Scintillation crystal performance test system based on silicon photomultiplier

Abstract

The utility model provides a scintillation crystal performance testing system based on a silicon photomultiplier, which relates to the technical field of scintillation crystal testing and comprises a camera obscura, a camera obscura partition plate, the silicon photomultiplier and a signal processor. The camera obscura comprises a box body and a box cover, and a camera obscura partition plate divides a cavity in the camera obscura into an accommodating cavity detection cavity and an accommodating cavity which are relatively distributed up and down; the detection cavity is a lightproof cavity with an openable structure, the silicon photomultiplier is located below the camera obscura partition plate, and the signal processor is connected with the silicon photomultiplier. The scintillation crystal has the beneficial effects that the silicon photomultiplier can receive photons and generate enhanced electric signals, and the signal processor detects the performance of the scintillation crystal according to the electric signals. The test system is small in size and flexible to use, can be directly configured in a vacuum glove box, and completes the detection process of the scintillation crystal; the test system can effectively avoid the problem of deterioration of the scintillation crystal due to detection transfer.

Description

Technical Field

[0001] The utility model relates to the technical field of scintillation crystal testing, in particular to a scintillation crystal performance testing system based on a silicon photomultiplier tube. Background Art

[0002] A scintillation counter is a device that uses radiation or particles to induce luminescence in a scintillator and then records the intensity and energy of the radiation through a photoelectric device. The scintillation crystal is the core component of a scintillation counter. The scintillation crystal is excited by radiation and then emits photons. The scintillation counter detects the intensity of radiation in the environment by measuring the number or intensity of photons emitted by the scintillation crystal.

[0003] Scintillating crystals have disadvantages such as being easily deliquescent and prone to yellowing and deterioration. Deterioration of scintillation crystals can have a significant impact on the performance and service life of scintillation counters. Therefore, before packaging scintillation crystals, their performance needs to be tested. To ensure that the scintillation crystals do not undergo qualitative changes, the packaging of scintillation crystals can be carried out in a vacuum glove box. The space in a vacuum glove box is limited, and existing scintillation crystal performance testing devices usually have built-in photomultiplier tubes. The photomultiplier tubes are large in size, and such testing devices are difficult to place directly in the glove box. When testing scintillation crystals, they need to be transferred to a scintillation crystal performance testing device for testing. During the transfer process, scintillation crystals also have the risk of deterioration. Therefore, to prevent the deterioration of scintillation crystals, it is necessary to design a scintillation crystal performance testing device that is compact, flexible, and convenient to use. Utility Model Content

[0004] In view of this, the utility model provides a scintillation crystal performance test system based on silicon photomultiplier tube, comprising a dark box, a dark box partition, a silicon photomultiplier tube and a signal processor;

[0005] The dark box includes a box body and a box cover, the box body can be opened on the dark box body, the dark box partition is arranged in the box body, and the dark box partition divides the cavity in the dark box into a relatively upper and lower accommodating cavity, a detection cavity and an accommodating cavity;

[0006] A positioning groove is provided on the dark box partition. The silicon photomultiplier tube and the signal processor are both located in the accommodating cavity. The silicon photomultiplier tube is opposite to the positioning groove. The scintillation crystal to be detected is located directly below the positioning groove. The silicon photomultiplier tube is connected to the signal processor. The silicon photomultiplier tube is used to receive photons emitted after the scintillation crystal is excited to generate an electrical signal and strengthen the electrical signal. The signal processor is used to process the electrical signal generated and strengthened by the silicon photomultiplier tube to detect the performance of the scintillation crystal.

[0007] Furthermore, a light-transmitting stage is embedded in the positioning groove of the darkroom partition, and the scintillation crystal is supported on the light-transmitting stage.

[0008] Furthermore, a switch mounting hole is provided on the box body, a detection switch is provided on the switch mounting hole, the detection switch is connected to the silicon photomultiplier tube, and the detection switch is used to control the silicon photomultiplier tube to be turned on or off.

