Transformer testing device and system

Abstract

The utility model discloses a transformer testing device and system, and belongs to the field of transformer testing. The transformer testing device comprises a carrying disc, a mechanical arm and a testing clamp, a plurality of first placing discs are arranged on the carrying disc, each first placing disc is provided with a first groove used for containing a to-be-tested transformer, and therefore a plurality of to-be-tested transformers can be placed on the carrying disc at the same time. The manipulator can move the to-be-tested transformer. When the sensing device on the test fixture senses that the transformer to be tested is placed in the test space, the pushing device can make the probe contact with the preset position of the transformer to be tested, so that the probe supplies power to the transformer to be tested, and the test is facilitated. According to the scheme, manual testing is not needed, rapid measurement can be achieved through the mechanical arm and the testing clamp, the testing speed is increased, and meanwhile the labor intensity is reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of transformer testing, in particular to a transformer testing device and system. Background Art

[0002] The overall after-sales failure rate of high-frequency transformers is relatively high, seriously affecting the after-sales failure rate of controllers. Furthermore, high-frequency transformers play a key role in the entire device and are a core component. Any quality issues with the transformer can lead to unstable output voltages in the switching power supply, and functional failures in the controller and the entire device are inevitable. Therefore, transformers require extremely high reliability. To ensure comprehensive product quality, high-frequency transformers must be tested to ensure quality.

[0003] Existing technologies all use manual testing, but due to the large number of test items, manual testing is labor-intensive and slow, which cannot meet production needs. Summary of the Invention

[0004] In order to overcome the deficiencies of the prior art, the utility model provides a transformer testing device and system to solve the problem that manual testing has high labor intensity, slow testing speed and cannot meet production needs.

[0005] The technical solution adopted by the utility model to solve its technical problems is:

[0006] In one aspect, a transformer testing device is provided, comprising: a carrier, a manipulator, and a test fixture;

[0007] The carrier plate is provided with a plurality of first placement plates, each of which is provided with a first groove for holding the transformer to be tested;

[0008] The test fixture includes a second placement plate, a pushing device, a probe and a sensing device;

[0009] The second placement tray is provided with a test space for holding the transformer to be tested;

[0010] The manipulator is used to move the transformer to be tested;

[0011] The sensing device is used to detect whether the test space contains a transformer to be tested;

[0012] The pushing device is used to push the probe to contact the transformer to be tested when a transformer to be tested is placed in the test space, so as to facilitate power-on testing through the probe.

[0013] Further, the test fixture includes a conventional parameter fixture;

[0014] The conventional parameter fixture is used to detect conventional parameters of the transformer to be tested, and the conventional parameters include electrical strength, insulation resistance and performance parameters.

[0015] Furthermore, the test fixture includes an inter-turn withstand voltage fixture;

[0016] The inter-turn withstand voltage fixture is used to detect the inter-turn withstand voltage of the transformer to be tested.

[0017] Furthermore, the test fixture includes an inter-turn withstand voltage fixture;

[0018] The inter-turn withstand voltage fixture is used to detect the inter-turn withstand voltage of the transformer to be tested.

[0019] Furthermore, it also includes: a clamp;

[0020] The fixture is used to fix the second placement plate on the test fixture.

[0021] Furthermore, the carrier plate is provided with a second groove;

[0022] The second groove is used to hold the first placement tray.

[0023] Furthermore, a third groove is provided on at least one side of the second groove;

[0024] The depth of the third groove is smaller than the depth of the second groove.

[0025] Furthermore, it also includes: a guide rail and a power device;

[0026] The power device is used to push the carrier plate to move on the guide rail.

[0027] Furthermore, it also includes: a base;

[0028] The carrier plate and the test fixture are arranged on the base.

[0029] On the other hand, a transformer testing system is provided, comprising: the transformer testing device as described above.

