Silicon controlled rectifier testing device and equipment
By introducing a current suppressor into the thyristor test device, the problem of long time consumption in thyristor electrical testing is solved, and the equipment damage rate is reduced and the test efficiency is improved.
Patent Information
- Application Number
- CN202422716964.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-07
- Publication Date
- 2025-09-12
- Estimated Expiration
- 2034-11-07
AI Technical Summary
The electrical testing process of thyristors takes too long, and the large number of test items leads to a high rate of equipment damage, affecting test efficiency.
Introduce a current suppressor into the test device to suppress current mutations through a choke module, current limiting module or anti-interference module to avoid equipment damage.
The damage rate of thyristors and test execution modules is reduced, the number of equipment replacements during testing is reduced, and test efficiency is improved.
Smart Images
Figure CN223333110U_ABST
Abstract
Description
Technical Field
[0001] The present disclosure relates to the technical field of thyristor testing, and in particular to a thyristor testing device and equipment. Background Art
[0002] A silicon controlled rectifier (SCR), also known as a thyristor, is a high-power electrical component with advantages such as small size, high efficiency, and long life. Due to the controllability of thyristors, they can be controlled to conduct and block by external triggers or control circuits, making them important components in the fields of electronics and power applications. For example, in automatic control systems, they can be used as high-power driver devices to control high-power devices with low-power controls. Before thyristors are put into production, they need to undergo multiple electrical tests. However, too many test items will cause the testing process to consume a lot of time. Therefore, how to improve the electrical testing efficiency of thyristors is a technical problem that those skilled in the art urgently need to solve. Utility Model Content
[0003] In order to solve the above technical problems or at least partially solve the above technical problems, the present disclosure provides a thyristor testing device and equipment.
[0004] The present disclosure provides a thyristor testing device, comprising: a current suppressor, a test execution module, and a test box; the test execution module is used to execute at least one test item of the thyristor to be tested; the test box is electrically connected to the test execution module via the current suppressor; the test box is used to test the breakdown voltage of the thyristor to be tested; wherein the current suppressor is used to suppress current mutations in a current loop formed by the test box and the test execution module during the test process.
[0005] Optionally, the current suppressor includes a choke module; the test box is electrically connected to the test execution module via the choke module; the choke module is used to suppress changes in current in the current loop.
[0006] Optionally, the choke module includes a wire-wound inductor.
[0007] Optionally, the current suppressor includes a current limiting module; the test box is electrically connected to the test execution module through the current limiting module; the current limiting module is used to reduce the sudden change current of the current loop.
[0008] Optionally, the current limiting module includes a current limiting resistor.
[0009] Optionally, the testing device further includes an anti-interference module; the test box is electrically connected to the test execution module via the anti-interference module; wherein the test box is also used to collect test data of the test execution module, and the anti-interference module is used to reduce interference with the test data collected by the test box.
[0010] Optionally, the anti-interference module includes a first resistor and a first inductor; the first resistor and the first inductor are connected in series, and the test box is electrically connected to the test execution module through the first resistor and the first inductor.
[0011] Optionally, the current suppressor includes a first plug connector and a second plug connector; the test box includes a first socket; the test execution module includes a second socket; the current suppressor is connected to the first socket through the first plug connector, and the current suppressor is connected to the second socket through the second plug connector.
[0012] Optionally, the test execution module includes: a device socket and a test circuit; the device socket is used to connect the thyristor to be tested; the test circuit is electrically connected to the device socket, and is used to execute at least one test item of the thyristor to be tested.
[0013] The present disclosure also provides a thyristor testing device, comprising any of the above thyristor testing devices.
