Capacitance test system

Abstract

The utility model belongs to the technical field of testing equipment, and particularly discloses a capacitor testing system, which comprises a feeding device, a testing device and a testing device, the correction device comprises a first correction mechanism, a correction conveying mechanism and a second correction mechanism; the first correction mechanism is used for receiving the capacitor conveyed by the feeding device and correcting the capacitor, and the correction conveying mechanism is used for conveying the capacitor in the first correction mechanism to the second correction mechanism; the second correction mechanism comprises at least two correction clamping assemblies and a correction driving assembly; each correction clamping assembly comprises a first clamping piece and a second clamping piece which are oppositely arranged; the at least two correction clamping assemblies are distributed in the first direction. The correction driving assembly is used for driving the first clamping piece and the second clamping piece to get close to each other or get away from each other; the testing device is used for testing the capacitance; and the receiving device is used for receiving the capacitor tested by the testing device. The technical problem that the capacitor test seat and the ox horn capacitor are damaged due to the fact that the pins of the ox horn capacitor collide with the capacitor test seat can be solved.

Description

Technical Field

[0001] The present application belongs to the technical field of testing equipment, and specifically relates to a capacitance testing system. Background Art

[0002] The horn capacitor test includes the steps of calibrating the horn capacitor, testing the horn capacitor, and classifying the horn capacitor. When calibrating the horn capacitor, the existing technology needs to use a camera to collect the pin position information of the horn capacitor, then clamp the horn capacitor and use a motor to control the rotation of the horn capacitor, calibrate the pins of the horn capacitor to a preset position, and then insert the pins of the horn capacitor into the clamping gap on the capacitor test socket. Since the pin position information collected by the camera has a certain error and the rotation angle of the motor also has a certain error, it is easy to cause the pins of some horn capacitors to be difficult to calibrate to the required preset position, which in turn easily causes the pins of the horn capacitor to be unable to be accurately inserted into the clamping gap on the capacitor test socket, causing the pins of the horn capacitor to collide with the capacitor test socket, which is easy to cause damage to the capacitor test socket and the horn capacitor. Utility Model Content

[0003] The purpose of the embodiments of the present application is to provide a capacitor testing system to solve the technical problem in the prior art that the pins of the horn capacitor collide with the capacitor test socket, which easily leads to damage to the capacitor test socket and the horn capacitor.

[0004] To achieve the above-mentioned purpose, an embodiment of the present application provides a capacitor testing system for testing a capacitor, wherein the capacitor includes a first pin and a second pin, and the capacitor testing system includes: a loading device for conveying the capacitor; a correction device, wherein the correction device includes a first correction mechanism, a correction conveying mechanism, and a second correction mechanism; the first correction mechanism is used to receive the capacitor conveyed by the loading device and correct the capacitor, and the correction conveying mechanism is used to convey the capacitor in the first correction mechanism to the second correction mechanism; the second correction mechanism includes at least two correction clamping assemblies and a correction drive assembly, the correction clamping assembly includes a first clamping member and a second clamping member arranged opposite to each other, and a clamping space is provided between the first clamping member and the second clamping member, and the clamping space is used to accommodate the first pin and / or the second pin; at least two correction clamping assemblies are distributed along a first direction so that the first pin and the second pin are distributed along the first direction; the correction drive assembly is used to drive the first clamping member and the second clamping member to approach or move away from each other; a testing device is used to receive the capacitor corrected by the second correction mechanism and test the capacitor; and a receiving device is used to receive the capacitor after being tested by the testing device.

[0005] In some embodiments, the correction mechanism also includes two correction elastic components, which are respectively abutted against the correction drive component and the first clamping member, so that the correction drive component drives the first clamping member to move through the correction elastic component; and / or, the correction elastic component is respectively abutted against the correction drive component and the second clamping member, so that the correction drive component drives the second clamping member to move through the correction elastic component.

[0006] In some embodiments, the correction elastic component includes a first correction elastic member and a second correction elastic member, the first correction elastic member abuts against the correction drive component and the first clamping member respectively, and the second correction elastic member abuts against the correction drive component and the second clamping member respectively.

[0007] In some embodiments, the second correction mechanism also includes a correction base and a correction rotation assembly; the correction drive assembly and the correction clamping assembly are both arranged on the correction base; the correction rotation assembly is connected to the correction base, and the correction rotation assembly is used to drive the correction base to rotate along the correction axis, and the correction axis is perpendicular to the first direction and the arrangement direction of the first clamping member and the second clamping member.

[0008] In some embodiments, the testing device includes: a capacitor test seat, including two conductive components; the two conductive components are respectively used to electrically connect to the first pin and the second pin; a transfer mechanism, used to transport the capacitance corrected by the second correction mechanism to the capacitor test seat; a test seat conveying mechanism, used to carry the capacitor test seat and used to convey the capacitor test seat along the second direction; a testing mechanism, arranged on one side of the transfer mechanism along the second direction, the testing mechanism is used to electrically connect to the conductive components of the capacitor test seat to test the capacitance; a cleaning mechanism, arranged on the side of the test mechanism close to the transfer mechanism along the second direction, the cleaning mechanism is used to clean the conductive components; a detection device, arranged on the side of the transfer mechanism along the second direction away from the test mechanism, the detection device is used to detect the capacitor test seat.

[0009] In some embodiments, the cleaning mechanism includes: a cleaning support assembly; at least one cleaning assembly, the cleaning assembly including a cleaning piece and a cleaning elastic piece, the cleaning piece is movably connected to the cleaning support assembly, the cleaning elastic piece is connected to the cleaning support assembly and the cleaning piece, and the cleaning elastic piece is used to apply elastic force to the cleaning piece so that the cleaning piece is pressed against the conductive assembly.

[0010] In some embodiments, the cleaning support assembly is arranged on one side of the test seat conveying mechanism along a direction perpendicular to the second direction; the cleaning member extends from the cleaning support assembly toward the test seat conveying mechanism and is inclined in the second direction; the cleaning member is bent toward the cleaning support assembly at one end close to the test seat conveying mechanism, and the cleaning member forms a guide portion and a cleaning portion on both sides of its bending line, and the guide portion and the cleaning portion are arranged in sequence along the second direction; the guide portion is used to support the conductive component and moves relative to the cleaning support assembly as the conductive component moves, so that the cleaning portion is supported against the conductive component.

[0011] In some embodiments, the detection device includes: a detection support assembly; a test seat detection mechanism, the test seat detection mechanism includes a continuity detector and two test head assemblies, the two test head assemblies are respectively used to electrically connect to the two conductive components; the positive and negative poles of the continuity detector are respectively electrically connected to the two test head assemblies to detect the continuity of the two conductive components; a detection translation assembly, connected to the detection support assembly; the detection translation assembly is also connected to the two test head assemblies to drive the test head assembly close to or away from the conductive component; two connecting assemblies, the connecting assembly includes a conductive part movably connected to the detection support assembly, the two conductive parts in the two connecting assemblies are electrically connected, and the two conductive parts are respectively used to electrically connect to the two conductive components to conduct the two conductive components.

[0012] In some embodiments, the connecting component further includes two conductive elastic members, which are connected to the detection support component and the conductive member. The conductive elastic members are used to apply elastic force to the conductive member so that the conductive member is pressed against the conductive component.

[0013] In some embodiments, the testing mechanism includes: a test support assembly; at least one test assembly, the test assembly includes two test probes, and the two test probes are respectively used to electrically connect to two conductive components; a reciprocating drive mechanism, the reciprocating drive mechanism includes a swinging mechanism and a power mechanism; the swinging mechanism includes a swinging member, a probe driving assembly and a probe support assembly; the swinging member rotates around a first axis and is arranged on the test support assembly; the probe support assembly includes at least two probe supports slidably connected to the test support assembly, and the probe supports are connected to the test probes; the probe driving assembly includes a driving arm corresponding to the probe supports one by one; one end of the driving arm along its length direction is rotationally connected to the swinging member around a second axis, and the other end of the driving arm is rotationally connected to the probe support member around a third axis, so that when the swinging member swings around the first axis, the probe support member is driven to slide relative to the test support assembly through the driving arm; the first axis, the second axis and the third axis are parallel; the power mechanism is arranged on the test support assembly; the power mechanism is connected to the swinging member, and is used to drive the swinging member to swing back and forth.

[0014] In some embodiments, the swing mechanism includes at least one probe driving assembly and at least one probe supporting assembly; the probe supporting assembly includes two probe supporting members with the same sliding direction, and the two probe supporting members are arranged relative to each other along the sliding direction; the two driving arms in the probe driving assembly are arranged on both sides of the virtual line, the virtual line is parallel to the sliding direction of the probe supporting assembly and passes through the first axis, and the probe driving assembly is used to drive the two probe supporting members in the same probe supporting assembly to move closer to or away from each other.

[0015] In some embodiments, the material receiving device is arranged on a side of the testing mechanism away from the transfer mechanism along the second direction; the material receiving device includes: a first material receiving support; a material picking assembly, used to collect and release the capacitor after the test mechanism is tested; the capacitor includes a pin end and a plane end arranged opposite to each other; a material receiving translation assembly, connected to the material picking assembly and the first material receiving support, the material receiving translation assembly is used to drive the material picking assembly to move back and forth between the first position and the second position along the third direction; a receiving mechanism, arranged on a side of the second position away from the first position along the third direction, the receiving mechanism is used to receive the capacitor; a material receiving adjustment assembly, connected to the first material receiving support and the material receiving translation assembly, the material receiving adjustment assembly is used to adjust the position of the material receiving translation assembly relative to the first material receiving support in the third direction, so that the material picking assembly picks up the capacitor at the first position; a material receiving limit assembly, connected to the first material receiving support; in the process of the material picking assembly moving from the first position to the second position, the material receiving limit assembly is used to hinder the movement of the material picking assembly at the second position, so that the material picking assembly corresponds to the receiving mechanism.

[0016] In some embodiments, the receiving mechanism includes: a good product receiving component for receiving good capacitors; a defective product receiving component for receiving defective capacitors; a defective conveying component for receiving capacitors in the material picking component and conveying them to the defective product receiving component; and a good product conveying component for conveying good capacitors on the defective conveying component to the good product receiving component.

[0017] In some embodiments, the test seat conveying mechanism is used to drive the capacitance test seat to move along a closed loop, and the cleaning mechanism and the detection device are arranged between the material receiving device and the transfer mechanism along the second direction.

[0018] The capacitor testing system provided by the present application has the following beneficial effects: after the first correction mechanism corrects the capacitor, the first and second pins of the capacitor may deviate from the preset positions. The correction conveying mechanism can place the first and second pins that deviate significantly from the preset positions on the clamping assembly, causing such capacitors to fall from the clamping assembly. This can prevent capacitors with significantly deviated first and second pins from the preset positions from being placed into the testing device, thereby reducing the risk of the first and second pins of the capacitor colliding with the capacitor test socket.

[0019] The correction drive assembly can drive the first clamping member and the second clamping member to push the first pin and the second pin in the clamping space, so that the first pin and the second pin can be arranged along the first direction, so that the first pin and the second pin can be placed in the clamping gap opened on the capacitor test socket, thereby reducing the risk of the first pin and the second pin of the capacitor damaging the test socket. In summary, the embodiments of the present application can solve the technical problem that the pins of the horn capacitor collide with the capacitor test socket, which easily causes damage to the capacitor test socket and the horn capacitor. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments or descriptions of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0021] Figure 1 A schematic diagram of a capacitance testing system provided in some embodiments of the present application;

[0022] Figure 2 for Figure 1 Schematic diagram of the center correction device;

[0023] Figure 3 for Figure 2 A schematic diagram of the second correction mechanism in FIG.

[0024] Figure 4 for Figure 3 A partial enlarged view of part B in the middle;

[0025] Figure 5 Schematic diagram of a capacitor with two pins provided in some embodiments of the present application Figure 1 ;

[0026] Figure 6 A schematic diagram of a capacitor with three pins provided for some embodiments of the present application;

[0027] Figure 7 Schematic diagram of a capacitor with two pins provided in some embodiments of the present application Figure 2 ;

[0028] Figure 8 A schematic diagram of a capacitance test socket provided in some embodiments of the present application;

[0029] Figure 9 for Figure 1 A partial enlarged view of part A in the middle;

[0030] Figure 10 A schematic diagram of a cleaning mechanism provided in some embodiments of the present application;

[0031] Figure 11 for Figure 10 A partial enlarged view of the middle E part;

[0032] Figure 12 for Figure 10 Schematic diagram of the connection between the elastic member and the cleaning member;

[0033] Figure 13 A schematic diagram illustrating the relative positions of a cleaning mechanism and a cleaning capacitor test socket provided in some embodiments of the present application;

[0034] Figure 14 A schematic diagram of a detection device provided in some embodiments of the present application;

[0035] Figure 15 for Figure 14 A partial enlarged view of the middle F part;

[0036] Figure 16 A schematic diagram of the exploded state of the first detection support member and the second detection support member provided in some embodiments of the present application;

[0037] Figure 17 A schematic diagram of the connection structure between the test socket conveying mechanism and the swing mechanism provided in some embodiments of the present application;

[0038] Figure 18 for Figure 17 A partial enlarged view of the middle C section;

[0039] Figure 19 Schematic diagram of the reciprocating drive mechanism provided in some embodiments of the present application Figure 1 ;

[0040] Figure 20 for Figure 19 A partial enlarged view of the middle D part;

[0041] Figure 21 Schematic diagram of the reciprocating drive mechanism provided in some embodiments of the present application Figure 2 ;

[0042] Figure 22 A schematic diagram of a material receiving device provided in some embodiments of the present application;

[0043] Figure 23 A schematic diagram of a receiving mechanism provided in some embodiments of the present application;

[0044] Figure 24 A schematic diagram of the state of capacitance collected by a material collecting component provided in some embodiments of the present application;

[0045] Figure 25 A schematic diagram of a laser marking device provided in some embodiments of the present application;

[0046] Figure 26 Schematic diagram of a loading device provided in some embodiments of the present application.