[0030] This application adopts the above technical solution, which has at least the following beneficial effects:

[0031] The technical solution of the present application provides a transformer testing device and system. The transformer testing device includes a carrier, a manipulator and a test fixture. The carrier is provided with a plurality of first placement plates, and each first placement plate is provided with a first groove for holding the transformer to be tested, so that a plurality of transformers to be tested can be placed on the carrier at the same time. The manipulator can move the transformer to be tested. When the sensing device on the test fixture senses that a transformer to be tested is placed in the test space, the pushing device can contact the probe with the preset position of the transformer to be tested, so that the transformer to be tested is powered by the probe for testing. The present application solution does not require manual testing, and can achieve rapid measurement through the manipulator and the test fixture, thereby increasing the test speed and reducing labor intensity. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0033] Figure 1 This is a schematic diagram of the three-dimensional structure of a transformer testing device provided by an embodiment of the utility model;

[0034] Figure 2 The embodiment of the present utility model provides Figure 1 A front view of the transformer test setup is shown;

[0035] Figure 3 The embodiment of the present utility model provides Figure 1 A top view of the transformer test setup is shown;

[0036] Figure 4 This is a schematic diagram of a carrier structure provided by an embodiment of the present utility model;

[0037] Figure 5 This is a schematic diagram of the three-dimensional structure of a conventional parameter fixture provided by an embodiment of the utility model;

[0038] Figure 6 This is a schematic diagram of the three-dimensional structure of a pressure-resistant clamp provided by an embodiment of the present utility model;

[0039] Figure 7 This is a schematic diagram of a transformer structure provided by an embodiment of the utility model. Description of the drawings:

[0041] 100-carrying plate, 110-first placement plate, 120-first groove, 130-third groove, 210-conventional parameter fixture, 220-inter-turn pressure-resistant fixture, 230-pressure-resistant fixture, 240-second placement plate, 250-test space, 260-sensing device, 270-pushing device, 280-fixture, 300-guide rail, 400-base. DETAILED DESCRIPTION

[0042] To make the purpose, technical solutions, and advantages of this application more clear, the technical solutions of this utility model are described in detail below with reference to the accompanying drawings and examples. Obviously, the described embodiments are only some of the embodiments of this application, rather than all of them. Based on the embodiments in this application, all other implementation methods obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0043] Conventional high-frequency transformer testing requires manual connection of the high-frequency transformer pins using jumper wires according to the drawing requirements, then using a fixture to clamp the corresponding pins, and then powering on the high-frequency transformer pins for testing.

[0044] Since there are many test items, such as conventional parameters and turn-to-turn withstand voltage and different connections for withstand voltage test pins, manual testing requires operators to connect the wires, remove the wires after testing one item, and then connect the wires according to the next test item. This is very cumbersome, labor-intensive, and has low test efficiency.

[0045] To solve the above problems, refer to Figure 1 、 Figure 2 、 Figure 3 、 Figure 4 and Figure 5 as well as Figure 6 , an embodiment of the utility model provides a transformer testing device, comprising: a carrier 100, a manipulator and a test fixture;

[0046] The carrier plate 100 is provided with a plurality of first placement plates 110 , each of which is provided with a first groove 120 for holding the transformer to be tested;

[0047] like Figure 5 and Figure 6 As shown, the test fixture includes a second placement plate 240, a pushing device 270, a probe and a sensing device 260;

[0048] The pushing device 270 can be an electric push rod or a pneumatic push rod, which can be selected according to actual needs.

[0049] The sensing device 260 may be an infrared sensing device 260 or a distance measuring device, which may be selected according to actual needs.

[0050] The second placement tray 240 is provided with a test space 250 for holding the transformer to be tested;

[0051] The sensing device 260 is used to detect whether the test space 250 contains a transformer to be tested;

[0052] The pushing device 270 is used to push the probe to contact the transformer to be tested when a transformer to be tested is placed in the test space 250 , so as to facilitate power-on testing through the probe.

[0053] The test fixture includes at least one of a conventional parameter fixture 210 , an inter-turn withstand voltage fixture 220 and a withstand voltage fixture 230 .

[0054] The conventional parameter fixture 210 is used to detect the conventional parameters of the transformer to be tested, and the conventional parameters include electrical strength, insulation resistance and performance parameters. Figure 5 shown.

[0055] The test fixture includes an inter-turn withstand voltage fixture 220;

[0056] The turn-to-turn withstand voltage fixture 220 is used to test the turn-to-turn withstand voltage of the transformer under test. The conventional parameter fixture 210 and the turn-to-turn withstand voltage fixture 220 have basically the same structure, except for the connection pins and test parameters.

