Super-resolution imaging device of super-resolution imaging probe

Abstract

The utility model discloses a super-resolution imaging device of a super-resolution imaging probe, which belongs to the technical field of optical microscopic imaging and comprises an imaging structure for random optical reconstruction super-resolution imaging, an imaging structure for stimulated radiation loss super-resolution imaging and an imaging structure for ground state depletion super-resolution imaging. The device can be simultaneously suitable for random optical reconstruction super-resolution imaging detection, stimulated radiation loss super-resolution imaging and ground state depletion super-resolution imaging, is simple in structure and high in integration level, and can minimize the damage of a light source to cells and a probe and improve the imaging quality under the synergistic effect of low-power laser.

Description

Technical Field

[0001] The utility model belongs to the technical field of optical microscopic imaging, and in particular relates to a super-resolution imaging device of a super-resolution imaging probe. Background Art

[0002] Super-resolution imaging refers to imaging technology that can break the resolution limit of optical microscopes, including single-molecule localization super-resolution imaging and point spread engineering super-resolution imaging.

[0003] Single-molecule localization super-resolution imaging, especially stochastic optical reconstruction super-resolution imaging, is based on two single-molecule fluorescence imaging technologies, STORM and PALM. By using special fluorescent dyes or markers in the sample, it causes a random light-on and light-off process. During this process, each marker will randomly emit a fluorescent signal, which is recorded by the camera. By statistically analyzing these fluorescent signals, the spatial position information of each marker can be obtained. By combining this position information, a high-resolution image can be reconstructed.

[0004] Point spread function engineering super-resolution imaging, by modulating the laser illumination mode to change the point spread function of the imaging system, to achieve imaging technology beyond the traditional optical resolution limit, including stimulated emission depletion super-resolution imaging and ground state depletion super-resolution imaging. Stimulated emission depletion super-resolution imaging, based on the principle of stimulated emission, introduces a special depletion light, which is superimposed on the excitation light and acts on the sample. The excitation light puts the fluorescent molecules in the sample in an excited state, while the depletion light causes the molecules in the edge area of ​​the excited fluorescent molecules to return to the ground state through the stimulated emission process, thereby suppressing the fluorescence emission in these areas. Only the fluorescent molecules in the central area can spontaneously radiate fluorescence, forming a smaller Luminous point, thereby achieving imaging resolution technology beyond the diffraction limit, ground state depletion super-resolution imaging, when the sample is irradiated by excitation light, the labeled molecules absorb light energy and transition from the ground state to the excited state. Subsequently, by introducing a high-intensity loss light, the loss light overlaps with the excitation light in space and acts on the labeled molecules in the excited state. Due to the effect of the loss light, these excited state labeled molecules will quickly return to the ground state by stimulated radiation and no longer emit fluorescence. Under the action of the loss light, only a small amount of labeled molecules that are not irradiated by the loss light and are still in the ground state can emit fluorescence and be captured by the detector, thereby realizing the technology of super-resolution imaging of the sample.

[0005] At present, the imaging structures of random optical reconstruction super-resolution imaging, stimulated emission depletion super-resolution imaging and ground state depletion super-resolution imaging are all independent structures. There is no imaging device that can simultaneously meet the requirements of random optical reconstruction super-resolution imaging, stimulated emission depletion super-resolution imaging and ground state depletion super-resolution imaging.

[0006] In view of this, a super-resolution imaging device of a super-resolution imaging probe is designed to solve the above problems. Utility Model Content

[0007] In order to solve the problems raised in the above background technology, the utility model provides a super-resolution imaging device of a super-resolution imaging probe, which is applicable to random optical reconstruction super-resolution imaging detection, stimulated emission depletion super-resolution imaging and ground state depletion super-resolution imaging, has a simple structure and high integration, and can minimize the damage of the light source to cells and probes under the synergistic effect of low-power laser, thereby improving the imaging quality.