[0047] Among them, the reference numerals in the figures are:

[0048] 100. Capacitance test system;

[0049] 10. Feeding device; 11. Feeding support; 12. Feeding conveyor; 13. Feeding blocking assembly;

[0050] 20. Calibration device; 21. First calibration mechanism; 22. Calibration conveying mechanism; 23. Second calibration mechanism; 231. Calibration clamping assembly; 2311. First clamping member; 2312. Second clamping member; 2313. Clamping space; 2314. Accommodating space; 232. Calibration elastic assembly; 2321. First calibration elastic member; 2322. Second calibration elastic member; 233. Calibration rotating assembly; 234. Calibration guide structure; 235. Calibration support assembly; 2351. Calibration support member; 2352. Calibration insulating member; 236. Calibration axis; 237. Calibration drive assembly; 238. Calibration base;

[0051] 30. Test device; 31. Capacitance test socket; 311. Conductive component; 3111. Conductive clamping structure; 3112. Conductive column; 3113. Clamping gap; 32. Transfer mechanism; 33. Test socket conveying mechanism; 34. Test mechanism; 341. Test support assembly; 342. Test probe; 343. Swing mechanism; 3431. Swing member; 3432. Probe drive assembly; 34321. Drive arm; 3433. Probe support assembly; 34331. Probe support member; 3434. First axis; 3435. Second axis; 3436. Third axis; 3437. Virtual line; 344. Power mechanism; 3441. Swing arm; 3442. Test drive member; 345. Transmission arm; 35. Cleaning mechanism; 351. Cleaning support assembly; 3511. First cleaning support member; 3512. Cleaning guide structure; 3513. Second cleaning support member; 3 514, cleaning positioning member; 352, cleaning assembly; 3521, cleaning member; 35211, cleaning portion; 35212, guide portion; 35213, first bending line; 3522, cleaning elastic member; 353, position adjustment assembly; 36, detection device; 361, detection support assembly; 3611, conductive support structure; 3612, detection support structure; 362, test socket detection mechanism; 3621, test head assembly; 362 11. Detection elastic member; 36212. Conductive probe; 3622. First detection support member; 3623. Second detection support member; 3624. Arc-shaped guide structure; 3625. Detection connector; 3626. Detection axis; 363. Detection translation assembly; 364. Connecting assembly; 3641. Conductive member; 36411. Guide portion; 36412. Connecting portion; 36413. Second bending line; 3642. Conductive elastic member;

[0052] 40. Material receiving device; 41. First material receiving support; 42. Material picking assembly; 43. Material receiving translation assembly; 44. Receiving mechanism; 441. Good product receiving assembly; 442. Bad product receiving assembly; 443. Good product conveying assembly; 4431. Sorting and pushing member; 4432. Receiving and conveying member; 444. Bad product conveying assembly; 45. Material receiving adjustment assembly; 46. Material receiving position limiting assembly; 47. Second material receiving support; 48. Receiving adjustment member; 491. First position; 492. Second position;

[0053] 50. Laser marking device; 51. Laser marking machine; 52. Position adjustment mechanism;

[0054] 200, capacitor; 201, first pin; 202, second pin; 203, main body; 2031, pin end; 2032, plane end. DETAILED DESCRIPTION

[0055] In order to make the technical problems, technical solutions and beneficial effects to be solved by this application more clearly understood, this application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0056] It should be noted that when an element is referred to as being “fixed on” or “disposed on” another element, it may be directly on the other element or indirectly on the other element. When an element is referred to as being “connected to” another element, it may be directly connected to the other element or indirectly connected to the other element.

[0057] It should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on this application.

[0058] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. Throughout the description of this application, "plurality" means two or more, unless otherwise specifically defined.

[0059] An embodiment of the present application provides a capacitor testing system for testing capacitors. The embodiment of the present application is described using the testing of horn capacitors as an example; it can be understood that the capacitor testing system can also test other capacitors.

[0060] Please refer to Figure 5 The capacitor 200 includes a main body 203 and a first pin 201 and a second pin 202 protruding from the main body 203. Figures 1 to 4 The capacitance testing system 100 includes a loading device 10, a correction device 20, a testing device 30 and a receiving device 40; the loading device 10 is used to convey the capacitor 200; the correction device 20 is used to correct the capacitor 200; the testing device 30 is used to receive the capacitor 200 corrected by the correction device 20 and test the capacitor 200; the receiving device 40 is used to receive the capacitor 200 tested by the testing device 30.

[0061] The correction device 20 includes a first correction mechanism 21, a correction conveying mechanism 22, and a second correction mechanism 23. The first correction mechanism 21 is used to receive the capacitor 200 conveyed by the loading device 10 and correct the capacitor 200. The correction conveying mechanism 22 is used to convey the capacitor 200 in the first correction mechanism 21 to the second correction mechanism 23. The second correction mechanism 23 includes at least two correction clamping components 231 and a correction drive component 237. The correction clamping component 231 includes a first clamping member 2311 and a second clamping member 2312 arranged opposite to each other. A clamping space 2313 is provided between the first clamping member 2311 and the second clamping member 2312. The clamping space 2313 is used to accommodate the first pin 201 and / or the second pin 202. The at least two correction clamping components 231 are distributed along the first direction X so that the first pin 201 and the second pin 202 are distributed along the first direction X. The correction drive component 237 is used to drive the first clamping member 2311 and the second clamping member 2312 to move closer to or away from each other.

[0062] Optionally, capacitor 200 is a horn capacitor, and first pin 201 and second pin 202 are respectively the positive and negative electrodes of capacitor 200. Capacitor 200 can also be other capacitors with pins, and first pin 201 and second pin 202 can also be pins other than electrodes, such as pins with supporting or connecting functions.

[0063] It can be understood that the feeding device 10 is used to feed the capacitor 200 to the calibration device 20. Optionally, the feeding device 10 includes a conveying structure such as a conveyor belt.

[0064] The calibration device 20 is used to calibrate the first pin 201 and the second pin 202 of the capacitor 200 to a preset position.

[0065] It can be understood that the testing device 30 is used to test the capacitor 200 after calibration by the calibration device 20. The testing device 30 includes a capacitor test socket 31, which can receive the capacitor 200 and electrically connect to the first pin 201 and the second pin 202 of the capacitor 200.

[0066] The receiving device 40 can remove the tested capacitor 200 from the capacitor test seat 31 .

[0067] The first correction mechanism 21 is used to adjust the position of the first pin 201 and the second pin 202 of the capacitor 200. Optionally, the first correction mechanism 21 includes a pin position detector, a holder, and a rotator. The pin position detector is used to identify the positions of the first pin 201 and the second pin 202. The holder is used to fix the capacitor 200. The rotator is connected to the holder and is used to drive the holder and the capacitor 200 to rotate to correct the position of the capacitor 200. The pin position detector can use a recognition camera, etc., the holder can use a clamping structure such as a clamping cylinder, and the rotator can use a stepping motor or a screw, etc.

[0068] The correction conveying mechanism 22 is used to convey the capacitor 200 corrected by the first correction mechanism 21 to a specific position in the second correction mechanism 23. Optionally, the correction conveying mechanism 22 includes a clamping cylinder and a flipping cylinder. The clamping cylinder includes two opposing V-shaped clamps. When the V-shaped clamps clamp the capacitor 200, the capacitor 200 can be guided to the specific position. The flipping cylinder is connected to the clamping cylinder and is used to drive the clamping cylinder and the capacitor 200 to flip 180 degrees, thereby flipping the capacitor 200 to the specific position on the second correction mechanism 23.

[0069] Each calibration clamping assembly 231 includes a first clamping member 2311 and a second clamping member 2312. The first clamping member 2311 and the second clamping member 2312 are primarily used to clamp the first pin 201 and the second pin 202 of the capacitor 200. The two first clamping members 2311 in the two calibration clamping assemblies 231 can be an integral structure or can be provided separately, and the two second clamping members 2312 can be an integral structure or can be provided separately. Optionally, the first clamping member 2311 and the second clamping member 2312 can be rod-shaped, block-shaped, or plate-shaped structures.

[0070] The first clamping member 2311 and the second clamping member 2312 can be made of an insulating material or a conductive material such as metal. When the two first clamping members 2311 are an integral structure, the first clamping member 2311 is made of an insulating material to prevent the two first clamping members 2311 from connecting the first pin 201 and the second pin 202, causing the capacitor 200 to short-circuit. Similarly, when the two second clamping members 2312 are an integral structure, the two second clamping members 2312 are made of an insulating material. The first clamping member 2311 and the second clamping member 2312 can also be used to support the main body 203 of the capacitor 200. For convenience of description, the arrangement direction of the first clamping member 2311 and the second clamping member 2312 in the same correction clamping assembly 231 is defined as the clamping arrangement direction P.

[0071] A clamping space 2313 is provided between the first clamping member 2311 and the second clamping member 2312 in the same correction clamping assembly 231. Each clamping space 2313 can accommodate the first pin 201 or the second pin 202. The two clamping spaces 2313 can be used to accommodate the first pin 201 and the second pin 202, respectively, that is, the two correction clamping assemblies 231 are used to clamp the first pin 201 and the second pin 202, respectively. For a capacitor 200 with a small distance between the first pin 201 and the second pin 202, one clamping space 2313 can also be used to accommodate the first pin 201 and the second pin 202, that is, one correction clamping assembly 231 can be used to clamp the first pin 201 and the second pin 202. Optionally, the clamping space 2313 can also accommodate other pins on the capacitor 200 that are located on the same straight line as the first pin 201 and the second pin 202.

[0072] Optionally, two correction clamping assemblies 231 are provided.

[0073] The two correction clamping assemblies 231 are distributed along the first direction X, that is, the two first clamping members 2311 in the two correction clamping assemblies 231 are distributed along the first direction X, and the two second clamping members 2312 are distributed along the first direction X. Optionally, the first direction X is perpendicular to the height direction of the correction clamping assemblies 231 .

[0074] Optionally, the number of the correction clamping components 231 may be more than two to clamp pins other than the first pin 201 and the second pin 202 .

[0075] The correction drive assembly 237 can directly drive the first clamping member 2311 and the second clamping member 2312, or can indirectly drive the first clamping member 2311 and the second clamping member 2312 through an elastic member, etc. When the correction drive assembly 237 directly drives the first clamping member 2311 and the second clamping member 2312, the force applied by the correction drive assembly 237 to the first clamping member 2311 and the second clamping member 2312 can only push the first pin 201 and the second pin 202 through the first clamping member 2311 and the second clamping member 2312, and cannot cause the first clamping member 2311 and the second clamping member 2312 to squeeze the first pin 201 and the second pin 202, thereby causing the first pin 201 and the second pin 202 to deform.

[0076] The correction drive assembly 237 can be provided with a driving member to drive the first clamping member 2311 and the second clamping member 2312, or a plurality of driving members can be provided to respectively drive each first clamping member 2311 and each second clamping member 2312. Optionally, the correction drive assembly 237 can include structures such as a clamping cylinder, a forward and reverse screw or four cylinders. For example, when the correction drive assembly 237 includes a clamping cylinder, one clamping jaw of the clamping cylinder is connected to the two first clamping members 2311, and the other clamping jaw is connected to the two second clamping members 2312. For example, when the correction drive assembly 237 includes four cylinders, two of the cylinders respectively drive the two first clamping members 2311, and the other two cylinders respectively drive the two second clamping members 2312.

[0077] The working process of the embodiment of the present application is: the capacitor 200 is placed on the loading device 10, the loading device 10 conveys the capacitor 200 to the correction device 20, the correction device 20 corrects the first pin 201 and the second pin 202 of the capacitor 200 to a preset position, and then the corrected capacitor 200 is conveyed to the testing device 30, the testing device 30 tests the capacitor 200 and records the test results of each capacitor 200; the receiving device 40 receives the tested capacitor 200 and stores or further processes the capacitor 200.

[0078] Optionally, the process of the correction device 20 correcting the capacitor 200 is as follows: the pin position detector identifies the positions of the first pin 201 and the second pin 202, then the fixer fixes the capacitor 200, and the rotator drives the fixer and the capacitor 200 to rotate around the center line (the axis of the capacitor 200), so that the first pin 201 and the second pin 202 are rotated to a preset position.

[0079] The clamping cylinder of the correction conveyor mechanism 22 then grips capacitor 200 and guides it to a specific position. The flipping cylinder of the correction conveyor mechanism 22 then rotates the clamping cylinder and capacitor 200 180°, so that the pins of capacitor 200 face downward. Capacitor 200 is then placed on the correction clamping assembly 231, aligning the centerline of capacitor 200 with the center of the assembly formed by the two correction clamping assemblies 231.

[0080] When placing the capacitor 200 on the second calibration mechanism 23, the positions of the first pin 201 and the second pin 202 relative to the center line of the capacitor 200 are uncertain. If the first pin 201 or the second pin 202 is placed on the first clamping member 2311 or the second clamping member 2312, the main body 203 of the capacitor 200 cannot be stably placed on the calibration clamping component 231, and the capacitor 200 will fall from the second calibration mechanism 23.

[0081] If the first pin 201 and the second pin 202 are placed in the clamping space 2313, the body 203 of the capacitor 200 can remain stable on the calibration clamping assembly 231. After the capacitor 200 is placed, the calibration drive assembly 237 drives the first clamping member 2311 and the second clamping member 2312 toward each other, and the two sets of first clamping members 2311 and second clamping members 2312 push the first pin 201 and the second pin 202 to move. For a capacitor 200 in which the first pin 201 and the second pin 202 are symmetrical about the center line (axis) of the capacitor 200, the center line of the capacitor 200 is aligned with the center position of the whole composed of the two correction clamping components 231 and the capacitor 200 is placed. Then, the first pin 201 and the second pin 202 are symmetrical about the center position of the whole composed of the two correction clamping components 231. The first pin 201 and the second pin 202 are located on both sides of the center position along the clamping arrangement direction P. The two correction clamping components 231 push the first pin 201 and the second pin 202 to move in opposite directions, so that the first pin 201 and the second pin 202 can drive the capacitor 200 to rotate around the center line; when the first pin 201 and the second pin 202 move to the middle position of the clamping space 2313, the first pin 201 and the second pin 202 are located on the same straight line along the first direction X, and the correction is completed.

[0082] The beneficial effects of the embodiments of the present application are as follows: after the first correction mechanism 21 corrects the capacitor 200, the first pin 201 and the second pin 202 of the capacitor 200 may deviate from the preset position. The correction conveying mechanism 22 can place the first pin 201 and the second pin 202 that have a large deviation from the preset position on the correction clamping assembly 231, so that such capacitors 200 fall from the correction clamping assembly 231, thereby preventing capacitors 200 with a large position deviation of the first pin 201 and the second pin 202 from being placed into the test device 30, and reducing the risk of the first pin 201 and the second pin 202 of the capacitor 200 colliding with the capacitor test socket 31.