[0057] The test fixture includes a pressure-resistant fixture 230;

[0058] The withstand voltage fixture 230 is used to test the withstand voltage of the transformer to be tested. Figure 6 shown.

[0059] As a preferred implementation of the embodiment of the present application, the conventional parameter fixture 210 and the inter-turn voltage withstand fixture 220 further include a fixture 280 , which is used to fix the second placement plate 240 on the test fixture.

[0060] The manipulator is used to move the transformer under test. Specifically, the manipulator first removes the transformer under test from the first groove 120 and then places it in the test space 250 of the conventional parameter fixture 210. After the conventional parameter test is completed, if the test fails, the manipulator returns the transformer under test in the test space 250 to the original first groove 120. If the test passes, the manipulator moves the transformer under test in the test space 250 of the conventional parameter fixture 210 to the test space 250 of the inter-turn withstand voltage fixture 220. After the inter-turn withstand voltage test is completed, if the test fails, the manipulator returns the transformer under test in the test space 250 to the original first groove 120. If the test passes, the manipulator moves the transformer under test in the test space 250 of the inter-turn withstand voltage fixture 220 to the test space 250 of the withstand voltage fixture 230. After the test is completed, the manipulator moves the transformer under test back to the original first groove 120. In this way, a serial number or serial number is set on the first placement tray 110, and the test results can be obtained.

[0061] It should be noted that transformers of different specifications or models have different sizes, so the size of the first groove 120 matches the size of the transformer to be tested, so as to avoid the transformer to be tested being easily shaken when placed in the first groove 120 when the first groove 120 is too large, affecting the robot's grasping.

[0062] In one embodiment, the first placement tray 110 is fixed to the carrier 100. For example, the first placement tray 110 and the carrier 100 are integrally formed. However, due to the varying specifications of the transformers to be tested, multiple sizes of carriers 100 are required in practice, each with a different size of first recess 120. Larger carriers 100 are more expensive and require more space for placement.

[0063] Therefore, in another embodiment, Figure 4 As shown, the carrier plate 100 is provided with a second groove;

[0064] The second groove is used to hold the first placement plate 110. The size of the second groove matches the size of the first placement plate 110.

[0065] In this way, only one carrier plate 100 is needed. If transformers of different specifications need to be tested, first placement plates 110 with different sizes of first grooves 120 can be prepared. That is, the first placement plates 110 of different specifications have the same size, and only the first grooves 120 thereon have different sizes.

[0066] In order to ensure that the transformer to be tested is stable in the first groove 120 in the first placement tray 110, the first placement tray 110 needs to remain stable when it is in the second groove. In this way, when it is necessary to test transformers of different specifications, it may be difficult to remove the first placement tray 110 when replacing the first placement tray 110.

[0067] To solve this problem, as a preferred implementation method of the embodiment of the present application, in order to facilitate the modification of the first placement plate 110, a third groove 130 is provided on at least one side of the second groove; that is, a third groove 130 is opened on the edge of the second groove.

[0068] The depth of the third groove 130 is less than that of the second groove, that is, the third groove 130 is shallow and does not affect the stability of the first placement plate 110 when it is in the second groove.

[0069] The second groove can be easily removed through the third groove 130 .

[0070] As a preferred implementation of the embodiment of the present application, it further includes: a guide rail 300 and a power device;

[0071] The power device is used to push the carrier plate 100 to move on the guide rail 300 .

[0072] The power device includes a motor and a transmission structure, such as a chain. The specific implementation method can be set according to actual needs and is not specifically limited in this application.

[0073] The power device can enable the operator to place the carrier 100 at a distance. Since the test fixture consumes electricity, the guide rail 300 and the power device can enable the operator to place the transformer to be tested on the carrier 100 without testing the fixture, thereby ensuring the operator's safety.

[0074] In order to ensure the stability of the transformer testing device, it also includes: a base 400;

[0075] The carrier plate 100 and the test fixture are disposed on the base 400 .

[0076] It should be noted that the test fixture also includes corresponding sensors or test tools, such as devices for obtaining parameters such as voltage, current, and inductance. The specific setting positions and quantities are set according to actual needs.

