Valve path system for analyzing trace or trace impurities in various high-purity gases
Through the valve circuit system of four-valve and six-column system, the problem of the inability to detect trace or trace impurities of multiple high-purity gases simultaneously in the prior art is solved, and efficient and low-cost detection of multiple high-purity gases is achieved.
Patent Information
- Application Number
- CN202422369629.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-26
- Publication Date
- 2025-08-12
- Estimated Expiration
- 2034-09-26
AI Technical Summary
The existing high-purity gas trace or trace impurity detection methods cannot meet the detection needs of multiple high-purity gases at the same time. They require multiple instruments or complex system flow path changes, resulting in low analysis efficiency and high cost.
The valve circuit system using a four-valve and six-column system, including a pulse discharge helium ionization detector, separates and detects trace or trace impurities in hydrogen, argon, oxygen, nitrogen and helium through switching of four valves and separation of six columns, simplifies the operation process and reduces the cost of analysis.
Simultaneous detection of trace or trace impurities in five high-purity gases is achieved, with peak area reproducibility ≤1%, and the minimum detection limit is less than 20ppb, which simplifies the operation process and reduces the analysis cost.