[0083] The correction drive assembly 237 can drive the first clamping member 2311 and the second clamping member 2312 to push the first pin 201 and the second pin 202 in the clamping space 2313, so that the first pin 201 and the second pin 202 can be arranged along the first direction X, so that the first pin 201 and the second pin 202 can be placed in the clamping gap 3113 opened on the capacitor test socket 31, thereby reducing the risk of the first pin 201 and the second pin 202 of the capacitor 200 damaging the test socket. In summary, the embodiments of the present application can solve the technical problem that the pins of the horn capacitor collide with the capacitor test socket 31, which easily causes damage to the capacitor test socket 31 and the horn capacitor.

[0084] In some embodiments, please refer to Figure 3 and Figure 4 The second correction mechanism 23 also includes two correction elastic components 232, which are respectively in contact with the correction drive component 237 and the first clamping member 2311, so that the correction drive component 237 drives the first clamping member 2311 to move through the correction elastic component 232; and / or, the correction elastic component 232 is respectively in contact with the correction drive component 237 and the second clamping member 2312, so that the correction drive component 237 drives the second clamping member 2312 to move through the correction elastic component 232.

[0085] The correction elastic component 232 is disposed between the correction drive component 237 and the correction clamping component 231. The correction drive component 237 pushes the correction elastic component 232 toward the first pin 201 and the second pin 202, causing the correction elastic component 232 to push the correction clamping component 231 toward the first pin 201 and the second pin 202. The force exerted by the correction elastic component 232 on the first clamping member 2311 and the second clamping member 2312 only causes the first clamping member 2311 and the second clamping member 2312 to push the first pin 201 and the second pin 202, causing the first pin 201 and the second pin 202 to move the capacitor 200, but does not cause the first pin 201 and the second pin 202 to deform. By designing a smaller elastic coefficient, the correction elastic component 232 can be controlled to exert a smaller elastic force on the correction clamping component 231.

[0086] The correction elastic component 232 includes an elastic member, which can be arranged between the correction drive component 237 and the first clamping member 2311, or between the correction drive component 237 and the second clamping member 2312, or part of the elastic member in the correction elastic component 232 is arranged between the correction drive component 237 and the first clamping member 2311, and another part of the elastic member is arranged between the correction drive component 237 and the second clamping member 2312.

[0087] Optionally, the correction elastic component 232 is fixedly connected to the correction driving component 237 and the correction clamping component 231 respectively, and the correction driving component 237 can drive the correction clamping component 231 away from the first pin 201 and the second pin 202 through the correction elastic component 232.

[0088] When the correction elastic component 232 contacts or abuts the correction drive component 237 and the correction clamping component 231, but is not connected to the correction drive component 237 and the correction clamping component 231, the correction drive component 237 cannot drive the first clamping member 2311 and the second clamping member 2312 away from the first pin 201 and the second pin 202 through the correction elastic component 232. At this time, the correction drive component 237 can also be connected to the first clamping member 2311 and the second clamping member 2312 through other structures such as a soft rope, thereby being able to drive the first clamping member 2311 and the second clamping member 2312 away from the first pin 201 and the second pin 202.

[0089] Optionally, the correction elastic component 232 may include elastic parts such as a spring and a pneumatic telescopic rod.

[0090] In the embodiment of the present application, the process of clamping the first pin 201 and the second pin 202 is as follows: the two correction clamping components 231 respectively push the first pin 201 and the second pin 202 to move in opposite directions, thereby causing the capacitor 200 to rotate; after the correction clamping component 231 clamps the first pin 201 and the second pin 202, the correction clamping component 231 both abuts against the first pin 201 and the second pin 202, and the correction driving component 237 continues to operate, which will cause the correction elastic component 232 to be compressed and deformed, and the elastic force applied by the correction elastic component 232 to the correction clamping component 231 increases, and the force applied by the correction clamping component 231 to the first pin 201 and the second pin 202 increases. Because the elastic force applied by the correction elastic component 232 to the correction clamping component 231 is small, the force applied by the correction clamping component 231 to the first pin 201 and the second pin 202 is small, and it is not easy to deform the first pin 201 and the second pin 202.

[0091] The beneficial effects of the embodiment of the present application are as follows: the correction drive component 237 drives the correction clamping component 231 to move through the correction elastic component 232, and the force of the correction drive component 237 cannot directly act on the first pin 201 and the second pin 202. The correction drive component 237 controls the elastic force of the correction elastic component 232 by controlling the deformation of the correction elastic component 232, thereby controlling the clamping force; the elastic force of the correction elastic component 232 is conveniently controlled within a smaller range, and the clamping force of the correction clamping component 231 is conveniently controlled by controlling the elastic force of the correction elastic component 232, thereby conveniently controlling the first clamping member 2311 and the second clamping member 2312 to only push the first pin 201 and the second pin 202, and cannot cause the pins to be deformed.

[0092] In some embodiments, please refer to Figure 3 and Figure 4 The correction elastic component 232 includes a first correction elastic member 2321 and a second correction elastic member 2322. The first correction elastic member 2321 abuts against the correction drive component 237 and the first clamping member 2311 respectively, and the second correction elastic member 2322 abuts against the correction drive component 237 and the second clamping member 2312 respectively.

[0093] The first and second alignment elastic members 2321 and 2322 may be arranged in various ways.

[0094] For example, the correction elastic component 232 includes a first correction elastic member 2321 and a second correction elastic member 2322. The first correction elastic member 2321 abuts against the two first clamping members 2311 to push the two first clamping members 2311 to move synchronously; the second correction elastic member 2322 abuts against the two second clamping members 2312 to push the two second clamping members 2312 to move synchronously.

[0095] For example, the correction elastic assembly 232 includes two first correction elastic members 2321 and two second correction elastic members 2322. The two first correction elastic members 2321 respectively abut against the two first clamping members 2311, and each first correction elastic member 2321 pushes each first clamping member 2311 to move independently. The two second correction elastic members 2322 respectively abut against the two second clamping members 2312, and each second correction elastic member 2322 pushes each second clamping member 2312 to move independently.

[0096] The first pin 201 and the second pin 202 of different capacitors 200 have different distribution forms. Please refer to Figure 7, the first pin 201 and the second pin 202 are perpendicular to each other; when the first pin 201 and the second pin 202 are pushed to the middle position of the clamping space 2313, the sizes of the first pin 201 and the second pin 202 in the clamping arrangement direction P are different. If the two first clamping members 2311 move synchronously and the two second clamping members 2312 move synchronously, only one of the first pin 201 and the second pin 202 will be clamped, and both pins cannot be clamped, and the clamping of the first pin 201 and the second pin 202 is not stable enough.

[0097] The two first correction elastic members 2321 push the two first clamping members 2311 of the two correction clamping assemblies 231 to move separately, and the two second correction elastic members 2322 push the two second clamping members 2312 of the two correction clamping assemblies 231 to move separately. Then, before the two correction clamping assemblies 231 clamp the first pin 201 and the second pin 202, the two first correction elastic members 2321 push the two first clamping members 2311 to move synchronously, and the two second correction elastic members 2322 push the two second clamping members 2312 to move synchronously. After the first correction clamping assembly 231 clamps the first pin 201 with a larger size in the clamping arrangement direction P, the first clamping member 2311 and the second clamping member 2312 in the first correction clamping assembly 231 stop moving; at this time, the first clamping member 2311 and the second clamping member 2312 in the second correction clamping assembly 231 can also be pushed by the first correction elastic member 2321 and the second correction elastic member 2322 until the first clamping member 2311 and the second clamping member 2312 in the second correction clamping assembly 231 respectively abut against the second pin 202 with a smaller size in the clamping arrangement direction P, and the first clamping member 2311 and the second clamping member 2312 in the second correction clamping assembly 231 stop moving.

[0098] The beneficial effects of the embodiment of the present application are as follows: the provision of the first correction elastic member 2321 and the second correction elastic member 2322 facilitates control of the elastic force on the first clamping member 2311 and the second clamping member 2312, thereby facilitating control of the clamping force of the correction clamping assembly 231. The two first correction elastic members 2321 and the two second correction elastic members 2322 can respectively push the first clamping member 2311 and the second clamping member 2312 to move independently. In the clamping arrangement direction P, the two first clamping members 2311 can move to different positions according to the size of the pins and abut against the first pin 201 or the second pin 202. The two second clamping members 2312 can move to different positions according to the size of the pins and abut against the first pin 201 or the second pin 202. This allows the first clamping member 2311 and the second clamping member 2312 to stably abut against both sides of the first pin 201 or the second pin 202, thereby stably clamping the first pin 201 and the second pin 202.

[0099] In some embodiments, please refer to Figure 3 and Figure 4 The second correction mechanism 23 also includes a correction base 238 and a correction rotation assembly 233; the correction drive assembly 237 and the correction clamping assembly 231 are both arranged on the correction base 238; the correction rotation assembly 233 is connected to the correction base 238, and the correction rotation assembly 233 is used to drive the correction base 238 to rotate along the correction axis 236, and the correction axis 236 is perpendicular to the first direction X and the arrangement direction of the first clamping member 2311 and the second clamping member 2312.

[0100] The correction base 238 is used to support the correction drive assembly 237 and the correction clamping assembly 231 .

[0101] The correction rotation assembly 233 can drive the correction base 238 to rotate, thereby driving the correction drive assembly 237 and the correction clamping assembly 231 on the correction base 238 to rotate. Optionally, the correction rotation assembly 233 includes an angle adjuster, a bolt, or a stepping motor.

[0102] For ease of description, a correction reference direction V is defined as perpendicular to the correction axis 236. The correction reference direction V forms an angle with the first direction X, and the correction reference direction V is fixed. With the correction reference direction V as a reference, initially, the clamping arrangement direction P is parallel to the correction reference direction V. At this time, the size of the clamping space 2313 in the correction reference direction V is minimized. As the correction rotation assembly 233 drives the correction clamping assembly 231 to rotate, the clamping arrangement direction P changes, forming an angle with the correction reference direction V. At this time, the size of the clamping space 2313 in the correction reference direction V increases to accommodate the first pin 201 and the second pin 202, which are larger in the correction reference direction V. As the correction rotation assembly 233 drives the correction clamping assembly 231 to rotate, the size of the clamping space 2313 in the correction reference direction V changes.

[0103] The beneficial effects of the embodiments of the present application are: for the first pin 201 and the second pin 202 that are larger in size in the correction reference direction V, when the size of the whole composed of the first pin 201 and the second pin 202 in the correction reference direction P is larger than the size of the clamping space 2313 in the clamping arrangement direction P, using the correction rotation component 233 to drive the correction clamping component 231 to rotate can increase the size of the clamping space 2313 in the correction reference direction V, so that the first pin 201 and the second pin 202 are easier to be placed in the clamping space 2313; using the correction rotation component 233 to drive the correction clamping component 231 to rotate different angles can change the size of the clamping space 2313 in the correction reference direction V, and can be suitable for first pins 201 and second pins 202 of different sizes.

[0104] In some embodiments, please refer to Figure 3 and Figure 4 The first clamping member 2311 and / or the second clamping member 2312 is provided with an accommodating space 2314 on one side away from the clamping space 2313 along the clamping arrangement direction P, and the accommodating space 2314 is used to accommodate one or more of the other pins on the capacitor 200 except the first pin 201 and the second pin 202.

[0105] The first clamping member 2311 is provided with an accommodating space 2314 on a side away from the clamping space 2313 along the clamping arrangement direction P; alternatively, the second clamping member 2312 is provided with an accommodating space 2314 on a side away from the clamping space 2313 along the clamping arrangement direction P; alternatively, both the first clamping member 2311 and the second clamping member 2312 are provided with an accommodating space 2314 on a side away from the clamping space 2313 along the clamping arrangement direction P. The accommodating space 2314 may be a groove, a notch, or the like.

[0106] Please refer to Figure 6 , other pins refer to pins on the capacitor 200 that do not need to be corrected, and the other pins are not in the arrangement direction of the first pin 201 and the second pin 202. Optionally, the other pins are pins used to support the fixed capacitor 200 and are not connected to the positive or negative pole of the capacitor 200. Optionally, the size of the first clamping member 2311 and the second clamping member 2312 in the clamping arrangement direction P is smaller than the distance between the first pin 201 and the other adjacent pins, and smaller than the distance between the second pin 202 and the other adjacent pins, so that when the first pin 201 and the second pin 202 are located in the clamping space 2313, the other pins are located on the side of the first clamping member 2311 or the second clamping member 2312 away from the clamping space 2313 and are located in the accommodating space 2314. Optionally, the size of the first clamping member 2311 and the second clamping member 2312 in the clamping arrangement direction P is less than 10 mm.

[0107] Optionally, when the capacitor 200 has more than two pins, the clamping space 2313 can only accommodate the first pin 201 and the second pin 202 , and cannot accommodate other pins that are not in the arrangement direction of the first pin 201 and the second pin 202 .

[0108] The beneficial effects of the embodiment of the present application are: setting the accommodating space 2314 to accommodate other pins besides the first pin 201 and the second pin 202, reducing the risk of other pins being placed on the correction clamping component 231, and reducing the situation of the capacitor 200 falling from the correction clamping component 231.

[0109] In some embodiments, please refer to Figure 3 and Figure 4The second correction mechanism 23 further includes a correction guide structure 234 connected to the correction clamping assembly 231. The correction guide structure 234 is used to guide the correction clamping assembly 231 to move along the deformation direction of the correction elastic assembly 232. The correction guide structure 234 can also guide the correction elastic assembly 232 to deform along the length direction of the correction guide structure 234.

[0110] Optionally, the correction guide structure 234 includes a plurality of guide rods extending along the clamping arrangement direction P. The guide rods are slidably connected to the correction drive assembly 237 and fixedly connected to the first clamping member 2311 or the second clamping member 2312. The correction guide structure 234 may also be a guide groove or other structure. Optionally, the correction elastic assembly 232 includes a spring mounted on the guide rods, which is capable of deforming along the length of the guide rods.

[0111] The beneficial effects of the embodiments of the present application are as follows: setting the correction guide structure 234 can guide the correction clamping component 231 to move along its length direction, so that the correction clamping component 231 can move stably, and the correction guide structure 234 can also guide the correction elastic component 232 to deform along the length direction of the correction guide structure 234, so that the elastic force of the correction elastic component 232 is consistent with the moving direction of the correction clamping component 231, so that the correction elastic component 232 can stably push the correction clamping component 231 to move.

[0112] In some embodiments, please refer to Figure 3 and Figure 4 The second correction mechanism 23 further includes a correction support component 235 , which is used to support the main body 203 of the capacitor 200 .

[0113] The correction support component 235 can be set at the same height as the correction clamping component 231, and jointly support the main body 203 of the capacitor 200 with the correction clamping component 231; or, the correction support component 235 is at least partially higher than the correction clamping component 231, and the height difference is h, and the correction support component 235 can independently support the main body 203 of the capacitor 200, separating the main body 203 of the capacitor 200 from the correction clamping component 231 in the height direction.