[0077] The transformer testing device provided in the embodiment of the present application includes a carrier, a manipulator and a test fixture. The carrier is provided with a plurality of first placement plates, and each first placement plate is provided with a first groove for holding the transformer to be tested, so that a plurality of transformers to be tested can be placed on the carrier at the same time. The manipulator is capable of moving the transformer to be tested. When the sensing device on the test fixture senses that a transformer to be tested is placed in the test space, the pushing device can contact the probe with the preset position of the transformer to be tested, so that the transformer to be tested is powered by the probe for testing. The present application solution does not require manual testing, and rapid measurement can be achieved through the manipulator and the test fixture, which increases the test speed while reducing labor intensity.

[0078] Based on the same inventive concept, an embodiment of the present application provides a transformer testing system, including: a transformer testing device as provided in the above embodiment.

[0079] In order to more clearly illustrate the present application solution, a specific implementation method is provided below.

[0080] Conventional high-frequency transformer testing requires manual connection of the high-frequency transformer pins using jumpers according to the drawing requirements, and then use a fixture (comprehensive tester fixture) to clamp the corresponding pins to test the high-frequency transformer pins. Figure 7 As shown in the figure, a structural diagram of the transformer is provided. According to the after-sales situation, an in-depth analysis of the defective high-frequency transformer was conducted. It was found that the black glue at the NC end hanging wire corresponding to the N6 winding of the high-frequency transformer exploded, the coil inside the black glue was melted and broken, and the 5- and 6-pin coils corresponding to the N2 winding were in an open circuit state.

[0081] Based on the above ideas, an automated transformer testing system was developed to achieve automated transformer testing. Conventional performance parameter testing, insulation withstand voltage testing, and interturn withstand voltage testing were integrated into a single device. A robot (computer + manipulator) was then used to automatically load and unload high-frequency transformers. All three devices were connected to a host computer, which also controlled the manipulator, setting relevant parameters. The system then set and tested the test parameters for the high-frequency transformers, automatically recording pass / fail information and isolating failed samples.

[0082] like Figure 1 、 Figure 2 、 Figure 3 、 Figure 4 and Figure 5 as well as Figure 6 As shown:

[0083] The functions of each device are as follows:

[0084] Guide rail: used for the motor and transmission mechanism to drive the carrier to reciprocate on the guide rail to form a motion mechanism;

[0085] Replaceable carrier: Different carriers are used according to the package size of the high-frequency transformer, mainly for limiting the high-frequency transformer;

[0086] Conventional parameter fixture: mainly used to test the conventional parameters of high-frequency transformers;

[0087] Inter-turn withstand voltage fixture: mainly used to test the inter-turn withstand voltage of high-frequency transformers;

[0088] Withstand voltage fixture: mainly used for withstand voltage testing of high-frequency transformers;

[0089] Base: Mainly for fastening the overall structure.

[0090] The overall operation of the device is as follows:

[0091] Power on the device.

[0092] After the device is powered on, the materials are manually loaded into the carrier.

[0093] Place the carrier into the guide rail.

[0094] Open the host computer software, call out the parameters that need to be tested (enter the corresponding coded test parameters into the device before testing), and automatically send the high-frequency transformer to be tested into the device through the carrier plate;

[0095] The six-axis robot grabs the sample to be tested and places it in the corresponding test fixture for testing of electrical strength, insulation resistance, performance parameters (inductance, leakage inductance, DC resistance, number of winding turns, etc.), inter-turn withstand voltage and withstand voltage and other parameters.

[0096] The electrical strength: the primary coil and the secondary coil (in Figure 7 For example: between N6 and N4), the withstand voltage between adjacent coils of the same level (in Figure 7 For example: between N6 and N2, or between N4 and N5);

[0097] Insulation resistance: primary coil and secondary coil (in Figure 7 For example: between N6 and N4), the insulation resistance between adjacent coils of the same level (in Figure 7 For example: between N6 and N2, or between N4 and N5)

[0098] Performance parameters: Figure 7 Take inductance measurement as an example: the inductance between pins 1-3.

[0099] After the test is completed, all test data will be automatically saved. If any unqualified samples are found during the test, the specific workstation or serial number of the defective product can be directly identified on the display monitoring screen (host computer), and the relevant parameters of the unqualified test items can be extracted.