[0008] To achieve the above objectives, the present invention provides the following technical solutions: a super-resolution imaging device for a super-resolution imaging probe, comprising:

[0009] The imaging structure of random optical reconstruction super-resolution imaging includes: a first light source assembly, a first carrier assembly, a first optical path assembly, and a first receiving terminal, wherein the first light source assembly generates short-wavelength excitation light, the first carrier assembly carries the sample, the first optical path assembly splits the short-wavelength excitation light into two, one of which is focused on the carried sample, and collects the fluorescence signal reflected by the sample for transmission, and the first receiving terminal receives the collected fluorescence signal for analysis, processing, and imaging;

[0010] The imaging structure of stimulated emission depletion super-resolution imaging includes: a second light source component, a second carrier component, a second optical path component and a second receiving terminal, wherein the second light source component generates long-wavelength excitation light, the second carrier component is the first carrier component, the second optical path component converts the long-wavelength excitation light into a ring laser with a weak center and a strong outer ring, and combines it with another short-wavelength excitation light beam to form a composite laser beam, which is focused on the carrier sample and collects the fluorescence signal reflected by the sample for transmission. The second receiving terminal receives the collected fluorescence signal for analysis, processing and imaging;

[0011] The imaging structure of ground state depletion super-resolution imaging includes: a third light source assembly, a third carrier assembly, a third optical path assembly and a third receiving terminal, wherein the third light source assembly is the second light source assembly, the third carrier assembly is the second carrier assembly, the third optical path assembly is the second optical path assembly, and the third receiving terminal receives the collected fluorescence signal for analysis, processing and imaging.

[0012] Furthermore, the first light source assembly includes:

[0013] Short-wavelength laser, produces short-wavelength excitation light.

[0014] Furthermore, the first carrier assembly includes:

[0015] The stage carries the sample labeled with the super-resolution imaging probe.

[0016] Furthermore, the first optical path component includes:

[0017] The first quarter-wave plate adjusts the polarization of the short-wavelength excitation light;

[0018] A first polarizer, adjusting the polarization of the short-wavelength excitation light;

[0019] A first beam expander collimator is used to expand the spot diameter of the short-wavelength excitation light and collimate the short-wavelength excitation light beam;

[0020] The first half-wave plate adjusts the polarization of the short-wavelength excitation light;

[0021] A beam splitter that splits the short-wavelength excitation light into two;

[0022] The second quarter-wave plate adjusts the polarization of the short-wavelength excitation light;

[0023] A second polarizer adjusts the polarization of the short-wavelength excitation light;

[0024] a second beam expander collimator, which expands the spot diameter of the short-wavelength excitation light and collimates the short-wavelength excitation light beam;

[0025] A first reflector, reflecting short-wavelength excitation light;

[0026] a second reflector, reflecting short-wavelength excitation light;

[0027] The objective lens focuses the laser onto the sample on the stage and collects the fluorescence signal reflected from the sample. The concave / flat mirror collects the fluorescence signal reflected upward from the sample.

[0028] The first dichroic mirror transmits the excitation light and reflects the fluorescence signal;

[0029] The first lens focuses the fluorescent signal.

[0030] Furthermore, the first receiving terminal includes:

[0031] The first electron multiplying charge-coupled device, which detects photons quickly and with high sensitivity;

[0032] The computer receives the image collected by the first electron multiplying charge coupled device and performs data processing and analysis. Furthermore, the second light source assembly includes:

[0033] a first light source assembly;

[0034] Long wavelength laser, produces long wavelength excitation light.

[0035] Furthermore, the second optical path component includes:

[0036] a first optical path component;

[0037] The third quarter-wave plate adjusts the polarization of the long-wavelength excitation light;

[0038] The third polarizer adjusts the polarization of the long-wavelength excitation light;

[0039] The third beam expander collimator expands the spot diameter of the long-wavelength excitation light and collimates the short-wavelength excitation light beam; the third half-wave plate adjusts the polarization of the long-wavelength excitation light;

[0040] A spatial light modulator converts the long-wavelength excitation light into a ring laser with a weak center and a strong outer ring;

[0041] The second dichroic mirror reflects the ring laser;