[0114] Optionally, the correction support assembly 235 includes at least two correction support members 2351, each correction support member 2351 is respectively arranged on both sides of the whole formed by the correction clamping assembly 231 along the first direction X, and the correction support member 2351 is an insulating structural member including insulating materials such as polyformaldehyde or ceramics.

[0115] Optionally, the correction support assembly 235 also includes a correction insulating member 2352 arranged between each correction clamping assembly 231 to separate each correction clamping assembly 231, thereby isolating the two correction clamping assemblies 231, thereby reducing the risk of the two correction clamping assemblies 231 connecting the first pin 201 and the second pin 202.

[0116] The two correction supports 2351 and the correction insulator 2352 can be provided separately or as an integrated structure. Optionally, a connecting plate is connected to the bottom ends of the correction supports 2351 and the correction insulator 2352. The correction supports 2351, the correction insulator 2352, and the connecting plate are integrally formed. The top ends of the correction supports 2351 and the correction insulator 2352 are located at the same height and jointly support the main body 203 of the capacitor 200. Optionally, each correction support 2351 forms a groove with the correction insulator 2352 and the connecting plate, and the correction clamping assembly 231 is slidably disposed within the groove.

[0117] The beneficial effects of the embodiment of the present application are as follows: the correction support assembly 235 is provided to support the main body 203 of the capacitor 200, and the correction support assembly 235 and the correction clamping assembly 231 jointly support the main body 203 of the capacitor 200, which can increase the contact area between the second correction mechanism 23 and the main body 203 of the capacitor 200, making the capacitor 200 more stable on the second correction mechanism 23. The correction support assembly 235 is made of an insulating material, which can reduce the risk of the correction support 2351 connecting the first pin 201 and the second pin 202 through the correction clamping assembly 231. The correction support assembly 235 separates the main body 203 of the capacitor 200 from the correction clamping assembly 231, so that the main body 203 of the capacitor 200 does not contact the correction clamping assembly 231, which can reduce the impact of the movement of the correction clamping assembly 231 on the capacitor 200, making the capacitor 200 more stable on the second correction mechanism 23.

[0118] In some embodiments, please refer to Figure 1 、 Figure 8 and Figure 9The testing device 30 includes a capacitor test seat 31, a transfer mechanism 32, a test seat conveying mechanism 33, a testing mechanism 34, a cleaning mechanism 35 and a detection device 36; the capacitor test seat 31 includes two conductive components 311; the two conductive components 311 are respectively used to electrically connect to the first pin 201 and the second pin 202; the transfer mechanism 32 is used to convey the capacitor 200 corrected by the second correction mechanism 23 to the capacitor test seat 31; the test seat conveying mechanism 33 is used to carry the capacitor test seat 31 and to convey the capacitor test seat 31 along the second direction Y; the testing mechanism 34 is provided on one side of the transfer mechanism 32 along the second direction Y, and the testing mechanism 34 is used to electrically connect to the conductive component 311 of the capacitor test seat 31 to test the capacitor 200; the cleaning mechanism 35 is provided on a side of the testing mechanism 34 close to the transfer mechanism 32 along the second direction Y, and the cleaning mechanism 35 is used to clean the conductive component 311; the detection device 36 is provided on a side of the transfer mechanism 32 along the second direction Y away from the testing mechanism 34, and the detection device 36 is used to detect the capacitor test seat 31.

[0119] Optionally, the capacitor test socket 31 is used to fix the capacitor 200 . The capacitor test socket 31 includes an insulating structure provided between two conductive components 311 to prevent the two conductive components 311 from being directly connected in the capacitor test socket 31 .

[0120] Optionally, each conductive component 311 includes a conductive clamping structure 3111 and a conductive post 3112. The two conductive clamping structures 3111 are respectively used to clamp and fix the first pin 201 and the second pin 202 and electrically connect them to the first pin 201 and the second pin 202. The clamping structure includes a fixed conductive sheet and a movable conductive sheet, with a clamping gap 3113 between the fixed conductive sheet and the movable conductive sheet. The conductive post 3112 is electrically connected to the conductive clamping structure 3111, so that the conductive post 3112 is electrically connected to the first pin 201 or the second pin 202.

[0121] The transfer mechanism 32 is used to transport the capacitor to a specific position on the capacitor test seat 31, so that the first pin 201 and the second pin 202 are connected to the two conductive components 311. Optionally, the transfer mechanism 32 is used to transport the first pin 201 and the second pin 202 of the capacitor 200 to the two clamping gaps 3113. Optionally, the transfer mechanism 32 includes a transfer support and a translation mechanism connected to the transfer support, and also includes a lifting mechanism connected to the translation mechanism. The translation mechanism drives the lifting mechanism to move along the arrangement direction of the second correction mechanism 23 and the test seat conveying mechanism 33, and the lifting mechanism drives the capacitor 200 to move along the height direction of the capacitor test seat 31 and the second correction mechanism 23; the lifting mechanism can be connected to a clamping cylinder to fix or release the capacitor 200 by the clamping cylinder; both the lifting mechanism and the translation mechanism can use cylinders.

[0122] Optionally, the test seat conveying mechanism 33 includes a chain, a synchronous belt, or a linear motor.

[0123] It is understood that the testing mechanism 34 is disposed on one side of the transfer mechanism 32 along the moving direction of the capacitor test seat 31. The testing mechanism 34 can be electrically connected to the first pin 201 and the second pin 202 by connecting to the conductive component 311 to test the capacitor 200.

[0124] It can be understood that in the second direction Y, the cleaning mechanism 35 can be arranged between the testing mechanism 34 and the transfer mechanism 32 , or the cleaning mechanism 35 can be arranged on a side of the transfer mechanism 32 away from the testing mechanism 34 .

[0125] The detection device 36 is used to detect the capacitor test seat 31 before the transfer mechanism 32 transfers the capacitor 200 to the capacitor test seat 31 .

[0126] Optionally, the testing device 30 further includes a pressing mechanism, which may include a pneumatic cylinder or an electric push rod. The pressing mechanism is disposed between the transfer mechanism 32 and the testing mechanism 34 along the second direction Y and above the test socket conveying mechanism 33. The pressing mechanism is configured to push the capacitor 200 on the capacitor test socket 31 to ensure a stable connection between the capacitor 200 and the capacitor test socket 31.

[0127] The process of testing the capacitor 200 in the embodiment of the present application is as follows: the test socket conveying mechanism 33 conveys the capacitor test socket 31 to the detection device 36; the detection device 36 detects the capacitor test socket 31 and determines the function of the capacitor test socket 31. If the capacitor test socket 31 is not functioning properly, the capacitor test socket 31 is replaced; if the capacitor test socket 31 is functioning properly, the test socket conveying mechanism 33 continues to convey the capacitor test socket 31 to the transfer mechanism 32 and stops. The transfer mechanism 32 conveys the capacitor 200 on the second correction mechanism 23 to the capacitor test socket 31 and then separates the capacitor 200. After the capacitor test socket 31 fixes the capacitor 200, the test socket conveying mechanism 33 continues to convey the capacitor test socket 31 to the testing mechanism 34; the testing mechanism 34 is connected to the conductive component 311 and electrically connected to the first pin 201 and the second pin 202 through the conductive component 311 to test the capacitor 200. When the test socket conveying mechanism 33 conveys the capacitor test socket 31 to the cleaning mechanism 35, the cleaning mechanism 35 cleans the conductive component 311.

[0128] The beneficial effects of the embodiment of the present application are as follows: the cleaning mechanism 35 is disposed on the side of the testing mechanism 34 that is closer to the transfer mechanism 32 along the second direction Y, and is capable of cleaning the conductive component 311 before testing the capacitor 200. This can reduce the impact of patina and impurities on the conductive component 311 on the connection between the conductive component 311 and the testing mechanism 34, thereby providing more accurate test results. The detection device 36 is disposed on the side of the transfer mechanism 32 that is farther from the testing mechanism 34 along the second direction Y, and is capable of detecting the functionality of the capacitor test socket 31 before transferring the capacitor 200 to the capacitor test socket 31. This can reduce the impact of malfunctioning capacitor test socket 31 on the test results, thereby providing more accurate test results.

[0129] In some embodiments, please refer to Figures 10 to 13 The cleaning mechanism 35 includes a cleaning support assembly 351 and at least one cleaning assembly 352; the cleaning assembly 352 includes a cleaning member 3521 and a cleaning elastic member 3522, the cleaning member 3521 is movably connected to the cleaning support assembly 351, the cleaning elastic member 3522 is connected to the cleaning support assembly 351 and the cleaning member 3521, and the cleaning elastic member 3522 is used to apply elastic force to the cleaning member 3521 so that the cleaning member 3521 is pressed against the conductive assembly 311.

[0130] The cleaning support assembly 351 is used to support the cleaning assembly 352 .

[0131] It is understood that one cleaning assembly 352 may be provided, or multiple cleaning assemblies 352 may be provided along the second direction Y. Accordingly, one or more cleaning support assemblies 351 may be provided. One cleaning assembly 352 may be provided on one cleaning support assembly 351, or two or more cleaning assemblies 352 may be provided on one cleaning support assembly 351. Optionally, at least two cleaning assemblies 352 may be provided opposite each other along a direction perpendicular to the second direction Y to clean the two conductive structures on the capacitance test socket 31.

[0132] The cleaning member 3521 can be rotatably connected to the cleaning support assembly 351 or can be slidably connected. Optionally, the cleaning member 3521 can press against the conductive pillar 3112 of the conductive assembly 311 to clean impurities on the conductive pillar 3112.

[0133] The cleaning elastic member 3522 is connected to the cleaning support assembly 351 and the cleaning member 3521 to apply elastic force to both the cleaning support assembly 351 and the cleaning member 3521. Since the cleaning member 3521 is movably connected to the cleaning support assembly 351, the cleaning member 3521 can move relative to the cleaning support assembly 351 under the action of the elastic force.

[0134] The direction of the elastic force exerted by the cleaning elastic member 3522 on the cleaning member 3521 is toward the test workpiece, so that the cleaning member 3521 tends to move toward the test workpiece, so that the cleaning member 3521 can be pressed against the capacitor test seat 31; when the cleaning elastic member 3522 is subjected to the external force transmitted by the cleaning member 3521, it can be deformed and thereby drive the cleaning member 3521 to move. When the external force is removed, the cleaning elastic member 3522 can recover and drive the cleaning member 3521 to reset. The cleaning elastic member 3522 is subjected to different external forces and produces different deformations, driving the cleaning member 3521 to move to different positions.

[0135] It is understood that the cleaning elastic member 3522 can be a spring or an elastic telescopic rod. When the cleaning elastic member 3522 is a spring, the spring only provides elastic force and does not restrict the movement direction of the cleaning member 3521. When the cleaning elastic member 3522 is an elastic telescopic rod, the ends of the elastic telescopic rod along the length direction can be fixedly connected to the cleaning support assembly 351 and the cleaning member 3521, respectively, so that the cleaning member 3521 can only move in the extension direction of the elastic telescopic rod. The ends of the elastic telescopic rod can also be rotatably connected to the cleaning support assembly 351 and the cleaning member 3521, respectively, without restricting the movement direction of the cleaning member 3521.

[0136] When the cleaning member 3521 presses against the capacitor test socket 31 , the capacitor test socket 31 moves relative to the cleaning member 3521 and generates friction between the cleaning member 3521 and the cleaning member 3521 . The cleaning member 3521 cleans the capacitor test socket 31 through the friction.

[0137] The beneficial effects of the present application are: the present application applies elastic force to the cleaning member 3521 through the cleaning elastic member 3522, so that the cleaning member 3521 can be pressed against the capacitor test seat 31, and when the capacitor test seat 31 moves, the friction between the cleaning member 3521 and the capacitor test seat 31 can remove impurities on the capacitor test seat 31; compared with the fixed setting of the cleaning member 3521, the cleaning member 3521 is movably connected to the capacitor test seat 31, so that the cleaning member 3521 can move when subjected to the force applied by the capacitor test seat 31, reducing the risk of damage caused by interference between the cleaning member 3521 and the capacitor test seat 31; when the force applied by the capacitor test seat 31 is eliminated, the cleaning member 3521 can be reset under the elastic force of the cleaning elastic member 3522, and can work stably.

[0138] In some embodiments, please refer to Figures 10 to 13The cleaning support assembly 351 is arranged on one side of the test seat conveying mechanism 33 in a direction perpendicular to the second direction Y; the cleaning member 3521 extends from the cleaning support assembly 351 to the test seat conveying mechanism 33 and is inclined in the second direction Y; the end of the cleaning member 3521 close to the test seat conveying mechanism 33 is bent in the direction close to the cleaning support assembly 351, and the cleaning member 3521 forms a guide portion 35212 and a cleaning portion 35211 on both sides of the bending line of the cleaning member 3521, and the guide portion 35212 and the cleaning portion 35211 are arranged in sequence along the second direction Y; the guide portion 35212 is used to abut the conductive component 311 and moves relative to the cleaning support assembly 351 as the conductive component 311 moves, so that the cleaning portion 35211 abuts against the conductive component 311.

[0139] The cleaning member 3521 extends from the cleaning support assembly 351 toward the capacitance test socket 31. The extension direction of the cleaning member 3521 is inclined toward the movement direction of the capacitance test socket 31. That is, the extension direction of the cleaning member 3521 is inclined relative to both the cleaning arrangement direction Q and the movement direction of the capacitance test socket 31. The cleaning arrangement direction Q is the arrangement direction of the cleaning assembly 352 and the test socket conveying mechanism 33.

[0140] The cleaning member 3521 forms a first bend line 35213 at the bent position. The first bend line 35213 divides the cleaning member 3521 into a guide portion 35212 and a cleaning portion 35211. The guide portion 35212 is located at the end of the cleaning member 3521 near the cleaning support assembly 351, and the cleaning portion 35211 is located at the end of the cleaning member 3521 near the test socket conveying mechanism 33. The extension direction of the cleaning member 3521 is the extension direction of the guide portion 35212, and the extension direction of the cleaning portion 35211 is the extension direction after the cleaning member 3521 is bent. Optionally, the cleaning portion 35211 is in the shape of a vertical plate, and the first bend line 35213 is disposed vertically.

[0141] During the movement of the capacitance test seat 31 , the capacitance test seat 31 can push the cleaning member 3521 to move.