[0014] The present disclosure provides a test device and equipment for thyristors. The test device for thyristors includes a current suppressor, a test box, and a test execution module. The thyristor to be tested is arranged in the test execution module, and the test execution module can execute at least one test item of the thyristor to be tested according to the test requirements of the test box. During the breakdown voltage test of the thyristor, the test box outputs a rated current to the test execution module to test the breakdown voltage of the thyristor to be tested. However, when the voltage of the thyristor to be tested reaches its maximum value, the current in the current loop formed by the test box and the test execution module will suddenly change, causing damage to the thyristor to be tested and the test execution module. The present disclosure provides a current suppressor between the test box and the test execution module. The current suppressor suppresses the current in the current loop, thereby suppressing the current sudden change, avoiding damage to the thyristor to be tested and the test execution module due to large current sudden changes during the test process, and reducing the damage rate of the thyristor to be tested and the test execution module. Since the damage rate of the thyristor to be tested and the test execution module is reduced, the number of times the damaged thyristor to be tested and the number of times the damaged test execution module is replaced can be reduced during the breakdown voltage test of the thyristor. Therefore, there is no need to stop the test to adjust the damaged device, thereby saving the time for the thyristor breakdown voltage test, reducing the test time of the entire thyristor, and improving the test efficiency of the thyristor. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments of the present application. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.
[0016] Figure 1 A schematic structural diagram of a thyristor testing device provided in an embodiment of the present disclosure.
[0017] Figure 2 A schematic structural diagram of another thyristor testing device provided in an embodiment of the present disclosure. DETAILED DESCRIPTION
[0018] The features and exemplary embodiments of various aspects of the present application will be described in detail below. In the detailed description below, many specific details are proposed to provide a comprehensive understanding of the present application. However, it will be apparent to those skilled in the art that the present application can be implemented without the need for some of these specific details. The following description of the embodiments is merely intended to provide a better understanding of the present application by illustrating the examples of the present application.
[0019] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The embodiments will be described in detail below with reference to the accompanying drawings.
[0020] Figure 1 A schematic diagram of a thyristor test device provided in an embodiment of the present disclosure is shown in FIG. Figure 1 As shown, the testing device includes a current suppressor 100, a test execution module 200, and a test box 300. The test execution module 200 is used to execute at least one test item of the thyristor under test; the test box 300 is electrically connected to the test execution module 200 via the current suppressor 100; the test box 300 is used to test the breakdown voltage of the thyristor under test; the current suppressor 100 is used to suppress sudden current changes in the current loop formed by the test box 300 and the test execution module 200 during the test process.
[0021] For example, during the breakdown voltage test, phenomena that may cause a sudden change in the current in the current loop formed by the test box 300 and the test execution module 200 include Zener breakdown, avalanche breakdown, and thermal breakdown.
[0022] It should be noted that the current suppressor 100 can also be used to suppress current mutation problems caused by other test items, which is not specifically limited here.
[0023] Specifically, the thyristor to be tested is arranged in the test execution module 200, and the test execution module 200 can execute at least one test item of the thyristor to be tested according to the test requirements of the test box 300. During the breakdown voltage test of the thyristor, the test box 300 outputs a rated current to the test execution module 200 to test the breakdown voltage of the thyristor to be tested. However, when the voltage of the thyristor to be tested reaches its maximum value, the current in the current loop formed by the test box 300 and the test execution module 200 will suddenly increase. The sudden increase in current can cause damage to the thyristor to be tested and the test execution module 200. The present disclosure provides a current suppressor 100 between the test box 300 and the test execution module 200. The current suppressor 100 limits the current size in the current loop formed by the test box 300 and the test execution module 200, so that even if the current in the current loop suddenly increases, it will not damage the thyristor to be tested and the test execution module 200. Alternatively, the current suppressor 100 can be used to suppress the rate of change of the current sudden change in the current loop, thereby preventing damage to the thyristor under test and the test execution module 200 due to a rapid current sudden change. Thus, the present disclosure achieves suppression of current sudden changes through the current suppressor 100, preventing damage to the thyristor under test and the test execution module 200 due to large current sudden changes in the loop during the test process, thereby reducing the damage rate of the thyristor under test and the test execution module 200. Furthermore, since the damage rate of the thyristor under test and the test execution module is reduced, the number of times damaged thyristors under test and damaged test execution modules need to be removed during the thyristor breakdown voltage test can be reduced, as can the number of times damaged thyristors need to be removed and damaged test execution modules need to be replaced. Therefore, there is no need to stop the test to adjust the damaged device, thereby saving time for the thyristor breakdown voltage test, reducing the entire thyristor test time, and improving the thyristor test efficiency.
[0024] In some embodiments, the current suppressor includes a choke module; the test box is electrically connected to the test execution module through the choke module; and the choke module is used to suppress changes in current in the current loop.
