Modularized scanning electron microscope sample table for nuclear power sample

Abstract

The utility model relates to a nuclear power sample modularized scanning electron microscope sample stage, which is characterized in that a plurality of profiling grooves are arranged on a first surface of a separator, so that the sample can be matched according to the characteristics of samples with different geometric dimensions, and the samples cannot move or fall off in the test process, thereby ensuring the accuracy and reliability of the test result. After the plane device is aligned with the device, the top of the plane device can form a reliable plane together with the top of the isolation piece and the top of the limiting plate, and a sample can be pasted and fixed through the plane. By means of the mounting holes formed in the limiting plate and the detachable fastening device, different fastening modes can be selected according to actual needs, the sample can be fixed through the profiling groove and can also be directly fixed to the second surface of the isolation piece, and the requirements of samples of different shapes and sizes are met. The fastening device is detachably inserted into the limiting plate, so that the sample is clamped and released more simply and quickly, and the testing efficiency is further improved.

Description

Technical Field

[0001] The utility model relates to the field of nuclear power, in particular to a modular scanning electron microscope sample stage for nuclear power samples. Background Art

[0002] As an indispensable research tool in modern materials science, scanning electron microscopy (SEM) provides extremely important information at the microscopic scale, including the surface morphology, chemical composition distribution, and crystal structure of samples. This data is crucial for understanding the fundamental properties of materials and their potential applications.

[0003] Although SEM plays an irreplaceable role in materials analysis, sample preparation and fixation remain a key technical bottleneck in actual operation. This is especially true when performing cross-sectional tests on tubes or sheets of varying geometric dimensions. Traditional sample trays often struggle to meet the requirements for efficient and stable sample fixation. Specifically, the following major issues currently exist:

[0004] First, to ensure clear images of non-conductive or weakly conductive materials under the SEM, conductive adhesive is often used to adhere the sample to the sample holder. However, this method is not only time-consuming and labor-intensive, but also, due to the limited viscosity of the conductive adhesive, it may cause the sample to fall off during testing.

[0005] Secondly, using a large amount of conductive glue to fix the sample often blocks part of the sample area, thereby reducing the effective area available for analysis, which directly affects the test efficiency and the statistical representativeness of the data.

[0006] In addition, when samples of various geometric sizes need to be tested, frequent sample changes are not only time-consuming but may also introduce additional human errors. Utility Model Content

[0007] The technical problem to be solved by the utility model is to provide a modular scanning electron microscope sample stage for nuclear power samples, which can solve the problems of low testing efficiency and high probability of human error.

[0008] The utility model provides a modular scanning electron microscope sample stage for nuclear power samples, which includes:

[0009] A fixing device, the fixing device comprising a base, an isolating member, and two limiting plates, the two limiting plates being arranged opposite to each other on the base, the isolating member being arranged between the two limiting plates, the isolating member having a first surface and a second surface, the first surface being provided with a plurality of contoured grooves;

[0010] a planar device detachably mounted on the base, such that the planar device abuts against the second surface and one of the limit plates, and the top of the planar device is aligned with the top surface of the isolating member and the top surface of the limit plate; and

[0011] At least one fastening device is detachably inserted into any one of the limiting plates, so that the fastening device fixes the sample against the contoured groove, or the fastening device fixes the sample against the second surface.

[0012] Preferably, each of the limiting plates is provided with a plurality of through holes arranged along a straight line, and each of the through holes is provided for the fastening device to pass through and be fixed thereto, so that the fastening device is exposed between the limiting plate and the isolating member.

[0013] Preferably, the modular scanning electron microscope sample stage for nuclear power samples includes several of the fastening devices, each of which includes a first threaded section, a sliding rod section, a second threaded section and a limiting section connected in sequence, the first threaded section and the second threaded section are both threadedly matched with the through hole, the diameter of the sliding rod section is smaller than the aperture of the through hole, and the diameter of the limiting section is larger than the aperture of the through hole.