[0142] Optionally, when the cleaning member 3521 is slidably connected to the cleaning support assembly 351, the cleaning portion 35211 can be parallel to the moving direction of the capacitor test seat 31, so that the cleaning portion 35211 can be flush with the capacitor test seat 31; the movement of the capacitor test seat 31 can be against the guide portion 35212 and push the cleaning member 3521 to slide, so that the cleaning portion 35211 can be against the capacitor test seat 31 and clean impurities on the capacitor test seat 31 through friction.

[0143] When the cleaning member 3521 is rotatably connected to the cleaning support assembly 351, the cleaning portion 35211 can be arranged at an angle to the moving direction of the capacitor test seat 31, so that after the guide portion 35212 is squeezed and rotated by the capacitor test seat 31, the cleaning portion 35211 can be flush with the capacitor test seat 31. The movement of the capacitor test seat 31 can abut against the guide portion 35212 and push the cleaning member 3521 to rotate, so that the cleaning portion 35211 can abut against the capacitor test seat 31 and clean impurities on the capacitor test seat 31 through friction. Optionally, when the cleaning member 3521 is rotatably connected to the cleaning support assembly 351 via a rotating shaft, the cleaning elastic member 3522 includes a torsion spring mounted on the rotating shaft, and the two torsion arms of the torsion spring respectively press against the cleaning support assembly 351 and the cleaning member 3521, and can apply elastic force to the cleaning member 3521.

[0144] The beneficial effects of this embodiment are as follows: the cleaning member 3521 extends from the cleaning support assembly 351 toward the capacitor test seat 31, so that the cleaning member 3521 can contact the capacitor test seat 31 and thus clean the capacitor test seat 31; the guide portion 35212 is arranged at an angle to the moving direction of the capacitor test seat 31, so that the capacitor test seat 31 can apply a component of force perpendicular to the moving direction of the capacitor test seat 31 to the guide portion 35212, so that the guide portion 35212 can drive the cleaning portion 35211 away from the capacitor test seat 31, causing the cleaning elastic member 3522 to deform, so that the cleaning elastic member 3522 applies pressure to the capacitor test seat 31 through the cleaning member 3521, thereby increasing the friction required for cleaning; the cleaning portion 35211 bends toward the cleaning support assembly 351, so that the cleaning portion 35211 can be flush with the capacitor test seat 31 when pressed against the capacitor test seat 31, thereby increasing the contact area between the cleaning portion 35211 and the capacitor test seat 31 and improving the cleaning effect.

[0145] In some embodiments, please refer to Figures 10 to 13 The cleaning support assembly 351 includes a first cleaning support member 3511, a second cleaning support member 3513, and a cleaning positioning member 3514. The second cleaning support member 3513 is movably connected to the first cleaning support member 3511 along the cleaning arrangement direction Q, and the second cleaning support member 3513 is connected to the cleaning assembly 352. The cleaning positioning member 3514 is provided on the first cleaning support member 3511 and is used to adjust the position of the second cleaning support member 3513 relative to the first cleaning support member 3511 in the cleaning arrangement direction Q, thereby adjusting the distance between the cleaning member 3521 and the test seat conveying mechanism 33 in the cleaning arrangement direction Q.

[0146] The first cleaning support member 3511 is used to support the second cleaning support member 3513 .

[0147] The second cleaning support member 3513 is used to support the cleaning assembly 352; the second cleaning support member 3513 can approach or move away from the capacitor test seat 31 along the cleaning arrangement direction Q, and the second cleaning support member 3513 is relatively fixed with the first cleaning support member 3511 in directions other than the cleaning arrangement direction Q.

[0148] The cleaning positioning member 3514 can secure the second cleaning support member 3513 to different positions on the first cleaning support member 3511 along the cleaning arrangement direction Q. Optionally, the cleaning positioning member 3514 is a hydraulic push rod, an electric push rod, or a bolt. When the cleaning positioning member 3514 is a hydraulic push rod or an electric push rod, the hydraulic push rod or the electric push rod is secured to the first cleaning support member 3511 and the second cleaning support member 3513 at both ends along the length direction. Controlling the hydraulic push rod or the electric push rod to extend or retract can drive the second cleaning support member 3513 to move relative to the first cleaning support member 3511. When the cleaning positioning member 3514 is a bolt, the tail of the bolt is detachably connected to the threaded hole in the first cleaning support member 3511. By placing different positions of the second cleaning support member 3513 on the head of the bolt, the head of the bolt presses the different positions of the second cleaning support member 3513 against the fixed position on the first cleaning support member 3511, thereby adjusting the position of the second cleaning support member 3513 relative to the first cleaning support member 3511. The second cleaning support member 3513 may be provided with a long slot extending along the cleaning arrangement direction Q. The long slot passes through the second cleaning support member 3513 so that a bolt can pass through the long slot to connect with the first cleaning support member 3511 .

[0149] Optionally, the first cleaning support member 3511 is provided with a cleaning guide structure 3512 extending along the cleaning arrangement direction Q, and the cleaning guide structure 3512 is used to guide the second cleaning support member 3513 to move along the cleaning arrangement direction Q. The cleaning guide structure 3512 may include a slide groove or a guide rail slidably connected to the second cleaning support member 3513.

[0150] The beneficial effects of this embodiment are as follows: the setting of the cleaning positioning member 3514 can adjust the distance between the second cleaning support member 3513 and the cleaning member 3521 and the capacitor test seat 31. Since the installation positions of the cleaning elastic member 3522 and the cleaning member 3521 remain relatively unchanged, the distance between the cleaning member 3521 and the capacitor test seat 31 changes, and the deformation of the cleaning elastic member 3522 after being squeezed by the cleaning member 3521 changes, thereby being able to adjust the pressure applied by the cleaning elastic member 3522 to the capacitor test seat 31 through the cleaning member 3521.

[0151] In some embodiments, please refer to Figures 10 to 13The cleaning mechanism 35 also includes a position adjustment component 353 connected to the cleaning support component 351. The position adjustment component 353 is used to adjust the position of the cleaning support component 351 relative to the test seat conveying mechanism 33, and then adjust the position of the cleaning member 3521 relative to the test seat conveying mechanism 33, so that the cleaning member 3521 can clean the capacitor test seat 31 at a suitable position.

[0152] In some embodiments, please refer to Figures 14 to 16 The detection device 36 includes a detection support assembly 361, a test seat detection mechanism 362, a detection translation assembly 363 and two connecting assemblies 364. The test seat detection mechanism 362 includes a continuity detector and two test head assemblies 3621. The two test head assemblies 3621 are respectively used to electrically connect to the two conductive components 311; the positive and negative poles of the continuity detector are respectively electrically connected to the two test head assemblies 3621 to detect the continuity of the two conductive components 311; the detection translation assembly 363 is connected to the detection support assembly 361; the detection translation assembly 363 is also connected to the two test head assemblies 3621 to drive the test head assemblies 3621 to move closer to or away from the conductive component 311; the connecting assembly 364 includes a conductive member 3641 movably connected to the detection support assembly 361, the two conductive members 3641 in the two connecting assemblies 364 are electrically connected, and the two conductive members 3641 are respectively used to electrically connect to the two conductive components 311 to conduct the two conductive components 311.

[0153] The detection support assembly 361 is used to support the detection translation assembly 363 and the communication assembly 364. Optionally, the detection support assembly 361 includes a detection support structure 3612 connected to the detection translation assembly 363 to support the detection translation assembly 363.

[0154] The continuity detector is used to detect the continuity of the circuit. The continuity detector includes a power supply, and the positive and negative poles of the power supply are respectively electrically connected to the two test head assemblies 3621. Optionally, the continuity detector includes a cable continuity tester or a multimeter.

[0155] Optionally, two test head assemblies 3621 are provided above the test socket conveyor mechanism 33. Each of the two test head assemblies 3621 includes a conductor and is spaced apart. The two test head assemblies 3621 can be connected to the two conductive assemblies 311, respectively, to connect the conductive assemblies 311 to the continuity detector.

[0156] The detection translation assembly 363 is used to drive the test head assembly 3621 to approach the conductive assembly 311, so that the test head assembly 3621 contacts and electrically connects with the conductive assembly 311. Optionally, the detection translation assembly 363 may include a cylinder or an electric push rod.

[0157] Conductive member 3641 is a conductor, and two conductive members 3641 can be electrically connected to two conductive components 311. Conductive member 3641 and test head assembly 3621 are connected to different positions of conductive component 311 to test the continuity of conductive component 311 between conductive member 3641 and test head assembly 3621.

[0158] Optionally, the two conductive members 3641 are respectively electrically connected to the conductive posts 3112 of the two conductive assemblies 311. Optionally, the conductive members 3641 can be brought into contact with or out of contact with the conductive assembly 311 using a device such as a cylinder, an electric push rod, or an elastic member. The cylinder or electric push rod can drive the conductive member 3641 toward or away from the conductive assembly 311, and the elastic member can use its elastic force to bring the conductive member 3641 toward the conductive assembly 311. When the test socket conveying mechanism 33 drives the conductive assembly 311 to move, the conductive assembly 311 can squeeze the conductive member 3641 and the elastic member, causing the elastic member to passively contract.

[0159] The process of testing the capacitor test socket 31 in the embodiment of the present application is as follows: the test socket conveying mechanism 33 conveys the capacitor test socket 31 and stops when the capacitor test socket 31 moves to the point where the conductive component 311 is directly aligned with the test head assembly 3621. The test translation assembly 363 is used to drive the test head assembly 3621 toward the conductive component 311, so that the two test head assemblies 3621 are connected to the two conductive components 311 respectively; the two conductive members 3641 are connected to the two conductive components 311 respectively. At this time, the two conductive components 311 are connected to the power supply of the continuity detector through the two test head assemblies 3621 and the two conductive members 3641.

[0160] Finally, a continuity test is performed using a continuity detector to determine whether the two conductive components 311 are conductive. During the test, the current flows from the positive pole of the power supply in the continuity detector through the first test head component 3621 connected to the positive pole, the first conductive component 311 connected to the first test head component 3621, the first conductive member 3641 connected to the first conductive component 311, the second conductive member 3641 connected to the first conductive member 3641, and then through the second conductive component 311 connected to the second conductive member 3641 and the second test head component 3621 connected to the second conductive component 311 to reach the negative pole of the power supply to form a loop. If the current can form a loop, it means that the two conductive components 311 are conductive. If the current cannot form a loop, it means that at least one of the conductive components 311 is not conductive.

[0161] After the test is completed, the detection translation component 363 is used to drive the test head component 3621 to separate from the conductive component 311, so that the conductive part 3641 is separated from the conductive component 311, and the test seat conveying mechanism 33 conveys the capacitor test seat 31 to move, and conveys the subsequent capacitor test seat 31 to the test head component 3621 for testing.

[0162] The beneficial effects of the embodiments of the present application are: the two conductive components 311 can be connected to the on-off detector through the test head assembly 3621 and the conductive part 3641, so that the on-off detector can detect the on-off of the two conductive components 311. After screening out the disconnected conductive components 311, the corresponding capacitor test socket 31 can be replaced with a good product, and the detection result when using the capacitor test socket 31 to detect the capacitor 200 is more accurate.

[0163] In some embodiments, please refer to Figures 14 to 16 The connecting component 364 also includes two conductive elastic members 3642 , which are connected to the detection support component 361 and the conductive member 3641 . The conductive elastic member 3642 is used to apply elastic force to the conductive member 3641 so that the conductive member 3641 is pressed against the conductive component 311 .

[0164] The conductive elastic member 3642 can be a device such as a shock-absorbing support rod that can limit the movement direction of the conductive member 3641, or a device such as a spring or torsion spring that only provides elastic force. When the conductive elastic member 3642 is a spring or torsion spring, a guide structure is required to limit the movement direction of the conductive member 3641.

[0165] It can be understood that when the conductive component 311 on the capacitor test seat 31 moves to the position of the conductive part 3641, the elastic force exerted by the conductive elastic part 3642 on the conductive part 3641 causes the conductive part 3641 to press against the conductive component 311; when the conductive component 311 moves out of the position of the conductive part 3641, the conductive component 311 can squeeze the conductive part 3641 and the conductive elastic part 3642, causing the conductive elastic part 3642 to passively shrink.

[0166] The beneficial effects of the embodiment of the present application are: a conductive elastic member 3642 is provided to apply elastic force to the conductive member 3641, and when the conductive component 311 reaches the position of the conductive member 3641, the conductive component 311 can automatically connect with the conductive member 3641; compared with the cylinder, there is no need to actively control the conductive elastic member 3642 to move, thereby reducing the difficulty of control.

[0167] In some embodiments, please refer to Figures 14 to 16The testing support assembly 361 includes two conductive support structures 3611, each connected to two conductive elastic members 3642. The two conductive support structures 3611 are arranged on either side of the test socket conveying mechanism 33, perpendicular to the second direction Y. The conductive members 3641 extend from the conductive support structures 3611 toward the test socket conveying mechanism 33 and are inclined in the direction of movement of the capacitor test socket 31. The conductive members 3641, one end of which is adjacent to the test socket conveying mechanism 33, bend toward the conductive support structures 3611. Connecting portions 36412 and guide portions 36411 are formed on either side of a second bending line 36413 of the conductive member 3641. The guide portions 36411 and the connecting portion 36412 are arranged sequentially along the direction of movement of the capacitor test socket 31. The guide portion 36411 is used to support the capacitor test socket 31 and moves relative to the conductive support structures as the capacitor test socket 31 moves, thereby ensuring that the connecting portion 36412 is in contact with the capacitor test socket 31.

[0168] When the capacitance test socket 31 reaches the position of the conductive member 3641 , the capacitance test socket 31 first contacts the guide portion 36411 and then moves along the guide portion 36411 to the connecting portion 36412 .

[0169] The beneficial effects of the embodiment of the present application are as follows: the conductive member 3641 extends from the conductive support structure 3611 toward the capacitor test socket 31, so that the conductive member 3641 can contact the conductive component 311 on the capacitor test socket 31, and thus can be electrically connected to the conductive component 311; the guide portion 36411 is arranged to be inclined with respect to the second direction Y, so that the capacitor test socket 31 can apply a component of force perpendicular to the second direction Y to the guide portion 36411, so that the guide portion 36411 can drive the connecting portion 36412 away from the capacitor test socket 31, thereby reducing the influence of the conductive member 3641 on the movement of the capacitor test socket 31; the connecting portion 36412 is bent toward the conductive support structure 3611, so that the connecting portion 36412 can be flush with the conductive component 311 when pressed against the capacitor test socket 31, thereby increasing the contact area between the connecting portion 36412 and the conductive component 311, and ensuring stable contact between the conductive member 3641 and the conductive component 311.

