodiment and will not be repeated here.

[0066] It should be noted that not all modules in the above structural diagrams are required, and some modules may be omitted according to actual needs. The structures described in the above embodiments can be physical structures or logical structures. That is, some modules may be implemented by the same physical entity, or some modules may be implemented by multiple physical entities, or may be implemented by certain components in multiple independent devices.

[0067] Nouns and pronouns referring to persons in this patent application are not limited to a specific gender.

[0068] In the above embodiments, the hardware module can be implemented mechanically or electrically. For example, a hardware module can include a permanent dedicated circuit or logic (such as a dedicated processor, FPGA or ASIC) to complete the corresponding operation. The hardware module can also include programmable logic or circuits (such as a general-purpose processor or other programmable processors), which can be temporarily set by software to complete the corresponding operation. The specific implementation method (mechanical method, or dedicated permanent circuit, or temporarily set circuit) can be determined based on cost and time considerations.

[0069] The present application has been presented and described in detail above through the accompanying drawings and preferred embodiments. However, the present application is not limited to these disclosed embodiments. Based on the above multiple embodiments, those skilled in the art can know that the code review methods in the above different embodiments can be combined to obtain more embodiments of the present application, and these embodiments are also within the scope of protection of the present application.

Claims

1. A circuit board testing device (100), characterized in that: include: A displacement module (101), a driving module (102) and a plurality of test channels (103); The displacement module (101) is used to drive the driving module (102) to move between driving positions corresponding to the plurality of test channels (103), wherein different test channels (103) among the plurality of test channels (103) correspond to different driving positions; The driving module (102) is used to drive the circuit board (10) to be tested placed on the test channel (103) corresponding to the driving position to be electrically connected to the test channel (103) when moving to the driving position; The test channel (103) is used to generate a test signal after being electrically connected to the circuit board (10) to be tested, and to send the test signal to a test host (20).

2. The circuit board testing device (100) according to claim 1, characterized in that: The test channel (103) comprises: a probe (1031) and a support needle (1032); The probe (1031) is used to electrically connect to an interface on the circuit board (10) to be tested; The support needle (1032) is used to drive the circuit board to be tested (10) after the driving module (102) stops driving the circuit board to be tested (10), so as to disconnect the interface on the circuit board to be tested (10) from the probe (1031).

3. The circuit board testing device (100) according to claim 2, characterized in that: The device further comprises: a first positioning module (104) for limiting the relative position of the circuit board to be tested (10) and the test channel (103) when the feeding device places the circuit board to be tested (10) on the test channel (103), so that the circuit board to be tested (10) is placed above the test channel (103); A second positioning module (105) is used for limiting the relative position of the circuit board to be tested (10) and the test channel (103) when the driving module (102) drives the circuit board to be tested (10) to be electrically connected to the test channel (103), so that the interface of the circuit board to be tested (10) is aligned with the probe (1031).

4. The circuit board testing device (100) according to claim 1, characterized in that: The displacement module (101) comprises: a first piston (1011), a first piston rod (1012), a permanent magnet (1013) and a first cylinder (1014); the first piston (1011) is fixedly connected to the driving module (102); the first piston (1011) is sleeved on the outside of the first piston rod (1012); both ends of the first piston rod (1012) are connected to the first cylinder (1014); and the permanent magnet (1013) is arranged on the inside of the first piston rod (1012); The first cylinder (1014) is used to drive the permanent magnet (1013) to move along the axis of the first piston rod (1012); The permanent magnet (1013) is used to drive the first piston (1011) to move along the axis of the first piston rod (1012); The first piston (1011) is used to drive the driving module (102) to move along the axial direction of the first piston rod (1012), so that the driving module (102) moves between the driving positions corresponding to the multiple test channels (103).

5. The circuit board testing device (100) according to claim 4, characterized in that: The displacement module (101) further includes: a displacement sensor (1015) and a first processor, wherein the displacement sensor (1015) is arranged at one end of the first piston rod (1012); The displacement sensor (1015) is used to obtain a first distance between the first piston (1011) and one end of the first piston rod (1012), and send the first distance to the first processor; The first processor is used to control the first cylinder (1014) in response to the first distance, so that the first cylinder (1014) drives the permanent magnet (1013) to drive the first piston (1011) to move, so that the first piston (1011) drives the driving module (102) to move to a driving position corresponding to the test channel (103).

6. The circuit board testing device (100) according to claim 4, characterized in that: The displacement module (101) further includes: a guide rail (1016) and a slider (1017) cooperating with the guide rail (1016); The axis of the guide rail (1016) is parallel to the axis of the first piston rod (1012); The slider (1017) is fixedly connected to the driving module (102); When the driving module (102) moves along the axial direction of the first piston rod (1012), the sliding block (1017) moves along the axial direction of the guide rail (1016).

7. The circuit board testing device (100) according to claim 1, characterized in that: The driving module (102) comprises: a connecting plate (1021), a baffle (1022), a second cylinder (1023) and a second piston rod (1024); the connecting plate (1021) is fixedly connected to the second cylinder (1023); a first end of the second piston rod (1024) is connected to the second cylinder (1023); a second end of the second piston rod (1024) is fixedly connected to the baffle (1022); and a connecting column (10221) is provided on a surface of the baffle (1022) opposite to the test channel (103); The second cylinder (1023) is used to control the second piston rod (1024) to move along the axis of the second piston rod (1024) between a first starting position and a first ending position, so as to drive the baffle (1022) to move between a second starting position and a second ending position; The baffle (1022) is used to drive the connecting column (10221) to move along the axial direction of the second piston rod (1024) when moving between the second starting position and the second ending position, and to drive the circuit board (100) to be tested placed on the test channel (103) corresponding to the driving position to be electrically connected to the test channel (103) through the connecting column (10221).

8. The circuit board testing device (100) according to claim 7, characterized in that: The driving module (102) further includes: a starting sensor (1025), wherein the starting sensor (1025) is installed on the second cylinder (1023); The start sensor (1025) is used to generate a positioning signal when the circuit board (10) to be tested is placed on the test channel (103) to which the drive module (102) moves, and to generate a termination signal when the test of the circuit board (10) to be tested is completed; The second cylinder (1023) is used to control the second piston rod (1024) to move from the first starting position to the first ending position according to the in-position signal, so as to drive the baffle (1022) to move from the second starting position to the second ending position, and to control the second piston rod (1024) to move from the first ending position to the first starting position according to the stop signal, so as to drive the baffle (1022) to move from the second ending position to the second starting position.

9. A circuit board testing system (200), characterized in that: include: The circuit board testing device (100) and feeding device (201) according to any one of claims 1 to 8; The feeding device (201) is used to place the circuit board (10) to be tested on a test channel (103) included in the circuit board testing device (100), and to remove the circuit board (10) to be tested from the test channel (103) after the test is completed.

10. The circuit board testing system (200) according to claim 9, characterized in that: The difference between the time taken for the circuit board testing device (100) to move from the position of one test channel (103) to the position of another test channel (103) and the time taken for the feeding device (201) to remove the circuit board (10) to be tested from the test channel (103) and place another circuit board (10) to be tested in the test channel (103) is less than a preset time threshold.

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