[0042] The third dichroic mirror reflects the short-wavelength excitation light to combine it with the ring laser to form a composite laser beam; the scanning galvanometer deflects the composite laser beam;

[0043] Scanning tube lens, adjusting and focusing the composite laser beam;

[0044] Scanning lens, adjusting the composite laser beam;

[0045] a fourth dichroic mirror, reflecting the composite laser beam so as to allow it to enter the objective lens;

[0046] The second lens focuses the fluorescent signal returning along the original path;

[0047] Motorized pinhole to optimize imaging quality;

[0048] The fifth dichromatic mirror reflects the fluorescence signal.

[0049] Furthermore, the second receiving terminal includes:

[0050] a first receiving terminal;

[0051] Photomultiplier tubes collect fluorescent photons, amplify the fluorescent signals, and output electrical signals to computers for data processing and analysis.

[0052] Furthermore, the third receiving terminal includes:

[0053] a second receiving terminal;

[0054] The second electron multiplying charge coupled device detects the number of photons quickly and with high sensitivity, and transmits the data to the computer for processing and analysis.

[0055] Furthermore, an optical anti-drift component is also included, including:

[0056] Near-infrared laser to generate drift-resistant laser light;

[0057] The sixth dichroic mirror reflects the anti-drift laser;

[0058] The seventh dichroic mirror reflects the anti-drift laser and receives the reflected signal of the anti-drift laser;

[0059] a third reflecting mirror, for reflecting a reflected signal of the anti-drift laser;

[0060] The four-quadrant detector receives the reflected signal of the anti-drift laser, processes and analyzes it, and performs drift correction.

[0061] Compared with the prior art, the beneficial effects of the present invention are:

[0062] The utility model can be simultaneously applied to random optical reconstruction super-resolution imaging detection, stimulated emission depletion super-resolution imaging and ground state depletion super-resolution imaging. It has a simple structure and high integration. At the same time, it can minimize the damage of the light source to cells and probes under the synergistic effect of low-power laser, thereby improving imaging quality. BRIEF DESCRIPTION OF THE DRAWINGS

[0063] Figure 1 It is a structural diagram of the utility model;

[0064] In the figure: 101, short-wavelength laser; 102, first quarter-wave plate; 103, first polarizer; 104, first beam expander collimator; 105, first half-wave plate; 106, beam splitter; 107, second quarter-wave plate; 108, second polarizer; 109, second beam expander collimator; 110, first reflector; 111, second reflector; 112, objective lens; 113, stage; 114, concave / flat reflector; 115, first dichroic mirror; 116, first lens; 117, first electron multiplying charge coupled device; 118, computer;

[0065] 201, long-wavelength laser; 202, third quarter-wave plate; 203, third polarizer; 204, third beam expander collimator; 205, third half-wave plate; 206, spatial light modulator; 207, second dichroic mirror; 208, third dichroic mirror; 209, scanning galvanometer; 210, scanning tube mirror; 211, scanning lens; 212, fourth dichroic mirror; 213, second lens; 214, motorized pinhole; 215, fifth dichroic mirror; 216, photomultiplier tube;

[0066] 301. Second electron multiplying charge coupled device;

[0067] 401. Near-infrared laser; 402. Sixth dichroic mirror; 403. Seventh dichroic mirror; 404. Third reflecting mirror; 405. Four-quadrant detector. DETAILED DESCRIPTION

[0068] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0069] See also Figure 1 The present invention provides the following technical solution: a super-resolution imaging device of a super-resolution imaging probe, comprising:

[0070] The imaging structure of random optical reconstruction super-resolution imaging includes: a first light source assembly, a first carrier assembly, a first optical path assembly, and a first receiving terminal, wherein the first light source assembly generates short-wavelength excitation light, the first carrier assembly carries the sample, the first optical path assembly splits the short-wavelength excitation light into two, one of which is focused on the carried sample, and collects the fluorescence signal reflected by the sample for transmission, and the first receiving terminal receives the collected fluorescence signal for analysis, processing, and imaging;