[0170] In some embodiments, please refer to Figures 14 to 16 The test seat detection mechanism 362 also includes a first detection support 3622 connected to the detection translation assembly 363; the test head assembly 3621 includes a conductive probe 36212 and a detection elastic member 36211, and the conductive probe 36212 is slidably connected to the first detection support 3622; the detection elastic member 36211 is connected to the first detection support 3622 and the conductive probe 36212, and the detection elastic member 36211 is used to apply elastic force to the conductive probe 36212 so that the conductive probe 36212 is pressed against the conductive assembly 311.

[0171] The detection translation assembly 363 moves the conductive probe 36212 by driving the first detection support member 3622 .

[0172] The conductive probe 36212 is electrically connected to the positive and negative electrodes of the continuity detector. The conductive probe 36212 may include a conductor such as a conductive probe or a conductive block. Optionally, the conductive probe 36212 is provided with two limiting structures, each including a flange, etc., located on either side of the first detection support 3622 in the sliding direction of the conductive probe 36212 to prevent the conductive probe 36212 from detaching from the first detection support 3622. The detection elastic member 36211 includes a spring mounted on the conductive probe 36212, the spring being disposed between the first detection support 3622 and one of the limiting structures.

[0173] The advantageous effects of this embodiment of the present application are as follows: the conductive probe 36212 can be configured to be longer in the sliding direction, enabling the conductive probe 36212 to contact the conductive component 311. Under the action of the detection elastic member 36211, the conductive probe 36212 applies a certain amount of pressure to the conductive component 311, making the contact between the conductive probe 36212 and the conductive component 311 more stable. The detection elastic member 36211 also has a cushioning effect, reducing the risk of collision damage to the conductive probe 36212 and the conductive component 311.

[0174] In some embodiments, please refer to Figures 14 to 16 The test seat detection mechanism 362 also includes a second detection support 3623 fixedly connected to the detection translation assembly 363, an arc-shaped guide structure 3624 and a detection connecting member 3625. The arc-shaped guide structure 3624 extends in an arc shape around the detection axis 3626, and the detection axis 3626 is parallel to the sliding direction of the conductive probe 36212; the detection connecting member 3625 is used to detachably connect the first detection support 3622 with the second detection support 3623 to guide the first detection support 3622 to rotate along an arc trajectory.

[0175] Optionally, the arc-shaped guide structure 3624 may include a structure such as a slide rail or a slide groove connected between the first detection support member 3622 and the second detection support member 3623 .

[0176] Optionally, the detection connection member 3625 may include a bolt or other structure.

[0177] For example, the arc-shaped guide structure 3624 includes a sliding hole defined in the second detection support member 3623, and the detection connector 3625 includes at least two bolts disposed within the sliding hole. The tail ends of the bolts are threadedly engaged with the first detection support member 3622, and the heads of the bolts hold the second detection support member 3623 against the first detection support member 3622. This structure is simple and can limit the adjustment direction of the first detection support member 3622 relative to the second detection support member 3623.

[0178] Detection axis 3626 is virtual line 3437. Optionally, when the capacitance test socket 31 is moved directly below the two test head assemblies 3621, the two conductive assemblies 311 on the capacitance test socket 31 are symmetrical about the detection axis 3626; the two test head assemblies 3621 are symmetrical about the detection axis 3626, which facilitates alignment with the conductive assemblies 311 on the capacitance test socket 31.

[0179] In some embodiments, please refer to Figures 17 to 21 The testing mechanism 34 includes a testing support assembly 341 , at least one testing assembly and a reciprocating driving mechanism; the testing assembly includes two testing probes 342 , and the two testing probes 342 are respectively used to electrically connect to the two conductive assemblies 311 .

[0180] The reciprocating drive mechanism includes a swinging mechanism 343 and a power mechanism 344; the swinging mechanism 343 includes a swinging member 3431, a probe driving assembly 3432 and a probe supporting assembly 3433; the swinging member 3431 is rotated around a first axis 3434 and is arranged on the test supporting assembly 341; the probe supporting assembly 3433 includes at least two probe supporting members 34331 slidingly connected to the test supporting assembly 341, and the probe supporting member 34331 is connected to the test probe 342; the probe driving assembly 3432 includes a driving arm 34321 corresponding one to the probe supporting member 34331.

[0181] One end of the driving arm 34321 along its length direction is rotatably connected to the swing member 3431 around the second axis 3435, and the other end of the driving arm 34321 is rotatably connected to the probe support member 34331 around the third axis 3436, so that when the swing member 3431 swings around the first axis 3434, the driving arm 34321 drives the probe support member 34331 to slide relative to the test support assembly 341; the first axis 3434, the second axis 3435 and the third axis 3436 are parallel; the power mechanism 344 is arranged on the test support assembly 341; the power mechanism 344 is connected to the swing member 3431, and is used to drive the swing member 3431 to swing back and forth.

[0182] The two test probes 342 of the same test component are respectively used to connect to the two conductive components 311 , that is, the two test probes 342 are respectively used to electrically connect to the first pin 201 and the second pin 202 of the capacitor 200 .

[0183] The test component is electrically connected to the capacitor 200 through the test probe 342 to test the function of the capacitor 200. One or more test components can be set to test one or more functions of the capacitor 200. Each test component includes a group of test probes 342. When multiple test components are set, the multiple groups of test probes 342 are distributed along the second direction Y, and the distance between two adjacent groups of test probes 342 is equal to the distance between two adjacent capacitor test sockets 31, so that when the capacitor test socket 31 moves to the next group of test probes 342, the subsequent capacitor test socket 31 moves to the position of the current test probe 342. Optionally, the test component may include an open circuit detection component, a capacity detection component, etc. After the detection is completed, the capacitor 200 can be directly removed from the capacitor test socket 31, or the capacitor 200 can continue to be transported.

[0184] Optionally, the testing mechanism 34 includes a convex bottom detection component. If the planar end 2032 of the capacitor 200 is protruding, the capacitor 200 is removed from the capacitor test seat 31.

[0185] It can be understood that the test support assembly 341 is used to support the swing mechanism 343 and the power mechanism 344 .

[0186] There can be one or more reciprocating drive mechanisms to drive different positions and different numbers of test probes 342 .

[0187] The power mechanism 344 is used to drive the swing member 3431 to swing back and forth. That is, the power mechanism 344 can drive the swing member 3431 to rotate clockwise or counterclockwise about the first axis 3434. Optionally, the power mechanism 344 can include a test drive member 3442 such as a crank rocker mechanism, a double crank mechanism, a stepper motor, or a cylinder.

[0188] Optionally, the power mechanism 344 may further include a swing arm 3441, one end of which is fixedly connected to the swing member 3431 and the other end of which extends away from the first axis 3434. The test drive member 3442 can drive the swing arm 3441 to swing about the first axis 3434, thereby causing the swing member 3431 to rotate synchronously about the first axis 3434, thereby achieving energy-saving driving. Optionally, a limit buffer structure such as an oil pressure buffer can be provided on both sides of the swing arm 3441 along the swing direction to limit the swing range of the swing arm 3441.

[0189] When the swing member 3431 rotates about the first axis 3434, it drives the drive arm 34321 connected thereto to move, causing the drive arm 34321 to slide the probe support 34331 connected thereto. Adjusting the swing angle of the swing member 3431 changes the movement distance of the drive arm 34321, thereby changing the sliding stroke of the probe support 34331. Optionally, the swing member 3431 includes a plate-like structure or a rod-like structure.

[0190] The probe support 34331 is used to carry the test probe 342. One test probe 342 can be set on the probe support 34331, or multiple test probes 342 can be set, so that the multiple test probes 342 can move together with the probe support 34331. The sliding direction of the probe support 34331 is set according to the preset moving direction of the test probe 342, so that the test probe 342 is close to or away from the capacitor test seat 31. Optionally, the probe support 34331 is a slider, and the test support assembly 341 is provided with a slide groove, slide rail and other structures that are compatible with the slider. Optionally, the sliding direction of the probe support 34331 is perpendicular to the moving direction of the capacitor test seat 31 and perpendicular to the first axis 3434.

[0191] The number of driving arms 34321 is equal to the number of probe supports 34331, with one driving arm 34321 driving one probe support 34331. The length of each driving arm 34321 is determined based on the sliding direction of the probe support 34331, and the length of each driving arm 34321 is determined based on the distance between the probe support 34331 to which it is connected and the swing member 3431. When the driving arms 34321 intersect, the intersecting driving arms 34321 may be spaced apart along the first axis 3434. Alternatively, the driving arms 34321 may be rod-shaped, elongated, or other structures.

[0192] According to the distribution of the test probes 342 , the probe support assembly 3433 and the probe driving assembly 3432 can have various arrangements.

[0193] For example, when a conductive column 3112 is provided on one side of the capacitance test seat 31, please refer to Figure 21, the test probe 342 is only arranged on one side of the capacitor test seat 31 and is arranged opposite to the conductive pillar 3112. In this case, the probe support assembly 3433 includes at least two probe supports 34331, and each probe support 34331 is respectively opposite to the capacitor test seat 31 at a different position. The probe support assembly 3433 may include two, three or more probe supports 34331, and the probe supports 34331 are arranged in sequence along the distribution direction of the capacitor test seat 31; two test probes 342 in the same test assembly can be connected to the same probe support 34331; the probe supports 34331 in the probe support assembly 3433 are arranged along different sliding directions; or, the swing member 3431 is arranged between the two probe supports 34331. The probe drive assembly 3432 includes all drive arms 34321 connected to one swing member 3431, and each drive arm 34321 can respectively drive each probe support 34331 to move along a different sliding direction.

[0194] For example, when the conductive posts 3112 are provided on both sides of the capacitor test seat 31, please refer to Figure 19 and Figure 20 , the test probes 342 are respectively arranged on both sides of the capacitor test socket 31 and opposite to the conductive pillars 3112. In this case, a probe support assembly 3433 includes two probe supports 34331, and each probe support 34331 of the same probe support assembly 3433 is opposite to the capacitor test socket 31 at the same position to drive the test probes 342 arranged on both sides of the capacitor test socket 31. The two probe supports 34331 are both arranged on one side of the swing member 3431 along the sliding direction of the probe supports 34331. The two test probes 342 in the same test assembly are respectively connected to the two probe supports 34331 of the same probe support assembly 3433. A probe driving assembly 3432 includes two driving arms 34321, and the two driving arms 34321 respectively drive two relative probe supports 34331 to move away from or towards each other, so that the two probe supports 34331 drive the relative test probes 342 to approach or move away from the same capacitor test seat 31 at the same time; at this time, one or more probe support assemblies 3433 can be included, and one or more probe driving assemblies 3432 can be included accordingly.

[0195] It is understandable that the probe support assembly 3433 and the probe drive assembly 3432 may also have other arrangements and are not limited to the above two.

[0196] The beneficial effects of the embodiment of the present application are as follows: the power mechanism 344 is capable of driving the swinging member 3431 to swing, and when the swinging member 3431 swings, it can drive the multiple probe supports 34331 to slide via multiple drive arms 34321. Multiple test probes 342 can be set on one probe support 34331, and multiple sections of test probes 342 can be driven by one power mechanism 344. Compared with using multiple cylinders to drive each section of test probe 342, the present application can use fewer power devices to drive multiple sections of test probes 342, which is lower in cost. By driving multiple sections of test probes 342 with one power device, it is convenient to control the synchronous movement of multiple test probes 342, and the synchronization is better.

[0197] In some embodiments, please refer to Figure 19 and Figure 20 The swing mechanism 343 includes at least one probe driving assembly 3432 and at least one probe supporting assembly 3433; the probe supporting assembly 3433 includes two probe supporting members 34331 with the same sliding direction, and the two probe supporting members 34331 are arranged relative to each other along the sliding direction; the two driving arms 34321 in the probe driving assembly 3432 are arranged on both sides of the virtual line 3437, and the virtual line 3437 is parallel to the sliding direction of the probe supporting assembly 3433 and passes through the first axis 3434. The probe driving assembly 3432 is used to drive the two probe supporting members 34331 in the same probe supporting assembly 3433 to move closer to or away from each other.

[0198] The number of the probe driving assembly 3432 and the number of the probe supporting assembly 3433 can be equal.

[0199] The two probe support members 34331 in the probe support assembly 3433 are located on the same side of the swing member 3431 along the sliding direction of the probe support assembly 3433. The two probe support members 34331 in the same probe support assembly 3433 are also located on either side of the capacitance test socket 31 at the same position. That is, the two probe support members 34331 in the same probe support assembly 3433 correspond to the capacitance test socket 31 at the same position. The two probe support members 34331 slide in the same direction, that is, the movement directions of the two probe support members 34331 are parallel.

[0200] It can be understood that a probe driving assembly 3432 includes two driving arms 34321, and the two driving arms 34321 respectively drive two probe support members 34331 in a probe support assembly 3433. Optionally, the second axis 3435 around which the two driving arms 34321 in the same probe driving assembly 3432 are symmetrical about the center of the first axis 3434, and the two driving arms 34321 are symmetrical about the virtual line 3437, so that the two symmetrical driving arms 34321 can drive the two probe support members 34331 to move the same distance.

[0201] Optionally, when the sliding directions of the two probe support assemblies 3433 are the same and they are respectively arranged on both sides of the swing member 3431 along the sliding direction, the two sets of second axes 3435 around which the two sets of driving arms 34321 connected to the two probe support assemblies 3433 are rotated can overlap, thereby saving the space required for installation.

[0202] A virtual line 3437 is defined with respect to each probe driving assembly 3432 and the probe supporting assembly 3433 connected to the probe driving assembly 3432 , and the virtual line 3437 is located between the two driving arms 34321 in the probe driving assembly 3432 .

[0203] The probe driving assembly 3432 of the embodiment of the present application can drive the corresponding two probe supports 34331 to drive the relative test probes 342 to simultaneously approach or move away from the capacitor test seat 31 at the same position. Because the two probe supports 34331 are located on opposite sides of the capacitor test seat 31 at the same position, the movement directions of the two probe supports 34331 are opposite at this time, and the capacitor test seat 31 can be connected to or disconnected from the test probes 342 on both sides at the same time, which is suitable for the situation where the test probes 342 are respectively arranged on both sides of the capacitor test seat 31.

[0204] The beneficial effects of the embodiment of the present application are: multiple probe support assemblies 3433 and probe drive assemblies 3432 can be set, which can drive multiple test probes 342 located on both sides of the capacitor test seat 31 to move synchronously. Compared with setting cylinders to drive the test probes 342 on both sides of the capacitor test seat 31, the embodiment of the present application sets a power mechanism 344 on one side of the capacitor test seat 31 to improve the synchronous control effect.