[0025] Specifically, the choke module is arranged between the test box and the test execution module, thereby connecting the choke module to the current loop formed by the test box and the test execution module, so that the current in the current loop will pass through the choke module. During the test process of the thyristor to be tested, the choke module will only affect the speed of the current change in the current loop, and will not affect the normal test of the thyristor to be tested. During the test process of the breakdown voltage of the thyristor, the test box will output a preset rated current to the test execution module, so that the thyristor to be tested will undergo a breakdown voltage test on the test execution module. When the voltage of the thyristor to be tested reaches the maximum value, the current in the current loop will suddenly change. The choke module can control the speed of change of the current sudden change, thereby achieving the suppression of the current sudden change, avoiding the thyristor to be tested and the test execution module from being damaged due to a large sudden change in current during the test process, thereby reducing the damage rate of the thyristor to be tested and the test execution module.
[0026] In some embodiments, the choke module includes a wirewound inductor. Figure 2 A structural diagram of another thyristor testing device provided in an embodiment of the present disclosure is shown in FIG. Figure 2 As shown, the testing device includes: a winding inductor L, a test execution module 200 and a test box 300 .
[0027] Specifically, the test box 300 includes a first output terminal 301, a second output terminal 302, a third output terminal 303, a fourth output terminal 304, a fifth output terminal 305, and a sixth output terminal 306. The test execution module 200 includes a first input terminal 201, a second input terminal 202, a third input terminal 203, a fourth input terminal 204, a fifth input terminal 205, and a sixth input terminal 206. The first output terminal 301 is electrically connected to the first input terminal 201, the second output terminal 302 is electrically connected to the second input terminal 202, the third output terminal 303 is electrically connected to the third input terminal 203 via a winding inductor L, the fourth output terminal 304 is electrically connected to the fourth input terminal 204 via a winding inductor L, the fifth output terminal 305 is electrically connected to the fifth input terminal 205, and the sixth output terminal 306 is electrically connected to the sixth input terminal 206. The test box 300 outputs test parameters to the test execution module through different output terminals according to different test requirements, so that the test execution module 200 executes the test items of the thyristor to be tested.
[0028] For the breakdown voltage test of a thyristor, a winding inductor L is disposed between the test box 300 and the test execution module 200, thereby connecting the winding inductor L to the current loop formed by the test box 300 and the test execution module 200, so that the current in the current loop passes through the winding inductor L. During the breakdown voltage test of the thyristor under test, when the voltage of the thyristor under test reaches its maximum value, the current in the current loop will suddenly change. The winding inductor L will then generate a back electromotive force due to the sudden change in current. The direction of the back electromotive force is opposite to the direction of the original electromotive force, thereby slowing down the change in current. Furthermore, the winding inductor L can also act as an energy storage device. After a sudden change in current occurs, the sudden current in the current loop will first charge the winding inductor L. After the winding inductor L completes energy storage, the current change in the current loop has stabilized, thereby preventing the instantaneous current flowing through the thyristor under test and the test execution module 200 from suddenly changing significantly. Therefore, the present disclosure suppresses current mutations through the winding inductor L, thereby preventing the thyristor to be tested and the test execution module 200 from being damaged due to large current mutations during the test process, thereby reducing the damage rate of the thyristor to be tested and the test execution module.
[0029] In some embodiments, the wirewound inductor comprises a variable inductor.
[0030] Specifically, since the breakdown voltages of different thyristors to be tested are different, the test voltages in the current loop formed by the test box and the test execution module are different, and the currents in the current loop are also different. Therefore, the present invention provides a variable inductor, which can adjust the inductance value of the variable inductor according to the current in the loop, so that the variable inductor can suppress current mutations during the breakdown voltage test of different thyristors to be tested.
[0031] In some embodiments, the current suppressor includes a current limiting module; the test box is electrically connected to the test execution module through the current limiting module; the current limiting module is used to reduce the sudden current of the current loop.