[0071] The imaging structure of stimulated emission depletion super-resolution imaging includes: a second light source component, a second carrier component, a second optical path component and a second receiving terminal, wherein the second light source component generates long-wavelength excitation light, the second carrier component is the first carrier component, the second optical path component converts the long-wavelength excitation light into a ring laser with a weak center and a strong outer ring, and combines it with another short-wavelength excitation light beam to form a composite laser beam, which is focused on the carrier sample and collects the fluorescence signal reflected by the sample for transmission. The second receiving terminal receives the collected fluorescence signal for analysis, processing and imaging;

[0072] The imaging structure of ground state depletion super-resolution imaging includes: a third light source assembly, a third carrier assembly, a third optical path assembly and a third receiving terminal, wherein the third light source assembly is the second light source assembly, the third carrier assembly is the second carrier assembly, the third optical path assembly is the second optical path assembly, and the third receiving terminal receives the collected fluorescence signal for analysis, processing and imaging.

[0073] Specifically, the first light source assembly includes:

[0074] The short-wavelength laser 101 generates short-wavelength excitation light.

[0075] Specifically, the first loading assembly includes:

[0076] The stage 113 carries the sample labeled with the super-resolution imaging probe.

[0077] Specifically, the first optical path component includes:

[0078] A first quarter-wave plate 102 adjusts the polarization of the short-wavelength excitation light;

[0079] A first polarizer 103, for adjusting the polarization of the short-wavelength excitation light;

[0080] A first beam expander collimator 104 is used to expand the spot diameter of the short-wavelength excitation light and collimate the short-wavelength excitation light beam;

[0081] The first half-wave plate 105 adjusts the polarization of the short-wavelength excitation light;

[0082] Beam splitter 106, splits the short wavelength excitation light into two;

[0083] A second quarter-wave plate 107 adjusts the polarization of the short-wavelength excitation light;

[0084] A second polarizer 108 adjusts the polarization of the short-wavelength excitation light;

[0085] The second beam expander collimator 109 expands the spot diameter of the short-wavelength excitation light and collimates the short-wavelength excitation light beam;

[0086] A first reflector 110 reflects short-wavelength excitation light;

[0087] The second reflector 111 reflects the short-wavelength excitation light;

[0088] Objective lens 112 focuses the laser onto the sample on stage 113 and collects the fluorescent signal reflected from the sample;

[0089] Concave / plane reflector 114 collects the fluorescent signal reflected upward from the sample;

[0090] The first dichroic mirror 115 transmits the excitation light and reflects the fluorescence signal;

[0091] The first lens 116 focuses the fluorescent signal.

[0092] Specifically, the first receiving terminal includes:

[0093] The first electron multiplying charge coupled device 117 detects the number of photons quickly and with high sensitivity;

[0094] The computer 118 receives the image captured by the first electron multiplying charge coupled device 117 and performs data processing and analysis.

[0095] In this embodiment, a short-wavelength laser 101 emits a short-wavelength laser, the short-wavelength laser passes through a first quarter-wave plate 102 and a first polarizer 103 to adjust the laser polarization, the first beam expander collimator 104 expands the laser spot diameter and collimates the laser beam, the first half-wave plate 105 adjusts the laser polarization, and the beam is split into two by a beam splitter 106. A beam of short-wavelength continuous laser passes through a second quarter-wave plate 107 and a second polarizer 108 to adjust the laser polarization, the second beam expander collimator 109 expands the laser spot diameter and collimates the laser beam, and the laser transmission direction is changed by a first reflector 110 and a second reflector 111. The laser enters an inverted microscope in a wide-field illumination mode of total internal reflection or large-angle incidence, and illuminates a sample on a stage 113 through an objective lens 112. The sample generates random flashing fluorescence under laser excitation, and the fluorescence signal is collected by the objective lens 112. At the same time, the sample has an upwardly emitted fluorescence signal, which is enhanced by the emission of the concave / plane reflector 114. The fluorescence signal collected by the objective lens 112 and the concave / plane reflector 114 is reflected by the second reflector 111 to the first dichroic mirror 115. The first dichroic mirror 115 separates the fluorescence signal and the excitation light and then reflects it to the first lens 116. The first lens 116 focuses the fluorescence signal onto the first electron multiplying charge coupled device 117. The first electron multiplying charge coupled device 117 detects the number of photons quickly and highly sensitively and transmits it to the computer 118. The computer 118 receives the image collected by the first electron multiplying charge coupled device 117 for data processing, analysis and imaging.