[0205] In some embodiments, please refer to Figure 19 and Figure 20The reciprocating drive mechanism also includes a transmission arm 345 and at least two swinging mechanisms 343; the power mechanism 344 is connected to any one of the multiple swinging members 3431, and the transmission arm 345 is rotatably connected to the swinging members 3431 of the two swinging mechanisms 343 at both ends along its length direction. The rotation axis of the transmission arm 345 is parallel to the first axis 3434, so that the two swinging members 3431 connected to the transmission arm 345 swing simultaneously.

[0206] The beneficial effects of the embodiment of the present application are: the power mechanism 344 drives the first swinging member 3431 to swing, so that the first swinging member 3431 can drive other swinging members 3431 to swing through the transmission arm 345, and multiple swinging members 3431 can drive more probe support members 34331 and test probes 342 to move.

[0207] In some embodiments, please refer to Figures 22 to 24 The receiving device 40 is provided on the side of the testing mechanism 34 away from the transfer mechanism 32 along the second direction Y; the receiving device 40 includes a first receiving support 41, a picking assembly 42, a picking translation assembly 43, a receiving mechanism 44, a receiving adjustment assembly 45 and a receiving limit assembly 46. The picking assembly 42 is used to collect and release the capacitor 200 after the test of the testing mechanism 34; the capacitor 200 includes a pin end 2031 and a plane end 2032 arranged oppositely; the picking translation assembly 43 is connected to the picking assembly 42 and the first receiving support 41, and the picking translation assembly 43 is used to drive the picking assembly 42 to move back and forth between the first position 491 and the second position 492 along the third direction Z; the receiving mechanism 44 is provided on the side of the second position 492 away from the first position 491 along the third direction Z, and the receiving mechanism 44 is used to receive the capacitor 200; the picking adjustment assembly 45 is connected to the first material receiving support 41 and the material receiving translation assembly 43, and the material receiving adjustment assembly 45 is used to adjust the position of the material receiving translation assembly 43 relative to the first material receiving support 41 in the third direction Z, so that the material picking assembly 42 picks up the capacitor 200 at the first position 491; the material receiving limit assembly 46 is connected to the first material receiving support 41; in the process of the material picking assembly 42 moving from the first position 491 to the second position 492, the material receiving limit assembly 46 is used to hinder the movement of the material picking assembly 42 at the second position 492, so that the material picking assembly 42 corresponds to the receiving mechanism 44.

[0208] The process of the material picking component 42 collecting the capacitor 200 includes clamping the capacitor 200 and flipping the capacitor 200; the material picking component 42 includes clamping parts such as a clamping cylinder, and also includes flipping parts such as a flipping cylinder connected to the clamping parts. The clamping parts are used to clamp the tested capacitor 200 on the capacitor test seat 31, and the flipping parts are used to flip the clamping parts and the capacitor 200.

[0209] The pin end 2031 is the end of the body 203 of the capacitor 200 where the pin is provided, and the flat end 2032 is the end opposite to the pin end 2031. The capacitor 200 can be a horn capacitor or a capacitor with a pin at another end.

[0210] The receiving and translating assembly 43 is connected to the retrieving assembly 42 and can drive the retrieving assembly 42 to move back and forth in a straight line. The first position 491 and the second position 492 are the two positions at which the receiving and translating assembly 43 drives the retrieving assembly 42. In the first position 491, the retrieving assembly 42 collects the capacitor 200, and in the second position 492, the retrieving assembly 42 releases the capacitor 200. Optionally, the receiving and translating assembly 43 includes an electric push rod, a pneumatic cylinder, a ball screw, or other linear drive structure. Optionally, the third direction Z represents the height of the receiving device 40.

[0211] Receiving mechanism 44 is used to receive capacitors 200 released by retrieving assembly 42. Receiving mechanism 44 is located closer to second position 492 than first position 491. When retrieving assembly 42 reaches second position 492, capacitors 200 are released to receiving mechanism 44. Receiving mechanism 44 can transport capacitors 200 for further processing or collect and store them. Receiving mechanism 44 may optionally include a conveyor or the like.

[0212] The material receiving adjustment assembly 45 can be directly connected to the material receiving translation assembly 43, or indirectly connected to the material receiving translation assembly 43 through the material picking assembly 42. In the third direction Z, the material receiving adjustment assembly 45 adjusts the position of the material receiving translation assembly 43, allowing the material receiving translation assembly 43 to drive the material picking assembly 42 to move to different positions, namely, changing the first position 491. This adjusts the distance between the material picking assembly 42 and the capacitor 200 when in the first position 491, allowing the material picking assembly 42 to clamp the capacitor 200 at a specific position. Optionally, the material receiving adjustment assembly 45 includes an electric push rod or a ball screw.

[0213] The material receiving limit assembly 46 is used to hinder the movement of the material receiving translation assembly 43, thereby stopping the movement of the material receiving translation assembly 43. When the material receiving limit assembly 46 stops the movement of the material receiving translation assembly 43, the position of the material picking assembly 42 is the second position 492. The material receiving limit assembly 46 corresponds to the position of the receiving mechanism 44. The second position 492 can be determined by presetting the position of the material receiving limit assembly 46. The second position 492 corresponds to the position of the receiving mechanism 44. That is, by presetting the second position 492, when the material picking assembly 42 is in the second position 492, the flat end 2032 of the capacitor 200 reaches the receiving mechanism 44. Optionally, the material receiving limit assembly 46 is fixedly connected to the first material receiving support member 41. Optionally, the material receiving limit assembly 46 includes a photoelectric switch or a limit block. Optionally, when the material receiving translation assembly 43 includes a translation cylinder, the material receiving limiting assembly 46 includes a limiting member, which is used to support the material taking assembly 42 to prevent the material taking assembly 42 from approaching the receiving mechanism 44 along the third direction Z.

[0214] The first material receiving support 41 and the receiving mechanism 44 are relatively fixed in the third direction Z. The first material receiving support 41 is used to support the material taking assembly 42, the material receiving translation assembly 43, the material receiving adjustment assembly 45 and the material receiving limit assembly 46. Optionally, the first material receiving support 41 is a vertical plate-shaped structure.

[0215] The receiving mechanism 44 is located below the material taking assembly 42 .

[0216] The receiving adjustment component 45 is used to adjust the positions of the translation component and the material taking component 42 in the third direction Z. For capacitors 200 of the same size, the receiving adjustment component 45 does not move after adjusting the receiving translation component 43 and the material taking component 42.

[0217] For capacitors 200 of different sizes, the position of the planar end 2032 of the capacitor 200 in the third direction Z is different; for example, when replacing a capacitor 200 with a larger height dimension, the clamping position of the material picking component 42 and the planar end 2032 of the capacitor 200 are farther apart in the third direction Z. When the material picking component 42 has not yet moved to the second position 492, the planar end 2032 of the capacitor 200 has already reached the receiving mechanism 44, but the material picking component 42 will continue to move toward the second position 492, and the planar end 2032 will collide with the receiving mechanism 44.

[0218] Therefore, when replacing the model of capacitor 200, it is necessary to use the material receiving adjustment component 45 to adjust the position of the material receiving translation component 43 in the third direction Z, and change the first position 491 of the material picking component 42, so that the clamping position of the material picking component 42 on the capacitor 200 and the distance between the planar end 2032 of the capacitor 200 in the third direction Z are consistent, so that when the material picking component 42 moves to the second position 492, the planar ends 2032 of capacitors 200 of different sizes can reach the receiving mechanism 44 and do not collide with the receiving mechanism 44.

[0219] Optionally, the maximum stroke of the material receiving translation assembly 43 is greater than the distance between the capacitor 200 and the receiving mechanism 44 in the third direction Z, so that after the material receiving limit assembly 46 limits the stroke of the material receiving translation assembly 43, the material receiving translation assembly 43 can still transport the capacitor 200 to the receiving mechanism 44.

[0220] Optionally, the material receiving translation assembly 43, the material receiving adjustment assembly 45 and the material receiving limit assembly 46 are all arranged on the side of the material picking assembly 42 close to the receiving mechanism 44 along the third direction Z, that is, when the material picking assembly 42 is located in the first position 491, the material receiving translation assembly 43, the material receiving adjustment assembly 45 and the material receiving limit assembly 46 are all located on the side of the material picking assembly 42 close to the receiving mechanism 44 along the third direction Z, so that the material receiving device 40 is more concentrated in the third direction Z.

[0221] The working process of the embodiment of the present application is as follows: the receiving translation assembly 43 drives the picking assembly 42 to move along the third direction Z to the first position 491 and then stops. The picking assembly 42 clamps the capacitor 200 at the first position 491 and drives the capacitor 200 to flip, so that the flat end 2032 of the capacitor 200 faces the receiving mechanism 44. The receiving translation assembly 43 then drives the picking assembly 42 to move along the third direction Z toward the receiving mechanism 44. After the receiving translation assembly 43 drives the picking assembly 42 to move to the second position 492, the receiving limit assembly 46 prevents the receiving translation assembly 43 from further driving the picking assembly 42 to move, so that the picking assembly 42 stops at the second position 492. At this time, the flat end 2032 of the capacitor 200 reaches the receiving mechanism 44, the picking assembly 42 releases the capacitor 200, and the capacitor 200 falls on the receiving mechanism 44.

[0222] The beneficial effects of the embodiment of the present application are as follows: the material receiving adjustment component 45 can adjust the first position 491 according to the different heights of the capacitors 200, so that the clamping position of the material receiving component 42 on the capacitor 200 is consistent with the distance between the flat end 2032 of the capacitor 200. When the material receiving component 42 moves to the second position 492, the flat ends 2032 of different capacitors 200 are all at the same distance from the receiving mechanism 44. The material receiving limit component 46 can preset the second position 492, and when the distance between the flat end 2032 of the capacitor 200 and the receiving mechanism 44 is zero, the material receiving component 42 can be controlled to release the capacitor 200, thereby reducing the collision between the capacitor 200 and the receiving mechanism 44.

[0223] In some embodiments, please refer to Figure 23 The receiving mechanism 44 includes a good product receiving component 441, a defective product receiving component 442, a defective conveying component 444 and a good product conveying component 443; the good product receiving component 441 is used to receive good capacitors; the defective product receiving component 442 is used to receive defective capacitors; the defective conveying component 444 is used to receive the capacitor 200 in the material taking component 42 and convey it to the defective product receiving component 442; the good product conveying component 443 is used to convey the good capacitors on the defective conveying component 444 to the good product receiving component 441.

[0224] Before the picking assembly 42 picks up the capacitor 200 , the capacitor 200 is tested by the testing device 30 . The capacitor 200 is classified into good capacitors and bad capacitors according to the test results, and the test results of each capacitor 200 are stored.

[0225] It can be understood that the defective conveying component 444 receives all capacitors 200 in the material taking component 42 and conveys all capacitors 200 to the defective product receiving component 442. Optionally, the defective conveying component 444 is a conveying belt.

[0226] Good product conveying assembly 443 and defective product receiving assembly 442 are sequentially arranged along the conveying direction of defective product conveying assembly 444. Based on the test results of testing device 30, good product conveying assembly 443 conveys good capacitors 200 from defective product conveying assembly 444 to good product receiving assembly 441 before the capacitors 200 on defective product conveying assembly 444 reach defective product receiving assembly 442. Defective product conveying assembly 444 then conveys the remaining capacitors 200 to defective product receiving assembly 442.

[0227] Optionally, the defective product receiving component 442 includes multiple pushing cylinders. According to test data, the multiple pushing cylinders of the defective product receiving component 442 can selectively push the defective capacitors out of the defective conveying component 444, and classify the defective products and push them to different locations.

[0228] Optionally, the good product conveying component 443 includes a classification pushing component 4431 such as a cylinder, and also includes a receiving conveying component 4432 such as a conveyor belt; in the conveying direction perpendicular to the defective conveying component 444, the classification pushing component 4431 and the receiving conveying component 4432 are respectively arranged on both sides of the defective conveying component 444, and the good product capacitor on the defective conveying component 444 can be pushed to the receiving conveying component 4432 through the classification pushing component 4431.

[0229] Optionally, the good product receiving component 441 includes multiple pushing cylinders. According to test data, the multiple pushing cylinders of the good product receiving component 441 can selectively push the good capacitors out of the receiving conveyor 4432 and push the good products to different locations.

[0230] The beneficial effects of the embodiments of the present application are as follows: the good product conveying component 443 conveys the good product capacitors on the defective conveying component 444 to the good product receiving component 441. When the good product conveying component 443 fails, the defective product capacitors are still conveyed to the defective product receiving component 442, reducing the risk of the defective product capacitors being conveyed to the good product receiving component 441.

[0231] In some embodiments, please refer to Figure 24 The material receiving device 40 also includes a second material receiving support 47 that is slidably connected to the first material receiving support 41 along the third direction Z, and a translation cylinder is connected to the second material receiving support 47 to adjust the position of the material taking component 42 relative to the second material receiving support 47; the material receiving adjustment component 45 is connected to the second material receiving support 47 to adjust the position of the second material receiving support 47 relative to the first material receiving support 41; the material receiving device 40 also includes a collecting adjustment component 48 connected to the second material receiving support 47, and the collecting adjustment component 48 is connected to the material receiving limit component 46 to adjust the position of the material receiving limit component 46 relative to the second material receiving support 47 in the third direction Z.

[0232] The second material receiving support member 47 is connected to the cylinder body of the translation cylinder, used to support the translation cylinder and the material receiving assembly 42. The second material receiving support member 47 is connected to the material receiving adjustment assembly 45, which enables the material receiving adjustment assembly 45 to adjust the position of the second support member, the translation cylinder, and the material receiving assembly 42 in the third direction Z. Optionally, the second material receiving support member 47 is a horizontal plate-like structure or a rod-like structure. Optionally, the second material receiving support member 47 is connected to the first material receiving support member 41 for sliding along the third direction Z via a guide structure such as a slider and a slide rail.

[0233] Optionally, the receiving adjustment member 48 comprises an electric push rod, a ball screw, or a screw. Optionally, the receiving adjustment member 48 is located below the receiving limit assembly 46 to facilitate manual adjustment. The receiving limit assembly 46 is indirectly connected to the first receiving support member 41 via the receiving adjustment member 48 and the second receiving support member 47. Optionally, the number of receiving adjustment members 48 and receiving limit assemblies 46 is equal, with one receiving adjustment member 48 regulating each receiving limit assembly 46.