[0014] Preferably, the first threaded section is provided with a soft portion on the end away from the sliding rod section, and the soft portion is detachably supported on the sample.

[0015] Preferably, the first thread segment, the sliding rod segment, the second thread segment and the limiting segment are an integrally formed structure.

[0016] Preferably, the fastening device comprises an elastic rod, and the elastic rod is detachably arranged in the through hole, so that the elastic rod holds the sample against the isolation member.

[0017] Preferably, the fixing device further comprises an electron microscope connecting column, and the electron microscope connecting column is arranged at the bottom of the base.

[0018] Preferably, the planar device comprises a base and a convex block, wherein the convex block is arranged on the base;

[0019] The seat body is provided with a sliding mounting hole, and the protrusion is detachably and slidably arranged in the sliding mounting hole, so that the top of the base body is aligned with the top of the isolation member and the top of the limiting plate respectively.

[0020] Preferably, the protrusion is in the shape of an elongated strip.

[0021] Preferably, the shape of the protrusion is adapted to the hole wall profile of the sliding mounting hole.

[0022] The implementation of this utility model has the following beneficial effects:

[0023] The utility model relates to a modular scanning electron microscope sample stage for nuclear power samples. By providing a plurality of contoured grooves on the first surface of an isolating member, the stage can be adapted to the characteristics of samples of different geometric sizes, ensuring that the sample does not move or fall off during testing, thereby ensuring the accuracy and reliability of the test results. After the planar device is aligned, the top of the planar device can form a reliable flat surface together with the top of the isolating member and the limit plate, through which the sample can be attached and fixed.

[0024] The mounting holes and removable fastening device on the limit plate allow for different fastening methods to be selected based on actual needs. Samples can be secured via the contoured grooves or directly secured to the second surface of the isolator, accommodating samples of varying shapes and sizes. The removable fastening device is inserted into the limit plate, making sample clamping and release simpler and faster, further improving testing efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The above and other objects, features and advantages of the present invention will become more apparent by describing in more detail exemplary embodiments of the present invention in conjunction with the accompanying drawings, wherein the same reference numerals generally represent the same components in the exemplary embodiments of the present invention.

[0026] Figure 1 This is a schematic structural diagram of a modular scanning electron microscope sample stage for nuclear power samples in some embodiments of the present invention;

[0027] Figure 2 It is a schematic structural diagram of a modular scanning electron microscope sample stage for nuclear power samples in some embodiments of the present invention in another usage state;

[0028] Figure 3 From another perspective Figure 1 The schematic diagram of the structure of the modular scanning electron microscope sample stage for nuclear power samples is shown. DETAILED DESCRIPTION

[0029] The following describes embodiments of the present invention in more detail with reference to the accompanying drawings. Although the accompanying drawings illustrate embodiments of the present invention, it should be understood that the present invention can be implemented in various forms and should not be limited by the embodiments described herein. Rather, these embodiments are provided to make the present invention more thorough and complete, and to fully convey the scope of the present invention to those skilled in the art.

[0030] It should be understood that although the terms "first", "second", "third", etc. may be used in the present invention to describe various information, such information should not be limited to these terms. These terms are only used to distinguish information of the same type from each other. For example, without departing from the scope of the present invention, the first information may also be referred to as the second information, and similarly, the second information may also be referred to as the first information. Thus, features defined as "first" or "second" may explicitly or implicitly include one or more of such features. In the description of the present invention, "multiple" means two or more, unless otherwise clearly and specifically defined.

[0031] In the description of the present invention, it should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0032] Unless otherwise expressly specified or limited, the terms "mounted," "connected," "connect," "fixed," and the like should be interpreted broadly. For example, they may refer to fixed connection, detachable connection, or integration; mechanical connection, electrical connection; direct connection, or indirect connection through an intermediate medium; and internal communication between two components or interaction between two components. Those skilled in the art will understand the specific meanings of the above terms in this utility model based on specific circumstances.