[0009] Furthermore, a plurality of light leakage protection components are provided on the dark box partition, and the light leakage protection components pass through the dark box partition and are connected to the silicon photomultiplier tubes.

[0010] Furthermore, the light leakage protection component includes a light sensor and a connecting wire, wherein the light sensor is connected to the dark box partition, and the connecting wire connects the light sensor and the silicon photomultiplier tube.

[0011] Furthermore, a plurality of mounting threaded holes are provided on the dark box partition, a connecting screw is provided at the lower end of the light sensor, and the light sensor is connected to the mounting threaded hole through the connecting screw.

[0012] Furthermore, one side of the box cover is rotatably connected to the box body through a hinge.

[0013] Furthermore, the box body is provided with an elastic snap plate, the inner side of the snap plate is provided with a snap groove, and the side of the box body is provided with a snap protrusion corresponding to the snap groove one by one, and the snap protrusion is used to snap into the snap groove.

[0014] Furthermore, a sealing groove is provided at the top of the box frame, an elastic sealant is provided at the bottom of the sealing groove, and a sealing ridge is provided at the bottom of the box cover to embed into the sealing groove and compress the elastic sealant.

[0015] The present invention provides a scintillation crystal performance testing system based on silicon photomultiplier tubes (SPMs). The system comprises a darkroom, a darkroom partition, a SPM, and a signal processor. The darkroom comprises a housing and a lid. The darkroom partition divides the cavity within the darkroom into a receiving chamber, a detection chamber, and a receiving chamber, which are arranged relatively vertically. The detection chamber is an openable, light-tight housing. The darkroom partition is provided with a positioning slot. The SPM is located directly below the positioning slot. The signal processor is connected to the SPM. The SPM to be tested is located in the positioning slot. The SPM to be tested emits photons under the action of a radiation source. The SPM receives the photons and generates and amplifies electrical signals, which the signal processor uses to detect the performance of the SPM. The system is compact and flexible, and can be directly deployed in a vacuum glove box to complete the scintillation crystal testing process, effectively avoiding the problem of scintillation crystal deterioration caused by testing transfer. Furthermore, the system can seal the SPM within a black box environment during the testing process, ensuring the accuracy of the scintillation crystal performance test. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 This is a schematic diagram of the overall external structure of a scintillation crystal performance testing system based on silicon photomultiplier tubes according to an embodiment of the present utility model.

[0017] In the above figure: 1-box body, 11-sealing groove, 12-switch mounting hole, 13-snap plate, 2-box cover, 21-sealing ridge, 22-snap protrusion, 3-darkroom partition, 31-positioning groove, 32-transparent stage, 4-mounting threaded hole. DETAILED DESCRIPTION

[0018] In order to make the purpose, technical solutions and advantages of the present invention more clear, the embodiments of the present invention will be further described below with reference to the accompanying drawings.

[0019] Please refer to Figure 1 A scintillation crystal performance test system based on silicon photomultiplier tubes includes a dark box, a dark box partition 3, a silicon photomultiplier tube and a signal processor.

[0020] The dark box is a rectangular box structure, which includes a box body 1 and a box cover 2. The box body 1 can be opened on the box body 1. The dark box partition 3 is arranged in the box body 1. The dark box partition 3 divides the cavity in the dark box into a accommodating chamber, a detection chamber and a accommodating chamber that are relatively distributed up and down. The detection chamber can be opened through the box body 2, and the edge of the dark box partition 3 contacts the inner wall of the box body 1 to fully seal the detection chamber to ensure that after the box cover 2 is closed, the detection chamber is in a light-proof and sealed state.