[0096] Specifically, the second light source assembly includes:

[0097] a first light source assembly;

[0098] The long-wavelength laser 201 generates long-wavelength excitation light.

[0099] Specifically, the second optical path component includes:

[0100] a first optical path component;

[0101] A third quarter-wave plate 202 adjusts the polarization of the long-wavelength excitation light;

[0102] The third polarizer 203 adjusts the polarization of the long-wavelength excitation light;

[0103] The third beam expander collimator 204 expands the spot diameter of the long-wavelength excitation light and collimates the short-wavelength excitation light beam;

[0104] The third half-wave plate 205 adjusts the polarization of the long-wavelength excitation light;

[0105] The spatial light modulator 206 converts the long-wavelength excitation light into a ring-shaped laser with a weak center and a strong outer ring;

[0106] The second dichroic mirror 207 reflects the ring laser;

[0107] The third dichroic mirror 208 reflects the short-wavelength excitation light so as to combine it with the ring laser to form a composite laser beam;

[0108] Scanning galvanometer 209, deflecting the composite laser beam;

[0109] Scanning tube lens 210, adjusting and focusing the composite laser beam;

[0110] Scanning lens 211, adjusting the composite laser beam;

[0111] The fourth dichroic mirror 212 reflects the composite laser beam so that it enters the objective lens 112;

[0112] The second lens 213 focuses the fluorescent signal returning along the original path;

[0113] Motorized pinhole 214 to optimize imaging quality;

[0114] The fifth dichroic mirror 215 reflects the fluorescent signal.

[0115] Specifically, the second receiving terminal includes:

[0116] a first receiving terminal;

[0117] The photomultiplier tube 216 collects fluorescent photons, amplifies the fluorescent signal, and outputs the electrical signal to the computer 118 for data processing and analysis.

[0118] In this embodiment, a long-wavelength laser 201 emits a long-wavelength laser, the long-wavelength laser is polarized by the third quarter-wave plate 202 and the third polarizer 203, the laser spot diameter is expanded and the laser beam is collimated by the third beam expander collimator 204, the laser polarization is adjusted by the third half-wave plate 205, a ring laser is formed by the spatial light modulator 206, and the laser beam is reflected by the second dichroic mirror 207 onto the scanning galvanometer 209. Another short-wavelength laser beam is reflected by the third dichroic mirror 208 onto the scanning galvanometer 209, and the beams are combined to form a composite laser beam, which is deflected by the scanning galvanometer 209, adjusted and focused by the scanning tube lens 210, adjusted by the scanning lens 211, and reflected by the fourth dichroic mirror 212 into the inverted microscope, and irradiated by the objective lens 112 on the sample on the stage 113. The sample is excited. Under light excitation, stimulated emission depletion super-resolution imaging fluorescence is generated, and the fluorescence signal is collected by the objective lens 112. At the same time, the sample has an upwardly emitted fluorescence signal, which is emitted by the concave / plane reflector 114 to enhance the fluorescence collection. The fluorescence signal collected by the objective lens 112 and the concave / plane reflector 114 returns along the fourth dichroic mirror 212, the scanning lens 211, the scanning tube lens 210, the scanning galvanometer 209, the third dichroic mirror 208 and the second dichroic mirror 207, and is reflected to the second lens 213. It is transmitted to the electric pinhole 214 through the second lens 213, and is transmitted to the fifth dichroic mirror 215 through the electric pinhole 214. It is reflected and focused to the photomultiplier tube 216 by the fifth dichroic mirror 215. The fluorescence photons are collected by the photomultiplier tube 216, and the fluorescence signal is amplified and output as an electrical signal to the computer 118 for data processing, analysis and imaging.