[0033] Figure 1 A modular scanning electron microscope sample stage 10 for nuclear power samples in some embodiments of the present invention is shown. The modular scanning electron microscope sample stage 10 for nuclear power samples is used to clamp and fix samples of various shapes.

[0034] The modular scanning electron microscope sample stage 10 for nuclear power samples includes a fixing device 1, a plane device 2 and at least one fastening device 3. The plane device 2 can be detachably arranged on the fixing device 1, and the fastening device 3 can be detachably arranged on the fixing device 1, so that the fastening device 3 can hold and fix the object on the fixing device 1 accordingly.

[0035] like Figures 1 to 3 As shown, the fixing device 1 includes a base 11, an isolation member 12 and two limit plates 13. The two limit plates 13 are relatively arranged on the base 11, and the isolation member 12 is arranged between the two limit plates 13. The isolation member 12 has a first surface 121 and a second surface 122. A plurality of contour grooves 123 are opened on the first surface 121.

[0036] As will be understood, the base 11 is used to support other components. The isolation member 12 is located between two limiting plates 13 and has a first surface 121 and a second surface 122. The first surface 121 is provided with a plurality of contoured grooves 123 for adapting to the characteristics of samples of varying geometric dimensions. The two limiting plates 13 are positioned opposite each other on the base 11, supporting the isolation member 12 and providing a mounting location for the fastening device 3.

[0037] The planar device 2 is detachably mounted on the base 11 , so that the planar device 2 abuts against the second surface 122 and one of the limiting plates 13 , and the top of the planar device 2 is aligned with the top surface of the isolation member 12 and the top surface of the limiting plate 13 .

[0038] As can be understood, the top of the removable mounting member 11 is aligned with the top surface of the isolation member 12 and the top surface of the retaining plate 13, forming a flat surface for easy placement and fixation of the sample. The flat surface member 2 abuts against the second surface 122 of the isolation member 12 and one of the retaining plates 13, ensuring stability and flatness of the sample after fixation.

[0039] The fastening device 3 can be detachably inserted into any of the limiting plates 13 , so that the fastening device 3 fixes the sample against the contoured groove 123 , or fixes the sample against the second surface 122 .

[0040] It can be understood that it can be detachably inserted into any of the limiting plates 13 to fix the sample in the contoured groove 123 of the first surface 121 of the isolation member 12, or directly fixed to the second surface 122. The design of the fastening device 3 allows the sample to be firmly fixed, preventing movement or falling off during the test.

[0041] It should be noted that, depending on the sample's shape, the sample can be placed between the first surface 121 and the limiting plate 13, with the contoured groove 123 adapted to the sample's shape, and the groove wall of the contoured groove 123 conforming to the sample's contour. The second surface 122 and the limiting plate 13 can correspondingly clamp a sample of another contour.

[0042] Furthermore, if the sample is cylindrical in shape, the contoured groove 123 can be configured as a curved surface, the diameter of which matches the diameter of the cylindrical sample, so that after the cylindrical sample is placed in the contoured groove 123, the groove wall of the contoured groove 123 can closely fit the outer peripheral wall of the cylindrical sample. The cylindrical shape can be a cylinder, a prism, or an irregularly shaped column.

[0043] like Figures 1 to 3As shown, in some embodiments of the modular scanning electron microscope sample stage 10 for nuclear power samples, each limiting plate 13 is provided with a plurality of through holes 131 arranged along a straight line, and each through hole 131 is provided for the fastening device 3 to pass through and be fixed, so that the fastening device 3 is exposed between the limiting plate 13 and the isolation member 12.

[0044] As can be understood, each limiting plate 13 is provided with a plurality of through holes 131 arranged along a straight line. This arrangement allows the fastening device 3 to be inserted into different positions as needed, thereby accommodating samples of different sizes and shapes. After the fastening device 3 passes through these through holes 131, the sample can be fixed within the contoured groove 123 of the first surface 121 of the isolating member 12, or directly fixed to the second surface 122 of the isolating member 12. After the fastening device 3 passes through the through holes 131, a portion of it is exposed between the limiting plate 13 and the isolating member 12. This ensures that the fastening device 3 maintains a stable position when fixing the sample and also facilitates adjustment by the operator.