[0032] Specifically, the current limiting module is disposed between the test box and the test execution module, thereby connecting the current limiting module to the current loop formed by the test box and the test execution module, so that the current in the current loop will pass through the current limiting module. During the test process of the thyristor to be tested, the current limiting module will reduce the sudden change current of the current loop. Although the rated current output by the test box to the test execution module will pass through the current limiting module, in order to ensure the normal test of the thyristor to be tested, the test box can increase the output to ensure that the output current can still ensure the normal test of the thyristor to be tested after passing through the current limiting module. During the test process of the breakdown voltage of the thyristor, the test box will output a preset rated current to the test execution module, so that the thyristor to be tested undergoes a breakdown voltage test on the test execution module. When the voltage of the thyristor to be tested reaches its maximum value, the current in the current loop will suddenly change. Since the current will increase after the sudden change, the increased current value will exceed the withstand current of the thyristor to be tested and the test execution module, thereby damaging the thyristor to be tested and the test execution module. Therefore, the present invention sets a current limiting module to limit the current in the current loop, so that even if the current in the loop suddenly changes, it will not increase beyond the tolerance current of the thyristor to be tested and the test execution module, thereby suppressing the current mutation, avoiding damage to the thyristor to be tested and the test execution module due to large current mutations during the test process, and reducing the damage rate of the thyristor to be tested and the test execution module.
[0033] In some embodiments, the current limiting module includes a current limiting resistor.
[0034] Specifically, a current-limiting resistor is provided between the test box and the test execution module, thereby connecting the current-limiting resistor to the current loop formed by the test box and the test execution module, so that the current in the current loop will pass through the current-limiting resistor. During the test process of the thyristor to be tested, it is also necessary to refer to the parameters of the test box when setting the current-limiting resistor, optimize the parameters of the test box or adjust the resistance value of the current-limiting resistor to ensure that the current-limiting resistor does not affect the normal test process. The current-limiting resistor provided in the present disclosure will limit the current in the current loop, so that even if a sudden change occurs in the current in the loop, it will not increase to exceed the tolerance current of the thyristor to be tested and the test execution module, thereby achieving the suppression of the current sudden change, avoiding the thyristor to be tested and the test execution module from being damaged due to a large sudden change in the current during the test process, and achieving the reduction of the damage rate of the thyristor to be tested and the test execution module.
[0035] In some embodiments, the current limiting resistor includes a variable resistor.
[0036] Specifically, since the breakdown voltages of different thyristors to be tested are different, the test voltages in the current loop formed by the test box and the test execution module are different, and the currents in the current loop are also different. Therefore, the present invention provides a variable resistor, which can adjust the resistance of the variable resistor according to the current conditions in the loop, so that the current mutation can be suppressed by the variable resistor during the breakdown voltage test of different thyristors to be tested.
[0037] In some embodiments, the testing device further includes an anti-interference module; the test box is electrically connected to the test execution module via the anti-interference module; wherein the test box is also used to collect test data of the test execution module, and the anti-interference module is used to reduce interference with the test data collected by the test box.
[0038] Specifically, during the test of the thyristor to be tested, due to the inductance in the wires and other wires, when the current output by the test box to the test execution module suddenly changes, a voltage spike will be generated, thereby causing voltage oscillation. The present invention consumes the energy of the voltage spike through the anti-interference module set up, thereby eliminating the voltage oscillation, so that the relevant parameters of the thyristor to be tested finally detected by the test box are more accurate.
[0039] In some embodiments, the anti-interference module includes a first resistor and a first inductor; the first resistor and the first inductor are connected in series, and the test box is electrically connected to the test execution module through the first resistor and the first inductor.
[0040] Specifically, during the test of the thyristor to be tested, due to the inductance in the wires and other wires, a voltage spike will be generated when the current output from the test box to the test execution module suddenly changes, thereby causing voltage oscillation. The present invention forms an RL filter circuit by providing a first resistor and a first inductor in series between the test box and the test execution module. The generated voltage spike is filtered out by the RL filter circuit, thereby consuming the energy of the voltage spike to eliminate the voltage oscillation, so that the relevant parameters of the thyristor to be tested finally detected by the test box are more accurate.
[0041] In some embodiments, the current suppressor includes a first plug connector and a second plug connector; the test box includes a first socket; the test execution module includes a second socket; the current suppressor is connected to the first socket through the first plug connector, and the current suppressor is connected to the second socket through the second plug connector.