[0119] Specifically, the third receiving terminal includes:

[0120] a second receiving terminal;

[0121] The second electron multiplying charge coupled device 301 detects the number of photons quickly and with high sensitivity, and transmits the data to the computer 118 for data processing and analysis.

[0122] In this embodiment, the long-wavelength laser 201 emits long-wavelength laser light, and the steps are as above to deplete the ground state. The short-wavelength laser 101 emits short-wavelength laser light, and the steps are as above. The number of photons is detected quickly and highly sensitively by the second electron multiplying charge coupled device 301 and transmitted to the computer 118. The computer 118 receives the image captured by the second electron multiplying charge coupled device 301 for data processing, analysis and imaging.

[0123] Specifically, it also includes an optical anti-drift component, including:

[0124] A near-infrared laser 401 generates an anti-drift laser;

[0125] A sixth dichroic mirror 402 reflects the anti-drift laser;

[0126] The seventh dichroic mirror 403 reflects the anti-drift laser and receives the reflected signal of the anti-drift laser;

[0127] A third reflecting mirror 404 reflects the reflected signal of the anti-drift laser;

[0128] The four-quadrant detector 405 receives the reflected signal of the anti-drift laser, processes and analyzes it, and performs drift correction.

[0129] In this embodiment, a near-infrared laser 401 emits an anti-drift laser, which is reflected to a target by a sixth dichroic mirror 402 and a seventh dichroic mirror 403. The seventh dichroic mirror 403 receives a reflected signal of the anti-drift laser, which is reflected to a four-quadrant detector 405 by a third reflecting mirror 404. The four-quadrant detector 405 receives the reflected signal of the anti-drift laser, processes and analyzes it, and performs drift correction.

[0130] Although the embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A super-resolution imaging device of a super-resolution imaging probe, characterized in that: include: The imaging structure of random optical reconstruction super-resolution imaging includes: a first light source assembly, a first carrier assembly, a first optical path assembly, and a first receiving terminal, wherein the first light source assembly generates short-wavelength excitation light, the first carrier assembly carries the sample, the first optical path assembly splits the short-wavelength excitation light into two, one of which is focused on the carried sample, and collects the fluorescence signal reflected by the sample for transmission, and the first receiving terminal receives the collected fluorescence signal for analysis, processing, and imaging; The imaging structure of stimulated emission depletion super-resolution imaging includes: a second light source component, a second carrier component, a second optical path component and a second receiving terminal, wherein the second light source component generates long-wavelength excitation light, the second carrier component is the first carrier component, the second optical path component converts the long-wavelength excitation light into a ring laser with a weak center and a strong outer ring, and combines it with another short-wavelength excitation light beam to form a composite laser beam, which is focused on the carrier sample and collects the fluorescence signal reflected by the sample for transmission. The second receiving terminal receives the collected fluorescence signal for analysis, processing and imaging; The imaging structure of ground state depletion super-resolution imaging includes: a third light source assembly, a third carrier assembly, a third optical path assembly and a third receiving terminal, wherein the third light source assembly is the second light source assembly, the third carrier assembly is the second carrier assembly, the third optical path assembly is the second optical path assembly, and the third receiving terminal receives the collected fluorescence signal for analysis, processing and imaging.

2. The super-resolution imaging device of a super-resolution imaging probe according to claim 1, characterized in that: The first light source assembly comprises: The short-wavelength laser (101) generates short-wavelength excitation light.

3. The super-resolution imaging device of a super-resolution imaging probe according to claim 1, characterized in that: The first carrier assembly comprises: The stage (113) carries the sample labeled with the super-resolution imaging probe.