[0045] It should be noted that by providing multiple through-holes 131 arranged in a straight line on the limiting plate 13, the appropriate fastening position can be selected according to the size and shape of the sample, thereby improving the flexibility and versatility of the clamping mechanism. After the fastening device 3 passes through the through-hole 131, the sample can be directly fixed in the appropriate position without the need for complex adjustment steps, simplifying the operation process and reducing the difficulty. The partial exposure of the fastening device 3 between the limiting plate 13 and the isolation member 12 helps ensure that the sample remains stable during the test, reducing the risk of sample movement or dislodgment, thereby improving the accuracy and reliability of the test results.

[0046] like Figures 1 to 3 As shown, in some embodiments of the modular scanning electron microscope sample stage 10 for nuclear power samples, the modular scanning electron microscope sample stage 10 for nuclear power samples includes a plurality of fastening devices 3, each fastening device 3 includes a first threaded segment 31, a sliding rod segment 32, a second threaded segment 33 and a limiting segment 34 connected in sequence, the first threaded segment 31 and the second threaded segment 33 are both threadedly engaged with the through hole 131, the diameter of the sliding rod segment 32 is smaller than the aperture of the through hole 131, and the diameter of the limiting segment 34 is larger than the aperture of the through hole 131.

[0047] It can be understood that each fastening device 3 includes a first threaded section 31, a sliding rod section 32, a second threaded section 33 and a limiting section 34 connected in sequence. The first threaded section 31 is threadedly engaged with the through hole 131 on the limiting plate 13, and is used to fix the fastening device 3 on the limiting plate 13. The diameter of the sliding rod section 32 is smaller than the aperture of the through hole 131, so that the fastening device 3 can slide between the limiting plate 13 and the isolation member 12 to better position and fix the sample. The second threaded section 33 is also threadedly engaged with the through hole 131 to fix the position of the fastening device 3. The diameter of the limiting section 34 is larger than the aperture of the through hole 131, and serves to limit the fastening device 3 to the extreme position on the limiting plate 13.

[0048] It should be noted that the first thread segment 31 and the second thread segment 33 are used to cooperate with the isolation member 12 at different positions, so as to be screwed and adapted at different positions, and then adjust the exposed length of the fastening device 3 between the isolation member 12 and the limiting plate 13, so that samples of different sizes can be held and fixed.

[0049] In some embodiments of the modular SEM sample stage 10 for nuclear power samples, a soft portion is provided on the end of the first threaded section 31 away from the slide rod section 32 , and the soft portion is detachably supported on the sample.

[0050] It is understandable that the soft portion can be formed by a process such as dipping, or can be pre-made and then sleeved on the first threaded segment 31. The provision of the soft portion can prevent the fastening device 3 from causing contact wear on the surface of the sample, and can also prevent the fastening device 3 itself from being worn, thereby ensuring the durability of the product.

[0051] like Figures 1 to 3 As shown, in some embodiments of the modular scanning electron microscope sample stage 10 for nuclear power samples, the first thread segment 31 , the slide rod segment 32 , the second thread segment 33 and the limiting segment 34 are an integrally formed structure.

[0052] It can be understood that the first thread segment 31, the slide rod segment 32, the second thread segment 33 and the limiting segment 34 are configured to be integrally formed, which can improve the connection strength of the connection positions of the components and improve durability.

[0053] In other embodiments of the modular SEM sample stage 10 for nuclear power samples, the fastening device 3 includes an elastic rod, which is detachably disposed in the through hole 131 , so that the elastic rod holds the sample against and fixes it on the isolation member 12 .