[0042] Specifically, during routine thyristor testing, the first and second connectors can be connected directly to each other via a connecting wire, thereby connecting the test box to the test execution module to test the thyristor under test. For tests that generate current changes, such as the thyristor breakdown voltage test, the first connector of the current suppressor can be connected to the first connector, and the second connector of the current suppressor can be connected to the second connector, thereby electrically connecting the test box to the test execution module through the current suppressor. This arrangement facilitates the installation and removal of the current suppressor, thereby improving the efficiency of thyristor testing.
[0043] In some embodiments, the test execution module includes a device socket for connecting to a thyristor to be tested and a test circuit, wherein the device socket is electrically connected to the device socket and is configured to execute at least one test item of the thyristor to be tested.
[0044] Specifically, the device socket includes a magnetic base, which can directly adsorb the thyristor to be tested on the device socket. After the thyristor to be tested is installed in the device socket, the test circuit is connected to the thyristor to be tested, and the test circuit can execute at least one test box of the thyristor to be tested according to the test requirements of the test box. The present disclosure ensures that during the test process, the thyristor to be tested can be fixed on the device socket without loosening and falling through the magnetic base set in the device socket. When the thyristor to be tested needs to be replaced, the magnetic base can be directly closed. Therefore, the present disclosure can not only strengthen the installation of the thyristor to be tested through the magnetic base in the device socket, but also facilitate the replacement of the thyristor to be tested, thereby improving the testing efficiency of the thyristor.
[0045] The present disclosure also provides a thyristor testing device, including the thyristor testing apparatus provided by any of the above embodiments.
[0046] It can be understood that the thyristor testing equipment provided in the embodiment of the present application can achieve the corresponding beneficial effects of the thyristor testing device provided in any of the above-mentioned embodiments, which will not be described in detail here.
[0047] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article, or device that includes a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or device that includes the element.
[0048] The above are merely specific embodiments of the present disclosure, intended to enable those skilled in the art to understand and implement the present disclosure. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present disclosure. Therefore, the present disclosure is not limited to these embodiments, but is to be construed in the broadest manner consistent with the principles and novel features disclosed herein.
Claims
1. A thyristor testing device, characterized in that: include: Current suppressor; A test execution module, the test execution module is used to execute at least one test item of the thyristor to be tested; A test box, electrically connected to the test execution module via the current suppressor; the test box is used to test the breakdown voltage of the thyristor to be tested; The current suppressor is used to suppress current mutations in the current loop formed by the test box and the test execution module during the test process.
2. The testing device according to claim 1, wherein: The current suppressor includes a choke module; the test box is electrically connected to the test execution module through the choke module; the choke module is used to suppress the change of the current in the current loop.
3. The testing device according to claim 2, characterized in that The choke module includes a winding inductor.
4. The testing device according to claim 1, wherein: The current suppressor includes a current limiting module; the test box is electrically connected to the test execution module through the current limiting module; the current limiting module is used to reduce the sudden change current of the current loop.
5. The testing device according to claim 4, characterized in that: The current limiting module includes a current limiting resistor.
6. The testing device according to claim 1, wherein: It also includes an anti-interference module; the test box is electrically connected to the test execution module through the anti-interference module; The test box is further used to collect test data of the test execution module, and the anti-interference module is used to reduce interference with the test data collected by the test box.
7. The testing device according to claim 6, characterized in that The anti-interference module includes a first resistor and a first inductor; the first resistor and the first inductor are connected in series, and the test box is electrically connected to the test execution module through the first resistor and the first inductor.
8. The testing device according to claim 1, wherein: The current suppressor includes a first plug connector and a second plug connector; the test box includes a first socket; the test execution module includes a second socket; The current suppressor is connected to the first socket via the first plug connector, and the current suppressor is connected to the second socket via the second plug connector.
9. The testing device according to claim 1, wherein: The test execution module includes: A device socket, used for connecting the thyristor to be tested; A test circuit is electrically connected to the device socket and is used to execute at least one test item of the thyristor to be tested.
10. A thyristor testing device, characterized in that: A testing device comprising a thyristor as claimed in any one of claims 1 to 9.