4. The super-resolution imaging device of a super-resolution imaging probe according to claim 1, characterized in that: The first optical path component comprises: A first quarter-wave plate (102) adjusts the polarization of the short-wavelength excitation light; A first polarizer (103) for adjusting the polarization of the short-wavelength excitation light; A first beam expander collimator (104) is used to expand the spot diameter of the short-wavelength excitation light and collimate the short-wavelength excitation light beam; A first half-wave plate (105) adjusts the polarization of the short-wavelength excitation light; a beam splitter (106) for splitting the short-wavelength excitation light into two; a second quarter-wave plate (107) for adjusting the polarization of the short-wavelength excitation light; a second polarizer (108) for adjusting the polarization of the short-wavelength excitation light; A second beam expander collimator (109) is used to expand the spot diameter of the short-wavelength excitation light and collimate the short-wavelength excitation light beam; a first reflecting mirror (110) for reflecting short-wavelength excitation light; A second reflector (111) reflects short-wavelength excitation light; The objective lens (112) focuses the laser onto the sample on the stage (113) and collects the fluorescence signal reflected by the sample; a concave / flat mirror (114) for collecting the fluorescent signal reflected upward from the sample; a first dichroic mirror (115) for transmitting excitation light and reflecting fluorescence signals; The first lens (116) focuses the fluorescent signal.

5. The super-resolution imaging device of a super-resolution imaging probe according to claim 1, characterized in that: The first receiving terminal includes: A first electron multiplying charge coupled device (117) for detecting the number of photons quickly and with high sensitivity; The computer (118) receives the image collected by the first electron multiplying charge coupled device (117) and performs data processing and analysis.

6. The super-resolution imaging device of a super-resolution imaging probe according to claim 2, characterized in that: The second light source assembly includes: a first light source assembly; The long-wavelength laser (201) generates long-wavelength excitation light.

7. The super-resolution imaging device of a super-resolution imaging probe according to claim 4, characterized in that: The second optical path component includes: a first optical path component; a third quarter-wave plate (202) for adjusting the polarization of the long-wavelength excitation light; A third polarizer (203) adjusts the polarization of the long-wavelength excitation light; A third beam expander collimator (204) expands the spot diameter of the long-wavelength excitation light and collimates the short-wavelength excitation light beam; A third half-wave plate (205) adjusts the polarization of the long-wavelength excitation light; A spatial light modulator (206) converts the long-wavelength excitation light into a ring-shaped laser with a weak center and a strong outer ring; A second dichroic mirror (207) reflects the ring laser; a third dichroic mirror (208) for reflecting the short-wavelength excitation light so as to combine it with the ring laser to form a composite laser beam; a scanning galvanometer (209) for deflecting the composite laser beam; A scanning tube mirror (210) for adjusting and focusing the composite laser beam; A scanning lens (211) adjusts the composite laser beam; a fourth dichroic mirror (212) for reflecting the composite laser beam so as to allow it to enter the objective lens (112); The second lens (213) focuses the fluorescent signal returning along the original path; Motorized pinhole (214) to optimize imaging quality; The fifth dichroic mirror (215) reflects the fluorescent signal.

8. The super-resolution imaging device of a super-resolution imaging probe according to claim 5, characterized in that: The second receiving terminal includes: a first receiving terminal; The photomultiplier tube (216) collects fluorescent photons, amplifies the fluorescent signal, and outputs the electrical signal to the computer (118) for data processing and analysis.

9. The super-resolution imaging device of the super-resolution imaging probe according to claim 8, characterized in that: The third receiving terminal includes: a second receiving terminal; The second electron multiplying charge coupled device (301) detects the number of photons quickly and with high sensitivity, and transmits the detected photons to the computer (118) for data processing and analysis.

10. The super-resolution imaging device of a super-resolution imaging probe according to claim 1, characterized in that: Also included are optical anti-drift components, including: A near-infrared laser (401) generates an anti-drift laser; a sixth dichroic mirror (402) for reflecting the anti-drift laser; a seventh dichroic mirror (403) for reflecting the anti-drift laser and receiving a reflected signal of the anti-drift laser; A third reflecting mirror (404) reflects a reflection signal of the anti-drift laser; The four-quadrant detector (405) receives the reflected signal of the anti-drift laser, processes and analyzes it, and performs drift correction.

Images