[0054] As can be understood, the fastening device 3 is configured as a resilient rod-shaped structure that can return to its original shape after compression or stretching. The elastic rod can be inserted into the through hole 131 of the retaining plate 13 and is held in place by a mechanism (such as friction or other locking mechanism). One end of the elastic rod can support the sample, while the other end is fixed to the retaining plate 13. The sample is secured by the elastic deformation of the elastic rod.

[0055] Furthermore, the elastic rod can be configured to include a long rod slidably set in the through hole 131 and a spring sleeved on the long rod, one end of the spring is limited to the end of the long rod, and the other end of the spring is abutted on the limiting plate 13, so that the elastic force of the spring can drive the long rod to slide, so that the long rod can abut on the sample, and then abut and fix the sample on the isolation member 12.

[0056] like Figures 1 to 3 As shown, in some embodiments of the modular scanning electron microscope sample stage 10 for nuclear power samples, the fixing device 1 further includes an electron microscope connecting column 14 , which is disposed at the bottom of the base 11 .

[0057] As can be understood, the electron microscope connecting post 14 is provided at the bottom of the base 11 for connecting the entire clamping mechanism to a scanning electron microscope (SEM). The design of the electron microscope connecting post 14 ensures that the clamping mechanism can be stably installed in the SEM, facilitating SEM testing.

[0058] like Figures 1 to 3 As shown, in some embodiments of the modular scanning electron microscope sample stage 10 for nuclear power samples, the planar device 2 includes a base 21 and a protrusion 22, and the protrusion 22 is arranged on the base 21; a sliding mounting hole 111 is opened on the base 11, and the protrusion 22 is detachably slidably arranged in the sliding mounting hole 111, so that the top of the base 21 is aligned with the top of the isolation member 12 and the top of the limit plate 13 respectively.

[0059] As can be understood, the base 21 is used to support the protrusion 22. The protrusion 22 is provided on the base 21 and has a specific shape, which can be inserted into the sliding mounting hole 111 on the base 11. The sliding mounting hole 111 is provided on the base 11 to accommodate the protrusion 22, allowing the protrusion 22 to slide therein.

[0060] The sample is fixed in the contoured groove 123 of the first surface 121 of the isolation member 12 using the fastening device 3 , or is directly fixed on the second surface 122 of the isolation member 12 .

[0061] Specifically, in some embodiments of the modular scanning electron microscope sample stage 10 for nuclear power samples, the protrusion 22 is in the shape of an elongated strip.

[0062] like Figures 1 to 3As shown, in some embodiments of the modular scanning electron microscope sample stage 10 for nuclear power samples, the shape of the protrusion 22 is adapted to the hole wall profile of the sliding mounting hole 111 .

[0063] It can be understood that the shape of the protrusion 22 is adapted to the hole wall contour of the sliding mounting hole 111, so that the outer shape design of the protrusion 22 matches the internal shape of the sliding mounting hole 111 to ensure that the protrusion 22 can slide smoothly in the sliding mounting hole 111 without falling off.

[0064] The implementation of this utility model has the following beneficial effects:

[0065] The utility model relates to a modular scanning electron microscope sample stage for nuclear power samples. By providing a plurality of contoured grooves on the first surface of an isolating member, the stage can be adapted to the characteristics of samples of different geometric sizes, ensuring that the sample does not move or fall off during testing, thereby ensuring the accuracy and reliability of the test results. After the planar device is aligned, the top of the planar device can form a reliable flat surface together with the top of the isolating member and the limit plate, through which the sample can be attached and fixed.

[0066] The mounting holes and removable fastening device on the limit plate allow for different fastening methods to be selected based on actual needs. Samples can be secured via the contoured grooves or directly secured to the second surface of the isolator, accommodating samples of varying shapes and sizes. The removable fastening device is inserted into the limit plate, making sample clamping and release simpler and faster, further improving testing efficiency.