[0100] The transformer testing system provided in an embodiment of the present application includes: a transformer testing device as provided in the above embodiment. The transformer testing device includes a carrier, a manipulator, and a test fixture. The carrier is provided with a plurality of first placement plates, each of which is provided with a first groove for holding a transformer to be tested, so that a plurality of transformers to be tested can be placed on the carrier at the same time. The manipulator is capable of moving the transformer to be tested. When the sensing device on the test fixture senses that a transformer to be tested is placed in the test space, the pushing device can bring the probe into contact with the preset position of the transformer to be tested, so that the transformer to be tested is powered by the probe for testing.

[0101] This application solution solves the following technical problems

[0102] 1. Solve the problem of manual soldering of high-frequency transformer pins and reduce employee fatigue.

[0103] 2. Solve the problem of cross-detection of multiple instruments and equipment, realize automatic testing by integrating multiple instruments together, and improve test efficiency.

[0104] 3. Automatic transformer testing is achieved, eliminating the need for frequent replacement of test equipment. High-frequency transformer performance parameters are tested one by one using a pre-set program. After the test, qualified and unqualified products are automatically distinguished, and the test data is automatically saved, improving the efficiency of incoming material inspection. Automatically determine the status results to prevent manual misjudgment and missed inspections.

[0105] This application solution does not require manual testing, and can achieve rapid measurement through a manipulator and a test fixture, thereby increasing the test speed and reducing labor intensity.

[0106] It can be understood that the same or similar parts of the above embodiments can be referenced to each other, and the contents not described in detail in some embodiments can refer to the same or similar contents in other embodiments.

[0107] It should be noted that, in the description of this application, the terms "first", "second", etc. are used for descriptive purposes only and should not be understood as indicating or implying relative importance. In addition, in the description of this application, unless otherwise specified, the meaning of "plurality" refers to at least two.

[0108] Throughout this specification, reference to terms such as "one embodiment," "some embodiments," "examples," "specific examples," or "some examples" means that a specific feature, structure, material, or characteristic described in conjunction with that embodiment or example is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0109] Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limitations on the present application. Ordinary technicians in this field can change, modify, replace and modify the above embodiments within the scope of the present application.

Claims

1. A transformer testing device, characterized in that: include: Carriers, manipulators, and test fixtures; The carrier plate is provided with a plurality of first placement plates, each of which is provided with a first groove for holding the transformer to be tested; The test fixture includes a second placement plate, a pushing device, a probe and a sensing device; The second placement tray is provided with a test space for holding the transformer to be tested; The manipulator is used to move the transformer to be tested; The sensing device is used to detect whether the test space contains a transformer to be tested; The pushing device is used to push the probe to contact the transformer to be tested when a transformer to be tested is placed in the test space, so as to facilitate power-on testing through the probe.

2. The transformer testing device according to claim 1, characterized in that: The test fixture includes a conventional parameter fixture, The conventional parameter fixture is used to detect conventional parameters of the transformer to be tested, and the conventional parameters include electrical strength, insulation resistance and performance parameters.

3. The transformer testing device according to claim 1, characterized in that: The test fixture includes an inter-turn withstand voltage fixture; The inter-turn withstand voltage fixture is used to detect the inter-turn withstand voltage of the transformer to be tested.

4. The transformer testing device according to claim 1, characterized in that: The test fixture includes a pressure-resistant fixture; The withstand voltage fixture is used to detect the withstand voltage of the transformer to be tested.

5. The transformer testing device according to claim 2 or 3, characterized in that: Also includes: fixture; The fixture is used to fix the second placement plate on the test fixture.

6. The transformer testing device according to claim 1, characterized in that: The carrier plate is provided with a second groove; The second groove is used to hold the first placement tray.

7. The transformer testing device according to claim 6, characterized in that: A third groove is provided on at least one side of the second groove; The depth of the third groove is smaller than the depth of the second groove.

8. The transformer testing device according to claim 1, characterized in that: Also includes: guide rails and power units; The power device is used to push the carrier plate to move on the guide rail.

9. The transformer testing device according to claim 1, characterized in that: Also includes: base; The carrier plate and the test fixture are arranged on the base.

10. A transformer testing system, characterized in that: include: A transformer testing device according to any one of claims 1 to 9.

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