[0021] A positioning groove 31 is provided on the darkroom partition 3. A light-transmitting stage 32 is embedded in the positioning groove 31 of the darkroom partition 3. The scintillation crystal is supported on the light-transmitting stage 32. In this embodiment, the light-transmitting stage 32 is made of glass with high light transmittance. The silicon photomultiplier tube and the signal processor are both located in the accommodating cavity. The silicon photomultiplier is directly opposite the positioning groove 31. The scintillation crystal to be detected is located directly below the positioning groove 31. The silicon photomultiplier tube is connected to the signal processor. The structure of the silicon photomultiplier tube is an existing structure. The silicon photomultiplier tube is composed of an avalanche diode array operating in Geiger mode. When light shines on the silicon photomultiplier tube, photons hit photoelectrons on the diode photocathode. The photoelectrons are multiplied in the photomultiplier tube. The multiplied electron flow generates an electrical signal on the anode load. The signal processor is used to process the electrical signal generated by the silicon photomultiplier tube and obtain the performance parameters of the scintillation crystal based on the electrical signal. The signal processor is also provided with a Bluetooth module connected to the detection terminal via a wireless connection. The signal processor sends the test results to the detection terminal via the Bluetooth module through wireless transmission.

[0022] When using the testing system, the lid 2 is opened, the scintillation crystal to be tested is placed on the light-transmitting stage 32, the lid 2 is closed, rendering the detection chamber opaque, the silicon photomultiplier tube is turned on, and then a radioactive source placed directly above the darkroom is turned on. (In this embodiment, the lid 2 is also provided with a crosshair mark. When the lid 2 is closed, the crosshair mark is located directly above the scintillation crystal to be tested. The crosshair mark indicates the location of the radioactive source, improving the convenience of testing the scintillation crystal.) The radioactive source emits radiation of a fixed intensity. The radiation passes through the lid 2 and excites the scintillation crystal to be tested, causing it to emit photons. The scintillation crystal located directly below receives these photons and generates electrical signals. The signal processor receives these electrical signals, obtains scintillation crystal performance parameters, and transmits them to the detection terminal, thereby completing the scintillation crystal performance testing process. The testing system is compact and flexible, and can be directly configured within a vacuum glove box to complete the scintillation crystal testing process, effectively avoiding the problem of scintillation crystal deterioration caused by test transfer. Furthermore, the system can seal the scintillation crystal within a darkroom environment during the testing process, ensuring the accuracy of the scintillation crystal performance test.

[0023] Preferably, the box body 1 is further provided with a switch mounting hole 12 , and the switch mounting hole 12 is provided with a detection switch, the detection switch is connected to the silicon photomultiplier tube, and the detection switch is used to control the silicon photomultiplier tube to be turned on or off.

[0024] Preferably, the darkroom partition 3 is also provided with multiple light leakage protection components, which pass through the darkroom partition 3 and connect to the silicon photomultiplier tube. In this embodiment, the light leakage protection components include a light sensor and connecting wires. The light sensor is a TSL2591 light sensor, which can measure light intensity ranging from 188μl ux to 88,000μl ux and has a sensitivity of 0.002μl ux. The light sensor is connected to the darkroom partition 3, and the connecting wires connect the light sensor and the silicon photomultiplier tube. The darkroom partition 3 is provided with multiple mounting threaded holes 4. The lower end of each light sensor is provided with a connecting screw, which connects the light sensor to the mounting threaded hole 4 via the connecting screw. The light sensor of the light leakage protection component is used to detect the external light intensity. When the external light intensity is lower than a predetermined value, the light sensor controls the silicon photomultiplier tube to be in an open state, preventing the silicon photomultiplier tube from being turned on by the detection switch under strong light conditions (i.e., when the box cover 2 is not closed), causing the silicon photomultiplier tube to be overloaded and damaged.

[0025] Preferably, one side of the box cover 2 is rotatably connected to the box body 1 through a hinge. This allows the box cover 2 to be easily opened and closed, thereby improving the convenience of operating the test system.

[0026] Preferably, the box body 1 is further provided with two snap plates 13, the lower ends of the two snap plates 13 are fixed to the sides of the box body 1, and the inner sides of the upper ends of the two snap plates 13 are provided with snap grooves. The snap plates 13 are made of a metal material with a certain elasticity, and the side of the box body 1 is provided with snap protrusions 22 corresponding to the snap grooves one by one. When the box cover 2 is covered on the box body, the snap protrusions 22 can be snapped into the snap grooves, so that the box cover 2 and the box body 1 are tightly combined to ensure the airtightness of the detection cavity.