[0067] The scheme of the present invention has been described in detail above with reference to the accompanying drawings. In the above embodiments, the descriptions of each embodiment have their own emphases. For parts that are not described in detail in a certain embodiment, please refer to the relevant descriptions of other embodiments. Those skilled in the art should also be aware that the actions and modules involved in the description are not necessarily required for the present invention. In addition, it can be understood that the steps in the method of the embodiment of the present invention can be adjusted in sequence, merged and deleted according to actual needs, and the modules in the device of the embodiment of the present invention can be merged, divided and deleted according to actual needs.

[0068] While various embodiments of the present invention have been described above, the above descriptions are illustrative and non-exhaustive, and are not intended to be limiting of the disclosed embodiments. Many modifications and variations will be apparent to those skilled in the art without departing from the scope and spirit of the described embodiments. The terminology used herein is selected to best explain the principles of the embodiments, their practical applications, or improvements to existing technologies, or to enable others skilled in the art to understand the embodiments disclosed herein.

Claims

1. A modular scanning electron microscope sample stage for nuclear power samples, characterized in that: include: A fixing device, the fixing device comprising a base, an isolating member, and two limiting plates, the two limiting plates being arranged opposite to each other on the base, the isolating member being arranged between the two limiting plates, the isolating member having a first surface and a second surface, the first surface being provided with a plurality of contoured grooves; a planar device detachably mounted on the base, such that the planar device abuts against the second surface and one of the limit plates, and the top of the planar device is aligned with the top surface of the isolation member and the top surface of the limit plate; and At least one fastening device is detachably inserted into any one of the limiting plates, so that the fastening device fixes the sample against the contoured groove, or the fastening device fixes the sample against the second surface.

2. The modular scanning electron microscope sample stage for nuclear power samples according to claim 1, characterized in that: Each of the limiting plates is provided with a plurality of through holes arranged along a straight line, and each of the through holes is provided for the fastening device to pass through and be fixed thereto, so that the fastening device is exposed between the limiting plate and the isolating member.

3. The modular scanning electron microscope sample stage for nuclear power samples according to claim 2, characterized in that: The modular scanning electron microscope sample stage for nuclear power samples includes several fastening devices, each of which includes a first threaded section, a sliding rod section, a second threaded section and a limiting section connected in sequence. The first threaded section and the second threaded section are both threadedly matched with the through hole. The diameter of the sliding rod section is smaller than the aperture of the through hole, and the diameter of the limiting section is larger than the aperture of the through hole.

4. The modular scanning electron microscope sample stage for nuclear power samples according to claim 3, characterized in that: The first threaded section is provided with a soft portion on the end away from the sliding rod section, and the soft portion is detachably supported on the sample.

5. The modular scanning electron microscope sample stage for nuclear power samples according to claim 3 or 4, characterized in that: The first thread segment, the slide rod segment, the second thread segment and the limiting segment are an integrally formed structure.

6. The modular scanning electron microscope sample stage for nuclear power samples according to claim 2, characterized in that: The fastening device includes an elastic rod, which is detachably arranged in the through hole, so that the elastic rod holds the sample against the isolation member.

7. The modular scanning electron microscope sample stage for nuclear power samples according to claim 1, characterized in that: The fixing device also includes an electron microscope connecting column, and the electron microscope connecting column is arranged at the bottom of the base.

8. The modular scanning electron microscope sample stage for nuclear power samples according to claim 1, characterized in that: The planar device includes a base and a bump, wherein the bump is arranged on the base; The seat body is provided with a sliding mounting hole, and the protrusion is detachably and slidably arranged in the sliding mounting hole, so that the top of the base body is aligned with the top of the isolation member and the top of the limiting plate respectively.

9. The modular scanning electron microscope sample stage for nuclear power samples according to claim 8, characterized in that: The protrusion is in the shape of an elongated strip.

10. The modular scanning electron microscope sample stage for nuclear power samples according to claim 9, characterized in that: The shape of the protrusion is adapted to the hole wall profile of the sliding mounting hole.

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