[0234] The method for adjusting the second position 492 in the embodiment of the present application is: according to the distance between the planar end 2032 of the capacitor 200 and the receiving mechanism 44 in the third direction Z, according to the position of the material picking component 42 clamping the capacitor 200 in the third direction Z, determine the distance between the planar end 2032 and the receiving mechanism 44 after the material picking component 42 flips the capacitor 200, and use the collecting adjustment member 48 to adjust the position of the material collecting limit component 46 to adjust the second position 492, so that the distance between the second position 492 and the material picking component 42 is equal to the distance between the planar end 2032 and the receiving mechanism 44 after the capacitor 200 is flipped.

[0235] Optionally, when replacing the capacitor 200, the first position 491 and the second position 492 are adjusted respectively, and the distance adjusted by the first position 491 in the third direction Z is equal to the distance adjusted by the second position 492 in the third direction Z, but in opposite directions, that is, the first position 491 and the second position 492 are adjusted in the positive direction and the reverse direction of the third direction Z respectively.

[0236] The beneficial effects of the embodiment of the present application are as follows: the second receiving support 47 facilitates the connection between the receiving adjustment assembly 45 and the translation cylinder, thereby facilitating the adjustment of the translation cylinder. The receiving adjustment member 48 facilitates the adjustment of the position of the receiving limit assembly 46, thereby facilitating the adjustment of the second position 492.

[0237] In some embodiments, please refer to Figure 1 and Figure 25 The test system also includes a laser marking device 50. In the conveying direction of the defective conveying component 444, the laser marking machine 51 is arranged between the good product conveying component 443 and the material picking component 42. In the conveying direction perpendicular to the defective conveying component 444, the laser marking machine 51 is arranged on one side of the defective conveying component 444; the laser marking device 50 includes a laser marking machine 51 and a position adjustment mechanism 52. The position adjustment mechanism 52 is used to adjust the position of the laser marking machine 51 relative to the defective conveying component 444, so as to adjust the position where the light beam emitted by the laser marking machine 51 converges on the capacitor 200.

[0238] After the material taking component 42 places the capacitor 200 on the defective conveying component 444, the defective conveying component 444 conveys the capacitor 200 to the position of the laser marking machine 51 and then stops, and the laser marking machine 51 codes on the capacitor 200.

[0239] The beneficial effect of the embodiment of the present application is that when marking capacitors 200 of different heights or diameters, the position adjustment mechanism 52 can be used to adjust the up and down or front and back position of the laser marker 51 so that the light beam converges at a preset position on the capacitor 200.

[0240] In some embodiments, please refer to Figure 17 The test seat conveying mechanism 33 is used to drive the capacitance test seat 31 to move along the closed loop, and the cleaning mechanism 35 and the detection device 36 are arranged along the second direction Y between the material receiving device 40 and the transfer mechanism 32.

[0241] It can be understood that the test socket conveying mechanism 33 can drive the capacitance test socket 31 to move along the circular track, so that the capacitance test socket 31 moves cyclically on the circular track.

[0242] It can be understood that the cleaning mechanism 35 and the detection device 36 are arranged between the material receiving device 40 and the transfer mechanism 32 along the second direction Y, that is, the test seat conveying mechanism 33 drives the capacitor test seat 31 to pass through the material receiving device 40, the cleaning mechanism 35 and the detection device 36, the transfer mechanism 32 and the testing mechanism 34 in sequence.

[0243] Optionally, the operating process of the embodiment of the present application is as follows: the test socket conveying mechanism 33 drives the capacitor test socket 31 to move, and each time the test socket conveying mechanism 33 drives the capacitor test socket 31 to move a distance equal to the distance between two adjacent capacitor test sockets 31. When the capacitor test socket 31 moves to the receiving device 40, the receiving device 40 removes the capacitor 200 from the capacitor test socket 31. Then, the test socket conveying mechanism 33 drives the capacitor test socket 31 through the cleaning mechanism 35 and the detection device 36. When the capacitor test socket 31 passes through the cleaning mechanism 35, the cleaning mechanism 35 cleans foreign matter from the conductive pillars 3112. When the capacitor test socket 31 stops at the detection device 36, the detection device 36 detects whether the conductive component 311 of the capacitor test socket 31 is conductive. If the conductive component 311 is not conductive, the capacitor test socket 31 is replaced. If the conductive component 311 is conductive, the test socket conveying mechanism 33 drives the capacitor test socket 31 to move to the transfer mechanism 32, and the transfer mechanism 32 transfers the calibrated capacitor 200 to the capacitor test socket 31. The test socket conveyor mechanism 33 then moves the capacitor test socket 31 to the test mechanism 34. The test mechanism 34 connects to the conductive posts 3112 of the capacitor test socket 31 and tests the capacitance. After passing through the test mechanism 34, the capacitor test socket 31 reaches the receiving device 40 and the above process repeats.

[0244] The beneficial effects of the embodiment of the present application are: the test seat conveying mechanism 33 drives the capacitor test seat 31 to move in a circular motion. After receiving the capacitor 200 that has been tested, there is no need to manually transfer the capacitor test seat 31. The capacitor test seat 31 can continue to receive new capacitors 200, thereby improving the efficiency of the capacitor 200 test.

[0245] In some embodiments, please refer to Figure 1 and Figure 26 The feeding device 10 includes a feeding support 11, a feeding conveying member 12 such as a tank chain assembly, and a feeding blocking assembly 13; the feeding support 11 is used to support the feeding conveying member 12 and the feeding blocking assembly 13, and the feeding conveying member 12 is used to transport the capacitor 200 toward the approaching correction device 20; the feeding blocking assembly 13 includes two blocking members arranged at intervals, and the gap between the two blocking members is greater than the diameter of a capacitor 200 and less than twice the diameter of the capacitor 200, and only one capacitor 200 can pass through.

[0246] The beneficial effects of the embodiment of the present application are as follows: when the feed conveyor 12 drives the capacitor 200 to pass through the feed blocking assembly 13, only one capacitor 200 passes through the feed blocking assembly 13 at a time, and finally the capacitors 200 form a row behind the feed blocking assembly 13, and are then transported to the correction device 20 by the conveyor belt, so as to facilitate the subsequent correction of the capacitors 200 one by one.

[0247] The above are only preferred embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent replacements, and improvements made within the spirit and principles of the present application should be included in the scope of protection of the present application.

Claims

1. A capacitor testing system for testing a capacitor, wherein the capacitor comprises a first pin and a second pin, wherein: The capacitance testing system comprises: Loading device, used for conveying capacitors; A correction device, the correction device comprising a first correction mechanism, a correction conveying mechanism, and a second correction mechanism; the first correction mechanism is used to receive the capacitor conveyed by the feeding device and correct the capacitor, and the correction conveying mechanism is used to convey the capacitor in the first correction mechanism to the second correction mechanism; The second correction mechanism includes at least two correction clamping assemblies and a correction drive assembly, wherein the correction clamping assembly includes a first clamping member and a second clamping member arranged opposite to each other, a clamping space is provided between the first clamping member and the second clamping member, and the clamping space is used to accommodate the first pin and / or the second pin; at least two of the correction clamping assemblies are distributed along a first direction so that the first pin and the second pin are distributed along the first direction; the correction drive assembly is used to drive the first clamping member and the second clamping member to move closer to or away from each other; a testing device, configured to receive the capacitance corrected by the second correction mechanism and test the capacitance; The receiving device is used to receive the capacitor after being tested by the testing device.

2. The capacitance testing system according to claim 1, wherein: The correction mechanism further includes two correction elastic components, the correction elastic components respectively abutting against the correction drive component and the first clamping member, so that the correction drive component drives the first clamping member to move through the correction elastic components; And / or, the correction elastic component is in contact with the correction drive component and the second clamping member respectively, so that the correction drive component drives the second clamping member to move through the correction elastic component.

3. The capacitance testing system according to claim 2, wherein: The correction elastic component includes a first correction elastic member and a second correction elastic member. The first correction elastic member abuts against the correction drive component and the first clamping member respectively. The second correction elastic member abuts against the correction drive component and the second clamping member respectively.

4. The capacitance testing system according to claim 1, wherein: The second correction mechanism also includes a correction base and a correction rotation assembly; the correction drive assembly and the correction clamping assembly are both arranged on the correction base; the correction rotation assembly is connected to the correction base, and the correction rotation assembly is used to drive the correction base to rotate along the correction axis, and the correction axis is perpendicular to the first direction and the arrangement direction of the first clamping member and the second clamping member.

5. The capacitance testing system according to any one of claims 1 to 4, characterized in that: The testing device comprises: A capacitance test socket, comprising two conductive components; the two conductive components are respectively used to electrically connect to the first pin and the second pin; a transfer mechanism, configured to transfer the capacitor corrected by the second correction mechanism to the capacitor test socket; a test socket conveying mechanism, configured to carry the capacitance test socket and convey the capacitance test socket along a second direction; a testing mechanism, disposed on one side of the transfer mechanism along the second direction, the testing mechanism being configured to be electrically connected to the conductive component of the capacitor test socket to test the capacitance; a cleaning mechanism, disposed on a side of the testing mechanism close to the transfer mechanism along the second direction, the cleaning mechanism being used to clean the conductive component; The detection device is provided on a side of the transfer mechanism away from the testing mechanism along the second direction, and is used for detecting the capacitance test socket.

6. The capacitance testing system according to claim 5, wherein: The cleaning mechanism comprises: Clean support components; At least one cleaning component, the cleaning component includes a cleaning member and a cleaning elastic member, the cleaning member is movably connected to the cleaning support component, the cleaning elastic member is connected to the cleaning support component and the cleaning member, and the cleaning elastic member is used to apply elastic force to the cleaning member so that the cleaning member is pressed against the conductive component.

7. The capacitance testing system according to claim 6, wherein: The cleaning support assembly is provided on one side of the test seat conveying mechanism in a direction perpendicular to the second direction; the cleaning member extends from the cleaning support assembly toward the test seat conveying mechanism and is inclined in the second direction; One end of the cleaning member close to the test seat conveying mechanism is bent toward the direction close to the cleaning support assembly, and the cleaning member forms a guiding portion and a cleaning portion on both sides of the bending line, and the guiding portion and the cleaning portion are arranged in sequence along the second direction; the guiding portion is used to abut against the conductive assembly and moves relative to the cleaning support assembly as the conductive assembly moves, so that the cleaning portion abuts against the conductive assembly.

8. The capacitance testing system according to claim 5, wherein: The detection device comprises: Detect support components; A test socket detection mechanism, the test socket detection mechanism comprising a continuity detector and two test head assemblies, the two test head assemblies being respectively electrically connected to the two conductive assemblies; the positive and negative electrodes of the continuity detector being respectively electrically connected to the two test head assemblies to detect the continuity of the two conductive assemblies; A detection translation assembly is connected to the detection support assembly; the detection translation assembly is also connected to the two test head assemblies to drive the test head assemblies to approach or move away from the conductive assembly; Two connecting components, each of which includes a conductive member movably connected to the detection support component, wherein the two conductive members in the two connecting components are electrically connected, and the two conductive members are respectively used to electrically connect to the two conductive components to conduct the two conductive components.

9. The capacitance testing system according to claim 8, wherein: The connecting component further includes two conductive elastic members, which are connected to the detection support component and the conductive member. The conductive elastic members are used to apply elastic force to the conductive member so that the conductive member is pressed against the conductive component.

10. The capacitance testing system according to claim 5, wherein: The testing organization includes: Testing support components; At least one test component, the test component comprising two test probes, the two test probes being respectively used to electrically connect to the two conductive components; A reciprocating drive mechanism, the reciprocating drive mechanism comprising a swing mechanism and a power mechanism; the swing mechanism comprising a swing member, a probe drive assembly and a probe support assembly; the swing member being rotatable about a first axis and disposed on the test support assembly; the probe support assembly comprising at least two probe supports slidably connected to the test support assembly, the probe supports being connected to the test probes; the probe drive assembly comprising drive arms corresponding one to one with the probe supports; One end of the driving arm along the length direction is rotatably connected to the swing member around a second axis, and the other end of the driving arm is rotatably connected to the probe support member around a third axis, so that when the swing member swings around the first axis, the driving arm drives the probe support member to slide relative to the test support assembly; the first axis, the second axis and the third axis are parallel; The power mechanism is arranged on the test support assembly; the power mechanism is connected to the swing member and is used to drive the swing member to swing back and forth.

11. The capacitance testing system according to claim 10, wherein: The swing mechanism includes at least one probe driving assembly and at least one probe supporting assembly; The probe support assembly includes two probe supports with the same sliding direction, and the two probe supports are arranged relatively spaced apart along the sliding direction; The two driving arms in the probe driving assembly are arranged on both sides of a virtual line, which is parallel to the sliding direction of the probe supporting assembly and passes through the first axis. The probe driving assembly is used to drive the two probe supporting members in the same probe supporting assembly to move closer to or away from each other.

12. The capacitance testing system according to claim 5, wherein: The material receiving device is provided on a side of the testing mechanism away from the transfer mechanism along the second direction; the material receiving device comprises: a first material receiving support member; A material taking component, used for collecting and releasing the capacitor after being tested by the testing mechanism; the capacitor includes a pin end and a plane end that are arranged oppositely; a material receiving and translating assembly connected to the material taking assembly and the first material receiving and translating member, the material receiving and translating assembly being used to drive the material taking assembly to reciprocate between the first position and the second position along a third direction; a receiving mechanism, disposed at a side of the second position away from the first position along the third direction, the receiving mechanism being configured to receive the capacitor; a material receiving adjustment assembly connected to the first material receiving support and the material receiving translation assembly, the material receiving adjustment assembly being used to adjust the position of the material receiving translation assembly relative to the first material receiving support in the third direction, so that the material taking assembly receives the capacitor at the first position; A material receiving limit assembly is connected to the first material receiving support; during the movement of the material picking assembly from the first position to the second position, the material receiving limit assembly is used to hinder the movement of the material picking assembly at the second position so that the material picking assembly corresponds to the receiving mechanism.

13. The capacitance testing system according to claim 12, wherein: The receiving institutions include: Good product receiving component, used for receiving good product capacitors; Defective product receiving component, used to receive defective capacitors; A defective product conveying component, used for receiving the capacitor from the material taking component and conveying it to the defective product receiving component; A good product conveying component is used to convey the good product capacitor on the defective conveying component to the good product receiving component.

14. The capacitance testing system according to claim 5, wherein: The test seat conveying mechanism is used to drive the capacitance test seat to move along a closed loop, and the cleaning mechanism and the detection device are arranged between the material receiving device and the transfer mechanism along the second direction.

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