[0027] Preferably, a sealing groove 11 is provided at the top of the frame of the box body 1, and an elastic sealant is provided at the bottom of the sealing groove 11. A sealing ridge 21 is provided at the bottom of the box cover 2, which is embedded in the sealing groove 11. When the box cover 2 is covered on the box body 1, the sealing ridge 21 is embedded in the sealing groove 11 and presses the elastic sealant. The matching structure of the sealing groove 11, the sealing ridge 21 and the elastic sealant can further improve the tight combination between the box cover 2 and the box body 1.

[0028] In this document, directional terms such as front, back, top, and bottom are defined based on the positions of components in the accompanying drawings and relative to each other, and are intended only for clarity and convenience in describing the technical solution. It should be understood that the use of these directional terms should not limit the scope of protection claimed in this application.

[0029] In the absence of conflict, the above embodiments and features in the embodiments may be combined with each other.

[0030] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A scintillation crystal performance test system based on silicon photomultiplier tube, characterized in that: It includes a darkroom, a darkroom partition, a silicon photomultiplier tube and a signal processor; The dark box includes a box body and a box cover, the box cover is openably arranged on the box body, the dark box partition is arranged in the box body, and the dark box partition divides the cavity in the dark box into a receiving cavity, a detection cavity and a receiving cavity distributed up and down; A positioning groove is provided on the dark box partition. The silicon photomultiplier tube and the signal processor are both located in the accommodating cavity. The silicon photomultiplier tube is opposite to the positioning groove. The positioning groove is used to place the scintillation crystal to be detected. The silicon photomultiplier tube is connected to the signal processor. The silicon photomultiplier tube is used to receive photons emitted after the scintillation crystal is excited to generate an electrical signal and strengthen the electrical signal. The signal processor is used to process the electrical signal generated and strengthened by the silicon photomultiplier tube to detect the performance of the scintillation crystal.

2. A scintillation crystal performance test system based on silicon photomultiplier tube according to claim 1, characterized in that: A light-transmitting stage is also embedded in the positioning groove of the dark box partition, and the scintillation crystal is supported on the light-transmitting stage.

3. The scintillation crystal performance testing system based on silicon photomultiplier tube according to claim 1, characterized in that: The box body is further provided with a switch mounting hole, on which a detection switch is provided. The detection switch is connected to the silicon photomultiplier tube and is used to control the silicon photomultiplier tube to be turned on or off.

4. The scintillation crystal performance testing system based on silicon photomultiplier tube according to claim 1, characterized in that: The dark box partition is also provided with a plurality of light leakage protection components, and the light leakage protection components pass through the dark box partition and are connected to the silicon photomultiplier tube.

5. The scintillation crystal performance testing system based on silicon photomultiplier tube according to claim 4, characterized in that: The light leakage protection component includes a light sensor and a connecting wire. The light sensor is connected to the dark box partition, and the connecting wire connects the light sensor and the silicon photomultiplier tube.

6. A scintillation crystal performance test system based on silicon photomultiplier tube according to claim 5, characterized in that: A plurality of mounting threaded holes are provided on the dark box partition, a connecting screw is provided at the lower end of the light sensor, and the light sensor is connected to the mounting threaded hole via the connecting screw.

7. A scintillation crystal performance test system based on silicon photomultiplier tube according to claim 6, characterized in that: One side of the box cover is rotatably connected to the box body through a hinge.

8. The scintillation crystal performance testing system based on silicon photomultiplier tube according to claim 1, characterized in that: The box body is further provided with an elastic snap plate, the inner side of the snap plate is provided with a snap groove, and the side surface of the box body is provided with a snap protrusion corresponding to the snap groove one by one, and the snap protrusion is used to snap into the snap groove.

9. The scintillation crystal performance testing system based on silicon photomultiplier tube according to claim 1, characterized in that: A sealing groove is provided on the top of the box frame, an elastic sealant is provided on the bottom of the sealing groove, and a sealing ridge is provided on the bottom of the box cover to embed into the sealing groove and compress the elastic sealant.

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